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Welcome

Andy Howard Senior Applications Engineer Agilent EEsof

Copyright 2012 Agilent Technologies April 5, 2012

Fast Characterization of Power Amplifier Performance with Modulated Signals

Efficient simulations with swept-power, modulated signals Agilent EEsof EDA


Andy Howard Applications Engineer April 5, 2012

Copyright 2012 Agilent Technologies April 5, 2012

Power amplifier design and characterization has become more complex


Characterizing amplifier performance with sinusoids is no longer sufficient Need to know ACLR, EVM, output power, etc. Need to know performances versus power and at specific output powers How should design parameters be adjusted to improve performance? Need to know statistical distributions of performances

Copyright 2012 Agilent Technologies April 5, 2012

Two Solutions
1) Simulate nonlinearity using 1-tone HB power sweep. Apply modulated signal to nonlinearity in post-processing. Interpolate to get data at specific output power. Repeat for each Monte Carlo trial or swept parameter value. 2) Use Ptolemy cosimulation and Automatic Verification Modeling. Interpolate to get data at specific output power. Repeat for each Monte Carlo trial or swept parameter value.
Solution 1: somewhat faster, but less accurate. Solution 2: more accurate and more information.

Copyright 2012 Agilent Technologies April 5, 2012

Two Solutions
1) Simulate nonlinearity using 1-tone HB power sweep. Apply modulated signal to nonlinearity in post-processing. 2) Use Ptolemy cosimulation and Automatic Verification Modeling.

Copyright 2012 Agilent Technologies April 5, 2012

Weve offered this technique for a while, so whats new?


Parameter sweep or Monte Carlo analysis now allowed See correlations between statistical variables and results Data now available at user-specified output power(s) no need to re-simulate or run an optimization

Copyright 2012 Agilent Technologies April 5, 2012

To carry out this technique, what do you need?


Modulated signal or baseband I and Q data Main, adjacent, and alternate, channel frequency limits for ACPR calculation An example from which you copy the setup

Copyright 2012 Agilent Technologies April 5, 2012

Many modulated signals could be used (only have to create file once)
From a simplified Ptolemy example Could use baseband I and Q data Could use data from Signal Studio

Could use same signal with which you test real amplifier
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Run swept power HB simulation of amplifier

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Apply modulated signal to simulated amplifiers nonlinearity


Amplifier nonlinearity Ideal and distorted output trajectories

Input trajectory

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ACPR, EVM, output power computed via equations


EVM is computed from delta at each time point Ideal and distorted output trajectories

ACPR is computed from Output spectrum

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Display swept-power (from scaling input signal amplitude) and interpolated results
Interpolation gives data at specified output power
Fast plots update instantly

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Copyright 2012 Agilent Technologies April 5, 2012

Speed up calculation by specifying subset of modulated time sequence

Using ..EDGE_Sig[0::500]

Using ..EDGE_Sig[0::5000]

Using ..EDGE_Sig - All time points included

Trade accuracy for calculation speed.


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Shorter sequence gives very similar results as longer one


501 vs 5001 time points ~8 seconds vs. ~42 seconds

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Run Monte Carlo to see statistical variation


1072 seconds required Dataset: 866 kbytes

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With shorter sequence, only slight changes


217 seconds required Dataset: 751 kbytes

These data are only slightly different.


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New specified output power; histograms and data update instantly no need to re-simulate

Higher output power -> higher distortion, as expected.


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We now know the statistical variation. Which statistical variables matter?

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Scatter plots show correlations - ACPR

ACPR improves with increasing TL width Little correlation with dielectric constant

ACPR improves with increasing drain bias Little correlation with gate bias

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Scatter plots show correlations - EVM

No correlation with dielectric constant

EVM improves with increasing TL width

EVM improves with increasing drain bias Little correlation with gate bias

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Could design parameters be changed to attain better performance?

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Sweeping a parameter to seek better performance

Variables defined in subcircuit can also be swept

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Performance varies with transmission line length

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Sweeping one parameter at a time is inefficient


Use Monte Carlo to investigate multiple design parameters simultaneously Design variables allowed to vary uniformly over large range. All values within range are equally likely.

Similar to running a multi-dimensional parameter sweep


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Big variation in performance

Minimum ACPRs while delivering 26 dBm

Corresponding variable values (lengths and widths in mils)


25 Copyright 2012 Agilent Technologies April 5, 2012

Which design variables affect Pout_dBm?


Want 26 dBm Pout, but not all sets of parameter values enable this

Better performance

Better performance

Better performance

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Which design variables affect ACPR?

Better performance

Better performance

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Copyright 2012 Agilent Technologies April 5, 2012

Using this technique effectively


Use as many design variables as you want. Simulation time only determined by number of Monte Carlo trials. Correlations indicate which variables matter Best parameter values update as you change specified output power Iterate (re-run Monte Carlo) after adjusting parameter value ranges based on best set of parameter values

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Copyright 2012 Agilent Technologies April 5, 2012

Two Solutions
1) Simulate nonlinearity from 1-tone HB power sweep. Apply modulated signal to nonlinearity. 2) Use Ptolemy cosimulation and Automatic Verification Modeling.

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Copyright 2012 Agilent Technologies April 5, 2012

Weve offered this technique for years, so whats new?


Power sweeps now run much more efficiently See correlations between statistical variables and results Data now available at user-specified output power(s) no need to re-simulate or run optimizations

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Copyright 2012 Agilent Technologies April 5, 2012

Using Ptolemy cosimulation


EVM measurement ACLR measurement DC power consumption measurement

EDGE source

Power amplifier subcircuit

Input power sweep

Output power measurement

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Copyright 2012 Agilent Technologies April 5, 2012

Power amplifier subcircuit

Co-simulation requires Envelope controller Time step must be set should match source time step Variables copied from EDGE source. Stop time setting is ignored
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Use Fast Cosimulation (Automatic Verification Modeling)


Creates and simulates behavioral model -- but only if something in the circuit changes Simulates orders of magnitude faster than full transistorlevel model

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Simulation results
Specify desired output power. Data is interpolated to find values corresponding to this power level.

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Run Monte Carlo to see statistical variation

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Swept parameter results same transmission line swept

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Comparing simulation results

Results are similar, but not Identical. Differences increase at highest output Powers.

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Comparing the methods


Ptolemy cosimulation advantages: - Specification-compliant measurements - Can include receive-side filtering, if required - Power-added efficiency (PAE) is computed Swept-power harmonic balance simulation advantages: - Faster (but less accurate) for short time sequences - Can be used with any source

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Conclusions
ADS enables fast characterization of amplifier performance Powerful post-processing capabilities Understand statistical variation of your design Understand which variables matter

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Copyright 2012 Agilent Technologies April 5, 2012

Examples shown are available here:


(Agilent EEsof Knowledge Center login required) http://edocs.soco.agilent.com/display/eesofkc/Computing+Swept+Input+Power+ACPR http://edocs.soco.agilent.com/display/eesofkc/ Swept+Power+ACPR%2C+EVM%2C+and+PAE+from+Ptolemy+Co-simulation

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Copyright 2012 Agilent Technologies April 5, 2012

You are Invited:

Hsieh-Hung Hsieh (PhD Technical Manager / RF Design Program TSMC

George Estep RFIC Application Development Enginee Agilent EEsof You can find more webcasts www.agilent.com/find/eesof-innovations-in-eda www.agilent.com/find/eesof-webcasts-recorded
Copyright 2012 Agilent Technologies April 5, 2012

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