Portable X.R.

F
One of the most important and modern geological field equipment because it
provides a chemical analysis for samples at once in the field

PORTABLE XRF TECHNOLOGY

Born in a culture of innovation, portable Thermo Scientific x-ray fluorescence
(XRF) analyzers continue to lead the way since we introduced the first one-piece
handheld XRF analyzer in 1994. XRF itself is a nondestructive test for material
composition, a technique that we perfected so that we can offer you a choice of
instrument platforms, excitation sources, calibration models, and modes of
operationchoices that are optimized for the way you work.

How XRF Works

Whether you're interested in geochemical analysis for mining and

exploration or alloy verfication for quality control, performing precious metal
testing to confirm purity and karat weight or compliance testing to meet
regulatory requirements - or if you're just curious to learn more about x-ray
fluorescence (XRF) spectroscopy - look no further. Here's an introduction to

the physics, technology, and the algorithms that make XRF a robust, versatile,
and easy-to-use elemental analysis tool.
Because of Fundamental Parameters (FP) analysis and other advanced
technology, in a variety of testing applications, users of our analyzers require
little, if any, specialized knowledge or laboratory training to work effectively in
the field...this means non-technical personnel can usually perform the work. In
applications such as metal and precious metal analysis, our standard FP
algorithms are used in combination with a built-in grade-identification library
that enable you to identify hundreds of metal and/or precious metal alloy grades
in seconds. Costs decrease while productivity increases through immediate onsite analysis - no more waiting for lab results.

From the inside out, our award-winning portable XRF analyzers are designed to make
you more successful. With innovative technology engineered into all our Thermo
Scientific portable XRF instruments - from the handheld Thermo Scientific Niton
XL2 Series and Niton XL3 Series analyzers to the Niton FXL field x-ray lab, you

get high-performance today, scalability for tomorrow, and a solid foundation to

develop future features and applications.

Sample Analysis Using Energy Dispersive X-ray Fluorescence

(EDXRF)
Thermo Scientific portable energy-dispersive x-ray fluorescence (EDXRF)
analyzers, commonly known as XRF analyzers, can quickly and nondestructively
determine the elemental composition of:

Metal and precious metal samples

Rocks, ore, and soil
Painted surfaces, including wood, concrete, plaster, drywall, and other
building materials
Plastics, consumer goods
Dust collected on wipe samples
Airborne heavy elements collected on filters

Up to 40 elements may be analyzed simultaneously by measuring the

characterisitic fluorescence x-rays emitted by a sample. Our XRF analyzers can
quantify elements ranging from magnesium (Mg - element 12) through uranium (U
- element 92) and measure x-ray energies from 1.25 keV up to 85 keV in the
case of Pb K-shell fluorescent x-rays excited with a 109Cd isotope. These
instruments also measure the elastic (Raleigh) and inelastic (Compton) scatter xrays emitted by the sample during each measurement to determine, among other
things, the approximate density and percentage of the light elements in the
sample.

Elemental Analysis - A Unique Set of Fingerprints

How does XRF work? Each of the elements present in a sample produces a
unique set of characteristic x-rays that is a "fingerprint" for that specific
element. XRF analyzers determine the chemistry of a sample by measuring the
spectrum of the characteristic x-ray emitted by the different elements in the
sample when it is illuminated by x-rays. These x-rays are emitted either from a
miniaturized x-ray tube, or from a small, sealed capsule of radioactive material.
1. A fluorescent x-ray is created when an x-ray of sufficient energy strikes
an atom in the sample, dislodging an electron from one of the atom's
inner orbital shells.
2. The atom regains stability, filling the vacancy left in the inner orbital
shell with an electron from one of the atom's higher energy orbital
shells.
3. The electron drops to the lower energy state by releasing a fluorescent
x-ray, and the energy of this x-ray is equal to the specific difference in
energy between two quantum states of the electron.

When a sample is measured using XRF, each element present in the sample emits its
own unique fluorescent x-ray energy spectrum. By simultaneously measuring the
fluorescent x-rays emitted by the different elements in the sample, our Thermo
Scientific portable XRF analyzers, from our handheld Thermo Scientific Niton XL2
analyzer to our Niton FXL field x-ray lab, can rapidly determine those elements
present in the sample and their relative concentrations - in other words, the elemental
chemistry of the sample. For samples with specifically defined chemical
composition, such as common grades of metal alloys, these XRF instruments also
identify most sample types by name, typically in seconds.

Light Element Analysis with XRF

Recent advancements in Thermo Scientific Geometrically Optimized Large Area
Drift Detector (GOLDD) technology have improved the performance of our
portable XRF analyzers in general, but particularly the performance on elements
below atomic number 17 (Mg, Al, Si, P, S, Cl). The handheld Thermo Scientific
Niton XL2 GOLDD and the Niton XL3t GOLDD+ analyzer as well as the Niton
FXL field x-ray lab can now detect elements as low as Mg (atomic number 12)
without the use of helium (He) purge or vacuum pumps.

However, a few applications require the very best in light element sensitivity.
In these cases, light element XRF analysis should be performed either with a
helium gas purge or in a vacuum chamber in a laboratory environment. Because
using a vacuum with portable XRF is highly impractical (even minor punctures to
the thin window used to seal the instrument from the environment will draw
dust, debris, and metal fililings into the instrument), an He purge unit is the
most appropriate solution.

