Test Record

Design Verification Test Report
Test Description: Tensile Force Tests of Contacts Crimped at Multiple Tool Settings
Product Number / Product Identification: Revision A
Test Period: November 5-7, 2014
Test Report Number: TR-14-0012
Test Report Revision: A
Test Protocol Reference Number (if applicable):
Customer (if applicable):
Product Tester(s): R. Dobrzynski and D. Addison
Prepared By:
R. Dobrzynski and D. Addison
Reviewed By:
J. Meszaros
Report Date:
November 7, 2014
Approved By:
Date:
FORM: EF 2.04.03-1 REV Page 1 of 14
1.
Test Procedures and Equipment

1.1
Test Description: Examination of Product (Dimensional). Ref. TP-14-0012-01 section 3.1
1.1.1
Test Sample Description:
1.1.1.1 Re-designed crimp pin, revision A, un-plated.
1.1.1.2 Sample population consists of (3) units
1.1.2
Test Equipment:

1.1.3
1.1.2.1 #T-909 (Caliper), calibration due 10/31/15

1.1.2.2 Reference gage pins verified with #T-391 (micrometer) before use.
Micrometer calibration due 10/31/15
Applicable Standard:
Yes
If YES, list Standard (e.g. IEC, EIA,

etc.)
No
drawing #103422 Revision A

1.1.4
1.1.5
Procedure:
1.1.4.1 Measure crimp area o.d., i.d. and depth dimensions.
1.1.4.2 Record results on form EF2.04-04-4 for PQR #3536.
Acceptance Criteria
Pass Criteria Specified
If Yes, List all

applicable
O.D. 0.074 0.002
I.D. 0.036 0.001
NA
Depth 0.31 0.01
NA
Yes
1.1.6
Sample
1
2
3
1.1.8
No
If YES, describe
deviation
NA
Test Results
0.074 0.002
0.074
0.074
0.074
P/F
P
P
P
0.036 0.001
0.036
0.036
0.036
P/F
P
P
P
0.31 0.01
0.310
0.308
0.312
P/F
P
P
P
Summary / Conclusion
All Criteria
Pass
1.2
If No, List Reason (e.g., Specification to be

developed from test, information only, other)
NA
Deviations (Customer and/or Internal; If YES, describe deviation and attach evidence)
Yes
1.1.7
No
All Criteria
Fail
Partial Criteria
Pass
Data Review
Required?
Test Description: Examination of Product (Visual). Ref. TP-14-0012-01 Section(s) 3.2, 3.3, 3.5 & 3.6
1.2.1
Test Sample Description: Duplex cable #453564381001 (#104936-01) prepared and terminated
to plated crimp pin #103422, using one crimp tool, according to the following procedure.
1.2.1.1 Cut duplex cable into 8 lengths (18 lengths per test group). Note, 3 lengths are spares
1.2.1.2 Split cable into separate legs along jacket web for entire length (36 legs per test group)
1.2.1.3 Remove jacket & shield over full length & label both ends with unique serial number
1.2.1.4 Strip conductive layer & insulation at 7/16 long both ends
1.2.1.5 Set tool selector & verify with go/no-go gage per table 1. Set pressure gage at 100 psi.
1.2.1.6 Insert wire into contact barrel until strands are visible within inspection window both ends
1.2.1.7 Place contact & wire into tool positioner at blue turret location & crimp both ends
1.2.1.8 Re-check tool selector setting at completion of test group with go/no gage per table 1
DMC #WA27F (Crimp Tool) S/N 807298 with DMC #TH1A (Positioner) Cage #11851

