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6, JUNE 2005
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AbstractThis paper presents an integrable RF sampling receiver front-end architecture, based on a switched-capacitor (SC)
RF sampling downconversion (RFSD) lter, for WLAN applications in a 2.4-GHz band. The RFSD lter test chip is fabricated in
a 0.18- m CMOS technology and the measurement results show
a successful realization of RF sampling, quadrature downconversion, tunable anti-alias ltering, downconversion to baseband, and
decimation of the sampling rate. By changing the input sampling
rate, the RFSD lter can be tuned to different RF channels. A
maximum input sampling rate of 1072 MS/s has been achieved.
A single-phase clock is used for the quadrature downconversion
and the bandpass operation is realized by a 23-tap FIR lter. The
RFSD lter has an
3 of 5.5 dBm, a gain of 1 dB, and more
than 17 dB rejection of alias bands. The measured image rejection
is 59 dB and the sampling clock jitter is 0.64 ps. The test chip consumes 47 mW in the analog part and 40 mW in the digital part. It
occupies an area of 1 mm2 .
IIP +
Index TermsBandpass lters, CMOS analog integrated circuits, mixers, radio receivers, sample and hold circuits, switchedcapacitor lters.
I. INTRODUCTION
Manuscript received May 11, 2004; revised February 16, 2004. This work
was supported by Intel Corporation and the STRINGENT program.
D. Jakonis is with Acreo AB, S-60221 Norrkping, Sweden, and also with
the Department of Electrical Engineering, Linkping University, S-58183
Linkping, Sweden (e-mail: darja@isy.liu.se).
K. Folkesson, J. D browski, and C. Svensson are with the Department of
a
Electrical Engineering, Linkping University, S-58183 Linkping, Sweden.
P. Eriksson is with Wavebreaker AB, S-60186 Norrkping, Sweden.
Digital Object Identier 10.1109/JSSC.2005.848027
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Fig. 2. RF sampling receiver front-end frequency downconversion, anti-alias ltering, and decimation.
A. Block Description
The proposed RF sampling receiver front-end architecture is
shown in Fig. 1. It comprises an RF lter, a tuned LNA, an S/H
mixer, downconversion lters, A/D converters, and a clock path.
is selected and
At the RF lter the whole frequency band
are suppressed (Fig. 2). The signal
the image frequencies
is then amplied and ltered by the tuned LNA to further improve RF selectivity and to provide sufcient protection against
aliasing in the subsampling process. It is important to note that
the LNA needs to be tuned to prevent aliasing of its amplied
input referred noise. If the LNA is not tuned, it must instead
be followed by an additional lter. The RF lter and tunable
LNA selectivity sets the requirements for the choice of IF. The
S/H mixer samples the output of the tuned LNA and thereby
downconverts the RF signal to IF. Since the signal is bandpass
should be higher than
sampled, the intermediate frequency
half of the RF band
or, equivalently, the sampling rate
should be higher than
to avoid in-band aliasing. By
choosing a high IF, the requirements on RF selectivity can hence
be relaxed. For RF signal downconversion to IF quadrature components and , the S/H mixer sampling rate should be selected
from the following expression [14]:
(3)
To reduce noise aliasing in RF signal subsampling, a high sampling rate is desirable. On the other hand, a too high sampling
rate is not suitable for the A/D converter due to excessive power
dissipation. One method to combine these requirements is to reduce the sampling rate by signal decimation. If the sampling rate
is decimated by , then the resulting sampling rate in the A/D
converter is given by
(4)
The decimation operation can also be employed for signal
downconversion to the baseband. In this case, the decimated
should be equal to
or its submultiple
sampling rate
in (4)
frequency. To satisfy this requirement, the ratio
should be an integer number. Due to the downconversion
operation in decimation, a number of frequencies can alias
into the baseband. Alias band center frequencies around IF are
expressed as
(1)
(5)
(2)
(6)
Since the phase difference between S/H mixer output samples
is equivalent to 90 degrees, they can be sorted into even path
samples and odd path samples. Thus, a quadrature downconversion operation is accomplished by using one sampling clock.
In this context, quadrature downconversion is necessary to distinguish the wanted band and its image in the next step of down-
where
is the signal bandwidth. Here, the anti-alias lter
should be placed at the intermediate frequency
.
