Concept

The Concept
of OMICRON Test Universe
OMICRON Test Universe
Test Universe 3.00 - Manual Version: CONC.ENU.16 - Year: 2014

OMICRON electronics. All rights reserved.
This manual is a publication of OMICRON electronics GmbH.
All rights including translation reserved. Reproduction of any kind, for example, photocopying,
microfilming, optical character recognition and/or storage in electronic data processing systems,
requires the explicit consent of OMICRON electronics.
Reprinting, wholly or in part, is not permitted. The product information, specifications, and technical
data embodied in this manual represent the technical status at the time of writing and are subject to
change without prior notice.
OMICRON electronics translates this manual from the source language English into a number of other
languages. Any translation of this manual is done for local requirements, and in the event of a dispute
between the English and a non-English version, the English version of this manual shall govern.
We have done our best to ensure that the information given in this manual is useful, accurate, up-todate and reliable. However, OMICRON electronics does not assume responsibility for any inaccuracies
which may be present.
The user is responsible for every application that makes use of an OMICRON product.
Table of Contents
Table of Contents
1 OMICRON Test Universe Software. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2 The Test Universe Start Screen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.1
Test Modules - Stand-Alone Startup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.2
Control Center - Creating Multi-Functional Test Documents . . . . . . . . . . . . . . . . . 14
2.3
Test Tools - Additional Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.4
Setup - Preparing Test Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.5
Support - Documentation and Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.6
Custom - User-Specific Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3 Setting Up the Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

3.1
A Test Modules Local Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.2
Global Test Object - Sharing a Test Object in a Control Center Document. . . . . . 22
3.2.1
More Than One Test Object in a Control Center Document . . . . . . . . . . . . . . . . . . . . . 22
3.2.2
Test Objects in Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.2.3
Why Test Modules Change their Reference to a Test Object . . . . . . . . . . . . . . . . . . . . 24
3.2.4
Example of Test Objects in a Control Center Test Document. . . . . . . . . . . . . . . . . . . . 25
3.3
XRIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.3.1
XRIO Converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
3.3.2
LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.4
Test Object Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.4.1
Context Menus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.4.2
Operational Modes and Available Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
3.4.3
The File Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
3.4.4
The View Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.4.5
The Function Menu (Advanced Mode Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
3.4.6
The Block Menu (Advanced Mode Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
3.4.7
The Parameter Menu (Advanced Mode Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
3.4.8
Creating Entries in the Custom Block (Advanced Mode Only) . . . . . . . . . . . . . . . . . . . 36
3.5
Device Settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
4 Setting Up the Test Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
4.1
About the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.1.1
What is the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.1.2
Global Hardware Configuration if the Test Module is Embedded in a Control Center

Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
4.1.3
Local Hardware Configuration if the Test Module is Embedded in a Control Center

Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
4.1.4
Hardware Configuration if the Test Module is Running in Stand-Alone Mode . . . . . . . 48
4.2
Example of Global and Local Hardware Configurations (Test Module

Embedded in Control Center Document) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
4.3
Test Setup (Symbolic Representation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
4.4
Starting the Hardware Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
4.5
Usage of Existing Hardware Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
4.6
Update of the Test Hardware Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
4.6.1
Update Behavior if a Test Module is Running Stand-Alone . . . . . . . . . . . . . . . . . . . . . 56
4.6.2
Update Behavior if Test Modules are Inserted into a Test Document and Access
a Global Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
4.7
The Hardware Configuration Dialog Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
4.7.1
Working with the Wiring Tables in the Inputs and Outputs Tabs. . . . . . . . . . . . . . . . . . 60
4.7.2
General Tab. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
4.7.3
CMC Output Configuration Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
4.7.4
Amplifier Configuration Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
4.7.5
Voltage and Current Sensor Simulations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
4.7.6
Rogowski Current Sensor Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
4.7.7
Low Level Outputs Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
4.7.8
Analog Outputs Tab. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
4.7.9
Binary / Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
4.7.10
Binary Outputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
4.7.11
DC Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
4.7.12
Time Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
4.8
CMB IO-7 Hardware Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
4.8.1
Behavior in Online Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
4.8.2
Behavior in Offline Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
Table of Contents
5 The OMICRON Control Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

5.1
Test Modules in a Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
5.1.1
Multiple Test Modules in a Single Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
5.1.2
Inserting a Group into a Control Center Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
5.1.3
LinkToXRIO for the "Activate" Flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
5.1.4
Multiple Test Objects in a Single Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
5.1.5
Multiple Hardware Configurations in a Single Test Document . . . . . . . . . . . . . . . . . . 108
5.1.6
Inserting Fields into a Control Center Document. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
5.1.7
Inserting Objects into a Control Center Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
5.2
Test Reports. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
5.2.1
Using a Pre-Defined Test Report Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
5.2.2
Customizing a Test Report Form. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
5.2.3
The Advanced Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113
5.3
Running Tests from the Control Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.3.1
Selecting Test Modules for the Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.3.2
Verifying the Connected Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.3.3
Switching Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
5.3.4
Start/Continue a Test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
5.3.5
Stopping or Pausing a Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
5.3.6
Clearing Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
5.3.7
Changing a Passed/Failed Test Assessment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
5.4
Test Document Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.4.1
Page Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.4.2
Text Formatting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.4.3
Headers, Footers, Page Numbers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
5.4.4
Object Icons in Test Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
5.4.5
Printing a Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
5.5
Exporting a Report . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
5.6
Exporting Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124
5.6.1
Data Export . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124
5.6.2
Data Caching in Control Center. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
5.7
Protection Levels of Control Center Test Documents . . . . . . . . . . . . . . . . . . . . . . 126
5.8
Control Center Helper Module Pause . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
5.8.1
Inserting a Pause Module into a Control Center document. . . . . . . . . . . . . . . . . . . . . 130
5.8.2
Performing an Information/Instruction Mode Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130
5.8.3
Performing a Test With Required User Input. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130
5.9
Control Center Helper Module ExeCute . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
5.10
Control Center Helper Module TextView . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
6 Synchronizing CMC Test Sets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133

6.1
Synchronizing to an External Reference Power Frequency . . . . . . . . . . . . . . . . . 133
6.2
Synchronizing to an External Time Base - GPS, PTP, IRIG-B, PermaSync . . . . . 134
6.3
Using GPS to Synchronize CMC Test Sets . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136
6.3.1
Using CMGPS 588 Synchronization Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136
6.3.2
Using CMGPS Synchronization Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137
6.4
Using the IRIG-B Time Reference to Synchronize CMC Test Sets . . . . . . . . . . . . 138
6.4.1
Using CMIRIG-B Synchronization Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138
6.4.2
Using the CMC Test Set as IRIG-B Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138
6.5
Time Trigger Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141
6.5.1
How to Set the Time Trigger Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141
6.5.2
Modify Pulse Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 144
File Name Extensions within OMICRON Test Universe . . . . . . . . . . . . . . . . . . . . . . . . 147

Software License Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 153
Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 155
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157
OMICRON Test Universe Software
1 OMICRON Test Universe Software

The OMICRON Test Universe software is a powerful software suite designed to
control CMC test sets from a computer. The Test Universe functionality includes
convenient computer-controlled manual testing,
testing with software modules optimized for specific test object functions,
generic testing allowing the creation of tests for special requirements,
combining all these elements in overall test plans,
using pre-defined test templates provided by OMICRON.
Manual Testing
Use the QuickCMC test module for quick computer-controlled manual testing.
Set voltage and current values, phase angles, frequencies, etc., either
numerically or in the Phasor View.
In addition, QuickCMC performs standard power system calculations, allowing
to enter settings in sequence components, power values, impedances, etc.
QuickCMC displays the binary input signals and performs time measurements.
Together with the step and ramp function, thresholds, such as pick-up values,
can be determined.
Modules for Testing Particular Test Object Functions

Besides computer-controlled manual testing, OMICRON's Test Universe
software provides a variety of automated testing possibilities in dedicated
modules especially designed for individual test object functions, such as testing
overcurrent relays, distance relays, or differential relays.
In these modules, a specific graphic representation of the protection device's
characteristic (I/t diagram, impedance plane, etc.) allows the graphical definition
of test specifications as well as the visualization of the test results directly in the
relay's characteristic diagram.
General Functionality
For creating and performing special tests not covered by the function-oriented
modules, the Test Universe software also comprises generic test modules.
Examples of such tests:
sequences of output states, controlled by time or the reaction of the relay

under test with assessments based on time measurements,
linear or pulsed ramping of electrical quantities with assessment based on

the level of starting or resetting.
Besides the generic test modules OMICRON offers a wide variety of additional
software that works with the CMC test sets (for example, IEC 61850 testing
solutions, network simulation software, scheme testing tools, etc.).
OMICRON Control Center Test Plans for Multifunctional Test

Objects
In order to test the many functions of digital relays, the OMICRON Control
Center (OCC) allows to combine individual testing functions into an overall test
plan. When performing a test, each embedded function will be executed
sequentially, and an overall test report including the results of all the tested
functions is created automatically.
Since the test documents hold the complete test specification that is, the
nominal behavior (settings) of the test object, its test points and tolerances
such a document serves as basis for repeating the same test at a later time by
reloading it, clearing the results of the previous test, replaying the test plan, and
saving the new results.
Thereby tests, which have been created once, can be repeated for maintenance
testing. This assures a constant testing quality and the possibility for direct
comparison of results, also saving time when performing routine tests.
Automatic Reporting
All test modules of the Test Universe software have a common element the
reporting function. Each module provides a fully-formatted test report.
Depending on the module the results come from, data is entered in tabular and/
or graphical form. If several modules are used within the Control Center to
compose a test, each module adds its specific piece of data to the overall report.
When the test is finished, its results and assessments are entered automatically
to complete the report. Reports can easily be printed, saved to a file or to a
database, or exported to standard office applications using Rich Text Format
(RTF) or TXT format.
Customizing test reports based on individual requirements is easy. The visible

content of test reports can customized. Recorded data always remain available,
regardless whether you choose to include them in the reports. Defined report
settings are quickly and easily generated, saved with a form name, and reloaded
at a later time. Company-specific elements, such as logos etc., can easily be
included.
Exporting test results:
Besides the standard export formats TXT and RTF for further use of the data in,
for example, Microsoft Word, OMICRON Control Center documents provide the
following two export formats for more extensive external post-processing of test
data:
The well-established CSV format (Comma Separated Value),
and the XML (eXtensible Markup Language) format.
Furthermore, CSV and XML Data Export is available in all test modules in the
so-called stand-alone mode (test modules started directly from the Test
UnIverse start screen in contrast to being started from within the Control
Center).
Protection Testing Library

For mastering the challenge of testing modern multi-functional relays,
OMICRON provides a library of protection testing templates, the Protection
Testing Library (PTL). This library offers you access to prepared test plans and
relay models of various manufacturers (ABB, Alstom, Areva, GE, Reyrolle,
Schneider Electric, SEL, Siemens, Toshiba etc.) as well as parameter import
filters for specific protection devices. That includes:
relay modeling that is, calculation of the characteristics (such as a zone

diagram) and tolerances from the relay settings, taking into account the
technical characteristics as specified in the relay manual,
import filter for importing setting values from the relay's software or from
setting calculation tools,
test routine for common relay functions.
This not only helps to save the time needed to manually create the relay
characteristics and test templates but also lets you benefit from OMICRON's
testing know-how, such as how to model and test specific relays and their
functions in the Test Universe software.
New templates are continuously being added to the PTL and are available for
download on the OMICRON websites Customer Area ( "Support" on
page 155).
Languages
The Test Universe software is available in a number of different languages. You
can change the system language at any time just by selecting the language of
your choice on the OMICRON Test Universe start screen. All languages are
automatically installed; no installation of any additional software components is
required.
Especially in international projects, clients many times wish to get a report in a
different language than the commissioning engineer's preferred working
language. This is easily possible for all available Test Universe languages.
When the system language is changed and an existing test document is
re-opened, the test report automatically switches to the new system language.
The Test Universe Documentation

Test Universe Help
The Test Universe software comes with a comprehensive Help covering every
single component that Test Universe offers you: start screen, Control Center,
Test Object and Hardware Configuration, all test modules, tools, setup and
configuration utilities, CMEngine, PTL, Automation, etc.
Help can be found anywhere in the Test Universe software:
Use the context-sensitive Help feature.

Context-sensitive Help is Help that is obtained from a specific point in the
software by clicking the
symbol, providing Help precisely for the situation
associated with that point. Each context-sensitive Help topic describes
exclusively one state, one situation, one feature or one dialog box of the
software.
Position your mouse cursor on the point of your interest, and hit the <F1>
keyboard button. This is very similar to the context-sensitive Help
mentioned above.
Click the Help button, where available. This, too, will provide you a contextrelated Help.
Click the Help Topics symbol

at the upper right corner of an application
window. This launches the test module-specific Help showing its introduction
topic.
Click File > Help > Help Topics. This also launches the test module-specific
Help showing its introduction topic.
With Test Universe version 3.00, the Help comes in 6 languages: English,
German, Spanish, French, Russian and Brazilian-Portuguese. If you installed
your Test Universe in any other language, the Help will start in English.
10
Test Universe manuals

The Test Universe software furthermore provides a large number of software
manuals, practical examples of use and hardware manuals for each CMC test
set, CMA current and CMS voltage amplifier and piece of accessory. The
manuals are available as PDF files on your hard disk at
installation folder\Test Universe\Doc
For languages other than English, language specific subfolders exist.
The purpose of these manuals is to familiarize users with these devices and to
show how to properly use them in various application areas. The manuals
contain important information on how to use the devices safely, properly, and
efficiently. Its purpose is to help you avoid danger, repair costs, and down time
as well as to help maintain the reliability and life of the devices. The manuals are
to be supplemented by existing national safety standards for accident prevention
and environmental protection. They should always be available at the site where
the device is used. It should be read by all personnel operating the device.
In addition to the manuals and the applicable safety regulations in the country
and at the site of operation, the usual technical procedures for safe and
competent work should be heeded.
Not all manuals are available in all Test Universe languages. In such a case,
Test Universe will attempt to open the manual in the language of your Windows1
operating system. Should that language also not be available, the English
manual will open.
You wont have to access any of these folders to view a manual. You find direct
hyperlinks to all of these manuals in the Help topic User Manuals.
To view a PDF file, either the Adobe Reader , the Foxit Reader (both freeware)
or any other compatible PDF reader is required. If you have no PDF reader on
your computer yet, the OMICRON Test Universe Setup installs the Foxit
Reader.
1. Windows is a US registered trademark of Microsoft Corporation.
11
12
The Test Universe Start Screen
2 The Test Universe Start Screen

Start the Test Universe software either from the Windows Start menu or
double-click the desktop icon that was created during the installation.
Both starts the OMICRON Test Universe start screen, an organizing element of
the OMICRON Test Universe software. The Test Universe start screen is a
window with a functionality similar to that of a Web page.
Figure 2-1:
The OMICRON
Test Universe 3.00
start screen
At the top right of the Test Universe start screen, click www.omicron.at to visit
the OMICRON website. Customers from North and South America are
requested to visit www.omicronusa.com.
Click Get Support or Customer Area in the lower right corner of the
Test Universe start screen to go directly to the Technical Support section or the
Customer Area of the OMICRON website.
Position the cursor over any hyperlink to bring up a tooltip that summarizes the
link's function. If it is a test module or test tool hyperlink, a right-click launches
the according Help.
13
Get in touch with OMICRON

