Checksum TR - 4 - Automated Test System - Instr Manual PDF

Model TR-4/6 Automated Test System INSTRUCTION MANUAL
CheckSum, Inc. P.O. Box 3279 Arlington, WA 98223 (360) 435-5510 Web Site: www.checksum.com
P/N 4400-010 Revision 12/2003 Copyright 1990-2003 - CheckSum, Inc. - all rights reserved Litho in U.S.A.
Specifications and operational characteristics of the System are subject to change. CheckSum, Inc. cannot take responsibility for any direct or consequential damages arising from use of this manual or the related product.
IBM-PC, IBM-XT, and IBM-AT are trademarks of International Business Machines, Inc. MS-DOS is a trademark of Microsoft Inc. OrCad is a trademark of OrCad Systems Corp. CadStar is a trademark of Racal-Redac.
Table of Contents
Chapter 1 Introduction Getting Started System Overview Chapter 2 Operational Overview Installation Connection to the UUT Creating a Spec File Testing an Assembly Chapter 3 Specifications Model TR-4 MDA System Model TR-6 Functional Test System Model TR4/6 CheckSum Test System Software Model RM-1 Relay Module Model GPIB IEEE-488 Interface System Configuration Chapter 4 Theory of Operation Model TR-4 Overview Current Mode Voltage Mode Model TR-6 Overview Measurement Guidelines Chapter 5 Installation Instructions Overview Model TR-4 System Module Installation Model MPX-3-200/TR-4-1D MPX Module Installation Model TR-6 System Module Installation Model TR-6-1 Relay MPX Module Installation Accessory Module Installation Completing the Hardware Installation CheckSum Test System Software Installation Connection to the UUT 1-1 1-2
2-1 2-4 2-5 2-7
3-1 3-6 3-13 3-15 3-15 3-18
4-1 4-2 4-6 4-11 4-16
5-1 5-3 5-6 5-9 5-9 5-10 5-13 5-14 5-19
CheckSum Model TR-4/6 Manual
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Chapter 6 Testing an Assembly Overview Selecting the Proper Spec Data Performing the Test Concluding the Test Chapter 7 Learning an Assembly Overview Assembly Learn Menu Assigning Connection Information Enter/Edit Spec Data Autolearn/Autoguard Use and Configuration QuickGuard Configuration Measurement Analysis Nominal Fit Dynamic Point Analysis Edit/Enter Continuity Test Data Edit/Enter IC Test Data DMM Interactive Control UCT Interactive Control Assigning Operator Messages Global Spec File Operations Edit/Enter Fixture-Check Data Special Features Assign Other Measurement Characteristics Auto Programming Translating Spec Data To and From an ASCII File Assign Measurement Characteristics Assign Operator Setup Screen Printing Specification or Wire List Data Testing Multi-PCB Panels Multi-PCB Panel Configuration Testing Digital Logic Chapter 8 CAD Data Conversion Overview Generating the Spec File CAD Conversion Selections Menu Enter/Edit Reference Designator Template Selective Spec Data Generation Notes on P-Cad Data Conversion Notes on Mentor Data Conversion
6-1 6-4 6-8 6-12
7-1 7-3 7-6 7-8 7-13 7-16 7-18 7-22 7-25 7-28 7-33 7-36 7-38 7-40 7-42 7-45 7-46 7-48 7-50 7-54 7-56 7-58 7-60 7-61 7-65 7-69
8-1 8-2 8-4 8-8 8-9 8-12 8-14
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Chapter 8 Notes Notes Notes Notes Notes Notes Notes Notes Notes Notes Notes
CAD Data Conversion, continued on OrCAD Data Conversion on HP-BCF Data Conversion on Cadence Data Conversion on Racal-Redac Data Conversion on ViewLogic Data Conversion on Tango Data Conversion on ComputerVision Data Conversion on Pads2000 Data Conversion on Schema Data Conversion on Scicards Data Conversion on Fabmaster Data Conversion
8-16 8-18 8-19 8-20 8-22 8-24 8-26 8-29 8-31 8-32 8-33
Chapter 9 Statistical Analysis Statistical Process Control Reporting Chapter 10 Configuring the System Overview Model TR-4 Module Configuration Model TR-6 Module Configuration Other Hardware Configuration Assign Passwords and Password Privileges Configure Test Environment Configure SPC Logging & Automatic Reporting Configure Test Reports Chapter 11 Test Type Descriptions Analog Measurement Test Types Analog Stimulus Test Types Digital Test Types Transfer of Control Test Types Message Test Types User-Defined Tests Memory Manipulation Test Types General Purpose Interface Bus I/O Miscellaneous Tests Wiring Diagrams Sample Reports Command Line Parameters In Case of Problems Error Messages Glossary Example Spec File Segments Index
9-1
10-01 10-03 10-06 10-09 10-12 10-14 10-16 10-19
11-04 11-28 11-33 11-41 11-51 11-57 11-59 11-67 11-77 Appendix A Appendix B Appendix C Appendix D Appendix E Appendix F Appendix G
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Figures & Illustrations

Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 1-1 2-1 4-1 4-2 4-3 4-4 4-5 4-6 4-7 4-8 4-9 4-10 4-11 4-12 5-1 5-2 5-3 5-4 5-5 5-6 5-7 5-8 5-9 6-1 6-2 6-3 6-4 6-5 6-6 6-7 7-1 7-2 7-3 7-4 7-5 Title System Block Diagram Module Orientation Current Mode Block Diagram External Sensing Diagram Circuit with Parallel Components Circuit with Current Guarding Voltage Mode Block Diagram Series LR Model Parallel RC Model Series RC Model Offset Circuit with Voltage Guarding Choosing Voltage Mode Guards Choosing Current Mode Guards Module Configuration CheckSum Module Base Address Jumpering Aux I/O Pinout Model MPX-3/TR-4-1D MPX Installation System Menu Configure/Install System Menu Model MPX-3/TR-4-1D Test Point Pin-Out Model TR-6-1 Test Point Pin-Out Model TR-6 System Module Pin-Out System Menu File Selection Menu File Selection List Spec File Execution Parameters Testing Display Halt on Failure for Continuity Screen Test Completed Menu Assembly Learn Menu Assign Connection Information Screen Enter/Edit Spec Data Screen Autolearn Configuration Select QuickGuard Points Screen Page Number 1-3 2-2 4-2 4-3 4-5 4-5 4-6 4-7 4-7 4-8 4-8 4-10 4-18 4-18 5-2 5-3 5-5 5-8 5-16 5-17 5-19 5-20 5-21 6-2 6-4 6-6 6-7 6-8 6-11 6-12 7-3 7-6 7-8 7-13 7-16
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Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 7-6 7-7 7-8 7-9 7-10 7-11 7-12 7-13 7-14 7-15 7-16 7-17 7-18 7-19 7-20 7-21 7-22 7-23 7-24 7-25 7-26 7-27 7-28 7-29 7-30A 7-30B 7-31 8-1 8-2 8-3 8-4 8-5 8-6 8-7 8-8 8-9 8-10 8-11
Title Measurement Analysis Display Nominal Fit Display Dynamic Point Analysis Screen Edit/Enter Continuity Test Data Screen Edit/Enter IC Test Data DMM Interactive Control Menu UCT Interactive Control Menu Assign Operator Messages Screen Global Spec File Operations Menu Edit/Enter Fixture-Check Data Screen Special Features Menu Assign Other Measurement Characteristics Menu Autoprogram UUT Menu Autoprogram UUT Parameters Resistance Measurement Characteristics Screen Operator Setup Entry Screen Spec File Report Device Selection List Testing Display with Multi-PCB Panels Skip PCBs in Panel Test Completed Display with Multi-PCB Panels Multi-PCB Panel Configuration Menu Panel Configuration Screen PCB Wiring Assignments Screen Example Circuit for Logic Test Logic Test File for Test Steps of Example Spec File Example Logic Spec File in ASCII Format G-80-ODM Input/Output Pin Mapping When Connected to a Model G-80 CAD Conversion Selections Menu Example Fixture Wiring List Example Exception Report Enter/Edit Reference Designator Template Screen Selective Spec Data Generation Menu P-Cad Net List Format P-Cad Materials List Format Mentor Net List Format Mentor Component List Format OrCAD Cross-Reference File Format HP-BCF File Format
Page Number 7-19 7-22 7-25 7-30 7-34 7-36 7-38 7-40 7-42 7-45 7-46 7-48 7-51 7-52 7-56 7-58 7-60 7-61 7-62 7-63 7-65 7-67 7-68 7-71 7-72 7-72 7-73 8-4 8-5 8-7 8-8 8-10 8-12 8-13 8-14 8-15 8-16 8-18
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Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 8-12 8-13 8-14 8-15 8-16 8-17 8-18 8-19 8-20 8-21 8-22 8-23 8-24 9-1 10-1 10-2 10-3 10-4 10-5 10-6 10-7 10-8 10-9 10-10 10-11 10-12
Title Cadence Net List Format Racal-Redac Net List Format Racal-Redac Materials List Format ViewLogic Net List Format Tango Net List Format ComputerVision Net List Format Modified Mentor Component List Format Pads2000 Net List Format Pads2000 Component List Format Scicards CAD Data Format Fabmaster Net List Format Fabmaster Materials List Format Fabmaster Nails File Format Statistical Analysis Menu Configure/Install System Menu Model TR-4 Module Configuration Screen Model TR-6 Module Configuration Screen Model TR-6 Calibration Screen Other Hardware Configuration Screen Configure Accessories & Fixture Screen Password Access Menu Configure Test Environment Menu Configure SPC Logging & Automatic Reporting Menu Configure Test Report Menu Configure Test Report Header Items Menu 80-Column Test Report Fields Menu
Page Number 8-19 8-20 8-21 8-23 8-25 8-27 8-28 8-29 8-30 8-32 8-33 8-34 8-35 9-1 10-1 10-4 10-7 10-9 10-10 10-11 10-13 10-14 10-16 10-19 10-21 10-22
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Limited Warranty
CheckSum, Inc. products, exclusive of fixturing products, are covered by a one-year limited parts and labor warranty for defects in materials and workmanship from time of original product shipment. Fixturing products (Model TR-3/TR-5/TR-7 series and Model GS-850) include a 90-day limited warranty. This warranty extends only to the original purchaser and excludes products or parts that have been subject to misuse, neglect, accident, or abnormal conditions of operations. CheckSum, Inc. reserves the right to replace the product in lieu of repair. If the failure has been caused, as determined by CheckSum, by misuse, neglect, accident, or abnormal conditions of operation, repairs will be invoiced at a nominal cost. In such case, an estimate will be submitted before the work is started, if requested.
THE FOREGOING WARRANTY IS IN LIEU OF ALL OTHER WARRANTIES, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO ANY IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS, OR ADEQUACY FOR ANY PARTICULAR PURPOSE OR USE. CHECKSUM, INC. SHALL NOT BE LIABLE FOR ANY SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES, WHETHER IN CONTRACT, TORT, OR OTHERWISE.
In the event of a failure of a product during the warranty period: 1. Contact CheckSum for a returned material authorization number (RMA). 2. Pack the product in its original packing material or suitable equivalent and return it postage-paid to CheckSum, Inc.. Mark the package clearly with the RMA number. 3. CheckSum will repair the product and return it postage-paid. Repairs are typically completed within two working days of receipt. In the event that expedited repair is necessary, call CheckSum for information. In many cases a replacement module can be provided immediately.
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Introduction
Getting Started
This instruction manual is for use with the CheckSum Model TR-4 Manufacturing Defects Analyzer (MDA) System, the CheckSum Model TR-6 Functional Test System, or the combined Model TR-4/6 Test System. Since these Systems are based on a common hardware and software architecture, most descriptions are shared. Programming and use is very similar between the Systems, with the most significant exception being that test commands (Chapter 11) for controlling measurements and stimuli are specific to each of the Systems. In order to best serve your long-term needs, the Model TR-4 Manufacturing Defects Analyzer System and Model TR-6 Functional Test System contain a number of features and capabilities. Because of this, it may take you some time before you want (or need) to use all the features of the System. To help you get your System up and testing as quickly as possible, you might want to expedite your initial reading of the manual. The manual has been organized to support you in doing so. First, read this Introduction. You also might want to look over Appendix F, the Glossary, to become accustomed to the terminology used with the System. Then read through the next section of this manual, the Operational Overview. By this time, you will have a good general knowledge of what the System can do and how to navigate your way around. Finally, using the remainder of the manual as reference material, you can install your hardware and software, and begin experimenting with the System as you become familiar with its use. Check the software disk enclosed with your System. If it has a READ.ME file, print the READ.ME file for any last-minute information about System updates. If you run into problems or have questions, dont hesitate to call CheckSum for assistance. We are here to help you.
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System Overview
The CheckSum Model TR-4 Manufacturing Defects Analyzer System allows an IBM PC (or compatible) to efficiently test assemblies (such as cables, components and bare or assembled circuits) to find manufacturing defects such as opens, shorts, and incorrect or misoriented components. The System makes high-speed measurements for opens and shorts, resistances, capacitances, inductances, voltages and semiconductor junctions. For each test it makes a measurement of a pair of test points in the unit-under-test (UUT) and compares the outcome against individual, user-specified upper and lower test limits. The CheckSum Model TR-4 MDA Core System contains the System electronics for making measurements, CheckSoft Software, and this Instruction Manual. Test points are added in 200-test point increments (with Model TR-4-1 MPX Modules) to a maximum of 1600 test points. The Model TR-6 Functional Test System provides the capability to power- up the UUT and to apply stimulus and make measurements while powered-up. This can be used to confirm that the UUTs circuitry is functioning properly. The Model TR-6 Core System is comprised of a single, full-sized module that contains a DMM, Counter/Timer, Function Generator, Digital I/O, sixteen relay test points, fused power outputs, and four undedicated relays. The Model TR-6-1 Relay MPX Module expands the relay switching of the Model TR-6 in 50-test-point increments. Relay switch points are used when measuring low resistances or when the test points are subject to voltages greater than +/-12 volts (with respect to the PC chassis). The Model TR-6-2 Fixture Interface allows you to provide special functions near the UUT to help facilitate functional testing. These functions include switching high power to the UUT, buffering and conditioning of signals (e.g. frequency-dividing and redriving an oscillator signal from the UUT), and switching or disconnecting signals near the UUT to reduce capacitive loading or to support special signal cabling requirements. The Model-GPIB allows a Model TR-4 or TR-6 to use external IEEE-488 instrumentation to supplement testing operations. The software is designed to support the specific GPIB module supplied by CheckSum. The Model TR-4 and TR-6 Base Systems each provide eight digital I/O bits that can be used for control of external solid-state relays (such as those produced by Opto-22) for input or output, or for LS-TTL or CMOS-compatible logic for purposes of functional testing of the UUT. The Model TR-6 digital I/O can also directly control relays (it is open-collector). The TR-6 also supports output of DC voltages directly to several simultaneous test points (up to 16) through the Model TR-4 test points. These can be used to supply digital signals.
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If additional digital I/O points are needed, 96 more digital bits can be added with an optional CheckSum Model G-80 Digital I/O Module. The Model TR-6 or TR-4 can either be used on a standalone basis, or can be used in combination. When this is the case, the test points and other capabilities can be shared by the two Systems. The Model TR-6 can also be used with Model TR-4-1 (or TR-4-1D) MPX modules, even if a Model TR-4 Base System is not used.
Figure 1-1 - System Block Diagram You can provide your own fixturing that is compatible with the 50-pin ribbon cables provided with the System or purchase a fixture from CheckSum: 1. The CheckSum Model TR-3 Vacuum Fixture System provides bed-of-nails capability for testing bare or assembled PCBs. It uses a GenRad 2270-style receiver interface for interchangeable test heads. 2. The CheckSum Model TR-5 Mechanical Fixture Systems provide bed-of-nails capability for testing small bare or assembled PCBs. These mechanical fixtures are used for PCBs with up to 150 test points to provide a low-cost, compact fixture without the requirement for a vacuum source or fixture receiver.
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3. The CheckSum Model GS-850 Fixture System provides an interface to edge connectors or sockets that mate to the UUT. Each Model GS-850 Fixture can accommodate up to 240 test points via two removable adapter boards. Adapter boards are available prewired for common connector types or in breadboard format that you can customize for your UUT. Other System options include controllers (PCs) of various speeds and a foot switch that can provide operator input to the System. The System software provides the ability to program (learn) the test sequence for a UUT. The System can self-learn the opens and connections for a UUT, then allows you to easily add the component tests. The initial test data can also be entered via compatible CAD data if available. Once the UUT is learned, you may save the information (called the specification file, or spec file for short) on your System disk. It can be recalled later to test UUTs. Once a UUT is tested you may generate various types of test reports or gather statistics to help control the manufacturing process.
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Operational Overview
This section guides you through typical complete sequences for each major use of the System. These sequences include:
Installation Fixturing Creation of a Spec File for a UUT Testing a UUT
Read through this section to get an overview of each activity. Complete detail is not given in this section, so you will probably want to refer to the individual sections of the manual that describe each action in detail as you perform the task.
Installation
The Model TR-4/6 controller (PC) minimally requires an 80386 processor with a full-sized slot available for each module system or MPX module. The modules can be installed in either 8-bit or 16-bit slots. Figure 2-1 shows a suggested ordering of the modules, cable installation overview, and default base addresses. For a Model TR-4 MDA system, the Model TR-4 System Module is first installed in your PC. As delivered from CheckSum, it is jumpered to base address 768 (300 hex). For a Model TR-6 Functional Test System, the Model TR-6 System Module is first installed in your PC. As delivered from CheckSum, it is jumpered to base address 816 (330 hex). For a combined TR-4/6 System, install both the TR-4 and TR-6 modules in the order shown in Figure 2-1. Install a short 16-pin bus cable from the TR-4 connector (JP-1) to the TR-6 connector (JP-2). For every additional 50 test points of relay switching that are to be used (for Systems with a Model TR-6), install a Model TR-6-1 Module. The default base addresses for these
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modules are 832 (hex 340), 848 (hex 350), and so on. Install a two-wire bus connecting the TR-6 (JP-5) to each of the TR-6-1 modules (JP-2). For every 200 test points of solid-state switching that are to be used, an MPX (MPX-3-200 or TR-4-1D) Module is installed. As shipped, the first MPX-3-200 module is set to a base address of 672 decimal (2A0 hex, JP2 jumpers on positions 9, 7, and 5) and a Board Select setting of 1 decimal (1 hex, JP3 jumper on position 0). The TR-4-1D Modules are jumpered to 776 (hex 308), 780 (hex 30C), and so on. Connect the 16-pin bus cable to JP-1 on each MPX module. For a TR-4 System, connect the end of the cable to JP-1 on the TR-4 system module. For a System with a Model TR-6, connect the end of the 16-pin cable to JP-3 on the TR-6 system module. Note Plug the modules into your PC, taking normal safety and electrostatic discharge (ESD) precautions: turn off power and ground your body to the PC prior to installation. Ensure that the 50-pin test point ribbon cables are installed with each MPX Module during the installation. You might find it easier to install the MPX modules first to allow easier routing of the 50-pin cables.
Module Installation
Viewed from top of controller Test Points (16-pin bus) TR-4 System Module (Base 768) JP-1 JP-2 TR-6 System Module (Base 816) JP-3 TR-6-1 Relay MPX Modules (Base 832, 848,...) JP-2 " JP-2 TR-4-1 MPX Modules (Base 776, 780,...) JP-1 " JP-1 Other Modules (Model GPIB, RM-1) --JP-5 B a c k o f P C 1601-1616 1651-1700 1701-1750,... 1-200 201-400,... (2-pin bus) ---
Figure 2-1 - Module Orientation Once the hardware is installed, install the CheckSoft Software in your PC. If you have a hard disk, put the CheckSoft disk into A:, assign A:, then run the INSTALL program (type INSTALL[Enter]). If you dont have a hard disk, back up the CheckSoft disk (using
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DISKCOPY or similar tools), then put the CheckSoft disk into A: and assign it (A: followed by [Enter]). Start the CheckSoft Software by typing MDA[Enter]. At this point, you will see the System menu which is the hub of all System operations. When first installing the System, it is necessary to run a self-test. This ensures that the hardware is installed properly. It also performs some special accuracy and speed enhancement functions that allow your System to operate properly. Self-test is executed by selecting Configure/Install System from the System menu ([F4]), then [F1] Model TR-4 module configuration, and/or [F2] Model TR-6 module configuration as necessary. Once in the applicable module configuration screen, individually select each module installed in the System and press [F1] Self-test module. Once self-test has started, press the keys as prompted to sequence through the self-test. Once the System Modules are completed, test each MPX Module that is installed by selecting each at a time. As part of the MPX (MPX-3 and TR-4-1D) self-test process, the System will ask you to install a shorting fixture to each 50-pin ribbon cable in sequence. The shorting fixture is included with the TR-4 System and can be connected onto each cable, then removed with its ejection levers. As the MPXs are shorted, the System measures the zero-offset values associated with each test point. This is necessary to ensure full accuracy is achieved. Once self-test is completed, select Save configuration data on disk ([F8]) to save the setup information determined during the self-test for use next time the System is used. Saving configuration data on disk saves the current value for most selections of the Configure/Install System menu and its submenus. Saved values include most of the System operating characteristics such as self-test determined data, report configuration, active ports, and measurement characteristics. The Model TR-4 and TR-6 can be tested against external standards if desired. This can be used to meet standards of traceability for the Systems. The optional Model CM-3 Calibration Module provides software and hardware to test Model TR-4 Test System operation against values external to the System. You can confirm/characterize the values of the components on the Calibration Module in your calibration facility if desired. The Model TR-6 can be calibrated to external standards using a DMM and Multifunction Calibrator. This process determines calibration constants for the system to obtain full accuracy. This process is described in Chapter 10 of this Manual.
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Connecting to the UUT

The Systems measurements are made via test points available at the end of the 50-pin ribbon cables that come from the back of the Model TR-6 System Module, MPX-3-200/TR-4-1D Modules, and TR-6-1 MPX Modules. Each pin is called a port or test point. Each test point is completely universal in nature and can be connected to any UUT test point, although selection of test points between relay test points (TR-6) and solid state MPX points (TR-4) should be separated based on the nature of the UUT. Also, if you are using Model TR-4-1D modules, the first 16 points on each module are special in that they can be switched to digital points. The MPX-3-200 does not support digital I/O. For MDA testing (or TR-6 testing through the Model TR-4-1D test points), all MPX (MPX-3-200/TR-4-1D) test points (points 1-1600) are electrically equivalent and can be wired randomly. If you are not concerned with detailed pin and connection names for operator interaction and reports, it is not even necessary to know how the UUT is connected to the System for doing MDA opens and shorts testing. The System can self-learn a UUT without concern for user-assigned pin and connection names. For functional testing, you should use Model TR-6 (and TR-6-1) relay test points for nodes on the UUT that exceed +/- 12V with respect to the computer chassis, or points that you want to use for low-resistance TR-6 DMM measurements. You should use MPX-3/TR-4-1D test points whenever possible since they have the widest spectrum of capabilities (e.g., continuity testing, guarded measurements, signal sourcing). The pin-out of the MPX-3-200/TR-4-1D MPX Module is shown in Appendix A. Note that test points 1, 51, 101, and 151 are at the bottom of JP9, JP8, JP7, and JP6 respectively. Test points 1 - 200 are on the first MPX Module shown in the Set I/O module configuration display of the Configure/Install System menu. Test points 201 - 400 are contained on the second MPX Module shown in the display, and so on. If you are not sure about the pin out, use the Probe a pin feature available from the [F3] Assign Connection Information selection of the Assembly Learn menu. If you enable this feature, then touch a grounded probe to the port in question, the System will display the test point number. The Model TR-6 System Module signals are available at the back panel of the module. The TR-6 system module can be differentiated from the Model TR-6-1 MPX modules because the back panel connector is a special color (typically blue). The pin-out of this module is shown in Appendix A of this manual. The 16 test points available from this module are numbers 1601-1616. Note The Model TR-6 System Module back panel connector contains power supply voltages that could harm your fixture or UUT. Ensure that you do not route this cable to the wrong spot on your fixture.
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The Model TR-6 Relay MPX modules have 50 test points available at each back panel. These test points are numbered as 1651-1700, 1701-1750, and so on.
Creating a Spec File

The specification file (spec file) tells the System how to test an assembly (also called the unit-under-test or UUT). The spec file is typically generated once, saved on the disk, then used each time one or more of the same UUTs are tested. The spec file consists of a number of test steps, most of which can generate test results. Typical test types include CONT for continuity, RES for resistance tests, DMM for voltage and resistance measurements, UCT for frequency and time measurements, CAP for capacitance tests, INDUC for inductance tests and DIODE for semiconductor junction tests. For most of these test types, the test step contains upper and lower test limits, the two test point numbers and names, the measurement range, and a test title describing the component being tested. In addition, the spec file contains pin names (optionally assigned), the measurement characteristics (e.g., samples averaged for each reading), active ports, the assembly name (optional) and operator comments (optional instructions to the operator). Generating a spec file can be performed in several ways. All are available from the Learn an Assembly ([F2]) selection of the System menu. You may use the System in random sequences of configuration, learning, testing, and other operations. When you are satisfied that your PCs memory contains the proper spec data, save it to disk. Following is a typical programming sequence: The Assign Connection Information ([F3]) selection of the Assembly Learn menu allows you to enter names specific to your UUT into the System. When you do this, the System displays and reports will contain the names that you enter. Each pin name can be up to eight characters. The System can automatically assign sequential pin names as you probe the fixture, making this process quick and easy. The Assign Connection Information selection also allows you to specify which test points are active and inactive (ignored) when learning CONTinuity for an assembly. Once you have assigned pin names, you can use the [F8] Output Wire List Report selection of the Learn menu selection to generate a wiring list for the UUT. Use the Enter/Edit Spec Data screen ([F2] from the Assembly Learn menu) to enter a test type of CONT (continuity). Then select [F5] to get the Enter/Edit Continuity Test Data screen. Finally, use the [F6] selection to automatically learn the UUTs opens and shorts. Once the connections are learned, [ESC] back to the Enter/Edit Spec Data menu. For each component in the UUT, press [INS]sert, enter the two test point numbers (from and to port numbers) or pin names, the test type (e.g., RES, CAP, INDUC
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or DIODE), and the component name in the test title (e.g., R101). Then press [F5] for the System to measure the points, assign the range and test tolerances. Note that at times the measurement values will be different from the nominal values of the components that you are measuring. This is a normal case caused by interference from associated circuitry on the UUT. Even though the test limits may not represent the nominal value of the component, the System will still efficiently find most manufacturing faults because differences from the learned value are detected. These measurement differences can be minimized by careful selection of ranges and polarities used in the measurements, guarding, and the use of zero/scale values. The uses of these advanced features are described in detail in the Learning an Assembly chapter. The Theory of Operation chapter describes how the System makes measurements to allow you to make the best measurements if you run across problem components. Once the MDA tests are completed, you can use the Model TR-6 to power up the UUT, apply stimulus and make measurements of various signal points on the UUT. The Assign operator set-up screen, accessed from [F4], can be used to create a screen of text that the operator sees prior to beginning a test for each UUT. This text can be used for precautions, connection information, or other things that you would like to convey to the operator. Once you have entered the spec data, you will want to run a batch of UUTs through the System to verify that the tolerances are appropriate to meet the UUT-to-UUT and measurement variances. As you do this, if you encounter a failure that is not caused by a fault in the UUT, press the [F5] key while observing the failure. The System will adjust the test tolerances to accommodate the UUT that you are testing. Note that the [F5] key is hidden in the Testing display so that operators wont have a tendency to use it during production testing (it is also password-protected). You can use data logging in conjunction with the X-Bar/Sigma Control Report to help determine appropriate tolerances by analyzing the readings from the first few batches of UUTs tested. Output spec data report ([F7]) lists information about the spec data presently in memory. It may be sent to the CRT, a disk file or a printer. Output wire list report ([F8]) outputs a report that shows the correlation between tester port numbers and pin names that you have assigned. The report is sorted by both port numbers and pin names. Save spec data to disk ([F9]) is used to save the spec data for future use. This information is on the System disk. Consequently, when the spec file is loaded in the future this information will be restored to match the conditions when the spec file was saved.
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Testing an Assembly
Once you have generated a spec file for a UUT, the UUT may be tested. To test a UUT, select Test an Assembly ([F1]) from the System menu. You are then presented with the Select Spec Data File menu. Either enter [F2] and type in the spec file name or use the Select Spec Data File From List ([F3]) to choose the proper spec file. Once the proper spec file is loaded into memory, select Start Test With Present File ([F1]) to actually start the test. You may elect to single step or halt on failure from this display if you wish. If the test fails any points (and you have selected halt on fail), you are presented with a display describing the failure. You may either continue, abort or retry the test. Once the test is completed or aborted, you see the Test Completed menu. This menu allows you to either continue on to the next assembly in this run or to retest the present assembly. At any point you may also generate a report. The test report ([F3]) contains the actual measurements for the UUT. A failure-only report ([F4]) lists only the test values that failed. The batch report ([F5]) gives a summary of all of the UUTs tested in this run.
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Specifications
Model TR-4 MDA System
Resistance Measurement Characteristics
Voltage Technique

Frequency: Output Voltage into Open: Output Impedance:
DC, 100 Hz or 1 KHz sine wave 200 mV or 2 V 600
Max Current Through Unknown: 2V range: 3.3 mA 200 mV range: 33 mA Typical Accuracy: 0 - 10 K : 10 K - 1 M: 1 M - 19 M : 2% of reading + 0.5 3% of reading 10% of reading
Approximate Measurement Speed: DC: 12 mSec 1 KHz: 18 mSec 100 Hz: 130 mSec
Current Mode Full Range 190 1.9 K 19 K 190 K 1.9 M 19 M Volts (Full Range) 0.2 V 2V 2V 2V 2V 2V Current 1.0 mA 1.0 mA 0.1 mA 10.0 A 1.0 A 0.1 A Typical Accuracy 0.5 9 190 4.5 K 95 K 1.9 M
Full-range values shown applicable for externally sensed measurements. Reduce value by 20 when using internally sensed measurements. Reduced accuracy with other 200 mV ranges.
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Test speed is 4 mSec per test point switching, measurement, and evaluation time when measuring a value less than 190 . Worst-case time of 50 mSec when autoranging from 0 to a measurement on the 19 M range. System uses internal Kelvin measurements for compensation of switching resistance with an offset stored for lead and contact resistance from that point. Readings can be externally sensed at device being measured if desired.
Capacitance Measurement Characteristics

Voltage Mode

100 Hz or 1 KHz sine wave 200 mV or 2 V 600
Max Current Through Unknown: 2V range: 3.3 mA 200 mV range: 0.33 mA Usable Range: 100 Hz: 1 KHz: Typical Accuracy: Usable Resolution: 10 pF to 20,000 F 0 pF to 2,000 F 5% with zero-offset compensation 0.5% (minimally 5 pF)
Approximate Measurement Speed: 1 KHz: 18 mSec 100 Hz: 130 mSec
Current Mode

Six-decade ranges from .05 to 5,000 F, providing a usable range of 500 pF to 20,000 F. Typical Accuracy: Resolution: 5% (Reading accuracy may degrade if capacitor being tested has significant leakage.) 1% of range
Technique: Inject DC current, measure rise characteristics of voltage across unknown. Stimulus: 0.1 A to 1 mA in decade ranges. 2 V or 200 mV full-range voltage across unknown.
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Inductance Measurement Characteristics

100 Hz or 1 KHz sine wave 200 mV or 2 V 600
Max Current Through Unknown: 2V range: 3.3 mA 200 mV range: 0.33 mA Usable Range: Typical Accuracy: Usable Resolution: 6 H - 1000 H 5% with zero-offset compensation 0.5% (minimally 0.5 H)
Approximate Measurement Speed: 1 KHz: 18 mSec 100 Hz: 130 mSec
Voltage Measurement Characteristics

Range: Typical Accuracy: Speed:
0 to 9.9 V 200 mV 1-2 mSec/measurement
Continuity Measurement Characteristics

Connection and open thresholds are separately programmable from 2 to 50 . Each test point pair can be specified as open, connection or not tested. Maximum open/short test time for 200 test points is 6.8 sec.. Each measurement takes approximately 330 Sec. The worst-case total time to test a block of n test points can be calculated as: T = 330 S n(n 1) 2
The System uses optimizations to increase speed of continuity testing. In most cases test speed is much faster than the times listed above. For example, a CONT test for a typical 200-test point assembly executes in less than a second.
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Semiconductor Measurement Characteristics

Technique: Typical Accuracy: 0-2 V: 2-9.9 V: Speed:
Source constant-current in decade values (1 mA through 0.1 A), measure voltage. 2 mV 20 mV 1-2 mSec/measurement
Digital I/O Capabilities
Eight individually bi-directional digital bits, each of which can be tri-stated or configured for input or output. One of the bits is used for control of vacuum if the Model TR-3-VALVE is configured into the System. Sink capability of 24 mA per bit. Source capability of 2.6 mA per bit. Each 74LS-TTL bit is configured with a 10 K pull-up resistor for TTL/CMOS compatibility. The System can be expanded by 96 bits of digital I/O by addition of an optional CheckSum Model G-80 Digital I/O Module.
Guarding Capabilities

General: AC/DC Voltage Guarding:
Up to 6 guard points can be simultaneously selected. Each guard point can be externally sensed. Usable to ratios of approximately 100:1 (impedance of measured component divided by impedance of guarded path). Guard point is driven to low test point potential (ground). Up to 15 mA of total guarding current. Guard point is driven to potential of high test point. Since the System makes complex impedance measurements, even without guarding, it can make measurements of components with parallel impedances with a ratio down to 20:1. For example, when using external sensing at 100 Hz, it can directly measure either a 10 K resistor or a 3 F capacitor that are directly wired in parallel.
DC Current Guarding: Unguarded Measurement:
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Zener Measurement Characteristics
General:
The Zener measurement function is available at TR-4-1D test points only. Use the Diode (Semiconductor) measurement technique if a TR-4-1D is not installed. Source approximately 10 mA constant current. The positive test point is current limited with 12 V compliance and the negative test point is set to -10 V. Two terminal measurements are made up to 18 V. 5%, .3 V 2 mSec
Technique:
Accuracy: Approximate Measurement Speed:
External Verification
The Model TR-4 can be tested against external standards to confirm proper operation. The optional Model CM-3 provides hardware and software for this purpose. The external calibration may be executed semi-annually to assure full confidence.
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Model TR-6 Functional Test System

Digital Multimeter
The DMM is used to make voltage and resistance measurements on the UUT. It can make voltage measurements through the TR-6 test points (up to 250 volts) or through the TR-4 test points (up to 12 volts). Low resistance measurements, through the back panel or TR-6 test points, augment the Model TR-4 MDA resistance measurement capabilities. DC Voltage Measurement

Ranges: Accuracy: Resolution:
200 mV, 600 mV, 2V, 6V, 20V 60V, 200V, 600V (max input 250V), autorange 0.5% of range .05% of range
AC Voltage Measurement

Ranges: Accuracy: Resolution: Input:
200 mV, 600 mV, 2V, 6V, 20V, 60V, 200V, 600V (max input 250V RMS), autorange 2% of range (40 Hz to 1 KHz) 5% of range (1 KHz to 10 KHz) 0.05% of range AC or AC+DC Coupled 2, 6, 20 , autorange (including lead resistance) .05% of range 3% of range (using zero offset) 100 mA The DMM can take fully floating differential measurements on the ranges up to 6V. Neither input can exceed 8 from the computer chassis. On the 20V and higher ranges, measurements are ground-referenced. ~60mSec (AC readings and filtered DC readings ~500mSec)
Resistance Measurement Ranges:

Resolution: Accuracy: Ohms Source:
DMM General Voltage levels:
Measurement Speed:
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Counter/Timer
The counter/timer is used to measure frequencies and periods. It is typically used to measure UUT oscillator frequency and other UUT signal frequencies. Inputs can be taken from the unswitched back panel connector, the TR-6 switching, or through the TR-4 test points. The DMM input (usable to 50 KHz) can be accessed for low-level differential inputs through the TR-6 test points. The optional Model TR-6-2 Interface can be used to buffer, and divide frequency signals in close proximity to the UUT.

Frequency range: Channels: Triggering: Input Level: Coupling: Common: Frequency Ranges: Resolution: Accuracy: Period: Range: Resolution: Accuracy:
DC to 10 MHz (higher frequencies can be prescaled by Model TR-6-2 in fixture - see accessories) 2 plus DMM input Programmable threshold -2.2V to +2.2V 300 mV to 5 V (60 mV to 250 V through DMM channel) AC/DC Ground-referenced (except on differential input ranges of DMM) 5KHz, 50 KHz, 500 KHz, 5 MHz, 10 MHz .0015% of range .01% 2 counts 12.8 S - 128 Sec (in 8 decade ranges) .0015% of range .01% 2 counts 1 to 65,535 counts (up to 5MHz input) Same as period Start and stop slope selectable
Totalize: Range:
Pulse Width: Specifications Function:
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Function Generator
The Function Generator is used to provide UUT stimulus. It can provide DC-V, sine and square waves. Both square wave output levels are separately programmable to provide full flexibility. The stimulus is available at unswitched Model TR-6 back panel outputs, or at Model TR-4 MDA test points. All three stimuli are available simultaneously with some limitations (sine and square frequencies must match, square wave must be ground-referenced). When switched through the Model TR-4 test points, the total path resistance is 1 Kohm or less. Each function generator output can source up to 10mA into low impedances, but the current/voltage is limited by the switch resistance.

Functions: Frequency Range: Common: Frequency Accuracy: Harmonic Distortion: Amplitude Accuracy:
DC Voltage / Sine Wave / Square Wave DC, 2 Hz - 40 KHz in 56 discrete steps Ground-referenced .01% 1% 1% of scale (DC) 5% of scale (25 Hz to 1 KHz) 10% of scale (1 KHz to 20 KHz) 100 mV to 20 Vpp (.1dB steps) Each level programmable from -10V to +10V (5mV steps) Programmable from -10V to +10V (5mV steps)
Sine Amplitude: Square Wave Amplitude: DC V Amplitude:
Power Outputs
The Model TR-6 makes PC-power available at the back panel connector. Each supply is fused on the TR-6 with a plug-in fuse. Fuse status is determined by system self-test. The power outputs can be used to power UUTs with limited current requirements. The power outputs can be switched to the UUT with use of the undedicated relay switches on the Model TR-6.
Fixed outputs:
+12V fused at 1A -12V fused at .1A +5V fused at 1A GND unfused
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Digital I/O
The Model TR-6 provides digital capabilities which allow you to perform low-speed digital input and output for test of UUT functionality. The digital I/O capability can also be used to drive relays or send and receive digital signals and switch closures controlling test flow. The standard Model TR-6 includes eight bits of digital I/O capabilities. These bits are available at the TR-6 back panel. Open-collector outputs can directly control external relays requiring up to 100mA when used with an external source. The digital outputs can be left floating, or jumper-connected on the TR-6 through pull-ups to either +5V or + 12V. The status of the eight bits can be read back by the system. The digital I/O capability of the system can be expanded by 96 non-multiplexed bits with the addition of a Model G-80 Digital I/O Module. Each bit on this module is individually bidirectional and can sink up to 24mA. When used in conjunction with Model TR-4-1D MPX modules, the system provides an additional 16-bits of digital I/O per MPX module. On these modules, the first sixteen test points can be switched from general purpose analog MPX points to digital I/O points when performing power-on testing. These points can source up to 2 mA and sink up to 24 mA. Basic TR-6 Digital I/O

Bits: Direction: Logic Family: Outputs: Distribution: Sink/Source: Pull-ups:
8 Output w/readback 5V TTL/LS/HC-MOS Open-collector w/pull-up Back panel connector only Sink 100 mA. Source determined by pull-up resistor 10K socketed pull-up to +5V or +12V
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Undedicated Switching
The Model TR-6 provides four undedicated relays, available at the back panel, that can be used for various testing needs such as switching power or other signals to the UUT. Typically, all of the signals from the Model TR-6 back panel connector are available inside the test fixture. When a test fixture is built for a particular UUT, other TR-6 signals and UUT test points can be connected to the undedicated relay connections for use during the power-up tests. In addition, an accessory 16-pin ribbon cable header on each Model TR-6-1 MPX Module provides four relays for custom use.

Undedicated Switches: Contact Rating: Isolation:
4 SPDT relays hardwired to back panel (12 connections) 250V, 1A, 30 VA resistive switched 250V RMS
Test Point Switching

The Model TR-6 provides 16 relay-switched test points at its back panel. These test points can be expanded in 50-point increments by adding Model TR-6-1 Relay Modules (up to 6 TR-6-1 modules can be configured into a system). The relay test points are used for UUT connections that exceed 12 volts with respect to the computer chassis when power is applied to the UUT. The Model TR-6 can make DMM and Counter/Timer measurements at these points. In addition, unguarded 2-wire Model TR-4 MDA measurements (e.g. resistance, capacitance and inductance) can be made through these points.
TR-6 Test Point Matrix:
16 relay-switched test points. Each TR-6 relay test point may be specified as a high or low for DMM measurement. The matrix may be expanded in 50-point increments with the Model TR-6-1 Relay Expansion Module. Each TR-6-1 module uses one full-length/full-height PC slot. 2-wire measurements from the Model TR-4 can be made through the Model TR-6 matrix. TR-6 source and measurement capability (except high-voltage & resistance measurement) is available from all TR-4 test points. Multiple sources can be active at TR-4 test points while making measurements.
Relay Expansion:
Model TR-4 Test Points:
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Fixture Interface Module

The Model TR-6-2 Fixture Interface Module is designed to be used inside or near the UUT fixture to help support functional test operations. Connecting to the Model TR-6, it provides a number of special capabilities with wire-wrap terminals for connection to the UUT and test point electronics. The basic module contains fundamental capabilities, and by setting jumpers and adding components as necessary, you can perform a number of specialized functions. Under automated control of the Model TR-6, it provides power relays that can be used to switch power supplies or other signals to the UUT, an interface to the counter/timer that allows you to redrive or frequency-divide low-level UUT oscillator signals, dual instrumentation amplifiers that can buffer and differentially amplify low level signals for the DMM, two shunt locations for current monitoring and a bread-board area for custom circuitry. The Fixture Interface includes stand-offs for easy mounting inside the fixture or on any flat surface. The 50-pin ribbon cable from the Model TR-6 back panel can be directly plugged into the Fixture interface, or when used inside a Model TR-3 vacuum test head, the special Model TR-6-3-THC plugs directly from the Fixture Interface to the inside of the fixture wiring block connected to the Model TR-6. The basic Fixture Interface contains two power relays, connectors and interface circuits. You can install your own components to tailor it to your application or purchase kits from CheckSum to populate it as necessary. The Model TR-6-RLY is an additional power relay (up to 8 can be installed), the Model TR-6-CT is the counter/timer interface, the Model TR-6-2-DMM is the DMM signal conditioner interface parts, and the Model TR-6-2-SWO allows change-over of test points from one source to another (or isolation of the test points to eliminate loading). Mechanical

Size: Mounting:
8" x 6.9" x 3"H (with relays installed). 8 - 3/4" x #6 screws (not included)
Relay Switching

Provisions for up to 8 DPDT (2 form-C) relays Contact rating 10A, 250VAC, 240VA Remotely controlled by Model TR-6
Counter/Timer Interface

Inputs: Frequency divider ratios: Sensitivity:
2 via wire-wrap or SMA connectors 2, 4, 8, 16 100 mV
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Frequency response:
50 MHz
DMM Signal Conditioner Interface

Dual 2-input buffer amplifiers Amplification ratios: Max input voltage: 1 to 1000 6 volts, differential
Switch-Over Module The Model TR-6-2-SWO modules install in the Model TR-6 Fixture Interface Module allowing test points (close to the UUT) to be switched from one source to another (e.g. digital to analog) or to isolate pins to reduce capacitive loading.

Each switch-over module installs in 2-power relay positions (for a maximum of 4 switch-over modules with no power relays installed). Provides 17 ganged test point switch-overs per module.
External Verification
The Model TR-6 can be tested and calibrated against external standards to confirm proper operation and to provide full accuracy. This process uses an external multifunction calibrator and DMM and should be run semi-annually for best performance. Automated software is included for this purpose. See Chapter 10 of this manual for details of this process.
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Model TR-4/6 CheckSum MDA Software

Media: 1.44 MByte 3 1/2" DS/HD Floppy Diskette MS and PC-DOS compatible (V2.0 and later). V6.0 or later recommended. Monochrome or color CGA, EGA, VGA and Hercules compatible Minimum memory requirement: 4 MB
Functions provided:

Autolearn continuity from known-good sample Automatic selection of optimal test method Enter or edit UUT specification data Learn UUT connections, names and test tolerances from ASCII text file created independently Save learned file on disk Self-test each I/O pin and control circuitry Probe for test point identification with autonaming Execute steps interactively during programming with automatic tolerance and range assignment Assign special operator instructions Assign 8-character pin names Assign 12-character test names Print test results (all or fail only) Print test report for batch (yield report) Print specification data for UUT Print fixture wiring report with both sequential point number and alphabetic name sort Configure report destination and formatting options Enter up to 1000 test steps per test program Print Production Reports Print Pareto Reports Print X-bar/Sigma Control Reports
Page 3-13
Partial List of Test Step Types RES CAP DIODE INDUC VOLT DMM UCT SQRV DCV SINEV RELAY GPIB ZENER CONT DIGI/DIGO PORTI/O PAUSE DISCHARGE DISP JMPx/LABEL EXEC CALL BEEP WAITK Measure resistance Measure capacitance Measure semiconductor junction voltage Measure inductance Measure voltage Measure AC/DC voltage Measure frequency/time Square wave stimulus DC voltage stimulus Sine wave stimulus Control TR-6/TR-6-1 Relays Control IEEE-488 Interface Measure Zener diodes Opens/shorts continuity test Digital input and output PC port input and output Pause specified number of mSec Discharge capacitor Display message to operator Unconditional or conditional jumps to labels based on measurements or keyboard input Call user-written test step (.EXE or .COM file) Call a subroutine Sound the speaker Wait for operator to press a specified key
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Model RM-1 Relay Module

The Model RM-1 Relay Module general purpose Relay Module can be installed in an unused short 8-bit controller (PC) slot. It provides eight (four form-C and four form-A) undedicated relays rated at 1A (up to 250VAC) for switching UUT power and signals. It includes a backpanel 37-pin D-sub mating connector to accept your custom wiring. It is controlled by the Systems PortO test step type.
Model-GPIB IEEE-488 Interface

The Model GPIB provides IEEE-488 interface capabilities for the test system. The GPIB module installs in an 8-bit PC short slot. It comes with a 2-meter cable for connection to the first GPIB device, embedded firmware and software support, and drivers for other languages.
Configuration
Model TR-4 Base System

Includes: System Measurement Module (with no test points), CheckSoft Software and Instruction Manual. System Module: Includes measurement, guarding and digital I/O circuitry. Configuration: Requires one full-length, AT-height slot. Can be expanded to 200 through 1600 test points with MPX Modules.
Model MPX-3 Modules

200 test points per MPX Module (or 100 externally sensed test points). Each point can be designated as high or low test point, external sense point, a guard, or an external guard sense point.
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Z ener diode measurement capability. Can source up to 10 mA across diode for measurement of Z ener diodes up to 18VDC. (Requires use of Model TR-4 System module). Includes four 50-pin ribbon cables that extend approximately 30" from the rear of the computer. Each module requires one full-length, AT-height slot (uses 8-bit bus).
Model TR-4-1D MPX Modules

Same as MPX-3 with additional features: Sixteen bits digital I/O. Test points one through sixteen can be switched (under program control) between standard analog I/O points or dedicated digital IO points.
Model TR-6 Base System

Includes System Module, 50-pin ribbon cable, CheckSoft Software and Instruction Manual. System Module: Includes DMM, Counter/Timer, Function Generator, 16 Relay test points, 4 undedicated relays, fused power outputs and 8 digital driver bits. Configuration: Requires one full-length, AT-height slot. Test point count can be expanded with Model TR-4-1, TR-4-1D or TR-6-1 MPX Modules.
Model TR-6-1 Relay MPX Modules

50 test points per Relay MPX Module. Each point can be designated as high or low measurement test point for UCT, DMM, or 2-wire TR-4 measurements (no sourcing). Includes 50-pin ribbon cable that extends approximately 30" from the rear of the computer. Each module requires one full-length, AT-height slot (uses 8-bit bus).
Page 3-16
Controller Requirements
Minimal controller configuration includes 486 processor, monochrome graphics, hard disk and 4 MByte RAM memory. Software is compatible with color or monochrome monitors with graphics capability. A typical controller, such as the CheckSum Model T-120, can be configured for up to 1000 test points internally. Larger configurations require the use of an controller with additional slots such as the CheckSum Model T-120-IC Industrial Controller. Contact CheckSum for details. When purchased with a controller, the System is shipped fully integrated and tested.
General Notes

Typical accuracies shown are when measuring isolated components. Accuracies may degrade depending on surrounding circuitry. All speeds shown derived with 33 MHz controller. Speeds for most MDA DC-based testing operations are roughly proportional to CPU speed. To obtain stated typical Model TR-4 accuracies when using AC techniques, low-impedance measurements (less than about 1 K ) may require external sensing. This compensates for typical 15 lead resistance beyond internal sense points.
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Configuration
A CheckSum Test System is configured for your particular application from the following System elements: Core System Model TR-4
MDA Base System with Measurement Electronics, System Software License Model MPX-3-200 Solid-state MPX Module with 200 Test Points and Cabling (includes Zener testing capability) Model TR4-1D Solid-state MPX Module with 200 Test Points and Cabling (includes 16-bits digital I/O) Model TR-6 Functional Test Base System with Measurement Electronics, System Software License Model TR6-1 Relay MPX Module with 50 Test Points and Cabling Model TR6-2 Fixture Interface for power switching and UUT signal isolation and conditioning. Test Controller (PC) Options Model T-120 Desktop Controller Model T-120-IC Industrial Controller with Additional Slots Fixture System Options Model GS-850 Edge Connector Fixture System Model AB1-AB6 Adapter Boards for Model GS-850 Fixture System Model TR-5-812 Bed-of-Nails Mechanical Fixture System (8" x 12") Model TR-5-1216 Bed-of-Nails Mechanical Fixture System (12" x 16") Model TR-5-1620 Bed-of-Nails Mechanical Fixture System (16" x 20") Model TR-3A Bed-of-Nails Vacuum Fixture System Model TR-3-1 Fixture Wiring/Connectors Model TR-3-2 Test Head Wiring Block Model TR-3-1216 12" x 16" Test Head Model TR-3-1620 16" x 20" Test Head Model TR-3-2024 20" x 24" Test Head Optional Accessories Model T-120-2P Printer Model T-120-PTRC Expansion Chassis Model T-120-3 Foot Switch Model G-80 Digital I/O Module Model RM-1 Relay Module Model GPIB IEEE 488 Interface
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Theory of Operation
This chapter describes how the CheckSum Model TR-4 and TR-6 Test Systems make measurements. The first section describes the Model TR-4 MDA System. The second section describes the Model TR-6 Functional Test System. The final section provides guidelines for making effective measurements.
Model TR-4 Theory of Operation

