BY :AMIT R.

NAIKWADE

Digital IC Tester

TABLE OF CONTENTS
Sr. No. CONTENTS Page No.

1 1 2 3 4 5 5 6 7 8 9 10 11 12 13 14 15 16 17 18

Abstract Introduction to digital IC tester Background Block Diagram Features of IC tester circuit Technical Specifications Introduction to LCD Introduction to KEYPAD IC tester circuit diagram PCB Layouts Algorithm of program Flow chart Logic involved Code for IC testing Problems and Troubleshooting Conclusions Future Scope of Work Component list and their cost References Software used

5 6 8 10 10 11 12 13 14 15 17 18 19 20 40 42 43 44 46 46

Digital IC Tester

ABSTRACT

The digital IC tester is implemented by using the 89C51 microcontroller board. The processing of the inputs and outputs is done by the microcontroller. The display part on the microcontroller board is modeled using LCD. After the successful testing of the IC, the result is displayed on the LCD. The basic function of the digital IC tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. It can test digital ICs having a maximum of 24 pins. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication, displays the faulty and good gates on the LCD. The testing procedure is accomplished with the help of keys present on the main board. At this stage we had completed to test the most common used digital IC's used in our laboratories, mainly belonging to the 74TTL series and successfully completed writing assembly code for 10 ICs. This tests various types of IC's like OR, XOR, NAND, AND, NOT, NOR, XNOR GATES and also FULL ADDER, MULTIPLEXER, SHIFT REGISTER.

Digital IC Tester

INTRODUCTION

In any manufacturing industry there are continuous efforts in cost reductions, upgrade quality and improve overall efficiencies. In electronic industry, with dramatic increase in circuit complexity and the need for the higher levels of reliability, a major contributor cost in any product can be in the testing. However we should recognize in the real world that no product is perfect, so that testing and in particular automatic testing will be an essential part of production in the foreseeable future. In industries, research centers and college, some common IC's are frequently used; many times people face problems due to some fault in these integrated circuits. So it is very essential to test them before actually using them in any of the applications. Microcontroller based digital IC tester is best solution for these problems. This project has the capability of testing any available digital IC of the TTL or CMOS family of 24 pins. The main advantage over the industry standard for the project is its low cost and eases of updating to any new IC design which may be inducted in the market by any company only through software updating. The IC-tester tests the basic logic gates used in the digital laboratory of colleges. It uses 89c51 as the controlling and processing unit. The keyboard and the display circuits are interfaced with the master microcontroller. The input is given to the corresponding pins of the IC to be tested using program stored in micro-controller acting as slave. The output is taken

Digital IC Tester from the relevant pin. It is compared with the look-up table of that IC being stored in the memory. Depending on the result of comparison, the output is displayed in the LCD display. Microcontrollers have become ubiquitous in electronic applications. However the system supported by these devices has become exceedingly complex in terms of functionality and the quantity of peripheral components. In recent years the boundaries of such systems have stretched to include additional peripheral components marking the advent of system-on-chip(S o C). The motivation to develop such devices has been to increase functionality and performance while reducing system cost, integrity complexity and power dissipation.

Digital IC Tester

BACKGROUND OF DIGITAL IC TESTER

The digital IC tester is implemented in order to test the digital ICs to verify the faulty gates and the good gates. The necessary inputs to the gates of the IC to be tested which is placed in the ZIF socket is received from the slave micro-controller IC and corresponding outputs are accumulated and sent to the same controller IC where the output is compared with the functional or the logic table and if any discrepancy results, it displays the fail in the LCD display screen. Analog IC tester is also available in the market which was replaced by this digital IC tester which is more sophisticated by performing the tasks in a much easier fashion and the execution time also very fast in it The primary purpose of this digital IC tester is that it can easily check the IC within due course of time and if any discrepancy results then it determines the gates which were good ones and which were the bad ones. The manual operation or a human intervention includes testing of each individual IC by making necessary connections and verifying the outputs for each gate by the truth table is a time taking and tedious process. With the implementation of the micro controller units it makes the job much easier to receive data for the respective gates and process output and display results. The operation of a MCU based controller is determined primarily by its program.

Digital IC Tester Microcontrollers are versatile. MCUs are very useful, since its approach is programmable, many additional features are possible at little or no added cost.