OMICRON provides an automatic update information service, called OMICRON
News. If your computer has access to the Internet, and if there is an update
available for your Test Universe software, the Test Universe start screen retains
this information and displays an Update available message right below the
version number. Click the message to visit the relevant OMICRON website for
more information regarding that update. We encourage you to always keep your
software up-to-date to benefit from the latest enhancements and bug fixes.
To customize the OMICRON News settings, click System Settings in the
Setup section of the Test Universe start screen, and then News Window
Settings.
2.1 Test Modules - Stand-Alone Startup

Click any test module of your choice to create and run a stand-alone test.
"Stand-alone" means, the test module starts as an individual instance rather
than being embedded into an OMICRON Control Center document
( 2.2 "Control Center - Creating Multi-Functional Test Documents").
Test modules without a valid license are disabled on the start screen
( "License Manager" on page 16).
2.2 Control Center - Creating Multi-Functional

Test Documents
Open Existing Test Document
Click to browse through your computer's folder structure for previously saved
Control Center test documents. These test documents can be identified by their
file name extension .occ ( "File Name Extensions within OMICRON
Test Universe" on page 147).
Open Protection Testing Library

The Protection Testing Library contains a number of XRIO Converters,
relay-specific test templates (.occ files; see above) and the corresponding
documentation in PDF format.
14
The XRIO Converters cover the main protection functions plus some
relay-specific protection functions. They provide the parameter input according
to the manufacturer's software. The characteristics are automatically calculated
in the advanced test modules; they are based on the XRIO1 technology
( 3.3 "XRIO" on page 26).
The test templates of the Protection Testing Library are developed particularly
for the work with certain relays. They use the XRIO Converters to prepare the
test data and characteristics. The templates therefore provide a basis for routine
or commissioning tests.
Open Generic Template

Starts the Control Center and opens the Choose Template window in the "Test
Library\Templates" folder. From this templates folder you can open a document
of your choice. This can be a test document you have saved before, a
ready-made or an empty OMICRON-supplied template, or the Default.occ
template.
Tip: The Default.occ template already contains a Test Object and a Hardware
Configuration. You can, however, customize Default.occ to meet your most
common requirements, and use it as your own personalized template.
New Test Document

Starts the Control Center with a blank test document. This enables you to create
a new test specification from scratch. While opening the document, Control
Center adds a blank Test Object and a Hardware Configuration to that
document.
Tip: If you don't want Control Center to add a Test Object and a Hardware
Configuration to that document and to leave it entirely blank instead, disable
that functionality by editing a Windows Registry key.
Read the Customizing Standard Characteristics of OMICRON
Test Universe manual to learn how to do that. That manual was installed with
the Test Universe software (unless you deliberately chose not to install
documentation). For information where to find and how to view the manuals,
"The Test Universe Documentation" on page 10.
1. XRIO represents the second generation of RIO file technology. The term RIO stands for Relay
Interface by OMICRON, a technology that was already available with previous Test Universe
versions. The X denotes "extended".
15
2.3 Test Tools - Additional Applications

The Test Tools section provides additional applications for specific testing
tasks. Test tools are subject to restrictions:
they run in stand-alone mode, only, that is, they cannot be embedded into a
Control Center test document,
they do not use the common Test Object.
2.4 Setup - Preparing Test Equipment

In the Setup section you find all means to set up your working environment.
Test Set Association

With the Test Set Association component you associate and configure your
CMC test set(s) via Ethernet. Using the Ethernet interface, you can put as many
CMC test sets as you wish on the network and control them by even
geographically remote computers (clients).
System Settings
System Settings provides the means for system-wide default settings, such as
personal user information, default folders for test documents, phase names and
default values to use, the OMICRON News settings, default settings for the data
export and sound settings.
For more details Help topic Test Universe Start Screen > System Settings.
License Manager
The OMICRON Test Universe software is protected from unauthorized
installation and use by a license file. The license file codes specify both the
individual test modules and the hardware serial numbers, that is, each code
specifies a pair of "test module X to work with test set A". The license code
enabling test module X to work with test set A will differ from the code for test set
B, even though A and B might be the same CMC model.
The master license file Omicron.lic is installed to [Common Files]\OMICRON,
whereat [Common Files] holds the full path to the folder defined by Windows to
store files shared by applications that are installed on the system. In English
Windows, that folder is named "Common Files" and is located in the [Program
Files] folder. In other language versions of Windows, the common files folder
name is localized appropriately by default.
Omicron.lic is an ASCII text file that can be viewed with any text editor.
16
If you purchase additional OMICRON test sets at a later point of time, you need
to add their license codes, provided in separate license files, to the master
license file. To do so, use the setup tool License Manager. The License Manager
combines the functionality of a license browser, a merge tool and a license file
editor. It searches for OMICRON license files stored on the computer's hard
disk(s) and displays their contents. It merges license information from different
files into the master license file Omicron.lic. It furthermore allows to add license
keys manually.
Language Selection
The language you selected when you installed Test Universe is the default
language when a Test Universe application is started for the first time or by a
new user. Click Language Selection to change that language.
Once you selected the language of your choice from the Language for
Test Universe Applications box and clicked OK, the OMICRON Test Universe
start screen immediately re-starts in the selected language. Still running test
modules will change their user interface and test report language the next time
you start them. The test report of the currently open Control Center document,
however, can be previewed on-the-fly with the new language by using the
Update function of the Set All Reports dialog.
If a certain component is not available in the language you selected,
Test Universe will attempt to start it in the language of your Windows operating
system. Should that language also not be available, the component will start in
English.
2.5 Support - Documentation and Assistance

Tutorials
From the OMICRON Test Universe start screen you can launch a number of
video tutorials. Click the Tutorials hyperlink to see an overview of the available
tutorials and to start them. The Tutorials hyperlink on the Test Universe start
screen is disabled as long as you did not install the tutorials. To install the
tutorials, insert the Test Universe DVD into your drive.
If the Windows "Autostart" feature is enabled on your computer, the DVD
browser, a start screen-like installation screen, launches automatically. Else,
open Windows Explorer, navigate to your DVD drive, and double-click
Setup.exe.
Then click the DVD browser entry CM-Line Tutorials of the Install CM-Line
Tools section and follow the on-screen instructions.
17
Manuals
OMICRON Test Universe provides a number of software and hardware
manuals. Click to see an overview of the available manuals. The best starting
point for getting familiar with Test Universe is the Getting Started manual.
Help
Click to launch the OMICRON Test Universe Help.
Tips & Tricks

Tips & Tricks contains a collection of "protection goodies" that can contribute
to make your daily work with Test Universe components more goal-oriented,
efficient and convenient.
Contacts
Information on how to contact OMICRON worldwide.
OMICRON Assist
Click OMICRON Assist to launch a diagnosis tool that collects comprehensive
information about your test system. These information are meant to be
forwarded to OMICRON's Technical Support in case you need the assistance of
our experts for troubleshooting.
For more details Help topic Test Universe Start Screen > OMICRON
Assist.
Diagnosis & Calibration...

Group of diagnosis and calibration utilities.
18
Click Hardware Check to initiate a self-test of the connected and associated

CMC test set. Please allow an adequate time period for this self-test, since it
tests the CMCs analog and binary inputs and outputs.
Click Log file to analyze the communication between a CMC test set and
your computer, and to create a log file of it.
Click Calibration Info to obtain calibration information about your licensed

CMC test set(s).
Background: Your Test Universe DVD contains a calibration file. This file
holds calibration information about the CMC test sets you have purchased.
When you install the Test Universe software, this calibration file is installed
to your computer. Calibration Info is enabled when this file was correctly
installed. If disabled, you may have installed, for example, a download
version of the Test Universe software that provides no calibration information
for a licensed CMC test set.
The Field Calibration Software (FCS) facilitates and automates the

calibration and testing of the OMICRON CM product line. The software runs
calibration/test procedures at test points specified by templates and checks
whether the test set is within the specifications. After calibrating/testing a test
set, the FCS provides a report summarizing the test conditions and results.
What's New
Read the What's New to learn about new features, improvements or bug fixes
of the current Test Universe version.
2.6 Custom - User-Specific Tools

The Test Universe start screen has the capability of assimilating custom entries
that allow to start programs or open documents, which are not directly related to
Test Universe.
Refer to the Start Screen Customization (Adding Entries to the Start Screen
Custom Section) manual for details. That manual was installed with the
Test Universe software (unless you deliberately chose not to install
documentation). For information where to find and how to view the manuals,
"The Test Universe Documentation" on page 10.
French customers find ELISA and OTARIO preset in this section.
19
20
Setting Up the Test Object
3 Setting Up the Test Object

The Test Universe modules are designed for testing protection relays,
transducers, and energy meters. Such devices are the "physical"1 test objects.
Each test module acquires the specific data of the physical test object from a
configurable data container called Test Object. The Test Object data container
serves as test parameter management tool for an individual test module. In Test
Object you browse, access and edit the contents of the test object parameters.
The subject "Test Object" is closely related to the subject "XRIO". Therefore, to
better understand Test Object - the first dialog box that opens once you
selected to configure the data describing your physical test object - we
recommend to subsequently read 3.3 "XRIO" on page 26 right after you have
read the Test Object chapters.
The Test Universe Help holds additional information about Test Object. Launch
the Help and search for Test Object in the table of contents of any test module.
3.1 A Test Modules Local Test Object

A test module that runs stand-alone (that is, it was launched from the
Test Universe start screen, not embedded in a Control Center document)
comprises one individual Test Object data container. Since such a Test Object
data container applies to a particular test module only, it is called local Test
Object.
To launch Test Object, click Test Object on the Home tab.
When one or more test modules are embedded in a Control Center document,
and the Control Center document does not have its own Test Object (positioned
before the embedded test modules), each test module keeps its own local Test
Object data container and launches it.
Figure 3-1:
Two test modules
embedded in a Control
Center document
TestDocument.occ
Test
module 1
Local Test Object; applies to test module 1, only.
Test
module 2
Local Test Object; applies to test module 2, only.
1. The word "physical" is used here to draw attention to the fact that this is a real test object and
not the correspondingly named software function Test Object, which is used for configuration.
21
3.2 Global Test Object - Sharing a Test Object in a

Control Center Document
Contrary to a test module started stand-alone from the Test Universe start
screen, which has its individual local Test Object data container, two or more
test modules that are inserted into an OMICRON Control Center document
share a common Test Object - the so-called global Test Object.
Figure 3-2:
Control Center
document with one
global Test Object for
two test modules
TestDocument.occ
Test Object
Test module
1
Test module
2
Within a Control Center document, a Test Object

serves as global data container for the following
test modules - here the embedded test modules 1
or 2. Each embedded test module acquires its test
object data from the Test Object that is positioned
before the test module. Embedded Test Objects,
generally serving more than one test module, are
called global Test Objects.
In this example Test Object 1 is the global Test
Object for the test modules 1 and 2.
If you launch Test Object from within the embedded test module 1 or 2, you will
always get to see the global Test Object.
3.2.1
Figure 3-3:
Control Center
document structure with
more than one Test
Object
More Than One Test Object in a Control Center

Document
TestDocument.occ
Test Object 1
Test module
1
Test module
2
Test module
3
Test Object 2
Test module
4
22
A Control Center document can have more than

just one Test Object. In this example, the first
embedded Test Object 1 of the Control Center
document serves as global data container for the
following three test modules (1 - 3).
Test module 4 has a preceding Test Object 2,
therefore Test Object 2 serves as global data
container for test module 4 (and additional test
modules that may later be embedded after or
before test module 4). It does not affect test
modules 1, 2 and 3, though.
If you launch Test Object from within an embedded
test module, you will always get to see the global
Test Object. In case of the test modules 1, 2 or 3
that is Test Object 1. In case of test module 4 that
is Test Object 2.
To add a Test Object to a Control Center document, click Test Object on the
Home tab.
3.2.2
Test Objects in Groups

In case the test module is part of a group of consecutive test modules, the rules
stated for the Control Center also apply inside the group. In case the group does
not contain a Test Object, test modules acquire their test object data from the
closest Test Object preceding the group on the next higher hierarchy level(s).
Figure 3-4:
Control Center
document structure with
a group
TestDocument.occ
Test Object 1 serves as global data

container for the following test modules
1 and 2.
Test Object 1 also serves as global

data container for test module 3
because there is no Test Object within
Group 1 preceding test module 3. The
"opening" of a group does not interrupt
the binding to the preceding Test
Object and Hardware Configuration.

container for test module 4 because
within Group 1 Test Object 2 precedes
test module 4.
Test Object 1 furthermore serves as

global data container for test module 5
because Test Object 1 precedes test
module 5 on its own level. Since Test
Object 2 is in a lower level (in Group 1),
test module 5 ignores Test Object 2.

container for the following test module 6.
Test Object 1
Hardware
Configuration
Test module
1
Test module
2
Group 1
Test module
3
Test Object 2
Test module
4
Test module
5
Test Object 3
Test module
6
More information about groups 5.1.2 "Inserting a Group into a Control Center
Document" on page 100.
23
3.2.3
Why Test Modules Change their Reference to a Test

Object
One principal rule applies: A test module changing from "idle" (= no test results,
currently not testing) to "action" (= performing a test) preserves its reference to
the Test Object data in the condition it was before the module left the idle state.
That way, test object data and test results always match up correctly, and they
cannot be changed independent from each other.
In exceptional cases, however, test modules change their reference to a Test
Object. This happens when
a) you subsequently insert a Test Object into a Control Center document (click
Test Object on the Home tab),
b) you subsequently embed a test module into an OCC document with the "from
file" option (click Test Module on the Insert tab and select the Create from
file option), and this file was previously saved in stand-alone operation with
test results.
Case a):
All test modules in the Control Center document following this newly inserted
Test Object refer to it. This also applies to a group (or groups) of test modules.
Exception: those modules that already contain test results from a previous test.
After clearing the test results (with Test > Clear), those modules then
automatically change their reference to the Test Object preceding them in the
Control Center document.
Case b) :
Since this test module (or the inserted file, respectively) contains test results, the
module keeps its local Test Object data container. After clearing the test results
(with Test > Clear), the module then automatically changes its reference to the
Test Object preceding it in the Control Center document.
The same happens if that module was previously saved in stand-alone mode,
however, with no test results: it then automatically refers to the Test Object
preceding it in the Control Center document, and replaces its original test object
data with the ones from the Control Center Test Object data container.
24
3.2.4
Figure 3-5:
Example of a Control
Center document with
several Test Objects
Example of Test Objects in a Control Center Test

Document
TestDocument.occ
Test module
1
Test module 1 keeps its own local Test

Object data container because it does
not have a preceding Test Object.