Overview
The CheckSum Model TR-4 Manufacturing Defects Analyzer has been designed to effectively measure a variety of components, both out-of-circuit and in-circuit. To deal with the variety of in-circuit conditions that can occur, the System offers several measurement methods and options. This section describes these techniques and gives you an idea about how to best use them to solve testing problems. For most measurements, the System can automatically choose the best technique and it is not necessary for you to know the details of the measurements. However, if you want to obtain optimum results on problem measurements or use to guarding, you should read and understand this section. The System contains two separate measurement modes: Current Mode - Uses a DC constant-current stimulus for taking measurements. Voltage Mode - Uses either AC or DC voltage stimulus for taking measurements. Each of these measurement modes is described separately. Finally, some guidelines about how to test in general are included. This section also gives tips on how to test various specific components.
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Current Mode
Overview
The Current Mode uses a precision constant-current source in conjunction with a voltage measurement capability to effectively test resistors, semiconductor junctions, and capacitors. Each is discussed below. The System can provide DC constant-current in five-decade steps from .1 A to 1 mA and has two voltage measurement ranges of 200 mV and 2 V full range. Between combinations of source currents and measurement ranges, the System can provide a number of unique measurement ranges. Typically, 2 V full-range values provide better accuracy. However, when measuring in-circuit, it may be necessary to use 200 mV ranges to prevent diode junctions from turning on and adversely affecting the readings.
Current Source
Rx Cx Qx
Voltage Measure
Figure 4-1 - Current Mode Block Diagram
As shown in Figure 4-1, the System is connected in a four-wire Kelvin configuration so that the voltage is sensed on the component side of the solid-state relays that provide the constant-current to the unknown resistance. The Kelvin technique takes advantage of the fact that you can make an accurate voltage measurement through a resistance (such as switches in the measurement side) as long as the input impedance of the measurement circuit is very high. Since the current through the sense leads is very small, there is
Page 4-2
essentially no voltage drop across the switches. Consequently, the resistances of the switches are not significant, allowing accurate voltage measurements to be made. The paths from the internal sense point to the end of the cables can add up to approximately 15 to the resistance on each test point. This resistance, shown as Rp in Figure 4-2, is measured during System self-test/calibration and is automatically subtracted from readings that you take. If you need to take precise readings of low impedances, you can instruct the System to remotely sense at the assembly that you are testing. To use this technique, wire two additional test points to the fixture measurement point. This will effectively eliminate the effect of all of the resistance in the switching and lead paths. Figure 4-2 shows how external sensing can be used to eliminate virtually all of the extraneous impedances in the measurement path.
Internal Sense (+)
Rp External Sense (+) Current Source Rx Cx Qx Voltage Measure
External Sense (-) Rp
Internal Sense (-) Rp = Lead/Path resistance (2-15 Ohms)
Figure 4-2 - External Sensing Diagram
Testing Resistors
The Current Mode measures resistors by applying a constant-current source to the unknown resistance and then measuring the voltage drop across the unknown resistance. From the known current and measured voltage, resistance is calculated with Ohms law.
Page 4-3
Using the various current and voltage combinations available, the System provides ten resistance measuring ranges with mid-scale readings from 100 to 10 M . Depending on the range, full-range voltage is either 2 V or 200 mV. The System can be configured to provide variable delays between the time when the current source is applied and when the measurement is taken. You may also specify how many samples are averaged in each measurement range. If the assembly that you are testing has capacitors that can become charged during testing, you can specify that the System check for a voltage across the resistor prior to making the measurement, and if so, discharge the point.
Testing Capacitors
The Current Mode tests for capacitors by applying a constant current, then measuring at small precise time intervals to determine the rise time of the voltage as the capacitor charges. From the voltage change, the time, and the amount of constant-current applied, the capacitance can be computed. For capacitance measurements the Model TR-4 uses the same constant-current source and voltage measurement circuitry used for measuring resistance. However, when measuring capacitance, the System measures a number of samples at precise intervals for 100 mSecs. From the gathered information, the System computes the capacitance. Prior to each measurement, the System discharges the point as necessary. Both 2V and 200mV full-range voltages and 1 mA to .1 A constant-current source ranges can be selected to measure capacitance.
Testing Diodes/Semiconductors
The Current Mode measures diodes in a fashion similar to that of testing resistors. A selectable constant-current source (1 mA to .1 A) is connected to the semiconductor junction, then the voltage drop across the junction is measured. You can also measure zener diodes up to about 10 volts with diode measurements.
Guarding
The Model TR-4 allows you to apply guard points to help eliminate the effect that parallel components have on the measurement. Consider the circuit shown in Figure 4-3. If you measure Rx, you are also measuring the parallel combination of Ry + Rz. Using guarding, you can eliminate (or reduce) the effects of Ry and Rz from the measurement.
Page 4-4
(+) test point
Ry Rx Rz (-) test point
Figure 4-3 - Circuit with Parallel Components
Figure 4-4 shows the same circuit with current guarding applied. The guard point, applied to the junction of Ry and Rz, applies current to bring the guard point to the same voltage potential as the (+ ) test point. Once this is achieved, there is little or no current flow through Ry. Consequently, all of the source current flows through Rx, and as a result, the effects of Ry and Rz are eliminated from the measurement. You can apply up to six simultaneous guard points with a current mode measurement. Each of the guard points can be externally sensed to more accurately cancel the currents of the parallel resistances. The System can apply up to 15 mA of guard current for a DC current measurement.
(+) test point
Ry + Rx Guard point Rz (-) test point
Figure 4-4 - Circuit with Current Guarding
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Voltage Mode
Overview
The Voltage Mode provides the capability to measure resistors, capacitors and inductors. It can measure using DC voltage or AC frequencies of 100 Hz and 1 KHz as stimulus. Figure 4-5 shows a block diagram of the voltage System.
Voltage Source
Rx Cx Ix
Voltage Measure
+ Current Measure
Figure 4-5 - Voltage Mode Block Diagram Compared to the Current Mode, the Voltage Mode provides advantages for many in-circuit measurements: a. Since complex measurements are taken, the System can provide better measurements when connected to circuits that contain both resistive and inductive or capacitive components. b. Capacitance readings taken at 1 KHz are much faster than capacitance measurements taken with the Current Mode. c. Measurements of smaller capacitances are possible. d. Ability to measure inductance is available. The voltage source can provide either 2 V or 200 mV full-range stimulus of DC, 100 Hz, or 1 KHz. The AC signals are low-distortion sine waves. Internal output impedance of
Page 4-6
the stimulus system is about 600 , limiting the current and voltage at the component to be tested. Maximum current through the tested component will not exceed about 3 mA. Once the stimulus signal is applied, the System measures the voltage drop across the unknown component. Using other circuitry, the System then measures the current to ground (which is the (-) measurement test point) through the unknown component. From this information, the impedance of the component being measured can be calculated via Ohms law. In AC-voltage measurements, the System also measures the 90-degree quadrature voltage and current components through the unknown. Knowing the voltage and current both in-phase and in 90-degree phase, the System can calculate the capacitive, inductive, and resistive components of the unknown impedance.
Testing Resistors
When taking resistance measurements with AC, measurements that have an inductive component are calculated using a series LR calculation model as shown in Figure 4-6. For other AC-resistance measurements the System uses the parallel RC model as shown in Figure 4-7.
Figure 4-6 - Series L R Model The System can also measure resistors using DC voltage. When measuring resistors with this mode, only two in-phase readings (voltage and current) are made, then the resistance computed using Ohms law. The System can measure resistance values from 0 to 19 M .
Figure 4-7 - Parallel RC Model
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Testing Capacitors
Small capacitance values (less than 1 F) use the parallel RC model shown in Figure 4-7. Large capacitance values use the series RC model shown in Figure 4-8. The effective measurement range is 0 pF - 2,000 F at 1 KHz and 10 pF - 20,000 F at 100 Hz.
Figure 4-8 - Series RC Model
Testing Inductors
Inductors use the series LR model shown in Figure 4-6. The effective measurement range of inductors is 6 H to 1000 H.
Use of Offset
The AC stimulus from the System can be offset. If the System is not offset, the source signal (+ test point) is symmetrical above and below the potential of the (-) test point. If positively offset, the signal is entirely above potential of the (-) test point, and if negatively offset, entirely below the potential of the (-) test point. The effects of offsetting on the output signal are shown in Figure 4-9.
No Bias 0V
Positive Bias
Negative Bias
Figure 4-9 - Offset Offsetting can be valuable when measuring across diodes and sometimes can provide better readings when measuring polarized capacitors. Offset operation is slower than normal operation. Since offsetting can effectively leave a charge on the component being tested, it may be necessary to discharge it before other measurements are taken.
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Frequency Selection
You may choose between DC, 100 Hz, and 1 KHz when using the Voltage Mode. This section discusses the theoretical reasons for choosing the frequency. For purposes of speed, whenever practical, 1 KHz should be used in place of 100 Hz since measurements at 1 KHz are about 10 times faster than 100 Hz measurements. In most cases, the speed of capacitor measurements taken with the Current Mode are slower than 1 KHz measurements and faster than 100 Hz measurements. From a measurement standpoint, selection of 100 Hz vs 1 KHz is a choice based primarily on the value of the component being measured and its surrounding circuitry. For small inductors and small capacitors, use 1 KHz. For large inductors and large capacitors, use 100 Hz. When measuring components that have other components in parallel, you should use the frequency that makes the impedance of the unknown component small compared to the surrounding components. For example, consider that you are measuring a 10 K resistor in parallel with a .1 F capacitor. The impedance of the capacitor depends on the frequency. As you probably recall: XC = 1 2FC
For capacitors: For inductors:
XL = 2 F L
In our hypothetical measurement of the 10 K resistor in parallel with a .1 F cap, the capacitors impedance is: Frequency 100 Hz 1000 Hz Impedance 15.9 K 1.59 K
You want to minimize the effect of the parallel capacitance upon the resistor, therefore 100 Hz is better since it will decrease the parallel load. If you were measuring the capacitor, you would want to use 1 KHz since it makes the capacitor more dominant with respect to the resistor.
Guarding
The Model TR-4 allows the use of voltage guarding. Guarding is a technique by which you can reduce the effect of parallel components upon the measurement.
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Consider the circuit shown in Figure 4-3. If we measure Rx, we will actually measure the combination of Ry + Rz in parallel with Rx. If we add a guard point, as shown in Figure 4-10, we can minimize the effects of the parallel resistance of Ry and Rz.
(+) test point
Ry Rx Rz (-) test point Guard point
Figure 4-10 - Circuit with Voltage Guarding In the Model TR-4 Voltage Mode, guard points tie the guarded circuit point to ground potential. When the guard is active, it forces the top of Rz and the (-) Test Point to be at the same voltage potential. As a result, no current can flow through Rz and consequently all of the current that we measure at the (-) Test Point flows through Rx. Since we have accurately measured the current through Rx and we can accurately measure the voltage across Rx, we can determine its value with the effects of Ry and Rz guarded out. The Model TR-4 allows you to have up to six simultaneous guard points. This allows you to eliminate the current paths from several surrounding circuits. Each of the six guard points can be externally sensed at the UUT to provide the most effective guarding. You can guard out resistors, capacitors or inductors with the System. The effectiveness of guarding increases as does the impedance of the component between the (+) test point and the guard point (Ry in the previous example). If the impedance of this component is small (less than 1/100 the value of Rx, for example), guarding is not likely to be highly effective. In the example (Figure 4-10), if Rz is a larger resistance than Ry, you could improve the effectiveness of guarding by reversing the polarity of the measurement. Note that as you add guard points to the Model TR-4 Voltage Mode, the amplitude of the stimulus signal becomes smaller and smaller. If the guarded impedances are small, you may eventually get to the point where the stimulus is so small that repeatability of the readings decreases.
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Model TR-6 Theory of Operation

Overview
The Model TR-6 Functional Test System allows you to power-up your unit-under-test (UUT), then apply stimulus and make measurements to ensure proper UUT operation. Typically, the Model TR-6 Functional Test System is used in conjunction with CheckSums Model TR-4 MDA System. When this is the case, the MDA system is first used to passively (no UUT power applied) test for proper assembly and no opens or shorts that could cause damage once power is applied. Once this testing has successfully been completed, the Functional Test System can apply power, provide stimulus, and make active measurements. The combined Systems provide a number of capabilities and shared elements. This section describes various aspects of using the System with respect to common elements. It also describes some global aspects of using the Model TR-6 Functional Test System. Chapter 11 describes the test step types that are specific to the Model TR-6.
System Switching Overview

System test point switching allows you to use Model TR-4-1 solid state test points (test points 1-1600), relay test points on the Model TR-6 (test points 1601-1616) or from the Model TR-6-1 Relay MPX Modules (test points 1651-1950). The Model TR-6 also allows you to directly use its stimulus or measurement capabilities from its back panel. If you want to use this direct path, specify a "from (-)" test point of 1625. Doing so eliminates any other internal switching that might otherwise be done. Note that the back panel inputs and outputs are always active (not disconnected) regardless of other system activity. Consequently, if you connect them directly to a test point, make sure that stimulus/measurements routed to these points during other parts of the test sequence will not cause problems. When wiring the test fixture, special care must be used when wiring test points that can exceed plus or minus 12 volts with respect to the controller (PC) chassis when the UUT is powered up. These points must be wired to the Model TR-6(-1) relay test points to prevent erroneous measurements and damage to the test system. However, whenever possible use Model TR-4-1 test points since these are the most flexible. The TR-4-1 test points can be used for continuity tests, source, sense and do guarded measurements while the Model TR-6 test points are for basic 2-wire measurements only).
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The TR-6 relay switching is also used in place of the TR-4 switching for taking low resistance measurements with the Model TR-6. Since the TR-6 DMM uses 100 mA, the TR-4 switching would be damaged by its use and compliance voltages would be exceeded.
System Measurement Switching

Both the relay switching of the Model TR-6(-1) or the solid-state switching of the Model TR-4-1 can be used to make UUT measurements. These measurements can be made with the Model TR-6s DMM or UCT or the Model TR-4 MDAs measurement circuitry for resistance, capacitance, inductance or DC voltage measurements. UUT measurements using the TR-6 switching are 2-wire only. Therefore, guarded or externally sensed measurements are not practical through these points, although TR-4 measurements taken through TR-6 test points can be externally sensed through TR-4 test points.
System Source Switching

The Model TR-6 has internal sources for generating sine waves (SINEV), square waves (SQRV) and dc voltages (DCV). In addition, there are provisions for switching an external signal (EXTIO) for sourcing or measuring with an external device. These sources are available at the TR-6 back panel, or they can be switched into the Model TR-4-1 solid state switching. They are not available at the Model TR-6(-1) relay switching. If it is necessary to apply one of these sources to a test point that cannot be wired into the Model TR-4-1, you can provide wiring for the source to the UUT point through one of the Model TR-6s undedicated relays. The Model TR-6 sources are ground-referenced. The ground is ultimately connected to the chassis of the controller (PC). The "from (-)" test point used for supplying sources are connected back to this ground. System sources are disconnected when the source test title is specified as RESET (in either upper or lower case), or when the same source is connected to another destination. The System can provide each source to multiple destinations if the test program uses a FLAGS (8) command to enable multiple sourcing or a FLAGS (4) to disable multiple sourcing. The sources are all reset when the system is powered up, when a CONT or ICS test is performed, and before and after each complete spec file is executed. The Model TR-4 allows up to six guard points at one time (each of which can be remotely sensed. When one or more sources are programmed (and not reset), only three guard points can be active simultaneously. The software automatically ignores the last three guard points if present.
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UUT Power Switching

The Model TR-6 has the ability to apply power to the UUT. Applying power can be accomplished in several ways depending on the requirements of the UUT. For low-power UUTs that require +12 V or 5 V (up to 1A) or -12V (up to 100mA), the System provides fused outputs from the controllers (PCs) power supply. These can be connected to the Model TR-6s undedicated switching for connecting power and ground to the UUT. For medium power UUTs (those requiring up to about 1 amp), the Systems undedicated relays can be used to switch the power to the UUT via an external power supply. There are several ohms of internal resistance present in this switching, so some voltage drop will occur when switching more than a few milliamps. For higher power UUTs, the TR-6s digital output capability can be used to directly switch external power relays. The open-collector digital outputs sink up to 100 mA and, as such, can power fairly large power relays. As a final method of switching higher UUT power, the Model TR-6-2 Fixture Interface contains power switching relays that are suitable for UUTs requiring up to 10 amps. Note that you should switch both power and ground to the UUT since the Model TR-4 MDA System relies on the UUT to be floating during MDA testing operations.
- WARNING Because of the extreme hazard to operators, you should avoid applying line power and other high voltages to the UUT during test. As an alternate, switch DC into the output of the AC power supply on the UUT.
System Source Interdependency

The Model TR-6 has the ability to provide simultaneous stimulus channels, however, there are some interdependencies. In the case of interdependencies, the last programmed value has priority. These include: 1. If a square wave (SQRV) is specified with a non-zero low-limit, the DC voltage (DCV) output is used as the lower value. Therefore, the stimulus value for the first voltage of the square wave and the DCV output will be the same. If the alternate DCV output (range = 2) is used, it disables the square wave output entirely and replaces it with the specified DC voltage signal. 2.
Page 4-13
The square and sine wave generation (SINEV/SQRV) use the same frequency generation circuitry, therefore the frequency must be the same for both if they are simultaneously used.
AC Source Frequencies Available

The following frequencies are available when generating sine and square waves: 40KHz, 20KHz, 13.3KHz, 10KHz, 8KHz, 6.67KHz, 5.71KHz, 5KHz, 4.44KHz, 4KHz, 3.64KHz, 3.33KHz, 3.08KHz, 2.85KHz, 2.67KHz, 2.5KHz, 2KHz, 1.33KHz, 1KHz, 800Hz, 667Hz, 571Hz, 500Hz, 444Hz, 400Hz, 364Hz, 333Hz, 308Hz, 285Hz, 267Hz, 250Hz, 200Hz, 133Hz, 100Hz, 80Hz, 67Hz, 57Hz, 50Hz, 44Hz, 40Hz, 36Hz, 33Hz, 31Hz, 29Hz, 27Hz, 25Hz, 20Hz, 13Hz, 10Hz, 8Hz, 7Hz, 6Hz 5Hz, 4Hz, 3Hz.
Digital Input/Output
The Model TR-6 directly accommodates eight bits of digital I/O via its System Module. The eight bits consist of open-collector drivers that can be used to control external relays that require currents of up to 100 mA. The module supports the installation of on-board pull-up resistors that make the digital byte appear as + 5V or + 12V digital logic. Alternatively you can use an external pull-up source. Digital input signals of up to 12 volts can also be read back (at TTL logic thresholds). This digital I/O is controlled with the DIGI and DIGO test types (see Chapter 11). When used with a Model TR-4 MDA System, an additional byte of digital data on the Model TR-4 System module is also available. Model TR-4 digital I/O is controlled with the DIGA, DIGI and DIGO test types (see Chapter 11). The TR-6 DCV command (see Chapter 11) can be used to provide logic levels to several test points simultaneously. The (-) test point serves as a digital low and the (+ ) test point, when programmed to + 5V serves as a digital high level. Up to 16 simultaneous source points can be used. Under normal circumstances, the System disconnects previous test points connected to the same source (e.g. DCV) when a new stimulus is applied. However, with use of the FLAGS test step, you can have the System allow multiple stimulus points from the same source (FLAGS range = 8). The FLAGS test type with a range of 4 sets the System back to single source mode. The source can be disconnected with a RESET of the desired source. Note When using the DCV command for digital control, be advised that the System will disconnect the stimulus for short periods of time between tests as part of the hardware reset process. Because of this you should not use DCV stimulus to digital points that are clocks or are edge-sensitive.
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When the System is configured with Model TR-4-1D MPX modules, you can multiplex the first 16 test points per TR-4-1D module between standard analog I/O and digital I/O under software control. These points can be wired into digital nodes on the UUT to supply digital testing. These test points are configured as analog or digital inputs and outputs with the DIGA test type. Use the DIGO and DIGI test types to then change the bits. See chapter 11 for detailed information about these test types. A G80 Overdrive Module (G80-ODM) is an available accessory for overdrive of signal and control lines to extend the LOGIC test capability of a system. The overdrive module provides high current drivers useful to temporarily force a logic level on a net which also is driven by another active output. The automatic use of overdrive is included in the LOGIC test. The G80-ODM can be controlled by TTL outputs and can be directly connected to a G80 cable.
Grounding
The Model TR-6 provides two grounds, analog and chassis. These are connected together internally in the Model TR-6 module. During fixturing, you will normally leave both grounds separated. For analog sourcing and measuring, the analog ground is used. By being separated from the chassis ground, noise and ground loops are minimized. Model TR-6 analog sources and digital I/O are referenced to the computer chassis ground. DMM inputs are floating (to within 8 volts of computer chassis) for the lower ranges (up to 6 V), and referenced PC chassis for higher ranges. UCT inputs are with respect to ground. Model TR-4 MDA measurements require the UUT to be floating with respect to the controller, consequently when applying power to the UUT you should switch both power and ground. Signal inputs to the Model TR-4 test points should never exceed 12 volts from the PC chassis. Doing so will damage the System.
Fixturing
When the Model TR-6 is shipped from CheckSum with Model TR-3 bed-of-nails fixturing, a particular convention is used. The MDA test point switching (1-1600) start from the left and work to the right (when facing the fixture receiver interface blocks). The functional test system is connected starting at the right (with the Model TR-6) and working left (with the Model TR-6-1 modules). Using this convention provides an easy way to separate the two functions and allow for systematic increases in the test point-count if expansion is desired. If the Model TR-3 is shipped from CheckSum using the GenRad wiring convention, the MDA/Functional wiring is still separated end to end, but in this case the MDA starts on the right and the functional test hardware starts on the left.
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Measurement Guidelines
Overview
This section discusses guidelines that you can use to obtain the best test results in your testing application. For most readings, the System will automatically choose the best method and ranges. If that fails, you can easily get a display showing a variety of measurements taken on the points in question. From the displayed alternatives you can simply choose the best one and use it. However, in some cases you may want to make a detailed analysis to determine the best measurement method. This section gives some guidelines to help. Note that no matter what test equipment you use, CheckSums or an alternative, you are likely to run across occasional components that you cant effectively test with standard automated techniques. For these points youll have to rely on the continuity test or other inspection methods.
General Guidelines
The following general guidelines apply to all component measurements: a. All other things being equal, choose the 2 V output voltage rather than 200 mV. This will result in more accurate, repeatable measurements. The exception to this is the 100 DC constant-current resistance measurement range (200 mV output @ 1 mA), which is the most accurate way to measure resistances less than 160 . b. For DC readings (current or voltage), try reversing the polarity and measuring again. This can provide a solution if there are diodes in the measurement circuit. c. For AC readings where unguardable parallel circuitry exists, choose the frequency that makes the impedance of the measured component low compared to parallel impedances. In general, the System will take good measurements if the parallel impedance is greater than 10% of the impedance of the component that you are measuring. d. For DC current measurements, look at the Dynamic Point Analysis screen for clues. You might find that there is a slowly charging cap across the resistor or an inductor causing a negative slope on the display. You might also see a diode junction turning on at about .6 V, indicating that you need to use a low-voltage range. e.
Page 4-16
On AC measurements, try positive and negative offset to see if the readings improve. Try the 200 mV output range before experimenting with offset changes. f. The relative measurement speed of the System is approximately as listed in order from fastest to slowest: 1. Continuity measurements 2. DC-current resistance/diode measurements 3. DC-voltage resistance measurements 4. AC-voltage 1 KHz cap/inductor/res measurements 5. DC-current capacitance measurements 6. AC-voltage 100 Hz cap/inductor/res measurements g. To optimize testing speed, organize your program so that readings are grouped together by frequency. This allows testing to proceed with minimal settling time. h. If the readings that you are getting are too high, it may be a case of significant series resistance in the measurement path. If you have wired other test points to the component, use external sensing to eliminate the effects of path resistance beyond the local sense points on the MPX modules. i. If the readings are too low and there are parallel paths with a test point in the middle of the components in the parallel path, it is likely that guarding will have a positive influence. j. For Voltage Mode guarding, choose guard points that have some resistance (impedance) between both the (+ ) test point and the (-) test point. It is best if the guard points have the highest value of resistance in the path between the (+) test point and the guard points. You can rearrange the polarity of the measurement if need be to obtain this effect. It is only necessary to consider guarding of the points that are ultimately connected to the (-) test point. See Figure 4-11 for an idea of where to guard when using the Voltage Mode. k. For Current Mode guarding, choose guard points in a similar fashion to Voltage Mode guarding, but arrange the guard points so that the highest resistance is between the (-) test point and the guard point. Remember that the Current Mode guard is limited to about 15 mA of guard current, so if the resistance between the guard point and the (-) test point is less than about 13 (130 on the 2V ranges), you will have better luck using the Voltage Mode for guarding. With the Current Mode, it is only necessary to consider guarding of impedances that connect to the (+ ) test point. See Figure 4-12 for an idea of where to guard when using the Current Mode. The preceding general guidelines apply to all measurements. The remaining sections deal with specific component types that are to be tested.
Page 4-17
Dont Guard (+) test point Dont Guard
Rx
Guard! (-) test point Guard!
Figure 4-11 - Choosing Voltage Mode Guards
Guard! (+) test point Guard!
Rx
Dont Guard (-) test point Dont Guard
Figure 4-12 - Choosing Current Mode Guards
Testing Resistors
As a first choice for testing resistors, select a measurement with the Current Mode since it will generally be the fastest and most accurate. For high values (e.g., 2 M and above), DC-V or 1 KHz readings may be faster. In general, with the Current Mode, use the highest output voltage in conjunction with the highest current that gives good results. For values below about 160 , the .2 V/ 1 mA range is the most accurate.
Page 4-18
If no readings (AC or DC) seem to work, look at the Dynamic Point Analysis screen. You might find that a cap in parallel is charging and that you can either discharge it previously with a DISCH test step, use the remeasurement delay, RES discharge parameter, or set the RESRG delay time to help.
Testing Capacitors
Although not always the case, in general, the Voltage Mode is preferable for small capacitors (about 10 F or less) and the Current Mode is best for larger capacitors. In addition to the general guidelines, try the swap model parameter to see if you get better results. This changes the calculation model used (see Theory of Operation). The System automatically tries to choose the best method. However, it can not correctly make this choice in all cases. Consequently, you may find your results improve dramatically by swapping the calculation model. For large capacitors, better measurement results are obtained if the fixture is wired for external sense. Since impedance of large capacitors is small, the characteristic resistance (up to about 15 ) in each test point can cause significant errors without external sensings.
Testing Inductors
Inductance measurements are subject to the same guidelines as capacitors, with only the calculations changed. Inductance measurements are available only with the Voltage Mode
Continuity Tests
Continuity tests are optimized for speed. As a result, you might find that the automatically generated continuity tests contain some erroneous connections or opens that are caused by charged or discharged capacitors. If this is the case, and it causes some testing problems, you can turn these into dont-cares and use RESistance tests for the problem points.
Testing ICs/Transistors/Diodes
For testing ICs, the ICs Test is typically used. Diode tests can be used for transistors, ICs and diodes. Most semiconductor junctions measure about 600 mV when forward-biased. Transistors and FETs can often be tested with use of biasing. A resistance test is made between the two load terminals of the device (e.g., source and drain) while a voltage is applied to the control terminal (e.g., gate). This can be used to turn the device on and off for testing purposes. This type of measurement can be made if you have the optional Model TR-4-1D MPX modules installed in your System. This capability is described in more detail in Chapter 7 of this manual in the section describing use of the Measurement Analysis screen.
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With a single diode test you can ensure that the diode or semiconductor is installed, that it is in the proper polarity, and that it is not open or shorted. With ICs, the diode test is typically used to measure the protection diodes present between the input and output pins and power/ground. You can typically find an asymmetrical set of diode junctions on the pins of the IC to confirm that the IC is clocked properly. You may also find a combination that has a different number of diode junctions in series in one IC orientation.
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Installation Instructions
Overview
There are several steps in the installation process. The first step is installation of the Model TR-4/6 Electronics Modules into your PC. The next step is installation of the CheckSum Test System Software. Finally, connections are made to the UUT via a CheckSum-supplied or your own fixturing system. You should read through this entire installation section before beginning. The procedure for installing the TR-4 Modules is discussed first, followed by installation of TR-6 Modules, installation of accessories and finally, installation of software. The System, as shipped, is configured so that the software and hardware jumper configurations match for your particular order. Because of this, you normally will not need to change any of the jumpers. However, if you find conflicts with existing hardware in your computer, it may be necessary to change some jumper positions. Also, you may be installing additional hardware not included with your initial system configuration which will require appropriate jumpering. If changes are necessary, the corresponding changes need to be made both on the hardware and in the software. You may wish to change the software configuration first since it will show you the new jumper positions necessary and show the range of addresses used by the module to help prevent conflicts. Note This installation procedure requires that you remove the cover from your PC for internal installation of the electronics modules. If you are not experienced with such procedures, you should obtain the help of a qualified person to do the installation. Before doing any the of module installation, it is necessary to remove the cover from the PC. To do so, perform the following steps:
Step 1.
Remove the power cord from your PC and turn off the power to minimize safety hazards and to ensure that no damage is done to circuitry in the PC or the CheckSum Modules.
Page 5-1
CAUTION
Ensure that you have removed the power from your PC. The power cable should be completely disconnected from its receptacle and the power switch should be turned off.
Step 2.
Remove the cover from your PC. Typically, the cover is secured with five screws on the back, one in each corner and one in the center top.
Step 3.
Discharge static electricity. Use an antistatic wrist strap when doing the following to minimize potential electrostatic discharge (ESD) damage to your computer or to the Model TR-4 electronics. If you do not have one, place your hand on the chassis of the PC to discharge any electrostatic potential your body may contain. Since a variety of hardware configurations are available, not all can be discussed in detail. However, the general ordering for modules is shown in Figure 5-1 below. You should determine which of these modules that you will be installing, then install them as shown in the diagram. They can be installed using some other organizations, but that shown works out well for the internal bus cabling.
Viewed from top of controller Test Points (16-pin bus) TR-4 System Module (Base 768) JP-1 JP-2 TR-6 System Module (Base 816) JP-3 TR-6-1 Relay MPX Modules (Base 832, 848,...) JP-2 " JP-2 TR-4-1 MPX Modules (Base 776, 780,...) JP-1 " JP-1 Other Modules (Model GPIB, RM-1) --JP-5 B a c k o f P C 1601-1616 1651-1700 1701-1750,... 1-200 201-400,... (2-pin bus) ---
Figure 5-1 - Module Configuration
Page 5-2
Model TR-4 System Module Installation

The first step of the installation procedure involves installing the Model TR-4 System Module in the PC. First, ensure that your Model TR-4 System Module is jumpered correctly. The default configuration has jumpers on JP-3 (shown in Figure 5-2) BASE ADDRESS positions 9 and 8, setting Base Address 768 decimal (300 hex). The System Module uses 8 consecutive I/O addresses beginning at its base address. Detail about the specifics of setting the jumpers is shown in Appendix D. Once the Module is properly jumpered, remove the blank bracket in the PCs back panel position, install the TR-4 System Module into the slot, and reinstall the hold-down screw through the modules back panel.
Base Address 9876543
Figure 5-2 - CheckSum Module Base Address Jumpering
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Model TR-4 Auxiliary I/O Connector

Overview The Aux I/O Connector (consisting of a bracket, cable and connector) included with the Model TR-4 System Module can be used to provide access at the back of the controller to the special auxiliary inputs and outputs of the Model TR-4 System Module. These inputs and outputs include eight digital I/O bits, ground, and unswitched source and sense from the measurement module. The available inputs and outputs are shown in Figure 5-3 of this Instruction Manual. It is not necessary to install this bracket unless you are going to use these special capabilities. However, if you are installing a Model TR-3 Vacuum fixture receiver with automated vacuum control (Model TR-3-VALVE), you will need this bracket to connect the remote control cable to the fixture. Bracket Installation The bracket can be installed in any open slot that is in the proximity of the Model TR-4 System Module. Once the bracket is installed, the other end of the cable is plugged into JP-4 on the System Module. Pin one is shown on the connector with a small triangle and with a red wire on the appropriate side of the ribbon cable. Ensure that pin one of the cable is connected to the left side of JP-4. If you do not have any open slots on the controller for installation of the bracket, you can alternatively remove the DB-15 connector from the bracket and install it in a cut-out in the back panel of the controller. Wiring to the Aux I/O Connector A standard DB-15 male connector mates with the Aux I/O Connector. These are readily available from a number of sources. Unless necessary, it is recommended that you do not connect to the high and low source and sense terminals. The connected wires can act as antennas adding noise to low level measurements. Also, these terminals are not switched by the System, so any impedances on these terminals will affect normal measurements taken by the System. Call CheckSum for more information if you would like to use these terminals.
Page 5-4
Low Source Low Sense High Source High Sense Digital IO Bit 1 Digital IO Bit 2 Digital IO Bit 3 Digital IO Bit 4 Digital IO Bit 5 Digital IO Bit 6 Digital IO Bit 7 Digital IO Bit 8 Not Used Not Used (or +5V, see note below) Ground
1 9 2 10 3 11 4 12 5 13 6 14 7 15 8
Figure 5-3 - Aux I/O Pinout Back Panel Connector, DB-15 Female (viewed facing back panel from rear)
- Note If necessary, you can also connect unfused +5V from the controller to the back panel connector. To do so, solder a jumper on the back of the Model TR-4 System Module JP-4 from pin 16 to pin 14. Also, install a shunt to JP-2 on the System Module to enable this output. Once you have made these changes, +5V will be available at pin 15 of the back panel auxiliary I/O connector. If you do so, do not attempt to draw more than about 100mA from the connector to prevent damage to the module. To provide additional safety, you could install a fuse (e.g., Littelfuse .1A Microfuse 273 series) or a current-limiting resistor (e.g., 50 ) instead of connector JP-2.
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MPX Module (MPX-3 and TR-4-1D) Installation

The next step of the installation procedure involves installing the MPX Modules (MPX-3 or TR-4-1D) in the PC. Note Because of the 50-pin ribbon cabling used with the MPX Modules, there is limited space between the Modules. If possible, allow an extra slot between the Modules for additional clearance. If this is not practical, the Modules may be installed in adjacent slots. CheckSum can, upon request, provide Nomex dividers to be placed between the ribbon cables of each Module and the circuit side of the adjacent Module to ease installation and to help prevent the cables from being damaged by rubbing on the protruding component leads.
Step 1.
Make sure the MPX Modules are jumpered properly. The base address jumpers are installed on JP-2 of the MPX Modules. MPX-3-200 The MPX-3-200 module base address jumpers are installed on JP2 and the Board Select jumpers are installed on JP3. As shipped from CheckSum, the first MPX-3 module is set to a base address of 672 decimal (2A0 hex, JP2 jumpers on positions 9, 7, and 5) and a Board Select setting of 1 decimal (1 hex, JP3 jumper on position 0). The second MPX-3 module uses the same Base Address and a Board Select setting of 2 decimal (2 hex, JP3 jumper on position 1). The third MPX-3 module uses the same Base Address and a Board Select setting of 3 decimal (3 hex, JP3 jumpers on positions 1 and 0), and so on. TR-4-1D As shipped from CheckSum, the first TR-4-1D MPX is jumpered to a base address of 776/308 hex (jumpers on positions 9, 8 and 3), the next to 780/30C hex (jumpers on positions 9, 8, 3 and 2), the next to 784/310 hex (jumpers on positions 9, 8 and 4), and so on. Detail about the specifics of setting the jumpers is shown in Appendix D.
Step 2.
For each MPX Module, install as described below and as shown in Figure 5-4. The instructions assume you are positioned in front of the computer, facing the front panel. If you are installing several cards, install them from right to left. Install the MPX Modules with the addressing in sequential order, beginning on the left. Using this convention, it is easier to keep track of the cabling.
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Note If there is a card installed in the slot to the left of the slot desired for the MPX Module, temporarily remove it to provide additional working room. 1. Remove the blank slot cover from the desired slot. Save the screw for reinstallation in step 5. 2. Slide the card into the desired position, but without the board-edge fingers engaged into the motherboard connector. Position the bracket end of the MPX Module to the left to provide working room. 3. Install the first of the four cables to JP-9 on the MPX Module. Pin one (typically indicated by a tracer on the cable) should be toward the bottom. Install the end of the cable without the white handle and strain relief to the MPX Module. Fully seat the cable by pressing the cable connector onto its corresponding header. 4. Similarly, install the other three cables to JP-8, JP-7 and JP-6 on the MPX Module. 5. Ensure that the cables are nested in their proper position on the MPX Modules back panel bracket. Reposition the MPX Module over the motherboard connector and fully seat it. Install the screw removed in step 1 through the top of the back panel bracket into the PC chassis to hold the Module in place.
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Figure 5-4 - MPX Module Installation
Page 5-8
Model TR-6 System Module Installation

The next step of the installation procedure involves installing the Model TR-6 Functional Test System in the PC. The Model TR-6 System Module can be identified by the different colored connector (typically blue) on the back panel.
Step 1.
Make sure the System Module is jumpered properly. The base address jumpers are installed on JP-4 of the TR-6 Module. As shipped from CheckSum, it is set to base address 816-831(330-33F hex) with jumpers on positions 9, 8, 5 and 4. Details about setting the jumpers is shown in Appendix D. Attach the appropriate cable to JP3.
Step 2.
Plug the Model TR-6 System module into the PC.
Step 3.
Install the screw removed in step 1 through the top of the back panel bracket into the PC chassis to hold the Module in place.
Step 4.
Install a 50-pin ribbon cable in the back panel connector.
Model TR-6-1 Relay MPX Module Installation

The next step of the installation procedure involves installing the Model TR-6-1 Relay MPX Module(s) in the PC. The Model TR-6-1 Relay MPX Modules can be identified by observing a black 50-pin ribbon cable connector on the back panel.
Step 1.
Make sure the Modules are jumpered properly. The base address jumpers are installed on JP-1 of the TR-6-1 Modules. As shipped from CheckSum, the first module (test points 1651-1700) is jumpered to base address 832-847 (340-34F hex) with jumpers on positions 9, 8 and 6. The second module (test points 1701-1750) is jumpered to base address 848-863 (350-35F) with jumpers on positions JP-1 9, 8, 6 and 4.
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The third module (test points 1751-1800) is jumpered to base address 864-879 (360-36F) with jumpers on positions JP-1 9, 8, 6 and 5. Subsequent modules are jumpered in a similar sequence. Details about the specifics of setting the jumpers is shown in Appendix D.
Step 2.
Plug the Model TR-6-1 Relay MPX modules into the PC.
Step 3.
Install the screw removed in step 1 through the top of the back panel bracket into the PC chassis to hold the Modules in place.
Step 4.
Install a 50-pin ribbon cable in the back panel connector of each module.
Accessory Module Installation

The follow sections discuss installation of accessory modules that can be configured into the System. Usually, these modules are installed after the TR-4 and TR-6 System Modules.
Model T-120-2 Strip Printer Installation

The Model T-120-2 Strip Printer can be used to print test results in a compact form. The Model T-120-2 is available in either parallel (standard) or serial (no-cost option) configurations. Both include the appropriate cable. The parallel printer connects to the LPT1 connector, and the serial version connects to the COM1 connector on the back of the controller. In order to configure the printer to work properly, the internal DIP switches should be set to all ON except set switches 6 and 7 to OFF. For the serial printer, to set the baud rate and other communication parameters of the PC to match the printers hardware setup, include the following line in your AUTOEXEC.BAT file: MODE COM1: 12, n, 8, 1, p To configure the Model TR-4/6 Software for the printer, use the "Configure Accessories & Fixture" Screen (from the main menu, press [F4]/[F3]/[F2]). Set blank lines at end of report to 6 and test and batch report printer width to 40.
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Finally, for the paraller printer specify "LPT1" as the output device in the "Test Completed" Menu after completing a test. Set it to "COM1" if you have the serial printer. Once changed, saving the station configuration data on disk will save the setting for future use (from the main menu press [F4]/F9]). Prior to use, check that the printer ribbon and paper are installed and that the printer is switched to the on-line position before printing results.
Model G-80 Installation

If you have purchased a CheckSum Model G-80 Digital I/O Module with your System, it is installed just like the Model TR-4 Modules. However, the jumper settings are slightly different. Refer to the Model G-80 Instruction Manual for details. As the default, the Model TR-4/6 expects the Model G-80 base address to be 512 (jumpers on position 8, 7, 6 and 5) and module select 1 (jumper on module select 1).
Model TR-6-2 Fixture Interface Installation

If you have purchased a CheckSum Model TR-6-2 Fixture Interface, it will be installed external to the PC (most likely inside your test fixture). Refer to its manual for instructions about how to customize this interface and wire it to your System.
Model-GPIB IEEE-488 Interface Installation

If you have purchased a CheckSum Model-GPIB IEEE-488 Interface Module, it is installed in the System using the default settings as per its instruction Manual. As these defaults, the Model TR-4/6 expects the following switch settings on the Model-GPIB: 1. Base address 688 (hex 2B0) - (SW-1 switches OFF for address positions A7, A5, A4 and ON for address positions A8, A6). Note that the actual address space used in this configuration is 688 (2B0 hex) to 703 (2BF hex), but the GPIB-proper starts at address 696 (2B8 hex). 2. Wait states 0 (SW-11 switches W1 and W0 = ON). 3. Firmware address segment setting 53248 (hex D000) - (SW-2 A18, A16 = OFF, SW-2 A17, A15, A14 = ON). Other address segment settings (such as hex E000, E400, E800 or EC00) are also accepted as long as the setting does not conflict with address space selection on other cards. 4. Operating Mode Setting "A" (SW-3 "A"). 5. DMA Level Setting DACK 3, DRQ 3 (jumper JP-1 on position 3, jumper JP-2 on position 3). 6. Interrupt Level 7 (jumper on JP-3 position 7)
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Model RM-1 Installation/Usage

The CheckSum Model RM-1 Relay Module can be installed into a test system to provide undedicated switching of power or signals. It uses one short PC slot and has interconnections via a d-Sub back panel connector. A mating connector is included with the Model RM-1. The Model RM-1 is jumpered and installed as described in its individual instruction manual. The default base address of 800 801 (320 - 321 hex) does not conflict with standard addressing of other CheckSum hardware. As defaults, the Model TR-4/6 expects the following switch settings on the Model RM-1: 1. Base address 800 (320 hex). (SW-1 A8 & A5 = OFF - SW-1 A7 & A6 & A4 & A3 & A2 & A1 = ON) 2. Other jumpers: dont care - the other jumpers on the module are for setting digital input characteristics and are no-cares as far as the Model TR-4/TR-6 configuration is concerned. You should set them to meet your testing requirements if you are using the module to do digital input. To program the Model RM-1 using CheckSum Model TR-4/6/8 Software, the PORTO command is used. Specify a range that matches the base address of the module (e.g., PORTO 800). The high limit represents the byte of information to send to the module. The high limit value is determined by adding the following values. The specified relays are closed and the remaining relays are opened.
Relay to Close Relay 1 Relay 2 Relay 3 Relay 4 Relay 5 Relay 6 Relay 7 Relay 8
Range Value to Add 1 2 4 8 16 32 64 128
The RM-1 requires about 8 mSec for switch closure. To ensure that the relays are fully closed, you can use a PAUSE command to delay sufficient time for switch closure. The Model RM-1 also supports digital input. To access the digital input, use the PORTI command using an address one higher than the base address. For example, if you are set to base address 800, use PORTI 801 in order to read back information from the module.
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Completing the Hardware Installation

As a final step in the hardware installation process, it is necessary to install the internal bus cabling inside the PC between the various test modules. With a TR-4 System, a 16-pin analog bus carries the signals from the TR-4 System Module to all of the MPX (MPX-3-200 and TR-4-1D) modules. With the TR-6 System, a 2-wire bus carries the signals from the TR-6 System Module to each of the TR-6-1 Relay MPX modules that are installed. With a combined TR-4/TR-6 System, the 16-pin bus is connected from the TR-4 to the TR-6, and another bus connects from the Model TR-6 to the MPX Modules.
Step 1.
For a standard Model TR-4 MDA System, connect the 16-pin ribbon cable between the Model TR-4 System Module and all installed MPX (MPX-3-200 and TR-4-1D) Modules. The cable connects between JP-1 on each Module. If you need a cable with a different number of connectors than that delivered with your System, contact CheckSum to obtain a cable with the necessary number of connectors. If you are also installing a Model TR-6 Module, a short 16-pin bus cable is connected from JP-1 on the TR-4 to JP-2 on the TR-6 Module. Connect the 16-pin bus from JP-1 on each of the MPX(s) to JP-3 on the TR-6 Module. Connect a 2-wire bus cable from JP-5 on the TR-6 Module to JP-2 on each TR-6-1 board. If you need to install any accessories, refer to the following section before putting the cover back on the PC.
Step 2.
Reinstall the cover of the PC.
Step 3.
Reinstall power to the PC and boot it up.
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CheckSum MDA Software Installation

The next step of the installation procedure entails installing CheckSum System Software in your computer. CheckSum Software is provided on a 3 1/2" DS/HD (1.44 MByte) floppy diskette. Depending on your hardware configuration, there are two installation procedures. The first is used if you have a hard disk drive in your System. The second is used if you do not have a hard disk drive. In this case, the System is run from the floppy disk drive. Use of a floppy drive only is not recommended because significant delays will occur when the software changes from function to function as disk accesses are necessary or when report information is saved to the disk. Also, the storage area for test programs and results data is very limited. For hard disk systems, the basic software will use about two MByte. Typical test programs (spec files) use less than 100 KBytes each. You will want to have several extra megabytes if you are saving SPC or results data to disk. The System uses the main executable file MDA.EXE which is accessed during some operations. It also uses the configuration file $TR4$.DAT that contains information specific to your installation (calibration constants, hardware setup, data paths,...). Finally, it contains protected mode memory manager files RTM.EXE and DPMI16BI.OVL. Note Throughout the manual, computer keys to be pressed are represented with their name surrounded by square brackets. For example, the Escape key is represented by [ESC] .
Controller Memory Setup

CheckSum software uses a DPMI 16-bit compliant extended memory manager. This technique allows more available capacity within a computers memory space. With this technique, different parts of the program are loaded into memory as necessary. Memory management operation is transparent to you, except that you might notice small delays when moving from one section of the software to another as the newly necessary code is loaded from the hard drive into memory.
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Hard Disk Drive Installation

If you have a hard disk drive in your System (drive C:), you will want to install the CheckSum MDA System Software onto it. The installation procedure installs it in a new subdirectory called CHECKSUM.
Step 1.
Start your computer and go to the root directory of C: by typing: C:[Enter] CD \[Enter]
Step 2.
Insert the CheckSum Software diskette into your A: drive.
Step 3.
The installation procedure creates a directory on your hard disk drive (C:) named \ CHECKSUM. A file called MDA.BAT is copied onto the root directory to allow you to start the System from the root directory when you first power up the computer. Ensure that these directory and file names do not conflict with any existing ones on your disk. To install the software as described, type: A:INSTALL[Enter] Follow the instructions shown on the computer display.
Step 4.
Remove the CheckSum Software diskette and store it in a safe place.
Step 5.
Start the CheckSum Software by typing: MDA[Enter] In this configuration, the operating software and test spec data are stored in \ CHECKSUM. Testing can be initiated by typing MDA from within either the root or \CHECKSUM directories.
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Floppy Disk Drive Installation

If you do not have a hard disk drive in your System, use this procedure.
Step 1.
The first step is to back up the CheckSum System Software diskette. Have a spare floppy diskette ready. Insert the CheckSum diskette into the disk drive. Type: DISKCOPY A: B:[Enter] Follow the instructions with the source disk being CheckSum Software and the destination disk being your blank diskette. If you need additional instructions for this operation, refer to your DOS manual. There is no software protection of CheckSum Software, so use of the DOS COPY command for all of the files can be used alternatively. Once this operation is complete, store the original CheckSum Software diskette in a safe place for future use. Put your copy of the CheckSum diskette into Drive A:
Step 2.
You are now ready to start the CheckSum Software. Type: MDA[Enter] To initiate future testing, insert your diskette in A: and type: A:[Enter] MDA[Enter] In this configuration, your operating programs and spec data are stored on A:. You can save spec data on the same disk as the CheckSum Software. If you have a two-drive system, you can change the data paths to be B: with the Configure/Install System menu .
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Completing the Software Installation

At this point, you should see the main directory which is called the System menu. All System operations are obtained by starting at this directory.
Figure 5-5 - System Menu Select [F4] - Configure/Install System. You then see the Configure/Install System menu shown in Figure 5-6. For each of the Modules installed in the System, there is a configuration line available. Configuration lines for the Model TR-4 System Module and MPX (MPX-3-200 and TR-4-1D) Modules are available with [F1] TR-4 module configuration. Configuration lines for the Model TR-6 System Module and TR-6-1 Relay MPX Modules are available with [F2] TR-6 module configuration. Configuration lines for the Model G-80 Digital IO, RM-1 Relay Module, and Model GPIB are available with [F3] Other hardware configuration . For each module that you have installed, go to the appropriate configuration line, then Press [F1] to invoke the self-test for that module. The System will then exercise the selected module to ensure that it is working properly, that no PC incompatibilities exist, and to determine internal calibration constants for proper operation. The Model TR-4, MPX-3-200, TR-4-1D, TR-6, TR-6-1, and G-80 all have self-test routines that can be executed. Perform the self-tests beginning with the System Modules. As part of each system module test, the PC speed is characterized and other tests performed that allow the MPX
Page 5-17
tests to be performed properly. Executing the tests in another order can cause erroneous results (particularly the first time the hardware is installed in a new computer).
Figure 5-6 - Configure/Install System Menu Also on each configuration line is a listing of the test point numbers for each module, the address range, the jumper settings, and the fixture connections. The System is shipped with this configuration matching that of the hardware as shipped to you so you should not need to change anything here unless you wish to add or subtract modules, or rejumper to eliminate a conflict with other hardware installed in your PC. If you wish to change the jumpers on a module, type in the desired base address. The System will then compute the nearest achievable value and display the jumper setting to accomplish this base address. Note At the beginning of each self-test, the system does a check for overlapping addresses configured into the software. Conflicts with modules not shown on the MDA configuration (e.g., network cards) can still exist and not be detected by the software. The self-test calibrates your System and MPX Modules and verifies that all of the I/O pins (called ports or test points) on the MPX Modules are operational. Once each self-test has started, follow the prompts until it is completed. It will report any errors that it finds.
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As part of the MPX module self-test, the System performs a zero-offset calibration. When doing so, the System asks you to short each group of 50 pins on the MPX Module. When requested, install the shorting fixture (included with the TR-4 System Module) on the end of each ribbon cable coming from the MPX Modules. When asked to short the next 50 pins, remove the shorting fixture (by use of the ejection levers) and move it to the next cable. Note When facing the back of the computer, pins 1-50 are the rightmost cable coming from each MPX-3-200/TR-4-1D MPX Module, pins 51-100 are the next cable to the left, etc.. If you need further instructions in the use of the System self-test, refer to the System Self-Test section in the Configuring the System chapter of this manual. For detailed instructions in use of the Configure/Install System menu, refer to the Configuring the System chapter of this Instruction Manual. If errors are reported, refer to Appendix D for help. If no errors are reported, select [F8] to save the configuration data on the disk. Finally, select [ESC] to return to the System menu. Note It is important to save the System configuration data after System self-test is completed. This operation stores calibration constants and timing information specific to your installation on the System disk. If you skip this operation, the System will not perform as quickly or accurately as it should. Software installation is complete at this time.
Connection to the UUT

Once you have installed the System hardware and software, you are ready to connect your unit-under-test (UUT) to the System. The UUT is connected via the 50-pin ribbon cables from the MPX-3-200/TR-4-1D MPX Modules, the Model TR-6 System Module, and the Model TR-6-1 Relay MPX Modules. You may choose to obtain a fixturing system directly from CheckSum or design your own. If you are using a CheckSum Fixturing System, refer to the manual obtained with the Fixturing System for specifics of connection.
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If you are connecting to your own fixturing, you need to connect the test points available via the ribbon cables to your UUT.
MPX (MPX-3-200/TR-4-1D) Test Points

On the MPX Modules, the rightmost 50-pin connector (when facing the component side of the MPX Module) contains test points 1-50, the next connector contains test points 51-100, and so on. The pin-out for test points 1-50 is shown below. The pin-out for the other test points is the same except add 50, 100 or 150 to each test point number shown in the figure as appropriate. See Appendix A for additional information about the pin-out.
50 48 46 44 42 40 38 36 34 32 30 28 26 24 22 20 18 16 14 12 10 8 6 4 2
49 47 45 43 41 39 37 35 33 31 29 27 25 23 21 19 17 15 13 11 9 7 5 3 1
Figure 5-7 - MPX (MPX-3-200/TR-4-1D) Test Point Pin-Out (when facing header on MPX Module) If you have installed the jumpers as suggested, the pin-out will start at test point 1 on the rightmost cable (when facing the back of your computer) and increase by 50 for each cable. If you are confused, use the Systems probing feature to probe each cable for identification.
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Model TR-6 Test Points

