1-Mbit (128 K × 8) Static RAM: Features Functional Description

CY62128EV30 MoBL Automotive
1-Mbit (128 K 8) Static RAM

1-Mbit (128 K 8) Static RAM
Features

Functional Description
The CY62128EV30 is a high performance CMOS static RAM module organized as 128K words by 8 bits. This device features advanced circuit design to provide ultra low active current. This is ideal for providing More Battery Life (MoBL) in portable applications such as cellular telephones. The device also has an automatic power-down feature that significantly reduces power consumption when addresses are not toggling. Placing the device in standby mode reduces power consumption by more than 99 percent when deselected (CE1 HIGH or CE2 LOW). The eight input and output pins (I/O0 through I/O7) are placed in a high-impedance state when the device is deselected (CE1 HIGH or CE2 LOW), the outputs are disabled (OE HIGH), or a write operation is in progress (CE1 LOW and CE2 HIGH and WE LOW). To write to the device, take Chip Enable (CE1 LOW and CE2 HIGH) and Write Enable (WE) inputs LOW. Data on the eight I/O pins is then written into the location specified on the Address pin (A0 through A16). To read from the device, take Chip Enable (CE1 LOW and CE2 HIGH) and Output Enable (OE) LOW while forcing Write Enable (WE) HIGH. Under these conditions, the contents of the memory location specified by the address pins appear on the I/O pins.
Very high-speed: 45 ns Temperature ranges: Automotive-A: 40 C to +85 C Automotive-E: 40 C to +125 C Wide voltage range: 2.2 V to 3.6 V Pin compatible with CY62128DV30 Ultra low standby power Typical standby current: 1 A Maximum standby current: 4 A Ultra low active power Typical active current: 1.3 mA at f = 1 MHz Easy memory expansion with CE1, CE2, and OE features Automatic power down when deselected Complementary metal oxide semiconductor (CMOS) for optimum speed and power Offered in Pb-free 32-pin small outline integrated circuit (SOIC), 32-pin thin small outline package (TSOP) Type I, and 32-pin STSOP packages
Logic Block Diagram
CE1 CE2
A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 WE OE
INPUT BUFFER
I/O 0 I/O 1 SENSE AMPS I/O 2 I/O 3 I/O 4 I/O 5 I/O 6
ROW DECODER
128K x 8 ARRAY
COLUMN DECODER
POWER DOWN
I/O 7
A12
A14
A13
A16
A15
Cypress Semiconductor Corporation Document #: 001-65528 Rev. *A
198 Champion Court
San Jose, CA 95134-1709
408-943-2600 Revised June 27, 2011

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Contents
Pin Configuration ............................................................. 3 Product Portfolio .............................................................. 3 Pin Definitions .................................................................. 4 Maximum Ratings ............................................................. 5 Operating Range ............................................................... 5 Electrical Characteristics ................................................. 5 Capacitance ...................................................................... 6 Thermal Resistance .......................................................... 6 AC Test Loads and Waveforms ....................................... 6 Data Retention Characteristics ....................................... 7 Data Retention Waveform ................................................ 7 Switching Characteristics ................................................ 8 Switching Waveforms ...................................................... 9 Truth Table ...................................................................... 11 Ordering Information ...................................................... 12 Ordering Code Definitions ......................................... 12 Package Diagrams .......................................................... 13 Acronyms ........................................................................ 16 Document Conventions ................................................. 16 Units of Measure ....................................................... 16 Document History Page ................................................. 17 Sales, Solutions, and Legal Information ...................... 18 Worldwide Sales and Design Support ....................... 18 Products .................................................................... 18 PSoC Solutions ......................................................... 18
Document #: 001-65528 Rev. *A
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Pin Configuration
Figure 1. 32-pin STSOP [1]
A11 A9 A8 A13 WE CE2 A15 VCC NC A16 A14 A12 A7 A6 A5 A4 25 26 26 27 28 29 30 31 32 1 2 3 4 5 6 7 8 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 OE A10 CE1 I/O7 I/O6 I/O5 I/O4 I/O3 GND I/O2 I/O1 I/O0 A0 A1 A2 A3
Figure 2. 32-pin TSOP I [1]

A11 A9 A8 A13 WE CE2 A15 VCC NC A16 A14 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE A10 CE1 I/O7 I/O6 I/O5 I/O4 I/O3 GND I/O2 I/O1 I/O0 A0 A1 A2 A3
Top View (not to scale)
Top View (not to scale)
Figure 3. 32-pin SOIC [1]