container for the following test modules 2
and 3.
Test Object 1 also serves as global data

container for test module 4 because there
is no Test Object within Group 1
preceding test module 4.

container for test module 5 because
within Group 1 Test Object 2 precedes
test module 5.
Test Object 1 furthermore serves as

global data container for test module 6
because Test Object 1 precedes test
module 6 on its own level. Since Test
Object 2 is in a lower level (in Group 1),
test module 6 ignores Test Object 2.

container for the following test module 7.
The Hardware Configuration serves as

global data container for all test modules
but the preceding test module 1.
Test Object 1
Hardware
Configuration
Test module
2
Test module
3
Group 1
Test module
4
Test Object 2
Test module
5
Test module
6
Test Object 3
Test module
7
25
3.3 XRIO
XRIO represents the second generation of RIO file technology. The term RIO
stands for Relay Interface by OMICRON, a technology that was already
available with previous Test Universe versions. The X denotes "extended".
XRIOs predecessor, RIO, was developed out of a need for a uniform data
format for parameters of protective relays produced by different manufacturers.
RIO provides a common structure to allow functionally similar relays from
diverse manufacturers to be tested with similar test procedures. Moreover, RIO
permits relay characteristics to be imported into the Test Universe software from
external sources.
XRIO data are organized in a tree-like structure of blocks, sub-sections and
parameters with all of their properties and values as set in the Test Object
( 3.4 "Test Object Parameters").
The XRIO technology features a number of benefits. The major advantages are:
1. Ease of use
In a special custom block, you can now enter names, units, values and
definitions of test object parameters exactly as you know them from your
protection relay. The user-defined names of those parameters appear at all
relevant places throughout the Test Universe software. Test reports also
display the parameters the way you defined them.
A so-called XRIO converter is an XRIO file with the integrated formulas and
dependencies to convert your relay settings into OMICRON Test Object
settings ( 3.3.1 "XRIO Converter" on page 27).
2. Improved automation
Test object parameters are defined at a central place of the Test Universe
software: The Test Object. This dialog box provides all the features to
browse, access and edit test object parameters. It also enables to create
user-defined variables. These variables can contain values, formulas,
dependencies or a combination thereof. Even simple logical functions such
as "if" queries are possible ( Test Object Help: In the table of contents of
any test module search for Test Object and select Formula Syntax).
3. LinkToXRIO
In test modules, input fields, instead of holding a fixed value, can now directly
link to one of the variables defined in XRIO - a feature named LinkToXRIO.
Furthermore, the linked value can be scaled by a constant factor, for
example, input field "Trip Time": 1.5 * ZT2; 1.5 being a multiplier of the linked
parameter.
26
In addition, an offset can be specified for such a link. This is advantageous

for certain test cases where an offset (or a combination of factor + offset) is
preferred over a fixed factor, for example, when linking to a phase
( 3.3.2 "LinkToXRIO" on page 28).
In case of a change of one or more parameter setting(s) in XRIO, the entire
test document, that is, all test modules embedded in the Control Center test
document linking to this particular setting, automatically adjust to this
change.
Example: Threshold determination "U>" using test module Ramping.
3.3.1
In the Test Object, parameter "U>" was defined with a value of 100 V.
Within the Control Center test document, various test modules link to this
parameter "U>".
In Ramping, rather than entering fixed voltage values for "from" and "to",
the ramp is specified with "from: 0.5 U>" and "to: 1.5 U>".
When executed, the test issues a ramp from 50 V to 150 V. The relay trips
at "U>" (= 100 V), the test is finished.
If parameter "U>" is now changed to, for example, 80 V, all test modules
linking to "U>" automatically adjust to this change. Ramping would now
issue a ramp from 40 V to 120 V.
XRIO Converter
An XRIO converter is an XRIO file with the integrated formulas and
dependencies to convert your relay settings into the OMICRON Test Object
settings.
The dependencies are set up to "translate" data from the Test Object's
"Custom" section (where the data are typically structured close to the relay's
representation) into test settings in the "RIO" section, which are used by test
modules. This way, an XRIO converter significantly simplifies the setup of a test
object.
OMICRON Test Universe distinguishes between:
test modules for specific protection functions,
and "general" test modules for universal use.
In the Test Universe releases 1.x, the general test modules only used some of
the parameters of the Device Settings page. Test modules for specific
protection functions possessed proprietary test module-specific pages. This was
also reflected in the RIO files: The files of test modules for specific protection
functions contained additional proprietary function blocks.
27
In Test Universe release 2.0, XRIO replaced RIO. The proprietary pages for
specific protection functions, however, did not change. Test modules for specific
protection functions, such as Overcurrent, Distance and Differential, need to
have their relay settings, now entered in the XRIO "convention", translated into
RIO. So-called XRIO converters do this.
Each Test Object for a specific relay needs its dedicated XRIO converter.
3.3.2
LinkToXRIO
Instead of holding a fixed value, test modules can directly link to Test Object
parameters.
Moreover, you can link to Boolean parameters ("true"/false"): This is useful if, for
example, the flag "activate test module" or "activate group" is to be controlled via
the LinkToXRIO feature ( 5.1.3 "LinkToXRIO for the "Activate" Flag").
For more information about the LinkTOXRIO feature refer to the Test Universe
Help. In the table of contents of any test module search for Test Object and
select LinkToXRIO.
For more information about XRIO refer to the misc. XRIO manuals. These
manuals were installed with the Test Universe software (unless you deliberately
chose not to install documentation). For information where to find and how to
view the manuals, "The Test Universe Documentation" on page 10.
28
3.4 Test Object Parameters

Test Object serves as test parameter management tool. At Test Object you
browse, access and edit the contents of the test object parameters.
Figure 3-6:
Test Object in
Advanced mode
The left pane 1 of the dialog box displays the extended block structure of XRIO
in a tree-like view. In the tree you add specific protection functions and navigate
to the different pages for "Device" settings and for the specific protection
functions.
The right pane 2 , the parameter table, displays the parameters that belong to
the selected section. The test modules can directly link to these parameters. The
number of visible columns depends on a) the set operational mode
( 3.4.2 "Operational Modes and Available Functions" on page 30) and b) the
context menu settings.
3.4.1
Context Menus
Right-click a pane to open its corresponding context-menu. Right-click any
heading cell of a parameter table column (for example, "Name", "ID",
"Description", "Value", ...) to open a context menu that lists the available
columns. By selecting or clearing individual columns you can customize the
parameter table view.
29
If the XRIO template of your device under test includes a XRIO converter, the
tree node above the RIO node represents the root note for the structured
representation of your device-specific blocks. Enter the relay parameters for
each block in the tabular view. The parameters are then automatically converted
into parameters of the RIO Device settings and the parameter of the specific
protection or measurement function.
Refrain from editing RIO parameters in such a scenario. Use the legacy user
interface of the specific function pages instead to view the distance zones of
your relay in a zone diagram.
3.4.2
Operational Modes and Available Functions

Test Object distinguishes between 2 operational modes: Standard and
Advanced. Set the mode of your choice by selecting or clearing the pull-down
menu command View > Advanced.
Standard mode
Usual working mode for users who primarily execute test documents. A tester
may occasionally switch to Advanced mode in order to carry out minor
adaptations or for troubleshooting. In Standard mode, some of the pull-down
menus are hidden.
Advanced mode
Working mode for test designers who create test documents. In Advanced
mode, a test designer models the test object, defines, adds or deletes sections
and parameters, sets properties, defines formulas, and starts the Organizer.
This mode should only be used by users with a good knowledge of the new
XRIO concept.
3.4.3
The File Menu

Import
Imports an XRIO or RIO file. The import replaces the structure of blocks and
sections of the currently loaded structure.
At the bottom, the dialog boxes for import and export (see below) hold some predefined Test Universe-specific destination folders you can use, such as "Test
Objects", "Test Objects in Test Library", "Test Wizard User Templates" or "PTL
Folder" (PTL = Protection Testing Library). They serve as shortcuts to easily
locate certain destination folders. Clicking these shortcuts saves you from
having to browse through the folder structure of your computer. Of course you
can also use any other folder of your choice to import an XRIO file from or export
one to.
30
Export
Exports an XRIO or RIO file.
Import Relay Settings
Imports settings from an external data source such as an XML file containing the
relay settings provided by, for example, the relay manufacturer. A respective
import filter is automatically invoked. The import automatically transfers the
parameters to the parameter table. This saves the user from having to enter all
data manually.
Note: The import filter requires a relay parameter structure to be defined in the
XRIO "Custom" section. Such a a relay parameter structure is generated, for
example, by importing an XRIO converter before the import of the relay settings
using the File > Import command. Furthermore, the software assumes the
imported data to be correct. Data that, by accident, may be set incorrectly in the
relay can falsify the test results.
Organize (Advanced mode only)
Opens the Organizer to arrange the contents of the Test Object and the XRIO
files, that is, to copy blocks and sections from the current test object to an
external XRIO file or vice versa, or to delete blocks and sections.
Figure 3-7:
The Organizer
31
The Organizers left pane 1 displays the current test object, that is, the
currently loaded and active XRIO file.
Its right pane 2 displays a RIO or XRIO file of your choice. To load the file, click
the Import... button.
Once both panes hold an XRIO structure, you can start organizing entries.
Duplicate Block or Delete Block
Either duplicates or deletes the selected block or section with all sub-sections.
Works in left pane only.
>> or <<
Copies the selected block or section with all sub-sections from the current
selection to the other side.
These buttons are disabled if either the hierarchical level or source and
destination do not match, or if the copy action you are intending to start is not
plausible (for example, the attempt to copy a Distance section to the Device
block).
Import... or Export As...
Import... imports an XRIO or RIO file. The import replaces the structure of
blocks and sections of the currently loaded structure.
Export As... exports the structure in the right pane to an XRIO file with a new
name of your choice. This is the only way to save changes made to this
particular file.
At the bottom, the dialog boxes for import and export hold some pre-defined
Test Universe-specific destination folders you can use, such as "Test Objects",
"Test Objects in Test Library", "Test Wizard User Templates" or "PTL Folder"
(PTL = Protection Testing Library). They serve as shortcuts to easily locate
certain destination folders. Clicking these shortcuts saves you from having to
browse through the folder structure of your computer. Of course you can also
use any other folder of your choice to import an XRIO from or export one to.
OK
Saves all changes made to the Test Object in the left pane, and closes the
Organizer.
Changes made to the file in the right pane are discarded that way ( Export
As...).
Cancel
Closes the Organizer and discards all unsaved changes.
32
Revision (Advanced mode only)

Provides the XRIO Converter Revision dialog box for version management of
XRIO converters. Every time you manually increment the revision number of a
XRIO converter file, its date is automatically updated with the system date and
saved. The author's name is also saved with each revision.
This name is taken from the System Settings (User Information tab) on the
Test Universe start screen.
Save and exit
Saves all changes and exits Test Object.
Exit without save
Discards all unsaved changes and exits Test Object.
3.4.4
The View Menu

Advanced
Toggles between the 2 operational modes "Standard" and "Advanced".
RIO
Shows/hides the RIO subtree.
Errors
All Test Object-related errors that occur are saved in a list. This menu item
displays that list.
Errors occurring during the import of a XRIO file with File > Import remain in the
list until you delete them with Clear.
Errors occurring while editing a formula will automatically be deleted once the
formula is corrected.
The bottom status line of the Test Object indicates the number of information
messages, warnings and errors (I:1 W:0 E:0) and an according symbol: a green
check mark to indicate OK, a yellow exclamation mark for a warning and a red
exclamation mark for an error.
For a detailed error description, please refer to the Help. In the table of contents
of any test module search for Test Object and select XRIO. This help topic
contains a direct hyperlink to the error description. Alternatively, search for the
Index keyword "error list Test Object".
33
3.4.5
The Function Menu (Advanced Mode Only)

Add...
Adds a new RIO function independent from the currently selected block.
Delete
Deletes the selected function.
Open Test Object dialog
Opens the block-specific Test Object dialog box.
"Block-specific" means, the menu item adapts to the selected block, that is, a
"Device" block provides Open Device dialog, and a "Distance" block Open
Distance dialog.
Open Test Object dialog is also available on the context menu by right-clicking
a block.
3.4.6
The Block Menu (Advanced Mode Only)

Add...
Adds a new block to the XRIO file. This button is disabled if the item selected in
the left pane does not allow having a block added.
Delete
Deletes an entire block with all sub-sections. This button is disabled if the item
selected in the left pane does not allow a deletion.
Cut/Copy/Paste
Cut/copy/paste functionality as known from, for example, Windows Explorer.
Also available on the context menu (right-click a block name in the tree view).
Cuts or copies an entire block with all of its details (including formulas) and
pastes it to a location of your choice. The operation is disabled where it makes
no sense.
This functionality is only available within one program instance and not over
multiple instances.
Details
Opens Block Details to specify further block properties.
34
Move Up
Moves the selected block one position up in the tree.
Move Down
Moves the selected block one position down in the tree.
Set as ActiveFunction
Example: Two Distance blocks in a XRIO file.
If multiple function blocks of the same type are present in a test object (for
example, 2 Distance blocks), the corresponding test modules need to know
which is the actually relevant instance they should access. This is determined
by setting the active function.
The one block that - if selected - turns into a red and blue symbol
is the active one of the two Distance blocks.
The other one may be a fully parameterized Distance block, but
its inactive. This is indicated by a green filling of the symbol. To
make this one the active block, select Block > Set as Active
Function.
What does "active function" mean?
If Test Object was called up from a stand-alone test module, the active block is
the block the test module accesses for its parameters. The inactive block is
ignored.
If Test Object was called up from within a Control Center document, the active
block is the one that is reported. The second Distance block does not appear in
the test report.
Copy Reference Value to Value & Copy Value to Reference Value
These commands are TestBase-specific. Refer to the TestBase
documentation for more details. Even though they have only little relevance for
Test Universe, these functions can be utilized in Test Universe, too.
Both commands work in the "Custom" block only, and copy the reference value
imported by TestBase to the regular value and vice-versa. Both commands
apply to the selected block plus all sub-blocks; that means, to copy all at once,
select the highest level block "Custom" before you execute the command.
The menu commands have the same function as the two rightmost toolbar icons
with the same names.
35
3.4.7
The Parameter Menu (Advanced Mode Only)

Add
Adds a new parameter to the currently selected sub-section. This button is
disabled if the item selected in the left pane does not allow adding a parameter.
Delete
Deletes the parameter that is selected in the right parameter table. This button
is disabled if the selected item does not allow a deletion.
Cut/Copy/Paste
Cut/copy/paste functionality as known from, for example, Windows Explorer.
Also available on the context menu (right-click a parameter line in the tree view).
Cuts or copies a parameter with all of its specific details (including formulas) and
pastes it to a block of your choice.
This functionality is only available within one program instance and not over
multiple instances.
Detail
Opens the Parameter Details dialog box to specify further parameter
properties.
Move Up
Moves the selected parameter one position up in the list.
Move Down
Moves the selected parameter one position down in the list.
3.4.8
Creating Entries in the Custom Block (Advanced