Test Group
1
2
3
4
5
6
7
8
Sample Qty
36
36
36
36
36
36
36
2
Tool Selector
1
2
3
4
5
6
7
8
Go Dia.
0.028
0.032
0.036
0.039
0.045
0.052
0.059
0.068
No-Go Dia.
0.033
0.037
0.041
0.044
0.050
0.057
0.064
0.073
Gage No.
T-391*
T-492
T-480
T-449
T-623
T-629
T-626
T-638
Gage Calibration
Due 10/31/15*
Due 10/31/15
Due 10/31/15
Due 3/31/15
Due 3/31/15
Due 3/31/15
Due 3/31/15
Due 3/31/15
*Go/No-Go Gage unavailable. Used reference gage pins verified with T-391 (micrometer)
Table 1
1.2.2
1.2.3
Test Equipment:
1.2.2.1 Bausch & Lomb Stereozoom 7 (Microscope), calibration N/A
Applicable Standard(s):
Yes
1.2.4
1.2.5
If Yes, List all applicable
No
Gap between wire insulation & contact < 2X dia.

Indenters centered within crimp barrel
Wire strands visible within inspection window
Loose strand(s) outside of contact crimp barrel
Cracks visible in contact crimp barrel
1.2.6
Yes
If YES, list Standard (e.g. IEC,

EIA, etc.)
IPC/WHMA-A-620 Section 5.3
Procedure: Inspect crimped contact for each of the following per class 1 of standard
1.2.4.1 Insulation clearance between back of contact and end of wire insulation
1.2.4.2 Indenter position within contact crimp barrel
1.2.4.3 Wire strand visibility within contact inspection window
1.2.4.4 Strand visibility outside of contact
1.2.4.5 Cracks visibility within contact crimp barrel
Acceptance Criteria:
Yes
Fail Criteria Specified
Fail Criteria Specified
No
Deviations (Customer and/or Internal; If YES, describe deviation and attach evidence):
No
If YES, describe deviation

Revised wire strip length from 3/4 to 7/16 for compliance to IPC standard.
Added Test Groups 7 & 8 to check full range of crimp tool settings
1.2.7
Test Results:
Group 1
Gaging

NA
NA
NA
NA
NA
P/F
Group 2
Reason (if failure)
Gaging
P/F
Reason (if failure)
Pre
NA
Pre
NA
Sample
P/F
Reason (if failure)
Sample
P/F
Reason (if failure)
1 crack in crimp area
NA
3 cracks in crimp area
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA

9
NA
10
11
10
NA
11
NA
12
12
NA
13
13
NA
14
14
NA
15
15
NA
16
16
NA
17
17
NA
18
NA
18
NA
19
19
NA
20
20
NA
21
21
NA
22
22
NA
23
23
NA
24
24
NA
25
25
NA
26
26
NA
27
27
NA
28
28
NA
29
NA
29
NA
30
NA
30
NA
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Post
NA
Post
NA
Gaging
P/F
Reason (if failure)
Gaging
P/F
Group 3
Group 4
Reason (if failure)
Pre
NA
Pre
NA
Sample
P/F
Reason (if failure)
Sample
P/F
Reason (if failure)
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
10
NA
10
NA
11
NA
11
NA
12
NA
12
NA
13
NA
13
NA
14
NA
14
NA

15
NA
15
NA
16
NA
16
NA
17
NA
17
NA
18
NA
18
NA
19
NA
19
NA
20
NA
20
NA
21
NA
21
NA
22
NA
22
NA
23
NA
23
NA
24
NA
24
NA
25
NA
25
NA
26
NA
26
NA
27
NA
27
NA
28
NA
28
NA
29
NA
29
NA
30
NA
30
NA
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Post
NA
Post
NA
Group 5
Group 6
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Pre
NA
Pre
NA
Sample
P/F
Reason (if failure)
Sample
P/F
Reason (if failure)
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
10
NA
10
NA
11
NA
11
NA
12
NA
12
NA
13
NA
13
NA
14
NA
14
NA
15
NA
15
NA
16
NA
16
NA
17
NA
17
NA
18
NA
18
NA
19
NA
19
NA

