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Agenda
Innovative solutions
test handlers
> Strip Test > Pick & Place
interface products
> DUT boards > Vertical Probes (Quad Tech) > Cantilever Springs (Blue Line)
In-Process Test
Final Test
Who is Multitest
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El Dorado Hills Santa Clara Dallas Pomona Japan Phoenix Taiwan Philippines
Singapore
Multitest experts are close to your sites for > application support > service including professional installations > post-installation support
Our markets
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Our markets
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Gravity
Gravity
P&P
Instrip
application
tube x4
tube x4 / x8
tray x4 / x8 / x16
Accelerometers
20g/ 50g /100g 3 axis low g X, Y, Z, 45 Z+X, Z+Y YZ = 5DOF Z sinusoidal; XYZ = 6DOF Y, Z, X+Y on request on request Z sinusoidal; XYZ = 6DOF (9DOF on request) Barometric abs.& rel
(on request)
Gas detection MRS XY = 2DOF, XYZ = 3DOF MRS XY = 2DOF, XYZ = 3/6DOF (9DOF on requ.)
humidity MEMS
on request
MEMS tomorrow
> tester
> manipulator + docking
Capital Cost
CoCT =
_________________________
Yield
Lifetime
Variable Cost
Overhead
Utilization
Throughput
> facilities
Capital Cost
CoCT =
_________________________
Yield
Lifetime
Variable Cost
Overhead
Utilization
Throughput
> contacting accuracy and repeatability > open/short rate > test yield / re-test rate
1 2 3 4
Step 1: Standardization
Standard Sensor Test Equipment replaces cost-intensive custom designed solutions:
> ease of operation > ease of maintenance > leverage skills / little additional training needs > convertibility to other sensors applications, exchangeable stimuli > global support > convenient spare supply
Example: Multitest MEMS Cart
Step 2: Modularity
Sensor Test Equipment is combined with Standard Handling Equipment
> ease of operation / maintenance - similar to standard process > leverage skills / little additional training needs > sensor test module can be fully optimized for dedicated requirements > new sensor applications require only changes in the sensor test modules -> fast time to market
Example: Multitest Standard Pick & Place Test Handler with MEMS Cart
> up to 1200 signal lines > high throughput > supporting small packages
Capital Cost
CoCT =
_________________________
Yield
Lifetime
Variable Cost
Overhead
Utilization
Throughput
> contacting accuracy and repeatability > open/short rate > test yield / re-test rate
MEMS Test and Calibration Equipment for best CoTC Best Cost of Test and Calibration is ensured by
Convertibility to changing packages
Exchangeable stimuli
Modular concept that combines best package handling performance with state-of-the art MEMS test solutions
MEMS test modules for high parallel test handling solutions (strip test, test in carriers)
Thank you!
For more information please visit: www.multitest.com/sensor This presentation will be available at
www.multitest.com/SemiconTaiwan
> singulated device handling tube to tube, bowl to bulk, tray to tray > NEW: up to 8/16 contact sites > temperature conditioning (-55C to +155C at +/- 3C accuracy) >fast package conversion (at MT9928, MT9510)
..
> fast package conversion
>temperature conditioning
(-40C to +125C)
MEMS applications
InFlip = Accelerometer 3 axis InPressure = Pressure test InGyro = 6 DOF motion InMagnet + InGyro InPhone
What is InCarrier?
Combined advantages of Singulated Test and InStrip Test
Singulated IC Test
InStrip IC Test
InCarrierTM IC Test
Patented
InCarrier Examples
SO Device in InCarrier
BGA 64 in InCarrier
InCarrier Process
tray tube
Burn-In using
Loader
MT InCarrier sockets
InMEMS = contact Strip Handler + Create map MEMS Test Module file
Sort-unloader
tray T&R