Mode Only)
The "Custom" block is for custom-defined relay parameters. At the "Custom"
block, you can create unrestricted sub-blocks and parameters of your own.
Click "Custom" and create a sub-block first by selecting Block > Add... or
with the right-click context-menu.
Click the new sub-block and create a parameter by selecting Parameter >
Add... or with the right-click context-menu.
This procedure can be repeated as many times as needed, and also changed at
any time with the Block and Parameter menu commands.
36
3.5 Device Settings

The "Device" block contains general information and settings like the relay's
name or a description, its manufacturer, its device type, its address, its serial or
model number, and any other information that is useful to identify it. It
furthermore provides a number of preset general parameters, such as nominal
values, residual factors and limits.
Double-clicking the block designation "Device" in the left tree-structure of the
Test Object opens the Device Settings page. This page is a legacy from earlier
Test Universe releases and lets you edit the device settings as hitherto, that is,
you can enter test object parameters in either way
in the right pane parameter fields of the Test Object or
on the Device Settings page.
Test modules with specific protection functions, for example, (Adv.) Differential,
(Adv.) Distance or Autoreclosure, additionally provide proprietary pages. Start
up these proprietary pages from the tree view of the Test Object by doubleclicking the respective block (for example, "Device", "Distance" etc.), or from a
context-menu that opens when right-clicking a section.
Device
Textual information for the relay to be tested (optional).
Enter the relay's name or a description, its manufacturer, its device type, its
address, its serial or model number, and any other information that is useful to
identify it. This information appears in all subsequent test reports, and can be
exported to or imported from an XRIO file.
Substation
Enter the name and the address of the substation where the test object (the
relay) is located. Textual information (optional).
Bay
Enter the name and the address of the bay where the test object (the relay) is
located. Textual information (optional).
Nominal values
Enter the number of phases and the test object's nominal values here. The test
modules use these values for calculation.
37
Residual voltage/current factors

These parameters are only relevant if your relay has separate potential/current
inputs for the residual voltage/current.
The ratio of VT and CT for the residual current may differ from the VT and CT
ratio for the phase current/voltage. At the Test Object set the ratio of the
residual VT or CT in relation to the single phase VT/CT ratio.
Residual voltage VN = +3 x (1 / ResidualFactorV) x V0 1)
Ground-fault current IN = -3 x ResidualFactorI x I0 2)
ResidualFactorV = VLN / VN
ResidualFactorI = IN / Inom
1)
V0 = zero sequence voltage
2)
I0 = zero sequence current
Default settings are:

VLN / VN = 1.7321 (3), as the phase voltages form the residual voltage in
the open delta connection, and
IN / Inom
= 1
The modules Distance, Advanced Distance, QuickCMC, Autoreclosure, State

Sequencer and the Annunciation Checker can put out VN and IN. To achieve
this, route VN and IN in the Hardware Configuration.
Limits
Enter the maximum voltage and current values of the test object. These values
are used by all test modules.
Debounce/deglitch filters
Deglitching input signals:
1
2
tdeglitch
tdeglitch
In order to suppress short spurious

pulses a deglitching algorithm can be
configured. The deglitch process results
in an additional dead time and
introduces a signal delay. In order to be
detected as a valid signal level, the level
of an input signal must have a constant
value at least during the deglitch time.
Legend:
1. Signal before the filter
38
2. Signal after the filter
Debouncing input signals:

For input signals with a bouncing characteristic,
a debounce function can be configured. This
means that the first change of the input signal
causes the debounced input signal to be
changed and then be kept on this signal value for
the duration of the debounce time.
1
2
tdebounce
The debounce function is placed after the

deglitch function described above and both are
realized by the firmware of the CMC test sets
and calculated in real time.
Legend:
1. Signal before the filter
2. Signal after the filter
Debouncing and deglitching is possible with the test sets CMC 356, CMC 353,
CMC 256plus, CMC 256, and with the CMB IO-7.
All test modules with the exception of Transducer and EnerLyzer support the
debounce/deglitch functionality. Since they do not use Test Object, some tools
also do not support the debounce/deglitch functionality.
Overload Detection Sensitivity
Being able to adjust the sensitivity of an overload detection of OMICRON CMC
test sets and amplifiers enables you to suppress overload messages where they
are not relevant for the test. Sensitivity here means, after a change of the analog
output signals, the overload has to be present a certain period of time to be
detected as such.
Note that this setting does not influence or delay the "Trigger on overload" in
QuickCMC (described in help topic "Trigger Conditions" of the QuickCMC Help).
Exceptions are the CMC 356 and CMC 353 test sets. Refer to the Test Universe
Help about setting the overload detection sensitivity for OMICRON CMC 356 or
CMC 353 test sets. Launch the Help and search for Test Object, subtopic
Device Settings in the table of contents of any test module.
Why do I want to adjust the overload sensitivity?
Example: For testing electromechanical relays. The results of this test show that
an overload has occurred during the test. Analyzing the signals with EnerLyzer
reveals that the overload occurred during the prefault and therefore is not crucial
for the result. Being able to prevent the overload indication for this test produces
a report without an overload message.
39
Overload Detection Sensitivity options:
"High" = 50 ms.
"Low" = 200 ms.
"Custom". Enter the overload sensitivity time of your choice into the "Custom"
field (10 ms 800 s).
"Off" turns off any adjustable overload detection sensitivity, that is, no
overloads are detected at all.
The following test sets and amplifiers support the variable overload detection:
CMC 356
CMC 353
CMC 256plus
CMC 256
CMC 156
CMA 56 (Ifxxxx)
CMA 156 (HDxxxx)
CMS 156 (HDxxxx)
CMS 25x
Restriction: Amplifiers need a specific hardware and firmware version. The

ability to adjust the overload detection sensitivity is available for devices with
serial numbers greater or equal to the ones specified in brackets in the list above
as well as for any device that has been modified to support the new overload
algorithm. The latter is indicated by a firmware version 1.03 and special flag set
in the flash.
40
Setting Up the Test Hardware
4 Setting Up the Test Hardware

To define the test-specific hardware settings, a configuration module named
Hardware Configuration is used. In Hardware Configuration (HWC) you
define the combination of outputs and/or inputs you want to use for a specific
test. Furthermore, Hardware Configuration automatically documents the
wiring information for the test. This way, an existing test file can additionally be
used for test instructions for that particular test.
Hardware Configuration allows you to select the test hardware you want to use
for the test without the necessity to physically connect any test hardware to the
PC. This enables you to fully prepare a test in the office. Furthermore, the test
documents become independent from the actual hardware that is used for the
test. For example, a test template for differential relay testing using six output
currents becomes independent from whether a CMC 356, a CMC 256plus, a
CMC 256 or a CMC 353 or CMC 156 with an external amplifier will be used.
Within OMICRON Test Universe, Hardware Configuration is a common
component that is started either from the OMICRON Control Center, from any
test module, or from a test document (if a Hardware Configuration is
embedded).
This chapter provides general information about the Hardware Configuration.
For specific information on how to configure a specific function of the test
hardware, for example a CMC test set, please refer to the Test Universe Help.
Launch the Help, click the --- Hardware Configuration --- entry in the table of
contents and navigate to the topic of your choice.
For more detailed information about the test hardware itself, refer to the relevant
manual. That manual was installed with the Test Universe software (unless you
deliberately chose not to install documentation). For information where to find
and how to view the manuals, "The Test Universe Documentation" on
page 10.
41
4.1 About the Hardware Configuration

4.1.1
What is the Hardware Configuration

The OMICRON Test Universe consists of several hardware and software
components. Depending on the type of test hardware you use, the software
allows for different types of tests. For instance, three-phase testing of a three
winding differential transformer is only possible with a test Hardware
Configuration with 9 current phases, for example a CMC 156 in combination
with a CMA 156 current amplifier.
In the broadest sense the test hardware can be seen as an "adaptation" between
the test software and the test object (relay, meter, transducer etc.). For instance,
an output signal of the test software is physically put out by a test set output and
then applied to the corresponding test object terminal via the wiring ( Figure
4-1).
Test
Module
VL1
VL2
VL3
Test set, for

example CMC 356
V1
V2
V3
Host Interface
Figure 4-1:
Hardware
Configuration, signal
path between test
software and test object
Terminal strip,
for example X1
N
IA1
IA2
IA3
VL1
VL2
VL3
N
Test
Object
To set up the software according to the hardware setup, a separate software

component, the Hardware Configuration (HWC), is available. The Hardware
Configuration "represents" the signal path between the software and the test
object and contains complete information about
the assignments between the inputs and outputs of the test software and the
test object terminals,
the used test hardware as well as its configuration and
the wiring between the test hardware and the test object terminals.
This information is defined in the Hardware Configuration dialog box which

provides several tabs for defining the hardware and mapping the signals to the
test object terminals.
42
Test modules can be used in stand-alone mode or embedded in an OMICRON

Control Center test document. Depending on the operating mode of the test
module the functional scope of the Hardware Configuration differs as shown
in Figure 4-2.
If a test module is used in stand-alone mode the functionality of the global

and the local Hardware Configuration are put together and considered as
the test module's Hardware Configuration ( chapter 4.1.4).
If a test module is embedded in an OMICRON Control Center test document

the Hardware Configuration is divided into the global and the local
Hardware Configuration ( chapters 4.1.2 and 4.1.3).
Figure 4-2:
Scope of the Hardware
Configuration
Test module in stand-alone mode
Test module embedded in Control Center test document

Local
Hardware Configuration
VL1
VL2
VL3
4.1.2
Test set, for

example CMC 356
V1
V2
V3
Host Interface
Test
Module
Global
N
IA1
IA2
IA3
Terminal strip,
for example X1
V(1)-1
V(1)-2
V(1)-3
N
VL1
VL2
VL3
N
Test
Object
Global Hardware Configuration if the Test Module is

Embedded in a Control Center Document
If the test module is embedded in a Control Center test document, a global
Hardware Configuration can be inserted into the Control Center test document
to be used by subsequent test modules. If no global Hardware Configuration
is inserted into the Control Center test document, the test modules behave as if
they were running stand-alone ( chapter 4.1.4).
43
The global Hardware Configuration allows you to define the hardware at only
one single place in a Control Center document, even for complex tests possibly
requiring several test modules. This makes it unnecessary to individually open
each single test module for configuration.
If a global Hardware Configuration is inserted into a Control Center test
document, the information specified there is valid for all subsequent test
modules throughout the Control Center document or until another global
Hardware Configuration is inserted, which is again valid for the test modules
following it. Information specified in a global Hardware Configuration cannot
be changed from a test module's local Hardware Configuration.
The following information is specified in the global Hardware Configuration (as
shown in Figure 4-3):
Used test hardware.
Usage of inputs and outputs (configuration) of the test hardware.
Physical wiring between the test hardware and the test object terminals.
Figure 4-3:
Information specified in
the global Hardware
Configuration
Global Hardware Configuration
IA1
IA2
IA3
N
IB1
IB2
IB3
N
44
V(1)-1
V(1)-2
V(1)-3
I(1)-1
I(1)-2
I(1)-3
I(2)-1
I(2)-2
I(2)-3
Terminal strip,
for example X1
VL1
VL2
VL3
N
I1S
I2S
I3S
N
I1P
I2P
I3P
N
Test Object
Host Interface
Test set, for

example
CMC 356 V1
V2
V3
N
Automatic configuration of the display names and the wiring

matrix with default settings
According to the test hardware the wiring matrix and the display names are
automatically configured with default settings. For this, the names are generated
by, for example, enumerating the voltage and current triples. This creates
names such as V(1)-1, V(1)-2, etc. For the binary/analog inputs, the binary
outputs and the analog DC inputs, the generated names are an enumeration of
the input/output. For a CMB the inputs/outputs number is preceded with the slot
number.
The default settings should be suitable for most applications. However, the
settings can also be changed manually, if necessary.
Manually performed settings and those which are stored in the test document
are kept and not overwritten by newly performed automatic configurations.
The automatic configuration is performed by the software
in offline mode (when no test hardware is connected) after opening the global
Hardware Configuration and selecting the test hardware.
in online mode (when test hardware is connected and switched on) each time
the test hardware information is updated.
Usage of a global Hardware Configuration by multiple test

modules
Since the global Hardware Configuration often stays the same, it can be used
by several embedded test modules. The following figure illustrates how several
test modules can access a global Hardware Configuration module (containing
the physical hardware and wiring information) while at the same time being able
to establish different test module signal assignments in the local Hardware
Configurations.
45
Figure 4-4:
Global and local
Hardware
Configuration in a test
document 2
46
Control Center Test Document

Global Hardware Configuration
Test Module 1
Local Hardware Configuration
Test Module 2
4.1.3
Local Hardware Configuration if the Test Module is

Embedded in a Control Center Document
If the test module is embedded in a Control Center test document containing a
global Hardware Configuration, the signal assignments between the test
module and the test object terminals (which are represented by the names in the
"Display Name" column) are determined in the local Hardware Configuration
of the test module. Here, each test module signal can be assigned to one
physical signal path defined in the global Hardware Configuration.
Figure 4-5 shows an example.
Figure 4-5:
Information specified in
the local Hardware
Configuration
Test set, for

example CMC 356
Terminal strip,
for example X1
Test Object
Test
Module
47
Automatic signal assignment based on the display names

In the local Hardware Configuration, the test module input and/or output
signals are automatically assigned to the display names. For this purpose a
matching algorithm of the software tries to find the display name that best fits the
input or output signal of the test module.
If the algorithm cannot find a matching pair, the test module signal is assigned
to the first available display name. In this case it can be necessary to perform
the signal assignment manually.
An automatic signal assignment is performed by the software
when a test module is first inserted into a test document,
when the test object terminals (display names) defined in the global
Hardware Configuration are changed,
when a new global Hardware Configuration is imported by clicking Import

on the General tab or
when the test hardware information is updated.
Signal assignments which were manually performed or changed by you and

which are stored in the test document are kept and not overwritten by newly
performed automatic signal assignments.
Coupling of test module signals with the display names (test

object terminals)
Once the test module signals are assigned in the local Hardware Configuration
(either automatically or manually) they are coupled to the display names (which
represent the test object terminals). This means that if the user changes the link
between a display name and a test hardware connector in the global Hardware
Configuration by moving the cross in the grid, the test module signal still sticks
with the display name.
This enables configuration changes in the global Hardware Configuration
without any need to adjust the signal assignments in the local Hardware
Configuration.
4.1.4
Hardware Configuration if the Test Module is