20
NA
20
NA
21
NA
21
NA
22
NA
22
NA
23
NA
23
NA
24
NA
24
NA
25
NA
25
NA
26
NA
26
NA
27
NA
27
NA
28
NA
28
NA
29
NA
29
NA
30
NA
30
NA
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Post
NA
Post
NA
Group 7
Group 8
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Pre
NA
Pre
NA
Sample
P/F
Reason (if failure)
Sample
P/F
Reason (if failure)
NA
No Crimp Indentation Visible
NA
No Crimp Indentation Visible
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
NA
10
NA
10
NA
NA
11
NA
11
NA
NA
12
NA
12
NA
NA
13
NA
13
NA
NA
14
NA
14
NA
NA
15
NA
15
NA
NA
16
NA
16
NA
NA
17
NA
17
NA
NA
18
NA
18
NA
NA
19
NA
19
NA
NA
20
NA
20
NA
NA
21
NA
21
NA
NA
22
NA
22
NA
NA
23
NA
23
NA
NA
24
NA
24
NA
NA

25
NA
25
NA
NA
26
NA
26
NA
NA
27
NA
27
NA
NA
28
NA
28
NA
NA
29
NA
29
NA
NA
30
NA
30
NA
NA
Gaging
P/F
Reason (if failure)
Gaging
P/F
Reason (if failure)
Post
NA
Post
NA
NA
Crimp Results by Test Group (Tool Setting)
Setting 1
Setting 2
Setting 3
Setting 4
Setting 5
Setting 6
Setting 7
Setting 8
1.2.8
Summary / Conclusion:
All Criteria Pass
All Criteria Fail
Partial Criteria Pass
Data Review Required?
1.3
Test Description: Pull Test to Destruction. Ref. TP-14-0012-01 Section(s) 3.3, 3.4, 3.5 & 3.6
1.3.1
Test Sample Description: Per section 1.2.1
1.3.2
Test Equipment:
1.3.2.1 DMC Alphatron #PT-150H, Serial #866795, Calibration Due 5/31/15
1.3.2.2 Bausch & Lomb Stereozoom 7 (Microscope), calibration N/A
1.3.3
Applicable Standard(s):
Yes
No
If YES, list Standard (e.g. IEC, EIA, etc.)

ANSI/EIA-364-08
NASA-STD-8739.4, Chapter 12
1.3.4
1.3.5
Procedure:
1.3.4.1
slotted grip per photo below.
1.3.4.2
below
1.3.4.3
until wire is removed
1.3.4.4
pulled out of contact
1.3.4.5
Place free end of sample between cam wheels per photo

Pull the operating lever back in a slow & consistent motion
Record pull force reading & whether wire strands broke or
Press the reset button
Acceptance Criteria:
Yes
Select proper slot & place contact from sample into rear
If Yes, List all applicable

Pull Force 12 lbf
No

NA

1.3.6
Deviations (Customer and/or Internal; If YES, describe deviation and attach evidence):
Yes
1.3.7
No
If YES, describe deviation

