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Technical Note
M500 SSD SMART AttributesFirmware MU02 and MU03 or Later Introduction
This technical note describes the self-monitoring, analysis, and reporting technology (SMART) feature set available for the Micron M500 SSD. The SMART attributes are used to protect user data and minimize the likelihood of unscheduled system downtime that may be caused by predictable degradation and/or fault of the device. This document describes the SMART parameters available with the Micron M500 SSD firmware versions MU02 and MU03 or later. Questions relating to this document should be addressed to ssd-support@micron.com.
Mechanism
A SMART attribute is retrieved by the host issuing the SMART READ DATA command. In the 512-bytes returned by the SMART READ DATA command, bytes 0361 (169h) are marked as vendor-specific in the ATA8-ACS2 specification. These contain the SMART attribute data. Table 1: SMART Attribute Table Layout
Offset 0 2 2 + 12 2 + (29 * 12) 12 Length (Bytes) 2 12 12 Description SMART structure version (vendor-specific) Attribute entry #1 Attribute entry #2 Attribute entry #30
Each attribute entry contains 12 bytes, comprised of the following fields: ID, Flag, Current Value, Worst Value, Raw Data, and Reserved. There is no requirement on the order of the attributes in the table. For each attribute, there is a corresponding threshold that is retrieved by the host issuing the SMART READ ATTRIBUTE THRESHOLDS command. In the 512-bytes data returned by the command, the host can compare the threshold with the current value of each attribute. If the current value is less than or equal to the threshold, the device is in a status that requires further attention from the system. This procedure is also called SMART Trip. The SMART RETURN STATUS command will compare the current value attributes with the threshold and return a status that specifies the self test has either completed without error (C24Fh) or detected a threshold has been exceeded (2CF4h). The SMART RETURN STATUS command replaces the functionality of the READ THRESHOLD VALUE and WRITE WARRANTY FAILURE THRESHOLD commands, and provides backwardcompatibility with existing SMART applications.
Products and specifications discussed herein are for evaluation and reference purposes only and are subject to change by Micron without notice. Products are only warranted by Micron to meet Micron's production data sheet specifications. All information discussed herein is provided on an "as is" basis, without warranties of any kind.
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Attribute Definition
Table 3: SMART Attribute Entry Format and Definition
Offset 0 Length (Bytes) 1 Field Name Data Description ID 00h This attribute entry is invalid. 01hFFh valid entry. Bit 0: Prefailure/advisory bit. Applicable only when the current value is less than or equal to its threshold. 0 = Advisory: the device has exceeded its intended design life; the failure is not covered under the drive warranty. 1 = Prefailure: warrantable, failure is expected in 24 hours and is covered in the drive warranty. Bit 1: Online collection bit. 0 = Attribute is updated only during off-line activities 1 = Attribute is updated during both online and off-line activities. Bit 2: Performance bit. 0 = Not a performance attribute. 1 = Performance attribute. Bit 3: Error Rate bit. Expected, non-fatal errors that are inherent in the device. 0 = Not an error rate attribute. 1 = Error rate attribute. Bit 4: Even count bit. 0 = Not an even count attribute. 1 = Even count attribute. Bit 5: Self-preserving bit. The attribute is collected and saved by the drive without host intervention. 0 = Not a self-preserving attribute. 1 = Self-preserving attribute. Bit 615: Reserved.
Flag
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Current value
4 5 11
1 6 1
Worst ever normalized value. Worst value Valid range 1253 (FDh), initial value 100 (64h). Values of 0, FEh, and FFh are invalid. Raw data Reserved Vendor and/or attribute-specific. 00h
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 1 (01h): Raw Read Error Rate
Micron
1
MSB
1
LSB
Flag 2Fh
Threshold
Where: EC = Total number of correctable errors EU = Total number of uncorrectable errors HP = Total number of pages read by the host Constant, C, is defined as:
C= 100000(BT) 2
Where: BT = Total number of blocks on the device Note that ECC errors occurring while reading non-user data will still contribute to this rate. The Current Value will not be calculated and remains as 0x64 until the host read page count is greater than C (100,000 total block count 2).
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 32h (50%).
Se
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 5 (05h): Reallocated Sector Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
1
LSB
Flag 33h
Threshold
Where: BG = The number of grown bad sectors BR = The total number of sectors reserved for use by the device SM = SMART_MAX_ATTRIBUTE_VALUE
VR = BG BLOCK_SECTOR_COUNT
Note that the retirement of a single defective area on a NAND-based SSD will be done at the NAND block level. This means that many sectors will be reallocated during a single block retirement. For the M500, 16,384 sectors are retired for each single reallocation event.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0x0A, meaning the threshold shall represent no value greater than 90% of the total available reallocated sectors.
Se
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 5 (05h): Reallocated NAND Block Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
1
LSB
Flag 33h
Threshold
Where: BG = The number of grown bad blocks BR = The total number of blocks reserved for use by the device SM = SMART_MAX_ATTRIBUTE_VALUE
VR = BG BLOCK_SECTOR_COUNT
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0x0A, meaning the threshold shall represent no value greater than 90% of the total available reallocated blocks.