On the Model TR-6 System Module and TR-6-1 Relay MPX Modules, the signals are available from 50-pin connectors on the Module back panels. The TR-6 System Module has a uniquely colored connector (typically blue) so that it can be differentiated from the TR-6-1 modules without removing the PCs cover. The back panel pin-out for the first Model TR-6-1 is shown in Figure 5-8 below. Add 50 to each test point for each additional TR-6-1 module installed.
TP 1651 TP 1653 TP 1655 TP 1657 TP 1659 TP 1661 TP 1663 TP 1665 TP 1667 TP 1669 TP 1671 TP 1673 TP 1675 TP 1677 TP 1679 TP 1681 TP 1683 TP 1685 TP 1687 TP 1689 TP 1691 TP 1693 TP 1695 TP 1697 TP 1699
TP 1652 TP 1654 TP 1656 TP 1658 TP 1660 TP 1662 TP 1664 TP 1666 TP 1668 TP 1670 TP 1672 TP 1674 TP 1676 TP 1678 TP 1680 TP 1682 TP 1684 TP 1686 TP 1688 TP 1690 TP 1692 TP 1694 TP 1696 TP 1698 TP 1700
Figure 5-8 - Model TR-6-1 Test Point Pin-Out (on first module) The Model TR-6 has a special pin-out because it mixes power, test points, and other dedicated signals on one connector. The pin-out for the TR-6 System Module is shown in Figure 5-9 and also in Appendix A.
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1-TP 1 3-TP 3 5-TP 5 7-TP 7 9-TP 9 11-TP 11 13-TP 13 15-TP 15 17-Ground 19-Relay 1 NC 21-Relay 1 Com 23-Relay 1 NO 25-Relay 3 NC 27-Relay 3 Com 29-Relay 3 NO 31-UCT Gate In 33-SqrV Out 35-SineV Out 37-DMM In Low 39-DigIO 1 41-DigIO 3 43-DigIO 5 45-DigIO 7 47-Ext IO 7 49-(-)12V Pwr
2-TP 2 4-TP 4 6-TP-6 8-TP 8 10-TP 10 12-TP 12 14-TP 14 16-TP 16 18-Relay 2 NC 20-Relay 2 Com 22-Relay 2 NO 24-Relay 4 NC 26-Relay 4 Com 28-Relay 4 NO 30-UCT Ch 2 In 32-UCT Ch 1 In 34-Analog Gnd 36-DcV Out 38-DMM In High 40-DigIO 2 42-DigIO 4 44-DigIO 6 46-DigIO 8 48-(+)5V Pwr 50-(+)12V Pwr
Figure 5-9 - Model TR-6 System Module Pin-Out
Connection Guidelines
Following are some guidelines for use when wiring for MDA testing. You should consider the use of external sense points when designing the fixture. In many cases, when measuring or guarding low-impedance components (below about 100 ), better measurement results can be obtained by making a 4-wire connection all the way to the UUT, allowing the voltages to be sensed as close to the component being measured as possible. A recommended practice is to always wire an extra connection to the UUTs ground and to each of its power supplies. There are three ways to wire an external sense point, all of which work well: 1. Install two probes on the desired network. 2. Connect two wires going to the same probe.
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3. Connect two test points together at the end of the cables coming from the MPX Module. If you would like to have groups of 50 test points all wired with external sense points, a special loop-back Kelvin cable can be used. Each end of the Kelvin cable connects to a header on the MPX Module, then it has a 50-pin receptacle mounted in the middle of the cable that you connect to your fixture. Upon request, CheckSum can substitute a Kelvin cable for two standard cables at time of shipment with no additional cost. Contact CheckSum for details. When wiring for functional testing, the following guidelines are appropriate. You should also read the Model TR-6 Theory of Operation (Chapter 4) before wiring the fixture. 1. Use MPX (MPX-3-200/TR-4-1D) test points where ever practical since they are the most flexible in use. 2. Use Model TR-6(-1) Relay Test points only when the voltage at the test point will exceed 12 volts from the PC chassis, or when higher current is required (e.g. TR-6 DMM resistance measurements exceed the current-carrying capability of the solid state switches. This is only of concern if you want to measure resistances less than a few ohms). 3. If you have Model TR-4-1D MPX Modules and want to use their digital capability, connect the signals that you want to multiplex between analog and digital to the first 16 test points on each module. Connect the output and inputs together on each byte (1-8 and 9-16) since the bytes are enabled as inputs and/or outputs as a whole (see the DIGA test type description in Chapter 11 for details). The MPX-3-200 module does not support digital I/O. 4. Use at least two probes on each power supply that you will be connecting to the UUT (or if possible use an external cable to plug into the UUT). To minimize voltage drops between the UUT and power supply, use relays and a power supply in close proximity to the UUT and use fairly large wiring. The Model TR-6-2 Fixture Interface Module supports this type of wiring.
Page 5-23
Page 5-24
Testing an Assembly
Overview
This chapter tells you how to use your Model TR-4 Test System to test assemblies (called UUTs or units-under-test). If you have not already installed the CheckSum hardware and software into your PC, refer to the Installation Instructions section in Chapter 5. If you do not have a hard disk drive, insert your copy of the CheckSoft disk into the A: drive. Type in the sequence: A:[Enter] MDA[Enter] If you have a hard disk drive in your computer and are presently in the CheckSum or root directory (\CHECKSUM or \), simply type: MDA[Enter] You will then see the System menu shown in Figure 6-1 on the following page.
- IMPORTANT NOTE The CheckSum Model TR-4/6 Test System provides adequate protection against normal input voltages at the test points. However, the System can be subject to damage in environments of high electrostatic discharge (ESD). If this is the case in your testing application, ensure that the operator wears a wrist strap connected to the computer chassis and that the UUT is adequately discharged before connection. If it is not possible to take these precautions, contact CheckSum to discuss alternative forms of ESD protection.
Page 6-1
Figure 6-1 - System Menu This chapter deals with the [F1] choice, Test an Assembly. The next two chapters describe the other choices from this main menu. In general terms, this is what each option will do for you:
[F1]
is used to test an assembly. The assembly must have been previously learned by use of [F2]. The selection of [F1] also allows you to choose a test specification data file describing the UUT, and to display or print test results. is used if you want to program (learn) the test sequence and test tolerances for a particular UUT. You can use [F2] to assign alphanumeric pin names, assign operator instructions, assign an assembly name, assign test tolerances, read or write the test specifications for an assembly in ASCII (e.g., from a PC file created separately), generate a test program from CAD data, manually generate or edit spec data, save specification information about an assembly on the disk, or get a test specification report for the assembly. is used to generate statistics reports to describe testing that has occurred on the System. These reports include Production Reports to list the number of UUTs tested over a period of time, how many passed or failed, the yield and how many defects. The Pareto Failure Report allows you to find out what type of errors have occurred and their frequency. The X-Bar/Sigma Control Report allows you to analyze analog measurements to observe trends or for setting test limits. is used to change the configuration of your testing environment. With this option you can select System self-test (which verifies proper operation and
[F2]
[F3]
[F4]
Page 6-2
calibrates your Test System), specify which disk and directory test specification data is to be stored in, turn the beeper on and off, tell the PC how the hardware is configured, and configure the reports generated by the System.
[F10] [V]
allows you to terminate operation of the System. Once this option is selected, you return to the DOS environment. is used to find out what version of software that you are presently using. The version menu also tells the date the system was last calibrated and CheckSums phone number.
[ALT D] is used to leave the MDA environment temporarily and run commands. When you are done entering these commands, type "exit" to return to the MDA main menu.
Page 6-3
Selecting the Proper Spec Data

File Selection Menu
To perform a test of an assembly, select [F1] from the System menu (Figure 6-1). This selects the File Selection menu shown in Figure 6-2.
Figure 6-2 - File Selection Menu In this menu, there are several choices. Not all may be available depending on the configuration of your System. When you initiate a test, it uses the specification (spec) data information that is currently loaded in memory. At the end of the [F1] line on the screen, you will see a name in parentheses. This is the name of the file that is currently loaded into memory. If it is (none), no file has been loaded into memory. If an assembly name has been assigned to the data in memory, it appears on the line preceding the file name. If an assembly has been learned but not saved on disk, it is valid to continue with the test even though no file name is present, i.e., (none). If an assembly has not been learned, or spec data about an assembly has not been loaded into memory, the System will not allow you to continue.
Page 6-4
[F1]
is selected to execute the spec data presently in memory. options are used to load a spec data file into memory from the disk.
[F2] or [F3]
[F2] allows you to type in the file name of a spec data file to be loaded into memory. Type in the name of the file (with up to eleven characters that do not include spaces or special characters such as colons or periods). The System automatically adds on the path name as defined in the Configure/Install System menu. The System advises you if the file is not found. Other errors that might occur are listed in Appendix E. [F3] allows you to choose the data file from a list of those available on the disk that you have chosen. The list is sorted to be in alphabetical order. A sample listing is shown in Figure 6-3.

[F4] [F5]
Selects the Spec File Execution Parameters menu shown in Figure 6-3. of the File Selection menu allows you to specify skipped PCBs in multiple-PCB panels. This selection only appears if the assembly that you are testing is configured as a multiple-PCB panel. When you have selected [F5], you are presented with the Skip PCBs in Panel display shown in Figure 7-22. By moving the cursor to the PCB(s) that are to be skipped, then pressing [F1], the test on the selected PCBs will not be performed. This selection is helpful when one or more of the PCBs in the panel are rejected and a test is not desired. of the File Selection menu allows you to disable data logging for the batch of assemblies that are about to be tested. This selection appears only if data logging is enabled. Disabling data logging can be performed in cases where you do not want to collect statistics, such as when you are retesting assemblies that have been repaired.
[F6]
[ESC] is used to return to the previous menu.
Page 6-5
File Selection List

You may move up and down the displayed list with the up and down arrow keys or page up and page down keys. When you press [Enter], the file name that has square brackets around it is loaded into memory. If you do not wish to load a file into memory, press [ESC] to exit.
Figure 6-3 - File Selection L ist
Page 6-6
Spec File Execution Parameters

This menu allows you to customize how spec file list execution is performed. It lets you set the default behavior during spec execution for halt on failure, single stepping, length of test result reports and the number of retests of failed steps. Halt on failure and single stepping can also be controlled from within the test program by the FLAGS test type to override the defaults selected in this menu. Figure 6-4 - Spec File Execution Parameters
[F1]
of the Spec File Execution Parameters menu allows you to choose to halt on failures that occur during the test. If N is selected, the System does not halt on failures. of the Spec File Execution Parameters menu allows you to choose single-step mode of operation during the test. If Y is selected, the System halts after each test step. of the Spec File Execution Parameters menu allows you to specify how many errors can occur before a test is aborted. The default, 10,000, allows the test to complete in all cases. If set to a lower value and the total errors during a test exceeds that count, the test is aborted and the operator is presented with the Test Completed screen. Since the total errors are checked between each test step, that number might exceed the maximum number of errors specified if a test step can generate multiple errors (e.g., CONTinuity). of the Spec File Execution Parameters menu allows you to specify how many test passes of failed test steps are executed for [ALT][F2] from the test completed menu of Figure 6-7. A value of zero means an unlimited retest amount. For each retest, steps that failed on the last test are executed along with steps that dont produce a pass/fail result such as conditional jump and display test types.
[F2]
[F3]
[F4]
[ESC] is used to return to the previous menu.
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Performing the Test

[F1] of the File Selection menu starts a test. If operator instructions have been assigned, those are presented first. When you are finished reviewing the instructions, press any key to continue on to the test. If you press [ESC], the System returns to the File Selection Menu. Once you have initiated the test, the System displays the Testing display shown in Figure 6-5. Note that if the System has been configured to test multi-PCB panels, the testing display will appear slightly different. In this case, the lower right of the display will show a matrix entry showing which PCB is presently being tested. See the multi-PCB section of this manual for details.
Testing Display
Figure 6-5 - Testing Display
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The upper left corner shows which test step number you are executing. This allows you to determine how far along the testing has progressed. The upper middle area of the screen shows the test status. This shows whether the System is actively testing or whether it is paused, waiting for operator input. The upper right corner of the screen shows the number of errors (test failures) that have occurred so far during the current test. Below the status area of the screen is the test result area. When the test is paused, the result of the last completed test step is displayed. It shows the following: 1. Test step outcome (passed or failed) 2. To and from test point numbers and names 3. Test type (e.g., RES for resistance or CAP for capacitance) 4. Range (e.g., 0 for autorange, 1 for 200 range,...) 5. Title showing the component name and/or part number tested 6. Low and high test limits 7. Measured value If the System has been invoked with the /sf or /sfp command line parameters (see the Appendix for particulars), it updates the test result area of the screen during the test even if the System doesnt halt. The test result area of the display shows a list of up to the first ten continuity failures (as in Figure 6-6) when Halt on Fail, [F4], is enabled and a continuity failure occurs. The displayed failures are continually retested and their displayed status is updated if the user enters [Alt][F2]. Any change in the status of the displayed errors is reported by a beep while in this mode. This mode is exited and continuity is remeasured when [F1] or [F2] are entered. Below the test result area is the message area. This part of the display is used for DISP messages displayed to the operator. The information shown here depends on how the System has been programmed in your facility. The bottom of the screen shows the selection area. The following choices are available:

[F1] [F2]
Next Step is used when the test is paused to continue with the next test step. Repeat Step is used when the test is paused to repeat the test step that was just executed (the test step that is repeated is shown in the test result area).
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[ESC] Abort Test is used to abort the test in progress so as to terminate execution. If a test step is in progress, the System pauses when [ESC] is pressed. If the System is paused, [ESC] terminates the test. [F3] Single-Step Mode is used to select or deselect single-step mode. If single mode is selected (an asterisk shows beside the selection), the System pauses after each test step. Halt-Fail Mode is used to select or deselect halt-on-failure mode. If halt-on-fail mode is selected (an asterisk shows beside the selection), the System pauses after each test step that fails. is a hidden key that is available only if there is no password assigned. It is used while debugging a spec file during the programming sequence. If you have halted on a failure during an analog test, and press [F5], the System will reassign the high or low limit so the test will pass the next time a similar reading is encountered. Only the limit on the failed side (high or low) is affected. The tolerance is assigned according to the settings of the automatic limits assignments set from the Enter/Edit Spec Data screen. If a continuity test has failed, the test point pair is assigned as a dont-care.
[F4]
[F5]
Shift-[F1] is provided as a means to escape from test execution inside a spec file called with RunT. If Shift-[F1] is used, the System escapes from the run environment without reloading the spec file that called the present spec file. This is intended only for use as a program development tool. Until a RetT instruction is executed, the calling spec file is still waiting to be reloaded and no further RunT calls can be made before RetT is executed. Note The [F5] and Shift-[F1] keys are only meant to be used by the System programmer during program development. [F5] is used to help adjust the System tolerances to accommodate normal variances from UUT to UUT. After a spec program is initially written, the programmer can run a batch of known-good UUTs, and press [F5] after each failure to adjust the tolerances. Shift-[F1] is used to examine execution results while staying in the context of a RunT called program.
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Figure 6-6 - Halt on Failure for Continuity Screen Note When you press [F1] or [ESC] to leave, the System logs the measurement value presently displayed. Consequently, if you repeat a test and it passed, the System will log the passed result.
Concluding the Test

Once the test is completed (either with or without errors), you are presented with the Test Completed menu shown in Figure 6-7. This display shows the total number of errors encountered in the test and the total time it took to execute the test. If the System has been configured for multi-PCB panel testing which fits within a four by four grid, the Test Completed menu also shows a representation of the PCBs with a [P] or [F] for each representing a Pass or Fail. If a matrix position is empty, then that PCB was not tested. For larger panels with multi-PCB testing, [F9] is provided to select panelized test results in a full screen.
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Test Completed Menu
Figure 6-7 - Test Completed Menu
The selections available from the Test Completed menu are explained as follows:
[F1]
is used to test the next assembly in this batch. Operator instructions are not redisplayed with this selection. The counter for the total number of assemblies in the batch is incremented when [F1] is selected. allows you to retest the present assembly without incrementing the total number of assemblies in the batch.
[F2]
[ALT][F2] executes only the test steps that failed on the last test pass or those unskipped steps that cant produce failures, e.g. such as VACUUM commands, display operations or math operations. It repeats test passes until there are no errors or until the maximum number of retest passes is reached (see Figure 6-4). Once an assembly passes failure only retests it generally
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should be retested on all test steps via [F2] to assure that there are no new errors.
[F3]
allows you to get a full test report for this assembly. The report goes to the destination selected in the [F6] Select Report Device selection. If CON (for console) is selected, the report is displayed on your CRT. Other choices include your PCs printer or a disk file. The format of the report is shown in Appendix B. The test report includes the name of your facility, the Assembly ID (the optional name assigned when the assembly is learned) and the date and time. It also contains the number of failures and an identifier for the tester. Even though a failure may have occurred more than once, it is only counted as a single failure. This prevents excessively long reports after intermittent testing. The result of each measurement is listed in the report. The same information is presented as in the Test Failure display, but in the report it is formatted slightly differently in order to be more compact. The appearance of the report can be configured with use of the Configure/Install System capabilities. See that section of this manual for specifics. Note that file names with the prefix format of $YYMMDD$ are temporarily created during report generation for panelized tests, where YY, MM, and DD represent year, month, and day, respectively. For example, reports generated on May 6, 1995 for a panelized test will temporarily create the file $950506$.1 containing test results for PCB 1. By default, test results reports for panelized boards are sorted by PCB number. Alt-R switches test result reporting to an alternate format which follows the test step sequence of the test program(s).
[F4]
allows you to get a test report for the assembly that lists only the outcome of the measurements that failed. In all other respects, it is just the same as the [F3] selection. is used to obtain reports about the batch of assemblies that are currently being tested. With use of the Test Environment Menu (see Chapter 10 for details), you can tailor the system to present two alternate selections for [F5] in this screen: SPC Not Allowed When not allowing SPC, at the end the test the option presented is [F5] Obtain test report for this batch which allows you to get a test report for this batch. The report goes to the destination selected in the [F6] Select Report Device selection. If CON (for console) is selected, the report is displayed on your CRT. Other choices include your PCs printer or a disk file. The format of the batch report is shown in Appendix B.
[F5]
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The batch report includes the name of your facility, the assembly ID, the date and time, the tester identification, the number of assemblies tested, the number of assemblies that had one or more failures, and the percentage yield. Depending on the configuration of your System (determined by the Report Configuration menu), the System may solicit the batch ID after you have requested a batch report. Your entry is printed in the report to describe which batch of assemblies (for example, your internal purchase order number) are being reported on. SPC Allowed When allowing SPC at end the test, the selection presented to the operator is [F5] Statistical Analysis. If this is selected, the operator can use the Statistical Analysis Menu discussed in Chapter 9 of this manual to obtain production, Pareto and X-bar/sigma reports. In this mode, there are some short-cut keys available to the operator: [Alt][F5] generates a production report, [Cntl][F5] generates a Pareto report, and [Shift][F5] generates a standard batch report as discussed above. When short-cut keys are used for SPC reports, the system uses the output device selected in the SPC screen, uses the reporting period of all today, and in the case of X-bar sigma, uses the currently loaded program as the selected UUT.
[F6]
is used to specify the destination of reports. The choice is shown in parentheses. You may toggle between several choices. If CON(sole) is selected, the reports will go to the PCs CRT display. You can individually select the COM and LPT ports if you have a printer. You may choose FILE.TXT to send the output to a disk file named FILE.TXT. Note that if this option is used, the file is saved in the same directory as the CheckSoft Software. It does not use the data path. After the file is saved you can leave CheckSoft Software and rename and/or move the file with the DOS COPY command. If you save more than once to FILE.TXT, the file is appended with the new data added. Because of this, you can use FILE.TXT to accumulate results, then periodically you may archive these results and start over. If you want to continue to use the same selections in future testing sessions, save the configuration data to disk (via the Install/Configure screen).
[F7]
of the Test Completed menu allows you to specify skipped PCBs in multiple-PCB panels. This selection appears only if the assembly that you are testing is configured as a multiple-PCB panel. When you have selected [F7], you are presented with the Skip PCBs in Panel display shown in Figure 7-21. By moving the cursor to the PCB(s) that are to be skipped, then pressing [F1], the test on the selected PCBs will not be performed. This selection is helpful when one or more of the PCBs in the panel are rejected and a test is not desired.
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[F8]
of the Test Completed menu allows you to specify that the System perform a fixture-check for possible contact problems with the test fixture. This selection is not available unless it has been previously learned via the Global menu available from the Enter/Edit Spec Data screen. Depending on whether the previously described option (Skip PCBs in Panel) is available, this selection may be called as either [F7] or [F8]. If this selection is chosen, the System tests each point to all other points to see if the measured value is below a predetermined resistance value. If the System detects test points that were below this threshold when fixture-check was learned, but now are above the threshold, it lists them (up to the first 20 points). The listed test point probes may not be making proper contact with the UUT. In this case, you may wish to check the fixture to ensure that the probes listed are making proper electrical contact.
[F9]
of the Test Completed menu allows you to call up an expanded display of pass/fail results for panelized PCBs. This selection is available only for PCBs that are panelized larger than four by four. The full results for smaller panels are fully represented without need for an expanded display.
[ALT E] Allows you to examine and edit SPC log errors including any logged results for the test just completed. Refer to [F8] in Chapter 9 Statistical Analysis menu for more details. [END] End allows you to leave the testing session (much like [ESC]), but without saving SPC data. This can be used if you have tested an assembly that you do not want to save data for in the SPC data base. [ESC] Escape allows you to return to the main System menu to select a new assembly to test or to begin a new batch.
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Page 6-16
Learning an Assembly
Overview
Learning an assembly is the process of entering test specification information about the assembly into the System so that it can be tested. The Test System provides the capability for this information to be entered in several ways. You may want to use a combination of these methods: 1. Open/short and ICs information for the assembly can be learned automatically by the System. To do this, you connect a known-good assembly, then tell the System to automatically learn the connections/ICs diode map for the assembly. 2. Information can be entered via a text file generated on your PC or automatic translation of CAD data. 3. Test data can be typed directly into the System. You probably will want to use method (1) for opens, shorts and diodes, then method (3) for the MDA test of the components installed in the assembly and for functional testing. For MDA testing, you can generate the test data as shown in the following steps: 1. Enter the test steps for each component, either manually or with CAD conversion. Minimally enter the two test points, test type (e.g. RES, CAP), component name (e.g. R101), and nominal value. Better yet, also assign pin names. 2. You may wish to use [Alt][s] in the Enter/Edit Spec Data screen to order the sort the test program in order by component title (e.g., C1, C2,..., R1, R2,...). 3. Go to the Global Menu and self-learn all the entries without guarding ([F7]). 4. Go to the Enter/Edit Spec Data screen. Look at each step that is skipped, which means the System couldnt find a good measurement method to achieve the nominal value. For each step, press [Alt][F5] to see if the System can achieve nominal with guard points. If it cant check your test program and fixture to ensure that they are correct. If they are correct, you may be able to achieve the correct result with manual guarding or other methods of measuring the step. Otherwise, the component may not be testable. 5. Insert a CONTinuity test. This usually goes near the beginning of the program before the components, but after tests for switches and pots. To enter an opens/shorts test, enter a test type of CONT (for continuity) and use the from and to test point columns to indicate the range of points to test for continuity.
Page 7-1
Press [F5], then [F5] again to automatically learn the connection map for these points. 6. To test for the presence and orientation of ICs, enter an ICs test, specify the power supply test points (e.g., +5V and Gnd), then press [F5], then [F5] to automatically learn the connection map for IC protection diodes. This usually goes at the end of program. 7. Test the program. It is a good idea to run batch of UUTs through the system while collecting SPC data. Then run an X-bar/Sigma report to check that the tests are comfortably within the test limit margins. 8. For functional testing using the Model TR-6, you will then power up the UUT and manually generate a sequence of steps providing stimulus and measurement on the UUT to ensure that it is working properly. Finally, you can program special features into the spec file. For example, you can do digital input and output. You may also enter operator adjustments and displays into the program. The available test step types provide the necessary flexibility in writing spec files to perform almost any task. Once an assembly is programmed (or learned), the System provides the capability of saving this information (called test spec data) on a disk for future use. Virtually all of the information established with the [F2] Learn an assembly selection from the System menu is saved with the spec data. The System also provides a number of additional features to help you obtain better operator instructions and more readable test results. These features are all available from the Assembly Learn menu shown in Figure 7-1.
Page 7-2
Assembly Learn Menu
Figure 7-1 - Assembly L earn Menu Note The System provides the capability to use a password to prevent unauthorized modification of spec files. If password protection is enabled (via the Configure/Install System menu), you are required to enter it prior to having access to the Assembly Learn menu. There are several selections available from the Assembly Learn menu:
[F1]
from the Assembly Learn menu allows you to load a spec file from the disk into memory. Once you have pressed [F1], you can select the spec file from a list using the File Selection List. The directory location for these files is specified from the main menu under [F4][F6]. from the Assembly Learn menu allows you to alter or type in the specification data. This can be used to enter new data or modify existing test data. The [F2] key invokes the Enter/Edit Spec Data screen shown in Figure 7-3. This screen lists each of the connections with its test point numbers and pin names. In addition, it includes the measured value of each component when
[F2]
Page 7-3
the assembly was learned (or the last time it was tested) and the upper and lower test limit in ohms, volts, henrys or farads.
[F3]
from the Assembly Learn menu allows you to enter information about how you have connected the unit being tested to the System. Once you have selected [F3], you see the Assign Connection Information screen shown in Figure 7-2. from the Assembly Learn menu allows you to enter operator instructions. Operator instructions are a way of giving information to the operator previous to each test. The notes are presented to the operator and then a key is pressed to continue with the test. from the Assembly Learn menu allows you to type in a descriptive name for the assembly. Any alphanumeric text up to 32 characters in length is allowed. The assembly name shows up in the File Select menu and on any reports that are generated. in the Assembly Learn menu allows you to specify special capabilities such as autoprogramming the UUT, generating spec data from CAD data files, reading and writing spec data information with ASCII files and assigning measurement characteristics. When you have selected [F6], you are presented with the Special Features screen shown in Figure 7-16. from the Assembly Learn menu allows you to print out a report of the test specification data for an assembly. Once you have selected report output, you are presented with a list of possible destinations as shown in Figure 7-21. The spec data report includes the test point numbers, test types, pin names, test title, ranges, and upper and lower test limit for each test step in the spec file. The spec data report also includes the assembly ID (the optional assembly name assigned when the assembly is learned), the date and identity of the tester.
[F4]
[F5]
[F6]
[F7]
[F8]
from the Assembly Learn menu allows you to print a wire-run report for the UUT. This report is used to list the test point numbers and the associated pin names that you have assigned. The report lists the test point numbers and pin names in order by test point numbers on the left of the report and lists the test point numbers and pin names in alphabetical order by pin names on the right side of the report. Once you have selected report output, you are presented with a list of possible destinations as shown in Figure 7-21. from the Assembly Learn menu allows you to save the information about the assembly that you have learned onto a hard disk or floppy disk.
[F9]
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After selection of [F9], you are prompted to enter a file name. Enter a file name with up to eleven characters that do not include spaces or special characters such as colons or periods. Your DOS manual describes valid file names for your version of DOS. The System saves the file in the path defined with the Configure/Install System menu. If you are modifying an existing file, the System displays the previous file name. If you press [ENTER], the System will choose the same name as previously used, although it will ask you to press Y to confirm that you will be overwriting an existing file. The file is written in binary. Consequently, you cannot look at it with normal editors (you can look at it with some editors, but it probably wont make any sense to you). The advantage of this storage method is that the file is compact and fast to load and execute. The file contains a list of the test steps, the test limits, the assembly name, operator comments, the pin names, the measurement characteristics, and most other information assigned when using the [F2] Learn an assembly selection of the System menu.
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Assigning Connection Information Screen

After you have wired your test fixture, you will probably want to assign meaningful pin names to the test points so that the reports from the System will be more useful. The test system allows you to enter a pin name of up to eight characters for each test point. To do so, use the Assign Connection Information screen (see Figure 7-2). One good way to use the Assign Connection Information screen is to first probe all of the fixture points to name them, then activate the named test points using the Edit/Enter Continuity Test Data Screen (see Figure 7-9).
Figure 7-2 - Assign Connection Information Screen The Assign Connection Information screen works much like a spreadsheet. Use the page up and down and the arrow keys or the Goto Pin key, [F9], to move the brackets to the row for adding a pin name. After you have entered a name, the System automatically moves to the next position to make entry of a list faster. You can use the [Del] key to erase the entire pin name that is presently bracketed.
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Probing You can use probing to locate a test point number. With this feature you do not need to know the specifics of how the UUT is connected to your test System. Probing is available for MDA solid state test points. You may either use the probe that comes with CheckSum fixturing or your own probe. The probe needs to be connected to the PC chassis to be effective since the System is searching for a grounded input (a value less than about 100 ohms). The System can be configured to probe all points or just active ports. In addition the probe can be calibrated for increased accuracy and the probe threshold changed. This setup is done with the Configure Accessories menu available from the Configure/Install System menu.
[F1]
sets the System into probing mode. When in probing mode, each time the grounded probe touches a test point, the test point moves to the middle of the screen. Probing stays active until [F1] is pressed again to toggle it off. If more than one point is detected when the probe is touching the UUT or fixture, the Systems lists the additional probed points in the upper right hand portion of the Assign Connection Information screen. In order to see all of the points, you may need to hold the probe to the UUT for a few moments to allow the System to make an entire scan to find all of the additional points.
[F2]
enables automatic incrementing of pin names during the probe process. The System uses the pin name in the center of the screen as the base. When the next point is probed, it is assigned the same name, but incremented by one. If the last digit of the pin name is alphabetic, it becomes the next alphabetic character, moving from lower case to upper case. Note that no alphabetic characters are skipped, so it may to necessary to probe a point twice to skip over unused pin names (such as an i in some cases). If the last characters of the pin name are numeric, they are incremented to the next numeric character. Pressing [F2] a second time disables auto-increment. Exiting
When you have completed entry of connection information, press [ESC] to move back to the Assembly Learn menu.
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Enter/Edit Spec Data Screen

The Enter/Edit Spec Data screen (shown in Figure 7-3) allows you to enter or edit the test steps that are performed when testing the UUT. Each line describes one test step.
Figure 7-3 - Enter/Edit Spec Data Screen
Test Step Descriptions Each line in the Enter/Edit Spec Data screen shows a test step type (e.g., CAP for capacitance or RES for resistance) and a test title that describes the component being tested. The test title can be used for the component designator (e.g., R201, C3402) and can contain other information (e.g., the part number). Any text up to twelve characters in length can be entered. The other fields are dependent upon the test type. For most tests, the high and low limits are used to describe the analog limits for the test (e.g., 10 and 12 ohms for resistance tests). The to and from test points describe the test points that are accessed for the measurement. The range shows the measurement range (e.g., 0 for autorange, 1 for 190 ohm range,...). The last column can be toggled (with [F2]) to show either the last measured value (Meas) or the nominal value (Nom) for the component. If in Meas mode, the last column shows the measurement that was taken for the test step during the last test execution or when [F3] was pressed. Refer to the Test Type Descriptions section of this Instruction Manual (Chapter 11) for the specifics of each test type and its corresponding information.
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Using the Enter/Edit Spec Data Screen You may individually alter each test step field by moving the brackets to the desired area, then typing the new value that you would like. The System works much like a spreadsheet. You can move from page to page with the [PgUp] and [PgDn] keys and from field to field with the four arrow keys. [Home] and [End] move you to the beginning or end of the spec file. To use the [ALT] and [SHIFT] key sequences, first press the [ALT] or [SHIFT] key, then the other key in the sequence. Most numeric entries can be entered in scientific notation if desired. For example, 10 M can be entered as 10000000 or 10000e3 or 10e6 or 1e7. Alternatively, you may enter most numbers with a p, n, u, m, K or M for pico, nano, micro, milli, kilo and mega. When you enter a pin name, the System searches the pin names that have been assigned. When it finds a match, the System inserts the port number and pin name that have been found. If a match is not found, the System gives an error message and returns the original pin name. To be found, the entered pin name must exactly match the assigned pin name, including upper and lower case. The following special keys are available when using the Enter/Edit Spec Data screen:
[Ins]
allows you to insert a step in the spec data. [Ins] automatically generates a new connection line just below the line that contains the brackets. If the brackets surround a test point number, that test point number is automatically incremented for the new connection. inserts a line above the selected line. This can be used to insert before the first line. removes the test step on the line with the brackets from the spec data. The deleted line is saved in the buffer and can be pasted back into the spec data using [Alt][p]. removes all of the spec data from memory and allows you to begin entry of new spec data. copies the selected line of spec data (including guarding, external sense, and gain/zero-offset information) into an internal buffer for use with [Alt][p] or [Alt][i]. pastes information in the test step buffer (saved with [Alt][c] or [Del]) to the selected line of spec data (including guarding, external sense, and gain/zero-offset information). This overwrites the test step data present on the selected line with that in the buffer.
[Alt][a] [Del]
[Alt][d] [Alt][c]
[Alt][p]
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[Alt][i]
inserts a new line in the spec data file (just below the selected line) and pastes information in the test step buffer (saved with [Alt][c] or [Del]) to the selected line of spec data (including guarding, external sense, and gain/zero-offset information). marks the selected line of spec data as the beginning of a block that can be used with [Alt][e] and [Alt][w]. marks the selected line of spec data as the end of a block that can be used with [Alt][b] and [Alt][w]. sorts the spec data by test title. writes the block of spec data lines marked with [Alt][b] and [Alt][e] beginning at the line past the cursor. Any data after the line is moved down to make room for the write operation. allows you to enter and search for a component name (e.g., R101). The System searches through the spec data (ignoring case) to find a matching test title. If found, the System selects the test step. Is used to assign the initial test limits and test range for the test step. It uses the nominal value as the basis for determining the test range and test limits. A test range is chosen that is likely to work based on the nominal and test type. The test limits are assigned according to the values set with the [Shift][F5] selection. Before [F1] modifies the test step, it saves it into the buffer so that it can be restored with the [Alt][P] command. Is used to assign the initial test limits for the test step. It uses the measured value as the basis for determining the test limits. The test limits are assigned according to the values set with the [Shift][F5] selection. Before [F1] modifies the test step, it saves it into the buffer so that it can be restored with the [Alt][P] command. Is used to assign the initial test limits for the test step. It uses the nominal value as the basis for determining the test limits. The test limits are assigned according to the values set with the [Shift][F5] selection. Before [F1] modifies the test step, it saves it into the buffer so that it can be restored with the [Alt][P] command. is used to toggle the last column of the screen between the nominal value and the measured value. makes a measurement on the bracketed line. The outcome of the measurement is shown in the Measure column. copies the measured value to the nominal value.
[Alt][b] [Alt][e] [Alt][s] [Alt][w]
[Alt][t]
[F1]
[ALT][F1]
[Shift][F1]
[F2] [F3] [Alt][F3]
Page 7-10
[F4]
reverses the polarity of the measurement on the bracketed line. You can then Press [F3] to remeasure with the new polarity. This allows you to easily check a measurement for sensitivity to polarity reversal. is used to learn a step. When you learn a typical step (e.g., RES, CAP, INDUC), the System makes measurements with applicable ranges, polarities and delays, then determines and assigns the measurement type and range that it feels would be most appropriate. Based on the nominal value (and the values assigned with the [Shift][F5] selection of this screen), it assigns upper and lower test limits. In special cases, such as CONT and ICs, the System presents subscreens such as the Edit/Enter Continuity Test Data screen shown in Figure 7-9. If the bracketed test type is display-related or GPIB, the System presents the Assign Operator Messages screen shown in Figure 7-13.
[F5]
[Alt][F5]
is used to learn a step with guarding. This step performs all of the actions described for [F5], but also automatically evaluates guards to obtain better measurements. The guarding parameters that are used to evaluate guard points are set up with use of the [Shift][F5] screen available from this menu. is used to specify how tolerance assignment, range selection, and autoguarding are determined. These selections are used with the [F1], [Alt][F1], [Shift][F1], [F5] and [Alt][F5] selections of this screen, [Alt][F1] and [Alt][F4] of the Dynamic Point Analysis screen, and [F7] and [F8] of the Global Spec File Operations screen. When [Shift][F5] is selected, the Autolearn Configuration menu, shown in Figure 7-4, is displayed. is used to analyze the measurement that is presently bracketed. The resultant display shows the outcome of measurements of each type taken on each range. As a result, you can determine the optimum range and function for each measurement, assign guard points, or determine why measurements are not reliable or accurate for particular components. When a DIODE, VOLT, JMPD, or JMPV is selected, the System makes a reading measurement on each range, then displays the readings, plus the voltage vs time plots for each range as shown in the Dynamic Point Analysis screen (Figure 7-8). When a CAP, RES, or INDUC is selected, the System makes readings on each function and range to show the outcome of each method. It also allows you to assign guard points, external sensing, delay times, zero offsets, and gain factors. All of these options are available with the Measurement Analysis display shown in Figure 7-6.
[Shift][F5]
[F6]
Page 7-11
If the bracketed test type is DMM or UCT, the System presents the DMM or UCT Interactive Control screen shown in Figure 7-11 or Figure 7-12.
[F7]
is used to obtain detailed information about the selected analog test type. When an analog test type (such as RES and CAP) is selected, this selection will display details of the measurement such as test method, range, guard points, and so on. It provides an quick way to see what is assigned without going into the lower level menus. is used to obtain perform multi-step (global) operations on the test program such as sorting, learning offsets, programming fixture-check, auto-learn, and guarded auto-learn. When [F8] is selected, the System presents the Global Spec File Operations menu shown in Figure 7-14. is used to mark the selected test step to be skipped during program execution. When a test step is selected to be skipped, a right-facing triangular mark is displayed in the left-most column of the display. Pressing [F9] when a test step is marked to be skipped unselects (toggles) it. performs the same action as [F9], but does so for the entire page displayed. performs the same action as [F9], but does so for the entire spec file. toggles the System between search mode and overwrite mode for pin names. The default, search mode, works as described above. If you toggle to overwrite mode, the System will assign the pin name that you type in to the port number that has been entered. returns you to the Assembly Learn menu. runs the block of test steps previously marked by [Alt][b] and [Alt][e].
[F8]
[F9]
[Alt][F9] [Shft][F9] [Alt][n]
[ESC] [Alt][r]
Page 7-12
Autolearn/Autoguard Use and Configuration

When using RESistance, CAPacitance, INDUCtance, DIODE and ZENER test types, the System can automatically help determine the best range, guarding, polarity, and assign upper and lower test limits for you. The System allows you to specify how these factors are automatically assigned. This is done via the Autolearn Configuration menu shown in Figure 7-4. This menu is available from the [Shift][F5] selection of the Enter/Edit Spec Data screen.
Figure 7-4 - Autolearn Configuration
[F1]
is used to specify whether the System will change the test limits to make the test pass. During the autolearn of a test step, the System tries to make the reading match the nominal value that you have entered. If the system cannot achieve a comfortably passing result, and this selection is specified as a yes, the System will then change the test limits to make the step pass. It uses the tolerance methods specified in [F4]-[F7] below to make the limits adjustment based on the final measured value, rather than the nominal value. The System default for this parameter is no. is used to specify how autoguarding is performed. When you ask the System to perform autoguarding, it first attempts to achieve a good reading without guarding. If this cannot be achieved, it then tries to find good guard points. It can automatically assign up to two guard points in an attempt to make a good reading. There are four levels of autoguarding, the factory default being Extensive:
[F2]
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Off QuickGuard
disables autoguarding so that it cannot be used. allows specification of a few guard points that are likely to be effective guards, such as ground and power supplies on the UUT. When QuickGuard (or a higher level of guarding) is specified, when the first guard assignment is necessary, the system displays the Select QuickGuard Points screen shown in Figure 7-5. This screen can also be obtained with the [F3] selection of the Autolearn Configuration menu. specifies that the system first attempt to find suitable guarding with the QuickGuard points, then if not successful, try points that are one component away from the component that is being tested. These points are determined by looking at the other test steps in the test program that is presently entered. specifies that the system first attempt to find suitable guarding with the QuickGuard points, then if not successful, try points that are one component away, then if still not successful, look at all the test points used for the UUT. While this is very thorough, it is slower than the other methods. If you have previously learned a CONTinuity map for the UUT, the System will use it to speed up the guarding process. It does this by only using the first point on each network as a potential guard point.
Component-Away
Extensive
[F3]
is used to call up the Select QuickGuard Points menu shown in Figure 7-5. This menu is used to help speed autoguarding and automatically appears when it is needed. are used to specify how autolearn and tolerance assignments are made for the various test types. Each menu has similar available functions:
[F4]-[F7]
Tolerance selection in percentage specifies the tolerance, in percent, from the nominal value that will be used to assign the low and high test limits. For example, if the value entered is 10%, and the measured value is 100 ohms, the System automatically assigns values of 90 and 110 ohms as the low and high limits. These percentages can typically be assigned as different values at different nominal values. This feature helps assign tolerances that will be effective, yet not lead to a high rate of false failures.
Page 7-14
Maximum Scale Factor Adjustment specifies the maximum scale factor adjustment that can be made to a reading in an attempt to match the nominal value. This number is assigned as a percentage. If the nominal value cannot be achieved with the scale factor, no scale factor is applied. In most cases, the System will not accept values above 30% for this parameter. If this value is zero (the default), the System will not adjust the scale factor. Before attempting to use the scale factor, the system first attempts to correct the reading with the offset adjustment (see below). Maximum Offset Adjustment specifies the maximum offset adjustment that can be made to a reading in an attempt to match the nominal value. This number is assigned in the units of the reading (e.g., ohms for resistance readings, pF for capacitance readings). If the nominal value cannot be achieved with the offset adjustment, no offset is applied. Reset to Factory Defaults sets the parameters back to the initial value when the system was shipped from CheckSum. These values are effective for most testing installations. Diode and Zener Diode tolerances are specified as a single plus and minus tolerance in volts. Diode testing setup also allows you to specify the current that is used when self-learning diodes. It can be toggled between 1 and 10mA. 10mA is not available on TR-4 MDA Systems.
[ESC]
from the Autolearn Configuration menu returns you to the Edit/Enter Spec Data screen.
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QuickGuard Configuration
The Select QuickGuard Points menu, shown in Figure 7-5, allows you to enter data to optimize and speed up automatic guarding with the System. This menu can be obtained with [F2] from the Autolearn Configuration screen, or it automatically is displayed when necessary during an autoguard operation. QuickGuards are test points that are most likely to be effective when guarding. For example, power supplies and grounds are effective guards for most measurements. By specifying these points so that the System can try them first, you can greatly speed up the guarding process, and in some cases obtain better guarding. Figure 7-5 - Select QuickGuard Points Screen
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In this screen, a list of all the test points are shown. By pressing [F1] or enter, you can select the selected point.
[F2]
will automatically select test points based on the testpoint names. The System looks through the names that you have assigned, and selects points that have names that are likely to be power supply and ground points. allows you to reset all of the QuickGuard points presently selected. allow you to specify the last test point to consider when autoguarding in the Extensive mode. By entering the last test point used on the UUT being programmed, you can drastically speed up System operation. If you have named your test points, the System will look for the last named test point and use it as the initial value. Otherwise it uses the last test point in your System configuration. Exits this screen and continues with the autoguarding process.
[F3] [F4]
[ESC]
The Select QuickGuard Points screen shows up when necessary for autoguarding. Once you have assigned any QuickGuard points, or changed the last test point (by [F4] or self-assignment from names), the screen will not show up again until a new test program is loaded, or you explicitly call it up with [F3] in the Autolearn Configuration screen.
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Measurement Analysis
Under normal circumstances, the [F5] Learn Step selection of the Enter/Edit Spec Data screen can be used to find a workable measurement technique for each component. However, if you run into problem points, or wish to use guarding, the Measurement Analysis display, shown in Figure 7-6, can be used to find the optimal measurement technique to use on a test step. The Measurement Analysis display is obtained by pressing [F6] Step Analysis from the Enter/Edit Spec Data screen while a RES, CAP, INDUC test type (or their JMP equivalents) is selected. This display provides you with as much information as possible about the measurement so that you can make an intelligent choice quickly and easily. When you enter the display, the System takes a measurement using each of the fundamental ranges and measurement techniques. Upon entry, the System brackets the measurement type as specified in the spec data. You can move around the screen with the arrow keys, pressing [F3] to take a few measurements with each method to get a feeling for the repeatability of the various techniques. Once youve found the best technique for the particular measurement (and moved to it on the screen), first press [F9] to generate default high and low test limits based on the measurement, then press [ESC] to exit. The System updates the test step accordingly so that when you execute the spec data for testing, it will use the same technique and test limits. The action of each key is described on the following pages. You can refer to the Theory of Operation for more detail about the actual hardware measurement interactions associated with the various selections.
[F1]
Bias Test Point - Specifies a third test point that is active during the measurement sourcing a voltage. This voltage can be used to bias a 3-terminal device on the UUT to turn it off and on. For example, if you are testing a FET, you can make a resistance measurement between the source and drain, while applying a bias voltage to the gate. If you make two measurements, one biased on and the other off, you have good measurement confidence that that FET is properly installed and operational. If the bias test point is active, an [F2] option appears that allows you to specify the bias voltage between -10V and + 10V. To disable the bias test point, enter a test point number of 0. When testing transistors, you normally need to install a current-limiting resistor in the fixture between the bias test point and the transistor base. Different values may be required depending on the UUT circuitry, but typically values are from 1K to 100Kohms. When using this third terminal during a measurement, only up to four guard points can be active at one time. Bias Test Point is only operational on Test Systems that have TR-4-1D MPX modules and in conjunction with RES test steps. Bias Voltage - Specifies the voltage (between -10 and +10 volts) when the bias test point (F1) is not zero. See the description of [F1] for more details.
[F2]
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Figure 7-6 - Measurement Analysis Display
[F3]
Measure - Makes a measurement and updates the display for the bracketed measurement. Other selections (offset, model, external sense, guarding,...) are used to make the reading.
[SHIFT]-[F3] Measure All - Same as [F3], but remeasures and refreshes all the values on the screen. [F4] [F5] Reverse Pins - Reverses the (+) and (-) measurement test point pins. Nominal Fit - Activates selections that can be used to help achieve a measurement value (nominal) that is similar to the actual component value. This can be achieved by choosing the best measurement technique, guarding, and the use of scale and offset factors to alter the measurement value. If a scale or offset value has been entered, an asterisk (*) appears next to the [F5] Nominal Fit text on the screen. See the following section, Nominal Fit, (Figure 7-7) for information about how to use this feature of the System. Dynamic Analysis - Displays a time vs voltage plot across the test points for each range and output voltage level. This display is described in the Dynamic Point Analysis section of this chapter and shown in Figure 7-8.
[F6]
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[F7]
Measurement Statistics - Takes a series of readings using the bracketed measurement technique and determines the average measured value (X-bar), the average measurement time in mSec, and the 3-Sigma limit for the readings. The total number of samples taken for the calculations depends on the measurement technique. The 3-Sigma limit is an indication of the repeatability of the measurement. It indicates how much that you can expect the measurements to vary from measurement to measurement for the component on the assembly presently connected. This information can be helpful to determine the most consistent reading technique and to help assign tolerances. Note that the test tolerances shouldnt be tighter than the larger of the 3-Sigma limit, the absolute accuracy of the component being measured, or the accuracy of the System.
[F8]
Delay - This selection allows you to enter a delay time in mSec to be used in conjunction with the measurement. If a value is specified, the delay time is used after the measurement source is applied, but before the measurement is made. This can be used to allow capacitors to charge prior to making the measurement. If the value specified is negative, the points are discharged for the specified time before making the measurement. This can be used to allow time for capacitors in parallel with the measurement point to discharge.
[F9]
Assign Limits - Causes the System to assign test limits based on the measurement technique that is bracketed. The high and low test limits are generated according to the settings of the Assign Test Tolerances for Learn menu selected with [Shift][F1] from the Enter/Edit Spec Data screen. Exit w/o Update - Allows you to return to the Enter/Edit Spec Data screen without changing the spec data. The test step data is restored to match the state when this screen was entered.
[F10]
[ESC] Update & Exit - The System captures all of the present setup information and incorporates it into the spec file presently in memory. The measurement method currently bracketed is selected. External Sense: You can move the brackets to the external sense point entry areas just below the test points used for the measurement. If you enter these test points (by name or number) on the sense line, the System uses these as external voltage sense points for the component being tested. You can use one or both points as external sense points. This can be used to eliminate the effects of the series resistance between the sense points on the MPX Modules and the component being tested.
Page 7-20
[INS]/[DEL] Guard: You can add or delete guard points with the [INS]ert and [DEL]ete keys. The guard points can be used to minimize the effects of parallel paths on measurements. See the Theory of Operation section of this manual for more details about guarding. Below each guard point is an entry area for specification of an external voltage sense point for the guard point. Use of this sense point can provide improved measurement accuracy on guarded measurements. Specifying a first guard channel value of 1621, 1622, 1623 or 1624 specifies one of four guard-all type measurements. These measurements are used to make resistance, capacitance or inductance and their JMP equivalent measurements between one point and a group of points. This is useful, e.g., in measuring for a short to a point to any of a group of points. Bias voltages or currents identified under F1 and F2 and TR6 sourcing via DCV, SINE, SQRV and EXTIO are not active when guard-all measurements are used. Guard sensing using the channel 1 guard sense and external sensing of the measurement points are still available. For measuring from one to many others connected to the source low side, assign the first guard to be number 1621. Then, list the points you want excluded as the other guard to guard-sense points. When you have programmed the step this way, the System measures to the To (+) point to the From (-) point that is connected to all other points except those listed as guard points, external sense points, and the To (-) point. If the first guard channel is 1622 then all test points in the ranges between the guard channel 2 and 3 points and guard channel 4 and 5 points are connected to the high test point. Guard channel 6 is not active. For example, specifying test point 15 as guard 2, test point 33 as guard 3, and specifying no other guards causes points 15 through 33 to be connected to the high point. If the first guard channel is 1623 then all other test points other than the guard, guard sense, external sense points and low test point are connected to the high test point. If the first guard channel is 1624 then all other test points other than the guard, guard sense, external sense points and low and high test points are connected to the guard channel appropriate for the measurement mode. E.g. for current mode measurements, this behaves the same as guard channel 1623 measurements.
[ALT C]
Repeats the measurement of F3 above until another key is pressed.
Page 7-21
Nominal Fit
Nominal Fit is a series of selections that can be used to help achieve a measurement value (nominal) that is similar to the actual component value. This can be achieved by choosing the best measurement technique, guarding, polarity, and the use of scale and offset factors to alter the measurement value. The nominal fit functions are called up by pressing [F5] in the Measurement Analysis display, and removed by pressing [F5] once again. If a scale or offset value has been entered, an asterisk (*) appears next to the [F5] Nominal Fit text on the screen. The nominal fit selections are shown in Figure 7-7. Figure 7-7 - Nominal Fit Display
When scale and offset values are used, the measurement is modified according to the following formula before the pass/fail is generated and the result displayed: Final Value = ( Measured Value Z ero Offset ) Gain Factor When in Nominal Fit mode, the System displays a number of function key selections that are accessed with the [ALT] key (press [ALT] then the function key). The [ALT][FunctionKey] values for nominal fit are also available when nominal fit is not selected. For example, at any time when you are in the Measurement Analysis display you can press [ALT][F7] to reset the zero and gain factors.
Page 7-22
Note When you have changed the gain or zero values, the changes are not reflected in the displayed measurements until new readings are taken.
The [ALT] functions available for Nominal Fit are:
[ALT][F1]
Causes the System to try applicable methods for each measurement to find the technique and polarity that give the closest reading to the nominal value. When the System has completed the nominal fit, it brackets the measurement that is closest to the nominal value and selects the other options that were used to make the measurement. As such, you can immediately press [ESC] to exit and the System will capture the correct parameters for the test.
[ALT][F2]
Allows you to enter a zero-offset value. This value is subtracted from the measurement prior to display of the result. The zero offset can be used to compensate the measurement for resistance, capacitance or inductance in the System wiring and test fixture. Allows you to enter a gain factor for the reading. After taking a measurement, the system subtracts the zero-offset value, then multiplies the result by the gain factor before generating a pass/fail and displaying the result. Causes the System to try applicable methods for each measurement to find the measurement technique and polarity that give the closest reading to the nominal value. This selection is like [Alt][F1], except that it also automatically evaluates guard points to help obtain the best reading. When the System has completed the guarded fit, it brackets the measurement that is closest to the nominal value and selects the other options that were used to make the measurement. As such, you can immediately press [ESC] to exit and the System will capture the correct parameters for the test.
[ALT][F3]
[ALT][F4]
[ALT][F5]
Causes the System to determine a zero-offset value that will make the measured value of the bracketed measurement equal to the nominal value entered with [ALT][F1]. If a gain factor has been entered, the System uses it when making the calculation for the zero-offset value.
[ALT][F6]
Causes the System to determine a gain factor value that will make the measured value of the bracketed measurement equal to the nominal
Page 7-23
value entered with [ALT][F1]. If a zero-offset value has been entered, the System uses it when making the calculation for the gain factor.
[ALT][F7] [ALT][F8]
Resets the zero and scale factors back to the defaults of zero offset = 0 and gain = 1. Causes the System to make a measurement of the test points presently connected, then use the resultant value as the zero offset. When making inductance and resistance measurements, you can first short the two points at the fixture, then press [ALT][F8] to determine the residual inductance or resistance in the System wiring and fixturing. When measuring capacitance, first remove the UUT from the fixture to measure the System and fixture residual capacitance. Toggles between no offset, positive offset, and negative offset. This selection applies to 100 Hz and 1 KHz capacitance readings, and is used when the circuit being measured has diode junctions or devices preventing the sourced sine wave from going fully positive and negative. Overrides the Systems automatic selection of measurement calculation technique for AC capacitance measurements. If the System would automatically select a series RC model, the System switches to the parallel RC model and vice versa.
[ALT][F9]
[ALT][F10]
Page 7-24
Dynamic Point Analysis

