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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Discover Todays
Solutions for
Tomorrows Nano
Characterization
Challenges
Additional Resources
The Emerging Challenges of
Nanotechnology Testing
Climbing the Commercialization Hill
G R E AT E R
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One approach to this technique is to use a nanoThis represents the number of electron states per manipulator that makes low resistance contacts
to the nanoparticle. Such an arrangement
unit volume per unit energy at energy E, where:
allows charge transport and density of states
m = the effective mass of the particle,
measurements. This works well into the conduction
h = Plancks constant, and
region thanks to the low resistance direct
E = the energy (electron orbital location) in
connections of the nano-probes on the material
electron volts.
(particle) being tested.
Although the result is independent of volume
(can be applied to any size particle), this equation
is of limited value if the particle size/structure is
unknown. However, other ways are available to
determine the density of states experimentally, from
which the particle size can be found.
3
E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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4
E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Additional Resources
Nanoscale Device and Material Electrical
Measurements
Advanced Particle Beam Methods For
Nano-characterization And Analysis
Optimizing Low Current Measurements
with the Model 4200-SCS Semiconductor
Characterization System
I-V Measurements of Nanoscale Wires
and Tubes with the Model 4200-SCS and
Zyvex S100 Nanomanipulator
Tips for Electrical Characterization of
Carbon Nanotubes and Low Power
Nanoscale Devices
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n Nanoscopic
n Given
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Improving Low
Current Measurements
on Nanoelectronic and
Molecular Electronic
Devices
Additional Resources
Electrical Measurements on
Nanoscale Materials
Four-Probe Resistivity and Hall Voltage
Measurements with the Model 4200-SCS
Guide to Measuring New Materials
and Devices
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E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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G R E AT E R
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Electrical Noise
Vn = (4kTBR)
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(a)
Electronic Properties of
Zinc-Blende Wurtzite
Biphasic Gallium Nitride
Nanowires and NanoFETs
(b)
Figure 3. (a) Circuit model for the source voltage/measure current technique; (b) Modified
model illustrating the noise gain (op-amp noise gained up) when the DUT impedance is low
compared to the measurement impedance.
The Johnson current noise of a resistor at 270K is: the correct measurement topology is chosen.
For example, consider a source voltage/measure
current topology. An operational amplifier is used
in many current measurement (ammeter) circuits,
as shown in Figure 3.
indicating that the noise goes down as DUT resistance increases.
To minimize noise gain, the ammeter circuit must
operate at a low gain with respect to its non-inverting
For all particle sizes, in addition to Johnson
input terminal.
noise, there could be a noise gain associated with
the measurement topology chosen. Noise gain
is a parasitic amplification of the noise of the
measurement system that is not present when
Additional Resources
Low Level Measurements Handbook
G R E AT E R
M E A S U R E
O F
C O N F I D E N C E
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Source-Measure Instruments
A commercial DC source-measure unit (SMU) is a
convenient test tool for many nanoscopic material
and device measurements. SMUs change measurement topology automatically (that is, they can rapidly
switch between sourcing voltage/measuring current
and sourcing current/measuring voltage). This
makes it easier to minimize measurement noise
while maximizing measurement speed and accuracy.
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In-situ Correlation of
Mechanical Properties,
Deformation Behavior,
and Electrical
Characteristics of
Materials Using
Conductive
Nanoindentation
Ryan Major
R&D Project Manager
Hysitron, Inc.
Additional Resources
Model 4200-SCS Semiconductor
Characterization System
Series 2600A System SourceMeter
Instruments
G R E AT E R
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O F
C O N F I D E N C E
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Pulsing Techniques
Choosing the correct measurement topology to
improve measurement speed and minimize noise
may still be insufficient to the test needs for some
nanoscopic materials. For example, it appears
that some CNTs can switch 1000 times faster than
conventional CMOS transistor switches. This is
too fast for the nano-amp ranges of commercial
picoammeters. Demanding devices like these may
require other techniques to improve the speed of
impedance measurements.
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Additional Resources
DC offsets due to thermal voltages and meter
offsets can give significant errors in the measured voltage.
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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Pp = Pa Tt / Tr
Jonathan Tucker
Senior Marketer, Nanotechnology
Keithley Instruments, Inc.