Thermo Scientific Portable XRF Sample Analysis Techniques

Thermo Scientific portable XRF analyzers automatically compensate for many

effects that would otherwise bias or distort sample analyses. These effects
include:

* Geometric effects caused by the sample's shape, surface texture, thickness,

and density

Spectral interferences

Sample matrix effects, including critical absorption of the characteristic

x-rays of one element by other elements in the sample, and secondary and
tertiary x-ray excitation of one or more elements by other elements in the
sample

By automatically adjusting for these effects, our XRF analyzers are able to
determine the chemistries of samples of widely different composition, usually in
seconds, without any requirement for instrument users to input empirical,
sample-specific calibrations. In typical samples containing many elements, the
elements can range in concentrations from high percent levels down to parts per
million (ppm).
In

sample

matrices

such

as

typical mining samples, metal,

and precious

metal alloys, it is necessary to measure both lighter elements that emit lower
energy x-rays (that are easily absorbed) as well as heavier elements that emit
much higher energy x-rays (that penetrate comparatively long distances through
the sample).
Compensation must be made for a variety of geometric effects. In these multielement samples, it is also possible that one or more of the elements present act
as critical absorbers. The effects of absorption, enhancement, and secondary
fluorescence vary widely depending on the chemistry of the sample matrix; but
in a sample with many elements in substantial concentrations, multiple
absorptions, secondary, and also tertiary x-ray fluorescence effects are
typically present.

Thermo Scientific portable XRF analyzers compensate for all of these effects
to measure the actual concentration of elements in multi-element samples from
the modified fluorescence x-ray spectrum that these samples produce in the
XRF analyzer. To accomplish this, we use multiple methods for determining the
true composition of these complex samples from their x-ray spectra. These
include:

Fundamental Parameters (FP) analysis

Compton Normalization (CN)

Spectral matching ("fingerprint") empirical calibration

User-definable empirical calibration

Various combinations of these techniques

The Many Faces of Calibration

Whether your application calls for our proprietary Fundamental Parameters
software or another calibration technique, our Thermo Scientific portable XRF
analyzers can optimize your results.

You need little, of any, specialized

knowledge or laboratory trainng to work efficiently and effectively in the field.

Just point and shoot or close the lid (Thermo Scientfic Niton XL field x-ray
lab or handheld with a test stand), and our instruments will do the rest.

Fundamental Parameters (FP) Analysis

For measuring samples of unknown chemical composition in which concentrations

of light and heavy elements may vary from parts per million (ppm) to high
percent levels, Fundamental Parameters (FP) analysis is used to simultaneously
compensate for a wide variety of geometric effects (including small and oddshaped samples), plus x-ray absorption, and sceondary and tertiary fluorescent
effects. FP is the preferred analysis tool for mining and exploration, precious
metals analysis, and all metal alloy testingapplications. Using this powerful, infactory calibrated instrument, a Thermo Scientific portable XRF analyzer can
then measure the full range of element concentrations in a wide variety of
samples for years without any additional calibrations or user input of any kind.

Compton Normalization (CN)

Compton Normalization XRF techniques provide the best results for a wide
range of environmental testing and some mining applications, particularly when it
is necessary to measure sub-percent concentrations of heavy elements in
samples composed mainly of light elements. In environmental testing projects, it
is often highly desirable to be able to quickly measurelow concentration levels of
eight of the Resource Conservation and Recovery Act (RCRA) heavy metals (Ag,
As, Ba, Cd, Cr, Hg, Pb, Se) on-site and in real time.
Normalization,

Thermo

Scientfic

portable

XRF

analyzers

Using Compton
can

measure

concentrations of many heavy metals.

Lead Paint Analysis

Heterogeneous samples, such as Pb and non-Pb layers on painted materials,

require the highly advanced lead paint algorithms that we have developed.

Spectral Matching Empirical Calibrations

In the first empirical testing mode, the user combines Signature Match Mode
with chemistry from a known (e.g., lab certified) sample, storing this data in the
instrument. When an unknown sample is measured in this mode, the sample
spectrum is compared to the sample spectra stored in this library. In this mode,
the unknown sample chemistry is calculated via extrapolation and interpolation
from the stored chemistries of the named samples in the library.

The

calculated chemistry is then compared to a stored grade look-up table of

chemical compositions. Empirical testing modes are well suited for measuring

samples for which the chemical compositions are reasonably well known in
advance.

User-definable Empirical Calibrations

While most applications are readily supported with our analyzers' robust
calibration algoriths, there are occasional samples that require specialized
processing to supply the most accurate results. For these few cases, the
empirical testing mode provides users with the ability to have their own
application-specific empirical calibrations. These calibration equations may then
be overlaid onto existing FP or CN calibration models, or used to create
completely new modes to optimize analytical results for specific applications.
Users can request custom linear regression equations, specifying the analyzed
elements and elemental intrerferences for real-time processing on Niton XL2
Series and Niton XL3 Series analyzers during sample measurement. Empirical
testing modes are well vsuited for measuring samples for which the general
chemical compositions are reasonably well known in advance.

: Prepared By

Mahmoud Salah El-enany

: Supervisor

Prof.Dr : Maher Daoud