Top View
NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC A15 CE2 WE A13 A8 A9 A11 OE A10 CE1 I/O7 I/O6 I/O5 I/O4 I/O3
Product Portfolio
Power Dissipation Product Range VCC Range (V) Min CY62128EV30LL CY62128EV30LL Automotive-A Automotive-E 2.2 2.2 Typ [2] 3.0 3.0 Max 3.6 3.6 45 55 Speed (ns) Typ [2] 1.3 1.3 Operating ICC (mA) f = 1 MHz Max 2.0 4.0 f = fmax Typ [2] 11 11 Max 16 35 Standby ISB2 (A) Typ [2] 1 1 Max 4 30
Notes 1. NC pins are not connected on the die. 2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C.
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Pin Definitions
I/O Type Input Input/output Input/control Input/control Input/control Input/control Ground A0A16. Address inputs I/O0I/O7. Data lines. Used as input or output lines depending on operation. WE. Write Enable, Active LOW. When selected LOW, a WRITE is conducted. When selected HIGH, a READ is conducted. CE1. Chip Enable 1, Active LOW. CE2. Chip Enable 2, Active HIGH. OE. Output Enable, Active LOW. Controls the direction of the I/O pins. When LOW, the I/O pins behave as outputs. When de-asserted HIGH, I/O pins are tri-stated, and act as input data pins. GND. Ground for the device. Description
Power supply VCC. Power supply for the device.
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Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the device. User guidelines are not tested. Storage temperature ................................ 65 C to +150 C Ambient temperature with power applied .......................................... 55 C to +125 C Supply voltage to ground potential .......................................0.3 V to VCC(max) + 0.3 V DC voltage applied to outputs in High Z state [3, 4] ......................0.3 V to VCC(max) + 0.3 V DC input voltage [3, 4] ...................0.3 V to VCC(max) + 0.3 V Output current into outputs (LOW) ............................. 20 mA Static discharge voltage ......................................... > 2001 V (MIL-STD-883, Method 3015) Latch up current ..................................................... > 200 mA
Operating Range
Device Range Ambient Temperature VCC[5] CY62128EV30LL Automotive-A 40 C to +85 C 2.2 V to Automotive-E 40 C to +125 C 3.6 V
Electrical Characteristics
Over the Operating Range Parameter VOH VOL VIH VIL IIX IOZ ICC ISB1[7] Description Output HIGH voltage Output LOW voltage Input HIGH voltage Input LOW voltage Input leakage current VCC operating supply current Test Conditions IOH = 0.1 mA, VCC < 2.70 V IOH = 1.0 mA, VCC > 2.70 V IOL = 0.1 mA IOL = 2.1 mA, VCC > 2.70 V VCC = 2.2 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 2.2 V to 2.7 V VCC = 2.7 V to 3.6 V GND < VI < VCC f = fmax = 1/tRC VCC = VCCmax IOUT = 0 mA f = 1 MHz CMOS levels Output leakage current GND < VO < VCC, output disabled 45 ns (Auto-A) Min Typ 2.0 2.4 1.8 2.2 0.3 0.3 1 1 11 1.3 1
[6]
55 ns (Auto-E) Min Typ [6] 2.0 2.4 1.8 2.2 0.3 0.3 4 4 11 1.3 1 Max 0.4 0.4 VCC + 0.3 V VCC + 0.3 V 0.6 0.8 +4 +4 35 4.0 35
Max 0.4 0.4 VCC + 0.3 V VCC + 0.3 V 0.6 0.8 +1 +1 16 2.0 4
Unit V V V V V V V V A A mA mA A
CE1 > VCC0.2 V, CE2 < 0.2 V, Automatic CE power-down VIN > VCC 0.2 V, VIN < 0.2 V, current CMOS inputs f = fmax (address and data only), f = 0 (OE and WE), VCC = 3.60 V Automatic CE CE1 > VCC 0.2 V, CE2 < 0.2 V, power-down VIN > VCC 0.2 V or VIN < 0.2 V, current CMOS inputs f = 0, VCC = 3.60 V
ISB2[7]
30
Notes 3. VIL(min) = 2.0 V for pulse durations less than 20 ns. 4. VIH(max) = VCC + 0.75 V for pulse durations less than 20 ns. 5. Full device AC operation assumes a 100 s ramp time from 0 to VCC(min) and 200 s wait time after VCC stabilization. 6. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C. 7. Chip enables (CE1 and CE2) must be at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating.
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Capacitance
Parameter [8] CIN COUT Description Input capacitance Output capacitance Test Conditions TA = 25 C, f = 1 MHz, VCC = VCC(typ) Max 10 10 Unit pF pF
Thermal Resistance
Parameter [8] JA JC Description Thermal resistance (Junction to ambient) Thermal resistance (Junction to case) Test Conditions Still Air, soldered on a 3 4.5 inch, two-layer printed circuit board 32-pin TSOP I 33.01 3.42 32-pin SOIC 48.67 25.86 32-pin STSOP Unit 32.56 3.59 C/W C/W
AC Test Loads and Waveforms