Running in Stand-Alone Mode
If test modules are used in stand-alone mode, the information specified in the
Hardware Configuration has to be defined for each individual test module. If
no global Hardware Configuration was inserted into the Control Center
document, the embedded test modules behave as if they were running standalone.
48
If a test module is used in stand-alone mode, the functionality of the global and
the local Hardware Configuration are put together and considered as the test
module's Hardware Configuration. In this case all necessary information is
contained in the Hardware Configuration ( Figure 4-6 below):
Used test hardware.
Usage of inputs and outputs (configuration) of the test hardware.
Physical wiring between the test hardware and the test object terminals.
Signal assignments between the test module and the physical wiring.
Figure 4-6:
Hardware
Configuration of a test
module running in
stand-alone mode
Test set, for

example
CMC 356
Terminal strip,
for example X1
Test Object
Test
Module
49
Automatic configuration of the display names and the wiring

matrix with default settings
According to the test hardware the wiring matrix and the display names are
automatically configured with default settings. For this, the names are generated
by, for example, enumerating the voltage and current triples. This creates
names such as V(1)-1, V(1)-2, etc. For the binary/analog inputs, the binary
outputs and the analog DC inputs, the generated names are an enumeration of
the input/output. For a CMB the inputs/outputs number is preceded with the slot
number.
The default settings should be suitable for most applications. However, the
settings can also be changed manually, if necessary.
Manually performed settings and those which are stored in the test are kept and
not overwritten by newly performed automatic configurations.
This automatic configuration is performed by the software
in offline mode (when no test hardware is connected) after opening the

Hardware Configuration of a test module and selecting the test hardware.
in online mode (when test hardware is connected and switched on) each time
the test hardware information is updated.
Automatic signal assignment based on the display names

Likewise, the test module input and/or output signals are also automatically
assigned to the display names. For this purpose a matching algorithm of the
software tries to find the display name that best fits the input or output signal of
the test module.
If the algorithm cannot find a matching pair, the test module signal is assigned
to the first available display name. In this case it can be necessary to perform
the signal assignment manually.
An automatic signal assignment is performed by the software when a test
module is opened or a new test is created.
50
4.2 Example of Global and Local Hardware

Configurations (Test Module Embedded in
Control Center Document)
Suppose an overcurrent test object and a differential test object are to be tested
within a single test document.
The first item shown in Figure 4-7 is the global Hardware Configuration which
is used by both test modules.
Figure 4-7:
List View of the Control
Center document
An example of a global Hardware Configuration is shown in Figure 4-8. In this

case the hardware setup consists of one CMC 356 test set and one CMA 156
current amplifier. The names in the "Display Name" column represent the test
object terminals. The display names and the wiring matrix are automatically
configured with default settings. The terminal designations in the "Connection
Terminal" column must be entered manually (but can also be left blank).
Figure 4-8:
Global Hardware
Configuration
51
In the local Hardware Configuration of the Overcurrent test module ( Figure

4-9) the test module signals are automatically assigned to the names in the
"Display Name" column which represent the test object terminals. Once the test
module signals are assigned in the local Hardware Configuration they are
coupled to the "Display Names".
Figure 4-9:
Local Hardware
Configuration of the
Overcurrent test module
(example)
Likewise, in the local Hardware Configuration of the Diff Configuration module

( Figure 4-10) the test module signals are again automatically assigned to the
corresponding names in the "Display Name" column.
Figure 4-10:
Local Hardware
Configuration of the
Diff Configuration test
module (example)
Only the "Test Module Output Signal" can be set in the local Hardware
Configuration of each test module. The selection menu contains only signals
that are applicable for this test module.
The columns for "Display Name" and "Connection Terminal" can only be edited
in the global Hardware Configuration.
52
4.3 Test Setup (Symbolic Representation)

Figure 4-11:
Symbolic
representation of a test
setup
4
5
(1)
Connection of a CMC test set (here a CMC 356) to the computer.

Connection variants:
CMC 356, CMC 256plus or CMC 256-6 with the NET-1 or NET-1B
option via Ethernet (ETH connector on the test set's back side)
Ethernet port of your computer.
CMC 356, CMC 256plus or CMC 256-6 with the NET-1C option via
USB on the test set's back side USB port of your computer.
Requires Test Universe 3.0 or higher to be installed on your computer.
CMC 256plus with the PAR-1 option to parallel printer port of your
computer. (Note: The PAR-1 option was discontinued in April 2014.)
CMC 256plus with the PAR-1 option CMUSB-P converter USB

port of your computer.
Standard CMC 256-6 with parallel Host Interface parallel printer

CMC 156 with parallel Host Interface CMUSB-P converter USB

(2)
Connection of the CMC's analog VOLTAGE OUTPUTS to feed the

simulated voltage signals to the corresponding voltage inputs of the test
object.
(3)
Connection of the CMC's analog CURRENT OUTPUTS to feed the

simulated current signals to the corresponding current inputs of the test
object.
(4)
Connection of the CMC's BINARY OUTPUTS to feed binary signals to the

corresponding binary inputs of the test object.
(5)
Connection of the test set's BINARY INPUTS to the corresponding binary

outputs of the test object to read the binary signals of the test object (and
therefore the reactions to the fed analog voltage and current signals).
53
4.4 Starting the Hardware Configuration

If the test module is embedded in a Control Center test
document
To start the global Hardware Configuration from the Control Center:
1. If necessary, insert a new Hardware Configuration into the test document
by clicking Hardware Configuration on the Insert tab.
2. To open an existing Hardware Configuration from the Navigation Pane,
double-click its icon in the list on the left side of the window.
3. To open an existing Hardware Configuration in the List View, double-click
its icon in the tree.
4. The Report View of a test document also contains a reference symbol to the
Hardware Configuration. The references within the test document appear
either as editable information or as icon. Double-click the reference to start
the Hardware Configuration.
To start the local Hardware Configuration of an embedded test module,
double-click the test module in Control Center to open it. In the test module, click
Hardware Configuration on the Home tab.
Figure 4-12:
Representation of the
Hardware
Configuration in the
Report View of a test
document as editable
information:
Test Equipment
Type
Serial number
CMC256-6
EB330D
Hardware Check
Performed at
Result
Details
Not yet performed
or as icon:
If the test module is used in stand-alone mode

To start the Hardware Configuration of a test module running in stand-alone
mode:
In the test module, click Hardware Configuration on the Home tab.
54
4.5 Usage of Existing Hardware Configurations

If you want to use an existing Hardware Configuration you can either open an
existing test document (or test) or you can import a stored Hardware
Configuration.
If you are working in online mode (test hardware connected and switched on),
an automatic configuration of the wiring matrix and the display names is
performed when the test hardware information is updated (for new test
documents or tests also an automatic signal assignment between the test
module signals and the display names is performed).
If the Hardware Configuration encounters a difference between a stored
configuration (either being part of a test document or being imported) and the
currently available test hardware, the software tries to map as many inputs/
outputs as possible from the stored configuration to the current one.
If the software cannot find an appropriate input/output for each of the stored
inputs/outputs, an appropriate message is displayed in the Status History
window. Any information of the stored configuration that cannot be mapped to
the current hardware is lost. In this case youll have to modify the Hardware
Configuration manually.
When working with an existing test document or test that already contains a
stored Hardware Configuration, always verify the physical wiring and the
Hardware Configuration settings.
55
4.6 Update of the Test Hardware Information

When the connected test set is exchanged by another test set or test set type,
no message is displayed, informing you that you have other test hardware
connected than displayed in your Hardware Configuration. Only the Status
History window displays a corresponding message. For example, when the test
hardware is changed from a CMC 356 to a CMC 353, or when an additional
amplifier is used that is switched off, it could happen that the number of available
outputs is no longer sufficient. In such case it is possible that you do not realize
this lack of outputs (for example, when working with the State Sequencer test
module).
Updating the test hardware information means that a hardware scan is
performed and the data of the connected test hardware (for example, test set
type, serial number, etc.) are loaded to the Hardware Configuration. Each time
the test hardware information is updated, the display names and the wiring
matrix are automatically configured with default settings based on the test
hardware information. Manually performed settings and signal assignments and
those which are stored in the test document are kept as far as possible and not
overwritten when the test hardware information is updated.
If the Hardware Configuration encounters a difference between a stored
configuration (either being part of a test document or test or being imported) and
the currently available test hardware, the software tries to map as many inputs/
outputs as possible from the stored configuration to the current one. If the
software cannot find an appropriate input/output for each of the stored inputs/
outputs, an appropriate message is displayed in the Status History window.
Any information of the stored configuration that cannot be mapped to the current
hardware is lost. In this case youll have to modify the Hardware Configuration
manually.
4.6.1
Update Behavior if a Test Module is Running StandAlone

If a test module is running stand-alone, the update behavior depends on whether
test results are available or not.
56
If no test results are available, the moment of the test hardware information
update depends on the test module.
If test results are available, no test hardware information update is performed

and the Hardware Configuration operates in read-only mode. In this case
no changes can be performed until the test results are deleted.
4.6.2
Update Behavior if Test Modules are Inserted into a

Test Document and Access a Global Hardware
Configuration
In Version TU1.5 the update behavior of the test hardware information changed
compared to earlier versions. Let's assume that a user performs tests
somewhere out in the field without a printer at hand and wants to print the test
document for archiving purposes when he is back in the office. In this case the
test hardware information in the test document may not be changed in order to
document which test hardware (serial no.) was used during the test.
Consequently, the Hardware Configuration must be informed whether a test
document has been tested or not.
For this purpose, 3 update states are distinguished. The update state is
determined by the test modules accessing a global Hardware Configuration,
that is all tests that follow a global Hardware Configuration in the test
document.
Automatic update
An automatic update of the test hardware information is performed when all of
the test modules are in IDLE state, that is, they have not been tested. In this case
the test hardware information is automatically updated as soon as the test
document is opened. A hardware scan for updating the test hardware
information is also immediately performed when the state is changed from one
of the other two states to the automatic update state. The user can perform a
manual update at any time by clicking the Search... button on the General tab.
Demand update
The demand update state is reached as soon as one of the test modules
following the global Hardware Configuration in the test document is not in IDLE
state (PAUSED, STOPPED, FINISHED or ERROR) and at least one other test
module is still in a state that allows for testing (IDLE, PAUSED or STOPPED).
In this case the test hardware information is not updated upon opening of the test
document. The test hardware information is updated on demand, before the test
module begins running the actual test. The user can perform a manual update
at any time by clicking the Search... button in the General tab.
57
No update
If all test modules are either in FINISHED or ERROR state, the test hardware
information is not updated. In this case the Hardware Configuration operates
in read-only mode and no changes can be performed. This mode is like the
behavior of stand-alone running test modules when test results are available.
58
4.7 The Hardware Configuration Dialog Box

In the local Hardware Configuration of test modules or if a test module is used
in stand-alone mode, possibly not all tabs are displayed in the Hardware
Configuration dialog box. In this case, only those tabs are displayed which
functions are supported by the specific test module. For instance, in the
Hardware Configuration of the Meter test module the Binary Outputs tab and
the DC Analog Inputs tab are missing because this module does not support
binary outputs or DC analog inputs.
The Hardware Configuration dialog box consists of up to 6 different tabs. The
basic purpose of each tab in the Hardware Configuration dialog box is
explained in this chapter.
If the configuration is performed in the global Hardware Configuration, the
selected configuration is valid throughout the Control Center document and
cannot be changed from a test module's local Hardware Configuration. If no
global Hardware Configuration was inserted into the Control Center
document, the test modules behave as if they were running stand-alone. In this
case, all information has to be specified for each individual test module.
For the General tab chapter 4.7.2 on page 63.
For the Analog Outputs tab chapter 4.7.8 on page 76.
For the Binary / Analog Inputs tab chapter 4.7.9 on page 78.
For the Binary Outputs tab chapter 4.7.10 on page 81.
For the DC Analog Inputs tab chapter 4.7.11 on page 83.
For the Time Source tab chapter 4.7.12 on page 84.
General information about working with the wiring tables in the inputs and
outputs tabs are given in chapter 4.7.1 on page 60.
59
4.7.1
Working with the Wiring Tables in the Inputs and

Outputs Tabs
In the inputs and outputs tabs the usage of the inputs and outputs of the test
hardware is defined.
The wiring tables in the inputs and outputs tabs are automatically configured and
adapted according to the test hardware and its configuration set in the General
tab. For example, if the configuration is changed to obtain additional outputs, the
wiring table is enhanced by an appropriate number of new terminal lines which
are automatically wired to the new connectors and provided with default display
names.
Figure 4-13:
Analog Outputs tab of
a test module running in
stand-alone mode
5
3
4
Even though the table rows are arranged in

alternating yellow- and white-colored
blocks with three lines each, these blocks
do not necessarily represent functional
blocks, for example, CMC output triples.
The assignment of CMC outputs to test
object terminals is freely user-definable,
therefore the colors should be regarded as
a visual aid.
As defined in the Output Configuration Details

dialog in the General tab, there are one voltage
and three current triples available.
If no test set is connected to the PC (offline mode), question marks are displayed
instead of the serial number.
60
Information about the columns and areas in the wiring tables

Figure 4-13:
(1)
"Test Module Signal"

In this column the input/output signal of the test module is assigned to the
test object terminal specified in this line. To change the assignment, leftclick the specific cell and select an input/output signal. The selection
menu only allows signals that an individual test module knows about and
that are appropriate for the wired connector. Once the test module signals
are assigned they are coupled to the names in the "Display Name"
column.
The "Test Module Signal" column is not available in the global Hardware
Configuration of a Control Center test document. The test module input/
output signals can only be assigned or changed in the local Hardware
Configuration or in the Hardware Configuration of a test module
running in stand-alone mode.
(2)
"Display Name"
The display name is the designation of the connection between the test
hardware connectors and the test object terminals. According to the test
hardware connected to the PC or selected in the General tab the display
names are automatically configured with default settings. The display
names cannot be changed in the local Hardware Configuration of a test
module which is embedded in a Control Center test document.
(3)
"Connection Terminal"
In the "Connection Terminal" column you can enter the names of the test
objects connectors. This information increases the usefulness of the
Hardware Configuration and can improve the quality of the test report.
It is recommended to use it, but it is optional and can also be left blank.
The connection terminal names cannot be changed in the local Hardware
Configuration of a test module which is embedded in a Control Center
test document.
61
(4)
Wiring Matrix
In the wiring matrix the connections (physical wiring) between the test
hardware connectors and the test object connectors are defined.
According to the test hardware connected to the PC or selected in the
General tab the wiring matrix is automatically configured with default
settings. The wiring matrix cannot be changed in the local Hardware
Configuration of a test module which is embedded in a Control Center
test document.
This note only applies when working in online mode:
Test hardware connectors which are not available because they are used
by a different application are disabled (displayed with a gray background)
in the wiring matrix and cannot be wired in the Hardware Configuration.
For example, this is the case if inputs are reserved by the EnerLyzer and
you look at the Hardware Configuration from a different test module.
(5)
Test set information

