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Taguchi and his school have made signifcant advances in the use of experimental design and analysis in industry. Of particular signifcance is their promotion of the use of statistical methods to achieve certain objectives in a mean response while simultaneously minimizing the variance. This paper shows how the dual response approach can be used to achieve the goals of the Taguchi philosophy within a more rigorous statistical methodology.
Taguchi and his school have made signifcant advances in the use of experimental design and analysis in industry. Of particular signifcance is their promotion of the use of statistical methods to achieve certain objectives in a mean response while simultaneously minimizing the variance. This paper shows how the dual response approach can be used to achieve the goals of the Taguchi philosophy within a more rigorous statistical methodology.
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Taguchi and his school have made signifcant advances in the use of experimental design and analysis in industry. Of particular signifcance is their promotion of the use of statistical methods to achieve certain objectives in a mean response while simultaneously minimizing the variance. This paper shows how the dual response approach can be used to achieve the goals of the Taguchi philosophy within a more rigorous statistical methodology.
Droits d'auteur :
Attribution Non-Commercial (BY-NC)
Formats disponibles
Téléchargez comme PDF, TXT ou lisez en ligne sur Scribd
G. GEOFFREY VINING 0niversityofHorida, Cainesvi//e, Horida 32611 RAYMOND H. MYERS lirginiaPo/ytechnicInstitateandState 0niversity, B/acks/arg, lirginia24061 G. Taguchi and his school have made signifcant advances in the use of experimental design and analysis in industry. Of particular signifcance is their promotion of the use of statistical methods to achieve certain objectives in a mean response while simultaneously minimizing the variance. Unfor tunately, many statisticians criticize the Taguchi techniques of analysis, particularly those based on the signal-to-noise ratio. This paper shows how the dual response approach of optimizing a "primary response" function while satisfying conditions on a "secondary response" function can be used to achieve the goals of the Taguchi philosophy within a more rigorous statistical methodology. An example illustrates this point. Introduction uu industrial statisticians have encoun- tered a need to develop experimental strategies to achieve some target condition for a characteristic of interest while simultaneously minimizing its vari ance. Too often the classical experimental design techniques have been found lacking since they tend to focus solely on the mean of the characteristic. With the current push for quality improvement, the engi neer must be more ambitious than to merely fnd op erating conditions that achieve a target condition on the mean. There must also be an efort to achieve conditions where variability around the target is low. Taguchi (Taguchi [1986], Taguchi and Phadke [1984], Taguchi and Wu [1985]) has highlighted the need for considering both the mean and the variance of the characteristic of interest. Through the param eter design method and the use of signal-to-noise ra tios, Taguchi has developed a total package for ap proaching this problem. Unfortunately, his approach has drawn much criticism, some of which we shall discuss in the next section. Dr. Vining is an Assistant Professor in the Department of Sta tistics. He is a Member of ASQC. Dr. Myers is a Professor in the Department of Statistics and Director of the Statistical Consulting Laboratory. Joural of Qualit Technology 38 This paper seeks to establish that one can achieve the primary goal of the Taguchi philosophy, to obtain a target condition on the mean while minimizing the variance, within a response surface methodologies (RSM) framework. Essentially, this paper views both the mean and the variance as responses of interest. In such a perspective, the dual response approach de veloped by Myers and Carter (1973) provides a more rigorous method for achieving some target for the mean while also achieving some target for the vari ance. The experimenter thus can remain true to the basic intent of the Taguchi method while avoiding many of the problems inherent to parameter design and signal-to-noise ratios. Review of the Taguchi Approach