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  • Guide to Types of Microscopy Techniques & Their Uses

    Transféré par

    Suresh Mg
    19 vues1 page
    This document provides a summary of different types of microscopy, including their probes, techniques, best resolutions, penetration depths, uses, and constraints. Optical microscopy uses visible light and has a resolution of around 200 nm. Near-field optical microscopy can achieve 10 nm resolution but samples must be biological. X-ray microscopy uses x-rays, has a resolution of around 20 nm, and can identify and map elements but requires vacuum conditions. Scanning electron microscopy uses electrons for 1 nm resolution imaging of surfaces in vacuum.

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    Types of Microscopy

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    This document provides a summary of different types of microscopy, including their probes, techniques, best resolutions, penetration depths, uses, and constraints. Optical microscopy uses visible light and has a resolution of around 200 nm. Near-field optical microscopy can achieve 10 nm resolution but samples must be biological. X-ray microscopy uses x-rays, has a resolution of around 20 nm, and can identify and map elements but requires vacuum conditions. Scanning electron microscopy uses electrons for 1 nm resolution imaging of surfaces in vacuum.

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    19 vues1 page

    Guide to Types of Microscopy Techniques & Their Uses

    Transféré par

    Suresh Mg
    This document provides a summary of different types of microscopy, including their probes, techniques, best resolutions, penetration depths, uses, and constraints. Optical microscopy uses visible light and has a resolution of around 200 nm. Near-field optical microscopy can achieve 10 nm resolution but samples must be biological. X-ray microscopy uses x-rays, has a resolution of around 20 nm, and can identify and map elements but requires vacuum conditions. Scanning electron microscopy uses electrons for 1 nm resolution imaging of surfaces in vacuum.

    Droits d'auteur :

    Attribution Non-Commercial (BY-NC)
    Téléchargez comme PDF, TXT ou lisez en ligne sur Scribd
    Signaler comme contenu inapproprié
    sur 1

    TypesofMicroscopy

    Type
    Optical Microscopy

    Note: this table is intended as a simple guide. Actual performance and usage may be different in certain applications.

    Probe
    Visible Light

    Technique
    Detect reflected light (opaque samples) or transmitted light (transparent samples). Light focused using lenses. Detect reflected light (opaque samples) or transmitted light (transparent samples). Uses an aperture very close to the sample surface. Image derived from x-ray scattering or interference patterns. X-rays focused using a zone plate (Fresnel lens). Detect electrons back-scattered by the sample. Electrons focused using electromagnets. Detect electrons scattered as they move through the sample. Electrons focused using electromagnets. Detect ions back-scattered by the sample. Ions focused using electromagnets.

    Best Resolution
    ~200 nm

    Penetration
    Surface or volume (can probe through transparent materials) Surface or volume (can probe through transparent materials) Surface or volume (x-rays can penetrate some materials) Surface

    Uses and Constraints

    Near-Field Optical Microscopy (NSOM)

    Visible Light

    ~10 nm

    Biological samples.

    X-Ray Microscopy (TXM, SXM, STXM)

    X-Rays

    ~20 nm

    Can be tuned to specific frequencies to provide element identification and mapping. Sample must be in a vacuum.

    Scanning Electron Microscopy (SEM)

    Electrons

    ~1 nm

    Transmission Electron Electrons Microscopy (TEM, STEM)

    ~0.05 nm

    Volume

    Samples must be <100 nm thick.

    Focused Ion Beam (FIB)

    Ions

    ~10 nm

    Surface

    Due to the large masses of the ions, this probe can be destructive to the surface of the sample. Therefore, it can also be used to etch the sample. Sample must be conductive material and must be in a vacuum. Can be used to manipulate atoms on the sample surface. Can be used to manipulate atoms on the sample surface. Sample must be ferromagnetic or paramagnetic.

    Scanning Tunneling Microscopy (STM)

    Cantilever Tip

    Detect the quantum tunneling current of electrons from the sample to the probe tip.

    ~0.1 nm

    Surface

    Atomic Force Microscopy (AFM) Magnetic Force Microscopy (MFM)

    Cantilever Tip

    Detect the electrostatic force between the sample and the probe tip.

    ~0.1 nm

    Surface

    Cantilever Tip

    Detect the magnetic force between the ~10 nm sample and the probe tip.

    Surface

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