The Dynamic Point Analysis screen allows you to view the electrical characteristics of measurements between the two test points selected in the to-from columns of the Enter/Edit Spec Data or Measurement Analysis screen when [F6] is selected. Figure 7-8 - Dynamic Point Analysis Screen
The Dynamic Point Analysis screen shows information about measurements taken on each measurement range. This information includes the following: 1. The resistance, capacitance or diode-measured values for each output range and voltage when using the DC-I measurement method. 2. A voltage vs time graph when a constant current is applied to the test point. 3. A voltage vs time graph of the sine wave stimulus sourced by the System when an AC measurement is executed. This screen helps determine the optimum range to use and allows you to see if the measurement point has unique characteristics. Current Mode Displays
Page 7-25
Under normal measurements of resistance and capacitance, each graph will be a straight line. If the graph is curved, that is an indication of a complex point with capacitance and resistance combined. If this is the case, you may want to use an AC measurement rather than a DC measurement for more accurate results. If the graph shows a knee, the point has some diode-type characteristics. This can have the effect of degrading the performance of resistance or capacitance measurements. Each plot has two lines, one for the 200 mV output range, and the other for the 2 V output range. The reading that would be obtained by each output voltage is shown below the graph. If you have a color monitor, the System plots the graph in the same color as the writing as appropriate for the output voltage range. The vertical scale is 2 V for the 2 V output range yellow traces and 200mV for the 200mV output range green traces. The horizontal scale is 100 mSec. When measuring capacitance when using the DC-I method, the System calculates capacitance values based on the rise time of the graph. The low-voltage ranges are available for special testing needs. These ranges use 200 mV full range and are not as accurate as the 2 V ranges. The ranges but can be used in testing cases where higher voltages cause diode turn-on or other undesired side effects on the UUT. The exception is the 1 mA / 200 mV range. This range is the most accurate means available to measure resistance values less than about 160 ohms. If you are having a problem with a measurement, try both measurement polarities. The problem also can be caused by the test points being charged prior to the measurement. If this is the case, you might use a DISCHarge test step before the measurement. In some cases, due to the UUTs surrounding circuitry, it may not be practical to make a measurement of a particular component. Viewing the Dynamic Point Analysis screen will often help identify measurement problems and solutions. For capacitance measurements, choose the range where the graph shows a line that is nearest to a 45-degree angle.
Voltage Mode Displays The two graphs in the lower righthand corner show the AC-stimulus signal measured across the UUT when using the AC-voltage measurement. One is shown using the 2 V output range and the other on the 200mV output range. Under normal circumstances these plots should be sine waves. If they are distorted, it is an indication that the circuitry surrounding the connected component is causing the circuit to be polarity-sensitive. This can occur with diodes in surrounding circuitry, particularly when using the 2 V output range. If the wave is distorted, the measurement is likely to be in error. You can either use a lower output voltage, offset the output, or use a Current Mode measurement on the component in question.
Page 7-26
Note If you are encountering problems with a measurement, see the Measurement Guidelines section of this manual for helpful tips.
Page 7-27
Edit/Enter Continuity Test Data

The Test System allows you to test the UUT for opens and shorts with use of a CONTinuity test step. Although opens and shorts data can be manually entered, typically this data is self-learned by the System from a known-good UUT, then saved with the spec data on disk for future use. The Edit/Enter Continuity Test Data screen can also be used to activate or inactivate MDA test points. If a point is inactive, continuity connections to it are not self-learned or tested. Inactivating contiguous blocks of unused ports can cause the System to operate more quickly. Using a Range value of 1 with a continuity measurement causes continuity to run slightly slower but guarantees that any voltage sources on inactivated ports, such as batteries, will not effect the continuity measurement. Two filled triangles left of the left column pin number show a pin to be active. In addition to specifying a connection list between points, you can also specify no-care connections between point pairs. [F8] in the Enter/Edit Continuity Test Data menu toggles the screen between continuity and no-care connection lists. A no-care connection ignores an open or short between two specific points. Other connections involving the points are still tested for correctness. This contrasts to making a point inactive, which removes testing of all connections involving the point. The use of a no-care connection allows the continuity test to disregard a point to point connection, such as a jumper connection, that may vary from one UUT to another and which is not a concern. Using self-learn to learn a single board then adding no-cares to disregard accepted variations to other boards can be a quick way of specifying a general continuity test for a run of boards. Self-learn logs as connections readings between pin pairs that are below the Learn Threshold resistance. When executing a test program (or pressing [F3] in the Assign Continuity Information Screen), continuity is tested using the following method: 1. For each network, measurements are made from the first point (lowest numbered) to each successive node on the network. If any measurement is greater than the Opens Threshold resistance and the point pair is not marked as no-care, an open is reported. 2. The first point of each network (and each unconnected active point) is measured to all other test points collectively, one MPX at a time. If a Range of 1 is specified, then inactive points are excluded from the point collection and connections to the inactive points are not measured. If the measurement is less than a threshold, the System measures from the network to each test point. This threshold is at minimum one third of the measurement range, or twice the opens resistance threshold, if that is greater. If a measurement less than the Shorts Threshold resistance is found and the point pair is not marked as no-care, a short is reported between the measured points. The default threshold values for shorts, learned connections and opens are 8, 10, and 12 ohms, respectively. For most applications these levels never need modification and provide consistent and reliable results. For applications involving boards with trace or
Page 7-28
component resistances in this range, experienced users may improve results by adjusting thresholds. The allowed range of thresholds is from .5% to 25% of the measurement range. The measurement range is determined by the opens threshold. The lowest resistance range which will measure this largest threshold is used. Continuity uses the .2 Volt, at 200, 2K, 20K, or 200K ohm measurement ranges. The lower the range, the faster the continuity measurement. The active ports and continuity thresholds information is saved with spec data files for a UUT. Consequently, you can set the active ports and continuity test thresholds for a particular UUT, then save the spec data. When the spec data is subsequently retrieved from the disk, the active ports and thresholds are reset to the previous settings and remain so until the System is restarted or a new spec data file is loaded. A separate set of thresholds is used for each measurement range. The active ports information is also saved with the System configuration data. If you select [F8] from the System Configuration/Installation menu, the active ports information is saved. When the System is restarted in the future, it will reflect the active ports present when the configuration information is saved. By use of the "From" and "To" columns, the CONT test type allows you to specify the range of MDA test points that you are testing. For example, if you want to measure for shorts and opens for all test points in the range of 1 to 600, the "From" and "To" columns would contain 1 and 600 respectively. If you have CheckSum Model TR-6 relay test points installed, you can use the high and low test limits to specify the range of relay test points to use in the CONTinuity test. The test point number range for these test points is 1601-1950. If both TR-6 and MDA test points are specified, the continuity test measures within each test point range and also between both ranges. Since continuity checking with relay test points is somewhat slow and involves a number of mechanical relay closures, it should be avoided unless necessary. To disable TR-6 test point testing, specify high and low limits of 0. The CONT test is normally entered into the test program after tests that confirm jumper installation, switch settings and pot adjustments. This order prevents false continuity failures and allows you to provide proper messages to the operator to make these settings as appropriate for the UUT.
Page 7-29
Figure 7-9 - Edit/Enter Continuity Test Data Screen When a CONT test is selected while in the Enter/Edit Spec Data screen, you can press [F5] to obtain the Edit/Enter Continuity Test Data screen shown in Figure 7-9 above. With this screen you can display learned information, self-learn new information, edit the existing information, activate and inactivate ports for continuity tests, measure resistance between displayed pin pairs, convert displayed continuity failures into no-care connections, and execute the CONT test interactively. The System shows one test point number and pin name in the left column on each line of the display. In the right column another point number and pin name appears if any connection to the left column pin has been specified. The default connection on a highlighted line shows the next higher pin number connection, or if there is none higher, the next lower pin number. The left and right arrow keys permit stepping to lower and higher numbered connections on the highlighted line. If there is another higher numbered connection beyond the right column pin then a right arrow is displayed. Likewise, if there is a lower numbered connection then a left arrow is displayed.
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The following keys are available when using the Edit/Enter Continuity Test Data screen:
[F2]
Make a resistance measurement of the two test points listed in the middle of the screen and display the resistance. This uses the resistance range used by the continuity test (e.g. a 200 ohm range reading will vary from 0 to approximately 170) . If a higher value is measured, the System reports an Over-Range condition. Execute the continuity test using the spec data as presently loaded, and see if any errors occur. If any errors do occur, up to the first 10 are listed along the right side of the display. The elapsed time (in mSec) to execute the test is also displayed. Display Statistics. The system displays how many networks are in the continuity map, how many test point interconnections are in the map, and how many no-care connections have been specified. Self-learn the continuity map for the UUT. The System measures resistance from each active point to each higher numbered active point. If the reading is less than the Learn Threshold resistance, the System assigns the points as a connection in the continuity map. Networks are learned from the first point on the network to all other points on the network. Once a point is assigned to a network, it is ignored while learning other networks. Auto-No-Care creates no-care connections for the displayed continuity errors seen in the column to the right of the display. Up to 50 no-care connections can be specified. Activate Pin On/Off toggles the highlighted left column pin between active and inactive. Normal/No-Care toggles displayed connection list from normal continuity connections to no-care connections. A period following the left column pin number indicates that the pin on a normal continuity list has no-care connections or that the pin on a no-care list has normal connections. Goto Pin Number. This displays the segment of the connection list surrounding a specified pin number. Help shows a summary of the active softkeys for the Edit/Enter Continuity Test Data Display. Insert a connection or no-care into the continuity map. When [INS] is selected, you are asked to enter another test point number. After entering the number, the System inserts a connection from the selected test point (the one in the center of the screen) to the entered number. Since the System maintains the map in ascending order, it may display the point differently than entered, but it will be electrically equivalent.
[F3]
[F4]
[F5]
[F6]
[F7] [F8]
[F9] [F10] [INS]
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[DEL] [Alt][p] [Alt][a] [Alt][n] [Alt][d]
Delete a connection from the continuity map. When [DEL] is selected, the System removes the presently selected connection. Displayed Pins On/Off. Toggles the pin activity between on and off for the pin numbers listed in the display left column. All Pins On/Off. Toggles the pin activity between on and off for all pin numbers. Named Pins On. Turns on the pin activity for all pins with pin names. Delete All Connections. Removes all connections of the type on the current display. First select normal connections or no-care connections lists using F8, then use [Alt][d] to delete all connections selected. Display Continuity Thresholds. Allows you to view and specify the resistance thresholds for shorts, learned connections, and opens or to set all three to their factory default values.
[Alt][t]
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Edit/Enter IC Test Data

The Edit/Enter IC Test Data screen shown in Figure 7-10 is used to specify IC tests to perform on the UUT. ICs testing can be done with the MDA solid state test points 1-1600. To perform an ICs test, enter an ICS test type in the Enter/Edit Spec Data screen, then press [F5]. You are then presented with the Edit/Enter IC Test Data screen shown in Figure 7-10. The ICs test measures from the specified power supply rails (as indicated in the from and to test points) to each other requested pin in the UUT to check for diode junctions. Since ICs typically have protection diodes between their pins and power and ground to protect the IC from damage, this test can be used to help find backwards, incorrect, or missing ICs. The power supply test points used in the ICs test are specified as the From and To test points for the ICs test in the Enter/Edit Spec Data screen. Each ICs test can test between two power supply rails (e.g., VCC and GND or VSS and VDD) and all other pins. The polarity is important. The more negative supply (e.g., GND or -12V) should be entered as the from (-) pin and the more positive supply (e.g. +5V or +12V) should be entered as the to (+) pin. The system contains two data bases (specified with a range value of 1 or 2). Consequently, it can test between up to four power supply rails and all other pins. For the first ICs test in a spec file, use a range of 1. For the second ICs test in the spec file, use a range of 2. The IC test step range is shown on the lower right area of the screen. A preceding ICRng test step can be used to set upper and lower bounds on the range of pins to test to. This can be used to separate a single set of ICs data into separate logical sections to accommodate multi-PCB panels. The current pin range is shown on the lower right portion of the screen. Each test ensures that the measured diode junction voltage is between the lower and upper limits. If not, a failure occurs. The specific voltage reading of each test is not logged (just a pass or fail like with a CONTinuity test), however, at run time the system displays the measured voltage to the operator in the event of a failure. The Edit/Enter IC Test screen, shown in Figure 7-10, is used to program the individual IC tests.
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Figure 7-10 - Edit/Enter IC Test Data Each row shows a to test point number and pin name and each column shows a from (power supply rail) test point number and name. At the intersection of each pair is either a period (.) indicating that no test is to be made or a graphic ( ) indicating that a diode junction exists. For most UUTs, the Systems default value of .4V for the low limit and .9V for the high limit are good choices. The range specifies which of two sets of IC test data to test against. For a test specification with one ICs test, the range should always be 1. The second ICs test should always use a range of 2. The only exception to this is that a single range of data can be shared between multiple ICs tests if the data ranges are limited with the ICRng test type. You may use the [PgUp], [PgDn], [Home], [End], [F9] or arrow keys to move around within the display. The following keys can also be used to edit and create ICs test data:
[F1]
allows you to toggle the selected measurement between a junction test and a no-care point. Measurements are not taken at no-care points. A period (.) can also be entered to specify a no-care. A d can also be typed to enter a diode junction test.
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[F2]
is used to measure the test point pair that is presently selected. After taking the measurement, the System assigns the point as a diode or a no-care as determined by the measurement. The display is updated accordingly. allows you to run the entire IC test from this display; the error list is updated. is used to have the System self-learn the IC diode map for the UUT. Once you press [F6], the System measures from each specified power supply rail to each other active pin and assigns the result as a diode or a no-care. When self-learning, the system provides some safety margin in the learn thresholds to help prevent tests that are intermittent. In addition, the system performs special internal tests during the learn cycle to help differentiate diode junctions from other circuitry that might look like a diode, but is actually something different. allows you to select the "to" column pin to be displayed.
[F3] [F5]
[F9]
[DEL] is used to erase all of the IC Test data and set every point to a no-care. [ESC] is used to return to the Enter/Edit Spec Data screen.
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DMM Interactive Control

Selection of [F6], Step Analysis, from the Enter/Edit Spec Data menu while a DMM test type is highlighted allows you to interactively control the DMM. Interactive control is similar to observing the display and pressing the buttons on the front panel of a standard bench-top DMM. With use of this display you can perform debug on the test program or do UUT repair operations. You can also use it to automatically determine the range value without referring to the instruction manual for the details of the range code assignment. The DMM Interactive Control menu is shown in Figure 7-11.
Figure 7-11 - DMM Interactive Control Menu
[F1]
is used to assign the function for the DMM. You can choose between AC volts, DC volts, and Resistance. Note that resistance is for low value resistance measurements only, such as when measuring trace resistance. To make these low value measurements it uses high current (100mA) that cannot be routed through the MDA solid-state test points (1-1600) without damage. Unless a special requirement exists, resistance measurements should be taken with the MDA system module resistance measurement capabilities. is used to set the range of the measurement. The allowed ranges are different based on the function selected using [F1]. Autorange allows the System to change ranges during the measurement. It is helpful during
[F2]
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interactive use, but test programs will operate more quickly if a fixed range is chosen.
[F3]
is used to make a DMM measurement and display it at the top of the display. [Alt][F3] puts the DMM into continuous measurement mode. In this mode the System continues to take readings until the screen is exited or other selected DMM settings are changed. is used to set the delay and samples averaged. You can increase or decrease the standard measurement settling delay to improve speed or accuracy. You can also increase the number of samples averaged by a factor of 10 or 100. Doing so increases the stability of the readings (by filtering noise) at the expense of some test speed. Use of extra samples averaged is normally only necessary if the source being measured is noisy. allows you to set the filter on or off. The filter is used for DC and resistance measurements to filter out noise in the measurements. The filter significantly reduces measurement speed and should not be used unless necessary. For AC measurements you can set AC or DC coupling. AC coupling eliminates or reduces the DC component of the input signal by routing the input signal through a capacitor.
[F4]
[F5]
WARNING
With the scale or offset values, the operator could be mislead into believing less voltage is present at the input to the DMM than is actual present. For safety purposes you should not scale or offset hazardous voltages so that lower values are displayed.
[F6]
is used to specify a scale factor. The scale factor is multiplied by the DMM reading before display. It can be used in conjunction with external dividers to display the proper value. is used to specify an offset that is added to the DMM measurement prior to display to the operator or making test evaluations. It can be used to correct a reading for offsets in the measurement such as path resistance. allows you to exit back to the Enter/Edit Spec Data screen without altering the spec data to reflect the DMM settings that have been changed during use of this screen.
[F7]
[F8]
[ESC] exits back to the Enter/Edit Spec Data. A new range value is computed for the spec data that reflects the DMM settings at the time [ESC] is selected.
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UCT Interactive Control

Selection of [F6], Step Analysis, from the Enter/Edit Spec Data menu while a UCT test type is highlighted allows you to interactively control the UCT. Interactive control is similar to observing the display and pressing the buttons on the front panel of a standard bench-top counter/timer. With use of this display you can perform debug on the test program or do UUT repair operations. You can also use it to automatically determine the range value without referring to the instruction manual for the details of the range code assignment. The UCT Interactive Control menu is shown in Figure 7-12 below. Figure 7-12 - UCT Interactive Control Menu
[F1]
is used to assign the function for the UCT. You can choose between frequency, time, and counts. Frequency measures the frequency of the input signal by counting the number of trigger transitions during a selected period. Period measurements are made by counting an internal clock between trigger transitions of the input signal. On the lowest ranges, the internal clock is measured for several input periods for more accuracy. Counts are measured by opening the gate for an amount of time specified under [F8], and measuring the trigger transitions of the input signal. is used to set the range of the measurement. The allowed ranges are different based on the function selected using [F1]. Ranges for period are from 12.8 uS to 128 S. Frequency ranges are from 5 KHz to 10 MHz full-range. Counts are measured during gate times of 12.8 mS to to 12.8 Sec. The range affects the measurement resolution and speed. You should select the range with the minimum resolution necessary in order to optimize speed.
[F2]
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[F3]
is used to make a UCT measurement and display it at the top of the display. [Alt][F3] puts the UCT into continuous measurement mode. In this mode the System continues to take readings until the screen is exited or other selected UCT settings are changed. is used to set the input source(s). You can choose between channel 1, channel 2, channel 1 to 2, channel 2 to 1, or the DMM input (and its associated full range value). Normal measurements are taken with channel 1. Channel 2 is only available at the TR-6 rear panel connector. If you want to measure a higher voltage or need differential input, use the DMM input. The DMM input is usable to about 50 KHz. Period measurements can be measured as starting and ending on the same channel or on different channels (e.g. channel 1 to 2 or 2 to 1). is used to set the coupling and slope. AC coupling eliminates the DC component of the measurement and can help eliminate noise in the measurement, but reduces the signal amplitude for very low frequencies (less than about 30 Hz). The slope specifies the start and stop trigger slopes. Normally, + to + is used unless you want to measure pulse width. You can either use the first reading that the UCT takes, or take another reading, ignoring the first. Often better measurements can be taken by ignoring the first one, but for lengthy measurements, the first may be most expedient.
[F4]
[F5]
[Arrow Keys] are used to set the trigger levels. Pressing the up and down arrow keys change the trigger level number displayed. Pressing the left and right arrow keys selects between the trigger level for channel 1 and 2. [F6] is used to specify a scale factor. The scale factor is multiplied by the UCT reading before display or test evaluation. It can be used in conjunction with external dividers (e.g., Model TR-6-2 Fixture Interface) to display the proper value before division takes place. is used to specify an offset that is added to the UCT measurement prior to display to the operator or making test evaluations. displays a delay for Counts and Period measurements. This delay has one millisecond resolution and is used to control the maximum Counts measurement time or the time the Period measurement waits before timing out in looking for a measurement pulse. The minimum delay time is one millisecond. Entering a value of 0 for delay causes the delay to be set to its default value. For Counts measurements the delay default value is slightly more than the full count down time of the internal timer used to gate Counts measurements. For Period measurements the default delay equals to twice the product of the number of periods averaged and the range value. allows you to exit back to the Enter/Edit Spec Data screen without altering the spec data to reflect the UCT settings that have been changed during use of this screen.
[F7] [F8]
[F9]
[ESC] exits back to the Enter/Edit Spec Data. A new range value is computed for the spec data that reflects the UCT settings at the time [ESC] is selected.
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Assigning Operator Messages

Selection of [F5] from the Enter/Edit Spec Data screen while on the line with a DISPx test type allows you to enter display messages. These messages are displayed to the operator during test time. Figure 7-13 - Assign Operator Messages Screen
Up to 36 one-line messages can be assigned. They can be used more than once during a test program. Each one is referred to by a message number which is shown in the first column. The second and third columns describe the column and row number where the message begins in the message area of the Testing display (see Figure 6-4). Allowable rows are 1 through 8 and allowable columns are 1 through 78. Messages can contain a special code {MEAS}. When the System encounters the {MEAS}, it inserts the measured value for the last test step that generated a result. This feature is valuable for displaying a measured value as the operator makes an adjustment on the UUT. Messages are displayed with the DISP test type and erased with the DISPE test type. Alternatively, the DISPL test type can display short messages contained in its title field. The [Del] key deletes the entire display message that is selected. The [F2] key allows you to edit the selected display message. Once you have pressed [F2], the line moves to an edit area at the bottom of the screen. You can use the arrow keys to move back and forth in the line, shift-left-arrow and shift-right-arrow to move by
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word through the line, and [Home]/[End] to move to the beginning or end of the line. Pressing [Enter] or [ESC] moves the edited line back up into the normal display area.
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Global Spec File Operations

Selection of [F8], Global Spec File Operations, from the Enter/Edit Spec Data menu allows you to perform special operations that are global to the spec file. For example, you can check test limits, sort the spec file for best speed, measure resistance and capacitance offsets, autolearn test steps (with or without guarding), and specify fixture-check information. The Global Spec File Operations menu is shown in Figure 7-14. Most of these operations are applicable primarily to MDA as opposed to functional testing. As such, you might first enter and debug the MDA portions of the test using these features, then manually add the functional test portions of the spec file. Figure 7-14 - Global Spec File Operations Menu
[F1]
is used to check the limits of the analog tests in the spec file. It provides warnings for test steps that can go into overrange before reaching the high test limit. You may wish to do this in some cases, but may have accidentally ended up in this situation in other cases. As an example of the former, you may want to use the 100 ohm range of RES, which is very fast, to ensure that a resistance value is greater than 100 ohms. By setting the low limit to 100 and the high limit to 200 (which is higher than the System can read on the 100 ohm range), you can do this in a very quick and efficient manner.
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[F1] also checks for illegal operations when using the Model TR-6. For example, it checks for measurements above 12 volts routed through the MDA solid-state test points, use of the DMM input for the UCT when the specified frequency is too high, and other similar sort of errors.
[F2]
is used to help automatically generate your test program during manual entry. Once you have typed in an MDA test, you can press [F2] to go through the data you have entered and assign default test limits based on the nominal value, then assign an initial test range that is likely to work properly for the specified nominal value. You can speed entry when using this function because you first only need to enter the test points, test type, title (component name), and nominal value and let this function complete the entry. The System uses the test step range set with [F9] for this operation. is used to sort the spec file to obtain the best test times. When the System changes measurement frequencies, it needs to settle to each new frequency. If your spec file has intermixed measurement frequencies, the test time is longer. This option groups together all the Current Mode readings first, then the DC Voltage Mode readings, then the 1 KHz readings, and finally the 100 Hz readings. If the spec file has a SHUT DOWN label, readings past the label arent affected. Normally, you should only use this sort function during MDA testing since ordering of functional tests shouldnt usually be disturbed. is used to automatically measure the resistance offsets from the test electronics to the fixture. After selecting this option, the System asks you to install a shorting bar on the fixture. After doing so, the System automatically measures between the points indicated for each low resistance measurement indicated in the spec file. The measured value is saved as a zero offset for each affected test step. Offsets measured using the 100 ohm range.
[F3]
[F4]
[ALT F4] Same as [F4] except measurement uses the test step range. [F5] is used to automatically measure the capacitance offsets from the test electronics to the fixture. After selecting this option, the System asks you to remove the UUT from the fixture. After doing so, the System automatically measures between the points indicated for each small capacitance measurement indicated in the spec file. The measured value is saved as a zero offset for each affected test step. Offsets measured using 1 KHz, 2V stimulus.
[ALT F5] Same as F5 except measurement uses the test step range.
[F6]
is used to enter and edit fixture-check data. This information can subsequently be used during testing operations to help determine whether a problem exists in the fixturing. After selecting [F6], you are presented with the Edit/Enter Fixture-Check Data screen shown in Figure 7-15.
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[F7]
is used to have the System automatically learn all of the RES, CAP, DIODE and INDUC test steps that have been entered. The System performs operations to determine the best polarity, measurement technique, and guard points for each test point. The initial and final test steps processed can be specified with [F9] of this menu. For the details about this operation, see the section describing the Autoguard Configuration menu earlier in this chapter. is just like [F6], but it does not use guarding. This option can be used as a faster alternative to [F6]. sets the first and final test step processed when using [F2], [F7] and [F8] of this screen.
[F8] [F9]
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Edit/Enter Fixture-Check Data

This screen is used to specify how the System confirms proper fixture operation. Fixture-check measures the approximate resistance from each pin to all other pins connected together, and confirms that the resistance is below a specified threshold. Since most pins are connected to at least one other point, fixture-check will find resistances below the threshold for most pins in a fixture. If fixture problems are suspected during testing, fixture-check can be invoked from the Test Completed menu. At this time it reports on pins that are above the threshold, that were previously below it. You can suspect fixture problems with the reported points. The fixture-check information is saved with the spec file. Fixture-check can also be invoked automatically during test execution with the FixCh test-type (see Chapter 11). Figure 7-15 - Edit/Enter Fixture-Check Data Screen
The fixture-check screen shows a diamond beside each point that is connected to at least one other point on the fixture. Fixture-check information can be automatically learned for the fixture as a whole (all active points) by pressing the [F5] key. The [F2] key measures the selected point. The [F8] key lets you enter a new resistance threshold to use for the fixture-check test. With the [F1] key you can force the test on a particular point to be connected or a no-care. The [F3] key allows you to run an entire fixture check test.
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Special Features
Selection of [F6] in the Assembly Learn menu allows you to specify special capabilities such as autoprogramming the UUT, assigning measurement characteristics and reading and writing spec data in ASCII format. The measurement characteristics available from the Special Features screen can also be modified during run time with the RESRG and RETRY test types. See the description of these test types in the Test Type Descriptions section of this manual. The Special Features menu is shown in Figure 7-16 below:
Figure 7-16 - Special Features Menu
[F1]
is used to assign the measurement characteristics used for Current Mode RESistance test steps used in a spec file. These characteristics set the number of samples averaged, delay time, discharge time and remeasurement delay time. These can be advantageous to increase the repeatability of measurements or to measure problem points. This process is discussed in more detail in the Assign Measurement Characteristics section of this manual (see Figure 7-20). selects the Assign Other Measurement Characteristics submenu. This menu allows you to specify how many retries to make before failing steps, and also discharge times and samples averaged for some measurement types. This submenu is shown in Figure 7-17.
[F2]
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[F3]
allows you to automatically generate a test program for a UUT without any programming necessary. This submenu is shown in Figure 7-18.
[F4] and [F5] are used to read and write spec file data as ASCII files to the PCs disk. This process is described in the following Translating Spec Data To and From an ASCII File section of this manual. [F6] is used to read and translate CAD data into a specification file. Conversion of several popular varieties of CAD data is supported. See Chapter 8 in this manual for specific details about the CAD conversion process. can be used when you are testing several separate PCBs that are assembled and tested as a single panel prior to separation. Refer to the Testing Multi-PCB Panels section for more detail of this process.
[F7]
[ESC] is used to return to the Assembly Learn menu.
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Assign Other Measurement Characteristics

Selection of [F2] in the Special Features menu allows you to specify the number of retries done in attempting to obtain a measurement result within the test limits specified for a test step. These retries cover both MDA (RES and CAP) and TR-6 (DMM and UCT) measurement types. With this selection, you can also specify discharge times and samples averaged for some of the test types.
Figure 7-17 - Assign Other Measurement Characteristics Menu
[F1] [F2] [F3] [F4]
specifies the number of retries allowed for MDA resistance-type measurements, including RES, JMPR, POTR, SWCHR, WIRE and JMPER. specifies the number of retries allowed for MDA capacitance-type measurements, including CAP and JMPC. specifies the number of retries allowed for TR-6 DMM, JMPDM, SWCHD and POTD measurements. specifies the number of retries allowed for TR-6 UCT, JMPU and POTU measurements.
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[F5]
specifies the maximum time to wait for a capacitor to discharge during a CAP measurement when using the Current Mode. Each time a measurement is taken, the System grounds the test points so that any charge is removed. As soon as the charge is removed, the System takes a measurement. The [F4] setting is the maximum time (in Sec) that the System will wait for a charge to dissipate. For small capacitors, the discharge time is only a few mSec, but with several thousand microfarads, the time can be in the seconds region. The default, five seconds, works well in most applications. is used to specify the maximum time to wait for a failure to become a pass during a DIODE test. Normally, the System takes a measurement and a pass or fail occurs immediately. However, if there is a capacitor in parallel with the diode, it can take up to a second or two for the cap to charge. This setting determines the time, in mSec, that the System will allow for charging to occur. The System will repeat the test until the voltage stabilizes and the test passes, the reading passes through the test limit range, or until this time setting is exceeded. The default, 100 mSec, is adequate in most applications. is used to specify how many voltage readings to average when executing a VOLT or JMPV test type. Averaging samples effectively improves the repeatability of tests by averaging noise in the measurement. Enough samples should be averaged to ensure repeatable measurements, but the number averaged should be small enough to ensure speedy test execution. Each sample takes approximately 50 to 100 uSec. is used to specify how many inductance readings to average when executing an INDUC or JMPI test type. Averaging samples effectively improves the repeatability of tests by averaging out noise in the measurement. The number of samples averaged should be large enough to ensure repeatable measurements, but small enough to ensure speedy test execution.
[F6]
[F7]
[F8]
[ESC] is used to return to the Special Features menu.
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Autoprogramming
The MDA system can be used without conventional test programming. This is handy if you would like to do testing on UUTs, but you dont have the time or staff to write a "real" test program yet. To do this, the system provides an "autoprogramming" facility. This allows you to put a known-good UUT on your test fixture, then have the system autoprogram the attributes of the UUT. When autoprogramming, the System electrically examines your UUT, generating: 1. A continuity map that is used to find opens and shorts, 2. A list of resistances from each point to each other point, 3. A list of capacitances from each point to each other point, and 4. A list of diode junctions from each point to each other point. Once the System has autolearned these attributes of your UUT, you can use the generated test program(s) to test assemblies. Autoprogramming has the advantage of quick and easy program generation, but it does not contain as good diagnostic information as a conventionally written test program. For example, if it detects a failure, it will simply list the error in terms of the measurement type (e.g., RESistance), the two test points being measured (by number), the high and low test limits, and the measured value. A normal test program would contain the name of the component being measured, and would contain less measurements since the automatically generated program cant tell the difference between impedances caused by series and parallel combinations and those not caused by normal component measurements. However, even with these disadvantages, the autoprogramming function allows you to get up and operating very quickly and still provides fairly high test coverage.
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Figure 7-18 Autoprogram UUT Autoprogramming is performed by the Autoprogram UUT screen as shown in Figure 7-18. This screen is accessed by pressing [F3] from the Special Features screen. To autoprogram an assembly, do the following steps: 1. Place a known-good UUT on the test fixture and actuate the fixture. Fixtures obtained from CheckSum can be mechanically locked into place or actuated with a switch available on the fixture system. 2. Press [F1] to enter the UUT name. This UUT name will be used as the spec-file name that is generated. It can be any sequence of up to eleven characters that do not contain spaces, colons, semi-colons, periods, or commas. 3. Press [F3] to enter the last used test point for the UUT. The number entered here has a big impact on autoprogramming speed, so use the smallest number you can that still encompasses all the UUT test points. 4. Press [F7] to start the autoprogram process. If an existing file is present, you will be asked if it is OK to overwrite it, then if so, the autoprogram will commence. Small UUTs of 100 points or less autoprogram in a matter of a few minutes, but large assemblies may take several hours. Thats it! Once autoprogramming is complete, you have a program with the name you provided that is ready to run. It contains RESistance tests, CAPacitance tests, DIODE tests, and some operator displays just as used with conventional programming. You can refer to other sections of this manual to see how these test-types function. You can run
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and edit the program to fine-tune it to your needs. You should run it a few times at first to make sure that every step reliably passes. If not, you can go to the Enter/Edit Spec Data screen to delete or modify test steps that are a problem. The Autoprogram UUT screen allows you some special keys ([F3] to [F6]) that can be used to alter the autoprogram process. For each type of measurement function, you can have the System autoprogram (yes), or not autoprogram (no). If you have already autoprogrammed the assembly, these keys also allow you to use the previously determined data (use-last) for a function when you do a new autoprogram. For example, if you have autoprogrammed an assembly, but would like to relearn CAPacitors, you can tell it to use-last for the other parameters (CONT, DIODE, RESistors) to save time. Figure 7-19 Autoprogram UUT Parameters
You can use the Autoprogram UUT Parameters screen shown in Figure 7-19 to fine-tune autoprogramming. Use [F1], [F2] and [F3] to choose the autoprogramming function Resistance, Capacitance and Diodes respectively. For each function, the parameters are listed in the [F4]-[F8] keys. [F4] and [F5] allow you to specify the lowest and highest values programmed for each function. [F6] allows you to set the test limits in percent (or in volts for diodes). [F7] allows you to specify the closest allowable tolerance. For example, for resistance the default percentage tolerance is 20%, and the closest absolute limit is 5. This means that even though 20% may be less than 5 ohms, the closest allowed tolerance is 5 ohms. [F7] for diode testing allows you to choose the current used for diode testing. Depending on your system hardware configuration, [F7] may or may not be active in the diode function. [F8] is used to return the system to the factory default settings for the currently selected parameter. The changes that you make in the Autoprogram UUT Parameters screen can be saved in the Station Configuration file for your next use of the System.
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If you are interested in the nitty-gritty details of autoprogramming, here is a little more information. For each parameter that is autoprogrammed, an ASCII file is generated. They are called $TMPCO$.1 for continuity, $TMPRE$.1 for resistance, $TMPCA$.1 for capacitance, and $TMPDI$.1 for resistance. These are normal CheckSum-ASCII files that can be read in by the standard ASCII-input function of the special features menu. If not all of the data fits into one spec file, more files with extensions of .2, .3,... are used. The first line of each file contains the name of the spec file that it was used to generate. These ASCII files are overwritten each time you do a new autolearn. If not all of the test steps will fit into a single test program, the autoprogram function generates a series of programs linked together with RUNT commands. The main file is called the name which you entered, and the RUNT programs use the same name, but with a last digit of A, B,... and so on. Each of these files can be called up and executed individually if desired.
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Translating Spec Data To and From an ASCII File

You can read from a file that has been created elsewhere. For example, you may wish to use a word processor or spreadsheet to describe an assembly. The [F8] option of the Special Features menu allows you to read in that file and convert it into the internal format used by CheckSoft Software. You can use the [F7] option of the Special Features menu to write the spec file in an ASCII format that can be read back by [F8]. This allows you to generate an ASCII file, modify it off-line with an editor, then read it back in. Note that special attributes (such as failure delay and active test points) are not translated to and from ASCII. The text file can contain the assembly name, connections, pin names, operator instructions, comments, and test step information for an assembly. In general, each of the sections is optional and may be placed in any order. However, the pin names must be assigned prior to their use in the Test Steps section of the file. The file typically has several sections, each of which is optional. Each section is prefaced by a keyword followed by a colon (:). Valid keywords are NAME:, PIN NAMES:, TEST STEPS:, DISPLAYS:, COM:, OPENS: and CONNECTIONS:. Keywords may be entered in either upper or lower case and must be the only thing on the line. After each keyword are one or more lines of data applying to the keyword. Valid data includes the following: Name: Followed by an assembly name with up to 32 characters. Pin Names: Followed by one or more lines each of which contains the MDA test point number, a comma, then a pin name with up to six characters. Test Steps: Followed by one or more lines, each of which contains from and to, type, range, title, low limit, high limit and nominal value, each separated by a comma delimiter. The from and to fields can either be a test point number or a pin name preceded by a tilde (~ ). If a pin name is used, it must have been previously defined in the Pin Names: section. Low and high limits are real numbers in volts, ohms or farads and can not include alphabetic modifiers such as u or k. Connections: A list of connections to be verified with the CONT test type. Each line contains a from test point number, the word to, and a to test point number. Optionally each destination can be followed by a hyphen (-) and another test point number to denote a range of test point numbers. The second test point number must be larger than the first. More than one range can be included. For example: 121 to 134-234 270-400
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Opens: Same as connections, but used to specify non-connections (opens) to the CONT test type. Displays: Followed by one or more lines describing the displays used by the DISP and DISPE test types. Each line includes the display number, a comma, the row number, a comma, the column number, a comma, the display itself. Com: Followed on the same line by an operator instruction (comment). These are read in order and appended, line by line. As an alternate to Com: you may use an asterisk (*) at the beginning of each line. ! An exclamation point is used to start a comment in the ASCII file. Everything after it on the line is ignored. Blank lines These lines are ignored. Blanks at the beginning or end of a line are ignored also. Appendix B shows an example of a text file used to define an assembly. Note When reading ASCII files, the System uses commas to separate the input fields. Therefore, you should not use commas in test titles for the test steps since this will confuse the System during ASCII input. During ASCII output, the System converts any commas that it finds in the test titles to semicolons.
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Assign Measurement Characteristics

[F1] of the Special Features menu is used to set how the MDA System performs RESistance tests when using the Current Mode. It allows you to specify how the System takes measurements and the method of testing. Selection of [F1] Assign RES Measurement Characteristics presents the Resistance Measurement Characteristics screen shown in Figure 7-20. Figure 7-20 - Resistance Measurement Characteristics Screen
The values set in this menu are the System defaults for testing. Most values can also be altered during run time with the RESRG test type. The arrow keys can be used to move the brackets to any of the fields. Once the brackets are moved to the selected field, type in the desired new value. The MDA uses a constant-current source that develops a voltage drop across the unknown UUT resistance. Each time the System switches to a new measurement path and selects the appropriate current range, it waits a short time to allow the current source and switching to stabilize. The first column of this display allows you to alter the amount of time delayed. Note Care should be taken when reducing the settling time. In most cases a reduction from the factory defaults will cause a significant degradation in performance.
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Once the System has stabilized, it takes one or more voltage reading samples, then averages them to compute the final resistance value. The second column of this display allows you to alter the number of readings that are averaged. By increasing the number of samples, the System readings will become more consistent at the expense of System speed. The System speed can be increased by decreasing the number of samples averaged. However, this will cause the readings to be less consistent. At the bottom of the screen, the Maximum Discharge Time allows you to specify that the System tests for a charge on a test point prior to making a RES measurement using the Current Mode. If there is a charge present, the System waits up to the specified amount of time for the capacitor to discharge prior to making the measurement. To optimally use this feature, you can use zero as the max discharge time on your normal test points (which will allow the System to operate as fast as possible), then set it to a non-zero discharge time (like 1000 mSec) for problem points via the RETRY test type. Note An alternate to using the max discharge time is the DISCHarge test type that can discharge two test points for a specified time. The Remeasurement Delay setting allows you to specify the delay time (in mSec) that the System uses for remeasurements. Normally, the failure delay is set to zero. However it can be set to any value up to 9,999 mSec. If a RESistance measurement fails and this value is non-zero, the System delays the specified number of milliseconds, then takes another reading. It repeats this sequence up to the number of times specified with the RES failure retries setting. This feature can be advantageous if your UUT contains capacitors. If a failure occurs because the capacitor hasnt had time to charge, this delay factor can give the System time to charge the capacitor, then remeasure prior to recording a failure. Similar functionality is available via the Max Discharge Time parameter of the measurement characteristics. However, the measurement characteristics cause a delay each time a RES test type is used, whether or not the delay is necessary. The remeasurement delay method causes a delay only in the event of a failure. Selecting [F1] allows you to reset the System back to the factory default values. The default values are a good compromise of speed and accuracy for most applications.
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Assigning Operator Setup Screen

[F4] from the Assembly Learn menu allows you to enter operator instructions. Operator instructions are a way of giving information to the operator previous to each test. The notes are presented to the operator and then a key is pressed to continue with the test. Operator instructions are presented each time a new assembly is tested, but are not repeated for subsequent assemblies while testing a batch. Operator instructions are handy for such things as connection information, special precautions, fixture adapter installation, or special instructions such as testing the assembly for intermittent failures. The comments screen can include line graphics such as - or = along with corresponding corners and vertical single and double lines. Comments are entered in the Operator Setup Entry screen shown in Figure 7-21. Figure 7-21 - Operator Setup Entry Screen
Use the arrow keys to move to the desired position for text or graphics. To enter text, just type it. To erase a character position, use the space bar or backspace key.
[F1]
is used to draw lines, toggling between the following: () no lines
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(-) (=)
single lines double lines
When in one of the line-drawing modes, the arrow keys draw lines in the direction indicated by the arrow key. By turning lines on and off, you can achieve most line drawings. By redrawing over lines, you can erase junctions to lines that you may have erased.
[F2]
allows you to save the present screen to the disk for future recovery if you would like to use it in a different spec file. It is normally saved only with the spec data file. The drawing is saved as the name you specify with an extension of .CMT.
[F3]
allows you to merge a comment file on the disk with the screen presently shown. Any non-space character in the disk file overwrites those at the same position on the display. Other characters are left undisturbed. To read a file, enter the name. The System automatically adds the .CMT extension. CheckSum provides .CMT files appropriate for its Fixture Systems along with the fixtures. unmerges the specified file name shifts the displayed figure one place to the right left triangle right triangle moves cursor to extreme left moves cursor to extreme right moves cursor to top moves cursor to bottom erases the display
[Alt]-[F3] [F10] ~ [Home] [End] [PgUp] [PgDn] [F4]
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Printing Specification or Wire List Data

Selection of [F7] or [F8] from the Assembly Learn menu allows you to print out a report of the test specification data or connection information for an assembly. When printing the wiring report, the System outputs the test point names, test point numbers, and fixture interface connection. The interface connection column is tailored according to what fixture system you have installed and how the back panel connections are made. The type of fixture system is specified in the Configure/Install System Menu ([F3] Other hardware configuration/ [F2] Accessories & fixture Section). Selections are available for CheckSums Model TR-3, TR-3 with GR-style wiring, Model TR-5, and none (custom). The fixture back panel connections can be specified in the Configure/Install System Menu ( [F1] & [F2] TR-4 and TR-6 module configuration screens. The last column of each entry allow you to specify where the module is plugged into the fixture system. Once you have selected report output, you are presented with a list of possible destinations as shown in Figure 7-21. If CON is selected, the report is displayed on your CRT. Other choices include your PCs printer or a disk file. If you want to abort printing of the report, press [ESC] to return to the Assembly Learn menu rather than selecting a report destination.
Figure 7-22 - Spec File Report Device Selection L ist
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Testing Multi-PCB Panels

UUTs that consist of several individual PCBs (usually identical) in a single panel can be accommodated with the multi-PCB capability of the MDA System. The multi-PCB panel capability provides several features: 1. If you have wired all the PCBs identically (but to a different range of test point numbers), you can program the first PCB in the panel, then have the System replicate the pin names and/or spec data for the other panels. The System automatically updates the test point numbers as it copies the data. 2. When testing a panel, the System displays the location of the PCB currently under test in the lower right of the testing screen. For panels that fit within a PCB array at most four PCBs wide and four PCBs high, a PCB map is displayed in the lower right corner. The current PCB under test is shown on the map as an asterisk. For larger panels the number of the PCB under test and its location within the panel are shown in the lower right corner. These locations are described as relative to the upper left corner of the PCB Panel (shown in Figure 7-24 and 7-26). This way the operator always is aware of which PCB is being tested. An example is shown in Figure 7-23. Figure 7-23 - Testing Display with Multi-PCB Panels.
3. Panels fitting into a four wide by four high array are shown at the end of the test at the top of the Test Completed display. The PCB status is shown at each PCB position as
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either a blank (not tested), F for failed, or P for passed. An example is shown in Figure 7-25. The softkey [F9] (Show Individual PCB Status) is provided in the Test Completed Display Menu for larger panels. This softkey brings up a full screen displaying the status of all PCBs. At the end of each test (and prior to the first test) an additional selection, [F7] Specify PCBs in panel to skip, is available. This selection only appears if the assembly that you are testing is configured as a multiple-PCB panel. When you have selected [F7], you are presented with the Skip PCBs in Panel display shown in Figure 7-24. By moving the cursor to the PCB(s) that are to be skipped, then pressing [ENTER], the test on the selected PCBs will not be performed. This selection is helpful when one or more of the PCBs in the panel are rejected and a test is not desired. Figure 7-24 - Skip PCBs in Panel
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Figure 7-25 - Test Completed Display with Multi-PCB Panels
To use the System for panelized PCBs, the general sequence of operations is as follows: 1. Wire the fixture with each PCB wired identically, but begin at a new range of test point numbers. The wiring must be in the same sequence for each PCB, but beginning at different test point numbers if automatic copy of spec data or pin names is to be used. 2. From the Multi-PCB Panel Configuration menu, select [F1] to enable panelization. 3. From the Multi-PCB Panel Configuration menu, select [F2] to specify a number to each PCB in the panel. This screen allows you to associate a positional relationship between the PCBs for operator messages. This map defines the number of PCBs on a panel. 4. From the Multi-PCB Panel Configuration menu, select [F3] to specify the range of test point numbers associated with each PCB. 5. Program and debug the spec data for the first PCB in the panel (PCB number 1). Start the spec data with a PCB 1 test step.
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6. From the Multi-PCB Panel Configuration menu, select [F4] to choose the method of statistical analysis of panel PCB results. PCB results on each panel are either treated as results from separate UUTs, as results from replicates of one UUT, or as results which add up to one UUT test. 7. From the Multi-PCB Panel Configuration menu, select [F5] to replicate the PCB 1 data into each of the PCBs in the panel. This will expand the spec file, updating the test point numbers as necessary. 8. From the Multi-PCB Panel Configuration menu, select [F6] to replicate the pin name data for PCB number 1 for each of the PCBs in the panel. When you have enabled and defined a multi-PCB panel, this information is saved along with the spec data on disk for use in testing. Remember to save your spec data often through this process in case you would like to recover back to an earlier stage. When you select [F10] Specify Multi-PCB panels from the Special Features menu you are presented with the Multi-PCB Panel Configuration menu shown in Figure 7-26.
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Multi-PCB Panel Configuration

The Multi-PCB Panel Configuration menu allows you to use the System to easily test panels that consist of several, identical PCBs.
Figure 7-26 - Multi-PCB Panel Configuration Menu
[F1]
of the Multi-PCB Panel Configuration menu allows you to turn on and off the PCB Panelized feature of the System. If it is turned off, the test displays do not show the PCB orientation in panels. Pressing [F1] toggles this feature on and off. is used to specify to the System the physical orientation of the individual PCBs within the panel. The panels can contain up to 99 PCBs, with at most 16 PCBs in one direction. When you select this option, you are presented with the Panel Configuration screen shown in Figure 7-25. is used to tell the System which range of test point numbers is associated with each PCB in the panel. This information is used when copying data with the [F5] and [F6] selections of this display. When you select [F3] Specify PCB Pin Number Ranges, you are presented with the PCB Wiring Assignments screen shown in Figure 7-28.
[F2]
[F3]
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[F4]
is used to select how Statistical Analysis counts individual PCBs within a panel. The [F4] key toggles between the choices of treating panel PCBs as separate U UTs, as replicates of one U UT, or as parts that combine into one UUT per panel. The method chosen is recorded along with test step results when test result logging is enabled. It is also remembered by the individual test program. Thus subprograms should generally use the same setup as the main program. is used to specify panelized UUT ID reporting. [F5] toggles between using one ID per UUT (multiple IDs off) and one ID per PCB (multiple IDs on). If your test program uses subprograms, it is recommended that the same UUT ID reporting strategy be used in both to maintain consistent UUT ID logging in the SPC file. is used to copy the spec data from PCB 1 to the other PCBs that you have specified. During panel replication all existing PCB blocks above block 1 that are defined using [F2] are deleted from the test. Statements in the PCB 1 block are then replicated into the subsequent blocks using pin number intervals defined in [F3]. If no PCB 1 block is found then the first block of non PCB statements becomes the new PCB 1 block, which is then replicated. Blocks outside the range defined using [F2] remain unchanged. It uses the assignments made in the PCB Wiring Assignments to update the test point numbers for the new PCBs. This option assumes that the test points are all wired in the same sequence for each PCB in the panel, but beginning at different points. When using this selection, it is recommended that as the first line in the spec data you place a PCB 1 test step. This will then be recreated and incremented for the other PCB types to allow the proper display functions. Prior to executing this copy operation the System checks the validity of the panel configuration and wiring assignments that you have done. If the spec data which you are copying has JMPs and LABELs you will need to go back and manually edit the label names after you replicate the data.
[F5]
[F6]
[F7]
is used to transfer the pin names that you have assigned to PCB 1 to each other PCB in the panel. It replicates the pin names to each PCB that you have identified in the Panel Configuration screen using the beginning and ending port numbers you assigned in the PCB Wiring Assignments screen.
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Panel Configuration Screen The Panel Configuration screen is used to specify to the System the physical organization of the PCBs in the panel. You assign a sequential number (beginning at 1) for each PCB in the panel. You can choose any of the positions in the panel to represent the orientation of the panel that you are testing. For example, if you have four PCBs in your panel, and they are located one above the other, you would select one complete column in the default display. The default panel size is four PCBs per row by four PCBs per column but the panel width and height can be set to sizes from 1 to 16 in order to accommodate up to 99 PCBs. The panel size is modified by changing the PCBs per row and PCBs per column values using [F1] and [F2]. Figure 7-27 - Panel Configuration Screen
The example Panel Configuration screen, Figure 7-27, shows six panels, three on the top and three on the bottom. This orientation would generate operator displays such as those shown in Figures 7-23 and 7-25. You can move around the screen with the arrow keys, then type in the number of the PCB. The PCB numbers must be sequential, beginning at one. To eliminate a PCB that has been assigned, move to it with the arrow keys and backspace over the number. Each PCB number should be matched in the spec file with a PCB test step for the displays to work properly. PCB Wiring Assignments Screen
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The PCB Wiring Assignments screen, shown in Figure 7-28, is used to associate test point (port) numbers used with each PCB in the panel. This information is used by the [F4] and [F5] Copy routines in the Multi-PCB Panel Configuration menu. Figure 7-28 - PCB Wiring Assignments Screen
Each PCB that has been assigned in the Panel Configuration screen as shown as Active in the PCB Wiring Assignments screen. Enter the beginning and ending test point numbers for each PCB. The numbers should not overlap, and the ending port must be larger than the beginning port. The System assumes that each PCB in the panel has been wired the same, but beginning at a different test point number. Table entry provides an automatic pin interval completion feature which completes the ending or beginning port assignments if the user just fills in the values of only one column. This algorithm replaces 0 entries with pin numbers that provide contiguous pin intervals between PCBs. The automatic algorithm only updates 0 pin values on lines near where the user is making entries.
Testing Digital Logic

