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BST82

N-channel enhancement mode eld-effect transistor


Rev. 03 26 July 2000 Product specication

1. Description
N-channel enhancement mode eld-effect transistor in a plastic package using TrenchMOS1 technology. Product availability: BST82 in SOT23.

2. Features
I I I I TrenchMOS technology Very fast switching Logic level compatible Subminiature surface mount package.

3. Applications
I Relay driver I High speed line driver I Logic level translator.

c c

4. Pinning information
Table 1: Pin 1 2 3 Pinning - SOT23, simplied outline and symbol Description gate (g)
3

Simplied outline

Symbol
d

source (s) drain (d)


g
03ab44

03ab30

SOT23

N-channel MOSFET

1.

TrenchMOS is a trademark of Royal Philips Electronics.

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

5. Quick reference data


Table 2: VDS ID Ptot Tj RDSon Quick reference data Conditions Tj = 25 to 150 C Tsp = 25 C; VGS = 5 V Tsp = 25 C VGS = 5 V; ID = 150 mA Typ 5 Max 100 190 0.83 150 10 Unit V mA W C drain-source voltage (DC) drain current (DC) total power dissipation junction temperature drain-source on-state resistance Symbol Parameter

6. Limiting values
Table 3: Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter VDS VDGR VGS ID IDM Ptot Tstg Tj IS ISM drain-source voltage (DC) drain-gate voltage (DC) gate-source voltage (DC) drain current (DC) peak drain current total power dissipation storage temperature operating junction temperature source (diode forward) current (DC) peak source (diode forward) current Tsp = 25 C Tsp = 25 C; pulsed; tp 10 s Tsp = 25 C; VGS = 5 V; Figure 2 and 3 Tsp = 100 C; VGS = 5 V; Figure 2 Tsp = 25 C; pulsed; tp 10 s; Figure 3 Tsp = 25 C; Figure 1 Conditions Tj = 25 to 150 C Tj = 25 to 150 C; RGS = 20 k Min 65 65 Max 100 100 20 190 120 0.8 0.83 +150 +150 190 0.8 Unit V V V mA mA A W C C mA A

Source-drain diode

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

03aa17

120
P der (%) 100

03aa25

120
Ider (%) 100

80

80

60

60

40

40

20

20

0 0 25 50 75 100 125
Tsp

150 (oC)

175

25

50

75

100

125

150 175 Tsp (oC)

P tot P der = ---------------------- 100 % P


tot ( 25 C )

VGS 5 V ID I der = ------------------ 100 % I


D ( 25 C )

Fig 1. Normalized total power dissipation as a function of solder point temperature.


1 ID (A) 10-1 RDSon = VDS/ ID

Fig 2. Normalized continuous drain current as a function of solder point temperature.


03aa60

tp = 10 s 100 s

1 ms 10 ms D.C.
P

10-2

tp T

100 ms

tp T

10-3 1 10 102

Tsp = 25oC VDS (V) 103

Tsp = 25 C; IDM is single pulse.

Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage.

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

3 of 13

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

7. Thermal characteristics
Table 4: Symbol Rth(j-sp) Rth(j-a) Thermal characteristics Parameter thermal resistance from junction to solder point thermal resistance from junction to ambient Conditions mounted on a metal clad substrate; Figure 4 mounted on a printed circuit board; minimum footprint Value 150 350 Unit K/W K/W

7.1 Transient thermal impedance


103 Zth(j-sp) (K/W) 102 = 0.5 0.2 0.1 10 0.05 0.02 1 single pulse
tp T t P tp T
03aa57

0.1 10-5 10-4 10-3 10-2 10-1 1 tp (s) 10

Mounted on a metal substrate.

Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration.

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

8. Characteristics
Table 5: Characteristics Tj = 25 C unless otherwise specied Symbol V(BR)DSS Parameter drain-source breakdown voltage Conditions ID = 10 A; VGS = 0 V Tj = 25 C Tj = 55 C VGS(th) gate-source threshold voltage ID = 1 mA; VDS = VGS; Figure 9 Tj = 25 C Tj = 150 C Tj = 55 C IDSS drain-source leakage current VDS = 60 V; VGS = 0 V Tj = 25 C Tj = 150 C IGSS RDSon gate-source leakage current drain-source on-state resistance VGS = 20 V; VDS = 0 V VGS = 5 V; ID = 150 mA; Figure 7 and 8 Tj = 25 C Tj = 150 C Dynamic characteristics gfs Ciss Coss Crss ton toff forward transconductance input capacitance output capacitance reverse transfer capacitance turn-on time turn-off time VDD = 50 V; RD = 250 ; VGS = 10 V; RG = 50 ; RGS = 50 IS = 300 mA; VGS = 0 V; Figure 13 IS = 300 mA; dIS/dt = 100 A/s; VGS = 0 V; VDS = 25 V VDS = 5 V; ID = 175 mA; Figure 11 VGS = 0 V; VDS = 10 V; f = 1 MHz; Figure 12 350 25 8.5 5 3 12 40 15 10 10 15 mS pF pF pF ns ns 5 10 23 0.01 10 1.0 10 100 A A nA 1 0.6 2 3.5 V V V 100 89 130 V V Min Typ Max Unit Static characteristics

Source-drain diode VSD trr Qr source-drain (diode forward) voltage reverse recovery time recovered charge 0.95 30 30 1.5 V ns nC