Figure 4. AC Test Loads and Waveforms
VCC output R1 VCC 30 pF including JIG and scope R2 GND Rise Time = 1 V/ns 10% All Input Pulses 90% 90% 10% Fall Time = 1 V/ns
Equivalent to: Output
THEVENIN EQUIVALENT
RTH
Parameters R1 R2 RTH VTH
2.50 V 16667 15385 8000 1.20
3.0 V 1103 1554 645 1.75
Unit V
Note 8. Tested initially and after any design or process changes that may affect these parameters.
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Data Retention Characteristics

Over the Operating Range Parameter VDR ICCDR[10] Description VCC for data retention Data retention current VCC = 1.5 V, CE1 > VCC 0.2 V or CE2 < 0.2 V, VIN > VCC 0.2 V or VIN < 0.2 V Automotive-A Automotive-E Conditions Min 1.5 Typ [9] Max 3 30 Unit V A A
tCDR[11] tR[12]
Chip deselect to data retention time Operation recovery time CY62128EV30LL-45 CY62128EV30LL-55
0 45 55
ns ns
Data Retention Waveform

Figure 5. Data Retention Waveform [13]
DATA RETENTION MODE VCC
VCC(min)
tCDR
VDR > 1.5V
VCC(min)
tR
CE
Notes 9. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 C. 10. Chip enables (CE1 and CE2) must be at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating. 11. Tested initially and after any design or process changes that may affect these parameters. 12. Full device AC operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) 100 s. 13. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH.
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Switching Characteristics
Over the Operating Range Parameter [14, 15] Read Cycle tRC tAA tOHA tACE tDOE tLZOE tHZOE tLZCE tHZCE tPU tPD Write Cycle [18] tWC tSCE tAW tHA tSA tPWE tSD tHD tHZWE tLZWE Write cycle time CE LOW to write end Address setup to write end Address hold from write end Address setup to write start WE pulse width Data setup to write end Data Hold from write end WE LOW to High Z WE HIGH to Low Z
[16, 17] [16]
Description
45 ns (Automotive-A) Min 45 10 5 10 0 45 35 35 0 0 35 25 0 10 Max 45 45 22 18 18 45 18
55 ns (Automotive-E) Min 55 10 5 10 0 55 40 40 0 0 40 25 0 10 Max 55 55 25 20 20 55 20
Unit
Read cycle time Address to data valid Data hold from address change CE LOW to data valid OE LOW to data valid OE LOW to Low Z CE LOW to Low Z
[16] [16, 17]
ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
OE HIGH to High Z CE HIGH to High Z
[16] [16, 17]
CE LOW to Power-up CE HIGH to Power-down
Notes 14. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH. 15. Test Conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less (1 V/ns), timing reference levels of VCC(typ)/2, input pulse levels of 0 to VCC(typ), and output loading of the specified IOL/IOH as shown in the Figure 4 on page 6. 16. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device. 17. tHZOE, tHZCE, and tHZWE transitions are measured when the output enter a high impedance state. 18. The internal write time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write.
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Switching Waveforms
Figure 6. Read Cycle 1 (Address Transition Controlled) [20, 21]
tRC RC Address tOHA Data Out Previous Data Valid tAA Data Valid
Figure 7. Read Cycle No. 2 (OE Controlled) [21, 22, 23]

Address tRC CE tACE OE tDOE tLZOE High Impedance DATA OUT VCC Supply Current tPU 50% tLZCE DATA VALID tPD 50% tHZOE tHZCE High Impedance
ICC ISB
Figure 8. Write Cycle No. 1 (WE Controlled) [19, 22, 24, 25]
tWC ADDRESS tSCE CE
tAW tSA WE tPWE
tHA
OE tSD DATA I/O NOTE 26 tHZOE