The Logic test type provides a compact means of functionally testing sequential and non-sequential digital hardware. Test vectors are applied at the rate which the test computer can interpret tests defined in an ASCII readable test file. A single Logic test
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references a sub-test within a test file which may contain multiple lines. The test file is ASCII for ease in editing. Function declarations have commonly used logic syntax. Logic Test File Syntax Test Point Names declared in the pin names list (Figure 7-2) are automatically recognized by the Logic test. Signals used only during a Logic test need only be declared in the LOGIC test file signal declarations. The LOGIC test file contains three elements: signal declarations, logic sub-tests and comments. Signal declarations are enclosed by lines beginning with "# define:" and "# end". Logic sub-tests are enclosed by lines beginning with "# test:" < name_list> " and "# end". Any text outside these blocks and any lines within the blocks beginning with a "#" mark are treated as comments. Within the signal declaration block each non-comment line declares a digital signal for use in the sub-tests of that file. UUT Logic input signals declared here override declarations of signals with the same name in the pin name list. This means that if a stimulus can be driven by either a digital source or as an analog test point it is driven digitally. Conversely, if a UUT output is wired to both a digital input and as an analog test point it will be measured as analog. This rule for measuring an output wired both ways allows tri-state and floating outputs to be detected as well as true logic high and logic low levels. The signal declaration syntax is: "signal_name = io_byte, io_bit" or "signal_name = io_byte, io_bit, cntrl_byte, cntrl_bit" or "signal_name.od = io_byte, io_bit", where io_byte and io_bit mask and cntrl_byte and cntrl_bit mask have the same byte and bit format as used in the DIGx commands. The last two formats identify signals that have corresponding overdrive control lines such as BANK0~ in Figure 7-29. There are two ways to specify a signal that has overdrive (through a G80-ODM module). If a signal has a corresponding dedicated control bit with the same bit sequence as the G80-ODM then the location of the control bit is known relative to the signal bit (see Figure 7-31). In this case all that needs to be specified is the signal bit using the "signal_name.od" format. When control and signal bit ordering is not the same as the G80-ODM then the control bit needs to be declared explicitly. An io_bit value of 0 indicates the use of overdrive for a signal already declared in the pin names list.
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The sub-test "name list" contains at least one test name following "#test:" that is preceded by at least one space. The Logic Test Step can use any of the sub-test names to identify the test declared. There are eight types of non-comment lines within the test declaration block. They are set, set immediately, reset, reset immediately, clock, sequential, output enable (.oe), and Sum-Of-Product (SOP) declarations. One of the following declaration types are allowed on a non-comment line within a sub-test: SET implicant; SETI implicant; RESET implicant; RESETI implicant; input.clk = compound_name; [!]{name|(dddd)} := expression; [!]{name|(dddd)}[.oe] = SOP expression; The last definition defines both SOP and output enable expressions. The square braces indicate an optional field. The curly braces indicates where the choice of one option is required. The vertical bar indicates a choice. The exclamation mark indicates negation. Following are definitions of terms used above: implicant = input[*input]...[*input] input = compound_name|(dddd) (dddd) is a positive decimal number up to 4 digits in length. This number indicates the testpoint number of a UUT input instead of the testpoint name. compound_name = !name|name name begins with an alpha character. expression = constant;|implicant; constant = 1| 0 SOP expression = constant;|implicant[+implicant]...[+implicant]; A SET declaration specifies that a signal is to be held high or low until the sub-test ends or the signal is reset to tri-state via RESET or RESETI or has its level changed by a later SET operation within the sub-test. One or more consecutive lines of SET operations are executed together without regard to ordering of the lines. The set immediate (SETI) operates like SET except that each line is executed immediately. The RESET and RESETI operations return any tri-statable signals that were previously SET back to the tri-state condition. SETI, RESETI and CLK declarations are generally intended for use with digital signals. LOGIC test control of voltage levels on analog channels can not rule out transients that could violate the test program sequence defined by SETI, RESETI and CLK declarations. The syntax to hold a signal high is "SET signal_name;". The syntax to hold a signal low is "SET !signal_name;". The clock declaration identifies a digital signal to be used as the clock for an immediately following sequential output test. Each sequential test must be preceded by a clock declaration which declares the clock signal for the sequential test output. The sequential output is treated as rising edge triggered if its clock signal declaration has no inversion, negative edge triggered otherwise. If multiple signal edges must be sequenced before
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testing a sequential output then SETI commands can be used to specify sequencing of the additional edges before the clock and sequential declarations. If an individual output to be tested has a group of setup signals to enable the output this is specified using an output enable declaration. The output enable declaration for a signal should precede the SOP expression for a combinatorial output or the CLK declaration for a sequential output. Figure 7-30 provides some SOP expression examples. A SOP expression can consist of several lines of implicants by ending each line except the last with either a plus sign character or an asterisk. The last line needs to end in a semi-colon. Figure 7-29 shows a schematic example and Figure 7-30 a corresponding Logic test file.
Figure 7-29 - Example Circuit for Logic Test
U1 SA10 SA11 SA12 SA13 SA14 SA15 1 2 3 6 4 5 A B C G1 G2A G2B Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 15 14 13 12 11 10 9 7 BANK0~
74ALS138 U2 SA4 SA5 SA6 AEN IOW~ 1 2 3 6 4 5 JP3-1 J1-1 J2-1 JP3-25 G80 J1-25 G80-ODM A B C G1 G2A G2B Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 15 14 13 12 11 10 9 7 WR00~ WR01~ WR02~ WR03~ WR04~ WR05~ WR06~ WR07~
74ALS138
Example Logic Test Figure 7-30 contains a listing of an example LOGICDEMO test program containing Logic test steps and the PG1.TST file used by these steps for testing U2 of the Figure 7-29 schematic. The test setup uses a G80 with a G80-ODM to provide overdrive of the BANK0~ signal. Overdriving BANK0~ allows U1 to be ignored during testing of U2. Note that the signal names may be entered with upper and/or lower case characters. Figure 30A - Logic Test File for Test Steps of Example Spec File (Fig. 30B)
Figure 30B - Example Logic Spec File in ASCII Format
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The PG1.TST logic test file contains two sub-tests. The U2-15 sub-test checks pin 15
output of the 74LS138 decoder after first verifying that the decoder inputs SA4, SA5, SA6, AEN and IOW~ can be toggled. This sub-test uses the set command to hold
select~ (and thus the BANK0~ overdrive output) low during the entire sub-test. It also
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checks that the BANK0~ overdrive output is indeed held low. The sub-test calls for AEN to be held high and IOW~ low during testing of the WR00~ output on pin 15. The U2 sub-test checks all eight decoder outputs. It uses the set command to hold BANK0~ low, IOW~ low and AEN high during the entire sub-test. This sub-test has examples of decoder outputs represented by active high (WR00~ and WR07~) and active low expressions (WR01~ through WR06~).
G80 JP3 to G80-ODM J1 Data Location DIGIO Byte 1 DIGIO Byte 2 DIGIO Byte 3 Control Byte Location DIGIO Byte 4 DIGIO Byte 5 DIGIO Byte 6 Output Bits G80-ODM J2: 01-08 G80-ODM J2: 09-16 G80-ODM J2: 17-24
G80 JP4 to G80-ODM J1 Data Location DIGIO Byte 7 DIGIO Byte 8 DIGIO Byte 9 Control Byte Location DIGIO Byte 10 DIGIO Byte 11 DIGIO Byte 12 Output Bits G80-ODM J2: 01-08 G80-ODM J2: 09-16 G80-ODM J2: 17-24
Figure 7-31 - G80-ODM Input/Output Pin Mapping When Connected to a Model G-80
Logic Test Error Logging The mda command line option of "/log <file_name> " specifies that all Logic errors are appended to a file of the specified name. Information on the Logic error detected, the specific test step number, and the date and time of step execution are included in the log file. This summary line is followed by a blank separator line and preceded by failure specific details. The first line of an entry specifies the error type including unrecognized pin or file names, test file format errors or actual hardware logic failures. Logic failures specify the output signal name/test point and measured value. They are followed by one or more lines indicating the state of the Logic inputs when the failure was detected. Input pin numbers are shown as negative numbers if the signal pin was forced to a logic low and as positive numbers for a logic high level. The Logic error log file may be viewed from the Edit Screen by selecting a Logic test step then [F5] followed by [F4]. [F1] from within this screen allows you to select by name another file for viewing, e.g., such as a Logic test file.
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Logic Test Coverage Each product term in the SOP expression is called an implicant of the output (which is a signal or its inverted form declared on the left of the equals sign in the signal declaration). The Logic test checks that the output goes low for one combination of inputs and that it is high for each of its implicants. If you want to test all implicants of both the signal and its complement you need to declare a SOP expression for both. Hardware Requirements Logic testing requires both UUT stimuli and the ability to measure UUT outputs. Stimuli can be provided by a TR6 and TR4-1 combination or by using digital outputs from the TR4-1D or G80. UUT outputs can be measured as voltages using the TR4 and TR4-1 or as logic levels using inputs to the TR4-1D or G80.
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CAD Data Conversion

Overview
The CAD data conversion feature of the CheckSum Test System is used to help generate test programs (spec files) from CAD data available from PCB layout and schematic entry software. The conversion process generates a fixture wiring list to help lay out and wire the fixture, then generates a test program for MDA testing most of the components on the UUT. Depending on the CAD data used, the System may also be able to input nominal values for the test steps and assign preliminary tolerances. The process of generating test files is performed with use of the Cad Conversion Selections menu shown in Figure 8-1. To use the System to automatically generate spec files and fixturing information, you must have ASCII input files in the proper format for the CAD system from which you are converting. Although the particular files necessary vary from CAD system to system, typically the net list file and parts list file (materials list) are used for the generation process. The former is used to determine what components are present in the assembly and how they are connected and the latter is used to determine the part values for purposes of assigning tolerances and other automated program generation purposes. The System can read ASCII CAD data files from P-Cad, Mentor, OrCAD, Cadence, Tango, Pads2000, ComputerVision, Schema, ViewLogic, Racal-Redac, Scicards and Fabmaster systems. The System can also convert ASCII test programs using the .BCF format written for HP-3065 and HP-3070 test systems. If you do not have one of these formats, your CAD system may be capable of generating a compatible file. For example, most schematic entry software can generate a number of different CAD output formats from a schematic entered in its own proprietary format. Using the schematic entry package, you can generate the net list and component file in one of the formats supported by CheckSum, then read them into the MDA System. Alternatively, if you have CAD data available from an unsupported CAD system, it may be practical for you to manually edit it or to write a simple translator to convert it to match one of the supported formats. If you will also be doing functional test of the UUT, you may want to alter the default wiring that the System assigns for you. The System sequentially chooses test points as necessary without regard to their analog characteristics. For example, to support functional test you will want to specially assign test points with special voltage and current requirements to the Model TR-6 relay test points. An easy way to make this change is to
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initially generate the test program automatically, then write it out to disk in ASCII format. You can then edit the ASCII file in the pin names section to assign new pin numbers as appropriate to the special needs for the particular nodes. When you read back the modified ASCII file, the rest of the test file will be adjusted accordingly to use these new points. In general, if you want to off-line generate or change pin name assignments, the ASCII format is convenient. You can either write out the existing data in ASCII then edit it with a text editor, or you can generate a new ASCII file with just the PIN NAMES: title followed by the test point numbers, a comma, and the test point name. When you read this into the system, the names will be assigned.
Generating the Spec File

Using CAD data to generate a test program uses the following steps: 1. Using [F1], specify the CAD data format (i.e., which CAD package that you are converting from). 2. Using [F2], specify the file name without an extension. The System assumes specific file extensions depending on which CAD system you use. The sections at the end of this chapter describe the various specific CAD formats in more details. 3. Using [F4], generate a Fixture Wiring Report specifying how the fixture can be wired. When generating this report, the System assigns a test point to each network on the UUT, shows the test point, the network name, the fixture receiver interface connection, and a list of connections on the UUT connected to the network. From this list, you can wire the fixture. In this list (an example is shown in Figure 8-2), the System shows a network name for each point. In many cases, this name is valuable to the person running the program (e.g., "GND", "DATA2" or "+ 12V"). In some cases, however, the CAD system will assign names that have no meaning to you (e.g., "UN000006" or "N0000002"). In this latter case, you may choose a physical name (e.g., "U21-3" or "R1-2") to replace the cryptic network name generated by the CAD system. You can also have the System automatically assign different names by use of the "Rename networks" feature. You can enable and tailor the operation of this feature by use of the menu obtained with [Shift][F7] in the Selective Spec Data Generation menu. When wiring the Fixture, choose one node on each network and wire it to the test point shown. As you do the wiring, you should record the physical point that you have wired each network to. Alternatively, you can choose other schemes of wiring. For example, you might want to choose test points to be in order from left to right and top to bottom on either the schematic or fixture to make them easier to find.
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Once the fixture is wired, you can go back and enter the physical names for the net names automatically assigned by the System. To do so, enter the net name or node name as the pin name for the point. Once you have done this, the System will use the names you have assigned rather than choose its own names. If you have a number of renames to do and the information is available in ASCII format, you can input it with "Read spec data from an ASCII file" in the Special Features Menu. To do so, create a file with a line "Pin Names:" followed by lines for each test point each containing a test point number, a comma, then the test point name. 4. Using [F3], generate the spec file. This step: a. reads the net list, assigning net names for those not already listed as pin names (as either a node or net name), b. using the reference designator template, generates a test step for each component found (see [F5]), c. assigns nominal values based on the information found in the materials list, d. finds parallel components and merges them (e.g., if C1 and C7 are connected to the same test points, the system adds the values of them and puts them together into one test step), e. if enabled, renames the networks with component names, and then f. assigns preliminary upper and lower test limits for each component. At this point, the Spec File can be debugged, edited and saved just as if you had manually entered it. Typically, the only things that need to be added are a CONTinuity test, an ICs test, and any special components that are not listed in the reference designator template. By listing the exception report you can obtain valuable information about what needs be added to the spec file. The generated spec file is in volatile RAM memory and must be saved with the [F9] selection of the Enter/Edit Spec Data menu. Translation of CAD formats also produces intermediate output files resembling the Mentor format. The Mentor.NET and Mentor.CMP files produced can later be translated as Mentor CAD format files. Mentor.LNL and Mentor.RNL files may also be generated. Mentor.LNL contains net names from the input file before they have been truncated. Mentor.RNL contains a list of any net renames. The Mentor.NET file contains net names truncated to eight characters and should be used for any additional selective net remaining of the spec file under [F7], "Selective spec data generation". Also, if the translation of the original CAD files produces more than 1000 test steps, additional steps are written into a spec file in the spec file directory named as the user-specified CAD file prefix plus the letters "TWO".
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CAD Conversion Selections Menu

The CAD Conversion Selections menu shown in Figure 8-1 is available from the Special Features menu by selecting [F9]. The selections are described below.
Figure 8-1 - CAD Conversion Selections Menu
[F1] [F2]
is used to select which type of CAD data you are working from. Each time [F1] is pressed, the System toggles to the next available format type. allows you to select the name of the CAD data file that you are going to convert. Depending on the CAD data that you have selected, the System will use default extensions for each type of data to be read. For example, if you are using P-Cad and enter a file name of "W345", the System will look for "W345.WRL" for the net list, and "W345.MAT" for the material list. Unless a different path is selected, the System will look for these files in the same directory as the MDA.EXE file that you are executing at the time. is used to generate a spec file from the CAD data that you have selected. [F3] is not active unless a CAD file name has been entered and a CAD file format has been selected. Once [F3] has been selected, the System reads the CAD files and generates the test program. If the System cant find one of the files (e.g., the materials list), it will display an error to you, but continue nevertheless after you press a key.
[F3]
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Once the spec file is generated, you can go the Enter/Edit Spec Data screen to edit and view it. See the following section describing Selective Spec Data Generation for more details about this conversion process.
[F4]
is used to generate a Fixture Wiring List like that shown in Figure 8-2. Figure 8-2 - Example Fixture Wiring L ist
The System reads the net list for the UUT when generating this report. Because of this, you must have selected a CAD format and input file name before selecting this report. For each network in the net list, the System first looks through the pin names that have been assigned at the time that you invoke the Fixture Wiring List option. If it finds the network name, or the name of one of the nodes on the network (the name must match that found in the CAD net list), it uses that assignment. If it doesnt find a test point already assigned, the System automatically assigns the next available test point number that doesnt have a pin name assigned.
[F5]
is used to specify how translations are made from reference designators (e.g., "R1" or "C901") to test steps types (e.g., RES or CAP) when the spec file is generated. When generating the spec file, the System generates test steps
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based on the entries in this table. Details of how this screen works are given in the Enter/Edit Reference Designator Template section of this chapter.
[F6]
is used to enable or disable generation of a text file that reports on the conversion process. This file (called the Exception Report) advises you of things to check in the generated spec file to help eliminate errors and to maximize test coverage. An example of this file is shown in Figure 8-3. By pressing [F6] you toggle generation of the Exception Report between none (not generated) or EXCEPT.DAT, the name of a text file placed in the same directory as MDA.EXE. Each time you generate a spec file, the System automatically overwrites any existing EXCEPT.DAT file. To examine the Exception Report, you can use the DOS commands PRINT EXCEPT.DAT to send it to a printer or TYPE EXCEPT.DAT to display it on the CRT. The first section of the Exception Report (if present) warns you of network names in the net list that are over eight or twelve characters in length (as applicable to the CAD data you are translating). If errors are shown, you should edit your net list to reduce the length of the listed names, otherwise tests of components connected to these network names may not be properly generated. The next section of the Exception Report describes components that have been programmed, but have more than two leads. Since the System generates tests based on pins one and two of each component, you may want to generate additional tests for the other pins or check to ensure that the generated tests use the proper pins. The next section of the Exception Report shows the names of the components found in the net list that did not generate a test. These typically will be components such as ICs (e.g., U201) and connectors (e.g., JP1), but may include names of components that you wish to test, but are not listed in the Reference Designator Template. The final section of the exception report shows test steps that have been consolidated because the components were wired in parallel. This section shows a full listing of the combined components. The spec file may not list all of these components due to a limited amount of space in the test title area.
Figure 8-3 - Example Exception Report
[F7]
is used to individually select the steps that occur when automatically generating a Spec File. This allows you to use these automatic capabilities with spec files not generated by a CAD file (e.g., you might want to have the
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System automatically generate the tolerances for a spec file that you have
manually generated), or to skip parts of the conversion process. The use of the Selective Spec Data Generation screen, which is accessed by this selection, is shown in a following section.
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Enter/Edit Reference Designator Template

The Enter/Edit Reference Designator Template screen, shown in Figure 8-4, is used to specify how the translations are made from reference designators (e.g. "R1" or "C901") to test steps types (e.g., RES or CAP) when the spec file is generated. When generating the spec file, the System generates test steps based on the entries in this table. Figure 8-4 - Enter/Edit Reference Designator Template Screen
For example, if the first line specifies a reference designator of "R", a designator range of 1 to 999, and a generated test type of "RES", the System searches that CAD data for occurrences of R1, R2, R3,...R999 and generates a RESistance test for each one found. In general, the system attempts to generate a test step between pins one and two of each reference designator. If pin one or two is not found then another pin is used to generate a component test. Automatic generation occurs in sequential order (e.g., R1, R2, R3, ...) for each translation. The System starts at the translation shown on the top line of the screen, then does the second line, and so on to the bottom in the table. The CAD Conversion Designator Template allows specification of prefix and/or suffixes to component reference designators. Prefix or suffix specifiers are either the !, ? or * characters.
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An exclamation present in a specifier represents any single character. An asterisk represents zero or more characters. A question mark represents zero or one characters. Prefix specifiers precede the reference designator in the Reference Designator column. Suffix specifiers are located in the Designator Suffix column. E.g., to convert components such as R123-a and R123a an asterisk as the suffix character to the R reference designator could be used. E.g., to convert only capacitors with two character prefixes such as 3aC10 and 2bC11, a prefix string consisting of two exclamations could be used with the C reference designator. The default Reference Designator Template has no prefixes or suffixes for component types. The order of fields designating a component in net list data is the same as the template column order i.e. prefix, designator, range, suffix. The Enter/Edit Reference Designator Template screen shown in Figure 8-4 is available with selection of [F5] of the CAD Conversion Selections screen. In this screen, you can use the arrow keys to move to any position, then type in a new entry. You can use the designator range to limit the generation to a few components on the assembly that you are testing. You can use the top to bottom order to generate the spec file so that it will work the best. For example, you will probably want to have the switches and pots set properly before doing a continuity test or testing parallel paths. The information in this table is saved in the station configuration data so that it can be tailored to meet the your specific needs and CAD standards, then saved for future use.
Selective Spec Data Generation

The Selective Spec Data Generation screen, shown in Figure 8-5, can be used to generate a spec file from CAD data, but with the ability to selectively choose the individual steps of this process. Selective spec data generation can be used if you would like to skip some parts of the process, or if you would like to use some of these facilities for programs that you have written manually (for example, consolidating parallel test steps or automatically assigning test limits). The detailed descriptions for each of the steps of this process also apply to the fully automatic generation of the spec file when selected from the CAD Conversion Selections screen. If you press the selections in sequence from top to bottom, you will have completely performed the "[F3] Generate spec data from CAD files" selection of the CAD Conversion Selections screen.
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Note Not all of the steps may work without first selecting others. For example, you cannot generate test steps unless you have first performed test point assignment.
Figure 8-5 - Selective Spec Data Generation Menu
Each of the selections of the Selective Spec Data Generation menu (Figure 8-5) are described below:
[F1]
reads the net list, assigning net names for those net names that are not already listed as a pin names. When assigning new pin numbers, the System first looks for each network as either a network name (e.g., "+EXCIT") or a node name (e.g., "R21-2"). generates a test step for each component found both in the reference designator template and the CAD net list. assigns nominal values based on the information found in the materials or component list. If this list is not found, this selection does nothing. generates an Exception Report showing the status of the generation process. This report is described in more detail in the [F6] description of the CAD
[F2] [F3] [F4]
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Conversion Selections menu. Note that EXCEPT.DAT must be enabled in the CAD Conversion Selections menu for this selection to be active. The section of the Exception Report describing parallel components is generated when [F5] below is selected.
[F5]
finds parallel components and merges them (e.g., if C1 and C7 are connected to the same test points, the System sums their values and puts them together into one test step). The test title of the consolodated test step lists the name of both components separated by a vertical line. If more parallel component names are consolidated than will fit in the test title on one line, the System stops adding the new component names into the title, but instead adds one or more periods (e.g., "...") indicating that more components than those listed are tested in parallel by that step. If nominal values are assigned when this step is executed, the System adds capacitance values, leaves diode values the same, and computes parallel resistance values. assigns preliminary upper and lower test limits for each component that has a nominal value listed. The component test limits assigned are based on the default assignments that you can set from the Enter/Edit Spec Data screen. allows you to rename the generated pin names. As a default, this is disabled and the System uses the network names as taken from the CAD data. If this option is enabled (see [Shift][F7]), the System can reassign all or selected network names to be more meaningful.
[F6]
[F7]
[Shift][F7] allows you to enable and tailor the rename of pin names as assigned from the CAD data. When [Shift][F7] is selected, you obtain the Assign Network Rename Parameters screen. [F1] and [F2] allow you to specify which test points are renamed. Pressing [F1] toggles between "None" (the default), "All", or "Selected". If "Selected" is chosen, the System only renames pin names that begin with a specified prefix. This is handy for only renaming networks that are automatically named by the CAD system and have no specific meaning to test engineers. If "Selected" is chosen, [F2] dictates the name prefix to replace. [F2] can be "Default" or something that you enter. "Default" (which can be assigned by entering a carriage return) chooses different prefixes based on the type of CAD data. For example, for OrCAD, it chooses "N" since OrCAD systems name unspecified networks as "N00001", "N00002", and so on. [F3] allows you to specify what the test point is renamed as. Pressing [F3] toggles between "First Component" and "Prioritized Names". If "First Component" is selected, the System chooses the first component listed on each network as the new network name. If "Prioritized Names" are chosen, the System uses a priority to choose the most meaningful new name. It looks through all components on the network and first for a test point (TP), then for a connector (J and P), then for an IC (U), and finally, if it cant find any of these, it uses the first component of the net list.
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[ESC] exits to the CAD Conversion Selections menu.
Notes on P-Cad Data Conversion

The P-Cad conversion format expects two ASCII files - the netlist with a .WRL extension, and a materials list with a .MAT extension. If you use the "Rename Networks" feature of the System, the default selected rename prefix for P-Cad translation is "UN". The expected netlist format is shown below in Figure 8-6. Figure 8-6 - P-Cad Net List Format The expected materials list format is shown below. Note that this file is only used to determine the nominal values of the components in the spec file and the consequent upper and lower test limits. If you do not have this file, the System will issue a warning but will continue with spec file generation after you have pressed a key.
Since there is not a standard P-Cad format for assigning component values, the .MAT file will not be of use to you during file generation unless you have used the following convention. For each item in the materials list, generate a description field with the component value: DEVICE=<value>
CheckSum Model TR-4/6 Manual Page 8-12
Value should be the value of the component followed by a space, end of line, underscore (_), F for capacitance value, or Z for resistance value. The field may contain modifiers such as K for kilo or u for micro. In the case of capacitors, an "M" is converted to a "u" for micro.
Figure 8-7 - P-Cad Materials L ist Format
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Notes on Mentor Data Conversion

The Mentor conversion format expects two ASCII files - the netlist with a .NET extension, and a component (materials) list with a .CMP extension. If you use the "Rename Networks" feature of the System, the default selected rename prefix for Mentor translation is "N". The expected netlist format is shown below in Figure 8-8. Figure 8-8 - Mentor Net List Format
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The expected component list format is shown below in Figure 8-9. Note that this file is only used to determine the nominal values of the components in the spec file and the consequent upper and lower test limits. If you do not have this file, the System will issue a warning but will continue with spec file generation after you have pressed a key. The .CMP file expects the component values to be listed just past the PART annotation in the value field. The component format should be the value of the component followed by a space, end of line, underscore (_), F for capacitance value, or Z for resistance value. The field may contain modifiers such as K for kilo or u for micro. In the case of capacitors, an "M" is converted to a "u" for micro.
Figure 8-9 - Mentor Component L ist Format
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Notes on OrCAD Data Conversion

The OrCAD conversion format expects two ASCII files - the netlist with a .NET extension, and a cross reference list with a .CRF extension. If you use the "Rename Networks" feature of the System, the default selected rename prefix for OrCAD translation is "N". To generate the netlist, output the data in Mentor format. For example: NETLIST <schematic name> <output file name> /F /S Mentor The expected netlist format is described in the Mentor files section of this chapter and shown in Figure 8-8. The component values are taken from the cross reference file generated by the OrCAD system. The System expects this file to be available with a .CRF file extension. An example of this file format is shown in Figure 8-10. Figure 8-10 - OrCAD Cross Reference File Format
This cross reference file can be generated (for example) by: CROSSREF <schematic name> <output file> /F /S /P
CheckSum Model TR-4/6 Manual Page 8-16
The cross reference is only used to determine the nominal values of the components in the spec file and the consequent upper and lower test limits. If you do not have this file, the System will issue a warning but will continue with spec file generation after you have pressed a key. The component format should be the value of the component followed by a space, end of line, underscore (_), F for capacitance value, or Z for resistance value. The field may contain modifiers such as K for kilo or u for micro. In the case of capacitors, an "M" is converted to a "u" for micro.
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Notes on HP-BCF Data Conversion

The HP-BCF conversion format expects an ASCII BCF file as used with the HP-3065 and HP-3070. This single file, containing both netlist and component information, is read with a file extension of .BCF. When reading these files, the CheckSum MDA System uses its own tolerance defaults rather than those out of the .BCF files. The expected file format is shown below in Figure 8-11. Typical .BCF files have other sections (e.g., *SUMMARY), but the ones shown in the example (as well as other component types) are the only ones used during the conversion process. The "Rename Networks" feature of the System is not available with HP-BCF conversion since the connection names are only available in one form. Figure 8-11 - HP-BCF File Format
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Notes on Cadence Data Conversion

The Cadence conversion utility expects one ASCII file with an extension of .NET. The System uses this file to extract both parts value and connection information. If you use the "Rename Networks" feature of the System, the default selected rename prefix for Cadence translation is "net". The expected ASCII file format is shown below in Figure 8-12. Note that the ASCII file should have CR/LF line terminators. When transferred from the workstation, the file may contain only LF line termination. To add CRs to the file, it may be necessary to read it into an ASCII editor and write it back out again. Net list information is obtained from the .ROUTE section of the file. Component information is obtained from the .PLACED section of the file. The data will not be of use to you during file generation unless you have used the described format for assigning part values. Within this section, the translator looks for titles in the first column with an underscore. The information from the underscore to the next space is translated to a component value. The value of the component should be followed by a space, underscore (_), end of line, F for capacitance value, or Z for resistance value. The field may contain modifiers such as K for kilo or u for micro. In the case of capacitors, an "M" is converted to a "u" for micro. Figure 8-12 - Cadence Net List Format
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Notes on Racal-Redac Data Conversion

The Racal-Redac conversion format expects two ASCII files - the netlist with a .CDI extension, and a materials list with a .LST extension. If you use the "Rename Networks" feature of the System, the default selected rename prefix for Racal-Redac translation is "TREE". The expected netlist format is shown below in Figure 8-13. The data is in Racal-Redacs initial data format. The System uses the .CON section of the file to obtain the connection information. Network names are generated from the .REM data before each network. The generated network name is the two parts of the .REM description connected with a hyphen (-). Pin names as used in the wiring report are also hyphenated between the reference designator and the pin number. Figure 8-13 - Racal-Redac Net List Format
The expected materials list format is shown below. Note that this file is only used to determine the nominal values of the components in the spec file and the consequent
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upper and lower test limits. If you do not have this file, the System will issue a warning but will continue with spec file generation after you have pressed a key. The materials list expects a .LST convention. It is generated from the schematic entry package (e.g., CadStar) as a parts list output. Since there is not a standard format for assigning component values, the .LST file will not be of use to you during file generation unless you have applicable conventions in the parts description. The System expects the first part of the description (up to the first space) to be the type of component (not used for translation). The next part of the description (up to the next space) is expected to be the component value. Value should be the value of the component followed by a space, end of line, underscore (_), F for capacitance value, or Z for resistance value. The field may contain modifiers such as K for kilo or u for micro. In the case of capacitors, an "M" is converted to a "u" for micro. Figure 8-14 - Racal-Redac Materials L ist Format
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Notes on ViewLogic Data Conversion

The ViewLogic conversion utility expects one ASCII file with an extension of .FWD. The System uses this file to extract both parts value and connection information. When reading these files, the CheckSum MDA System uses its own tolerance defaults rather than those out of the .FWD file. The expected ASCII format is shown in Figure 8-15. Typical .FWD files have other sections but only the $PACKAGES and $NETS sections shown in the example are used during the conversion process. They provide parts value and connection information, respectively. Component values in the $PACKAGES section are declared on lines beginning with an apostrophe or a letter. The value is found in the fifth field in from the line beginning; fields are separated by single spaces. The part value string may or may not be enclosed in apostrophes. The value is expressed by a real number followed by an optional suffix such as K, UF, or PF. The component name list follows an optional component tolerance which takes up two fields. The component tolerance value is enclosed in apostrophes. Thus the component name list begins in either the seventh or ninth fields. The name list continues to the next line if the line ends with a space followed by a comma. The component names on the next line must be preceded by eight spaces. Individual component names are separated by spaces within the component list. The $NETS section declares component interconnections. Net names are declared starting in the first character of a line. A net name may optionally be enclosed in apostrophes. The node name list of components follows the net name declaration. A node name is composed of the reference designator followed by an optional function field (:Fxxx where xxx is an integer), followed by the pin number field (.nn where nn is the pin number). Node names are separated by spaces with the net list. The node name list can be continued to a following line by adding a comma to the last node name on a line and continuing eight spaces in on the next line.
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Figure 8-15 - ViewLogic Net List Format
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Notes on Tango Data Conversion

The Tango conversion facility expects one ASCII file with an extension of .NET. The format of the Tango file is shown in Figure 8-16. It consists of a component declaration section followed by a net declaration section. Component declarations are enclosed in square braces. Network declarations are enclosed in parentheses. Any input lines not within matched braces or parentheses are treated as comments and ignored. Component declarations have the following format: [ refdes package type value (for some components) (blank line) (blank line) ] The refdes is the reference designator consisting of up to 16 uppercase alphanumeric characters. The package is a component package name and consists of up to 16 uppercase alphanumeric characters. The type is the component type, up to 16 alphanumeric characters in length. Net declarations have the following format: ( net_name node node ... ) A net consists of an arbitrary number of nodes that are connected together. A node consists of a component reference designator followed by a delimiter and a pin designator. The delimiter may be a hyphen, comma or a space. The pin designator may be up to 16 alphanumeric characters in length. A net is contained within enclosing parentheses. Each parenthesis is the first and only character on a line. The net_name consists of up to 16 alphanumeric characters.
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Any text outside of component or net declarations is treated as comments and ignored. Net names with pin designators A through F are automatically converted to pin numbers 1 through 6.
Figure 8-16 - Tango Net List Format
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Notes on ComputerVision Data Conversion

The ComputerVision conversion facility expects an ASCII file with an extension of .NET to generate network information. An example of this file is shown in Figure 8-17.
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Figure 8-17 - ComputerVision Net List Format
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Figure 8-18 - Modified Mentor Component List Format
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Notes on Pads2000 Data Conversion

To generate test programs from schematics generated with the Pads2000 CAD system, the test System expects a net list file with the extension .NET. An example of this file is shown in figure 8-19. The component information at the beginning of this file is ignored. Component information from the Pads2000 system is extracted from the parts list file with a .LST extension. An example of this file format is shown in Figure 8-20.
Figure 8-19 - Pads2000 Net List Format
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Figure 8-20 - Pads2000 Component List Format
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Notes on Schema Data Conversion

To generate test programs from schematics generated with the Schema schematic CAD system (by Omation Inc. of Richardson TX), the Tango intermediate file format can be used. Schema for Windows supports net list generation to Tango format. To generate this format, use the net list output screen within Schema. In this screen, select Tango net list output. Once net list generation is completed, you will have a net list file on your disk with a .TNL extension (e.g., xxx.TNL). To read it into the CheckSum system, rename it to have a .NET extension (e.g., RENAME xxx.TNL xxx.NET). Then select Tango input format and read it into the System for conversion. Early versions of Schema do not support component values in the Tango net list output, so if you are using an early version, component values need to be edited into the net list (see the Tango example file earlier in this chapter for location) or manually entered after translation. Contact Omation if you have questions about revisions supporting this translation. Unnamed networks from Schema begin with $$ (e.g., $$040). Therefore, specify the $$ prefix if you would like to use the net-rename facilities of the CheckSum CAD translator.
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Notes on Scicards Data Conversion

To generate test programs from CAD data generated by Scicards the test System expects a single ASCII file with the .DOC extension. An example of this file is shown in figure 8-21. This file contains both component information in the PARTS LIST section and net informat in the NET LIST section. Both sections are used during test program generation.
Figure 8-21 - Scicards CAD Data Format
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Notes on Fabmaster Data Conversion

To generate test programs from CAD data generated by Fabmaster, the test System expects two ASCII files. In addition a third ASCII file, NAILS.ASC, is used if present. The required net list file needs to have a .NET suffix. The component file should have the same prefix but with a .MTL extension. Examples of the Fabmaster net list and material list files are shown, respectively in figures 8-22 and 8-23. The optional NAILS.ASC file specifies the order in which the net names are assigned to test points. An example excerpt from NAILS.ASC is shown in figure 8-24.
Figure 8-22 - Fabmaster Net List Format
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Figure 8-23 - Fabmaster Materials List Format
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Figure 8-24 - Fabmaster Nails File Format
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Statistical Analysis
Overview
The Statistical Analysis menu, shown in Figure 9-1, is used to obtain reports from the System that can be used to analyze productivity, to find process problems and determine which are the most significant, and to analyze testing tolerances. Appendix B shows examples of the various reports that you can generate using this capability. In order for statistical analysis to be active, the System must have had logging turned on over the reporting period. Logging is enabled in the Configure Automatic Reporting menu that is accessed from the Configure Report Data menu of the Configure/Install System menu described in the next chapter. Production Reports only require that logging of summary information be enabled. Pareto Reports require that logging of failure information be enabled. X-Bar/Sigma Control Reports require data logged for passes. Logging of more data than minimally is required for each report does not create any problems, other than the use of more disk space and the time to write the data between tests.
Figure 9-1 - Statistical Analysis Menu
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Using Statistical Process Control

SPC reporting is performed by selecting from the following options:
[F1]
is used to select which UUT to report on. The default, All, reports on all UUTs that have been tested in the selected time frame. If a specification file name is selected, only UUTs tested with that spec file are analyzed. It is necessary to select a single UUT with X-Bar/Sigma Control Reports. After selection of [F1], you are presented with the File Selection list to choose the particular UUT spec file. This display is shown in Figure 6-3 and a description of its use accompanies the figure.
[F2]/[F3] The [F2] and [F3] selections of the Statistical Analysis menu allow you to specify the time frame which the report encompasses. The default when you first enter the Statistical Analysis menu is for the entire present day. You can enter any range of dates and times to allow analysis of a single shift or analysis over a long period of time. To change a date/time, press [F2] or [F3] as appropriate. The System then allows you to sequentially type in a new day, month, year, and time of day. If you press [ENTER] to the prompt for any of these values, the System reuses the previously set value which is shown in square brackets.
[F4]
The [F4] selection of the Statistical Analysis menu allows you to specify the destination of the report that you are about to generate. After pressing [F4], you are presented with the Select Report Device screen as shown in Figure 7-17. This screen allows you to choose among various destinations. The [F5] selection of the Statistical Analysis menu allows you to print a Production Report as shown in Appendix B. The Production Report lists how many UUTs have been tested, how many passed, how many failed, the yield, and the total number of defects encountered. If you are reporting on all UUTs and more than one has been tested, the Production Report also shows the production information (total, passed, failed, yield, defects) listed by UUT type. The list includes the PCB number of any panelized test failures when PCBs are counted as separate UUTs.
[F5]
[F6]
The [F6] selection of the Statistical Analysis menu allows you to print a Pareto Failure Report as shown in Appendix B. The Pareto Failure Report is used to analyze the failures that have occurred over the testing period. This allows you to find which failures have occurred most frequently so that you can best spend your time correcting the necessary aspects of the process. Logging of failure data must be enabled during the reporting period to obtain Pareto Reports.
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The Pareto Failure Report lists the total number of defects, then each defect in descending order by frequency. The defect descriptions include the UUT type (Spec Data name), which step number has failed, what test type (e.g., CONT or RES), the test title (e.g., R203), how many failures have occurred, and the percentage of the total number of defects that have occurred over the reporting period. Note that CONTinuity tests are sorted into two general groups, Shorts and Opens. For a more explicit description of the individual continuity failures, you can access the log data directly.
[F7]
The [F7] selection of the Statistical Analysis menu allows you to print an X-Bar/Sigma Control Report as shown in Appendix B. The X-Bar/Sigma Control Report is used to identify trends of analog measurements to tell if a process (or component value) is tending to be near one of the test limits. It can also be useful when determining test tolerances to use for a UUT. The X-Bar/Sigma Control Report contains an entry for each analog test (e.g., RESistors, CAPacitors) that has been logged during the reporting period for the UUT selected. Each step is described as a bar with a pointer. The length of the bar represents the distance from the low test limit to the high test limit. Above the ends of the bar, the low limit (LL) and high limit (HL) are shown. The pointer shows the X-Bar (average) reading measured over the reporting period. Above the bar, in the center, the System lists the step number, the step type, and the X-Bar value computed. Below the bar, the System lists the Standard Deviation (Sigma) of the readings recorded during the logging period. This gives you an idea of how randomly or widely spread the individual readings are. The bar also shows an "s" for the position of each 3-Sigma limit. The 3-Sigma limit (computed by multiplying the Standard Deviation by 3 and adding/subtracting from the X-Bar reading) shows how far readings can be expected to vary based on the sample set of readings. If the number of UUTs logged is fairly large, the 3-Sigma limits show the test limits that virtually all typical UUTs would pass. The computed values for Cp and Cpk are also below the bar. The Cp value is on the lower left and the Cpk value is on the lower right. Cp is an indication of how widely spread the readings are with respect to the high and low test limits. Cp should normally be well above one. If it becomes less than one, normal deviations in the readings will cause out-of-tolerance conditions. This is an indication that the limits are too close for this measurement.
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Cpk indicates whether the average readings are getting too close to one of the test limits. Where Cp shows the range of variations with respect to the size of the tolerance window, Cpk shows if the variations are not centered in the tolerance window. If the high and low limits are symmetrical with regards to X-Bar, Cp and Cpk will be equal. Cpk becoming less than one is an indication that the average readings value are becoming so close to the high or low test limit that some good readings will start to fail. The X-Bar/Sigma Control Report can be useful for adjusting tolerance values when first programming a new UUT. You can initially set the test limits fairly widely, then test a batch or two of UUTs. From the X-Bar/Sigma Control Report you can then determine the typical measured values (X-Bar) and the typical range of readings (3-Sigma). The 3-Sigma limits can be useful guides for setting the limits. For consistent testing results, the 3-Sigma "s" on the bar chart should be closer to the X-Bar value (^) on the chart than to the high or low test limit. Note Limits set by using the 3-Sigma indication can be tighter than the accuracy of the System. Before tightening measurement tolerances from the entry defaults, ensure that you are not exceeding system specifications. Note that the X-Bar/Sigma Control Report bases its calculations on passed UUT measurements and ignores failed measurements. This is because ATE failures are typically catastrophic in nature (for example, if a component is missing or shorted) and hence would skew the outcome excessively. As a result, when you are using the X-Bar/Sigma Control Report for assigning test tolerances, you should first assign quite wide tolerances to ensure that virtually all good UUTs pass. System logging for passed data must have been enabled for the UUT during the period which the data is generated. A UUT must be selected for X-Bar/Sigma Control Reporting (All UUTs is not valid). If the spec data UUT being analyzed is not loaded into memory at the time of the report, the System will load it in for you after giving you a chance to override the loading in case you have other spec data in memory that you do not want to overwrite.
[F8]
The [F8] selection allows you to examine and edit SPC log data according to the UUT ID recorded with log results. This brings up the Examine SPC Data screen shown in Figure 9-2.
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Examine SPC Data

This screen and its submenus allow you to view summaries of test run results for a UUT identified by its UUT ID. You can also modify SPC file contents by deleting entire test runs, by deleting single test steps, by assigning a failure code to a test step or by adding failure codes to a test run. The failure codes indicate diagnostic information about the cause of run failures. Access to these menus requires password privileges both to modify SPC files and to run SPC analysis when password protection is in use.
Figure 9-2 - Examine SPC Data Screen
[F1]
allows you to specify the UUT ID used to search for the SPC database. This ID often is the UUT serial number. For data recorded without a UUT ID the string recorded in the log is < No_UUT_ID> . specifies the beginning date and time of the search. specifies the ending date and time of the search. executes a search for the UUT specified by [F1] in the interval specified by [F2] through [F3]. The search results are summarized by the total test runs, total failed runs and total failures counts. A summary for the first run, if found, is displayed in the box above the softkeys when a search completes.
[F2] [F3] [F4]
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[ ]
Up and down arrows allow you to step to the run summary of successor or predecessor runs relative to the currently displayed run. If a run is displayed its summary includes its pass/fail status, test date and time, its failure count, and run ordinal out of all the runs found in the last search. allows you to examine and modify failing test steps by bringing up the Edit Run Failures screen shown in Figure 9-3. allows you to save any changes made to the current search results.
[F5] [F9]
[ESC] allows you to leave the Examine SPC Data screen.
Edit Run Failures

This screen displays up to 10 existing failed test steps and allows you to delete or modify these steps. It shows the measured value, step number and component description for displayed steps. You can also add additional failure codes to the failed run.
Figure 9-3 - Edit Run Failures Screen
[ ]
The up and down arrows allow you to select one of any of the failed test steps displayed. For summary only recording of failed runs no failing steps are found in the SPC log.
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[F2]
allows you to replace existing failures with a failure code and to modify the 12 character component description recorded with the test step. See Figure 9-4 for the Replace Run Failures screen. allows you to add additional failures to the failed run. These failures are stored as fail codes.
[F3]
[DEL] allows you to delete a step failure or undelete a failure selected for deletion. Deletions are not final until the edit changes are saved. [ESC] allows you to return to the Examine SPC Date Summary Screen.
Replace Run Failures

This screen allows you to replace existing failure steps with a failure code and to modify the step title field which describes the step. A failure code is selected by pressing one of the [F1] through [F7] softkeys. You can press the [F8] key to clear the step entry from being replaced by a failure code. A step component description is modified when the edit results are saved only if the step is also replaced with a fail code. Figure 9-4 - Replace Run Failures Screen
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[F1] [F2] [F3] [F4] [F5] [F6] [F7] [F8] [DEL]
assigns a "Missing" failure code to the test step. assigns a "Wrong" failure code to the test step. assigns a "Backwards" failure code to the test step assigns a "Short" failure code to the test step assigns an "Open" failure code to the test step assigns a "Faulty" failure code to the test step. assigns an "Other" failure code to the test step. cleans the current step from being replaced by a failure code. toggles the step deletion status as in the Edit Run Failures Screen
Add Run Failures

This screen allows you to add additional SPC data log. This screen has the same [F1] through [F8] and [ESC] choices as the Replace Run Failures screen.
Reporting on Panelized PCBs

Panelization adds additional information to the test results log file. The Panel number and method of counting PCBs for statistical analysis are recorded in the summary header of the test log for each test execution. Test Steps in a PCB 0 block are not recorded in the test log for panelized tests and thus arent available in X-Bar/Sigma Control Reporting. Individual PCBs on a panel may either be counted as replicates of a single UUT, as parts of one-panel UUT, or each as a separate unique UUT. Test steps with the same test title and test limits on a panelized board with PCBs counted as replicates are grouped together for X-Bar/Sigma analysis. The PCBs-per-panel information and counting method are included in the summary record of panelized tests. If all panels analyzed have the same number of PCBs per panel or the same method for counting results from each PCB, then the corresponding value is displayed in the report header. For Pareto reports, the PCB number is included in the description if the PCBs are not counted as replicates of one UUT and summary record information is in the results log. When PCBs are counted as replicates on a panel then neither the step number of PCB number of the test are displayed. Failing steps with the same test title are lumped
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together for error counting if they are not part of a panelized test counting PCBs separately or if they are in the same PCB block number.
Page 9-9
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Configuring the System

Overview
The Configure/Install System menu is used to either temporarily or permanently change the configuration of the System. This applies to characteristics such as printer configuration, report configuration, automatic reporting, hardware setup, and so on. Almost all of the attributes configured into the System can be saved on the System disk by the [F8] Save configuration data on disk selection of the Configure/Install System menu. If you use password protection, users cannot access the Configure/Install System menu without first entering the password. This provides System integrity against configuration changes.
Figure 10-1 - Configure/Install System Menu
[F1]
is the Model TR-4 module configuration option used to specify the hardware configuration of Model TR-4, TR-4-1D and MPX-3 Modules. With its use, you can specify how many modules you have, their base address jumpering, and their connection to the fixture system. With this screen you also run self-test on the TR-4, TR-4-1D and MPX-3 modules to ensure that
Page 10-1
they are operating properly and to calibrate them. The Model TR-4 Module Configuration screen is shown in Figure 10-2.
[F2]
is the Model TR-6 module configuration option used to specify the hardware configuration of Model TR-6 and TR-6-1 Modules. With its use, you can specify how many modules you have, their base address jumpering, and their connection to the fixture system. With this screen you also run self-test on the TR-6 and TR-6-1 modules to ensure that they are operating properly and to determine new internal calibration constants. With the Model TR-6 System Module, you can also select an external calibration. This process involves bringing calibrated standards to the System and using them to confirm proper operation and update the calibration constants for the TR-6 to provide the best accuracy. The Model TR-6 Module Configuration screen is shown in Figure 10-3. is the Other hardware configuration option used to specify the hardware configuration of Model G-80 Digital I/O, Model RM-1 Relay, and Model GPIB IEEE-488 Interface Modules. In addition, you can specify the configuration of the fixture system, turn the beeper on and off, set printer defaults, and specify a footswitch in the System configuration. The Other Hardware Configuration screen is shown in Figure 10-5. is used to assign passwords for system users and to define what functions are accessible to each password. The default system configuration has no passwords and no access restrictions. By adding passwords to the Password Access list unauthorized users are prevented from using system functions not intended for their use. When there is a least a single password in the Password Access list and the blank password, if present, doesnt allow access to the protected function, then the operator must enter a password before use of a protected function is allowed. When access to a protected function is attempted and a password with that privilege was not the last one entered then the user is automatically prompted to enter a password. Once a valid password has been entered its privileges are active until a new valid password is entered. See the Password Access menu (Figure 10-7) for more information on access privileges and modifying the password list. The System prompts you to enter a new password in order to change access privileges; terminate each entry with the [Enter] key. This option is typically used to change to a new password with fewer privileges than the current password. You can enter a blank password to remove the privileges of the previously entered password. The password can be up to twelve characters long and can contain any normal keyboard characters. The System does not discriminate between upper- and lower-case characters in the password. is used to set the path for the spec data files that are saved and retrieved. If you do not specify anything here, the files are stored in the same directory and media as the CheckSoft Software. If you use this feature, make sure that you include a "\ " or ":" at the end. Examples of proper data paths are "\CHECKSUM\DATA\", "B:", and "A:\DATA\".
[F3]
[F4]
[F5]
[F6]
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[F7]
is used to configure the testing environment, such as reporting, for the System. When you select [F7], you are presented with the Configure Test Environment menu shown in Figure 10-8. The choices made in the Configure Test Environment menu can be saved on the disk by use of [F8] from the Configure/Install System menu (Figure 10-1). is used to save your configuration selections to the disk drive. When you save the configuration, each time you restart CheckSoft Software you will not need to reconfigure your System. The configuration file is transparent to you. It is named "$TR4$.DAT" and is stored in the same directory as the CheckSoft Software. Selection of [F8] saves the test modes (halt on fail/single step), the report configuration, automatic reporting configuration, the I/O module configuration, the active ports, the measurement characteristics, the printout configuration parameters, the passwords, the default CAD format, and the System calibration constants. With a command line parameter, you can also specify an alternate path for the configuration file. This is useful in networking environments so that test systems on the network can share the same MDA executable file but have their own unique calibration and configuration data.
[F8]
[ESC] causes a return to the System menu.
Model TR-4 Module Configuration