And the main advantage of this circuit is that whenever a new IC is to be tested it does not include any addition of hardware but a slight updating in the software code is sufficient enough. The IC TESTER CIRCUIT is one among the many applications of the MICROCONTROLLER BOARD. The IC which is to be tested is mounted on the ZIF socket. The inputs are fed to the IC which is primarily processed through the slave controller board. The program is written in such a way that comparisons are to be made between the expected data from the truth table and the data that is obtained from the data bus which is nothing but the outputs of the IC that is in testing process. Finally a display has to be made on the LCD display which is located in the main controller board specifying which gates of the IC are working and which are not.

Digital IC Tester

FEATURES OF IC TESTER

1: User friendly set up and operates. 2:16 X 2 character LCD display. 3: Built in 2 functions and 10 numerical keys. 4: Identifies over 10 CMOS / TTL digital ICs (up to16 pins). 5: Various LEDS and LCD display to present the test results FAIL or PASS.
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Digital IC Tester

TECHNICAL SPECIFICATIONS:

FAMILY RANGE TEST SOCKETS PACKAGE DISPLAY

: TTL, CMOS, : Logic Gates, Shift Register, Adder and Multiplexer can be tested. : A single 24 pin ZIF sockets for IC Testing. : DIP14, 16, 20 and 24 pins. : 16X2 LCD Display.

INDICATOR LEDs: 4 bright LEDs of 3 mm each. KEY PAD ELECTRICAL : 4X3 MATRIX TYPE. : 230 V (+/- 10 %), 1 phase, 50 Hz (+/- 2 %)

Digital IC Tester

LCD
The LCD in the board is 16X2 characters display.

PIN DIAGRAM OF 16X2 LCD:

DB0-DB7: Data pins RS: Register select. If RS =0, the instruction command code register is selected, allowing the user to send a command such as clear display, cursor at home etc. If RS=1, the data register is selected allowing the user to send data to be displayed on the LCD. R/W: Read or Write. R/W=1 when reading; R/W=0 when writing. E: Enable. The Enable pin is used by LCD to latch information presented to its data pins. When data is supplied to data pins, a high to low pulse must be applied to this pin in order for the LCD to latch in the data present at the data pins. LCD COMMAND CODES: 08 h-Displays off, cursor off 01h-Clear Display screen 06-Increment cursor (shift cursor to right)

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Digital IC Tester 0ch- Display on, cursor off. 80H Force cursor to beginning of first line 0C0h - Force cursor to beginning of first line

4X3 KEY-PAD:
Row pins are connected to lower 4 pins of port 1. And column pins are connected to lower 3 pins of port 3. The keyboard section is as shown in the figure below. The keyboard is designed as a matrix and is interfaced to port 1 of the master IC. Here P1.0, P1.1, P1.2, P1.3 are configured as input ports, and P3.0, P3.1, P3.2 are configured as output ports. The keyboard consists of 10 digits as well as an ENTER button and RESET button. In case of matrix Keypad both the ends of switches are connected to the port Pin. Over here we have considered a 4x3 matrix keypad i.e. four rows and three columns. So in all twelve switches have been interfaced using just seven lines. The adjoining figure shows the diagram of a matrix keypad and how it is interfaced with the controller. As you can see no pin is connected to ground, over here the controller pin itself provides the ground. We pull one of the Column Pins low & check the row pins if any of the Pin is low then we come to know which switch is pressed. Suppose we make column 1 pin low and while checking the rows we get Row 3 is low then we come to know switch 7 has been pressed.
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Digital IC Tester

EXPERIMENTAL ASPECTS:

CIRCUIT DIAGRAM

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Digital IC Tester

PCB LAYOUTS

Track Side

Component Side

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Digital IC Tester

PCB LAYOUTS

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Digital IC Tester

ALGORITHM OF CODE FOR DIGITAL IC TESTER

I. II. III. IV. V. VI. VII. VIII. IX. X.

Begin. Reset the circuit. Initialize the LCD. Display the message Enter IC number. Wait for some time. Press the IC number on the keypad. Display the IC number. Send the code of the respective IC from master microcontroller to slave microcontroller. Check the working of IC depending upon the truth tables and functional tables. Depending upon the output, give the control signals to the master microcontroller to display respective messages on LCD.

XI.

Stop.