Notes 19. The internal write time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write. 20. The device is continuously selected. OE, CE1 = VIL, CE2 = VIH. 21. WE is HIGH for read cycle. 22. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH. 23. Address valid before or similar to CE1 transition LOW and CE2 transition HIGH. 24. Data I/O is high impedance if OE = VIH. 25. If CE1 goes HIGH or CE2 goes LOW simultaneously with WE HIGH, the output remains in high impedance state. 26. During this period, the I/Os are in output state. Do not apply input signals.
tHD
DATA VALID
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Switching Waveforms (continued)
Figure 9. Write Cycle No. 2 (CE1 or CE2 Controlled) [27, 28, 29, 30]
tWC ADDRESS tSCE tSA tAW tPWE WE tSD DATA I/O DATA VALID tHD tHA
CE
Figure 10. Write Cycle No. 3 (WE Controlled, OE LOW) [27, 30]
tWC ADDRESS tSCE CE
tAW tSA WE tSD DATA I/O NOTE 31 tHZWE DATA VALID tPWE
tHA
tHD
tLZWE
Notes 27. CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH 28. The internal write time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write. 29. Data I/O is high impedance if OE = VIH. 30. If CE1 goes HIGH or CE2 goes LOW simultaneously with WE HIGH, the output remains in high impedance state. 31. During this period, the I/Os are in output state. Do not apply input signals.
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Truth Table
CE1 H X
[32]
CE2 X
[32]
WE X X H L H
OE X X L X H
Inputs/Outputs High Z High Z Data out Data in High Z
Mode Deselect/Power-down Deselect/Power-down Read Write Selected, outputs disabled
Power Standby (ISB) Standby (ISB) Active (ICC) Active (ICC) Active (ICC)
L H H H
L L L
Note 32. The X (Dont care) state for the Chip enables in the truth table refer to the logic state (either HIGH or LOW). Intermediate voltage levels on these pins is not permitted.
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Ordering Information
Speed (ns) 45 Ordering Code CY62128EV30LL-45SXA CY62128EV30LL-45ZXA CY62128EV30LL-45ZAXA 55 CY62128EV30LL-55ZXE CY62128EV30LL-55SXE Package Diagram Package Type Operating Range Automotive-A 51-85081 32-pin 450-Mil SOIC (Pb-free) 51-85056 32-pin TSOP Type I (Pb-free) 51-85094 32-pin STSOP (Pb-free) 51-85056 32-pin TSOP Type I (Pb-free) 51-85081 32-pin 450-Mil SOIC (Pb-free) Automotive-E
Contact your local Cypress sales representative for availability of these parts.
Ordering Code Definitions

CY 621 2 8 E V30 LL - XX XX X X
Temperature Grade: X = A or E A = Automotive-A; E = Automotive-E Pb-free Package Type: XX = S or Z or ZA S = 32-pin SOIC Z = 32-pin TSOP Type I ZA = 32-pin STSOP Speed Grade: XX = 45 ns or 55 ns LL = Low Power Voltage Range: 3 V Typical E = Process Technology 90 nm Bus width = 8 Density = 1-Mbit Family Code: MoBL SRAM family Company ID: CY = Cypress
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Package Diagrams
Figure 11. 32-pin Molded SOIC (450 Mil) S32.45/SZ32.45, 51-85081
51-85081 *C
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Package Diagrams (continued)
Figure 12. 32-pin TSOP I (8 20 1.0 mm) Z32, 51-85056
51-85056 *F
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Package Diagrams (continued)
Figure 13. 32-pin Small TSOP (8 13.4 1.2 mm) ZA32, 51-85094
51-85094 *F
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Acronyms
Acronym CE CMOS I/O OE SOIC SRAM STSOP TSOP WE chip enable complementary metal oxide semiconductor input/output output enable small outline integrated circuit static random access memory small thin small outline package thin small outline package write enable Description
Document Conventions
Units of Measure
Symbol C MHz A s mA ns % pF V W degree Celsius Mega Hertz micro Amperes micro seconds milli Amperes nano seconds ohms percent pico Farad Volts Watts Unit of Measure
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Document History Page

Document Title: CY62128EV30 MoBL Automotive, 1-Mbit (128 K 8) Static RAM Document Number: 001-65528 Rev. ** ECN No. 3115909 Submission Orig. of Date Change 01/06/2011 RAME Description of Change New Datasheet for Automotive SRAM parts. Created separate datasheet for Automotive SRAM parts from Document no. 38-05579 Rev. *H Removed the Note For best practice recommendations, refer to the Cypress application note System Design Guidelines at http://www.cypress.com. and its reference in Functional Description. Updated Electrical Characteristics (Test Conditions of ISB1 and ISB2 parameters). Updated Package Diagrams. Updated in new template.
*A
3288690
06/21/2011
RAME
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Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturers representatives, and distributors. To find the office closest to you, visit us at Cypress Locations.
Products
Automotive Clocks & Buffers Interface Lighting & Power Control Memory Optical & Image Sensing PSoC Touch Sensing USB Controllers Wireless/RF cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB cypress.com/go/wireless
PSoC Solutions
psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 5
Cypress Semiconductor Corporation, 2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement.
Revised June 27, 2011
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All products and company names mentioned in this document may be the trademarks of their respective holders.
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1-Mbit (128 K × 8) Static RAM: Features Functional Description

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CY62128EV30 MoBL Automotive