For anti-alias ltering and signal downconversion to baseband, the downconversion lter block is used in the and
output branches of the S/H mixer (Fig. 1). In this context, the
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TABLE I
FREQUENCY PLAN FOR IEEE 802.11b/g RECEIVER FRONT-END
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Fig. 4. Downconversion lter. (a) Schematic. (b) 23-tap FIR lter nonzero
coefcient values and corresponding switched capacitors.
(9)
where
corresponds to a time delay, equal to the sampling
period
. The FIR lter frequency response for the samMS/s is shown in Fig. 5. Since the antipling rate
alias bandpass lter frequency response depends on the sampling rate, it can easily be tuned to different frequency bands by
varying .
A unit capacitor corresponds to the lowest coefcient value.
This solution makes possible to reuse the same unit capacitor
for all coefcient values. In this approach every lter coefcient
is accomplished by a switched capacitor, which comprises a
number of parallel unit capacitors. Since the nonzero coefcient
values are symmetrical around the highest value, the lter implementation is additionally simplied. In this case only 6 different
capacitance values are needed to realize 11 lter coefcients.
In the downconversion lter, the IF signal is sequentially sam
and
by a set of
pled on weighted capacitors
switches, connected to the input. Next, the weighted capacitor
charges are added together by another set of switches. Unlike
Fig. 5. FIR bandpass lter frequency response for the sampling rate f
1072 MS/s. Dashed lines indicate the signal bandwidth BW .
(10)
where
is the total noise charge,
is the total coefis the th coefcient capacitance. As
cient capacitance and
a result, the noise voltage in (10) is equivalent to sampling on
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Fig. 6. RFSD lter output noise power spectral density versus unit capacitor
size. The smallest unit capacitor size represents actual test chip design.
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Fig. 7. RF sampling downconversion lter main blocks. (a) Block diagram. (b) Nonzero coefcient multiplication and summation
time-interleaved outputs are ready after 12 clock samples.
Fig. 8. Clock path. (a) Block diagram. (b) Clock phases to S/H mixer and downconversion lter.
sequence. The
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Fig. 10.
Fig. 11.
D. Output Buffer
The output buffer is illustrated in Fig. 12. It is a unity-gain
buffer [26] with an input
, which is connected to the downthe buffer is intended
conversion lter output. At the output
to drive an off-chip load of 50 impedance. The unity-gain
buffer consists of a differential pair with an active load and a
source follower in a local feedback loop. Transistors , ,
realize the differential pair, where
acts as a current
and
and
implement the active load. The
source. Transistors
source follower comprises of
and , where
is a current
source. Due to a triple well process with a deep n-well transistor, the substrate of is connected to the drain to increase the
source follower linearity. To improve the stability of the output
is added to the drain of tranunity-gain buffer, a capacitor
sistor . This minimizes the ringing effect in the step response
for a large load capacitance. The unity-gain buffer has a power
gain of 0.86 dB and the output bandwidth is 786 MHz.
IV. EXPERIMENTAL RESULTS
A. Chip Layout
The RFSD lter test chip, shown in Fig. 13, was implemented
and fabricated in 0.18- m CMOS technology. The active core
area is 0.36 mm and the total chip area is 1 mm . There are
24 I/O pads, of which the power supply and bias pads are ESD
protected. To reduce crosstalk between the noisy digital part and
the sensitive analog part, different power supply and ground
pads were used. Decoupling capacitors were connected to the
power supply and bias voltages for on-chip stabilization of these
voltages. Wide power supply wires were employed to decrease
the resistive voltage drop. A termination resistor of 50 was
added to the RFSD lter input for measurement purpose only.
In a monolithic S/H mixer implementation with an LNA on a
single chip such termination is not needed. For mismatch minimization the downconversion lter blocks were symmetrically
placed with respect to the test chip vertical axis and the FIR
lter coefcients were realized in the array of unit capacitors,
illustrated in Fig. 14. Dummy capacitors were added into the
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Fig. 12.
Fig. 14. FIR lter array of unit capacitors. An integer number on the unit
capacitor indicates a set for coefcient capacitor implementation. The dummy
capacitors are realized to reduce mismatch.
Fig. 13. Chip microphotograph. The total chip area including the pads is
1 mm .
Fig. 15.
RFSD lter test chip shows the correct frequency downconversion operation for the quadrature components, illustrated
in Fig. 17. If the input signal with a frequency of 2.413 GHz
MS/s, the resulting output
is sampled at a rate
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Fig. 17. Measured output quadrature waveforms for the sampling rate f =
1072 MS/s, the analog input frequency f = 2:413 GHz, and the input power
level of 4 dBm.