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Digital IC Tester

FLOWCHART OF THE IC TESTER PROGRAM Start Reset the Circuit Initialize the LCD

Display the Message Enter IC no. Accept and Display IC no

Send IC no. to slave lcd Check IC working

Send control signals to Master

Display messages on LCD

lcd Stop lcd

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Digital IC Tester

LOGIC TO TEST AN IC

The logic to test an IC is very simple. We can test it using their truth tables and functional tables. In case of logic gates, we should check truth tables and in case of ICs like shift register, full adder, multiplexer etc we should check functional tables. Let us take an example of logic gate IC 7400 i.e. NAND gate. In this gate first two terminals are the inputs and third terminal is the output. So we are externally giving inputs to first 2 pins of IC and checking the 3rd terminal. If the desired output is obtained, LCD displays PASS and if the output is wrong, LCD displays FAIL.

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Digital IC Tester

PROGRAM FOR MASTER CONTROLLER

; FOR OLD KIT ; FOR MICRONTROLLER WITH DIP PACKAGE. PN EQU 40H ORG 00H LJMP MAIN ORG 50H MAIN: MOV R6, #00H MOV R1, #00H MOV SP, #70H ; stack pointer to 70h

LCALL LCDINIT ; LCD INITIALISATION MOV A, #80H ; SELECT FIRST LINE

LCALL COMMAND ; SAVE TO COMMAND MOV DPTR, #MSG1 ; DISPLAY FIRST MESSAGE MOV R7, #0FH LCALL DISPLAY LJMP K LCDINIT: MOV A, #20H ; NUMBER OF CHAR TO DISPLAY

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Digital IC Tester LCALL COMMAND MOV A, #28H LCALL COMMAND MOV A, #08H LCALL COMMAND MOV A, #01H LCALL COMMAND MOV A, #06H LCALL COMMAND MOV A, #0DH LCALL COMMAND MOV A, #0CH LCALL COMMAND RET COMMAND: LCALL READY PUSH 07H MOV R7, A ANL A, #0F0H SWAP A MOV P0, A CLR P0.6; RS=0
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; STORE THE CONTENT OF R7

Digital IC Tester CLR P0.5; W=0 WRITE SETB P0.4; E=1 NOP CLR P0.4; E=0 MOV A, R7 ANL A, #0FH MOV P0, A CLR P0.6; R=0 CLR P0.5; W=0 SETB P0.4; E=1 NOP CLR P0.4 POP 07H RET READY: PUSH 0E0H WAIT: MOV P0, #0FH CLR P0.4 CLR P0.6 SETB P0.5 SETB P0.4 MOV A, P0
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Digital IC Tester CLR P0.4 SETB P0.4 NOP NOP CLR P0.4 JB 0E3H, WAIT POP 0E0H RET DATA1: LCALL READY PUSH 07H MOV R7, A ANL A, #0F0H SWAP A MOV P0, A SETB P0.6; RS=1 CLR P0.5; W=0 WRITE SETB P0.4; E=1 NOP CLR P0.4; E=0 MOV A, R7 ANL A, #0FH
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; STORE THE CONTENT OF R7

Digital IC Tester MOV P0, A SETB P0.6; R=1 CLR P0.5; W=0 SETB P0.4; E=1 NOP CLR P0.4 POP 07H RET DISPLAY: LCALL DEBOUNCE CLR A MOVC A,@A+DPTR LCALL DATA1 INC DPTR DJNZ R7, DISPLAY RET K: K1: Nop MOV P3, #0FH MOV P1, #00H MOV A, P3 ; MAKE P3 AS INPUT PORT ; MAKE P1 AS I/P PORT ; STORE THE KEY STATUS IN A

ANL A, #00000111b CJNE A, #00000111b, K1 K2: MOV P3, #0FH ; CHECK FOR ALL KEY RELEASED

; MAKE P3 AS INPUT PORT

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Digital IC Tester MOV P1, #00H MOV A, P3 ; MAKE P1 AS I/P PORT ; STORE THE KEY STATUS IN A

ANL A, #00000111b CJNE A, #00000111b, K3 AJMP K2 K3: LCALL DEBOUNCE MOV P3, #0FH MOV P1, #00H MOV A, P3 ; FOR DEBOUNCE CHECKING ; MAKE P3 AS INPUT PORT ; MAKE P1 AS I/P PORT ; STORE THE KEY STATUS IN A ; CHECK FOR ANY KEY PRESSED