Se
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 9 (09h): Power-On Hours Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
10
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 170 (AAh): Reserved Block Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
1
LSB
Flag 33h
Threshold
Se
VC = SM - 100
RUSED RT
Where: RUSED = Total number of reserved blocks RT = Total number of blocks reserved by the device
VR = BT - BF
Where: BT = Total bad block count of the drive BF = Total number of OTP bad blocks
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
11
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 171 (ABh): Program Fail Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
VC = 100 -
FP 100 FP + BR
Where: FP = Total number of program fails BR = The number of reserved blocks remaining
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
12
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 172 (ACh): Erase Fail Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
VC = 100 -
EF 100 EF + BR
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
13
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 173 (ADh): Average Block-Erase Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Where: VC = The current value SM = SMART_MAX_ATTRIBUTE_VALUE EAVG = The average erase count BL = The rated life of a block (the erase count for which the part is rated)
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
14
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 174 (AEh): Unexpected Power Loss Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
15
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 180 (B4h): Unused Reserve (Spare) NAND Blocks
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
MSB
LSB
Flag
Threshold
Current Value
This value is hard-coded to zero (0x00).
Worst Value
This value is hard-coded to zero (0x00).
Raw Data
This value is calculated as:
URBC = BT - (BU - BF)
Where: URBC = Total unused reserved block count BT = Total number of reserved block list BU = Total number of bad blocks used in the device (both factory and grown) BF = Total factory loaded bad block list (OTP)
Reserved/Threshold
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
16
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 181 (B5h): Unaligned Access Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
0
LSB
Flag 22h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
17
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 183 (B7h): SATA Interface Downshift
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
18
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 184 (B8h): Error Correction Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
VC =
100 - ENR100
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
19
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 187 (BBh): Reported Uncorrectable Errors
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
20
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 188 (BCh): Command Timeout Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
21
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 194 (C2h): Enclosure Temperature
Micron
1
MSB
0
LSB
Flag 22h
Threshold
VC = SM - TC
Where: TC = Current temperature SM = SMART_MAX_ATTRIBUTE_VALUE
VW = SM - TM
Where: SM = SMART_MAX_ATTRIBUTE_VALUE TM = Maximum temperature recorded for the device
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
22
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 195 (C3h): Cumulative Corrected ECC
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
0
LSB
Flag 3Ah
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
23
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 196 (C4h): Reallocation Event Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
VR = BT - BF
Where: BT = Total number of bad block counts on the drive BF = The number of factory marked OTP bad blocks
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
24
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 197 (C5h): Current Pending Sector Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
25
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 198 (C6h): SMART Off-line Scan Uncorrectable Error Count
Micron
1
MSB
0
LSB
Flag 30h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
26
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 199 (C7h): Ultra-DMA CRC Error Count
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
27
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 202 (CAh): Percent Lifetime Remaining
Micron
1
MSB
1
LSB
Flag 31h
Threshold
Where: EAVG = The average erase count for a super block (stripe of blocks) BL = The erase count for which the part is rated (block life)
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
28
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 206 (CEh): Write Error Rate
Micron
0
MSB
0
LSB
Flag 0Eh
Threshold
Se
VC =
reduces to VC =
100FN ST
Where: FN = Total number of NAND program failures ST = Total number of sectors written
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
29
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 210 (D2h): Successful RAIN Recovery Count
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
0
LSB
Flag 32h
Threshold
Current Value
This value is hard-coded to 100% (0x64).
Worst Value
This value is hard-coded to 100% (0x64).
Raw Data
The total number of TUs successfully recovered by RAIN.
Reserved/Threshold (8 bits):
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
30
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 246 (F6h): Total Host Sector Writes
Attribute Flags
lf -p Ev res en er t va Er co tio ro un n r t Pe rat rf e or O ma ff lin nc e W e ar ra nt y
Micron
1
MSB
0
LSB
Flag 3Ah
Threshold
Current Value
This value is hard-coded to 100% (0x64).
Worst Value
This value is hard-coded to 100% (0x64).
Raw Data
The total number of sectors written by the host.
Reserved/Threshold
The threshold for this attribute is set to 0. This will not cause a SMART threshold trip.
Se
31
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 247 (F7h): Contact Factory
Current Value
Contact factory for details.
Worst Value
Contact factory for details.
Raw Data
Contact factory for details.
Reserved/Threshold
Contact factory for details.
32
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
TN-FD-21: M500 SSD SMART Attributes SMART ID 248 (F8h): Contact Factory
Current Value
Contact factory for details.
Worst Value
Contact factory for details.
Raw Data
Contact factory for details.
Reserved/Threshold
Contact factory for details.
33
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Revision History
Rev. B 09/13
Added support for MU03 firmware
Rev. A 05/13
Initial release
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PDF: 09005aef8535b133 tnfd21_m500_ssd_smart_attributes.pdf - Rev. B 9/13 EN
34
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.