NA
Test Results:
Legend: BC=Break at Crimp, BO=Break Outside Crimp, FB=Fray Break, PO=Pull Out, NC=No Crimp, NA=Not Applicable
Group 1
Group 2
Group 3
Group 4
Sample
Lbf
Type
Sample
Lbf
Type
Sample
Lbf
Type
Sample
Lbf
Type
9.0
BC
12.1
BC
17.9
BC
18.5
BC
8.2
BC
13.6
BC
17.7
BC
18.4
BC
8.8
BC
12.6
BC
17.4
BO
18.3
BO
8.4
BC
12.4
BC
16.8
BC
18.3
BO
7.2
BC
13.0
BC
17.3
BC
18.4
BC
9.0
BC
13.0
BC
17.8
BC
18.5
BC
9.3
BC
12.9
BC
17.2
BC
18.7
BO
8.0
BC
14.0
BC
18.0
BC
18.8
BC
5.4
BC
11.1
BC
17.6
BC
18.6
BO
10
7.9
BC
10
13.5
BC
10
16.7
BC
10
17.7
BC
11
6.0
BC
11
11.1
BC
11
16.3
BO
11
18.9
BC
12
8.1
BC
12
14.7
BC
12
17.5
BC
12
18.9
BC
13
8.3
BC
13
13.7
BC
13
17.2
BC
13
19.3
BO
14
6.1
BC
14
13.0
BC
14
18.0
BO, FB
14
17.6
BO
15
5.8
BC
15
13.6
BC
15
16.5
BC
15
18.7
BO
16
8.7
BC
16
12.3
BC
16
16.9
BC
16
18.5
BO
17
8.5
BC
17
11.7
BC
17
17.3
BC
17
17.7
BO
18
6.8
BC
18
13.1
BC
18
17.4
BC
18
15.6
BO
19
8.1
BC
19
12.2
BC
19
15.0
BC
19
19.2
BO
20
6.3
BC
20
12.8
BC
20
16.8
BC
20
17.5
BO
21
7.6
BC
21
12.7
BC
21
18.0
BC
21
16.5
BC
22
9.5
BC
22
11.4
BC
22
17.8
BC
22
18.4
BC
23
8.6
BC
23
13.9
BC
23
18.0
BC
23
18.8
BC
24
8.3
BC
24
13.2
BC
24
17.5
BC
24
18.7
BO
25
8.1
BC
25
13.4
BC
25
16.8
BC
25
18.3
BC
26
5.8
BC
26
11.4
BC
26
17.1
BC
26
18.7
BC
27
8.3
BC
27
12.3
BC
27
17.5
BC
27
18.3
BC
28
7.9
BC
28
14.1
BC
28
16.9
BC
28
16.0
BO
29
9.0
BC
29
13.7
BC
29
17.1
BC
29
18.4
BC
30
8.5
BC
30
12.9
BC
30
17.5
BC
30
18.9
BC

Legend: BC=Break at Crimp, BO=Break Outside Crimp, FB=Fray Break, PO=Pull Out, NC=No Crimp, NA=Not Applicable
Group 5
Group 6
Group 7
Group 8
Sample
Lbf
Type
Sample
Lbf
Type
Sample
Lbf
Type
Sample
Lbf
Type
18.7
BO, FB
14.4
PO
0.0
PO
NA
NC
19.0
BO, FB
14.5
PO
0.0
PO
NA
NC
17.9
BO
14.6
PO
0.0
PO
NA
NA
17.2
BO
14.3
PO
0.0
PO
NA
NA
18.8
BO, FB
14.9
PO
0.0
PO
NA
NA
18.6
BO
15.0
PO
0.0
PO
NA
NA
18.1
BO
14.6
PO
0.0
PO
NA
NA
17.0
BO
15.0
PO
0.0
PO
NA
NA
17.3
BO
14.5
PO
0.0
PO
NA
NA
10
17.0
BO
10
14.9
PO
10
0.0
PO
10
NA
NA
11
18.6
BO, FB
11
14.8
PO
11
0.0
PO
11
NA
NA
12
19.0
BO, FB
12
14.8
PO
12
0.0
PO
12
NA
NA
13
18.1
BC
13
14.9
PO
13
0.0
PO
13
NA
NA
14
18.0
BC
14
14.5
PO
14
0.0
PO
14
NA
NA
15
19.8
BO, FB
15
14.8
PO
15
0.0
PO
15
NA
NA
16
17.7
BO
16
14.9
PO
16
0.0
PO
16
NA
NA
17
18.3
BC
17
14.5
PO
17
0.0
PO
17
NA
NA
18
18.8
BO
18
14.0
PO
18
0.0
PO
18
NA
NA
19
19.1
BO, FB
19
14.4
PO
19
0.0
PO
19
NA
NA
20
18.9
BO, FB
20
14.9
PO
20
0.0
PO
20
NA
NA
21
19.1
BO, FB
21
13.8
PO
21
0.0
PO
21
NA
NA
22
18.8
BO, FB
22
13.3
PO
22
0.0
PO
22
NA
NA
23
18.9
BO, FB
23
12.5
PO
23
0.0
PO
23
NA
NA
24
18.8
BO, FB
24
12.9
PO
24
0.0
PO
24
NA
NA
25
18.9
BO
25
15.1
PO
25
0.0
PO
25
NA
NA
26
19.0
BO
26
13.1
PO
26
0.0
PO
26
NA
NA
27
18.4
BO, FB
27
11.8
PO
27
0.0
PO
27
NA
NA
28
18.7
BO, FB
28
14.2
PO
28
0.0
PO
28
NA
NA
29
18.3
BO, FB
29
15.1
PO
29
0.0
PO
29
NA
NA
30
18.6
BO
30
12.7
PO
30
0.0
PO
30
NA
NA
Crimp Barrel View by Test Group (Tool Setting)
Group 1 Sample 7
Group 2 Sample 3
Group 3 Sample 2
Group 4 Sample 2
Group 5 Sample 13
Group 6 Sample 2
Crimp Capability by Test Group (Tool Setting)