ANL A, #00000111b CJNE A, #00000111b, DETECTKEY AJMP K2 DETECTKEY: MOV P1, #11111110B MOV A, P3 ANL A, #00000111b CJNE A, #00000111b, ROW0 MOV P1, #11111101B MOV A, P3 ANL A, #00000111b CJNE A, #00000111b, ROW1 MOV P1, #11111011B ; CHECK ROW2 (2 6 A E)
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; CHECK FOR ANY KEY PRESSED

; CHECK ROW0 1 (0 4 8 C)

; CHECK ROW1 (1 5 9 D)

Digital IC Tester MOV A, P3 ANL A, #00000111b CJNE A, #00000111b, ROW2 MOV P1, #11110111B MOV A, P3 ANL A, #00000111b CJNE A, #00000111b, ROW3 LJMP K2 ; GO TO START TO CHECK KEY RELEADSED ; CHECK ROW3 (3 7 B F)

ROW0:MOV DPTR, #KEYCODE0 LJMP FIND ROW1:MOV DPTR, #KEYCODE1 LJMP FIND ROW2:MOV DPTR, #KEYCODE2 LJMP FIND ROW3:MOV DPTR, #KEYCODE3 LJMP FIND FIND: RRC A JNC MATCH INC DPTR SJMP FIND MATCH: mov r0, #50h CLR A
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Digital IC Tester MOVC A,@A+DPTR MOV R4, A Cjne a, #45H, x1 ljmp enter x1: cjne a,#52H,x2 ljmp reset1 x2: SUBB A,#30H MOV B,A mov @r0,B inc r0 inc r1 CLR A MOV A,R6 CJNE A,#00H, KEYOUT2 INC R6 LCALL KEYOUT1 LCALL KEYOUT KEYOUT3:LJMP K KEYOUT2: LCALL KEYOUT SJMP KEYOUT3 KEYOUT1:MOV A,#0CH LCALL COMMAND
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Digital IC Tester MOV A,#0C4H LCALL COMMAND RET KEYOUT :MOV A,#06H LCALL COMMAND MOV A,R4 LCALL DATA1 RET enter: mov a,@r0 mov r7,a dec r0 mov a,@r0 swap a orl a,r7 mov b,a cjne r1,#04h,e3 e1: mov dptr,#enter1 mov r5,#00h movc a,@a+dptr cjne a,b,e2 mov p2,r5 sjmp Q
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Digital IC Tester e2: inc r5 inc dptr sjmp e1 e3: mov r5,#08h mov dptr,#enter2 movc a,@a+dptr cjne a,b,e4 mov p2,r5 SJMP Q e4: inc r5 inc dptr sjmp Q reset1:lcall lcdinit ljmp MAIN DEBOUNCE: MOV R2,#255 HERE1 :MOV R5,#255 HERE : DJNZ R5,HERE DJNZ R2,HERE1 RET MSG1: DB "ENTER IC NO:- " enter1:db '00','02','04','08','32','86','83','95' enter2: db '86','51'
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Digital IC Tester KEYCODE0 : DB '0','1','2' KEYCODE1 : DB '3','4','5' KEYCODE2 : DB '6','7','8' KEYCODE3 : DB '9','E','R' Q:NOP END

PROGRAM FOR SLAVE CONTROLLER:

l1:

mov a,p0 cjne a,#0h,l1

mov a,p0 mov dptr,#t11 movc a,@a+dptr t11:db 01h,02h,03h,04h,05h,06h,07h,08h,09h,0ah cjne a,#01h,y1 nand0: mov r0,#00h mov r1,#00h mov r2,#00h

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Digital IC Tester mov r3,#00h mov r4,#00h nand1 : lcall n00 acall nand2 lcall n01 acall nand2 lcall n10 acall nand2 lcall n11 acall nand6 nand2:jnb p0.2,nand3 ;CHECK THE OUTPUT inc r0 nand3:jnb p0.5,nand4 inc r1 nand4:jnb p2.1,nand5 inc r2 nand5: jnb p2.4,a11 inc r3 a11: ret nand6:jb p0.2,nand7 inc r0
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;CHECK FOR INPUTS 00