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Vxx = Longitudinal
Voltage
xx
Vxx
= R xx
I
V
Researchers characterizing graphene and
graphene-based materials use Hall effect V = Transversal Voltage,
Hall Voltage with
measurements and study longitudinal
applied B
resistance to assess carrier mobility and look
for evidence of the quantum Hall effect,
Graphene
Vxy
whereby longitudinal resistivity decreases to
near 0-cm. These measurements require
Nanovoltmeter
very low current, precision sourcing, on
the order of nano-amps. However, the
most important aspect of tight control over
sourcing is ensuring that excessive power
DC Current Source
does not develop across the graphene sample
in order to avoid destroying it. Furthermore, Configuration for simultaneous measurement of
at nano-amp source current levels, the Hall effect voltage and longitudinal resistance of a
resulting voltages developed across the graphene sample in a Hall bar configuration.
sample are extremely small, on the order
of ten to hundreds of nanovolts. These type
of nanovolt-level measurements require special
instrumentation with sufficient resolution and
extremely high sensitivity.
xy
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E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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xx
+7/2
+5/2
Hall Voltage
VXY
Graphene
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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10
Featured Resources
Take Advantage of
Keithleys Expertise
with Measurements
on Graphene
+3/2
4K
14T
+1/2
1/2
Longitudinal
Voltage
VXX
SiO2
Silicon
Vgate
3/2
5/2
7/2
-2
0
n (1012 cm-2)
Additional Resources
Delta Mode Online Demo
Achieving Accurate and Reliable
Resistance Measurements in Low
Power and Low Voltage Applications
Plot of Hall voltage and longitudinal voltage across a magnetic field of varying intensity.
Note how the Hall Voltage is constant at specific points of magnetic field intensity;
at those points, the longitudinal voltage drops to near 0, indicating extremely high
conductivity. This demonstrates that graphene exhibits the quantum Hall effect.
Plot courtesy of Neto, Novoselov, Geim, et, al. The Electronic Properties of Graphene. Jan. 2009
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
Summary
The electronic structure of nanoscopic particles is
a reflection of the atomic electron energies and the
distribution of orbitals for both molecularly shared
and free electrons. This kind of information can be
used to describe how such materials will interact
in the presence of energy and other materials. The
density of states in a material is directly related to
its electronic structure and is useful in predicting
or manipulating its properties.
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It can be found through direct electrical measurements of differential conductance. Thus, the
density of states can predict a materials electrical
impedance and vice versa.
However, there is a right way and a wrong way
to interrogate a nanoscopic material electrically,
depending on its impedance. For a low impedance
material, the source current/measure voltage
method will result in the least electrical noise and
allow the most accurate response measurement
with the widest bandwidth. For a high impedance
material, the source voltage/measure current
method is more appropriate for similar reasons. At
times, the appropriate measurement mode must be
used in unison with yet another voltage or current
source to activate or stimulate the device.
Additional Resources
Model 4200 Semiconductor
Characterization Test System Product Intro
Model 4200-SCS Semiconductor
Characterization System
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Glossary
Absolute Accuracy. A measure of the closeness of
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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Glossary continued
Fullerene. Refers to C60, an approximately spherical,
impedance.
control of the structure of matter based on moleculeby-molecule control of products and by-products; the
products and processes of molecular manufacturing,
including molecular machinery.
Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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E N S U R I N G T H E AC C U R AC Y O F N A N O S C A L E E L E C T R I C A L M E A S U R E M E N T S
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Glossary continued
Repeatability. The closeness of agreement between
reference in laboratories.
Superconductor. A conductor that has zero resistance.
Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
terminals of an ammeter.
Voltage Coefficient. The change in resistance value
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Polymer Nanofibers/
Nanowires
Semiconductor
Nanowires
Carbon Nanotubes
and Graphene
Single Electron
Devices/Transistors
Carbon Nanotube
Field Effect Transistors
Nanobatteries
Nanophotonics
Synthesized Molecular
Electronics/Wires
Thermal Transport
Low I, Low V
Low I, Pulse
Low I, Pulse
Low I, Low V
G R E AT E R
M E A S U R E
O F
C O N F I D E N C E
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Introduction.......................................................2
Nanotech Testing Challenges.......................2
Electrical Measurement Considerations....5
Electrical Noise.................................................6
Source-Measure Instruments........................7
Pulsing Technologies......................................8
Avoiding Self-Heating Problems..................9
Application Example: Graphene................ 10
Summary.......................................................... 12
Glossary............................................................ 13
Selector Guide................................................ 16
For More Information.....................................17
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Some of the materials used in this e-handbook are reproduced from the first edition of Keithleys
Nanotechnology Measurement Handbook, Copyright 2007 Keithley Instruments, Inc.
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No. 3114
02.15.11
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