The Model TR-4 Hardware Configuration screen shown in Figure 10-2 is used to configure the software to match the CheckSum MDA test hardware installed in your System, to allow specification of fixture connections, and to invoke self-test on the modules. To alter the base address configuration, use the up and down arrow keys to move the bracketed area to the desired module position. Once you are at the position that you desire, type in the new desired base address value followed by an [Enter] or an arrow key. Pressing [ESC] returns to the Configure/Install System menu. Pressing [INS] (Insert key) inserts an additional MPX module into the screen with default jumper settings. Pressing [DEL] deletes the MPX module with the highest test point numbers. Once the base address is entered (in decimal), the System determines where jumpers should be placed to set that base address, and displays the jumper positions and the top address used by that Module. You should ensure that the displayed address range does not overlap among any of the Modules. If you enter a base address that can not be achieved by setting jumpers (for example, an odd number), the system will choose the nearest achievable address and display it to you. Pressing [F4] allows you to toggle between display of the module Base Address and its jumpers or the Board Select jumpers. Board Select jumpers are only used on the MPX-3 modules. If you have more MPX (MPX-3 / TR-4-1D) Modules installed than shown on the display, use the [Ins] key to increment the number of modules. Pressing [F3] allows you to toggle between the TR-4-1D and MPX-3 type of MPX module for the next inserted module. The [Del] key can be used to delete the MPX module with the highest test point numbers.
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With the [PgUp]/[PgDn] keys, you can change the connection of the module to the fixture. The System defaults to a standard connection, although you should first ensure that the correct fixture type is selected via the Other hardware configuration/Accessories & fixture screen. This fixture information is used when generating wiring reports for the UUT.
Figure 10-2 - Model TR-4 Module Configuration Screen Self-Test Selecting [F1] of the TR-4 Hardware Configuration menu, self-test module, provides two basic functions. First, it optimizes the speed and accuracy of your Test System by performing a self-calibration of the System Module installed in your System. It functionally tests each I/O test point to verify correct functioning of the MPX Modules, then measures and stores the zero offsets for each MPX test point path to compensate for resistance internal to the MPX Module and in the cabling from the System. If external confirmation of Model TR-4 operation is necessary in your installation, you can order the optional Model CM-3 Calibration Module as an external reference to provide traceability.
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You should select the System Module first, then do each MPX Module. The order is important (especially the first time when you install the System) since the System Module is used to self-test and characterize the MPX modules. After installation, to ensure proper operation, you should run self-test/calibration on every Module in your System. Thereafter, you should run self-test twice a year or if you suspect any problems with the Systems operation. Once self-test has started, follow the prompts until it is completed. It will report any errors that it finds. Once you have completed the System Module Self-Test, self-test each of the MPX Modules in the System. After selection of MPX Self-test, the System first performs a test of each of the test points for functionality, then it performs a zero-offset calibration. As part of the zero-offset calibration, the System asks you to short each group of 50 pins on the MPX Module. To do so, install the shorting fixture (included with the Model TR-4 System Module) on the end of each ribbon cable coming from the MPX Modules. When requested to short the next 50 pins, remove the shorting fixture (by use of the ejection levers) and move it to the next cable. Note When facing the back of the computer, pins 1-50 are the rightmost cable coming from each MPX Module, pins 51-100 are the next cable to the left, and so on. Note Ensure that no test assemblies are connected during the self-test. Otherwise, you may get incorrect test results. In the event that a failure occurs, you are presented with an error message describing the nature of the failure. When the test is complete, it is important that you save the System configuration data on the disk with use of the [F8] option of the Configure/Install System menu. When you save the configuration data, it saves the newly determined calibration constants on the disk drive so that they will not be lost when you power down the computer or complete your use of the CheckSoft Software. If you see massive self-test failures, it is likely to be an installation or compatibility problem. If you see one (or a few) repeatable failures, you can suspect a Model TR-4 hardware failure. In this case return the Model TR-4 to CheckSum for checkout or call CheckSum for help.
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Probe Configuration Selecting [F2] Probe Setup from the TR-4 Hardware Configuration screen allows you to tailor operation of the system probe. The probe is connected to ground on the PC chassis and is used to locate test points. Once you have selected [F2], you are presented with the Configure Probe menu with three options:
[F1]
allows you to enter the resistance threshold used by the probe. The default is 100 ohms. You can specify a lower threshold if desired to allow individual probing of points that may be connected together with resistances of less than 100 ohms. allows you to specify whether the System scans all MDA test points (1-1600), or just active points when probing. allows you to calibrate the probe on your System. By calibrating the probe, you can effectively probe with lower thresholds. To calibrate the probe, you touch the probe to another test point allowing the System to measure the probe resistance. Note that you should calibrate the System prior to calibrating the probe. The probe calibration data is stored with the station configuration data.
[F2] [F3]
Model TR-6 Module Configuration

The Model TR-6 Hardware Configuration screen shown in Figure 10-3 is used to configure the software to match the CheckSum Functional Test hardware installed in your System, to allow specification of fixture connections, and to invoke self-test on the modules. In addition it provides for an external calibration of the Model TR-6 System Module. To alter the base address configuration, use the up and down arrow keys to move the bracketed area to the desired module position. Once you are at the position that you desire, type in the new desired base address value followed by an [Enter] or an arrow key. Pressing [ESC] returns to the Configure/Install System menu. Pressing [INS] inserts an additional relay MPX module into the screen with default jumper settings. Pressing [DEL] deletes the relay MPX module with the highest test point numbers. Once the base address is entered (in decimal), the System determines where jumpers should be placed to set that base address, and displays the jumper positions and the top address used by that Module. You should ensure that the displayed address range does not overlap among any of the Modules. If you enter a base address that can not be achieved by setting jumpers (for example, an odd number), the system will choose the nearest achievable address and display it to you. If you have more relay MPX Modules installed than shown on the display, use the [Ins] key to increment the number of modules. The [Del] key can be used to delete one of the modules from the list.
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With the [PgUp]/[PgDn] keys, you can change the connection of the module to the fixture. The System defaults to a standard connection, although you should first ensure that the correct fixture type is selected via the Other hardware configuration/Accessories & fixture screen. This fixture information is used when generating UUT wiring reports.
Figure 10-3 - Model TR-6 Module Configuration Screen TR-6 System Self-Test Selecting [F1] of the TR-6 Hardware Configuration menu, self-test module, provides two basic functions. First, it optimizes the speed and accuracy of your Test System by performing a self-calibration of the TR-6 System Module installed in your System and functionally tests each I/O test point to verify correct functioning of the MPX Modules. You should select the TR-6 System Module first, then do each relay MPX Module. The order is important (especially the first time when you install the System) since the System Module is used to self-test and characterize the MPX modules. After installation, to ensure proper operation, you should run self-test/calibration on every Module in your System. Thereafter, you should run self-test twice a year or if you suspect any problems with the Systems operation. Once self-test has started, follow the prompts until it is completed. It will report any errors that it finds. NOTE Ensure that no test assemblies are connected during the self-test. Otherwise, you may get incorrect test results.
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In the event that a failure occurs, you are presented with an error message describing the nature of the failure. When the test is complete, it is important that you save the System configuration data on the disk with use of the [F8] option of the Configure/Install System menu. When you save the configuration data, it saves the newly determined calibration constants on the disk drive so that they will not be lost when you power down the computer or complete your use of the CheckSoft Software. If you see massive self-test failures, it is likely to be an installation or compatibility problem. If you see one (or a few) repeatable failures, you can suspect a Model TR-6 hardware failure. In this case return the Model TR-6 to CheckSum for checkout or call CheckSum for help. TR-6 System External Calibration Selecting [F2] of the Model TR-6 Hardware Configuration menu while the TR-6 System Module is selected invokes an external calibration of the Model TR-6 System Module. This external calibration should be run twice a year to ensure full accuracy. The external calibration determines calibration offsets and gains to external standards. The external standards are an AC/DC source (e.g., Fluke 5100) and a DMM with current measuring capability (e.g., Fluke 8840). The standards (which include those mentioned) should be at least 4 times the accuracy of the Model TR-6 for the necessary functions. Stimulus points necessary include DCV at .19V, .57V, 1.9V, 5.7V, and 19V, ACV of 5.7V @ 100Hz, and 19V @ 100 Hz and 10 KHz. Measurement capability of 100mA is also necessary. The TR-6 Calibration display, shown in Figure 10-4, is used for the calibration. It displays the calibration constants that are currently saved. You can manually move to a position and change each number, but you should not do so unless you are restoring values determined earlier for the same hardware. Pressing [F1] invokes the calibration sequence. The System will guide you through the process, in the correct order to determine the new values. Each time an action is required (e.g., provide a stimulus), the System prompts you accordingly. When the calibration test is complete, it is important that you save the System configuration data on the disk with use of the [F8] option of the Configure/Install System menu. When you save the configuration data, it saves the newly determined calibration constants on the disk drive so that they will not be lost when you power down the computer or complete your use of the CheckSoft Software.
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Figure 10-4 - TR-6 Calibration Screen
Other Hardware Configuration

The Other Hardware Configuration screen shown in Figure 10-5 is used to configure the software to match the CheckSum Model G-80 Digital IO Module, Model RM-1 Relay Module, Model GPIB IEEE-488 Module, the system printer, footswitch, beeper, and fixture type. It can also be used to invoke self-test of the Model G-80 Module. To alter the base address configuration, use the up and down arrow keys to move the bracketed area to the desired module position. Once you are at the position that you desire, type in the new desired base address value followed by an [Enter] or an arrow key. Pressing [ESC] returns to the Configure/Install System menu. Pressing [INS] inserts a default base address for the selected module. Pressing [DEL] deletes the selected module from the configuration. Once the base address is entered (in decimal), the System determines where jumpers should be placed to set that base address, and displays the jumper positions and the top address used by that Module. You should ensure that the displayed address range does not overlap among any of the Modules. If you enter a base address that can not be achieved by setting jumpers (for example, an odd number), the system will choose the nearest achievable address and display it to you. With the [PgUp]/[PgDn] keys, you can change the connection of the module to the fixture. The System defaults to a standard connection, although you should first ensure that the correct fixture type is selected via the Accessories & fixture selection from this
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screen. This fixture information is not presently used for these modules, but may be used in the future for generate wiring reports for the UUT.
Figure 10-5 - Other Hardware Configuration Screen Selecting [F1] of the Other Hardware Configuration menu, self-test module, provides a self-test function if the Model G-80 is selected at the time it is pressed. Model G-80 self-test checks each bit of the Model G-80 as an input and output, both high and low for proper operation. Once self-test has started, follow the prompts until it is completed. It will report any errors that it finds. Note Ensure that no test assemblies are connected during the self-test. Otherwise, you may get incorrect test results. If you see massive self-test failures, it is likely to be an installation or compatibility problem. If you see one (or a few) repeatable failures, you can suspect a Model TR-4 hardware failure. In this case return the Model TR-4 to CheckSum for checkout or call CheckSum for help.
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Configure Accessories & Fixture Selecting [F2] of the Other Hardware Configuration menu, Accessories & Fixture, provides the ability to configure the system fixture, footswitch, printer and beeper. The Configure Accessories & Fixture menu is shown in Figure 10-6.
Figure 10-6 - Configure Accessories & Fixture Screen
[F1]
selects the configuration of the System footswitch. The foot switch, available from CheckSum, connects to an unused printer port on your PC. When the foot switch is activated, it performs the same function as the [F1] key on the keyboard. [F1] toggles between none and the various printer ports (LPT1, LPT2,...) on the PC. Toggle through the various options until the display shows the printer port to which you have connected the foot switch. is used to turn the System beeper on and off. The beeper is used to let you know when an error occurs, a test is completed, or you have probed a point. [F2] toggles the beeper either on or off for all uses of the beeper in the System. configures page breaks while printing reports to a printer (PRN, COM, or LPT) port. Pressing [F3] toggles between None, Before, After and Before/After. In the default mode, After, the System prints a form feed after each report to set the printer for the next report to be on a new sheet of paper. configures the System to add blank lines to the end of reports. With this option you can enter the number of blank lines added to the end of the report. This capability is useful if you are using a strip printer that does not
[F2]
[F3]
[F4]
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accept form feeds, but needs some space after the printout to advance the paper so that it can be removed.
[F5]
is used to set the width of the test and batch reports. Normally it is set to 80 columns, but it can be set to 40 columns if you are using a narrow format strip printer with the Test System. Regardless of this setting, spec data reports are 80 columns wide. allows you to specify what type of fixturing that you are using with your System. This information is used when the System is generating wiring and CAD connection reports so that the interface connection is properly called out. The selections include Model TR-3 Standard wiring, Model TR-3 GR-Style Wiring (a no-cost factory option that specifies wiring on the Model TR-3 from the right to the left so that test heads built for the GenRad can be used with minimal impact), Model TR-5 or Model TR-7 Fixture, and none in which case the System does not print the interface wiring at all. If you have a custom-wired fixture interface with 50-pin ribbon-cable receptacles, the Model TR-5 selection is probably appropriate to list the proper interface wiring.
[F6]
[ESC] returns to the Other Hardware Configuration screen.
Assigning Passwords and Password Privileges

[F5] of the Configure/Install System menu is used to set up a list of user passwords and access privileges for each password. When you select [F5], you are presented with the Password Access menu. The choices made in the Password Access menu can be saved in the system configuration file by use of [F8] from the Configure/Install System menu shown in Figure 10-1. The Password Access Menu holds up to twelve user passwords. A password consists of up to twelve printable characters. To modify a previously entered password move the cursor to the password then backspace or type in more characters as desired, then press Enter. Each password has privileges that are assigned to it once the password has been added to the list. Privileges are added and removed from a password by use of the function keys. The [F1] key allows you to modify privileges one at a time while the other function keys set all privileges to defaults typical of different types of System users. Following each password is a series of check marks indicating which sofkey access privileges it has. The check marks are located in columns labeled according to privilege. By assigning privileges to the first blank password in the list you define the minimum set of privileges that can be accessed without a password. A blank password with privileges may only go at the bottom of the privilege list. A table of access privileges is shown on the display right side. The Load Spec (LS) privilege allows the user to read in another spec file. The Modify Spec (MS) privilege allows editing and saving a spec file. The Change Config (CC) privilege enables the user to change the System configuration. The Save Config (SC) privilege allows the user to
Page 10-12
update the System configuration file. The Self Test (ST) privilege allows the user to use the module self-test functions. The SPC Analysis (SA) privilege allows the user to generate SPC reports. If the system has no passwords allowing the Change Config (CC) privilege, then any user is still allowed access to the Password Access menu. If you want to exclude some passwords from Change Config privileges, you must have at least one password with this privilege.
Figure 10-7 - Password Access Menu
[F1]
is a toggle key used to enable or disable password privileges. To change a privilege place the cursor on the privilege to be modified by using the arrow keys then press [F1].
[Ins/Del] are used to add or remove passwords from the list. To add a password press Insert then enter the password name followed by the Enter key. To delete a password use the up and down arrows to place the cursor on the line of the password to be deleted then press the Delete key. [ESC] is used to leave the Password Access menu. [F3] is used to enable all privileges for a selected password.
Page 10-13
[F4]
is used to assign privileges commonly used by a spec program writer to the selected password. This includes loading, running and saving spec files as well as running SPC reports. is used to set privileges to those commonly used for periodic System calibration to the selected password. This includes running board self tests and saving the System configuration to disk. is used to assign privileges commonly used for System administration to the selected password. This includes changing and saving the System configuration and running board self tests. is used to assign privileges commonly used for periodic System self test to the selected password. This allows the operator to run tests on the system but not modify its configuration. is used to assign privileges commonly used by production technicians to the selected password. This allows the operator to load and run spec files.
[F5]
[F6]
[F7]
[F8]
Configure Test Environment

[F7] of the Configure/Install System menu is used to configure the reports generated by the System. When you select [F7], you are presented with the Configure Test Environment menu. The choices made in the Configure Test Environment menu can be saved on the disk by use of [F8] from the Configure/Install System menu shown in Figure 10-1.
Figure 10-8 - Configure Test Environment Menu
Page 10-14
[F1]
is used to enter the name of your company or organization. This name (up to 32 characters) appears on all of the reports generated by the System. If nothing is entered, the line does not appear on the reports. is used to configure automatic reporting for SPC or normal test results. This function allows you to configure the System to generate statistical data or automatic test reports after testing each UUT. See the Configure SPC Logging & Automatic Reporting menu (Figure 10-9) for details of this process. is used to configure the test reports generated by the System. This option allows you to configure the contents of the report and set the maximum failures before aborting. This option applies to full test reports and failure reports for a UUT, but not to spec data or batch reports. See the Configure Test Report menu (Figure 10-10) for details of this process. is used to configure the spec data reports generated by the System. This option allows you to configure the contents of the spec data report. With this option, you can turn on and off full reporting of CONTinuity data, ICs data, and FixCheck data. With these item turned off, the test reports are much shorter and faster to print. This selection also allows you to enter a special line that is included in the spec data. This special line is just like that which can be included with the Test Report and the Batch Report. For details of how the special line is specified, see the description for [F7] below. is used to select whether the System asks the operator to type in an identification of the unit being tested (UUT) prior to printing a test report. For example, you may want to have the operator enter the serial number of the unit being tested. If this feature is utilized, and the operator types in the UUT identification, a line on the report appears titled UUT ID: followed by the operator entry. This feature is used only on reports explicitly requested by the operator, not reports that are automatically generated by the System as configured in the Configure Automatic Reporting menu. is used to select whether the System asks the operator to type in the name of a batch prior to printing the batch report. If this feature is utilized, and the operator types in the batch identification, a line on the report appears titled Batch ID: followed by the operator entry. In addition, if this feature is activated, and a batch report is not requested at the end of testing a batch, the System verifies that this is the operators intent, since the data about the batch could be accidentally lost. is used to place a special line of text in the Batch report. You may enter a line of up to 32 characters. If nothing is entered, None is displayed and the reports do not contain this special line. If something is entered, it is placed in the header of the report, left-justified. If the line contains a colon, the information before the colon (including the colon) is placed in the left column, and the information after the colon is placed in the second column aligned with the other header items.
[F2]
[F3]
[F4]
[F5]
[F6]
[F7]
Page 10-15
Special lines of text can be used for any special information that you would like included in the reports. For example, if you would like to have the operator initial each batch test report, you would select [F7], then type in Operator Initials:__________. The outcome of this entry is shown in the example batch report in the Appendix of this manual.
[F8]
is used to toggle the System between English-language text and Spanish. If you select Spanish, the System uses Spanish for the text in the System Menu and most of the screens used by test operators (the functions under the [F1] Test an Assembly selection in the System Menu). is used to change the batch/statistical reporting selections available to the operator at the end of each test. If No is selected, the operator can use the [F5] key at the end of each test to obtain a batch report as shown in Appendix B-3. If Yes is selected, the operator can use the [F5] key at the end of each test to obtain the Statistical Analysis Menu as discussed in Chapter 9 of this manual. If Yes is selected, the operator can use short-cut keys to directly obtain reports: [Alt][F5] generates a production report, [Cntl][F5] generates a Pareto report, and [Shift][F5] generates a standard batch report.
[F9]
[ESC] returns to the Configure/Install System menu.
Configure SPC Logging & Automatic Reporting
Figure 10-9 - Configure SPC L ogging & Automatic Reporting Menu
Page 10-16
The System provides the capability to automatically log data during testing without operator intervention. The Configure SPC L ogging & Automatic Reporting menu, shown in Figure 10-9, is used for this purpose.
[F1]
turns automatic test reporting on and off. As you press [F1], the System toggles between disabled (no automatic test reports), Failed Assemblies (only report on UUTs that have one or more failures), and All Assemblies (report on all UUTs, passed or failed). If this capability is enabled, the System will automatically generate a test report for specified UUTs. This report occurs just after the test is completed, but before the operator sees the Test Completed screen. configures the destination of automatic test reports. Pressing [F2] toggles between LPT1:, LPT2:, COM1:, COM2:, CON (the CRT), a user named disk file, and none. If the data is sent to the user named file, the file is generated with the first test, then appended for each additional test. You may manipulate this file using DOS commands and/or text editors. is used to specify what type of report is automatically generated after each test. When you press [F3], the System toggles between all test results and failure data only. is used to specify a data path for storage of test report data. Use of this selection allows you to store the reports data in a separate directory from other information on your System disk. The specified path is automatically appended to the output file name and should end in a backslash (\). is used to specify whether to log statistics data to the disk. Statistics data can be used with the Systems SPC reporting features or to generate data for your own analysis. As you press [F5], the System toggles between disabled, summary, summary+ passes, summary+ fails and summary+ passes+ fails. If in any of the later cases the resultant statistics are stored on the System disk. In the case of passed or failed logged data, the outcomes of analog tests (e.g., RES, CAP,...) are logged. Since the amount of data being generated can get large, it is recommended that passed data only be logged if you are planning to obtain an X-Bar/Sigma Control Report or are testing a relatively small number of UUTs. The results are stored in a format that can be read and processed by a spreadsheet such as Lotus 1-2-3. The data is ready to be read in as numeric data for failure analysis. For example, in Lotus, the sequence /fin can be used to import the data. Since the data is stored in ASCII, you can also edit it with most standard editors and word processors. A new file is created each calendar day. The name of the file is yymmdd.DAT where yy is the year, mm is the month, and dd is the day of the month. For example, on January 15, 1991, the file would be named 910115.DAT.
[F2]
[F3]
[F4]
[F5]
Page 10-17
Each entry contains the following information: 1. 2. The spec file name. The time of day that the test was completed. Military time is used. For example, if the test was completed at 1:10 P.M., the entry might be "13:10:46.". All entries for a single test have the same time logged. The number of failures. If this number is zero, the test passed. The step number (as listed in the Enter/Edit Spec Data screen). If the step number is zero, this is a summary record only and only describes a test as passed or failed. The test has failed if item 3 is not zero. Test execution time in seconds. UUT ID string enclosed in double parenthesis. Spec file revision number PCB counting method, enclosed in double parenthesis if program uses panelization, "" otherwise. Name of main program if this is a subprogram called via RunT, "" otherwise.
3. 4.
5. 6. 7. 8. 9.
10. Batch string enclosed in double parenthesis. 11. Operator name enclosed in double parenthesis. (Operator name is set using MEMS 26.) The following fields will only be present if the record is used to report a passed or failed test step result as enabled by the [F5] selection of this menu. If this is the case, the test step number will also be non-zero. 5. 6. 7. The test type (e.g., RES) The measured value (e.g., 12.45K) The test title (e.g., R101)
In the event of a CONTinuity test failure, the measured value is xx/yy where xx is the from test point and yy is the to test point. The test title is either Short or Open. 8. 9. The low test limit (e.g., 11.00K) The high test limit (e.g., 14.00K)
Page 10-18
An example statistics file is shown in Appendix B.
[F6]
is used to specify a data path for storage of statistics data. Use of this selection allows you to store the statistics logging data in a separate directory from other information on your System disk. The specified path is automatically appended to the logging file name and should end in a backslash (\). is used to enable/disable automatic batch reports. is used to identify the location where automatic batch reports are sent. Choices include the display CONsole, a disk file, LPT1, LPT2, COM1 or COM2. is used to identify the automatic batch report file location,, used if this is the destination selected in F8.
[F7] [F8]
[F9]
Configure Test Reports

The Configure Test Report menu, shown in Figure 10-10, is used to configure test reports generated by the System.
Figure 10-10 - Configure Test Report Menu
Page 10-19
[F1]
displays the Configure Header Items menu shown in Figure 10-11. This menu sets up the display of header information in test result reports. This information precedes the results of individual test steps. is used to place a special line of text in the test report. You may enter a line of up to 32 characters. If nothing is entered, None is displayed and the test reports do not contain this special line. If something is entered, it is placed in the header of the report, left-justified. If the line contains a colon, the information before the colon (including the colon) is placed in the left column, and the information after the colon is placed in the second column aligned with the other header items. Special lines of text can be used for any unique information that you would like included in the reports. For example, if you would like to have the operator initial each test report, you would select [F2], then type in Operator Initials:__________. The outcome of this entry is shown in the example batch report in the Appendix of this manual.
[F2]
[F3]
is used to set the width of the test and batch reports. Normally it is set to 80 columns if you are using a narrow format strip printer with the Test System. Regardless of this setting, spec data reports are 80 columns wide. configures the System to add blank lines to the end of reports. With this option, you can enter the number of blank lines added to the end of the report. This capability is useful if you are using a strip printer that does not accept form feeds, but needs some space after the printout to advance the paper so that it can be removed. displays the Configure Header 80 Column Format menu as shown in Figure 10-12. This menu specifies which information is displayed in full-width test result reports. specifies the maximum number of lines of test step information displayed in an 80-column test report per test program UUT. If the program is panelized, then each PCB has a separate report line count limit. Setting the limit to zero makes the number of report lines unlimited. displays the Configure Header 40 Column Format menu. With the exception of a different header, this menu has the same appearance as Figure 10-12. This menu specifies which information is displayed in 40-column test result reports. specifies the maximum number of lines of test step information displayed in a 40-column test report per test program UUT. If the program is panelized, then each PCB has a separate report line count limit. Setting the limit to zero makes the number of report lines unlimited.
[F4]
[F5]
[F6]
[F7]
[F8]
Page 10-20
Figure 10-11 - Configure Test Report Header Items
[F1] - [F10] are used to enable or disable the various header items on the report. As you press these selection keys, the selections toggle between On and Off. If turned off, the field does not appear in the test report.
80-Column Test Report Fields

The 80 Column Test Report Fields menu, shown below in Figure 10-12, is used to configure which test-step specific information is contained in test reports and the order in which it is displayed. The menu choices are the same in the 40 Column Test Report Fields menu. The order in which choices are inserted in this menu determines the left-to-right column order in which the fields are displayed. The display lists available report fields in the left-most column along with the field width in the center column. The right-most column lists the displayed order of the fields from the left to right. Fields with an index of 0 are not displayed. Toward the bottom of the display is a summary line indicating the total length of the fields currently selected for display. This length includes any single spaces used to separate fields, but doesnt include the length of prefixes used to label fields when all fields will not fit on a single line.
Page 10-21
Figure 10-12 - 80 Column Test Report Fields Menu

[F1] [F2] [INS]
is used to configure the display to the default, e.g., as shown in Figure B1. is used to clear the display of all test step information fields. is used to add the field as the next column on the test result report. The field is added only if it already is not being displayed.
[DEL] is used to delete the selected field from the test result report. [ESC] [F9] is used to leave the 80 Column Test Report Fields menu with the changes intact. is used to leave the 80 Column Test Report Fields menu and abandon any changes made to the report format since the screen was entered.
Page 10-22
Test Type Descriptions

The descriptions in this chapter review each of the test types that can be used in a spec file for a UUT. These test types are inserted with the Edit/Enter Spec Data screen described in the previous chapter. Test step types that do not apply to both MDA and Functional Test Systems are noted as such in the description. The following list shows the test step types that are available and where to find them in this chapter:
Analog Measurement Test Types

Test Step Description Measure Resistance (TR-4) Measure Capacitance (TR-4) Measure Diode Junction (TR-4) Measure Zener Diode (TR-4) Test IC Presence/Orientation (TR-4) Set ICRNG Test Limits (TR-4) Measure Inductance (TR-4) Measure DC Voltage (TR-4) Test Opens/Shorts Discharge Test Points (TR-4) Delay During Test Set Remeasurement Parameters (TR-4) Set Resistance Measure Parameters (TR-4) Adjust Potentiometer (TR-4) Install/Remove UUT Jumper (TR-4) Set UUT Switch Make Cable Connection (TR-4) Measure AC/DC/Resistance (TR-6) Measure Frequency/Time/Counts (TR-6) Set UCT Trigger Condition (TR-6) Dynamic Measurement Calibration Test Type RES CAP DIODE Z ENER ICS ICRNG INDUC VOLT CONT DISCH PAUSE RETRY RESRG POTR/POTD/POTU JMPER SWCHR/SWCHD WIRE DMM UCT UCTTR ZERO/GAIN Page 11-6 11-7 11-8 11-9 11-10 11-11 11-11 11-12 11-13 11-14 11-15 11-15 11-16 11-17 11-18 11-19 11-20 11-22 11-23 11-26 11-27
Page 11-1
Analog Source Test Types

Test Step Description Source Sine Wave (TR-6) Source Square Wave (TR-6) Source DC Voltage (TR-6) External Signal Input/Output (TR-6) Test Type SINEV SQRV DCV EXTIO Page 11-29 11-30 11-31 11-32
Digital Test Types

Test Step Description Digital Input Digital Output Digital I/O Configuration Digital Hardware Tests PC Port Input PC Port Output Test Type DIGI DIGO DIGA LOGIC PORTI PORTO Page 11-36 11-37 11-38 11-39 11-40 11-40
Transfer of Control Test Types

Test Step Description Set Jump Destination Unconditional Jump Jump based on Resistance Measurement (TR-4) Jump based on Capacitance Measurement (TR-4) Jump based on Diode Measurement (TR-4) Jump based on Inductance Measurement (TR-4) Jump based on Voltage Measurement Jump based on DMM Measurement Jump based on UCT Measurement Jump based on Digital Input Jump based on Port Input Jump based on Keystroke Reset Error Counter Jump based on Number of Errors Jump based on Zener Measurement Call a Subroutine Return from a Subroutine Load and Run a Spec File Load and Run a Spec File Sub-Program Return from a Sub-Program Test Type LABEL JMP JMPR JMPC JMPD JMPI JMPV JMPDM JMPU JMPDI JMPPI JMPK ERROR JMPE JMPZ CALL RET RUN RUNT RETT Page 11-41 11-42 11-42 11-42 11-43 11-43 11-44 11-44 11-45 11-45 11-46 11-46 11-47 11-47 11-48 11-48 11-49 11-49 11-50 11-50
Page 11-2
Message Test Types

Test Step Description Display a Short Message Display a Message Erase the Display Wait for a Keystroke Change to Different Panelized PCB Screen Test Type Test Type DISPL DISP DISPE WAITK PCB SCRN Page 11-51 11-52 11-52 11-53 11-53 11-54
User-Defined Tests
Test Step Description User-Defined Test Result Execute .EXE or .COM File Test Type EVAL EXEC Page 11-57 11-58
Memory Manipulation Test Types

Test Step Description Manipulate Integer Memory Manipulate Real Memory Manipulate String Memory Test Type MEMI MEMR MEMS Page 11-59 11-62 11-64
General Purpose Interface Bus I/O

Test Step Description IEEE-488 Control RS232 Control Test Type GPIB RS232 Page 11-68 11-72
Miscellaneous Tests
Test Step Description Apply or Remove Vacuum to Fixture Engage or Disengage Probes onto UUT Open or Close Relays Fixture Check Generate Test Report Sound PC Beeper Set Test Conditions Remark in Spec File Test Report Output Control Test Type VACUM FIXCT RELAY FIXCH RPRTS BEEP FLAGS REM RSLTS Page 11-75 11-76 11-78 11-80 11-81 11-83 11-84 11-85 11-86
Page 11-3
Analog Measurement Test Types

Test Step Range Values
The range specifies the measurement range, whether guarding is used, and so on. In most cases, the System automatically generates the range value used for each analog test step in the spec data for you. As a result, you normally dont have any reason to be concerned about the range. However, you may be interested in how the actual range value is derived or create your own range and then type it in. The table on the following page shows the specifics of the range as it applies for most of the TR-4 analog measurement test types. The System chooses the appropriate value from each section of the table and adds them all together to form the final range value. For example, the test step range for a CAPacitance test using 200 mV output stimulus at 1 KHz would be 49.
Page 11-4
Test Step Range for CAP/RES/INDUCT Parameter Value 0-11 Voltage/Current Range 0 1 0 16 32 48 0 64 128 0 256 0 512 0 1024 2048 3072 4096 0 8192 16384 24576 0 32768 Description For Current Mode measurements, see the range value in the test type description 2V output range for Voltage Mode 200 mV output range for Voltage Mode DCI DCV 100 Hz 1 KHz None Pos Neg None Active None Active 12 mA 1.2 mA 120 A 12 A 1.2 A 4.8 V .48 V 48 mV 4.8 mV Normal Swap
Frequency/Function
Bias (Voltage Mode Only) Guarding External Sense
Initial Current Meas Range (Voltage Mode Only)
Initial Voltage Meas Range (Voltage Mode Only) Swap Calculation Model (Voltage Mode Only)
Page 11-5
Resistance Test: Measures the resistance value between two test points and generates
a result (TR-4). NOTE: The ranges shown in the table below apply to the DC-Current measurement method. If the voltage measurement mode is used, see the table at the beginning of this section. The nominal ranges shown below are usable to 90% overrange (minus about 15 ohms when not externally sensed). For example, the 1 Kohm range can be used for readings up to 1.9 Kohms. Also see the RETRY and RESRG test types for further specification of how the measurements are taken.
Parameters Test Type Title Range
Description RES Description of measured component (e.g., R234) 0 = autorange 1 = 100 (.2V/1mA) 2 = 1 K (2V/1mA 3 = 10 K (2V/.1mA) 4 = 100 K (2V/10uA) 5 = 1 M (2V/1uA) 6 = 10 M (2V/.1uA) 7 = 1 K (.2V/.1mA) 8 = 10 K (.2V/10uA) 9 = 100 K (.2V/1uA) 10 = 1 M (.2V/.1uA) 17 = default (See Note Above) Negative polarity test point Positive polarity test point Low test limit in ohms High test limit in ohms
From Port To Port Low Lim High Lim
Page 11-6
Capacitance Test: Measures capacitance between two test points and generates a test
result (TR-4). The ranges shown in the table below apply to the DC-Current measurement method. If the AC voltage measurement mode is used, see the table at the beginning of this section. Also see the RETRY test type for further specification of how the measurements are taken.
Parameter Test Type Title Range
Description CAP Description of measured component (e.g., C31) 0 = autorange 1 = 5000 F (.2V/1mA) 2 = 500 F (2V/1mA) 3 = 50 F (2V/.1mA) 4 = 5 F (2V/10uA) 5 = .5 F (2V/1uA) 6 = .05 F (2V/.1uA) 8 = 500 F (.2V/.1mA) 9 = 50 F (.2V/10uA) 10 = 5 F (.2/1uA) 11 = .5 F (.2/.1uA) Negative polarity test point Positive polarity test point Low test limit in farads High test limit in farads
Page 11-7
Diode Test: Applies a constant current across the semiconductor junction, measures the
voltage drop and generates a test result (TR-4). For typical diode measurements, the From(-) test point is connected to the cathode of the diode and the To(+) test point is connected to the anode of the diode. The voltage drop of typical diodes is approximately .6 V. The measured voltage is expected to be between the low and high limits. The voltage range is 0 through 9.9 volts. Measurements taken on the 2V range can be guarded. Guarding can also be used on adjacent circuit points to apply more current across the diode being measured. Also see the RETRY test type for further specification of how the measurements are taken. Also, see the Z ENER test type for diode measurements that need additional current or higher voltages.
Description DIODE Description of measured component (e.g., D101) 1, 2 = Source 1 mA, measure up to 2V 3 = Source .1 mA, measure up to 2V 4 = Source .01 mA, measure up to 2V 5 = Source 1 uA, measure up to 2V 6 = Source .1 uA, measure up to 2V 7 = Source 1 mA, measure up to 10V 8 = Source .1 mA, measure up to 10V 9 = Source .01 mA, measure up to 10V 10 = Source 1 uA, measure up to 10V 11 = Source .1 uA, measure up to 10V Cathode (-) test point for diode Anode (+) test point for diode Low test limit (typically 0.4 V) High test limit (typically 0.9 V)
Page 11-8
Zener Diode Test: Applies approximately 10mA of DC constant-current through the

diode and measures a voltage of up to 18 VDC (Applies only to TR-4 based Systems equipped with Model TR-4-1D MPX modules). The ZENER test can be used in place of the DIODE test type when current greater than 1 mA is necessary or when voltages greater than 10 volts need to be measured.
Description ZENER Description of measurement (e.g., CR3) Time, in mSec, to wait after applying the current and before beginning the voltage measurement. This can be used to allow time for parallel capacitances to charge. Negative polarity test point Positive polarity test point Low test limit in volts High test limit in volts
Page 11-9
IC Test: Allow for measurement of diode junctions at the inputs of ICs (TR-4). These
diodes are typically present at the inputs of ICs to protect the IC from damage by clamping the pin voltage between the power supply rails (e.g., VCC and GND for typical logic ICs). This test type can measure from two power supply rails (e.g., VCC and GND) to all other pins on the assembly. The system measures by applying a constant current, then measuring the voltage drop and ensuring that it falls between the high and low test limits. The measurement points for this test step type are programmed by using the Edit/Enter IC Test Data screen (Figure 7-10). By using two different ICs test steps in a program (each with its own range value of 1 or 2), UUTs with up to four power supply rails can be verified to each pin. Under normal circumstances, the System uses 1 mA as the measurement current, but this can reduced in decade values by specifying special range values. Also see the ICRNG test type for information on bounding the pin ranges to accommodate multi-PCB panels.
Description ICS Description of measured component (e.g., IC Tests) Sum of the following: 1 = Use first set of test data 2 = Use second set of test data 0 = Use 1 mA measurement current 16 = Use .1 mA measurement current 32 = Use 10 uA measurement current 64 = Use 1 uA measurement current More negative (-) power supply rail to test from (e.g., GND) More positive (+) power supply rail to test from (e.g., VCC) Low test limit (typically 0.4 V) High test limit (typically 0.9 V)
Page 11-10
IC Test Range Limiting: Allow for limiting the range of test points that are used
when executing the next ICS test step (TR-4). This test type can be used to separate a single range of IC specification data (range = 1 or 2) into several distinct sections, such as when testing multiple PCB panels. When non-overlapping ICRngs are used, the to and from pins of ICS test steps using the same range of data can be different.
Parameter Test Type Title Range From Port To Port Low Lim High Lim
Description ICRng Description (typically not used) Not used Port to begin testing from Port to end testing to Not used Not used
Inductor Test: Measures inductance between two test points and generates a test result
(TR-4).
Description INDUC Description of measured component (e.g., L302) As described in beginning of Chapter. Measurements use either 100 Hz or 1 KHz stimulus. Negative polarity test point Positive polarity test point Low test limit in henrys High test limit in henrys
Page 11-11
Voltage Test: Measures a DC voltage and generates a test result. This test can be used
to test on-board batteries or to test for charged capacitors. The usable voltage range is 0 through + 9.9 volts referenced to ground potential (TR-4). See the DMM test type for more flexible voltage measurements. Use DMM for measuring voltages generated by the TR-6 System.
Description VOLT Description of measured component (e.g., D101) Not used Most negative test point for voltage Most positive test point for voltage Low test limit High test limit
Page 11-12
Continuity Test: Measures all combinations of solid-state test points between the
from-port and to-port, and relay test points between the low-lim and high-lim for opens and shorts. There can be multiple CONT tests in a single spec file, but the range of tested points cannot overlap between any of the individual CONT tests since the data base is shared. To specify the expected outcome of individual CONT tests, select the CONT test step in the Enter/Edit Spec Data screen, then press [F5].
Description CONT Description (typically not used, or Opens/Shorts) Normally 0. If 1, instructs the System to ignore inactive pins during continuity testing optimizations. This slows test execution, but can be used to help prevent continuity errors on points connected to batteries on the UUT. Lowest test point number of continuity test for solid-state test points (1-1600) Highest test point number of continuity test for solid-state test points (1-1600) If non-zero, lowest test point number for continuity test of relay test points (1601-1950). If non-zero, highest test point number for continuity test of relay test points (1601-1950).
Page 11-13
Discharge Point: The specified test points are both connected to ground potential for
a specified time (TR-4). The ground path (with range = 0) is approximately 400 resistance (or about 600 between the two points through ground). If the Low Lim is 1 through 6, the System uses the Systems current source to charge the two test points in the specified polarity. The Low Lim indicates the current range to use. This function can be used to discharge caps or reverse the charge between two points. The Systems current source can source, but not sink, current. If the Low Lim is 7, the System connects all of the test points in the System together, effectively discharging everything. Note If Low Lim = 7 is used, the discharge impedance is low (about 50 ), so caution must be taken that the current through the discharge path does not exceed 15 mA. Doing so can damage the MDA System. Consequently there should not be more than about .75V present between any two points.
Parameter Test Type Title Range From Port To Port Low Lim
Description DISCH Not used Time to pause in milliseconds Point to discharge or charge (-) Point to discharge or charge (+) 0 = Discharge Points 1, 2 = Charge points at 1 mA 3 = Charge points at .1 mA 4 = Charge points at .01 mA 5 = Charge points at 1 uA 6 = Charge points at .1 uA 7 = Discharge all test points (see note above) Not used
High Lim
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Pause a Specified Time:

Parameter Test Type Title Range From Port To Port Low Lim High Lim Description PAUSE Not used Time to pause in milliseconds (0-32000 mSec) Not used Not used Not used Not used
Set Measurement Retry Parameters: Specifies remeasurement actions the System

takes if a test step failure occurs for RES, CAP and DIODE test types (TR-4). Also affected by these settings are the associated JMP for each analog test, i.e., JMPR, JMPC, JMPI, and JMPD. This test type allows modification, at spec data execution time, of the measurement parameters set in the Special Features screen. This test type can be used to increase the values for problem points, or to increase the speed of failures when executing JMP-type analog measurements.
Parameter Test Type Title
Description RETRY Normally not used, but if the title is RESET, the other fields are ignored and the default retry characteristics (as present when beginning the test) are restored. The maximum time, in mSec, to retry a DIODE test before reporting a failure. Can be used when capacitors in parallel with the diode need to charge. The maximum number of retries before reporting a RES failure. The maximum number of retries before reporting a CAP failure.
Range
From Port To Port
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Set RES Measurement Parameters: Specifies measurement parameters such as

delay time and number of samples averaged on analog measurements such as RES, JMPR, VOLT, CAP and INDUC. This test-type can be used to modify some of the analog measurement parameters during a test sequence to optimize measurements. Many of these values are the same as those set in the Resistance Measurement Characteristics screen and replace those values for the remainder of the test. When range values of 1-10 are specified, current-mode measurements are modified. When range values of 11-14 are specified, voltage mode measurements are modified. Range values of 17-22 modify VOLT test-type measurements. This test type can be used to increase the values for problem measurements or to increase accuracy.
Description RESRG Normally not used, but if the title is RESET, the other fields are ignored and the default measurement characteristics (as present when beginning the test) are restored. 1 = 100 (.2V/1mA) 2 = 1 K (2V/1mA 3 = 10 K (2V/.1mA) 4 = 100 K (2V/10uA) 5 = 1 M (2V/1uA) 6 = 10 M (2V/.1uA) 7 = 1 K (.2V/.1mA) 8 = 10 K (.2V/10uA) 9 = 100 K (.2V/1uA) 10 = 1 M (.2V/.1uA) 11 = Samples averaged for voltage-mode RES readings 12 = Samples averaged for voltage-mode CAP readings 13 = Samples averaged for voltage-mode INDUC readings 14 = Re-measures reference voltages to which voltage measurements are calibrated 17 = Samples averaged for each VOLT reading group 19 = High Limit contains number of groups averaged for VOLT readings (default = 1, maximum = 1000)
Range
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Range, cont.
20 = High Limit contains discard value for VOLT readings if groups averaged is greater than zero. Any group readings above specified percentage greater than reading average are discarded (default = 0). For example, if High Limit is 50, group samples greater than 50% above the average are discarded. Low Limit is similar, but discards readings specified percentage below the average. For example, if Low Limit is 50 (default = 0), group samples less than 50% of the average are discarded. 21 = High Limit contains time, in mSec, after switching, but before taking a VOLT reading (default = 0). 22 = High Limit contains scale factor for VOLT readings (default = 1). 24 = Sets the logic low source voltage to the low limit value (in Volts) and the logic high source voltage to the high limit value (in Volts). Not used Not used For range values 10 or less, the delay, in mSec, after applying the constant-current source and before beginning the measurement. For range value 20, specifies low discard range for VOLT readings. For range values 17 or less, the number of samples averaged for the measurement. For other range values, see specific range description for assignment.
From Port To Port Low Limit
High Lim
Adjust Potentiometer: Allow operator adjustment of a potentiometer on the UUT

using resistance, voltage or counter/timer measurements. The System first measures the two test points. If the measurement falls between the test limits, a result is logged (just as with a RES, UCT or DMM test), and the next test step is executed (requires TR-4 for POTR, TR-6 for POTU and POTD). If the initial reading is not within limits, the System displays the name of the component (taken from the test title), the upper and lower limits (taken from the test limits), an analog meter representation, and a request to the operator to make an adjustment. The System then displays an updated measurement value, both graphically and numerically, to allow the operator to make the adjustment. When the operator is done with the adjustment, any key can be pressed to continue, after which the System makes a pass/fail evaluation based on the last reading taken. If different adjustment criteria is required, you can create alternatives to this routine by using several discrete test types as shown in the appendix of this
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manual. The System generates three lines on the CRT when using this test type, then erases them when completed. If the test title contains an up-arrow (^), the System will not display the analog meter on the screen. If the test title contains an at-sign (@), the System requests that the operator adjust the pot regardless of whether the initial reading is in-limits or not. If the test title contains an ampersand (&), the analog meter movement polarity is reversed. This can be used to give the operator a better sense for the direction to turn the pot during the adjustment.
Description POTR (measuring TR-4 resistance), POTU (measuring with UCT), or POTD (measuring with DMM) Description of measured component (e.g., R234). Also see the description above for more detailed information about modifying operation of the POTx test with the test title. All of these fields are the same as: RES for POTR DMM for POTD, or UCT for POTU
Range From Port To Port Low Limit High Lim
Install/Remove Jumpers: Allow operator installation or removal of missing or

additional jumpers on the UUT (TR-4). The System first measures the resistance of the two test points. If the measurement falls between the test limits, a result is logged (just as with a RES test) and the next test step is executed. If the initial reading is not within limits, the System displays the name of the jumper (taken from the test title) to remove or install. If the low limit is zero, the operator is instructed to install the jumper. If the low limit is not zero, the operator is instructed to remove the jumper. Once the test passes (such as when the operator corrects the jumpering), the next test is executed. The operator can abort the test step (causing a failure) by pressing the [ESC] key. If different operator interaction criteria is required, you can create alternatives to this routine by using several discrete test types as shown in the appendix of this manual. The System generates two lines on the CRT when using this test type, then erases them when completed. Typical low/high limits for an installed jumper are 0 and 100 ohms. Typical limits for an open jumper are 100 ohms and 20 Mohms (which is displayed as "*>19M").
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Parameter Test Type Title Range From Port To Port Low Limit High Lim
Description JMPER Description of measured component (e.g., JP3-4) same as RES test type same as RES test type same as RES test type same as RES test type same as RES test type
Set Switch: Allows testing for correct switch settings on the the UUT. The System first
measures the between the two test points (TR-4 resistance for SWCHR or a DMM measurement with SWCHD). If the measurement falls between the test limits, a result is logged (just as with a RES or DMM test) and the next test step is executed (Requires TR-4 for SWCHR and TR-6 for SWCHD). If the initial reading is not within limits, the System asks the operator to toggle the switch (the name of which is taken from the test title). Once the test passes (such as when the operator corrects the switch setting), the next test is executed. The operator can abort the test step (causing a failure) by pressing the [ESC] key. If different operator interaction criteria is required, you can create alternatives to this routine by using several discrete test types as shown in the appendix of this manual. The System generates two lines on the CRT when using this test type, then erases them when completed. When using SWCHR, typical low/high limits for a switch to be closed are 0 and 100 ohms. Typical limits for a switch that is to be open are 100 ohms and 20 Mohms (which is displayed as "*>19M").
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Description SWCHR (for resistance measurement), SWCHD (for DMM measurement) Description of measured component (e.g., SW3-c) All of these fields are the same as: RES for SWCHR, or DMM for SWCHD
Make Cable Connection: Allows specification of a connection to be made when

building a cable or harness (TR-4). The System measures between the two test points, compares the reading to the high and low test limits, and generates a pass or fail based on the result. If the "From Point" is probed, the system displays a message to the operator: Connect from <From-pin name> to <To-pin name> Press [ESC] to fail test... If the test title is not blank, it can be used to provide a customized message to the operator. In this case, the System replaces the text after "Connect from" with the contents of the test title. The first up-arrow (^ ) found in the test title is replaced with the From-pin name. The second up-arrow found in the test title is replaced with the To-pin name. When used in this mode, the test title that would be the equivalent of the standard message would be "^ to ^". After presenting the message, the System waits for the connection to be completed, another point to be probed, or the [ESC] key to be pressed. When any of these events occur, the System beeps and then erases the above message from the CRT. In order to optimize speed, when performing this test the System always uses the 100 ohm current mode range to perform the measurements. As such, expected measurements should be less than 160 ohms. An example spec file to build a simple cable with four connections is shown below. When this spec file is executed, the System will wait until all the connections are made before ending execution. The number of connections not made is shown in the upper right corner of the display as the number of errors. The operator can either make each connection without instructions, or probe a point shown as a "From Pin", then receive the message about how to make the connection.
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Description WIRE If used, contains a custom description of connection to be made if the "From Pin" is probed (e.g., Red to J2-2) not used (System always uses 100 Ohm DC Current range) same as RES test type same as RES test type same as RES test type same as RES test type Example Spec File for Building a Cable
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DMM Measurement Test: Measures the AC or DC voltage or resistance value

between two test points and generates a result (TR-6) The measurement is made and compared against the high and low test limits. DMM AC and DC voltage measurements can be made from either TR-4-1 MPX test points or TR-6(-1) relay test points. DMM Resistance measurements can only be made through the back panel or TR-6 relay test points since the Model TR-4 solid state test points cannot accommodate the 100mA source current. If resistance measurements are to be made to Model TR-4 test points, use the Model TR-4 RESistance test type.
Description DMM Description of measurement (e.g., VCC) Sum of the following: 0 = DCV function 64 = ACV function 128 = Resistance function 0 1 2 3 4 5 6 7 8 = autorange = 200mV, 2 = 600mV, 6 = 2V, 20 = 6V = 20V = 60V = 200V = 600V (usable to 250V)
256 = AC Coupling for ACV, DC Filter for DCV/RES 512 = Measurement delay divided by 2 1024 = Measurement delay times 2 2048 = Measurement delay times 10 4096 = Samples averaged times 10 8192 = Samples averaged times 100 From Port To Port Low Lim High Lim Negative polarity test point (1625 if back panel only) Positive polarity test point Low test limit in volts or ohms High test limit in volts or ohms
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Universal Counter/Timer Measurement Test: Measures frequency, period, or

counts between two test points and generates a result (TR-6). In the case of Period measurements a separate channel can be used to determine the pulse end condition. The measurement is made, compared against the high and low test limits, and a pass or fail result generated. The input can be measured from the TR-6 back panel, a TR-4 MPX point, or a TR-6 relay test point. The source is typically taken with Chan 1, but can be routed through Chan 2 (back panel only) or taken through the DMM input divider. Inputs of up to 5 volts can be accommodated through Chan 1 and Chan 2 inputs. The DMM input is usable up to 50 KHz and offers differential input in conjunction with amplification or attenuation of the input signal, depending on the range. When the DMM input is used, you should the full-range DMM value that is closest to the amplitude of the signal that you are measuring. The trigger level is zero volts unless otherwise specified. The trigger levels are usable with Chan 1 and Chan 2 inputs and can range from -2.2V to +2.2V in approximately 100mV steps. The input is normally AC coupled, but can be DC coupled when used with low frequency signals (e.g., < 30 Hz). The time constant of AC coupled Chan 1 and Chan 2 inputs is approximately 63 mSec., while that of the DMM is 1.6 sec. The Model TR-6-2 Fixture Interface can be used to buffer and frequency-divide signals in the proximity of the UUT. This allows measurement of high frequency signals (up to about 50 MHz) or at circuit locations that are sensitive to capacitance or loading. See also the UCTTr test type for triggering during measurements. See also UCT Interactive Control in Chapter 7 for interactive setup of UCT measurement parameters.
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Description UCT Description of measurement (e.g., Osc X2) Function: 0 = Frequency function 1 = Period function 2 = Count function Range: 4 8 12 16 20 24 28 32 = = = = = = = = Period, Freq, Counts 12.8 uSec (1000 periods avg), 5 KHz, 12.8 Sec 128 uSec (100 periods avg), 50 KHz, 1.28 Sec 1.28 mSec (10 periods avg), 500 KHz, 128 mSec 12.8 mSec (1 period), 5 MHz, 12.8 mSec 128 mSec (1 period), 10 MHz 1.28 Sec (1 period) 12.8 Sec (1 period) 128 Sec (1 period)
Coupling: 00 = AC Coupling 64 = DC Coupling Input Selection: 000 = Chan 1 128 = Chan 2 256 = DMM Input 384 = Chan 1 to Chan 2 512 = Chan 2 to Chan 1 Trigger Slope (period/count only): 0000 = Start Slope + 1024 = Start Slope 0000 = Stop Slope + 2048 = Stop Slope Settled measurement: 0000 = Use first reading 4096 = Ignore first reading
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Range, cont.
Input Range (DMM Only): 0000 = 600 V 8192 = 200 V 16384= 60 V 24576= 20 V 32768= 6 V 40960= 2 V 49152= 600 mV 57344= 200 mV Negative polarity test point (1625 if back panel) Positive polarity test point Low test limit in Hertz/Sec/Counts High test limit in Hertz/Sec/Counts
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UCT Trigger Setup: Allows change of a source signal from the Model TR-6 during a
UCT measurement. This can be used to initiate a non-repetitive signal from the UUT after the UCT is armed for period or count measurements. With this capability, you can specify the following sequence of events: (1) set up an initial source value from the TR-6 with use of the DCV, SINEV, SQRV, RELAY or DIGO test steps, (2) use the UCTTR test step to save a pointer to the source test step and specify a new stimulus value, (3) during execution of the next UCT test step, once the UCT is armed for a measurement, the specified source is reprogrammed to the new high limit value (contained in the UCTTR high-lim), then the UCT measurement taken, and (4) the UCTTR setup is automatically disabled until the next UCTTR is executed. The stimulus is left at the value programmed by the UCTTR step.
Description UCTTR Typically not used. If non-zero, indicates which subsequent step number (relative to present step) that is used as type of stimulus. For example, a range of 1 points to the next test step. Not used. Not used. Not used. Stimulus value that the specified source is reprogrammed to during the UCT measurement. This value is used as the high-limit program value for the test step specified in the range.
As an example, the following three steps will program 0.5 volts to test point 5, arm the UCT for a period measurement, reprogram the stimulus at test point 5 to 4.5 volts, then take a period measurement at test point 10: UCTTr DCV UCT 1 1 21 4.5 0.5 20u
3 GND 3 GND
5 R3-3 10 P2-2
0 10u
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Dynamic Measurement Calibration: Allows test-time measurement of an external

value, after which the System adjusts the gain and/or the zero offset of similar test steps to reflect the error of the measured value. These test step types allow you to measure a known-good component value, then calibrate similar measurements so that they are corrected to match. For example, if you are going to measure some resistors that are more accurate than the System specification, you can measure a known-good value resistor in the fixture, then correct the subsequent measurements to match. This technique allows you to use the short-term stability of the System rather than the long-term accuracy. When a ZERO or GAIN test type is executed, the System uses the measured value of the most recent analog measurement (e.g., a RES or DMM test) as the reference. This test step is found by searching back from the present test step until the first analog measurement is found. Next, the system searches the range of test steps specified by the Low-Lim and High-Lim, and for each test step that matches the reference test type (e.g. if the last analog measurement was a CAP test type, it processes all of the CAP test types in the range), it replaces the existing GAIN or ZERO value with that determined by the reference measurement.
Parameters Test Type Title Range From Port To Port Low Lim
Description ZERO, GAIN Typically not used. Not used. Not used. Not used. The first step number in the range of test step to modify if the test types match. If 1000 is added to the step number, the value is forward-relative to the present step (e.g., 1002 refers to the second step ahead of the present step). If 2000 is added to the step number, the value is backwards-relative to the step number (e.g., 2002 refers to 2 steps before the present step). The last step number to consider for modification. Uses the same conventions as the Low Lim. For GAIN, this value specifies the numerator when determining the new gain factor. Typically, it will be the actual (nominal) value of the component measured in the last step. For Z ERO, this value is typically 0, but it can be a non-zero value if you are offsetting for a non-zero measurement.
High Lim Nominal Val
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Analog Stimulus Test Types