In the heading area of the wiring matrix the test set information is
displayed (type, offline or online state, input ranges of analog inputs,
connector, etc.).
Handling information
When moving the mouse over a "Test Module Signal", "Display Name " or
"Connection Terminal" cell, the wiring configuration (set by a cross in the wiring
matrix) is highlighted by blue line and column headers. When moving the mouse
over a cell in the wiring matrix area the mouse pointer changes to a cross and
the headers of the concerning line and column of the test set connector are also
highlighted in blue. This makes it easier to find the correct line and cell.
To establish a connection in the wiring matrix area, position the mouse pointer
on the desired cell and then click to put a cross to the desired cell.
A right mouse-click opens a context-menu allowing you to Add a line at the end
of the table, to Insert a line above the selected line, to Delete selected lines in
the table and to reset the assignment for selected lines (Reset Assignment).
62
4.7.2
General Tab
On the General tab define the used test hardware.
If the serial number of a connected test set is not yet known by the software,
question marks are displayed instead of the serial number. This could for
instance be the case if the software is in offline mode (no test set connected or
the connected test set is switched off).
If a new test set or amplifier is selected or if the test set or amplifier configuration
is changed in the General tab, the wiring information, display names and, if
applicable, the signal assignment in the wiring table of the other tabs are
automatically adapted. For example, if the configuration is changed for
additional outputs, the wiring table is enhanced by an appropriate number of
new terminal lines which are automatically wired to the new connectors and
provided with default display names and, if applicable, default signal
assignments.
Figure 4-14:
General tab
4
6
5
9
10
11
12
13
The combo boxes, buttons and display fields of the General tab shown in figure
4-14 are explained below:
63
(1)
In the Test Set(s) combo boxes, the connected OMICRON test set(s) are
either displayed together with their serial number or can be manually set.
Depending on the setting in the first combo box the second combo box is
disabled. The following settings can be selected or displayed:
Only a CMC test set (entry "CMCxx" in the first combo box, "No
extension device" in the second combo box or second combo box is
inactive if the displayed CMC test set does not support the CMB IO-7).
Only a CMB IO-7 test set (entry "CMB IO-7" in the first combo box,
second combo box is inactive).
Combination of a CMC (which is able to support a CMB IO-7) and a

CMB IO-7 test set (entry "CMC" in the first combo box and "CMB IO-7"
in the second combo box).
(2)
The display fields "Voltage Outputs", "Current Outputs" (and for

CMC 356/CMC 353/CMC 256plus/CMC 256 or CMB IO-7: "Aux DC")
show the selected configuration.
(3)
The voltage/current outputs configuration of the selected CMC device can

be changed by clicking the corresponding Details... button
( 4.7.3 "CMC Output Configuration Details" on page 67).
To set the AUX DC voltage, use AUX DC Configuration from the
Configuration Modules section of the Test Universe start screen.
64
(4)
The configuration of the selected CMB IO-7 test set can be changed by
clicking the Details... button. For more detailed information 4.8 "CMB
IO-7 Hardware Option" on page 96.
(5)
The Amplifier(s) / Low Level Outputs / Sensor Simulation combo box

allows the selection of additional amplifiers, low-level outputs or sensor
simulations. The group box is inactive if the selected test set does not
support this (for example, CMC 151) or when the only selected test set is
a CMB IO-7.
(6)
If the Multiple Amplifiers / Low Level Outputs check box is selected,

another combo box is displayed for specifying a second amplifier, sensor
simulation or system of low level outputs. Leave this option inactive if you
are not using more than one amplifier, sensor simulation or system of low
level outputs.
(7)
The display fields "Voltage Outputs" and "Current Outputs" display

information about the selected configuration.
(8)
The configuration can be changed by clicking the corresponding

Details... button ( chapters 4.7.4 to 4.7.7 on page 72).
(9)
Virtual Inputs/Outputs
You can set up either one of the test sets CMC 850, CMC 356, CMC 353,
CMC 256plus or CMC 256 with the NET-1 option to send and receive socalled GOOSE messages (GOOSE = Generic Object Oriented Substation
Events). GOOSE messages are events that are directly embedded into
the data packets transmitted via Ethernet in the substation network.
GOOSE messages can be mapped (assigned) to both the physically
existing BINARY INPUTS 1 - 10 of a CMC test set and to so-called
"virtual" inputs and outputs. Virtual inputs/outputs are physically not
existing, yet internally handled like real inputs/outputs by the
Test Universe software. 24 of these virtual inputs/outputs are combined
to one group, 15 groups are available. To use virtual inputs/outputs,
launch the GOOSE Configuration module from the IEC 61850 section of
the Test Universe start screen. In the GOOSE Configuration module,
launch the Hardware Configuration.
Note that not all Test Universe modules support the virtual inputs/outputs.
In test modules that don't, the Virtual Inputs/Outputs section is disabled.
Selecting and routing virtual inputs/outputs for GOOSE messages is
identical in all test modules:
1. Click the Details... button in the Virtual Inputs/Outputs group box.
In the Virtual IO Configuration Details dialog box, select the virtual
inputs and outputs groups that you want to use for GOOSE messages.
Then click OK to close the dialog box.
2. Change to the Binary / Analog Inputs tab.
At the Navigation Bar select a virtual input group of your choice (for
example, "vin group 1").
At "Test Module Input Signal", route the number of inputs you need
from this group to virtual binary inputs, for example input signal
"vBin. in 1-1" to virtual binary input 1-1.
3. Change to the Binary Outputs tab and repeat the procedure from
item 2 for the virtual binary outputs.
Note that a test from any test module supporting the virtual inputs/outputs
cannot be started if one or more virtual binary input/output signals are
routed in the module's Hardware Configuration without having mapped
them to a GOOSE message in the GOOSE Configuration module before
(Subscriptions tab).
The GOOSE Configuration Example manual holds further information
about this subject.
65
(10)
The Check Wiring Warning check box allows switching on or off the
wiring warning message. If active, this message will remind you to check
the physical wiring of your hardware prior to the start of the test procedure
or whenever the global Hardware Configuration instance changes (if the
test document contains more than one global Hardware Configuration).
(11)
Click the Search... button to search for connected devices and update the
test equipment information. Normally it is not necessary to perform a
manual search, because the software automatically finds connected
OMICRON test equipment and updates the test hardware information.
For detailed information chapter 4.6 on page 56.
(12)
Click the Calibration... button to open the Calibration dialog box and
display the last factory calibration for the connected OMICRON devices.
Guaranteed values provided in the hardware manual are valid for one
year after the date of the last factory calibration.
(13)
Using the import/export feature allows saving/loading of OHC files. OHC

files contain all information which can be set in the Hardware
Configuration. This way, Hardware Configurations can easily be
transferred between for example, different Control Center documents. For
more detailed information chapter 4.5 on page 55.
The message box Cannot use all of the selected devices at the same time
appears if you set an amplifier configuration that exceeds the max. number of 6
low level outputs that can be handled by a CMC test set. For more details, refer
to the Test Universe Help. Launch the Help, click the
--- Hardware Configuration --- entry in the table of contents and navigate to the
"General Tab" topic.
66
4.7.3
CMC Output Configuration Details

Click the Details... button next to the combo box to change the voltage or current
outputs configuration of a CMC test set which is selected/displayed in the upper
combo box of the Test Set(s) group box in the General tab.
In this dialog box the configuration of the selected CMC test set can be changed.
The image in the middle of the dialog box shows how to connect the outputs in
order to achieve the wanted configuration.
When opening the Output Configuration Details dialog box a warning
message is displayed. For each output configuration selected in the dialog box
a corresponding connection diagram is associated to show how to connect the
cables. These pictures are only symbolic! For information how to connect the
cables physically correct, consult the appropriate hardware manual. You can
suppress this message by selecting the Dont show this warning again check
box. To switch off the suppression and display the message again upon opening
the Output Configuration Details dialog box, press the <Shift> key while
opening the dialog box.
Figure 4-15:
Output Configuration
Details dialog box for a
CMC 256-6
2
4
3
67
(1)
CMC ... Voltage Outputs

In this group box select the wanted configuration of the voltage outputs of
your CMC test set from the entries in the list. A corresponding connection
diagram is associated with each configuration which symbolically shows
how to connect the cables in order to achieve the wanted configuration.
For a physically correct connection, please refer to your hardware
manual.
The setting "3 x 300 V, 50 VA @ 75 V, 660 mArms, VEautomatically
calculated"
This setting is available for the test sets CMC 356, CMC 353,
CMC 256plus and CMC 256.
If the configuration 3 x 300 V, 50 VA @ 75 V, 660 mArms,

VEautomatically calculated is set, the voltage VE is generated between
the terminals V4-N. VE represents the vectorial sum of the three phase
voltages V1-N, V2-N and V3-N.
This function is calculated in the CMC test set's internal firmware without
knowledge of any Test Object settings. Therefore, it does not consider
any VT ratio deviations between phase voltage and residual voltage
inputs as specified in the Test Object but will always divide the vectorial
sum of the three phase-to-ground voltages by 3, for example, if all three
phases put out 10 V with equal phase angles, VE will be 17.3 V.
Since this signal is automatically generated, it will not be available
anymore for the channel routing on Hardware Configuration's Analog
Outputs tab.
68
(2)
Voltage Factor
The "Voltage Factor" entry field is only enabled when the configuration
[3 x 300 V; 50 VA @ 75 V; 660 mArms;V0] is selected that includes the
automatically calculated zero-sequence voltage (for CMC 356/CMC 353/
CMC 256plus/CMC 256). The "Voltage Factor" value is the factor for the
zero-sequence voltage calculation. When the field is active, the zerosequence voltage calculated using this factor is output at the V4 output of
the according CMC test set. The default value is 1/3 (0.57735).
The fourth voltage V4-N is calculated from the residual voltage VG of the
three phase system V1, V2, V3 as follows:
V4-N = fv x VG,
VG = V1-N + V2-N + V3-N
fv is the voltage factor which can be entered in the input field.

(3)
CMC ... Current Outputs

In this group box select the wanted configuration of the current outputs of
your CMC test set from the entries in the list. A corresponding connection
diagram is associated with each configuration which symbolically shows
how to connect the cables in order to achieve the wanted configuration.
For a physically correct connection, please refer to your hardware
manual.
The setting "3 x 12.5 A, 70 VA @ 7.5 A 10 Vrms, IE automatically
calculated"
This setting is available for the test sets CMC 356/CMC 353/
CMC 256plus/CMC 256.
If the configuration 3 x 12.5 A, 70 VA @ 7.5 A 10 Vrms, IE automatically

calculated is set, the current IE flows between the connectors 1 and 2 of
the current triple B. IE represents the vectorial sum of the three phase
currents (I1, I2 and I3 of triple current A).
69
This function is calculated in the CMC test set's internal firmware without
knowledge of any Test Object settings. Therefore, it does not consider
any CT ratio deviations between phase current and residual current inputs
as specified in the Test Object; for example, if all three phases put out
1 A with equal phase angles, IE will be 3 A.
Since this signal is automatically generated, it will not be available
anymore for the channel routing on the Hardware Configuration's Analog
Outputs tab.
(4)
Compliance Voltage
The output power limit of the current outputs can be optimized with the
compliance voltage (except CMC 353/CMC 356). For normal use, the
default setting "high" is appropriate (6 or 15 V, depending on the CMC test
set), which is the optimum for most regular applications. Changed
compliance voltage values can be reset to the default setting by clicking
the Default button.
(5)
Fan Mode
Fan control options for CMC 356, CMC 353 and CMC 256plus test sets.
Silent: The fan is automatically controlled by the test set.
Max. Power: The fan always runs with maximum speed to extend the
output duration before an overtemperature warning occurs. With this
option, the CMC 356, CMC 353 and CMC 256plus test sets reach the
output duration of a CMC 256-6.
(6)
Auxiliary VT/CT control (Connect/Remove VT or Connect/Remove CT)

The auxiliary VT/CT control supports the connection of external current
and/or voltage transformers to the analog outputs of any CMC test set or
"intelligent" OMICRON amplifier (that is, an amplifier connected to the
CMC test set in a way that enables both devices to communicate with
each other).
Connecting a current or voltage transformer to an analog output changes
the characteristics of this output, for example, its amplification or
propagation delay time. The auxiliary VT/CT control allows specifying
these changes, so the software will apply the correct values to the CMC's
analog outputs, and display the correct transformer secondary winding
values.
Auxiliary CT/VT control holds a restriction. For setups consisting of
configurations that include more than one output current or voltage group
(for example, 4 x 300 V or 6 x 12.5 A with a CMC 356/CMC 353 (only 4 x
300 V)/CMC 256plus/CMC 256), it is assumed that you connect
respective transformers to all analog CMC output groups. It is not possible
to configure the software in such a way that one output group is
connected to transformers, and the other one is not.
70
Figure 4-16:
Example: A
configuration using the
current output groups A
and B (6 x 12.5 A).
Wrong:
A
3 CTs,
for example,
3 x 125 A
Analog outputs,
3 x 12.5 A
Right:
3 CTs,
for example,
3 x 125 A
3 CTs,
for example,
3 x 125 A
Click the Connect VT/CT (or, if a transformer is already connected,

Modify VT/CT) button to open the respective Configuration Details dialog
box, in which the transformer details are specified.
Click the Remove VT/CT button to remove the VT/CT configuration
information and reset the analog output configuration to normal operation.
For additional information please refer to the Help. Launch the Help, click the
topic General tab > CMC Configuration Details > Output Configuration
Details.
71
4.7.4
Amplifier Configuration Details

In the Amplifier(s) / Low Level Outputs / Sensor Simulation group box of the
General tab you can (among other things) specify OMICRON amplifiers or
user-defined non-OMICRON amplifiers.
Normally only one combo box is displayed, but if the Multiple Amplifiers / Low
Level Outputs check box is selected, another combo box is displayed which
allows the selection of a second amplifier. Leave this option inactive if you are
not using more than one amplifier.
To set or change the configuration of an amplifier which is selected/displayed in
the combo box(es) of the Amplifier(s) / Low Level Outputs / Sensor
Simulation group box in the General tab, click on the Details button next to the
combo box. This opens a dialog box where you can perform the configuration
for your amplifier.
Figure 4-17:
Amplifier Details
dialog box for
configuring a userdefined non-OMICRON
current amplifier
topic General tab > Amplifier Configuration Details.
72
Configuring an OMICRON amplifier:

This topic describes the configuration of OMICRON CMA and CMS
amplifiers which are able to communicate with the software.
Configuring a user-defined non-OMICRON amplifier:

This topic describes the configuration of non-OMICRON amplifiers which are
not able to communicate with the software.
AMP files:
This topic describes the usage of AMP files containing the amplifier
configuration data. By selecting AMP files the amplifier configuration data is
read by the software instead of specifying the data manually.
4.7.5
Voltage and Current Sensor Simulations

