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Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA
2
Department of Physics, University of Kelaniya, Kelaniya 11600, Sri Lanka
(Received 3 December 2012; published 21 February 2013)
We study the properties of a steplike defect on the surface of ultrathin topological insulator nanofilms. We
calculate the reflectance of an electron from such a defect for different parameters of the nanofilm and different
parameters of the defect. We show that an electron incident on a steplike defect not only produces reflected and
transmitted waves but also generates the modes, which are localized at the steplike defect. Such modes result in
an enhancement of electron density at the defect by 60%. The magnitude of the enhancement depends on the
parameters of the nanofilm and the height of the step and is the largest in the case of total electron reflection.
DOI: 10.1103/PhysRevB.87.075318
I. INTRODUCTION
075318-1
p 2
2
(1)
+ B1 2 + B2 2 z z ,
L
h
Region 1
nanofilm. Here k = kx2 + ky2 . For a given wave vector (kx ,ky )
there are two energy bands, E+ (k) and E (k), which can be
identified as conduction and valence bands of TI nanofilm.
The two-component wave function, corresponding to the wave
vector (kx ,ky ) and energy E (kx ,ky ), has the form
kx ,ky ,L =
F1 + N1 k 2 E (k,L)
Region 2
(b)
Reflected
Transmitted
Incident
localized modes
075318-2
1.0
L 40
0
0.8
Reflectance
(6)
0 =
t1 kx ,ky ,L2 + t2 i ,ky ,L2 ,
x > 0,
0.6
0.02
0.04
0.1
0.01
0.4
k0.005
0.2
20
40
L2()
60
80
100
075318-3
1.0
L = 10
0.6
0.6
30
L = 40
= 0
20
0.4
0.2
50
0 0
100
0.02
0.04
k(-1)
0.06
0.08
0.10
0.2
30
100
0
1.0 L =10
50
(b)
0.8
k = 0.1
L = 40
0.6
20
0.4
k = 0.02
L = 40
0.4
Reflectance
Reflectance
0.8
(a)
30
0.2
0
100
0.2
0.4
0.6
0.8
(rad)
1.0
1.2
50
1.4
at L2 = 10 A
075318-4
150
100
3
1
-20
-10
10
20
x()
(x)(10-3)
(c)
L1 = 100
L2 = 20
k = 0.1 -1
0.5
-20
-20
-10
(d)
30
20
20
x()
20
(x)(10-3)
10
0.4
10
-20
-10
(a)
0.6
50
-10
0.3
0.1
L1 = 100
L2 = 10
k = 0.05 -1
0.2
x()
k 0.05 -1
L1 = 100
L2 = 10
k = 0.1 -1
0.4
10
15
20
25
k 0.1
L1 = 100
L2 = 20
k = 0.05 -1
30
(b)
0.3
10
0.2
10
20
x()
0.1
10
15
20
25
30
the critical point, i.e., the transition point from total reflection
to small reflection, the larger the amplitudes of evanescent
modes are.
In Fig. 7 the densities of evanescent modes, 1 (0 ) and
2 (0 ), are shown as the functions of the angle of incidence,
. The system is in the regime of total reflection. The densities
of evanescent modes have nonmonotonic dependence on the
angle with maximum values at some finite values of ; e.g.,
L
L
0.15
k
(a)
0.8
(x)(10-3)
(b)
0.10
(x)(10-3)
0.05
0.2
0.4
0.6
0.8
(rad)
1.0
1.2
1.4
075318-5
12
075318-6
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