Kackar (1985) ofers an excellent summary of the basic Taguchi method. This section is largely based upon Kackar's article as well as the discussion which follows. Principally, Taguchi advocates the application of experimental strategies to minimize the mean squared error of the characteristic of interest. He con siders three basic situations: 1. "the target is best," where one tries to minimize the mean squared error around a specifc target value; 2. "the larger, the better," where one seeks to maxi mize the characteristic of interest; and Vol. 22, No. 1, Januar 1990 COMBINING TAGUCHI AND RESPONSE SURFACE PHILOSOPHIES: A DUAL RESPONSE APPROACH 39 3. "the smaller, the better," where one tries to mini- mize the characteristic. Fundamental to Taguchi's approach is the "signal-to noise ratio," which he uses as his measure of perfor mance relative to the desired objective. Assume that a process depends upon k variables and assume that the settings of these variables are fxed at particular levels. Let Y1, Y2 , , Ym represent a random sample of m observations taken at these conditions. Taguchi has defned over 60 diferent signal-to-noise ratios, with three of the most important being: 1. -10 IOg lO [ ; . YT l for the smaller is better case; [ 1 m 1 ] 2. -10 loglO L 2 , for the larger is better case; m i1 Yi and 3. 10 log lO [ !], for the target is best case. In this last expression, f is the sample mean and 8 2 is the sample variance. The Taguchi method seeks to minimize the appro priate signal-to-noise ratio by using experimental de signs based upon what he calls the inner and outer arrays. The inner array represents a design involving the k variables under the experimenter's control. Each point of the inner array is replicated according to the outer array, which is another design based upon q noise variables for which the experimenter either cannot control directly or chooses not to control. Ta guchi relies heavily upon saturated or near saturated orthogonal arrays for both his inner and outer arrays. Box (1985) points out that the Taguchi approach represents a signifcant advance in the application of experimental designs to the improvement of product quality. However, he also points out several short comings to the Taguchi procedure. Among these crit icisms are the following: 1. the Taguchi method does not exploit a sequential nature of investigation, 2. the designs advocated are rather limited and fail to deal adequately with interactions, 3. more efcient and simpler methods of analysis are available, and 4. the arguments for the universal use of the signal- to-noise ratio are unconvincing. The answer to these criticisms requires that the Tagu chi philosophy be blended with a data analysis strat egy in which the mean and variance of the quality characteristic are both empirically modeled to a con- Vol. 22, No. J, Januar 1990 siderably greater degree than practiced by Taguchi. In this way the engineer and scientist can achieve the basic goal of the Taguchi method while addressing Box's criticisms. Revew of te Dual Response Problem In order to achieve our objective, we shall borrow a technique developed by Myers and Carter (1973). Let x represent a k X 1 vector of independent variables under the experimenter's control. Suppose that the experimenter seeks to optimize two responses for x E R where R is a region of interest. Let 'p represent the response of primary interest, and let 's represent the response of secondary interest. Assume that these responses may be modelled by k k k 'p = .+ .. + ..-+ ,., + fp (1) and . . . k k k 's - 'o + ~..+ ~..-+ ~.,.,+ fs ( 2) .- . . where the {'s and the ''s represent the unknown coef fcients, and fp and fs are the random errors. Assume that an appropriate second order response surface experiment is conducted. Let wp and Ws rep resent the observed primary and secondary responses, respectively. The resulting ftted response surfaces may be represented by Wp = bo + x'b + x'Bx Ws - Co + x'c + x'Cx (3) (4) where bo = i0, Co - .o, b = (i1,, ik)', C = (.1, , .k )', and and B = - i12 2 : [ 2 i11 blk We note that bo, Co, b, c, B, and C are the appropriate vectors and matrices of the estimates for the coef cients. The dual response problem deals with the deter mination of the set of conditions, x* E R, which op timize wp subject to the constraint that Ws = (, where ( is some acceptable value for the secondary response. Journal of Qualify Technology 40 G. GEOFFREY VINING AND RAYMOND H. MYERS The details for the solution to this problem are found in Myers and Carter (1973). They establish that a solution can always be found given the additional constraint that x ' x = p 2 . A summary of this technique is given in the Appendix. Applying the Dual Response Results to the Taguchi Problem Let f represent the mean of the characteristic of interest and let ( 2 represent the variance. Assume that these characteristics may be adequately modeled by (1) and (2). Suppose that the experimenter has se lected an n-point design appropriate for these models, and that this design is replicated such that each design point is run a total of m 2 times. Ideally, the repli cation will follow Taguchi's outer array, but any scheme for proper randomization will be adequate for our basic purposes. Let Yuj be the )"response at the u th design point where j = 1, . . . , m and u = 1, ... , n. We note that 1 m fu = - Yuj m j l and 2 _ 1
( - ) 2 S u - - 1 . Y uj - Yu m - j l are the point estimators of f and ( 2 , respectively, at the u th design point. We also note that f u and sform a dual response system which may be analyzed by the techniques developed by Myers and Carter (1973). Recall that the objective of the dual response ap proach is to optimize the primary response subject to an appropriate constraint on the value of the second ary response. The decision whether to make the mean the primary or secondary response depends upon the ultimate purpose of the experiment. We shall consider Taguchi 's three basic situations in the following man ner: 1. "target value is best," which means keeping f at a specifed target value, fo, while minimizing ( 2 ; 2. "the larger the better," which means making f as large as possible, while controlling ( 2 ; and 3. "the smaller the better," which means making f as small as possible, while controlling ( 2 . The dual response approach seems ideal for the frst situation. We simply make f the secondary response and minimize an appropriate function of ( 2 subject to the constraint that f = fo. The second and third situations both appear to call for f to be the primary response. We then may establish several possible val ues for the variance, fnd the resulting optimum values Joural of Qualify Technology for f subject to these constraints on the variance, and select the best compromise combination. Several comments are in order. First, several articles (Bechhofer [1960], Box and Meyer [1986], Nair and Pregibon [1988]) have suggested the use of standard response surface models for the variance. In general, these authors suggest using the natural logarithm of s(In s,as the dependent response, following in the spirit of Bartlett and Kendall (1946). However, in their article, Bartlett and Kendall do not recommend using this transformation for m < 5, while for 5 . m . 9, they only marginally recommend it. Thus, for m < 1 0, any reasonable variance stabilizing transformation may be appropriate, for example the square root transformation which would use Su as the dependent response. Second, throughout this analysis, we have made no specifc assumptions about how the estimates of the appropriate coefcients were obtained. Two procedures are of particular interest. Let the elements of the mn X [ 1 + k(k + 3)/2] matrix X defne the k coordinates of the design points plus the squares and crossproducts of the design point coordinates as defned by the models ( 1 ) and (2). Thus X represents the design used expanded in terms of the assumed model. Let w " and w" represent the vectors of the observed sample means and sample variances, re spectively. The usual least squares estimators of { and l are and l = (X'X)- l X'W". In many cases, these estimates should be adequate. However, if we wish to take into account the heter ogeneity of the variances of the sample mean values, we should pursue weighted least squares to estimate {. In this case we would let V represent the variance covariance matrix of the responses obtained in the design. We observe that this matrix can be readily estimated since each design point has been replicated. The appropriate weighted least squares estimate of { then is 8 = (X'V-1X)- l X'V-1W,.. These are two reasonable estimates of V. Assume that the random errors are independent from design point to design point, in which case, V is diagonal. The frst approach uses the point estimates of the variances as the diagonal elements of V. A second approach uses the predicted values obtained through (4) to estimate these diagonal elements. Of the two approaches, we fnd the latter more attractive. Vol. 22, No.1, Januar 1990 COMBINING T AGUCHI AND RESPONSE SURFACE PHILOSOPHIES: A DUAL RESPONSE APPROACH 41 Proposed Methodolog We now have the tools necessary to develop an RSM approach to the basic Taguchi problem. Suppose that appropriate screening experiments have been per formed which suggest an appropriate region of inter est. These screening experiments could follow a Ta guchi-like parameter design followed by an appro priate region seeking procedure such as the method of steepest ascent on the primary response (see Myers [1976], Box and Draper [1987], and Khuri and Cornell [1987]). Such an approach is commonly pursued in R SM during the preliminary phases of experimenta tion. Once the appropriate region is defned, we then propose using any of the classical second-order re sponse surface designs, for ftting the primary re sponse and at whose points an outer array is set up. Such a strategy will place a premium upon using as small a basic design as possible. We recommend using such designs as the Box-Behnken (1960), the hybrid (Roquemore [1976]), and the Box-Draper (1974). The results of the experiment should then be analyzed through the dual response techniques developed by Myers and Carter (1973). Once a proposed set of op timal conditions is determined, we then recommend at least one confrmatory run at this location. Ideally, a small experiment should be conducted in this vi cinity. This approach answers several of Box's objections enumerated earlier. In particular, this methodology 1. allows a sequential investigation; 2. allows the use of a broad array of designs which do reflect the impact of interactions; 2. uses an efcient, rigorous statistical technique for the analysis; and 4. models the mean and variance while avoiding the use of the signal-to-noise ratio. In addition, since the proposed approach fts separate models to the mean and variance of the characteristic of interest, it allows the user to see directly which factors primarily influence the mean and which fac tors primarily influence the variance. The Relationship to PerMIA In the "target is best" situation, it is natural to com pare the proposed procedure to the Per MIA procedure proposed by Leon, Shoemaker, and Kacker (1987). PerMIA, which stands for "performance measures in dependent of adjustment," assumes that some vari ables afect the mean of the characteristic of interest Vol. 22, No. I, January 1990 but do not afect the variance. Thus, one can minimize the variance and then use the "adjustment" variables to attain the target condition for the mean. Of course in many applications, the variables do not neatly separate into these two classes: those that infuence the variance, and those that only influence the mean. Thus, in these cases, the PerMIA method ology cannot be applied. As a referee pointed out, in "the larger the better" and "the smaller the better" cases, the dual response approach may be more in sensitive to outliers than Taguchi's signal-to-noise ra tios. The methodology which we propose eliminates these problems by attacking the basic problem directly and in a manner which many engineers fnd natural. Since the proposed procedure does not rely upon the existence of adjustment variables, it will hold for a more general setting of the problem. In fact, under the assumption of an additive error model, the pro posed procedure can be used to suggest possible ad justment factors since it develops separate models for the mean and variance. Example The following example comes from an exercise in Box and Draper (1987). Although it is not a perfect example for illustrating this technique, it is the best we have been able to locate in the statistical literature. Typically, the examples used in traditional RSM do not replicate enough points to ft a model for the vari ance. Similarly, the examples used by the Taguchi proponents do not allow a full second-order model to be ft. This particular exercise from Box and Draper (1987) at least allows us to illustrate our proposed methodology. We hope that in the future more ex periments will be conducted which will better illus trate this technique. The purpose of the experiment was to study the efect of speed (Xl ) , pressure (X2), and distance (X3) upon a printing machine's ability to apply coloring inks upon package labels. The experiment is a 3 3 u = 27) factorial with three runs (m = 3) at each design point. We have assumed that the region of interest for this design reflects either preliminary experimen tation or sufcient prior information to justify using a second-order model. Table 1 summarizes the data. The following analysis utilized the MURSAC software package. Unfortunately, MURSAC is not set up to per form the appropriate weighted least squares estima tion. Consequently, we have used the ordinary least squares estimates, which should be slightly less ef- Joural of Qualify Technology 42 G. GEOFFREY VINING AND RAYMOND H. MYERS TABLE 1. The Printing Study Data u x, x, x, Y., Y . y. Y. s. 1 -1 -1 -1 34 10 28 24.0 12.5 2 0 -1 -1 115 116 130 120.3 8.4 3 -1 -1 192 186 263 213.7 42.8 4 -1 0 -1 82 88 88 86.0 3.7 5 0 0 -1 44 178 188 136.7 80.4 6 1 0 -1 322 350 350 340.7 16.2 7 -1 1 -1 141 110 86 112.3 27.6 8 0 1 -1 259 251 259 256.3 4.6 9 1 -1 290 280 245 271.7 23.6 10 -1 -1 0 81 81 81 81.0 0.0 11 0 -1 0 90 122 93 101.7 17.7 12 1 -1 0 319 376 376 357.0 32.9 13 -1 0 0 180 180 154 171.3 15.0 14 0 0 0 372 372 372 372.0 0.0 15 1 0 0 541 568 396 501.7 92.5 16 -1 0 288 192 312 264.0 63.5 17 0 1 0 432 336 513 427.0 88.6 18 1 1 0 713 725 754 730.7 21.1 19 -1 -1 1 364 99 199 220.7 133.8 20 0 -1 1 232 221 266 239.7 23.5 21 1 -1 408 415 443 422.0 18.5 22 -1 0 182 233 182 199.0 29.4 23 0 0 1 507 515 434 485.3 44.6 24 0 1 846 535 640 673.7 158.2 25 -1 236 126 168 176.7 55.5 26 0 1 660 440 403 501.0 138.9 27 1 878 991 1161 1010.0 142.5 cient. The ftted response surface for the mean of the characteristic of interest was w" = 327.6 + 177. 0Xl + 109.4x 2 + 131. 5x 3 + 32. 0xr + 75. 5xlX 3 + 43.6x 2 x 3 . Table 2 summarizes the corresponding analysis of variance. Of some concern was the size of the F sta tistic for the lack of ft test. Neither a log nor a square root transformation improved this value. As a r e sult, a second order model with all linear X quadratic terms (XiX]) was analyzed. The resulting overall F value (55. 512) , R2 (0. 8848), and F for the lack of fit test (4.98) did not justify the use of this model. Of all the linear X quadratic terms, only the x 2 x5 term waS of any concern. Consequently a second-order model with this single ' term added was ft. The resulting overall F value (83. 098), R 2 (0. 8830) , and F for the lack of ft test (3.53) again did not justify the addition of this term in light of the resulting mathematical complex ities in then applying the dual response methodology. Ultimately, one may argue that the size of the lack of ft test was purely due to the extremely large power Joural of Quality Technology available due to the total numbers of replications. Thus, while the lack of ft may be statistically signif icant, ultimately we felt that it was not practically signifcant. We chose to model the standard deviation rather than the more commonly used log (2 for several rea sons. First, since w= 3 < 5, then Bartlett and Kendall's (1946) work ofers . little argument in favor of log (2. Second, design runs 10 and 14 both have sample vari ances of zero, which does introduce some complexity for using the log transformation. Finally, the standard deviation is an important characteristic in its own right. As a result, the engineer can easily and directly interpret the results of this model. The ftted model for the standard deviation was w" = 34.9 + 11. 5xl + 15.3x 2 + 29.2x 3 + 4.2xI Table 3 gives the resulting analysis of variance. Since the claim of a second-order model is somewhat ten uous, a frst-order model was ft. The resulting F sta tistic ( 4.445) was clearly stronger, but its R2 (0. 3670) was quite weak. When applying the dual response methodology, the model's ability to predict is most important. In light of this concern, the greater R2 pro vided by the second order model justifed its use. This last situation also points out the need to develop a dual response methodology which: (1) takes directly into account the prediction ability of the model; and (2) allows the use of a frst-order model for the vari ance. Such a methodology will require a signifcant extension to the methodology proposed by Myers and TABLE 2. Analysis of Variance for the Mean Source df SS MS F 9' Model 9 3744658 416073 92.005 0.8741 Error Lack of Fit 17 295314 17371.4 3.841 Pure 54 244203.6 4552.2 Variable Partial t p Xl 19.342 0.0001 X2 11.958 0.0001 X3 14.365 0.0001 xf 2.018 0.0486 d -1.413 0.1634 x -1.833 0.0723 XlX2 5.892 0.0001 XlX3 6.734 0.0001 X2X3 3.889 0.0003 Vol. 22, No. J, January J 990 COMBINING TAGUCHI AND RESPONSE SURFACE PHILOSOPHIES: A DUAL RESPONSE APPROACH 43 TABLE 3. Analysis of Variance for the Standard Deviation Source df SS MS F R' Model 9 27168.5 3018.7 1.572 0.4542 Error 17 32652.0 1920.7 Variable Partial t p Xl 1.116 0.2800 X2 1.483 0.1563 X3 2.826 0.0001 X 0.235 0.8171 X -0.074 0.9426 d 0.938 0.3615 XlX2 0.610 0.5498 XlX3 0.404 0.6914 X2X3 1.113 0.2812 Carter (1973). As a result, it will be pursued in a later paper. Our frst example will consider the "target value is best" situation. Suppose we wish to minimize the population standard deviation while achieving a target for the mean of 500.0. In this case, we let ( be our primary response and let f be our secondary response with the constraint that / = 500.0. Table 4 summa rizes the resulting MURSAC output. In this table, A8 represents the appropriate Lagrangian multiplier for the dual response analysis. These results suggest that the settings Xl = 0.614, X2 - 0.228, and X3 = 0.100 achieve the condition / -500.0 with a predicted pop ulation standard deviation of 51.778. Next, we shall consider the "larger the better" case. We now let f be the primary response and let ( be the secondary response. Suppose that d e sired target values for the population standard deviation are 60.0, 75.0, and 90.0. Tables 5-7 summarize the resulting MURSAC output. Again, A8 is the appropriate Lagran gian multiplier. Table 5 indicates that the optimal set- TABLE 4. Locations of Minimum Variance for [ = 500. 0 A i XI x, x, -3.00 57.360 0.465 0.260 0.285 -2.00 57.147 0.470 0.259 Q.278 -1.00 56.482 0.485 0.256 0.258 -0.75 56.017 0.495 0.254 0.244 -0.50 55.041 0.519 0.249 0.213 -0.25 51.778 0.614 0.228 0.100 Vol. 22, No. I, Januar 1990 TABLE 5. Locations of Maximum Mean for u =60.0 A ; XI x, x, -3.00 494.8 0.386 0.264 0.372 -2.00 500.4 0.414 0.269 0.359 -1.00 507.3 0.449 0.275 0.341 -0.75 509.3 0.459 0.276 0.336 -0.50 511.4 0.470 0.278 0.331 -0.25 513.6 0.482 0.280 0.325 0.00 516.0 0.494 0.282 0.319 0.25 518.5 0.507 0.284 0.313 0.50 521.2 0.521 0.286 0.306 0.75 524.0 0.536 0.288 0.299 1.00 527.0 0.552 0.290 0.291 2.00 540.8 0.627 0.299 0.253 3.00 557.9 0.722 0.307 0.204 ting for u = 60.0, is Xl = 0.772, X2 = 0.307, and X3 -0.204, which produces a predicted value of 557.9 for f. Table 6 indicates that the bst setting for u = 75.0 is Xl = 1.048, X2 = 0.442, and X3 = 0.292. This setting results in a predicted value for f of 687.5. From Table 7 we observe that for u - 90.0 the optimal setting i s Xl = 1.333, X2 - 0.558, and X3 = 0.368. Such a setting produces a p redicted value for f of 813.9. Ultimately, the user must decide which of these settings ofers the best compromise. . . Summar In conclusion, we see that the dual response ap proached developed by Myers and Carter (1973) pro vides a reasonable basis for applying RSM techni q ues to achieve the basic goals of the Taguchi philosophy of experimentation. Finally, we have seen that the proposed methodology is a more general and more natural approach for the "target is best" situation. TABE 6. Locations of Maximum Mean for u = 75. 0 A ; x, x, x, -3.00 585.0 0.567 0.381 0.536 -2.00 594.9 0.610 0.389 0.515 -1.00 606.9 0.664 0.398 0.489 -0.75 610.4 0.679 0.400 0.481 -0.50 614.0 0.695 0.403 0.473 -0.25 617.8 0.712 0.405 0.465 0.00 621.8 0.731 0.408 0.456 0.25 626.0 0.750 O.4ll 0.446 0.50 630.4 0.770 0.414 0.436 0.75 636.1 0.792 0.417 0.425 1.00 640.0 0.815 0.420 0.413 2.00 662.0 0.920 0.431 0.359 3.00 687.5 1.048 0.442 0.292 Journal of Quality Technology 44 G. GEOFFREY VINING AND RAYMOND H. MYERS TABLE 7. Locations of Maximum Mean for u = 90.0 A ; x, x, x, -3.00 671.7 0.728 0.483 0.679 -2.00 686.1 0.785 0.493 0.651 -1.00 703.7 0.854 0.505 0.617 -0.75 708.6 0.874 0.508 0.607 -0.50 713.8 0.895 0.511 0.596 -0.25 719.2 0.918 0.515 0.585 0.00 724.9 0.941 0.518 0.573 0.25 730.9 0.966 0.522 0.561 0.50 737.2 0.992 0.525 0.548 0.75 743.7 1.019 0.529 0.534 1.00 750.5 1.048 0.533 0.519 2.00 780.4 1.118 0.547 0.451 3.00 813.9 1.333 0.558 0.368 Acknowledgents The authors thank the Editor and the referees for their suggestions and comments which signifcantly improved this paper. Appendix The dual response methodology developed by Myers and Carter (1973) is an extension of ridge analysis (Hoerl [1959] and Draper [1963], see also Myers [1976], Box and Draper [1987], and Khuri and Cornell [1987]). Let R be a spherical region of interest with radius p. The dual response problem concerns fnding the set of conditions, x* E R, which optimize the primary response wp subject to the constraint that the second ary response Ws = (, where ( is some acceptable value for this response, and where wp and Ws are given by (3) and (4), respectively. Just as in the case of ridge analysis, it is quite likely that x* lies on the boundary of R. In such a situation, Myers and Carter employ Lagrangian multipliers to fnd x*. Assume that R is a hypersphere of radius p. Let A8 be the Lagrangian multiplier associated with the constraint Ws = (, and let Ap be the Lagrangian multiplier associated with the constraint x'x = p 2 . To optimize wp given these two constraints, one must consider The resulting stationary point, XL, is the x which sat isfes aL = 0 ax . Joural of Quality Technology Thus, XL must satisfy For A8 = 0, the dual response problem reduces to ridge analysis. Myers and Carter suggest solving this system by frst fxing a value for A8 and then choosing Ap to be either larger than the largest eigenvalue or smaller than the smallest eigenvalue, whichever is appropri ate, of B. - A8C. The procedure can be repeated for various values of A8 within the interval ( -7 A8 7) . The particular choice of A8 basically defnes the di recti o n taken as one moves away from x = O. References BARTLETT, M. S. and KENDALL, D. G. (1946). "The Statistical Analysis of Variance-Heterogeneity and the Logarithmic Transformation." Journal of the Royal Statistical Society B8, pp. 128-138. BECHHOFER, R. E. (1960). "A Multiplicative Model for Analyzing Variances Which Are Afected by Several Factors." Joural of the American Statistical Association 55, pp. 245-264. Box, G. E. P. (1985). "Discussion of 'Of-Line Quality Control, Parameter Design, and the Taguchi Method' by R. N. Kackar." Joural of Quality Technology 17, pp. 189-190. Box, G. E. P. and BEHNKEN, D. W. (1960). "Some New Three Level Designs for the Study of Quantitative Variables." Tech nometrics 2, pp. 455-475. Box, G. E. P. and DRAPER, N. R. (1987). Empirical Model Building and Response Surfaces. John Wiley & Sons, New York, NY. Box, G. E. P. and MEYER, R. D. (1986). "Dispersion Efects from Fractional Designs." Technometrics 28, pp. 19-27. Box, M. J. and DRAPER, N. R. (1974). "On Minimum Point Second Order Designs." Technometrics 16, pp. 613-616. DRAPER, N. R. (1963). "Ridge Analysis of Response Surfaces." Technometrics 5, pp. 469-479. HOERL, A. E. (1959). "Optimum Solution of Many Variables Equations." Chemical Engineering Progress 55, pp. 69. KACKAR, R. N. (1985). "Of-Line Quality Control, Parameter De sign, and the Taguchi Method (with discussion)." Journal of Quality Technology 17, pp. 176-209. KHURI, A. I. and CORNELL, J. A. (1987). Response Surfaces: Design and Analyses. Marcel Dekker, New York, NY. LEON, R. V.; SHOEMAKER, A. C.; and KACKER, R. N. (1987). "Per formance Measures Independent of Adjustment." Technometrics 29, pp. 253-265. MURSAC. For information contact the Department of Statistics, Virginia Polytechnic Institute and State University, Blacks burg, VA. MYERS, R. H. (1976). Response Surface Methodology. Department of Statistics, Virginia Polytechnic Institute and State Univer sity, Blacksburg, VA. Vol. 22, No. 1, January 1990 COMBINING T AGUCHI AND RESPONSE SURFACE PHILOSOPHIES: A DUAL RESPONSE APPROACH 45 MYERS, R. H. and CARTER, W. H., JR . (1973). "Response Surface Techniques for Dual Response Systems." Technometrics 15, pp. 301-317. NAIR, V. N. and PREGIBON, D. (1988). "Analyzing Dispersion Efects from Replicated Factorial Experiments." Technometrics 30, pp. 247-257. ROQUEMORE, K. G. (1976). "Hybrid Designs for Quadratic Re sponse Surfaces." Technometrics 18, pp. 419-423. TAGUCHI, G. (1986). Introduction to Quality Engineering: Designing Quality into Products and Processes. Kraus International Publi cations, White Plains, NY. Vol. 22, No. 1, Januar 1990 TAGUCHI, G. and PHADKE, M. S. (1984). "Quality Engineering Through Design Optimization." Conference Record (Vol. 3, IEEE Globecom Conference). Institute of Electrical and Electronics Engineers, New York, NY, pp. 1106-1113. TAGUCHI, G. and Wu, Y. (1985). Introduction to OfLine Quality Control. Central Japan Quality Control Association, Nagaya, Japan (available from the American Supplier Institute, Dear born, MI). Key Words: 0ous|rcIued0|IwI:c|Iou,ResouseSur|cce Me|uodoloqIes. Journal of Quality Technology