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

03aa63

03aa65

0.5 ID (A) 0.45 0.4 0.35 0.3 0.25 0.2

0.7 Tj = 25oC VGS = 10V 5V ID (A) 0.6 0.5 0.4 0.3 3.5 V 0.2 0.1 0 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 VDS (V) 2 0 1 2 3 4 5 6 7 VGS (V) 8 Tj = 25oC 150oC VDS > ID X RDSon

4V

0.15 0.1 0.05 0 3V

Tj = 25 C

Tj = 25 C and 150 C; VDS > ID RDSon

Fig 5. Output characteristics: drain current as a function of drain-source voltage; typical values.
03aa64

Fig 6. Transfer characteristics: drain current as a function of gate-source voltage; typical values.
03aa29

12 RDSon 11 () 10 9 8 7 6 5 4 3 2 1 0 0 0.1 0.2 0.3 3V 3.5V

Tj = 25oC

3 a 2.8 2.6 2.4 2.2 2 1.8 1.6 1.4 1.2 1 0.8 0.6 0.4 0.2 0 -60 -20 20 60 100 140 180 Tj (oC)

4V

5V

VGS = 10V

0.4 ID (A)

0.5

Tj = 25 C

R DSon a = --------------------------R DSon ( 25 C )

Fig 7. Drain-source on-state resistance as a function of drain current; typical values.

Fig 8. Normalized drain-source on-state resistance factor as a function of junction temperature.

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

3
VGS(th) (V) 2.5 typ

03aa34

10-1 I D
(A) 10-2

03aa37

10-3

min

typ

1.5
min

10-4

1
10-5

0.5

0 -60 -20 20 60 100 140 180 Tj (oC)

10-6
0 0.5 1 1.5 2 2.5 3 VGS (V)

ID = 1 mA; VDS = VGS

Tj = 25 C; VDS = 5 V

Fig 9. Gate-source threshold voltage as a function of junction temperature.


03aa66

Fig 10. Sub-threshold drain current as a function of gate-source voltage.


03aa68

0.5 gfs 0.45 (S) 0.4 0.35 0.3 0.25 0.2 0.15 0.1 0.05 0 0

102 VDS > ID X RDSon Tj = 25oC Ciss, Coss, Crss (pF)

Ciss

150oC

10

Coss

Crss 0.1 0.2 0.3 0.4 0.5 0.6 ID (A) 0.7 1 10-1 1 10 VDS (V) 102

Tj = 25 C and 150 C; VDS > ID RDSon

VGS = 0 V; f = 1 MHz

Fig 11. Forward transconductance as a function of drain current; typical values.

Fig 12. Input, output and reverse transfer capacitances as a function of drain-source voltage; typical values.

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

03aa67

1 IS (A) 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 0

VGS = 0 V

150oC

Tj = 25oC

0.2

0.4

0.6

0.8

1.2 VSD (V)

1.4

Tj = 25 C and 150 C; VGS = 0 V

Fig 13. Source (diode forward) current as a function of source-drain (diode forward) voltage; typical values.

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

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Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

9. Package outline
Plastic surface mounted package; 3 leads SOT23

HE

v M A

Q A A1

1
e1 e bp

2
w M B detail X Lp

1 scale

2 mm

DIMENSIONS (mm are the original dimensions) UNIT mm A 1.1 0.9 A1 max. 0.1 bp 0.48 0.38 c 0.15 0.09 D 3.0 2.8 E 1.4 1.2 e 1.9 e1 0.95 HE 2.5 2.1 Lp 0.45 0.15 Q 0.55 0.45 v 0.2 w 0.1

OUTLINE VERSION SOT23

REFERENCES IEC JEDEC TO-236AB EIAJ

EUROPEAN PROJECTION

ISSUE DATE 97-02-28 99-09-13

Fig 14. SOT23.


9397 750 07223 Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

9 of 13

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

10. Revision history


Table 6: 03 02 01 Revision history CPCN HZG303 Description Product specication; third version; supersedes BST82_CNV_2 of 970623. Converted from VDMOS (Nijmegen) to TrenchMOS technology (Hazel Grove). 19970623 19901031 Product specication; second version. Product specication; initial version.

Rev Date 20000726

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

10 of 13

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

11. Data sheet status


Datasheet status Objective specication Preliminary specication Product status Development Qualication Denition [1] This data sheet contains the design target or goal specications for product development. Specication may change in any manner without notice. This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product. This data sheet contains nal specications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product.

Product specication

Production

[1]

Please consult the most recently issued data sheet before initiating or completing a design.

12. Denitions
Short-form specication The data in a short-form specication is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values denition Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specication is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specied use without further testing or modication.

13. Disclaimers
Life support These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no licence or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specied.

9397 750 07223

Philips Electronics N.V. 2000 All rights reserved.

Product specication

Rev. 03 26 July 2000

11 of 13

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

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Internet: http://www.semiconductors.philips.com

(SCA70)

9397 750 07223

Philips Electronics N.V. 2000. All rights reserved.

Product specication

Rev. 03 26 July 2000

12 of 13

Philips Semiconductors

BST82
N-channel enhancement mode eld-effect transistor

Contents
1 2 3 4 5 6 7 7.1 8 9 10 11 12 13 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 1 Quick reference data . . . . . . . . . . . . . . . . . . . . . 2 Limiting values . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Thermal characteristics. . . . . . . . . . . . . . . . . . . 4 Transient thermal impedance . . . . . . . . . . . . . . 4 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 10 Data sheet status . . . . . . . . . . . . . . . . . . . . . . . 11 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Philips Electronics N.V. 2000.

Printed in The Netherlands

All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Date of release: 26 July 2000 Document order number: 9397 750 07223

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