; CHECK FOR INPUTS 01

; CHECK FOR INPUTS 10

; CHECK FOR INPUTS 11

;INCREMENT R0

; INCREMENT R1

;INCREMENT R2

; INCREMENT R3 ;RETURN

Digital IC Tester nand7:jb p0.5,nand8 inc r1 nand8:jb p2.1,nand9 inc r2 nand9:jb p2.4,a1 inc r3 a1: y1: ljmp w cjne a,#02h,y2 ;A=1010 AND B=1011

adder:setb p0.4 clr p2.5 clr p2.3 clr p2.1 setb p0.7 clr p0.2 setb p0.0 setb p2.2 setb p2.6 clr p0.3 setb p2.7

jnb p2.0,adder1 inc r0 adder1:jb p0.5,adder2

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Digital IC Tester inc r0 adder2:jnb p0.1,adder3 inc r0 adder3:jb p2.6,adder4 inc r0 adder4:jnb p2.4,adder5 inc r0 adder5:cjne r0,#05h,adder6 setb p1.2 setb p3.7 ljmp q adder6:setb p3.6 y7: cjne a,#8h,y8

shiftreg:mov p0,#40h clr p2.1 setb p2.2 setb p2.7 nop jnb p2.6,s1 inc r0 s1: clr p2.2 lcall delay
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Digital IC Tester setb p2.2 jnb p2.5,s2 inc r0 s2: clr p2.2 lcall delay setb p2.2 jnb p2.4,s3 inc r0 s3: clr p2.2 lcall delay setb p2.2 jnb p2.3,s4 inc r0 s4: cjne r0,#04h,s5 setb p1.2 setb p3.7 ljmp q s5: setb p3.6 ljmp q delay: mov r7,#0ffh delay2:mov r6,#0ffh delay1:djnz r6,delay1
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;DELAY

Digital IC Tester djnz r7,delay2 y8: cjne a,#9h,y9

mux: mov r0,#00h clr p0.6 clr p0.7 mov p2,#80h setb p0.3 jnb p0.4,mux1 inc r0 mux1: clr p0.3 mov p2,#84h setb p0.2 jnb p0.4,mux2 inc r0 mux2: clr p0.2 setb p0.1 mov p2,#82h jnb p0.4,mux3 inc r0 mux3: clr p0.1 setb p0.0 mov p2,#86h
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Digital IC Tester jnb p0.4,mux4 inc r0 mux4: clr p0.0 setb p2.3 mov p2,#81h jnb p0.4,mux5 inc r0 mux5: mov p2,#85h jnb p0.4,mux6 inc r0 mux6: mov p2,#83h jnb p0.4,mux7 inc r0 mux7: mov p2,#87h jnb p0.4,mux8 inc r0 mux8: cjne r0,#8h,mux9 setb p1.2 setb p3.7 sjmp mux10 mux9: setb p3.6 mux10:ljmp q
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Digital IC Tester y10: mov p0,#00100000b ljmp q ;INPUTS 00 n00: clr p0.0 clr p0.1 clr p0.3 clr p0.4 clr p2.3 clr p2.2 clr p2.6 clr p2.5 ret ;INPUTS 01 n01: clr p0.0 setb p0.1 clr p0.3 setb p0.4 clr p2.3 setb p2.2 clr p2.6 setb p2.5 ret
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Digital IC Tester ;INPUTS 10 n10: setb p0.0 clr p0.1 setb p0.3 clr p0.4 setb p2.3 clr p2.2 setb p2.6 clr p2.5 ret ;INPUTS 11 n11: setb p0.0 setb p0.1 setb p0.3 setb p0.4 setb p2.3 setb p2.2 setb p2.6 setb p2.5 ret w: cjne r0,#4h,x setb p1.2
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Digital IC Tester inc r4 x: cjne r1,#4h,y setb p1.3 inc r4 y: cjne r2,#4h,z setb p1.4 inc r4 z: cjne r3,#4h,z3 setb p1.5 inc r4 z3: cjne r4,#04h,q1 setb p3.7 lcall q q1: setb p3.6 lcall q q: nop end

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Digital IC Tester

EXPERIMENTAL OBSERVATIONS

Problems & Trouble shooting

Problems do occur even with perfect designed circuit the problems that are faced during the project Use of NOP command Considerable delays Supply and ground to IC Operating system for downloading hex code

Even though there are no errors in the code and the logic is also correct, sometimes there will be a distraction on the LCD screen during displays we have to use the NOP command- No Operation command adequate number of times such that there doesnt occur any characters other than the desired ones.