Process Capability Report for Setting 1
LSL
Process Data
LSL
12
Target
*
USL
*
Sample Mean 7.85
Sample N
30
StDev(Overall) 1.14402
StDev(Within) 1.14637
LSL
Overall
Within
Overall Capability
Pp
*
PPL -1.21
PPU
*
Ppk -1.21
Cpm
*
Potential (Within) Capability
Cp
*
CPL -1.21
CPU
*
Cpk -1.21
10
11
Process Data
LSL
12
Target
*
USL
*
Sample Mean 12.8467
Sample N
30
11
13
14
15
LSL
LSL
Process Data
LSL
12
Target
*
USL
*
Sample Mean 17.25
Sample N
30
Observed
0.00
*
0.00
12
Performance
Observed Expected Overall Expected Within
PPM < LSL 166666.67
178460.96
204887.26
PPM > USL
*
*
*
PPM Total 166666.67
178460.96
204887.26
PPM < LSL

PPM > USL
PPM Total
Overall Capability
Pp
*
PPL 0.31
PPU
*
Ppk 0.31
Cpm
*
Cp
*
CPL 0.27
CPU
*
Cpk 0.27
12
Performance
Observed Expected Overall Expected Within
PPM < LSL 1000000.00
999856.93
999852.77
PPM > USL
*
*
*
PPM Total 1000000.00
999856.93
999852.77
Overall
Within
Overall Capability
Pp
*
PPL 2.76
PPU
*
Ppk 2.76
Cpm
*
Cp
*
CPL 3.05
CPU
*
Cpk 3.05
12.0
Overall
Within
13.2
14.4
15.6
Performance
Expected Overall Expected Within
0.00
0.00
*
*
0.00
0.00
16.8
Process Data
LSL
12
Target
*
USL
*
Sample Mean 18.2367
Sample N
30
18.0
Overall
Within
Overall Capability
Pp
*
PPL 2.40
PPU
*
Ppk 2.40
Cpm
*
Cp
*
CPL 2.79
CPU
*
Cpk 2.79
12.0
PPM < LSL

PPM > USL
PPM Total
Observed
0.00
*
0.00
13.5
15.0
16.5
Performance
0.00
0.00
*
*
0.00
0.00
18.0
19.5

LSL
LSL
Process Data
LSL
12
Target
*
USL
*
Sample Mean 18.4467
Sample N
30
Overall
Within
Overall Capability
Pp
*
PPL 3.17
PPU
*
Ppk 3.17
Cpm
*
Cp
*
CPL 4.11
CPU
*
Cpk 4.11
12.0
PPM < LSL