From the combo box in the Amplifier(s) / Low Level Outputs / Sensor
Simulation group box in the General tab, select
the entry "Create Linear Voltage Sensor" or "Create Linear Current Sensor"
to create a new voltage or current sensor simulation
or an existing voltage or current sensor simulation,
and then click the Details button next to the combo box.
Normally only one combo box is displayed, but if the check box Multiple
Amplifiers / Low Level Outputs is selected, another combo box is displayed
which allows the creation of a second sensor simulation. Leave this option
inactive if you are not using more than one sensor simulation.
The Linear Voltage/Current Sensor Simulation Details dialog box is opened
where you can enter or change your simulation data.
Figure 4-18:
Linear Voltage Sensor
Simulation Details
dialog box
Click OK to apply and store your simulation data. Your simulation is then added
to the combo box selection list in the Amplifier(s) / Low Level Outputs /
Sensor Simulation group box. The list entry consists of the sensor type
followed by a running number and the serial number of the CMC test set (for
example, "Linear Voltage Sensor 1 (AG150A)"). If you want to delete an existing
stored simulation from the combo box selection list, click Delete.
topic General tab > Voltage and Current Sensor Simulations > Configuring
a Linear Voltage or Current Sensor.
73
4.7.6
Rogowski Current Sensor Configuration

Configuring a Rogowski current sensor is only possible in combination with an
OMICRON test set CMC 850/CMC 356/CMC 353/CMC 256plus/CMC 256.
Simulation group box in the General tab select
"Create Rogowski Current Sensor" to create a new simulation
or an existing Rogowski current sensor simulation,
Normally only one combo box is displayed, but if the check box Multiple
Amplifiers / Low Level Outputs is selected, another combo box is displayed
which allows the creation of a second Rogowski current sensor simulation.
Leave this option cleared if you are not using more than one sensor simulation.
The Rogowski Current Sensor Simulation Details dialog box is opened
where you can enter or change your simulation data.
Figure 4-19:
Rogowski Current
Sensor Simulation
Details dialog box
Click OK to apply and store your simulation data. Your simulation is then added
to the combo box selection list in the Amplifier(s) / Low Level Outputs /
Sensor Simulation group box. The list entry consists of the name "Rogowski
Current Sensor" followed by a consecutive number and the serial number of the
test set (for example, "Rogowski Current Sensor 1 (AG150A)"). To delete an
existing stored simulation from the combo box selection list, click Delete.
topic General tab > Voltage and Current Sensor Simulations > Configuring
a Rogowski Current Sensor.
74
4.7.7
Low Level Outputs Configuration

In the Amplifier(s) / Low Level Outputs / Sensor Simulation group box in the
General tab you can (among other things) select existing (stored) or specify new
low level output systems of your CMC for using the external outputs directly as
low level outputs.
Simulation group box in the General tab, select
the entry "Create Standard Low Level Outputs" to create a new low level
output system
or an existing low level output system,
Normally only one combo box is displayed. But if the check box Multiple
Amplifiers / Low Level Outputs is selected, a combo box is displayed that
allows the creation of a second low level output system. Leave this option clear
if you are not using more than one low level output system.
The Amplifier Details dialog box is opened where you can select the low level
output system from the Output System combo box.
Figure 4-20:
Amplifier Details
dialog box for
configuration of low
level outputs
Click OK to apply and store your low level output system data. Your low level
output system is then added to the combo box selection list in the
Amplifier(s) / Low Level Outputs / Sensor Simulation group box. The list
entry consists of the name "Standard Low Level Outputs" followed by a running
number and the serial number of the CMC test set (for example, "Standard Low
Level Outputs 1 (AG150A)"). To delete an existing stored low level output
system from the combo box selection list, click Delete.
75
topic General tab > Creating Low Level Output Systems.
4.7.8
Analog Outputs Tab

On the Analog Outputs tab specify the usage of the analog outputs. The
available outputs displayed in the Analog Outputs tab depend on the test
hardware definition in the General tab.
The CMB IO-7 does not have analog outputs. Therefore, this tab is empty if the
only test set selected in the General tab is a CMB IO-7.
Figure 4-21:
Analog Outputs tab of
a test module running in
stand-alone mode
1
The columns and areas of the Analog Outputs tab shown in Figure 4-21 are
explained below:
(1)

displayed (test set type, voltage or current output, offline or online state,
connector).
76
(2)
object connectors. This information increases the usefulness of the
(3)
The "Display Name" is the designation of the connection between the test
hardware connectors and the test object terminals.
(4)
The "Test Module Output Signal" column is not available in the global
Hardware Configuration. In the "Test Module Output Signal" column the
output signal of the test module is assigned to the test object terminal
specified in this line. The selection menu only allows signals that an
individual test module knows about and that are appropriate for the wired
connector.
Mirrored Currents
What's a mirrored current?
A mirrored current is a current that is identical to a reference current in
waveform, phase and frequency, but with negated amplitude.
Why mirrored currents?
Example: For testing a particular function of a multi-functional relay with an
integrated differential protection feature without making this differential
protection feature trip. The first current triple (IL 1 IL3) represents the current
fed into the differential protection relay, the second current triple (-IL1 -IL3,
negated amplitude) represents the current leaving the differential protection
relay.
If on the Output Configuration Details dialog box the current triple IL1 IL3
is defined, the mirrored currents (-IL1 -IL3) are created automatically. If -IL1
is routed, its amplitude automatically gets the negated value of the amplitude of
IL1 while the other signal parameters (waveform, phase and frequency) are
copied from IL1.
The vector diagram of the respective test module displays the mirrored currents.
Mirrored currents are available for most test modules, however, QuickCMC,
VI Starting, Ground Fault, NetSim, Synchronizer, Adv. TransPlay, Differential
and Adv. Differential do not provide this feature.
--- Hardware Configuration --- entry in the table of contents and navigate to
Analog Outputs Tab.
For general information about working with the wiring tables chapter 4.7.1 on
page 60.
77
4.7.9
Binary / Analog Inputs Tab

On the Binary / Analog Inputs tab specify the usage of the binary and analog
inputs. In this tab all available inputs are displayed according to the test
hardware definition in the General tab.
The binary inputs of a CMB IO-7 can only be configured in the global Hardware
Configuration and in the Hardware Configuration of test modules which are
able to support CMB IO-7.
Figure 4-22:
Binary / Analog Inputs
tab of a test module
running in stand-alone
mode
The columns and areas of the Binary / Analog Inputs tab shown in Figure 4-22
are explained below:
(1)
Navigation Bar
If a CMB IO-7 and a CMC test set or only a CMB IO-7 with more than one
input module is selected in the General tab, a navigation bar is displayed
on the left side of the page to ease the handling of the potentially high
number of inputs. The navigation bar contains one entry for the CMC
inputs and one entry for each input module of the CMB IO-7. Clicking an
entry in the navigation bar causes the table to be scrolled horizontally and
vertically to display the inputs and the corresponding wiring matrix area in
the visible part of the dialog.
(2)

displayed (test set type, offline or online state, input configuration,
connector). The cells for the input configuration are arranged in 4 or 5
lines as follows (exception: older CMC 56 where only positive or negative
biasing can be selected):
78
"Function"
For a CMC 256/CMC 256plus/CMC 356 with EnerLyzer option, for
example, the binary inputs can have analog inputs mapped to them.
Thus, their function can be switched between analog voltage inputs,
analog current inputs, binary inputs, and counter inputs. All other CMC
test sets only allow switching between binary and counter inputs.
CMB IO-7 only has binary inputs; no switching is possible.
"Potential Free"
Specify whether potential-sensing or dry contacts are connected to the
binary or counter inputs. If the check box is selected, the input is
potential free (dry contact). Only relevant if the "Function" is set to
Binary or Counter.
"Nominal Range"
Nominal voltage of potential-sensing binary or counter inputs, or the
nominal range of analog voltage inputs or analog current inputs (taking
the Clamp Ratio into account).
"Clamp Ratio" (CMC 356/CMC 353/CMC 256plus/CMC 256 only)

For current inputs, the clamp ratio can be set from 1 V/A to 1000 V/A,
or a typical value can be selected from the context-menu (right-click).
The context-menu also allows setting the clamp ratios of all current
inputs to the same value. Only relevant if the "Function" is set to
Current.
"Threshold"
Threshold voltage for potential-sensing binary or counter inputs.
Specify the operating threshold for binary or counter inputs with
potential-sensing contacts connected. Only relevant if the "Potential
Free" check box is not selected. Setting the same threshold for all
inputs with this mode of operation can be accomplished by rightclicking and selecting the appropriate item from the context-menu.
If the nominal voltage (Nominal Range) is changed, the threshold
value is set to 0.7 x nominal voltage by default.
The inputs can have a hysteresis. For detailed information refer to the
appropriate hardware manual.
(3)
79
(4)
(5)
The "Test Module Input Signal" column is not available in the global
Hardware Configuration. In the "Test Module Input Signal" column the
input signal of the test module is assigned to the test object terminal
connector.
Binary / Analog Inputs Tab.
page 60.
80
4.7.10
Binary Outputs Tab

On the Binary Outputs tab specify the usage of the binary outputs. In this tab
all available outputs are displayed according to the test hardware definition in
the General tab.
The binary outputs of a CMB IO-7 can only be configured in the global
Hardware Configuration and in the Hardware Configuration of test modules
which are able to support CMB IO-7.
Figure 4-23:
Binary Outputs tab of a
test module running in
stand-alone mode
The columns and areas of the Binary Outputs tab shown in Figure 4-23 are
explained below:
(1)
Navigation Bar
If a CMB IO-7 and a CMC test set or only a CMB IO-7 with more than one
output module is selected in the General tab, a navigation bar is
displayed on the left side of the page to ease the handling of the
potentially high number of outputs. The navigation bar contains one entry
for the internal outputs of the CMC test set and one entry for each output
module of the CMB IO-7. Clicking an entry in the navigation bar causes
the table to be scrolled horizontally and vertically to display the outputs
and the corresponding wiring matrix area in the visible part of the dialog.
(2)

displayed (test set type, offline or online state, relay or transistor output (if
applicable), connector).
(3)
(4)
81
(5)
The "Test Module Output Signal" column is not available in the global
Hardware Configuration. In the "Test Module Output Signal" column the
output signal of the test module is assigned to the test object terminal
connector.
Binary Outputs Tab.
page 60.
82
4.7.11
DC Analog Inputs Tab

On the DC Analog Inputs tab specify the usage of the analog inputs.
The CMB IO-7 does not have analog inputs. Due to this, the DC Analog Inputs
tab is empty if the only test set selected in the General tab is a CMB IO-7.
Figure 4-24:
DC Analog Inputs tab
of a test module running
in stand-alone mode
The columns and areas of the DC Analog Inputs tab shown in Figure 4-24 are
explained below:
(1)

displayed (type, offline or online state, input ranges, connector). For a
CMC 356/CMC 353/CMC 256plus/CMC 256, the input range of the
current input can be selected: 20 mA or 1 mA.
(2)
(3)
(4)
The "Test Module Input Signal" column is not available in the global
Hardware Configuration. In the "Test Module Input Signal" column the
input signal of the test module is assigned to the test object terminal
connector.
83
4.7.12
Time Source
At Time Source, configure the trigger and synchronization setup and, in case
the CMC test set works as an IRIG-B generator, specify the time code
parameters.
The available time sources are GPS1, PTPv22, or IRIG-B3.
When doing end-to-end testing, make sure to use the same synchronization
mode, that is, either GPS, or PTP, or IRIG-B for all involved CMC 850/CMC 356/
CMC 353/CMC 256plus/CMC 256 test sets.
First select the time source of your choice from the upper left list of available
configurations. Depending on your selection, the illustration below the list
reflects the typical setup of the hardware components.
If you see this symbol
next to a time source configuration, this particular
configuration will not work with the connected hardware. Why does that happen?
The specific settings are saved with the test document of the respective test
module. Once this test document is re-opened, but this time with a different
hardware connected - a hardware that does not support the time source
configuration -, this symbol notifies you about this discrepancy.
<not used>
None of the available time sources is used for synchronization. On the test
module's Trigger tab, select a binary trigger condition or a user interaction, or
none.
Trigger via GPS using a CMGPS

A CMGPS synchronization unit is
connected to the test sets external
Interface input (a connector at the rear
side). The trigger is generated from the
CMGPS output pulses.
The Time Source tab requires no settings.
To set the test start time and the trigger
period, click Time Trigger on the Home
tab. Then click the Modify... button to open the Modify Pulse Data window.
1. GPS = Global Positioning System
2. PTPv2 = Precision Time Protocol, a protocol used to synchronize clocks throughout a computer
network.
3. IRIG = Inter Range Instrumentation Group. The IRIG standardized the different time code
formats.
84
Trigger via GPS using a CMGPS 588

A CMGPS 588 synchronization unit is
connected to one of the Power over Ethernet
ports ETH1 or ETH2 at the CMC test set's rear
side. The CMC test set synchronizes its
internal clock to the CMGPS 588, and
generates trigger signals based on this
internal clock.
The CMGPS 588 synchronization unit can be
used as a PTP grandmaster clock according to the IEEE 1588-2008 standard.
More information can be found in the CMGPS 588 manual.
PTP Settings
VLAN priority: The Power Profile requires an IEEE 802.1Q VLAN tag. This value
(0 ... 7) represents the PCP (Priority Code Point) field (3 bits) within the TCI (Tag
Control Identifier). See IEEE C37.238-2011, clause 5.6.
In addition to VLAN priority, the test report also provides profile, domain and
VLAN ID information. Since these PTP settings are preset and cannot be
changed by you, they are not visible here.
To set the test start time and the trigger period, click Time Trigger on the Home
The usage of a CMGPS 588 requires a CMC test set with an installed NET-1B
board. CMC 850 and CMC 353 have such a NET-1B board by default;
CMC 356, CMC 256plus and CMC 256-6 can be upgraded.
To learn more about the NET-1B board, view the relevant CMC test set manual.
Trigger via PTPv2

Connect a suitable PTPv2 time source to
one of the Power over Ethernet ports
ETH1 or ETH2 at the CMC test set's rear
side. The trigger is generated from this
time sources output pulses.
The CMC test set synchronizes its internal
clock to the PTPv2 time source, and
generates trigger signals based on this
internal clock.
85
PTP Settings
Profile:
Test Universe currently supports the Power Profile according to
IEEE C37.238-2011, only. Therefore this field is currently a read-only
information field, only.
Domain:
All PTP devices that should synchronize to each other must use the same
domain number.
VLAN ID:
The Power Profile requires an IEEE 802.1Q VLAN tag. This value (0 ... 4095)
represents the VID (VLAN Identifier) field (12 bits) within the TCI (Tag Control
Identifier). See "VlanId" in IEEE C37.238-2011.
VLAN priority:
The Power Profile requires an IEEE 802.1Q VLAN tag. This value (0 ... 7)
represents the PCP (Priority Code Point) field (3 bits) within the TCI (Tag
Control Identifier). See IEEE C37.238-2011, clause 5.6.
The usage of PTP requires a CMC test set with an installed NET-1B board.
CMC 850 and CMC 353 have such a NET-1B board by default; CMC 356,
CMC 256plus and CMC 256-6 can be upgraded.
Trigger via IRIG-B using a CMIRIG-B

