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chapter IV) is implemented within the protection device. For variant 1, the
OMICRON Ramping module is used to vary the angle between voltages and currents,
while their magnitude is fixed. This results in circular lines within the P-Q-plane as
shown in Figure 8a. One of the trip signals is used as trigger as with all other tests.
.The angle is tested in this way. It must be ensured that all other release criteria (e.g