PPM > USL
PPM Total
Observed
0.00
*
0.00
Process Data
LSL
12
Target
*
USL
*
Sample Mean 14.2567
Sample N
30
13.2
14.4
15.6
16.8
18.0
19.2
PPM < LSL

PPM > USL
PPM Total
All Criteria Pass
Overall Capability
Pp
*
PPL 0.87
PPU
*
Ppk 0.87
Cpm
*
Cp
*
CPL 1.25
CPU
*
Cpk 1.25
12
Performance
0.00
0.00
*
*
0.00
0.00
1.3.8
Overall
Within
Observed
33333.33
*
33333.33
13
14
15
16
Performance
4715.46
89.41
*
*
4715.46
89.41
Summary / Conclusion:
All Criteria Fail
Partial Criteria Pass
Data Review Required?
Conclusions/Recommendations:
Pull test & visual inspection results indicate an over crimp condition exits when using tool settings (1 & 2) as the wire strands
for all samples were compressed or partially severed by the crimp and produced marginal or failing pull force results.
Pull test & visual inspection results indicate an under crimp condition exits when using tool settings (6, 7 & 8) as the wire
strands for all samples pulled out of the contact crimp barrel with little or no evidence of wire deformation producing marginal
or failing pull force results.
The remaining settings (3, 4 & 5) each produced acceptable results, both in terms of average pull force and an increase in wire
breaks outside of the crimp area, indicating the crimp strength exceeded the wire tensile strength.
However setting 5 produced the optimum results as evidenced by the greatest mean pull force and highest level of process
capability and is therefore recommended as the desired setting for use in further process validation testing.
DFMEA Update Required : (If NO, Justification Required)

Yes
No
Justification
Design change for process (crimp) improvement.
Customer Sign-off Required

Yes
No
Customer Signature ___________________________________________

Test Record

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Design Verification Test Report

Product Number / Product Identification: Revision A

Test Period: November 5-7, 2014

Test Report Number: TR-14-0012

Test Report Revision: A

Test Protocol Reference Number (if applicable):

Customer (if applicable):

Product Tester(s): R. Dobrzynski and D. Addison

R. Dobrzynski and D. Addison

FORM: EF 2.04.03-1 REV Page 1 of 14

Design Verification Test Report

Test Procedures and Equipment

FORM: EF 2.04.03-1 REV Page 2 of 14

Design Verification Test Report

1.1.2.1 #T-909 (Caliper), calibration due 10/31/15

If YES, list Standard (e.g. IEC, EIA,

drawing #103422 Revision A

Pass Criteria Specified

If Yes, List all

Pass Criteria Specified

I.D. 0.036 0.001

Pass Criteria Specified

Depth 0.31 0.01

If No, List Reason (e.g., Specification to be

FORM: EF 2.04.03-1 REV Page 3 of 14

Design Verification Test Report

If Yes, List all applicable

Gap between wire insulation & contact < 2X dia.

If YES, list Standard (e.g. IEC,

If YES, describe deviation

If No, List Reason (e.g., Specification to be

Reason (if failure)

Reason (if failure)

Reason (if failure)

Reason (if failure)

1 crack in crimp area

3 cracks in crimp area

4 cracks in crimp area

4 cracks in crimp area

3 cracks in crimp area

FORM: EF 2.04.03-1 REV Page 4 of 14

Design Verification Test Report

4 cracks in crimp area

1 crack in crimp area

3 cracks in crimp area

1 crack in crimp area

1 crack in crimp area

2 cracks in crimp area

2 cracks in crimp area

2 cracks in crimp area

1 crack in crimp area

2 cracks in crimp area

2 cracks in crimp area

3 cracks in crimp area

1 crack in crimp area

2 cracks in crimp area

1 crack in crimp area

1 crack in crimp area

1 crack in crimp area

2 cracks in crimp area

1 crack in crimp area

Reason (if failure)