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VMMK-2403, VMMK-2503
Description
This document describes the reliability performance of
VMMK-2x03 based on a series of reliability tests conducted. VMMK-2x03 is fabricated using Avago Technolodiess
industry leading E-PHEMT technology associated with
chip scale surface mount leadless package with GaAs
encapsulation. VMMK-2x03 are intended for 0.5 11GHz
range of wireless application.
VMMK-2203 and VMMK-2403 had been subjected to extensive reliability stress tests to predict the mean time to
failure and associated distribution. The reliability performance of VMMK-2103, VMMK-2303 and VMMK-2503 were
leveraged on these two products based on similarity in
packaging and wafer fabrication process.
Stress Test
Condition
Total Units
Tested
Total Device
Hours
No. of Failed
Units
VMMK-2203
48
48,000
VMMK-2403
48
48,000
VMMK-2203 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB
VMMK-2403 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB, OIP3 degradation > 2dBm
Point Typical
Performance
MTTF hours
90%
Confidence
MTTF hours
Point Typical
Performance
FIT
90%
Confidence
FIT
150
9.600 X 104
4.165 X 104
10416.7
24010.4
125
4.637 X 106
2.012 X 106
215.7
497.1
100
3.766 X 108
1.634 X 108
2.7
6.1
85
7.074 X 109
3.069 X 109
0.141
0.326
65
5.296 X 1011
2.298 X 1011
0.002
0.004
50
1.914 X 1013
8.304 X 1012
0.00005
0.00012
Notes:
1. Arrhenius model with constant failure rate assumed. Activation energy Ea= 2.25eV derived from multi-temperature stress testing.
2. The point MTTF (representing an estimate of the mean point MTTF) is the total device hours divided by either the number of failures or unity if
there are no failures.
3. 90% confident MTTF and failure rate represent the minimum level of reliability performance that is expected from 90% of all samples. This
confidence interval is based on the statistics of the assumed exponential distribution of failures.
4. FIT = failure per 109 device hours.
5. Thermal Resistance qch-b: VMMK-2203 = 107C/W, VMMK-2403 = 161C/W
Note: These devices are esd sensitive, the following precautions are strongly recommended. EnEnsure that an esd approved carrier is used when units are transported
from one destination to another. personal groundings is to be worn at all times when handling these devices. the manufacturer assumes no responsibilities for esd damage due to
improper storage and handling of these devices.
Product
Conditions
Duration
Failures/number tested
High Temperature
Operating Life (HTOL)
VMMK-2203
1000hrs
0/48
VMMK-2403
1000hrs
0/48
VMMK-2203
85C/85%RH,
Vd = 5V, Id = 23mA
1000hrs
0/48
VMMK-2403
85C/85%RH,
Vd = 5V, Id = 52mA
1000hrs
0/48
VMMK-2203 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB
VMMK-2403 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB, OIP3 degradation > 2dBm
Product
Conditions
Duration
Failures/number tested
Temperature Cycle
VMMK-2203
JESD22A-104C, Cond B
-55 C /+125C,
15mins dwell (Air to Air)
500 cycles
0/90
500 cycles
0/88
1000hrs
0/90
1000hrs
0/87
1000hrs
0/90
1000hrs
0/85
1000hrs
0/89
1000hrs
0/88
VMMK-2403
Low Temperature
Storage Life
VMMK-2203
JESD22-A119, Cond A
-40C
VMMK-2403
High Temperature
Storage Life
VMMK-2203
JESD22-A103C, Cond A
125C
VMMK-2403
Temperature Humidity
Storage Life
VMMK-2203
85 C/85%RH
VMMK-2403
VMMK-2203 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB
VMMK-2403 Failure criterion: Id degradation > 20%, NF & Gain degradation > 0.5dB, OIP3 degradation > 2dBm
Note [1]: Life parts were sampled from 3 different wafers.
Conditions
Duration
Failures/number tested
Drop Test
JESD22-B111
60 drops
0/60
Amplitude = 2mm
50 cycles
0/60
Vibration
JESD22-B103-B
20Hz -2kHz @ 20Hz/min
For 3 axis (X, Y & Z)
4 cycles / axis
(4mins/axis/cycle)
0/102
Temperature Cycle
JESD22A-104C, Cond G
-40C/125C,
15mins dwell (Air to Air)
500 cycles
0/143
JESD22-B102E
245C5C, Pb Free Solder
5secs / dip
0/66
Reference:
Results
JESD22-A114
125V (Class 0)
Machine Model
JESD22-A115
50V (Class A)
ESD Test
Reference:
Results
JESD22-A114
Machine Model
JESD22-A115
40V (Class A)
ESD Test
Reference:
Results
JESD22-A114
Machine Model
JESD22-A115
40V (Class A)
ESD Test
Reference:
Results
JESD22-A114
Machine Model
JESD22-A115
50V (Class A)
ESD Test
Reference:
Results
JESD22-A114
Machine Model
JESD22-A115
60V (Class A)
VMMK-2203
VMMK-2303
VMMK-2403
VMMK-2503
ESD Failure criterion: Leakage current increase > 10x after exposure to ESD pulse.
HBM
ESD Sensitivity
Note: The device is classified as ESD sensitive. The following precautions should be taken:
MM
Class A is ESD voltage level <200V, Class B is voltage level
between 200V and 400V, Class C is voltage level > 400V.
For product information and a complete list of distributors, please go to our web site:
www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries.
Data subject to change. Copyright 2005-2009 Avago Technologies. All rights reserved.
AV02-1995EN - June 25, 2009