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Outline
4.1 Capabilities and Applications of AFM. 4.2 Basic working principles. 4.3 Instrumentation. 4.4 Example of AFM
What is AFM?
A microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. As the probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded, providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 106, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms. Also called scanning force microscope.
Nanodevices
Au lattice image
Nanowires
Animation
Tip-surface attraction/repulsion
Think about:
Both AFM and SEM are surface image method, what are the advantages and disadvantages of each technique?
4.3 Instrumentation
Basic components of AFM:
1. The AFM probe - a sharp tip mounted on a soft cantilever. 2. The optical lever that measures the cantilever deflections. 3. The feedback loop that allows for monitoring the interaction forces between the molecules on the tip with the ones on the cell surface. 4. The piezoelectric scanner that moves the tip relative to the sample in a 3D pattern. 5. The conversion system from raw data acquired by the instrument into an image or other useful display.
Cantilever stone
Typical AFM images of measurements for a rough dimple before testing and after 200 loadunload cycles , showing the flattened asperities within the encircled contact area.