The Model TR-6 provides the capability to source AC and DC voltages to the UUT. All test types in this section apply only if you have a Model TR-6 installed in your test system. The Model TR-6 has internal sources for generating sine waves (SINEV), square waves (SQRV) and dc voltages (DCV). In addition, there are provisions for switching an external signal (EXTIO) for sourcing or measuring with an external device. These sources are available at the TR-6 back panel, or they can be switched into the Model TR-4 solid state switching. They are not available at the Model TR-6(-1) relay switching. If it is necessary to apply one of these sources to a test point that cannot be wired into the Model TR-4(-1), you can provide wiring for the source to the UUT point through one of the Model TR-6s undedicated relays. The Model TR-6 sources are ground referenced. The ground is ultimately connected to the chassis of the controller (PC). The "from (-)" test point used for supplying sources are connected back to this ground. System sources are disconnected when the source test title is specified as RESET (in either upper or lower case). The sources are all reset when the system is powered up, when a CONT or ICS test is performed, and before and after each spec file is executed. The Model TR-4 allows up to six guard points at one time, each of which can be remotely sensed. When one or more sources are programmed (and not reset), only three guard points can be active simultaneously. The software automatically ignores that last three guard points if present. The Model TR-6 has the ability to provide simultaneous stimulus channels, however, there are some interdependencies. In the case of interdependencies, the last programmed value has priority. These include: 1. If a square wave (SQRV) is specified with a non-zero low-limit, the DC voltage (DCV) output is used. Therefore, the stimulus value for the first voltage of the square wave and the DCV output will be the same. If the alternate DCV output (range = 2) is used, it disables the square wave output entirely and replaces it with the specified DC voltage signal. The square and sine wave generation (SINEV/SQRV) use the same frequency generation circuitry, therefore the frequency must be the same for both if they are used simultaneously.
2.
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The following frequencies are available when generating sine and square waves: 40KHz, 20KHz, 13.3KHz, 10KHz, 8KHz, 6.67KHz, 5.71KHz, 5KHz, 4.44KHz, 4KHz, 3.64KHz, 3.33KHz, 3.08KHz, 2.85KHz, 2.67KHz, 2.5KHz, 2KHz, 1.33KHz, 1KHz, 800Hz, 667Hz, 571Hz, 500Hz, 444Hz, 400Hz, 364Hz, 333Hz, 308Hz, 285Hz, 267Hz, 250Hz, 200Hz, 133Hz, 100Hz, 80Hz, 67Hz, 57Hz, 50Hz, 44Hz, 40Hz, 36Hz, 33Hz, 31Hz, 29Hz, 27Hz, 25Hz, 20Hz, 13Hz, 10Hz, 8Hz, 7Hz, 6Hz 5Hz, 4Hz, 3Hz. In most cases the stimulus is used from the Model TR-4 test points. It also comes simultaneously from the hardwired TR-6 backpanel connector. If stimulus from the TR-6 backpanel only is to be used, the TR-4 testpoint stimulus can be eliminated by using a From Port of 1625.
Sine Wave Output: Provides sine wave stimulus from the Model TR-6 module. This
stimulus is available at the Model TR-6 back panel or via the Model TR-4-1 test points. The sine wave stimulus is referenced to a non-floating analog ground which is switched to the UUT with the "from (-)" test point.
Description SINEV If RESET is entered, the sine wave source is disconnected from the matrix and set to high impedance output. Frequency in Hertz. Discrete values from 3 Hz to 40 KHz are available. A list of these values is included at the beginning of this chapter. When a frequency is entered into the spec file, it is replaced by the nearest achievable value. Negative polarity source point (1625 if back panel only) Positive polarity source point. Not used. Sine wave amplitude in volts peak to peak. The range is 100 mV to 20 V peak (in .1 dB steps). When the amplitude value is entered into the spec file it is replaced by the nearest achievable value.
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Square Wave Output: Provides square wave stimulus from the Model TR-6 module.
This stimulus is available at the Model TR-6 back panel or via the Model TR-4-1 test points. The square wave stimulus is referenced to a non-floating analog ground which is switched to the UUT with the "from (-)" test point.
Description SQRV If RESET is entered, the square wave source is disconnected from the matrix. Frequency in Hertz. Discrete values from 3 Hz to 40 KHz are available. A list of these values is included at the beginning of this chapter. When a frequency is entered into the spec file, it is replaced by the nearest achievable value. Negative polarity source point (1625 if back panel only) Positive polarity source point. One of the amplitude levels of the square wave. Normally this value is zero, but it can range from -10 to +10 volts in 5 mV steps. One of the amplitude levels of the square wave. This value can range from -10 to +10 volts in 5 mV steps.
From Port To Port Low Lim
High Lim
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DC Voltage Output: Provides DC voltage stimulus from the Model TR-6 module.
The DCV D/A converters (DAC) provides stimulus in the range of -10V to +10V in 5 mV steps. The output can provide up to 10mA current. The output is available at the back panel or through the Model TR-4-1 switching. The DC stimulus is referenced to a non-floating analog ground which is switched to the UUT with the "from (-)" test point. An alternate DCV output is available by specifying a range of 2. In this case, the SQRV source is used to generate a DC voltage. If a non-zero low-limit on the SQRV output is specified, the DCV source is used for this purpose and the amplitude specified for the SQRV output will reprogram the DVC output. Multiple source connections are available by setting the multiple stimulus flag using the FLAGS command.
Description DCV If RESET is entered, the specified DCV output is set to 0 volts and disconnected from the matrix. DC source being programmed: 1 = Normal DCV output 2 = SQRV output Negative polarity source point (1625 if back panel only). Positive polarity source point. Not used. Amplitude in volts. The range is -10V to + 10V in 5 mV steps.
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External Signal Input/Output: Allows connection of external instrumentation to

the Model TR-4-1 solid-state switching. The switched signal is connected to the "to (+ )" test point. Ground (connected to the controller chassis) is switched to the UUT "from (-)" point. Signals of up to plus and minus 12 volts (with respect to the controller chassis) and up to 15mA can be accommodated. The signal is applied until a RESET is issued (via the title of this test type). The external signal is connected to the backpanel connector on the TR-6 System Module.
Parameters Test Type Title Range From Port To Port Low Lim High Lim
Description EXTIO If RESET is entered, the external signal is disconnected from the matrix. Not used. Negative polarity source point (connected to chassis ground) Positive polarity source point. Not used. Not used.
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Digital Test Types

The digital test types allow you to input and output digital data from within a spec file (TR-4 and TR-6).
PORTx Test Types

The PORTx test types do I/O to the PCs input and output ports allowing you to communicate with peripherals and other I/O-mapped devices.
DIGx Test Types

The DIGx test types perform input and output via the CheckSum Model TR-4 System Module (8 bits), Model TR-6 System Module (8 bits), Model TR-4-1D (16 bits each) and a CheckSum Model G-80 Digital I/O Module that can provide an additional 96 bits.
LOGIC Test Type

For digital I/O, the LOGIC test type can use one or more types of CheckSum hardware, including the Model TR-4 System Module, the Model TR4-1(D) MPX module, Model TR-6 Functional Test Module, Model G-80 Digital I/O Module and/or Model G-80 Overdrive Module. This combined software/hardware can be used to do in-circuit testing of digital hardware combinational logic and transceivers. Refer to Chapter 7 for more details and examples of LOGIC test use.
TR-4/G-80 Characteristics
For the Model TR-4 System Module and G-80 Digital IO Module, each bit is an individually bi-directional digital TTL I/O line which can source 2.5 mA or sink up to 24 mA. Since a pull-up resistor is in place (10 K ), the bits are also compatible with most CMOS logic families. Note Reset Conditions: Between spec file executions, the bits are all set to high impedance (tri-state). Since each line has a 10 K resistor to + 5 V, this results in a TTL one. Each line that you would like to use for output from the System needs to be set active using the DIGA test type. In the reset mode, the outputs are set to tri-stated zeros, so that when you activate an output it will immediately go to a zero. You can first perform a DIGO to set the bits to ones prior to the activate if you so desire.
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TR-6 System Module Digital I/O

The Model TR-6 directly accommodates eight bits of digital I/O via its System Module. The eight bits consist of open-collector drivers that can be used to control external relays requiring currents of up to 100 mA. The module supports the installation of on-board pull-up resistors that make the digital byte appear as 5V or 12V digital logic. Input signals of up to 12 volts can also be read back (at TTL logic thresholds). The TR-6 System is shipped with a 10 KOhm pullup resistor network connected to + 5V. This resistor network can also be jumpered on the Model TR-6 Module to + 12V. The resistor network (socketed) can be removed to eliminate inter-bit impedance or to allow connection to external pull-up sources such as when you are directly driving external relays with the System. The digital input always uses TTL-level inputs, although it can be used with inputs of up to +12 volts without damage.
Model TR-4-1D Digital I/O

When the System is configured with Model TR-4-1D MPX modules, you can multiplex 16 test points per module between standard analog I/O and digital I/O under software control. These points can be wired into digital nodes on the UUT to supply digital testing. When configured with Model TR-4-1D MPX modules, the System can provide additional digital I/O capabilities. On each Model TR-4-1D, the first 16 test points can be changed to digital I/O points. The points can be set as input or output on a byte-by-byte basis. When these points are used, they should be specially wired to the test points on the UUT requiring digital control. As a general rule, use test points 1-8 as output or input/output points and test points 9-16 as inputs (although these points can also be configured as outputs, but only when points 1-8 are also configured as outputs.) To use the digital capabilities on the Model TR-4-1D modules, after completion of MDA testing and application of power to the UUT, first connect the digital bytes to the test points and configure them as inputs or outputs as necessary with the DIGA command. Then use DIGO to do output or DIGI to do input. These digital bytes are accessed by test range values that apply to a byte on each module.
Other Digital Methods (TR-6)

The Model TR-6 DCV command can be used to provide logic levels to several test points simultaneously. The (-) test point serves as a digital low and the (+ ) test point, when programmed to + 5V, serves as a digital high level. Up to 16 simultaneous source points can be used. The System does interrupt these analog voltages during reset operations so DCV sourcing should only be used on level-sensitive digital bits.
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Under normal circumstances, the System disconnects previous test points connected to the same source (e.g., DCV) when a new stimulus is applied. However, with use of the FLAGS test step, you can have the System allow multiple stimulus points from the same source (FLAGS range = 8). The source can be disconnected with a RESET of the desired source.
General Programming
The numbers used with the digital test types are all decimal. As such, if you would like to send a byte of all ones, you would specify 255. A byte of all zeros is 0. Individual bits (which can be added) are 1, 2, 4, 8, 16, 32, 64, and 128. Masks are used to specify inactive bits during input. Any one in the mask is used to mask out the specified bits. For example, if you want to mask out the two least significant bits, specify a 3. Test results are presented after the masking operation. The System programs the bits in byte increments. Byte number 0 refers to the Model TR-4 bits, bytes 1-12 refer to the Model G-80 bits, byte 13 refers to the Model TR-6 System Module bits, bytes 14-29 refer to the Model TR-4-1D bits.
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Digital Input Test: Reads a byte of digital data from a CheckSum Model TR-4, TR-6,
TR-4-1D or G-80 and generates a test result.
Description DIGI Name of test step (e.g., U234 Out)9 Input byte number: 0 = TR-4 bits 1-8 1 = G-80 bits 1-8 2 = G-80 bits 9-16 ... 12 = G-80 bit 89-96 13 = TR-6 bits 1-8 14 = TR-4-1D points 1-8 15 = TR-4-1D points 9-16 16 = TR-4-1D points 201-208 17 = TR-4-1D points 209-216 ... 28 = TR-4-1D points 1401-1408 29 = TR-4-1D points 1409-1416 Not used 0 = normal execution 1 = do not generate or report results Input mask: Data read is ignored for any bit set as one in this field (e.g., if input mask is 5, the LSB and 2nd bit from the LSB are ignored). Expected data
High Lim
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Digital Output: Write a byte of digital data from the Model TR-4, TR-6, TR-4-1D or
G-80 Module to the UUT.
Parameter Test Type Title Range DIGO Not used Output byte number: 0 = TR-4 bits 1-8 1 = G-80 bits 1-8 2 = G-80 bits 9-16 ... 12 = G-80 bit 89-96 13 = TR-6 bits 1-8 14 = TR-4-1D points 15 = TR-4-1D points 16 = TR-4-1D points 17 = TR-4-1D points ... 28 = TR-4-1D points 29 = TR-4-1D points Not used Not used Not used Data byte to output
Description
1-8 9-16 201-208 209-216 1401-1408 1409-1416
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Digital Active: Set selected bits on a Model TR-4 System Module or Model G-80
Digital I/O Module to active. Sets specified one-bits as active and zero-bits as tri-state in the selected byte. All bits are tri-stated as a default. For the Model TR-4-1D MPX Modules, connect or disconnect the 16 digital bits to the test points and configure the bytes as inputs or outputs as necessary.
Description DIGA Not used Output byte number: 0 = TR-4 bits 1-8 1 = G-80 bits 1-8 2 = G-80 bits 9-16 ... 12 = G-80 bit 89-96 14 or 15 = TR-4-1D points 1-16 16 or 17 = TR-4-1D points 201-216 ... 28 or 29 = TR-4-1D points 1401-1416 Not used Not used Not used Tri-state data information. Each bit set as one is activated. For Model TR-4-1D programming, the high limit is assigned as: 0 = disconnect all digital test points on module 1 = connect all digital test points on module configure points 1-8 on module as inputs configure points 9-16 on module as inputs 2 = connect all digital test points on module configure points 1-8 on module as outputs configure points 9-16 on module as inputs 3 = connect all digital test points on module configure points 1-8 on module as outputs configure points 9-16 on module as outputs
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Digital Hardware Test: Test digital hardware power-on behavior according to

functional behavior defined in a test file.
Description LOGIC Name of test file (assuming .TST extension) optionally followed by name of a sub-test within the file to execute. Normally 0, but additional test coverage can by obtained by using a range value of 32 which causes all test steps in each sub-test to be performed regardless of any previous failures. Adding an offset of 64 causes test execution from the Edit screen to single step through the lines of the sub-test. A keyboard key must be pressed for the executive to proceed to the next sub-test line. The offset of 64 has no effect on execution outside the Edit screen. Not used Not used Not used Not used
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Port Input Test: Read a byte of digital data from the PCs I/O bus and then generate a
test result.
Description PORTI Name of test step (e.g., Data In) Input port address Not used 0 = normal execution 1 = do not generate or report results Input mask: Data read from port is ignored for any bit set as one in this field (e.g., if the input mask is 5, the 1-bit (LSB) and 4-bit are ignored). Expected data
High Lim
Port Output:
Write a byte of digital data to the PCs I/O bus.
Parameter Test Type Title Range From Port To Port Low Lim High Lim PORTO Not used Output port address Not used Not used Not used Data byte to write
Description
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Transfer of Control Test Types

The following test types are used for transfer of control within the spec file. A label is first specified that can be used as the destination of JMPs and CALLs. Labels can be up to twelve characters long and are not case-sensitive (differences in upper and lower case are ignored). Note The measurement parameters set in the Special Features menu, such as failure retries and discharge times, also affect the speed and accuracy of the analog JMP test types, i.e., JMPR, JMPC, JMPZ and JMPD. To enhance testing speed, you can use the RETRY and RESRG test types to modify these measurement parameters during a test.
Specify Label: Specify a label to be used as the destination of a JMP command. If the
label is SHUT DOWN, the test steps following it are executed, even if the test is aborted. This can serve as a power-down sequence at the end of the program. If the label is REPEAT, next time the [F2] Repeat key is pressed when the System is paused between steps, the repeat will occur to this point. This repeat action can be cancelled and returned to normal with a label of CLEAR REPEAT.
Description LABEL Label Name (or SHUT DOWN, REPEAT or CLEAR REPEAT - see above). Not used Not used Not used Not used Not used
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Jump Unconditionally: Unconditionally transfer control to a specified label.

Parameter Test Type Title Range From Port To Port Low Lim High Lim JMP Destination label Not used Not used Not used Not used Not used Description
Jump Based on Resistance Measurement: The System measures the resistance, and
if test passes, a jump to the specified destination occurs. No results are logged. Excluding test type and title, all fields are the same as for RES test type (TR-4).
Description JMPR Destination label Same as RES test type Negative polarity test point Positive polarity test point Low test limit in ohms High test limit in ohms
Jump Based on Capacitance Measurement: The System measures the

capacitance, and if the test passes, a jump to the specified destination occurs (TR-4). No results are logged. With the exception of the test type and title, all the fields are the same as the CAP test type. Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPC Destination label Same as CAP test type Negative polarity test point Positive polarity test point Low test limit in farads High test limit in farads
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Jump Based on Diode Measurement: The System measures the diode junction, and
if the test passes, a jump to the specified destination occurs. No results are logged. With the exception of the test type and title, all the fields are the same as the DIODE test type (TR-4). Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPD Destination label Same as DIODE test type Cathode (-) test point for diode Anode (+) test point for diode Low test limit (typically 0.4V) High test limit (typically 0.8V)
Jump Based on Inductance Measurement: The System measures the inductance,

and if the test passes, a jump to the specified destination occurs (TR-4). No results are logged. With the exception of the test type and title, all the fields are the same as the INDUC test type. Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPI Destination label Same as INDUC test type Negative polarity test point Positive polarity test point Low test limit in henrys High test limit in henrys
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Jump Based on Voltage Measurement: The System measures the DC voltage, and
if the test passes, a jump to the specified destination occurs (TR-4). No results are logged. With the exception of the test type and title, all the fields are the same as the VOLT test type. Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPV Destination label Same as VOLT test type Most negative polarity test point for measurement Most positive test point for measurement Low test limit in volts High test limit in volts
Jump Based on DMM Measurement: The System makes the specified DMM
measurement, and if the test passes, a jump to the specified destination occurs (TR-6). No results are logged. With the exception of the test type and title, all the fields are the same as the DMM test type. Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPDM Destination label Same as DMM test type Most negative polarity test point for measurement Most positive test point for measurement Low test limit in volts/ohms High test limit in volts/ohms
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Jump Based on UCT Measurement: The System makes the specified

Counter/Timer measurement, and if the test passes, a jump to the specified destination occurs (TR-6). No results are logged. With the exception of the test type and title, all the fields are the same as the UCT test type. Parameter Test Type Title Range From Port To Port Low Lim High Lim Description JMPU Destination label Same as UCT test type Most negative polarity test point for measurement Most positive test point for measurement Low test limit in Hz, Sec, Counts High test limit in Hz, Sec, Counts
Jump Based on Result of Digital Input: The System inputs the digital data, and if
the test passes, a jump to the specified destination occurs. No results are logged. With the exception of the test type and title, all the fields are the same as the DIGI test type.
Description JMPDI Destination label Same as DIGI test type Not used Not used Input mask: Data read from TR-4 or G-80 port is ignored for any bit set as one in this field (e.g., if input mask is 5, the LSB and 2nd bit from the LSB are ignored). Expected data
High Lim
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Jump Based on Result of Port Input: The System inputs digital data from the PCs
I/O port, and if the test passes, a jump to the specified destination occurs. No results are logged. With the exception of the test type and title, all the fields are the same as the PORTI test type.
Description JMPPI Destination label Input port address Not used Not used Input mask: Data read from port is ignored for any bit set as one in this field (e.g., if the input mask is 5, the 1-bit (LSB) and 4-bit are ignored). Expected data
High Lim
Jump Based on Result of Key Input: The System checks to see if the operator has
pressed a key on the PCs keyboard. If so, and if the key matches the specified key, the System performs the jump. Otherwise, if no key or the wrong key is pressed, the System performs the next test step.
Description JMPK Destination label Decimal ASCII value of key. For example, 65 is A and 48 is 0. F1-F10 are 131-140. If 0 is specified, the System accepts any key as true. If a lower-case key is pressed on the keyboard, it is converted to upper case before making the comparison. If the comparison is true, the key stroke is removed from the key buffer. If the comparison is not true, the key remains in the buffer for use by other JMPK test steps. The key buffer can be cleared by entering a JMPK range of 255. Not used Not used Not used Not used
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Set Error Counter Used for JMPE: Allows you to set the error counter that is used
with JMPE. This can be used to reset the value to 0 or to set a defined higher value for subsequent JMPE decisions. This test type can be used when testing for errors in repetitive tests using the same test spec file or to reset the counter between PCBs on multi-PCB panels. Note that unlike the error count displayed in the upper corner of the test display, the JMPE counter counts all failures that occur, even if the test step is subsequently repeated and passes. If a test title of RESET is used, the System restores the Systems error counter. This can be helpful if you have been resetting the counter, then need to find out how many total errors have occurred since the spec file began executing. If a test title of SET is used, it makes the Systems error counter match that of the JMPE error counter. If a test title of CLEAR ALL is used, then both the system error count and jump error count are cleared and all test results in the spec file are set back to skipped. This is useful at the start of main program loops with a different UUT tested for each loop execution. Parameter Test Type Title Description ERROR Normally not used, but if the title is RESET, the System restores the JMPE error count to the value of the System error count. If the title is SET, the System error count is set to be the same as the JMPE error count. The error count used for JMPE Not used Not used Not used Not used
Range From Port To Port Low Lim High Lim
Jump Based on Number of Errors: If the total number of errors encountered up

until the time of execution exceeds the specified number, the System performs the jump. Otherwise, the System performs the next test step. Also, see the ERROR and MEMI test types for manipulation of the error count. Parameter Test Type Title Range Description JMPE Destination label Number of errors. If the total number of errors encountered during execution of the spec file exceed the specified number, a jump occurs. Not used Not used Not used Not used
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Jump Based on Zener Measurement: The System measures the zener diode
junction and if the test passes, a jump to the specified destination occurs. No results are logged. Applies only to test systems equipped with Model TR-4-1D or equivalent MPX modules. With the exception of the test type and title, all the fields are the same as the Z ENER test type (TR-4).
Description JMPZ Destination label Same as ZENER test type Most negative polarity test point for measurement Most positive polarity test point for measurement Low test limit in volts High test limit in volts
Call a Subroutine: Control transfers to another test step, then resumes to the next test
step when a RETurn is executed. CALLs can be nested up to 16 deep.
Parameter Test Type Title Range From Port To Port Low Lim High Lim CALL Destination Label Not used Not used Not used Not used Not used
Description
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Return from Subroutine: Control transfers to the test step immediately following the
last CALL test type that was executed.
Parameter Test Type Title Range From Port To Port Low Lim High Lim RET Not used Not used Not used Not used Not used Not used
Description
Load and Run a Spec File: Causes the System to load a specified spec file into
memory and begin execution at the first test step. When a RUN test step is executed, the spec file presently in memory is overwritten. Also, any results information from the present spec file is lost. If you want to save any test results from the present spec file execution before doing the RUN, you may use the RPRTS test type. The memory locations are not reset during the RUN execution and consequently can be used to transfer information from one spec file to the next.
Description RUN Name of spec file to load and run. If the title is @M, use the contents of the memory string as the spec file name. Not used Not used Not used Not used Not used
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Load and Run a Sub-Program: Causes the System to load a specified spec file into
memory and begin execution at the first test step. When a RUNT test step is executed, the spec file presently in memory is overwritten with the RUNT spec file. The present spec file and its accumulated results information is saved. When a RETT test step in the RUNT spec file is encountered, the results from the RUNT spec file are saved, and the original spec file and its results are restored. The pass/fail status and location of any PCB panels from the main spec file are available from the RUNT spec file. The memory locations are not reset during the RUNT execution and consequently can be used to transfer information from one spec file to the next. Up to 10,000 lines of additional results and up to 16 spec files can connected together with use of RUNT commands from a single spec file. Nesting of RunT calls is not allowed.
Description RUNT Name Of Sub-Program To Execute. If the title is @M, use the contents of the memory string as the spec file name. Extent of Result Reporting For Called Program 0 = No individual test step results saved from called spec file, only its pass/fail status is returned 1 = Return only Pass (Fail Only if Called Program Non-Existent) 2 = All results of called spec file saved. Not used Not used Not used Not used
Return from Sub-Program: Control transfers to the test step immediately following
the last RunT test type that was executed.
Parameter Test Type Title Range From Port To Port Low Lim High Lim RETT Not used Not used Not used Not used Not used Not used
Description
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Message Test Types

The following test types allow you to display messages to the operator during test time. Messages are shown in the message area of the test screen. A short display message (up to twelve characters) can be displayed directly by the DISPL test type. The message displayed is contained in the title field of the test step. Longer messages are displayed with the DISP test type which references displays by a message number. These displays are defined by pressing [F5] after selecting the DISP test type in the Enter/Edit Spec Data screen. Up to 36 messages can be defined in a spec file with each used more than once if desired. When a message is defined, it is displayed beginning at the specified column and row of the message area of the display. Allowable rows are 1 through 8 and allowable columns are 1 through 78. Messages can contain a special code {MEAS}. When the System encounters the {MEAS}, it inserts the measured value for the closest step above this step that generated a result. This feature can be used for displaying a measured value as the operator makes an adjustment on the UUT.
Display a Short Message to the Operator: Display a message contained in the test
steps test title to the operator.
Description DISPL Text of message to display Not used Beginning column to display the message on. If this is greater than 78, the message is not displayed. Line to display the message on. If this is greater than 8, the message is not displayed. Not used Not used
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Display a Message to the Operator: Display a specified message number to the

operator.
Description DISP Not used Message number to present Not used Not used Not used Not used
Erase a Message to Operator: Erase the message area of the display from the
beginning location of the specified message to the end of the line.
Description DISPE Not used Message number to erase. If zero is entered, the System erases the entire display area. Not used Not used Not used Not used
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Wait for a Key to Be Pressed: The System waits until the specified key is pressed,
then continues to the next test step.
Description WAITK Not used Decimal ASCII value of key. For example, 65 is A and 48 is 0. F1 - F10 are 131 - 140. [Shift]F1 - [Shift]F10 are 156 - 165. [Ctrl]F1 - [Ctrl]F10 are 166 - 175. [Alt]F1 - [Alt]F10 are 176 - 185. If 0 is specified, the System waits for any key to be pressed. If a lower-case key is pressed on the keyboard, it is converted to upper case before making the comparison. Not used Not used Not used Not used
PCB Number Being Tested: Used with multi-PCB panels to specify to the operator
which PCB is being tested. Test results also contain the PCB number to show which PCB results are being listed. See the section of this manual describing Multi-PCB Panels for complete detail. Parameter Test Type Title Description PCB Typically not used, but if it is specified as SKIP FAIL, the System will advance to the next PCB statement in the spec file if there have been any failures for this PCB during the test. SKIP FAIL can be used, for example, to skip over functional tests of a PCB if the MDA tests have failed. Which PCB is being tested. Valid values are 0-99. Normally PCB 1 is the first PCB, followed by the others in sequential order. The value of 0 can be used for common test steps used by all PCBs so that these test steps will be executed, even if the PCB previously assigned has been skipped by the operator. Not used Not used Not used Not used
Range
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Screen Test Type

The Screen test type allows manipulation of display attributes (i.e. text color, background color, and character flashing), in the user display area (area controlled e.g. by DISP, DISPE, and DISPL test types). It also writes and reads user display area screen to/from files. There are six different operations that can be applied simultaneously with a single test step :
Get Display Attribute : Get a single display attribute value on the specified row / column (From Pin / Low Lim, respectively) into the integer memory location. Set Display Attribute : Set the display attribute of the specified area according to the specified display attribute value. Save Screen : save the message and display attribute of the specified area to an ASCII file whose name is specified in the Title. Note: This file can later be modified separately. Load Screen : Load the message and display attribute of the specified area from an ASCII file whose name is specified in the Title. Refresh User Display Area : Redraw the user display area.
Refresh Measurement Display Area : redraw the measurement display area. (this is the area above and below the user display area).
The Refresh Measurement Display and Refresh User Display Area will be useful when messages other than user messages have been printed on the screen and it is necessary to restore the previous user messages.
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The coordinates of a specified area is defined by the From/To Pins and High/Low limits. The corresponding values of the operations are listed in the SCRN Range table below, along with the list of display attribute values. After values for each display attribute and operation are determined, those values are added to get the final range value. Examples on how to specify the final range are given at the end.
SCRN Test Type Table

Parameter Test Type Title Range From Port To Port Low Lim High Lim Description SCRN filename, used when a save or load screen operation is specified color attribute and operation set up, see SCRN Test Range Table starting row ending row starting column ending column
SCRN Test Range Table

Parameter Text Color Value 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0 16 32 48 64 80 Description Yellow (default) Blue Green Cyan Red Purple Brown White Gray Light Blue Light Green Light Cyan Light Red Magenta Black Light White Blue (default) Black Green Cyan Red Magenta
Text Background
Text Background, cont.
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Toggle Character Flashing Operation (can be masked together)
96 112 0 128 256 512 1024 2048 4096 8192
Brown White Off On Get Display Attribute Set Display Attribute Refresh Measurement Display Area Refresh User Display Area Save Screen Load Screen (If load file is invalid, there will be no effect.) Note :
The operations are executed in the above order, from top to bottom sequentially (if specified). This SCRN test step is related to all test steps that allow user to put messages on the user display area e.g. : DISP, DISPL, DISPE, MEMS, MEMI, MEMR (test range = 5).
Examples:
Set Attribute to a flashing cyan text with a black background. Range = 512 (set attribute) + 128 (set flash on) + 3 (cyan text) + 16 (black background) = 659 Refresh the Measurement and User Display Area Range = 1024 (refresh measurement display) + 2048 (refresh user display area) = 3072 See also Appendix G for an example program.
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User-Defined Tests
Generate Test Result: Place a pass or fail into the test results. This can be used with
conditional jumps to generate and record a passed or failed result. If the range is 2, the System searches upward through the spec file and finds the last measured value from an analog test type (or its equivalent JMP command). This becomes the measured value for the step and it is compared against the high and low limits to generate a pass or fail result. This can be used after an adjustment loop to generate a pass or fail result based on the JMPx measurement the last time through the loop.
Description EVAL Descriptive title (e.g., Gain) 0 for Pass 1 for Fail 2 for compare against High/Low Limits 4 for same as 2, but use present memory-real value as measured value Not used Not used Not used unless the range is 2 or 4 Not used unless the range is 2 or 4
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Execute User-Written Routine: Execute routine written by user. The called routine
can be written in any language that generates a .EXE or .COM file. During spec file execution, the specified routine is loaded into memory with the MDA software, then executed. Once it has completed operation, control is resumed with the MDA software. If the DOS error level is non-zero upon return, the test fails. If it is zero, the test passes. If the System reports a DOS error 8, the EXECed program is too large to fit into the available RAM memory. Exec first looks in the current directory for the .EXE or .COM file. If it isnt found here it searches through the directory locations in the DOS PATH environment variable. Only if the file is not in any of these locations does the System report a DOS error 2. The test title describes the program name to EXEC. It can also specify command line parameters to pass to the program. The up arrow (^ ) specifies to send whatever in the title follows as a parameter. You can also include in the title: @i to pass the value of the memory integer, @s to pass the value of the memory string, @b to pass the value of the batch string, @c to pass the value of the compare string, @d# to pass the value of the #th display string, @r to pass the value of the memory real, @n to pass the step number being executed at the time of the call, and @u# to pass the value of the #th UUT ID string. If the first test title field is a string variable parameter, instead of a file name, then EXEC uses the first field of that string as the file name. A file name may include a path. Any fields that follow the file name obtained from a string variable are prepended to any other title field parameters and sent as command line parameters to the executable file.
Description EXEC Name of routine to execute. If the name has a up-arrow (^ ), the data following the up-arrow is passed to the execed routine as a parameter string. If no extension (e.g., .EXE or .COM) is specified, the System adds on, as a default, .EXE. See text above for more detail about passable parameters. Not used Not used 0 = normal execution 1 = do not generate or report results 2 = load DOS exit code from executed program into the memory integer variable 4 = load DOS error code from executed program into the memory integer variable Not used Not used
Range From Port To Port
Low Lim High Lim
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Memory Manipulation Test Types

The memory manipulation test types (MEMI, MEMR, MEMS) allow use of the Systems memory to assign, keep track of, manipulate, and use variables within a test program. There are three kinds of memory variables: an integer, a real (floating point), and three strings: 1. Integers are whole numbers ranging from plus to minus 32,767. 2. Real variables can include a fractional part and can range from plus to minus 10E37. 3. String variables can be up to 32 characters long and can include any normal ASCII characters. There are three string variables. The second string variable (referred to as the "Compare String") can be used to make pass/fail comparisons against the primary string variable. The "Batch Memory String" is only cleared between batches. As such, you can use it to solicit input about the batch as a whole (e.g., batch number, UUT configuration), then not ask the operator again until a new batch has started. You can do this by checking to see if the batch memory string is empty, and if so, asking the operator to enter it. These steps allow entry or assignment of the memory contents, pass/fail test generation based on the value of the memory contents, fundamental math and manipulation of the memory contents, transfer of control based on the contents of memory, or display of the variable. These test steps can be used to form a counter, to control program execution based on operator entry, or as an alternate way to generate test results based on operator entry.
Memory Manipulation (Integer): Allow manipulation of integer memory location.

See table listings below and on following pages. Parameter Test Type Title Range Description MEMI Description of the test step, or label of the jump destination for jumps based on the memory number (used when range is 20 - 23). Type of operation to perform on the memory location: 1 = Assign the memory location as the value entered in the Low-Lim of this test step. 2 = Perform a pass/fail test based on the value of the memory location as compared to the high and low test limits.
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Range, cont.
3 = Operator entry of the value. Place the entry cursor in the column/row of the display as indicated by the low/high limits respectively. 4 = Same as 3, but accept one character only with no [Enter] required. 5 = Display the memory value at the column/row of the display as indicated by the low/high limits respectively. 6 = Write the value of the memory location to a file named in the test title. 7 = Read the value of the memory location from a file named in the test title. 8 = Perform a logical shift-left operation on the memory location by the number of bits specified by the value in the Low-Lim. 9 = Perform a logical shift-right operation on the memory location by the number of bits specified by the value in the Low-Lim. 10 = Add the value in Low-Lim to the memory location. 11 = Multiply the memory location by the value in the Low-Lim. 12 = Perform a logical and operation on the memory location with the value in the Low-Lim. 13 = Perform a logical or operation on the memory location with the value in the Low-Lim. 14 = Perform a logical not operation on the memory location. 15 = Move the contents of the memory location into the sequence counter used by the RPRTS test type. 16 = Move the contents of the memory location into the high limit of the next test step. This can be used, for example, to set the output for a DIGO command. 17 = Move the contents of the memory integer location into the memory real location. 18 = Read the specified test program data into the integer memory. The Low Limit is the step number of the test program. If the Low Limit is between 1001 and 2000, then the step number is the amount above 1000 forwards from the current step. If the Low Limit is above 2000, then the step number is the amount above 2000 backwards from the current step. The High Limit indicates the data of that step number to read: 1 = From point, 2 = To point, 3 = Test Range, 4 = Low Limit, 5 = High Limit, 6 = Measured, 7 = Nominal.
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Range, cont.
19 = Write the value in integer memory into the specified test program location. The Low Limit is the step number of the test program to write to. If the Low Limit is between 1001 and 2000, then the step number is the amount above 1000 forwards from the current step. If the Low Limit is above 2000, then the step number is the amount above 2000 backwards from the current step. The High Limit indicates the data of that step number to write: 1 = From point, 2 = To point, 3 = Test Range, 4 = Low Lim, 5 = High Limit, 6 = Measured, 7 = Nominal. 20 = Jump to the label in the Title if the memory value is greater than or equal to the Low-Lim and less than or equal to the High-Lim. 21 = Jump to the label in the Title if the memory value is less than or equal to the High-Lim. 22 = Jump to the label in the Title if the memory value is greater than or equal to the Low-Lim. 23 = Jump to the label in the Title if the memory value is less than the Low-Lim or greater than the High-Lim. 24 = Divide the memory value by the integer part of the Low-Lim. 25 = Set the memory value to the step number of the last failed step or to zero if no failures. 26 = Set the memory value to the current jump error count. 27 = Set the memory value to the current system error count. 28 = Set the memory value to the length of the memory string variable. 29 = Add to the memory integer variable the ASCII value of the character in the low limit location of the memory string and subtract from the memory integer variable the value in the high limit. 30 = Swap the contents of MEMI and the total number of assemblies tested in this batch. 31 = Swap the contents of MEMI and the total number of assemblies that have failed in this batch. 32 = Load MEMI with the eight bit key_pad mask value. 33 = Load the key_pad mask value with the lower eight bits in MEMI. 34 = Append the value of the memory location as a line at the end of the file named in the test title. 35 = Read line specified by the low limit from the file named in the test title into the memory integer variable. If there is a read error or if the line doesnt contain a valid integer representation, then the memory integer is left untouched and a fail beep is emitted. 36 = Set keypad LEDs according to the two least significant memory integer bits. A value of 0 clears the LEDs, 1 turns on testing LED, 2 turns on pass LED, 3 turns on fail LED.
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Range, cont.
37 = Returns the starting IO address configured for the specified module. The module type is specified by the low limit: 0 = TR-4/TR-8 System Module, 1 = Multiplexer Module, 2 = TR-6, 3 = TR-6-1, 4 = G-80, 5 = RM-1, 6 = GPIB, 7 = TR-8-PWR, 8 = TR-8-SMT, 9 = TR-8-SMT-CAP. The high limit specifies the board index, starting at 1, where multiple boards can be configured such as MPX Modules, TR-6-1, TR-8-SMT, or TR-8-SMT-CAP. Not used Not used See range assignment for usage See range assignment for usage
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Memory Manipulation (Real): Allow manipulation of a real (floating point) memory

location. Parameter Test Type Title Range Description MEMR Description of the test step, or label of the jump destination for jumps based on the memory number (used when range is 20-23). Type of operation to perform on the memory location: 1 = Assign the memory location as the value entered in the Low-Lim of this test step. 2 = Perform a pass/fail test based on value of the memory location as compared to the high and low test limits. 3 = Operator entry of the value. Place the entry cursor in the column/row of the display as indicated by the low/high limits respectively. 4 = Same as 3, but accept one character only with no [Enter] required . 5 = Display the memory value at the column/row of the display as indicated by the low/high limits respectively. 6 = Write the value of the memory location to a file named in the test title. 7 = Read the value of the memory location from a file named in the test title. 10 = Add the value in the Low-Lim to the memory location. 11 = Multiply the memory location by the value in Low-Lim. 16 = Move the contents of the measured value from the last test step into memory real. This can be used, for example, to obtain a measured value, then make calculations based on the outcome. 17 = Move the contents of the memory real location into the memory integer location. If the value is greater than 32,767, transfer the number -1 as an error indication. 18 = Read the specified spec data into the memory real location. The Low-Lim is the step number of the spec file. If the Low-Lim is between 1001 and 2000 then the step number is the amount above 1000 forwards from the current step. If the Low-Lim is above 2000 then the step number is the amount above 2000 backwards from the current step. The High-Lim indicates the data of that step number to read: 1 = From pin, 2 = To pin, 3 = Test Range, 4 = Low-Lim, 5 = High-Lim, 6 = Measured, 7 = Nominal.
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Range, cont.
19 = Write the memory real contents into the specified spec file location. The Low-Lim is the step number of the spec file to write to. If the Low-Lim is between 1001 and 2000 then the step number is the amount above 1000 forwards from the current step. If the Low-Lim is above 2000 then the step number is the amount above 2000 backwards from the current step. The High-Lim indicates the data of that step number to write: 1 =From pin, 2 =To pin, 3 =Test Range, 4 = LowLim, 5 = High-Lim, 6 = Measured, 7 = Nominal. 20 = Jump to the label in the Title if the memory value is greater than or equal to the Low-Lim and less than or equal to the High-Lim. 21 = Jump to the label in the Title if the memory value is less than or equal to the High-Lim. 22 = Jump to the label in the Title if the memory value is greater than or equal to the Low-Lim. 23 = Jump to the label in the Title if the memory value is less than the Low-Lim or greater than the High-Lim. 24 = Divide the memory value by the Low-Lim. 26 = Save the current time (in Sec past midnight) in the Memory-Time location. 27 = Save the current time (in Sec past midnight) in the Memory-Real location. 28 = Wait until the number of seconds specified in the Low-Lim have past since the Memory-Time location has been saved (see range 26), then continue to the next test step (note: at midnight the delay may be smaller). 29 = Compute the amount of time (in seconds) since the Memory-Time location has been saved (see range 26) and place the result in the Memory-Real location. 30 = Swap the contents of the Memory-Real location and the Memory-Time locations. 31 = Set the memory real location to the measured value of the closest lower-numbered, unskipped, test step with a measured value. 32 = Convert the memory real location into a string having a maximum width specified by the low limit value and having the number of digits to the right of the decimal point specified by the high limit. The high limit must be less than or equal to the low limit amount. 33 = Append the value of the memory location as a line at the end of the file named in the test title. 35 = Read the file line number found in the Low-Lim into the memory variable from the file named in the test title. Not used Not used See range assignment for usage See range assignment for usage
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Memory Manipulation (String): Allow manipulation of a character-string memory

location.
Description MEMS Description of the test step, or as described below. Type of operation to perform on the memory location: 1 = Assign the memory location as the value entered in the Title of this test step. 2 = Perform a pass/fail test based on the memory string being equal to the compare string (pass) or not (fail). 3 = Operator entry of the value. Place the entry cursor in the column/row of the display as indicated by the low/high limits respectively. 4 = Same as 3, but accept one character only with no [Enter] required. 5 = Display the memory value at the column/row of the display as indicated by the low/high limits respectively. 6 = Write the value of the memory location to a file named in the test title. 7 = Read the value of the memory location from a file named in the test title. 9 = Add the string in the Title to the beginning of the memory location. 10 = Add the string in the Title to the end of the memory location. 11 = Make the memory string upper case. 12 = Convert the memory string to a substring starting at the Low-Lim character number and being High-Lim characters long. 13 = Transfer the memory string to the UUT ID field of the test results. 14 = Assign the memory location as the value saved for the Assembly ID. 15 = Swap the contents of the memory string and the compare string. 16 = Convert the string to an integer variable and put the result into the location used by MEMI. If there is an error, convert it to -1. 17 = Convert the string to a real variable and put the result into the location used by MEMR. If there is an error, convert it to -1. 18 = Swap the contents of the batch memory string with the contents of the main memory string.
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Range, cont.
19 = Copy the contents of the batch memory string to the main memory string. 20 = Jump to the label in the Title if the memory string value is the same as the compare string. 21 = Jump to the label in the Title if the memory string value is not the same as the compare string. 22 = Jump to the label in the Title if the memory string value is less than the compare string (when compared on an ASCII basis). 24 = Read the test title of the specified spec data step into the memory string location. The Low-Lim is the step number of the spec file to read from. 25 = Write the memory string contents into the specified spec file test title. The Low-Lim is the step number of the spec file to write to. If the Low-Lim is between 1001 and 2000 then the step number is the amount above 1000 forwards from the current step. If the Low-Lim is above 2000 then the step number is the amount above 2000 backwards from the current step. 26 = Swap the memory string contents with those of a storage string named "operator id". Can be used as a spare storage location. 27 = Swap the memory string contents with those of a storage string named "part id". Can be used as a spare storage location. 28 = Add to the end of the memory string the character whose ASCII value equals the memory integer value plus that in the test step high limit. 29 = Copy the UUT ID string into the memory string. 30 = Copy the memory string into the batch report special string. 31 = Copy the memory string into the test report special string. 32 = Append the value of the memory location as a line at the end of the file name in the test title. 33 = Swap the memory location with the UUT ID string identified by the low limit index. A low limit value of 0 accesses the UUT ID string for one UUT ID per panel. For multiple UUT IDs per panel the low limit value equal to the PCB number accesses the UUT ID for that PCB.
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Range, cont.
34 = Add the test title of the test step identified in the low limit to the beginning of the memory string. If the Low-Lim is between 1001 and 2000 then the step is the amount above 1000 forwards from the current step. If the Low-Lim is above 2000 then the step number is the amount above 2000 backwards from the current step. 35 = Open the file name specified in the Test Title, read the data from the line that is specified by the Low Limit, and set the memory string to the value on that line. 36 = Add the test title of the test step identified in the low limit to the end of the memory string. If the Low-Lim is between 1001 and 2000 then the step is the amount above 1000 forwards from the current step. If the Low-Lim is above 2000 then the step number is the amount above 2000 backwards from the current step. 37 = Get a message line from User Display into memory string (row = Low Limit). 38 = Get a line of Display Attributes from User Display into memory string (row = Low Limit). 39 = Write a line of Display Attributes from memory string to User Display Area (row = Low Limit). 40 = Write the memory string contents into the specified spec file test title in the same manner as MEMS 25. In addition any test title changes for JMP or LABEL operations are recognized by the system software. For example 41 = Set the memory string to the current date in YYYYMMDD format. 43 = Set the memory string to the test system software type: "TR-8" or "TR-4" (not including the quotes). 44 = Set the memory string to the name of the currently executing test program. 45 = Set the memory string to the name of the calling program if the currently executing test program was called with a RUNT or to an empty string otherwise. 46 = Deletes the file specified in the memory string. The memory string may include a path preceding the file name. Not used Not used See range assignment for usage See range assignment for usage
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General Purpose Interface Bus I/O

GPIB Control: Allows control of external instrumentation connected via the IEEE-488
interface. Use of this capability requires installation of the optional Model-GPIB interface that is available from CheckSum. This interface installs into an extra slot in your PC. The Model-GPIB can be used for most common IEEE-488 operations by use of the GPIB test step. However, if you have special needs, such as processing waveform or binary data, you can write a program in a common language, such as C or PASCAL, then call it with the EXEC test type. Information can be passed back and forth with files written to hard-disk or a ram-disk. In addition, data can be passed to the EXECed program as a command line parameter. Since the GPIB provided by CheckSum is provided with a toolkit, and since a device driver is not necessary, it is not extremely difficult to do your own specialized routines. In general, when using the GPIB test type, you will specify the address of the instrument on the bus. This is uniquely set for each instrument on the bus (dont use 21 since that is the system controller address). For reads and writes, the transferred data can be up to 255 characters long. For detailed information about what occurs during GPIB commands, refer to the manual that comes with the Model-GPIB. The commands available from the CheckSum software are almost one-for-one implementations of the commands described therein. When writing information to the bus, you can choose from sending the information in the test title (the to-pin is 0 in this case), sending the information in a display line (just like the data used for the DISP test type - the to-pin is 1 in this case), sending information from a disk file (the to-pin is 37 in this case and the test title contains the name of the file to open and read), or you can directly send the contents of a memory variable (to-pin is 38, 39, and 40 for the mem string, mem real, and mem integer respectively). When reading information from the bus, you can specify that the returned information goes into a memory location (to-pin is 0, 1, and 2 for the mem real, mem string, and mem integer respectively), or to send the data to a disk file (the to-pin is 3 in this case and the test title contains the name of the file to create and write to).
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GPIB Syntax:
Input from GPIB Device (ieenter) Parameter Range From Port To Port
Description
0 device address 0 = num in memr 1 = string in mems 2 = int in memi 3 = write to disk file named in title Output to GPIB Device (ieoutput) Parameter Range From Port To Port Description 1 device address 0 = data in test title 1-36 = data in DISP area 37 = data from file named in title 38 = data from mem string 39 = data from mem real 40 = data from mem integer Description
Abort (ieabort) Parameter Range 2 Device Clear (iedevclr) Parameter Range From Port 3 >0 = device 0 = full bus Set Bus Terminators (ieeol) Parameter Range From Port 4 device address Description Description
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Title
a,b,c,d, where: a = out term 0 = oel/eoi 1 = eoi 2 = oel b = eol string c = in term (like a) d = input term char Description
I/F Init (ieinit) Parameter Range From Port To Port 5 GPIB address [21] total of [0]: 32768 background DMA 16384 block DMA 4096 fast 32 non-system controller 16 IRQ 2 17 IRQ 3 19 IRQ 5 21 IRQ 7 1 DMA 1 2 DMA 2 3 DMA 3 Local Lockout (iello) Parameter Range 6 From Port device address Remote (ieremote) Parameter Range 7 From Port device address User Command (iesend) Parameter Range To Port Description 8 0 = data in title 1-36 = data in DISP 37 = data in file named in title Description Description
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Serial Poll (iespoll) Parameter Range From Port Status (iestatus) Parameter Range To Port 10 8 = error num 9 = byte count (puts into memi) Description 11 >0 = depends on microprocessor 0 = disable Description 12 device address Description 9 device address (puts into memi) Description
Timeout (ietimeout) Parameter Range To Port Trigger (ietrig) Parameter Range From Port
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RS232 Serial Interface I/O

RS232 Control: Allows communication with serial port devices.
The RS232 test type allows flexible input and output of data to the controllers COM ports 1 through 4. Data strings of up to 255 characters can be transferred. When sending data, the data transmission can have an optional preamble and/or postamble string of up to 32 characters. As alternatives to use of the RS232 test type, you can write a .EXE or .COM file and call it with the EXEC test type, or you can use the MEMS test type with a file name designating a serial port (e.g., COM1). However, these alternatives are generally not as flexible as the RS232 test type. When writing information to the port, you can choose between sending the information from the test title (the to-pin is 0 in this case), sending the information from a display line (just like the data used for the DISP test type - the to-pin is between 1 and 36 in this case), sending information from a disk file (the to-pin is 37 in this case and the test title contains the name of the file to open and read), or you can directly send the contents of a memory variable (to-pin is 38, 39, and 40 for the mem string, mem real, and mem integer respectively). When reading information from the port, you can specify that the returned information goes into a memory location (to-pin is 0, 1, and 2 for the mem real, mem string, and mem integer respectively), or to send the data to a disk file (the to-pin is 3 in this case and the test title contains the name of the file to create and write to).
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RS232 Syntax:
Input from RS232 Device Parameter Range From Port To Port (destination of data read)
Description
0 device address of desired COM port (e.g., 1 for COM1) 0 = num in memr 1 = string in mems 2 = int in memi 3 = write to disk file named in title Description 1 device address of desired COM port (e.g., 1 for COM1) 0 = data in test title 1-36 = data in DISP area 37 = data from file named in title 38 = data from mem string 39 = data from mem real 40 = data from mem integer Description
Output to RS232 Device Parameter Range From Port To Port (source of data sent)
Device Clear Parameter Range From Port 3 >0 = clear status for com port number (e.g.,1 for COM1) 0 = clear status for all com ports Set Communication Parameters Parameter Range From Port To Port Description 4 device address of desired COM port (e.g., 1 for COM1) Parameter Initialized: 0 = UART communication parameters. The baud rate, data length, parity, and stop bit length are respectively defined by comma separated values. The parity is specified by a single character and the other values by numeric values. The allowed baud rate is from 50 to 115200. The data length is from 5 to 8. The stop bit length can be 1 or 2 bits. Parity can be specified as N for none, E for even, O for odd, M for mark, or S for space.
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To Port, cont.
1=
2=
3=
4=
5=
6=
7=
8=
9=
optional transmission preamble. The default is no preamble. A non-null preamble is specified by a sequence of decimal values for the ASCII characters in the preamble. Each decimal value consists of the pound sign (#) followed by a decimal number in the range from 0 to 127. An empty string sets the preamble to null. end of transmission postamble. The default is carriage return, line feed (# 13# 10). A non-null postamble is specified by a sequence of decimal values for the ASCII characters in the postamble. Each decimal value consists of the pound sign (#) followed by a decimal number in the range from 0 to 127. An empty input string sets the postamble to null. soft start character. The default soft start character is control-S. A non-null character is specified by a pound sign (#) followed by a decimal number in the range from 0 to 31. The start must differ from the stop character. soft stop character. The default soft stop character is control-Q. A non-null character is specified by a pound sign (#) followed by a decimal number in the range from 0 to 31. The stop must differ from the start character. enable/disable software handshaking. The default mode is off. A value of 0 disables and 1 enables use of the soft characters to control character transmission. RTS Off Limit. The default limit is 0 bytes, the maximum size is 254 bytes. Above the Off Limit, the RTS line is deasserted then not reasserted until the count drops below the RTS On Limit. If the value specified is less than the On Limit, it is set to the On Limit. RTS On Limit. The default limit is 0 bytes, the maximum size is 254 bytes. When the buffer count drops below the RTS On Limit the RTS line is asserted. If the value specified is greater than the current Off Limit then the Off Limit is also set to the new value. enable/disable RTS hardware handshaking. The default mode is off. A value of 0 disables and 1 enables the use of the RTS output line to control character transmission. enable/disable CTS hardware handshaking. The default mode is off. A value of 0 disables and 1 enables the use of the CTS line to control character transmission. When enabled transmission is gated by assertion and deassertion of the CTS input line.
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Status Parameter Range From Port Description 10 >0 = read status for this com port number (e.g., 1 for COM1) 0 = show an error status bit if set for any com port (puts value into memi) Description 11 device address of desired COM port (e.g., 1 for COM1) 0 = disable IO timeouts >0 = number of .1 second increments to wait before timing out when a transmission should be active, but is not. The default timeout is 10 seconds.
Timeout Parameter Range From Port To Port
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Miscellaneous Tests
Turn Fixture Vacuum On and Off: Turns vacuum on and off to the test fixture.
The fixture can be built with a fixture-down switch, typically consisting of two spring probes that touch a common target when the fixture is engaged. If this is the case, you can specify that the System waits for this switch to become true (low resistance) before continuing. Otherwise, you can specify a wait time before the system continues after applying vacuum. This test-type controls bit 7 of the DIGI/O bits available on the Model TR-4 System Module. Vacuum-on is a low output and vacuum-off is a high output.
Description VACUM Not used except as an optional comment field. 0 - Remove vacuum from fixture 1 - Apply vacuum to fixture First test point connected to fixture-down switch. Second test point connected to fixture-down switch. Time, in mSec, to wait after applying vacuum but before continuing with next test step. If a fixture-down switch is used, the delay time to wait after the fixture-down switch is activated. Maximum resistance (in Ohms) before considering the fixture-down switch to be closed. If zero, do not measure the fixture-down switch.
High Lim
Fixture Control: Engages and Disengages probes onto UUT in fixture.