Fig. 18. (a) Measured RFSD lter baseband signal output power and (b) output
frequency versus the input signal frequency. The sampling rate f = 1072 MS/s
and the input signal power level is 4 dBm.
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In the same way, the RFSD lter performance was also measured for an input sampling rate of 567.5 MS/s. For the WLAN
channel center frequency of 2.412 GHz this sampling rate corin (1). In this case the measured output
responds to
sampling rate was 47.3 MS/s, the corresponding gain was 1 dB
of 13.5 dBm was achieved. The alias bands were
and the
rejected by more than 24 dB, whereas the center frequencies
in these bands were attenuated better than 36 dB. Regarding the
image frequency, the rejection of 29 dB was obtained. An equivalent output noise level was measured to 130 dBm/Hz and the
evaluated sampling clock jitter was 0.54 ps. The overall test chip
power consumption was 70 mW, where the analog and digital
parts consumed 43 mW and 27 mW, respectively.
By changing the input sampling rate, the RFSD lter can be
tuned to different center frequencies of WLAN channels. As
shown in Fig. 20, the input sampling rate of 567.5 MS/s is related to the WLAN channel center frequency of 2.412 GHz. For
a sampling rate of 581.6 MS/s, the WLAN channel, located at
2.472 GHz, is downconverted to the baseband. These results are
in (1). The described RFSD
demonstrated for the case of
lter test chip measurement results are summarized in Table II.
To measure the RFSD lter constellation diagram, a
high-order IEEE 802.11g standard modulation scheme of 64
QAM was used with a maximum data rate of 54 Mb/s. For the
front-end input sampling rate 567.5 MS/s the resulting error
vector magnitude, measured with a vector signal analyzer, was
6.2%. The constellation diagram of the modulated 2.4-GHz
frequency band WLAN signal is shown in Fig. 21.
C. Discussion
As a complement to the measurements at the input sampling
rate 1072 MS/s, another measurements at 567.5 MS/s were
performed. At the lower sampling rate the RFSD lter shows
higher linearity and higher alias band rejection. This indicates
that 1072 MS/s is too close to the frequency limits of the actual
RFSD lter. One of the reasons for the decreased performance
is a speed limit of the clock path leading to degraded clock
Fig. 20. Measured RFSD lter frequency response for different sampling
frequencies. The input signal power level was 4 dBm. Here, a frequency plan
with K = 9 was used.
TABLE II
PERFORMANCE SUMMARY OF THE RFSD FILTER MEASUREMENT
Fig. 21.
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The one-sided power spectral density (PSD) of the noise, generated in the S/H mixer switch, has been derived from (7) and
is given by
(11)
. Since the FIR lter has a length of
where
clock samples, this noise is resampled by each section of
. Hence, the noise is folded
the FIR lter at a rate
with a factor
[21]. The averaging operation in the downcon
are
version lter is performed when the switches
are in the
in the off-state, whereas the switches
on-state. After averaging, the resulting voltage of the S/H mixer
noise at the output is expressed as
(12)
APPENDIX
This appendix presents a noise analysis for the RFSD lter.
An equivalent noise model, presented in Fig. 22(a), includes the
S/H mixer and the downconversion lter with one array of positive/negative coefcient capacitors [Fig. 4(a)]. To simplify the
noise analysis, the buffers
and
are assumed to be noiseis neless with a unity gain. Also, the impact of capacitor
glected. In the noise model, three components of thermal noise
sources can be encountered: the noise from the S/H mixer switch
, the noise from the FIR lter switches
,
and the noise from the averaging switches
. Assuming the described circuit is linear, the total output noise will
be calculated by the superposition principle.
(13)
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Fig. 22.
Noise model. (a) RFSD lter with one array of capacitors. (b) An equivalent circuit for the averaging switch noise contribution.
, is
PSD, originating from the FIR lter switches
(14)
(17)
where
. In (14) a factor of 2 is included for
positive and negative coefcient capacitor arrays.
Finally, the noise contribution from the averaging switches
(15)
where
denotes the sum of
capacitors. The corresponding one-sided output noise PSD for the averaging
switches in positive and negative coefcient capacitor arrays is
(16)
ACKNOWLEDGMENT
The authors would like to thank S. Andersson and ACREO
AB for their help in the test chip design and fabrication.
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