Considerable delays are to be given during the issue of control commands to LCD. We know that controller is faster than the external I/O devices. So we use delays in between the issue of control and data commands to LCD screen.

While writing procedures for the IC to be tested, the first step is to give supply and ground connections to the IC and later proceed with the testing code. Without giving supply and ground connections to IC, if we implement the code that is, first the logic later the supply
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Digital IC Tester connections, the logic will not work i.e., it is futile. So always keep in mind that, be sure of supply and ground connections and later proceed with the logic.

It is better to implement the design of the code in either Windows NT or windows XP operating system for downloading the hex code in to controller board. The .exe files are compatible for Windows NT or windows XP operating system but not recommended for Windows 95 or windows 98. It is recommended to work with windows 2000 professional operating system

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Digital IC Tester

CONCLUSIONS

The project has been successfully completed and the main objective of emulating an IC tester on 89c51 micro controller has been achieved. For a given specification any IC can be checked for its functionality. It takes more time to test an IC manually, with the implementation of the system with microcontroller makes the testing procedure simpler. So we conclude that any digital IC with the given specifications can be implemented on IC tester circuit. This system is capable of testing the ICs having up to 24 pins.

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Digital IC Tester

FUTURE SCOPE OF WORK

This digital IC tester can test various digital IC families just by the software updating. In this project the code is written for 10 ICs which can be extended to digital families of 74XX and 40XX, but the code written might be reaching out of bounds of memory that is available in the microcontroller. That is due to the RAM may not be sufficient to support the whole code so we have to interface extra memory chips. The availability of large memory capacity makes the PIC processor the best suited surrogate for microcontroller with optimal features. So far the IC to be tested is mounted on the ZIF socket, and the respective details of the IC are selected form the menu provided in the micro controller board. This in turn produces the results by displaying if the IC is working or not by mentioning the gates. One special feature which makes this project, true equipment for industrial purpose is that to have a search procedure included in it. The search procedure is used, so that if we place an IC in the ZIF socket the entire process of identifying the IC and then selecting and sending the inputs to the ICs should be done by this procedure. This circuit has been designed with an aim to test an IC having up to 24 pins. So necessary steps should be taken in order to utilize this project to be implemented for digital ICs having pins more than 24.

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Digital IC Tester

COMPONENT LIST & BILLING

Sr.
No. 1 2 4 5 6 COMPONENTS AT 89C51 LCD MODULE KEYPAD ZIF SOCKET CAPACITORS SPECIFICATIONS 4 8 BIT I/O PORT, 128KB FLASH 4KB RAM 16X2 4X3 MATRIX 24 PINS 10F(25V), ELECTROLYTIC 33pF CERAMIC 1000 F(25V), ELECTROLYTIC) 0.1 F(25V), ELECTROLYTIC) 1 F(25V), ELECTROLYTIC) 7 RESISTORS 8.2K(1/4W) 10k(1/4W) 100 (1/4W) 1k(1/4W) 8 RESISTOR STACK 4.7K(9 PIN) 4.7K(8 PIN) CRYSTAL 9 10 DIODE LEDS 11.059 MHZ 1N4007 RED GREEN 11 IC 7805 +5V regulator QTY 2 2 1 1 1 4 1 1 1 2 1 4 1 2 1 2 4 2 2 1 PRICE (RS) 120 200 120 90 2 4 3 2 2 2 1 2 1 6 3 20 8 2 2 12

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Digital IC Tester

12 13

POWER CONNECTOR RELIMENTS (2X2) (4x4) (8X8)

1 2 1 4 1 1 1 1 1 1 1

8 20 15 60 30 10 5 45 150 75 10 200

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CONNECTOR

16 PIN 7 PIN

15 16 17

SWITCH TRANSFORMER PCB

PUSH BUTTON TYPE 230V-9V STEP DOWN, 500 mA MICROCONTROLLER BOARD ZIF SOCKET BOARD POWER SUPPLY BOARD

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CASING TOTAL

1230

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Digital IC Tester

REFERENCES

I.

The 8051 micro-controller and embedded systems by MAZIDI. Kenneth J.Ayala, The 8051 Microcontroller, Penrum International Publications www.alldatasheet.com

II.
III.

SOFTWARE USED

I. II.

NOVARM DIP TRACE: for PCB layout PG4UW BY ELNEC SOFTWARES

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