This test type activates or deactivates the fixture to engage or disengage probes onto the UUT. It can also be used to control a discharge module (such as Model DM-1) that is connected to the system and operating in remote mode. The fixture can be built with a fixture-engaged switch, typically consisting of two spring probes that touch a common target when the fixture is engaged. If this is the case, you can specify that the system waits for this switch to become true (low resistance) before continuing. Otherwise, you can specify a wait time before the system continues after activating the fixture.
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This test-type controls bit 7 of the DIGI/O bits available on the Model TR-4 System Module as the fixture control. The control line is active low to engage probes and high to disengage. DIGI/O bits 1 through 3 are used if and only if a discharge is specified. See Figure A-5 for details.
Description FIXCT Not used except as an optional comment field. 0 - Release UUT from test probes Engage UUT onto test probes via Fixture 1 control Dont display user warning if discharge module is set to BYPASS a discharge operation when a discharge is requested. This is used along with range mask value of 8. 8 - On Fixture 1 engagement, perform a discharge of Fixture 1 testpoints connected through a discharge module then connect the testpoints up to the test system. For fixture 1 disengage, this places discharge module switches in the discharge position when operating remotely. First test point connected to fixture-down switch. Second test point connected to fixture-down switch. Time, in mSec, to wait after applying vacuum but before continuing with next test step. If a fixture-down switch is used, the delay time to wait after the fixture-down switch is activated. Maximum resistance (in Ohms) before considering the fixture-down switch to be closed. If zero, do not measure the fixture-down switch. 14-
High Lim
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Control Relays: Control relays on the Model TR-6 and TR-6-1 Modules.
Controls the four undedicated form-C relays available at the Model TR-6 back panel. These can be used to switch external signals, apply power directly (up to 1 A) or to control other higher-power relays. These relays are reset each time a test program is started. Note that all four undedicated relays are programmed (either set or reset as specified) each time that this command is executed. Each Model TR-6-1 MPX module contains four undedicated relays connected to an IDC-style header on the MPX module. These can also be controlled with this test type. This test type can also be used to override automated control of the Model TR-6 and TR-6-1 test point relays. If a range of 7-10 is specified, the high limit controls one of the test point relays by either opening or closing it to the high or low relay bus. When this occurs, it also puts the System into a mode that stops these relays from being reset between tests, and as a consequence, allow you to do special switching (such as bussing together several test points). There is both a high bus and low bus on the relay channels that can separately be controlled and connected. When in relay override mode, if you make a measurement to a test point on the relay bus, the relays from the measurement are also not reset, and you must reset them explicitly with this command if closed. The System resets all the relays and goes back into normal mode when a range of 11 is executed, and at the end of the test program execution. Note Use extreme caution when overriding the standard TR-6 relay test point switching since in this mode you could damage the UUT or test system.
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Description RELAY Normally not used Which module to close relays on: 0 = TR-6 System Module 1 = First TR-6-1 MPX Module 2 = Next TR-6-1 MPX Module . = ... 7 = Set a relay test point to the high bus 8 = Reset a relay test point from the high bus 9 = Set a relay test point to the low bus 10 = Reset a relay test point from the low bus 11 = Reset all high/low relays from the buses and go back to normal switching mode
Not used Not used Not used Sum of the following: 1 2 4 8 = = = = Relay 1 Relay 2 Relay 3 Relay 4 closed closed closed closed
or the test point number for ranges 7-10.
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Fixture-Check: Tests connection of UUT to fixture.

Fixture-check allows you to determine if fixture connections from the Test System to the UUT (typically via spring probes) are making good contact. This is performed by measuring the resistance of each pin to all other pins and ensuring that the result is below a specified resistance threshold. The name and point number of any pins not meeting the desired criteria are displayed to the operator. The operator can take corrective action and then repeat the fixture-check to see if problems are still present, or continue to the next step of the test program. If errors occur, the System erases the message area of the testing display before and after presentation of the errors. Programming and use of fixture-check is described in detail in Chapter 7 of this manual.
Description FIXCH Not used except as an optional comment field. Not used. Not used. Not used. Not used. Not used.
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Print Test Results: Allows the System to print a test report from within a test
program. The test report is printed in the same format as configured for test reports requested from the System Configuration Configure SPC Logging & Automatic Reporting screen. This function can be used, for example, if a number of similar assemblies are tested repetitively in a loop without exiting the test execution between assemblies. (See also the ERROR test type CLEAR ALL option for initializing the loop results before testing an assembly.) This test step also allows the system to programatically change the SPC log data path or report data path and reconfigure automatic test reporting. Early versions of Model TR-4/6 software used an alternate reporting test type (REPRT) that was more limited in scope and is not recommended for new spec files. For example, to print test result failures to a COM1 printer only when there are test failures use RPRTS range 10 with a title of COM1. If the report is to include results from test steps which pass and report to the default test result device (specified on the Test Completed menu) then use a range of 74 and a blank title. To log to the SPC file summary only information use a range of 36. To log to the SPC file summary and failure information use a range of 164. To log to the SPC file summary, failure and passing test information use a range of 228.
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Description RPRTS Output device. For example, LPT1, COM1 or a file name. Sum of the following: 1 - Include a sequence number in the test report to describe which assembly of the batch is being reported on. The sequence number starts over each time the spec file is restarted. 2 - Print results report to file named in test title or to the default test report output device if no title. 4 - Print results to SPC log. 8 - Print report only if failures occur in the jump error count. 16- Clear out all test results after report(s). 32- Report summary information. (For SPC only.) 64- Report on test steps which pass. 128- Report on test steps which fail. (For SPC only.) 256- Set SPC data path or Report data path to memory string value. 512- Set Auto Reporting Configuration 1024-Print Batch Report to the output device named in the test title or the default batch report device if the test title is blank. 4096-Print Production Report to the output device named in the test title or the default SPC report device if the test title is blank. 8192-Print Pareto Report to the output device named in the test title or the default SPC report device if the test title is blank. Used By Range = 256 0 - update SPC data path from memory string value 1 - update Report data path from memory string value Used By Range = 512 1 - automatic report on failed assemblies 2 - automatic report on passed and failed assemblies 4 - automatic report of failed results data only (all results otherwise) Not used Not used
From Port
To Port
Low Lim High Lim
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Sound the PCs Beeper: Sounds the PCs beeper with either a single tone beep or the
warble-like beep used during failures.
Description BEEP Not used 0 is normal beep. 1 is warble-like beep. Not used Not used Not used Not used
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Turn Test Condition Flags On/Off: Turn testing conditions on or off during
execution of test. The internal calibration mode (FLAGS 16384) can be used to force a self-calibration cycle of the TR-4 System Module internal voltage references. Self-calibration also occurs automatically each time the MDA software is started. When a spec file is executing and a FLAGS 16384 is encountered, and it has been over an hour since the last internal calibration, a new self-calibration (requiring about two seconds) will occur. Internal calibration can lead to better accuracy if the tester is operated for long periods of time (e.g., over a day) without restarting the software (and hence forcing an internal calibration) or when the system is operated in greatly fluctuating temperatures.
Description FLAGS Not used 1 = do not halt on fail 2 = halt on failure 4 = set disconnect of TR-6 sources when new connection of same source 8 = allow multiple TR-6 sources (opposite of 4) 16 = restore halt on fail to the default value 32 = do not single step 48 = single step 64 = restore single step to the default value 80 = enable 10 volt clamp to ground on solid-state multiplexer* test points (default setting). 96 = enable 12 volt clamp to ground on solid-state multiplexer* test points. 16384 = perform internal system calibration * Note: Applies to MPX-3 modules. Not used Not used Not used Not used
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Put a Remark in the Spec File: Allows putting a remark in the spec file for purposes
of documentation. The test step is ignored for all purposes other than being displayed or printed with the spec file.
Description REM Remarks for spec file documentation Not used Not used Not used Not used Not used
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Test Report Output Control: Allows user-specified remarks to be placed into the
test results. These remarks can be used to provide additional diagnostic or UUT information. These remarks can be included always or based on whether the last step passed, failed, or was skipped. The range value tells where the remark text is located (in the current test title, one of the DISP strings or the mem string value at the time the results are output). The low limit specifies the conditions of the last test step that will cause the remarks to be placed into the results. For example, to output the text from the test title of this test step to column 5 of the test results, only if the previous step failed, use a range of 0, a from-pin of 5, and a low limit of 2. For purposes of pass/fail status, the closest previous test step that generates test results is used. Steps such as REMarks and LABELs are ignored. This test type can also be used to enable or disable output of test results during program execution. This can be used if detailed step results during part of the spec file are not desired. To specify this, use a range of 2000 and a low limit that is the sum of the types of test step outcomes that are to be reported on (0 = none). A subsequent RSLTS test step can change the reporting status back on or to another state.
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Description RSLTS If the range is 0 and the reporting condition is true (see low-lim), this steps Title is printed in the output report. Source of text string to place in the test report if the reporting condition is true: 0 = Use Comment from the Test Title 1..36 = Use Comment from the Display String of the same index 1000 = Use Mem String for comment Output reporting control of subsequent test steps: 2000 = Report on any of following last steps if, and only if, they have results matching outcomes specified in the low limit. 2001 = Same as 2000 but in addition remember the current reporting strategy. 2002 = Restore the results reporting strategy to that before the last use of RSLTS 2001. Specifies the starting column location of the comment in the test report (doesnt apply if range is below 2000). Not used Specifies the test result condition reported on. The sum of any of the following: 1 = test steps which have passed 2 = test steps which have failed 4 = test steps which have been skipped Not used
From Pin To Pin Low Lim
High Lim
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Page 11-88
Appendix A
Wiring Diagrams
CheckSum Model TR-4/6 Manual - Appendix Page A-1
Test Point Connectors (MPX PCB) JP9 AUX IO Connector (System PCB) JP4 Low Source High Source Digital IO 1 Digital IO 3 Digital IO 5 Digital IO 7 1 3 5 7 9 11 13 15 2 4 6 8 10 12 14 16 Low Sense High Sense Digital IO 2 Digital IO 4 Digital IO 6 Digital IO 8 PC +5V JP2 (Jumper) Port 50 Port 48 Port 46 Port 44 Port 42 Port 40 Port 38 Port 36 Port 34 Port 32 Port 30 Port 28 Port 26 Port 24 Port 22 Port 20 Port 18 Port 16 Port 14 Port 12 Port 10 Port 8 Port 6 Port 4 Port 2 50 48 46 44 42 40 38 36 34 32 30 28 26 24 22 20 18 16 14 12 10 8 6 4 2 49 47 45 43 41 39 37 35 33 31 29 27 25 23 21 19 17 15 13 11 9 7 5 3 1 Port 49 Port 47 Port 45 Port 43 Port 41 Port 39 Port 37 Port 35 Port 33 Port 31 Port 29 Port 27 Port 25 Port 23 Port 21 Port 19 Port 17 Port 15 Port 13 Port 11 Port 9 Port 7 Port 5 Port 3 Port 1
Pins are shown from component side of PCB
Add: 50 to port numbers for JP8 100 to port numbers for JP7 150 to port numbers for JP6
Back Panel Connector

DB-15 Female (viewed facing backpanel from rear)
IO Pin Ribbon Cables are wired 1:1 (i.e. pin 1 <-> pin 1, pin 2 <-> pin 2,...)
Low Source Low Sense High Source High Sense Digital IO Bit 1 Digital IO Bit 2 Digital IO Bit 3 Digital IO Bit 4 Digital IO Bit 5 Digital IO Bit 6 Digital IO Bit 7 Digital IO Bit 8 Not Used Not Used (or +5V, see note below) Ground
1 9 2 10 3 11 4 12 5 13 6 14 7 15 8
Figure A1 - TR-4 Connectors
2 4
Relay 1 NC Relay 1 NO Relay 1 Com Relay 2 NC Relay 2 NO Relay 2 Com Relay 3 NC Relay 3 NO Relay 3 Com Relay 4 NC Relay 4 NO Relay 4 Com
2 4
2 4
2 4
1 Amp F5 +12V F3 +5V -12V F4 .1Amp 1 Amp +5VF -12VF +12VF
TP1601 TP1603 TP1605 TP1607 TP1609 TP1611 TP1613 TP1615 Chassis Gnd Relay 1 NC Relay 1 Com Relay 1 NO Relay 3 NC Relay 3 Com Relay 3 NO UCT Gate In SqrV Out Sine Out DMM In Low DigIO1 DigIO3 DigIO5 DigIO7 External IO -12V Fused
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50
TP1602 TP1604 TP1606 TP1608 TP1610 TP1612 TP1614 TP1616 Relay 2 NC Relay 2 Com Relay 2 NO Relay 4 NC Relay 4 Com Relay 4 NO UCT Ch 2 In UCT Ch 1 In Analog Gnd DcV Out DMM In High DigIO2 DigIO4 DigIO6 DigIO8 +5V Fused +12V Fused
REAR PANEL CONNECTOR
Fused Power to Rear Conn.
Figure A2 - TR-6 Connectors
Digital Readback U38 18 16 14 12 9 7 5 3 1Y1 1Y2 1Y3 1Y4 2Y1 2Y2 2Y3 2Y4 1A1 1A2 1A3 1A4 2A1 2A2 2A3 2A4 1G 2G 74HCT244 2 4 6 8 11 13 15 17 1 19 1 1 2 1 9 8 7 5 3 2 14 DN2 U46 1 2 3 4 5 6 7 8 9 10 11 CLR STRB IN1 IN2 IN3 IN4 IN5 IN6 IN7 IN8 GND OUTEN VDD OUT1 OUT2 OUT3 OUT4 OUT5 OUT6 OUT7 OUT8 COMMON 22 21 20 19 18 17 16 15 14 13 12 Digital Output Drive DigIO1 DigIO2 DigIO3 DigIO4 DigIO5 DigIO6 DigIO7 DigIO8 +12V 1 0 9 8 7 6 5 4 3 2 R-Net normally installed in socket - either polarity is equivalent RN3 10K Jumper normally installed for +5V JP1 1 +5V +12V 1 2 3 1 +5V 1 2 3 4 5 6 7 8 10K RN2 Dip 16 15 14 13 12 11 10 9
UCN-5801A
Pull-up for Digital Out
Figure A3 - TR-6 Digital I/O Interface
JP3 K1A 3 K2A 3 K2B 8 2 4 2 4 9 7 1 3 5 7 9 11 13 15 2 4 6 8 10 12 14 16 4 2 4 2 3 K3A 3 K4A
Independent Isolated Relays
TP1 TP3 TP5 TP7 TP9 TP11 TP13 TP15 TP17 TP19 TP21 TP23 TP25 TP27 TP29 TP31 TP33 TP35 TP37 TP39 TP41 TP43 TP45 TP47 TP49
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50
TP2 TP4 TP6 TP8 TP10 TP12 TP14 TP16 TP18 TP20 TP22 TP24 TP26 TP28 TP30 TP32 TP34 TP36 TP38 TP40 TP42 TP44 TP46 TP48 TP50
Back Panel Connector
Figure A4 - TR-6-1 Connectors
Appendix B
Sample Reports
CheckSum Model TR-4/6 Manual - Appendix Page B-1
Figure B1 - Example Test Report
Figure B2 - Example Test Specification Report
Figure B3 - Example Batch Report
Figure B4 - Example Spec File in ASCII Format
Figure B5 - Example Statistics Data File
Figure B6 - Example Wire L ist Report
Figure B7 - Example Production Report
Figure B8 - Example Pareto Report
Figure B9 - Example X-Bar/Sigma Control Report
Appendix C
Command Line Parameters
Overview
The Model TR-4/6 Test System allows you to specially tailor operation with command line parameters. Command line parameters are used when you first invoke CheckSoft Software. Each parameter is entered on the DOS command line following MDA. Each parameter is separated by one or more spaces and can be in upper or lower case. Command line parameters can be incorporated into a batch file that is used to start the System. See your DOS manual for specifics of batch files.
PARAMETERS
Command Line Parameters Parameter Action Quiet operation. Do not write anything to the display (except operator comments that are in the spec file). Used in conjunction with /r to allow an entire test to be performed from a batch file. Note that if /q is invoked from a batch file, the System sets DOS ERRORLEVEL if there is a failure. Otherwise, no error condition is set. Load and run a spec file. When /r is followed by a spec file name, the System automatically loads the requested spec file, then begins execution. Monochrome. Force the displays to be in monochrome, even if the System has a color adapter/monitor. No calibration. Normally, the System measures internal reference values each time the MDA software is invoked. If the System is started with this parameter, the internal references are not measured during power up. Instead, the reference values determined during the last self-test are used. Use of this parameter can provide more consistent operation if the PC is powered up and the software started at a greatly different ambient temperature than normal operating temperature.
/q
/r /m
/nc
CheckSum Model TR-4/6 Manual - Appendix Page C-1
/cf
/sf /sfp
Configuration File. Specify the file name (optionally preceded by a path) for the station configuration file. If not specified, the file name is $TR4$.DAT in the same directory as the MDA.EXE file. The /cf parameter can be used in network configurations so that the MDA.EXE file can be shared, but each station can use its own configuration file which includes the stations unique calibration and setup information. Show Failures. When executing a spec file, display the failed test outcomes on the CRT, even if the System doesnt halt on the test step. This can be used to allow the operator to keep better track of System test activity, but at the expense of a little test speed. Show Failures and Passes. Same as /sf, but also shows passed test steps. Set network retry time. Allows you to specify how long, in seconds, to wait for the system to wait for a network file to become available for use. This time is necessary when more than one System is sharing a file and it is necessary for one System to close the file before the other can use it. The default is 10 seconds. To set a maximum delay of 30 seconds for example, specify /net 30. Defeat use of expanded memory. If the controller has expanded memory, the System will automatically use it for overlaying. This command line parameter forces the System to not use EMS, even if available. Set buffer size for overlaying. The System, as a default, allocates 320 KBytes of RAM memory for overlaying purposes. The /buf command line parameter allows you to allocate a different amount. For example, /buf 400 will allocate 400 KBytes of RAM. Password for exit. If the System is started with this command line parameter, the operator must enter the System password before exiting to DOS ([F10] from the System Menu). Additional SPC Log File output. If /spc .< ext> is specified, the System, whenever writing SPC data to the disk, will also write to the log file having the .< exe> suffix specified. If the < File> is not present, it will be created. The log file name prefix matches that of the default SPC Log File. Time logging. If /tl is specified, the System keeps track of execution time of each test step. This capability can be used to fine-tune test program execution speed by identifying test steps which take excessive time. When /tl is specified, you can press [ALT][M] while in the Enter/Edit Spec Data screen, and the System will display the execution time (in mSec) of each test step in the range column. Resolution of the times is about 50mSec. Pressing [ALT][M] again returns to the regular display. Specify temporary file directory. If /t is specified, the string that follows it specifies the location of the directory used to hold temporary files. These files are used e.g. to create test result reports sorted by PCB number. If no location is specified, then the current directory at the time mda.exe is executed is used. The temporary file location should generally not be a server location shared by more than one test station.
/net
/ems
/buf
/pw
/spc
/tl
/t
/rq /log /km /shell /ppath /spath /mpxlimit

/nocapdcisweep
Load, run a spec file, then quit mda when test completes. When /rq is followed by a spec file name, the System automatically loads the requested spec file, executes the program and returns to DOS. Specify output file for LOGIC test details. Load the lower eight bits of the specified value into the key_pad mask register. Specifies the operating system command shell executed by pressing ALT_D from the main screen. If not specified MDA runs \DOS\command.com. Specifies the spec file directory location in the string following this option. This overrides the spec data path stored in the system configuration. Specifies the SPC Log File directory location in the string following this option. This overrides the statistics data path stored in the system configuration. Specifies the maximum allowed multiplex offset value. Disables DCI cap measurements during measurement sweeps (e.g. from SHIFT_F3) of the measurement analysis screen for capacitors. This is intended to speed analysis of non-DCI capacitor measurements. Specifies the Logic low source voltage. This is specified in the parameter that follows. This is the voltage the TR-6 sources when driving digital inputs low. The default is 0 volts. Specifies the logic high source voltage. This is specified in the parameter that follows. This is the voltage the TR-6 sources when driving digital inputs high. The default is 5 volts. This value should be changed in order to test 3 volt logic. Momentarily disables maskable interrupts during timing critical measurements such as AC resistance. This provides to make such measurements more reliable when DOS MDA is running under Windows 95/98. If this option is used with test programs that make extensive use of such measurements, then system clock time may require resynchronization with an external clock. Disables correction for a defect in the DOS behavior where the system date lags the hardware clock when running on a computer that does not receive any key press for more than one day. This option may be useful when executing from a DOS window on a Windows 9X computer. Displays statistics on the testing and test complete screens. The yield is displayed on the testing screen. The yield, number of failed units, and total number of units tested is displayed on the test complete screen. Disables the ability to Retest an assembly [F2] . The selection [F2] Retest this assembly is not displayed on the Test Completed screen.
/loglo
/loghi
/di
/no_cmos_wr
/dy /nf2
Note that if you have configured automatic reporting, the System will save the results data for you during testing. Following are examples of using command line parameters: 1. Automatically load and begin execution of the spec file PN324. MDA /r pn324 2. Start the System in monochrome mode. MDA /m 3. Run two spec files (named SPEC1 and SPEC2) in succession, transparently, from a batch file. Print a message to the operator telling whether each passed or failed. echo off MDA /r spec1 /q if ERRORL EVEL 1 if NOT ERRORLEVEL MDA /r spec2 /q if ERRORL EVEL 1 if NOT ERRORLEVEL
echo "part 1 fail" 1 echo "part 1 pass" echo "part 2 fail" 1 echo "part 2 pass"
4. Start the System using station configuration data stored in the file STATION9.DAT in the directory CONFIG on device E:. MDA /cf E:\config\station9.dat 5. Start the System enabling time logging. MDA /tl
Appendix D
In Case of Problems
If you suspect problems in the operation of your Test System, you should run the self-test that is available from the Configure/Install System under the TR-4 or TR-6 Hardware Module Configuration menus. Directions for running the self-test are included in the Operating Instructions section of this manual. If the self-test reports a number of errors, it is likely to be caused by an installation problem such as improper jumpering or an address conflict with another module in the PC. If a single test-point or group of points give errors that are the same each time you run the test, there may be a failed component on the MPX Module. If this is the case, you may want to inspect the MPX Module for damage or return it for analysis. Ensure that you do not have any overlapping addresses in the way that you have jumpered the Modules. The address ranges for each Module are shown in the Hardware Configuration screen. The CheckSum Modules (other than the Model-GPIB) do not use interrupts or DMA channels so there can be no conflicts in these areas. If you still have problems, there may be a conflict on the PCs I/O channel. The standard default address range (beginning at 768/300 hex) is reserved by IBM for use with the prototype card so there should be no conflicts with standard PC hardware. Note Network interface cards are often set to the address range beginning at 768 (300 hex) creating a conflict. To determine if there are address conflicts, you may wish to remove suspected cards from your computer and try the Model TR-4/6 Modules again. Dont forget to remove power and observe static-sensitive rules when you do this! In the event another card in the PC is using this I/O space, you may rejumper that card to another spot. Otherwise, you may wish to rejumper the Model TR-4/6 Modules to another base address.
CheckSum Model TR-4/6 Manual - Appendix Page D-1
Note In some cases, other PC cards may use smaller address spaces than the Model TR-4/6 Modules, so it may be easier to find an open area by rejumpering another card.
Base Address 9 8 7 6 5 4 3 2
Value (Decimal) 512 (200 H) 256 (100 H) 128 (80 H) 64 (40 H) 32 (20 H) 16 (10 H) 8 (8 H) 4 (4 H)
The base address is the sum of the values shown above for all of the positions that have jumpers installed. The Module Configuration screen shows the base address range and corresponding jumper setting for each module. The addresses of each module installed in the System must not overlap or conflict with other hardware installed in the computer. The default addresses when shipped are 768 (jumpers on positions 8 and 9) for the Model TR-4 System Module and 776 (jumpers on positions 3, 8 and 9) for the Model TR-4 MPX Module. If additional TR-4 MPX modules are included in the System, they are jumpered at successive address locations (i.e., multiplexer 2 is at 780, 3 is at 784, ...). The Model TR-6 is set to base address 816 (jumpers on 9, 8, 5 and 4). Model TR-6-1 relay MPX modules are installed in 16 address increments beginning at 832 (set by jumpers on 9, 8 and 6). Figure 10-2, 10-3 and 10-5 show the default base address and jumper settings for all of the modules as shipped from CheckSum. When you change a modules base address, you must also go to the applicable Module Configuration menu (10-2, 10-3 or 10-5) and change the corresponding base address entries to match the jumpers of the modules. The configuration screens allows you to enter the base address for each module. After you have entered the address, the System displays the jumper positions that correspond to that module. If the address that you enter is different once it is displayed, it is because the address that you entered cannot be jumpered. For example, it is an odd base address when only even base addresses can be jumpered.
The following table shows how the IBM PC/XT and AT use their I/O ports:
User DMA Controller Interrupt Timer PPI Keyboard DMA Page Register NMI Mask Register Interrupt Controller 2 DMA Controller 2 Math Coprocessor Joystick/Game Controller Expansion Unit Parallel Printer Serial Port (primary) Serial Port (secondary) Prototype Card Fixed Disk Parallel Printer (pri) SDLC Bisynchronous Com. Mono Adapter/Printer Controller
PC/XT 000-00F 020-021 040-043 060-063 n/a 080-083 0A n/a n/a n/a 200-20F 210-217 n/a 3F8-3FF 2F8-2FF 300-31F 320-32F 378-37F 380-38F n/a 3B0-3BF 3D0-3DF 3F0-3F7
AT 000-01F 020-03F 040-05F n/a 060-06F 080-09F 070-07F 0A0-0BF 0C0-0DF 0F8-0FF 200-20F n/a 278-27F 3F8-3FF 2F8-2FF 300-31F 1F0-1F8 378-37F 380-38F 3A0-3AF 3B0-3BF 3D0-3DF 3F0-3F7
CGA Adapter Diskette Controller
Table D1 - Computer I/O Port Assignment
Test-Point Electronics
The Model TR-6 and TR-6-1 use relays for test-point switching. These relays do not normally require replacement except in cases of extreme abuse (in which case there are likely to be other failures on the module). The relays are not field-replaceable and the modules should be returned to CheckSum in the event of a failure. The Model TR-4-1, TR-4-1D and TR-8-1 MPX Modules use high-performance solid-state multiplexers to switch the test signals. These are very reliable parts, but can be damaged from extreme electrostatic discharge or abuse. The multiplexer ICs are socketed on the circuit boards for ease of replacement without damage to the module. On the TR-4-1, TR-4-1D and TR-8-1 MPX Modules, the multiplexer ICs are arranged as follows:
U10 U11 U12 U13 U14
U20 U32 U44
U21 U33 U45
U23 U35 U47
TR-8-1, TR-4-1D, and TR-4-1 MPX Module IC Locations (component side shown)
The table on the following page shows the correlation between the test-points and the solid-state switches on the MPX modules. When the multiplexer module experiences an input voltage at a test-point that is greater than 12V from the computer chassis, the protection networks and multiplexer IC protection circuits attempt to prevent permanent damage to the module. However, sustained overvoltages can damage the multiplexer ICs or protection networks. If one of the test-points fails self-test, you can find its multiplexer IC on the following chart, then replace it. In some cases, the protection network can also be damaged from overvoltage input. In most cases, this can be detected by measuring the voltage at the
test-points with a 10M input DMM while the system is powered up and reset (like when observing the main menu). The voltage should be less than one volt referenced to the PC chassis. If you observe higher voltages, the problem is likely to be caused by a faulty MPX IC and/or protection network. Note Some earlier modules use a DIP-style protection network, if your modules have these networks, the following chart does not apply. The protection networks are located physically adjacent to the module ICs that correspond to the same test-point numbers.
TR-8-1, TR-4-1D, and TR-4-1 MDA TEST-POINT MULTIPLEXER ICs Protection Network: CheckSum PN REMSIM Multiplexer IC: CheckSum PN 011553 Model TR-8-1/TR-4-1D Port No. 1-8 9 - 16 17 - 24 25 - 32 33 - 40 41 - 48 49 - 56 57 - 64 65 - 72 73 - 80 81 - 88 89 - 96 97 - 104 105 - 112 113 - 120 121 - 128 129 - 136 137 - 144 145 - 152 153 - 160 161 - 168 169 - 176 177 - 184 185 - 192 193 - 200 Protection Network DN 25 DN 24 DN 17 DN 16 DN 9 DN 8 DN 23 DN 22 DN 15 DN 14 DN 7 DN 6 DN 21 DN 20 DN 13 DN 12 DN 5 DN 4 DN 19 DN 18 DN 11 DN 10 DN 3 DN 1 DN 2 U10 U12 U11 U13 U20 U32 U44 U21 U33 U45 U23 U35 Multiplexer IC U47
Table D2 - TR-8-1, TR-4-1D, and TR-4-1 Field-Replaceable Parts
MPX-3-200 Modules The MPX-3-200 Module use high-performance solid-state multiplexers to switch the test signals. These are very reliable parts, but can be damaged from extreme electrostatic discharge or abuse. The multiplexer ICs are socketed on the circuit boards for ease of replacement without damage to the module. On the MPX-3-200 Module, the multiplexer ICs are arranged as follows:
MPX-3
U4 U14 U23 U32
U5 U15 U24 U33 U16 U25 U34 U17 U26 U35
MPX-3-200 Module IC Locations (component side shown) When the multiplexer module experiences an input voltage at a test point that is greater than the protection/clamp voltage from the computer chassis, the protection networks and multiplexer IC protection circuits attempt to prevent permanent damage to the module. If a functional, power-up, test requires that the MPX-3-200 test points are exposed to greater than 10V but less than 12V, then the test program must include a command to increase the clamp/protection voltage from the 10V default setting to 12V (see the FLAGS test step, range 96). However, sustained over-voltages can still damage the multiplexer ICs or protection networks. If one of the test-points fails self-test, you can find its multiplexer IC on the following chart, then replace it. In some cases, the protection network can also be damaged from over-voltage input. In most cases, this can be detected by measuring the voltage at the test-points with a 10M input DMM while the system is powered up and reset (in the main menu window). The voltage should be less than one volt referenced to the PC chassis. If you observe higher voltages, the problem is likely to be caused by a faulty MPX-3-200 IC and/or protection network.
The following table shows the correlation between the test-points, protection networks (DNs), and the solid-state switches (multiplexer ICs) on the MPX-3-200 modules. Model MPX-3-200 MDA TEST-POINT MULTIPLEXER ICs Protection Network: CheckSum PN 1500-150 Multiplexer IC: CheckSum PN 011553 MPX-3-200 Test Point No. 1 - 16 17 - 32 33 - 48 49 - 50 51 - 66 67 - 82 83 - 98 99 - 100 101 - 116 117 - 132 133 - 148 149 - 150 151 - 166 167 - 182 183 - 198 199 - 200 Protection Network
DN16 (1, 3, 5, 7, 9, 11, 13, 15) DN15 (2, 4, 6, 8, 10, 12, 14, 16) DN16 (17, 19, 21, 23, 25, 27) DN15 (18, 20, 22, 24, 26, 28) DN8 (29, 31) DN7 (30, 32) DN8 (33, 35, 37, 39, 41, 43, 45, 47) DN7 (34, 36, 38, 40, 42, 44, 46, 48) DN8 (49) DN7 (50) DN14 (51, 53, 55, 57, 59, 61, 63, 65) DN13 (52, 54, 56, 58, 60, 62, 64, 66) DN14 (67, 69, 71, 73, 75, 77) DN13 (68, 70, 72, 74, 76, 78) DN6 (79, 81) DN5 (80, 82) DN6 (83, 85, 87, 89, 91, 93, 95, 97) DN5 (84, 86, 88, 90, 92, 94, 96, 98) DN6 (99) DN5 (100) DN12 (101, 103, 105, 107, 109, 111, 113, 115) DN11 (102, 104, 106, 108, 110, 112, 114, 116) DN12 (117, 119, 121, 123, 125, 127) DN11 (118, 120, 122, 124, 126, 128) DN4 (129, 131) DN3 (130, 132) DN4 (133, 135, 137, 139, 141, 143, 145, 147) DN3 (134, 136, 138, 140, 142, 144, 146, 148) DN4 (149) DN3 (150) DN10 (151, 153, 155, 157, 159, 161, 163, 165) DN9 (152, 154, 156, 158, 160, 162, 164, 166) DN10 (167, 169, 171, 173, 175, 177) DN9 (168, 170, 172, 174, 176, 178) DN2 (179, 181) DN1 (180, 182) DN2 (183, 185, 187, 189, 191, 193, 195, 197) DN1 (184, 186, 188, 190, 192, 194, 196, 198) DN2 (199) DN1 (200)
Multiplexer IC U35 U26 U17 U4 U34 U25 U16 U4 U33 U24 U15 U4 U32 U23 U14 U4
Table D3 - MPX-3-200 Field-Replaceable Parts
Model TR-6 Fuses

The Model TR-6 provides unswitched power at its back panel. Three supplies are provided: + 12V, + 5V, and -12V. The high and low inputs from the relay MPXs are also protected against severe input overloads with two additional fuses. These fuses are checked during self-test of the TR-6 Module. In the event of a failure, you are advised of the likely fuse failure. Fuses are plugged into the top rear of the Model TR-6 System Module. The following table shows the fuse values and uses:
Fuse F1 F2 F3 F4 F5
Value 0.25A 0.25A 1A 0.1A 1A
Model TR-6 Fuses Usage Replacement Relay Test-Point Lo In Wickmann TR5 Fast-Acting 0.25 A Relay Test-Point Hi In +5V Power Output -12V Power Output +12V Power Output Wickmann TR5 Fast-Acting 0.25 A Wickmann TR5 Time-Lag 1 A Wickmann TR5 Time-Lag 0.1 A Wickmann TR5 Time-Lag 1 A
Table D4 - Model TR-6 Fuses
Appendix E
Error Messages
Errors that could occur while reading or writing to and from the computers disk or during other operations include: Error Error Error Error Error Error Error Error Error Error Error Error Error Error Error Error 1 2 3 4 5 12 15 97 99 100 101 103 150 152 156 Message Invalid DOS function number File not found Path not found Too many files open File access denied Invalid file access code Invalid drive number Incorrect spec file revision Not a valid spec data file Disk Read error Disk out of space File Open error Disk is write-protected Drive is not ready Disk seek error Device Write-Fault (normally printer) Hardware failure Division by zero Range check error Stack overflow error Heap overflow error Floating point overflow Floating point underflow Invalid floating point operation Overlay file read error General protection fault
Error 160 Error Error Error Error Error Error Error Error Error Error 162 200 201 202 203 205 206 207 209 216
Table E1 - DOS Error Messages
CheckSum Model TR-4/6 Manual - Appendix Page E-1
CheckSum Model TR-4/6 Manual - Appendix Page E-2
Appendix F
Glossary
Active Port - Port that is being used by the System. Inactive ports are ignored when an assembly is learned for CONTinuity. Ports are assigned to be active or inactive from the Learn Assembly menu selection Assign Connection Information. Data specifying which ports are active is stored with the spec data. Assembly - The unit being tested. A typical assembly might be a cable, harness, backplane, bare or loaded circuit assembly. Assembly Name - An optional name that can be assigned to spec data that identifies the UUT. The assembly name can be up to 32 characters in length. The assembly name is included in reports about the UUT and in some of the System menus. Base Address - Jumpers on the CheckSum Modules that allow the installer to specify where in the computers I/O address space the module resides. The base address must not conflict with other hardware installed in the computer. Batch - A collection of UUTs that share common spec data. Batches might be a shipment of assemblies that need testing or a single assembly with a number of common identical circuits to be tested. Batch Report - A report describing the outcome of testing more than one UUT with common spec data. The batch report includes yield (percent OK), date and time of the test, batch identification, tester ID, testing facility name, and optionally the spec data for the batch. CheckSoft Software - Software that runs on the PC to perform the testing. CheckSoft Software is menu-driven and runs in the DOS environment. Command Line Parameter - Optional information given to the System when it is first started to control operation. Command line parameters can be used to load and run a file, execute self-test, and to configure the System for monochrome operation. Configuration Data - Information that tailors the Systems setup to a particular application so that the System does not need to be configured each time it is used. The configuration data is specified and saved with selections in the Configure/Install System menu.
CheckSum Model TR-4/6 Manual - Appendix Page F-1
Data Path - A string of characters added to the front of the file name when spec data is being retrieved or saved. The data path can be used to specify a device or directory. For example, if the data path were set to B:\ DATA\ , all of the spec data would be saved and retrieved from the directory DATA on disk drive B. Failure Remeasurement Delay - The amount of time (in mSec) that the System waits before taking a resistance remeasurement after a failure. This delay can be used to allow capacitors time to charge. I/O Addressing - The internal bus used for controlling hardware with the 8086/8088/80286/80386/80486 series of computers. Inactive Port - Port that is being ignored. See Active Port. Max Discharge Delay - The amount of time (in mSec) that the System will wait for a test point to become discharged prior to taking a measurement. Measurement Characteristics - The user-configurable table of data that describes how the System takes measurements. Measurement characteristics include the settling time and number of samples averaged on each measurement range. Model TR-4 System Module - The measurement electronics for the MDA Test System that are installed in the PC. Used to passively test assemblies prior to power-up for manufacturing faults such as components installed incorrectly, opens and shorts, and wrong components. Model TR-4-1 MPX Module - The multiplexer modules used with the Model TR-4 MDA System. Each MPX Module contains 200 test points (ports). Model TR-4-1D MPX Module - Same as Model TR-4-1, but also contain 16 bits of digital IO that can be switched-over from the test points. Also have the ability to test zener diodes through the ability to source additional current and measure higher voltages. Model TR-4 MDA System - A Test System consisting of a Model TR-4 System Model, one or more Model TR-4-1 MPX Modules, CheckSoft Software, and cabling to the UUT. These elements are installed into the users PC for testing assemblies. Model TR-3 Fixture System - An optional bed-of-nails vacuum fixture system that can be used to interface the UUT to the Test System. The Model TR-3 uses GenRad 2270-type test heads that are readily available from several sources.
Model TR-5 Fixture System - An optional bed-of-nails mechanical fixture system that can be used to interface the UUT to the Test System. This system does not require a vacuum source. Model TR-6 Functional Test System - A Test System consisting of a Model TR-6 System Module, and usually one or more Model TR-4, TR-4-1(-1) or TR-6-1 Modules, CheckSoft Software, and cabling to the UUT. These elements are installed into the users PC for testing assemblies. Used to perform power-up testing on UUTs. Model GS-850 Fixture - An optional fixture that connects between the MPX Modules and the UUT. It allows the user to quickly and reliably change adapters for interfacing to different UUTs. Operator Comments (or Operator Instructions) - An optional screen of information that can be displayed to the System operator when beginning the test of each type of UUT. Operator comments can be used for various purposes such as to describe how to connect the UUT to the System, which adapters to install, or special precautions for the UUT. Password - A password can be assigned to prevent unauthorized parties from changing the spec data. The password is up to twelve characters long. Pin Name - An optional string of characters assigned by the user that describe the connection to the UUT. Examples might be J4 Pin 7a or U7 Pin 3. Each pin name can contain up to six characters. There can be a unique pin name for each tester port. Ports - The test points (pins) of the Model TR-4-1 or TR-6 MPX Module. Each port is connected to a particular test point of the unit being tested. Report Device - The computer device that will receive information from the computer. The report device can be configured to be the CRT (CONsole), the printer (PRN), a file on the disk (FILE.TXT) or other alternatives. Reporting Facility - Name of the organization doing the testing. If the System is configured with a reporting facility, all of the reports contain a line with the facility name. The reporting facility can be up to 32 characters long and is configured from the Report Configuration menu. Spec Data - Spec(ification) data describing how the UUT is tested. The spec data includes information about each connection such as the test point numbers, the pin names, and upper and lower test limits. Additionally, the spec data includes a list of active pins, measurement characteristics, assembly name, and other information.
Test Report - A report describing the outcome of testing a single UUT against its spec data. This report includes information about each measurement (e.g., port numbers, pin names, upper and lower test limits, actual measured value), the facility name, and tester identification. The test report can be configured to include only failed connections, or all connections. UCT - Universal counter/timer measurement test type. Measures frequency, period or counts between two test points and generates a result (TR-6). UUT - Unit-Under-Test. The assembly being tested by the Test System.
Appendix G
Example Spec File Segments
The CheckSum Model TR-4/6 Test System provides a flexible software environment to solve unique testing problems. This section of the manual shows example spec file segments for special testing situations that you might come across. The first example shows how to check for the position of a switch or jumper on the assembly that you are testing. Two other examples show ways to provide operator adjustment routines (using a potentiometer as an example). These operations are also available with simple pre-written test types (i.e. SWTCH, JMPER, POT), but are shown here as a series of other test types to demonstrate how the System can be used to solve complicated and unique testing problems.
CheckSum Model TR-4/6 Manual - Appendix Page G-1
Jumper/Switch Checking
The following example shows how the System can check for the presence of a closed switch (or installed jumper) on the assembly. The System presents a message to the operator to close the switch, then loops until the switch is closed. The operator can press the [F1] key to exit and record a failure in the event the desired closure cant be achieved.
The first two lines in the spec file segment display DISP messages one and two that instruct the operator to set the switch on. The next test step, RETRY, turns off failure retries and discharging for the subsequent JMPR test. This allows the loop to execute much faster when the test step is not passing. Following the RETRY test step is a label (START) defining the beginning of the loop. A JMPR test step measures the switch to see if it is less than one hundred ohms. If the measurement is less than 100 ohms, the test passes and control goes to the DONE label. If not, a JMPK test step checks to see if the operator has pressed the [F1] key. If the [F1] key has been pressed, control passes to the DONE label. If [F1] has not been pressed, the System JMPs back to the START label to test the switch again. Once the loop is terminated (by a measurement less than 100 ohms or the operator pressing the [F1] key), the System executes a RETRY Reset test step to restore the
RETRY parameters to those when the spec file was started. It then erases the displays with a DISPE test step. Finally, the System makes an RES measurement to log the results of the test and generate a pass/fail. The same technique can be used for testing for open switches (or removed jumpers). Just substitute low and high limits of the JMPR and RES test steps to be something like 100 ohms and 20 Mohm (which displays as > 19M). When testing for open conditions (no connection) you can increase the speed by fixing a low range (like Range = 1, the 190 ohm range). This will prevent the System from autoranging and consequently increase test speed.
Potentiometer Adjustments I
The following example shows how the System can prompt the operator to adjust a potentiometer to a desired value. The System presents a message to the operator to adjust within certain test limits, then loops, making a measurement each time and displaying it to the operator. When the desired resistance value is obtained, or the operator presses the [F1] key, the System measures the final adjusted value and generates a pass or fail result based on the value measured.
This spec file segment works almost exactly like the previous example that shows how jumpers and switches are tested and set. The main difference in this example is that the System displays a measurement each time through the loop. This is done by putting {Meas} into the DISPlay refreshed in the loop. When the System sees {Meas} in a DISPlay line, it substitutes the last measured value from an analog test step.
Potentiometer Adjustments II
The following example shows how the System can prompt the operator to adjust a potentiometer to a desired value. This is similar to the last example. However, in this case, the System stays in the loop until the operator presses the [F1] key. This allows the operator to use his discretion about when the best adjustment is achieved. When the desired adjustment is obtained and the operator has pressed the [F1] key, the System measures the final adjusted value and generates a pass or fail result based on the outcome.
This spec file segment works almost exactly like the previous two examples so you can refer to the description of those for the general idea of how the program flow works. In this case, however, the System takes a measurement, and in all cases continues on through the loop. The tolerances of the JMPR are set loose enough such that the test always passes (e.g., 0 ohms and 20 Mohm). This prevents the System from performing any failure retries and hence speeds operation. In fact, on fast computers you may want to put a PAUSE, as shown in the example, to slow down the refresh rate in the loop.
Screen and Display Attribute Manipulation

The following examples show how to use the SCRN test type for manipulating display attribute (i.e. text color, background color, and character flashing). First we make the area from row 2 to 7, column 20 to 40 to have a black text color (14), a cyan background color (48) character flashing on (128) with the Set Display Attribute operation (512). The resulting total range value is 702. Next we make the adjacent area from column 41 to 60 to have a white text color (15), a red background color (64), and character flashing on (128) with the Set Display Attribute operation as well (512). The resulting total range value is 719. Next we draw the block letter PASS using the DISP command. Then, we save the area from row 2 to 7 and column 20 to 60 to a file named pass.txt. (We will load in this file the next example). Finally, we ask the operator to press [F10] (wait K range = 140) to continue.
Example Spec for Display Attribute Manipulation
Example Display List for SCRN Test Type
The following is the result if we run the test program.
Example Screen Result for SCRN Test Type
The following examples show how to use the SCRN test type for loading an existing message and attribute file. We will use the pass.txt created in the previous example However, instead of putting the message and attribute in row 2 to 7 and column 20 to 60, this time we put them in row 1 to 6 and column 1 to 40. Example Spec for SCRN Load Operation

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Model TR-4/6 Automated Test System INSTRUCTION MANUAL

2-1 2-4 2-5 2-7

3-1 3-6 3-13 3-15 3-15 3-18

4-1 4-2 4-6 4-11 4-16

5-1 5-3 5-6 5-9 5-9 5-10 5-13 5-14 5-19

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6-1 6-4 6-8 6-12

8-1 8-2 8-4 8-8 8-9 8-12 8-14

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10-01 10-03 10-06 10-09 10-12 10-14 10-16 10-19

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Figures & Illustrations

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CheckSum Model TR-4/6 Manual

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CheckSum Model TR-4/6 Manual

CheckSum Model TR-4/6 Manual

CheckSum Model TR-4/6 Manual

Installation Fixturing Creation of a Spec File for a UUT Testing a UUT

CheckSum Model TR-4/6 Manual

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Connecting to the UUT

CheckSum Model TR-4/6 Manual

Creating a Spec File

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Frequency: Output Voltage into Open: Output Impedance:

DC, 100 Hz or 1 KHz sine wave 200 mV or 2 V 600

CheckSum Model TR-4/6 Manual

Capacitance Measurement Characteristics

Frequency: Output Voltage into Open: Output Impedance:

100 Hz or 1 KHz sine wave 200 mV or 2 V 600

Approximate Measurement Speed: 1 KHz: 18 mSec 100 Hz: 130 mSec

CheckSum Model TR-4/6 Manual

Inductance Measurement Characteristics

Frequency: Output Voltage into Open: Output Impedance:

100 Hz or 1 KHz sine wave 200 mV or 2 V 600

Approximate Measurement Speed: 1 KHz: 18 mSec 100 Hz: 130 mSec

Voltage Measurement Characteristics

Range: Typical Accuracy: Speed:

0 to 9.9 V 200 mV 1-2 mSec/measurement

Continuity Measurement Characteristics

CheckSum Model TR-4/6 Manual

Semiconductor Measurement Characteristics

Technique: Typical Accuracy: 0-2 V: 2-9.9 V: Speed:

Digital I/O Capabilities

General: AC/DC Voltage Guarding:

DC Current Guarding: Unguarded Measurement:

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Zener Measurement Characteristics

Accuracy: Approximate Measurement Speed:

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Model TR-6 Functional Test System

Ranges: Accuracy: Resolution: