Académique Documents
Professionnel Documents
Culture Documents
S P E C I F I C A T I O N
Technical Specifications for the LAMBDA 950 UV/Vis/NIR and LAMBDA 850 UV/Vis Spectrophotometers
LAMBDA 950
LAMBDA 850
Choose the LAMBDA 950 for ultra-high UV/Vis/NIR performance for wavelengths up to 3,300 nm, highprecision measurements, and for applications such as highly reflective and anti-reflective coatings, color correction coatings, bandpass characteristics of UV, Vis and NIR filters, and more.
Choose the LAMBDA 850 for ultra-high UV/Vis performance between 175 nm and 900 nm. Sun protection, reflectance properties of flat panel display screens, paint films, transmission and reflectance characterization of glass, solar cells, and more.
UV-Vis-NIR
175 nm 3,300 nm
UV-Vis
175 nm 900 nm
Introduction PerkinElmer UV/Vis and UV/Vis/ NIR spectrophotometers are built to the highest ISO-9001 manufacturing standards. This document presents confirmed performance specifications based on factory tests. All instruments will meet or achieve better than the confirmed specifications, under normal conditions of use as described in the user manual. The LAMBDA Series of UV/Vis/ NIR and UV/Vis spectrophotometers is the industry standard for high performance, flexibility and convenience. Each model includes the same range of modular components and snap-in accessories to tackle a range of tough applications. Whatever specifications your laboratory requires, the LAMBDA Series provides best-in-class accuracy, precision and reproducibility.
w w w. p e r k i n e l m e r. c o m
LAMBDA 950
Double beam, double monochromator, ratio recording UV/Vis/NIR spectrophotometer with microcomputer electronics, controlled by DELL PC or compatible personal computer. All reflecting optical system (SiO2 coated) with holographic grating monochromator with 1440 Lines/mm UV/Vis blazed at 240 nm and 360 Lines/mm NIR blazed at 1100 nm, Littrow mounting, sample thickness compensated detector optics. Chopper (46+ Hz, Cycle: Dark/Sample/Dark/ Reference, Chopper Segment Signal Correction CSSC). Photomultiplier R6872 for high energy in the whole UV/Vis wavelength range. Peltier cooled PbS detector for NIR. Pre-aligned tungsten-halogen and deuterium. 175 nm3300 nm 0.05 nm 0.20 nm >2A 0.00007 %T 0.00007 %T 0.00007 %T 0.00040 %T 0.0015 %T 0.0005 %T 0.08 nm UV/Vis 0.30 nm NIR 0.020 nm 0.080 nm 0.005 nm 0.020 nm 0.0006 A 0.0003 A 0.003 A 0.003 A 0.002 A 0.010 A
LAMBDA 850
Double beam, double monochromator, ratio recording UV/Vis spectrophotometer with microcomputer electronics, controlled by DELL PC or compatible personal computer. All reflecting optical system (SiO2 coated) with holographic grating monochromator with 1440 Lines/mm UV/Vis blazed at 240 nm, Littrow mounting, sample thickness compensated detector optics. Chopper (46+ Hz, Cycle: Dark/Sample/Dark/ Reference, Chopper Segment Signal Correction CSSC). Photomultiplier R6872 for high energy in the whole UV/Vis wavelength range. Pre-aligned tungsten-halogen and deuterium. 175 nm900 nm 0.05 nm >2A 0.00007 %T 0.00007 %T 0.00007 %T 0.08 nm 0.020 nm 0.005 nm 0.0006 A 0.0003 A 0.003 A 0.003 A 0.002 A 0.010 A
Optical System
Detector
Photometric Accuracy
Double Aperture Method 1 A Double Aperture Method 0.5 A NIST 1930D Filters 2 A NIST 930D Filters 1 A NIST 930D Filters 0.5 A K2Cr2O7-Solution USP/DAP method
Photometric Linearity
(Addition of filters UV/Vis at 546.1 nm, 2 nm Slit 1-sec. integration time) At 1.0 A At 2.0 A At 3.0A
LAMBDA 950
LAMBDA 850
0.00016 A 0.00008 A 0.00008 A 8A Unlimited 0.05 nm5.00 nm in 0.01 nm increments UV/Vis range 0.20 nm20.00 nm in 0.04 nm increments NIR range Fixed resolution, constant energy or slit programming.
0.00016 A 0.00008 A 0.00008 A 8A Unlimited 0.05 nm5.00 nm in 0.01 nm increments UV/Vis range Fixed resolution, constant energy or slit programming.
Photometric Stability
After warm-up at 500 nm, 0 A, 2 nm Slit, 2-sec. integration time, Peak to Peak 0.0002 A/h 0.0002 A/h
Baseline Flatness
LAMBDA 950: 190 nm3100 nm, Slit (UV/Vis) 2 nm, Slit (NIR) Servo Mode, NIR Gain = 1, integration time 3100-860.8 nm : 0.24 sec., integration time 860.8-190 nm : 0.20 sec., no smoothing applied LAMBDA 850: 190-860 nm, Slit 2 nm, integration time 0.20 sec., no smoothing applied 0.0015 A
0.0015 A
Purging
Optics Sample Compartment
Instrument Requirements
Power Temperature Recommended Humidity
w w w. p e r k i n e l m e r. c o m
PerkinElmer Life and Analytical Sciences 710 Bridgeport Avenue Shelton, CT 06484-4794 USA Phone: (800) 762-4000 or (+1) 203-925-4602 www.perkinelmer.com For a complete listing of our global offices, visit www.perkinelmer.com/lasoffices 2005 PerkinElmer, Inc. All rights reserved. The PerkinElmer logo and design are registered trademarks and LAMBDA is a trademark of PerkinElmer, Inc. All other trademarks not owned by PerkinElmer, Inc. or its subsidiaries that are depicted herein are the property of their respective owners. PerkinElmer reserves the right to change this document at any time and disclaims liability for editorial, pictorial or typographical errors. 006991B_12 Printed in USA