The CMC test set works as IRIG-B receiver. An
IRIG-B generator (a third party product; for
example, a satellite synchronizing clock) is
connected to the CMC test sets' external
Interface input via a CMIRIG-B. The IRIG-B
generator is connected to IRIG-B/PPS IN, the
test object to PPX OUT, the CMC test set to
CMC.
The trigger is generated from the received IRIG-B time reference. The PPX OUT
pulse sequence is in synchronization with the CMIRIG-B input on IRIG-B/
PPS IN.
For the Only test if synchronized to ext. time base option page 91.
86
You can find basic information about the IRIG time codes standard in the
according Test Universe Help topic. Launch the Help from the Test Universe
start screen or the test module you are currently working with, click the
--- Synchronizing CMC Test Sets --- entry in the table of contents, and
navigate to the Using the IRIG-B Time Reference to Synchronize CMC Test
Sets > Basic Information about the IRIG Time Codes Standard.
For a comprehensive covering of IRIG-B and its parameterization, refer to the
IRIG standard revision 200-04.
To learn more about the CMIRIG-B, view the CMIRIG-B manual.
IRIG-B Generator Master using a CMIRIG-B

The CMC test set works as IRIG-B generator
and provides its generated time reference to
the CMIRIG-B, CMC input. At the CMIRIG-B
output IRIG-B OUT the time reference is
available for the test object (for example, a
phasor measurement unit).
The pulse sequence at PPX OUT (fixed to
1 pulse per second) is in synchronization with
CMC's internal time base.
Operating the CMC test set as IRIG-B generator enables the IRIG-B parameters
section at the right.
navigate to the Using the IRIG-B Time Reference to Synchronize CMC Test
Sets > Basic Information about the IRIG Time Codes Standard.
For a comprehensive covering of IRIG-B and its parameterization, refer to the
IRIG standard revision 200-04.
To learn more about the CMIRIG-B, view the CMIRIG-B manual.
87
IRIG-B Generator following PPS using a CMIRIG-B

The CMC test set works as IRIG-B generator
following an external pulse sequence (1 pulse
per second) fed into the IRIG-B/PPS IN input.
The CMC provides its generated time reference
to the CMIRIG-B input CMC. At the CMIRIG-B
output IRIG-B OUT, the time reference is
available for the test object.
The pulse sequence at PPX OUT (fixed to
1 pulse per second) is in synchronization with the external pulse sequence.
The absolute start time for the IRIG-B output is generated from the IRIG-B
Source Settings shown at the right of the picture. The CMC triggers on PPX
sequence.
For the Only test if synchronized to ext. time base option page 91.
IRIG-B Generator following GPS using a CMIRIG-B and a

CMGPS
The CMC test set works as IRIG-B
generator following a 1 pps pulse
sequence from a CMGPS synchronization
unit fed into the CMGPS input. The CMC
provides its generated time reference to
the CMIRIG-B input CMC. At the
CMIRIG-B output IRIG-B OUT, the time
reference is available for the test object.
The pulse sequence at PPX OUT (fixed to 1 pulse per second) is in
synchronization with the 1 pps pulse sequence from the CMGPS unit.
The absolute start time for CMIRIG-B output is generated from the IRIG-B
Source Settings shown at the right of the picture. The CMC triggers on PPX
sequence.
If you use the CMIRIG-B in combination with the CMGPS synchronization unit,
make sure to connect the 100 - 240 VAC/18 VDC power supply unit to the
CMGPS. Else, Test Universe cannot detect the CMGPS.
88
IRIG-B Generator following GPS using a CMIRIG-B and a

CMGPS 588
sequence from a CMGPS 588
synchronization unit fed into the test set's
ETH1 or ETH2 Ethernet port. The CMC
provides its generated time reference to
the CMIRIG-B input CMC. At the
CMIRIG-B output IRIG-B OUT, the time
reference is available for the test object.
IRIG-B and its parameterization is comprehensively covered in IRIG standard
revision 200-04. For the PTP settings, refer to the Trigger via PTPv2 option
above.
PTP requires a CMC test set with an installed NET-1B board. CMC 850 and
CMC 353 have such a NET-1B board by default; CMC 356, CMC 256plus and
CMC 256-6 can be upgraded.
IRIG-B Generator following PTPv2 using a CMIRIG-B

sequence from a PTPv2 time source fed
into the test set's ETH1 or ETH2 Ethernet
port. The CMC provides its generated
time reference to the CMIRIG-B input
CMC. At the CMIRIG-B output IRIG-B
OUT, the time reference is available for
the test object.
IRIG-B and its parameterization is comprehensively covered in IRIG standard
revision 200-04. For the PTP settings, refer to the Trigger via PTPv2 option
above.
PTP requires a CMC test set with an installed NET-1B board. CMC 850 and
CMC 353 have such a NET-1B board by default; CMC 356, CMC 256plus and
CMC 256-6 can be upgraded.
89
Time-stamping via NTP using the NTP Client in CMC

The Network Time Protocol (NTP; a
networking protocol for clock
synchronization between computer
systems over data networks) is a client/
server application. Each workstation,
router, server, or CMC test set connected
to the computer network must be
equipped with an NTP client software in
order to synchronize its clock to the network time server. The CMC test set
works as NTP Client. That means, the CMC receives its time source from the
network time server.
In most cases the NTP client software is already resident in the operating
system of each individual device of the computer network. For a CMC test set,
the client software is the CMC firmware.
Note that NTP Client does not provide the trigger functionality to start a
synchronized operation of two or more CMC test sets.
Unicast client
Unicast Client is the default setting. Unicast transmission, still the
predominant form of transmission on LANs and within the Internet, denotes
a communication from one point to another point on the computer network.
In this case there is one sender, the network time Server (IP address or
domain name), and one receiver, the CMC test set. The Refresh rate
determines the intervals for the time information to be polled from the network
time server
Broadcast client
Broadcast transmission denotes a communication from one point to all other
points on the computer network. In this case there is one sender (the network
time server), and its information is sent to all connected receivers (clients).
Multicast client
Multicast transmission denotes a communication where information is sent
from one or more points to a set of other points. In this case there may be
one or more senders, and the information is distributed to a set of receivers
(there may be any number of receivers, or no receivers at all)
IP multicast transmission provides a dynamic many-to-many connectivity to
simultaneously deliver data packets between a set of senders (at least 1) to
a group of clients.
Unlike broadcast transmission, which is mainly used on LANs, multicast
clients receive a stream of packets only if they have previously elect to do so
by joining the specific multicast group Address.
90
Membership of a group is dynamic and controlled by the receivers, in turn

informed by the local client applications. The routers in a multicast network
learn which sub-networks have active clients for each multicast group and
attempt to minimize the transmission of packets across those parts of the
network that have no active clients.
NTP requires a CMC test set with either an installed NET-1 or NET-1B board.
CMC 356, CMC 256plus and CMC 256-6 with NET-1 option have a NET-1
board, CMC 850 and CMC 353 a NET-1B board by default. A standard
CMC 256-6 (Host Interf. board with parallel port) or a CMC 256plus with PAR-1
option do not support NTP.
To learn more about the NET-1(B) board, view the relevant CMC test set
manual.
The "Only test if synchronized to ext. time base" option

This option applies to the PermaSync TM functionality ( Synchronizing to an
External Time Base - GPS, PTP, IRIG-B, PermaSync in section 6.1 on
page 133) and is available for the configurations Trigger via IRIG-B using a
CMIRIG-B, IRIG-B Generator following PPS using a CMIRIG-B, and IRIG-B
Generator following GPS using a CMIRIG-B and a CMGPS; in other words:
for configurations that use an external time reference to synchronize the CMC
test set's internal time base. Accordingly, it requires a CMC 256 test set with the
NET-1 option, a CMC 256plus test set in standard version with Ethernet ports
(not with PAR-1 option), a CMC 353, a CMC 356 or a CMC 850 test set.
The PermaSyncTM functionality keeps the output sample clock of the CMC in
permanent synchronism to an external time source, avoiding any phasor drift
between CMC units operating in parallel (for example, decentralized PMU
testing).
In addition, enabling the Only test if synchronized to ext. time base option
requires a test module-specific so-called "Local Hardware Configuration". In a
"Global Hardware Configuration, that is, in a Hardware Configuration whose
specified parameters apply to all subsequent test modules throughout a Control
Center document, this option is not available.
More information about the distinction between "Global" and "Local" Hardware
Configurations can be found at chapter 4.1.1 "What is the Hardware
Configuration" on page 42 and the subsequent chapters.
Select the option Only test if synchronized to ext. time base to only start
the test if the CMC test set is able to synchronize to the external IRIG-B time
reference. If the CMC test set cannot synchronize, the test will not start.
Clear this option to start the test at any rate. If the CMC test set should not
be able to synchronize to the external IRIG-B time reference, the test will start
with the CMC's internal time base as reference, bypassing the external PPS.
91
What prevents a CMC test set from synchronizing to an external PPS?

Naturally, a synchronization of a CMC test set is only meaningful when the
synchronization source, that is, the external time base, is highly accurate. The
Test Universe software (or more precisely: the CMEngine component) verifies
this accuracy, and if the external time base exceeds an offset of 10 ppm or a
jitter of 2 ppm, the signal is assessed as inadequate. The CMC test set will then
stay "not externally synchronized", and with the option Only test if
synchronized to ext. time base selected, the test will not start.
The test module's status bar holds an icon that shows whether or not the CMC
is synchronized to the external time time base (
= CMC synchronized to
external time base;
= CMC not synchronized to external time base).
Position the mouse cursor over this icon for about a second; the tooltip displays
the average offset and the maximum jitter in ppm.
In addition, both the quality assessment and the synchronization status (CMC
synchronized/not synchronized) are written to the CMEngine log file - a file with
the extension .log with a user-created name and path.
Furthermore, once a test was executed, its test report will hold an entry showing
whether or not the test was executed synchronized to external time base,
regardless of the actual setting of the Test only if synchronized to external
time base option.
The first-time evaluation of the PPS signal, in the event that the CMC test set is
not yet synchronized, may take up to 11 seconds. With one of the above listed
configurations selected, this evaluation phase starts the moment the Hardware
Configuration is closed by clicking the OK button.
When CMC test sets are connected via Ethernet and controlled by so-called
"Sampled Values" data streams, also those data streams can be synchronized.
However, certain limitations apply.
Read more about these limitations in the Hardware Configuration Help.
Launch the Help, click the --- Hardware Configuration --- entry in the table of
contents and navigate to Time Source Tab > Synchronization when using
Sampled Values.
Telegram format
The "Telegram format" field shows the time code format configuration that the
CMC test set will generate based on your selections at "Modulation" and "Coded
Expressions". Test Universe supports the IRIG-B telegram formats B00x and
B20x, at which B indicates the format type (B = IRIG-B); digit two the modulation
technique (see below); digit three the counts included in the message
(frequency/resolution) and digit four (x) the coded expressions.
92
Time code format B has a time frame of 1 second with an index count of
10 milliseconds (100 pps) and contains time-of-year and year information in a
BCD format, and seconds-of-day in SBS (straight binary seconds); coded
expressions below.
In case of the CMC-generated IRIG-B time code format, digit three of the
telegram format always remains 0, which deciphers as "no carrier/index count
interval".
More information can be found in the IRIG SERIAL TIME CODE FORMATS
publication at the url https://wsmrc2vger.wsmr.army.mil/rcc/manuals/
200-04/index.html.
Modulation
Modulation technique, digit 2 of telegram format:
PWM / DC level shift; telegram format B00x (pulse width modulation)
Manchester II = modified Manchester modulation; telegram format B20x.
Coded Expressions
Digit 4 of telegram format:
0
BCDTOY, CF, SBS
BCDTOY, CF
BCDTOY
BCDTOY, SBS
BCDTOY, BCDYEAR, CF, SBS
BCDTOY, BCDYEAR, CF
BCDTOY, BCDYEAR
BCDTOY, BCDYEAR, SBS
The settings here (single or in combination) define the 74-bit time code that
contains 30 bits of BCD time-of-year information in days, hours, minutes and
seconds, 17 bits of SB seconds-of-day, 9 bits for year information and 18 bits for
control functions (coded expressions).
Control Functions: All time code formats reserve a set of bits known as control
functions (CF) for the encoding of various control, identification, and other
special purpose functions. The control bits may be programmed in any
predetermined coding system. For Format B, 18 control functions (control bits)
are available. Control functions are presently intended for internal range use, but
not for interrange applications; therefore, no standard coding system exists.
93
The inclusion of control functions into a time code format as well as the coding
system employed is an individual user-defined option. OMICRON supports
control functions that comply with the standard IEEE C37.118.
Example:
A telegram format designated as B006 is deciphered as follows: Format B, pulse
width modulated, no carrier/index count interval, coded expressions BCDTOY,
BCDYEAR.
IRIG-B Time Code Output

For the IRIG-B Generator modes, selecting or clearing the option Set date and
time at test start either in the Hardware Configuration of stand-alone
modules, or in the local Hardware Configuration of modules embedded in a
Control Center document, distinguishes two cases:
1. If Set date and time at test start is cleared, and the CMC test set does not
receive an absolute time information from an external time source (that is, it
is the time master, or only receives a 1 pps synchronization pulse as
reference), the start date and time is 2000-01-01 00:00:00h. If the CMC test
set receives an absolute time information (that is, from PTP or from a
CMGPS 588), this time will be used for the IRIG-B output. The CMC starts
the IRIG-B time code format output as soon as you click OK, or as soon as
you click Cancel if Apply had been clicked before.
2. If Set date and time at test start is selected, the IRIG-B output will start with
(or will be reset to) the date and time as specified at IRIG-B Source Settings
(see below) at the moment the test module starts the test execution.
IRIG-B Source Settings

The IRIG-B Source Settings are only relevant in case the CMC test set is set
up as IRIG-B generator, and it does not receive an absolute time information
from an external time source; that is, it is the time master, or it only receives a 1
pps sync pulse as reference, and only if Set date and time at test start is
selected (see above).
At "UTC Date" and "UTC Time" set the absolute start time for the CMCgenerated IRIG-B time code format.
Once you have set a date and a time of your choice, click OK or Apply. The
CMC test set starts the IRIG-B time code format output with that date/time as
soon as you click OK, or as soon as you click Cancel if Apply had been clicked
before.
94
Set date and time at test start

If you select Set date and time at test start, the IRIG-B generator (the CMC
test set) is set to the time specified at "UTC Date" and "UTC Time" the moment
you start a test in the respective test module. This applies to each individual start
of a stand-alone test or of a test module embedded in a Control Center test
document with this option selected in its local Hardware Configuration;
therefore, you won't get a continuous time reference.
Without this option the IRIG-B time reference remains unchanged when you
start a test; that is, the time reference continues normally.
95
4.8 CMB IO-7 Hardware Option

To change the configuration of a CMB IO-7 test set which is selected/displayed
in one of the combo boxes of the Test Set(s) group box in the General tab, click
the Details button next to the combo box.
The CMB Configuration Details dialog box is opened. In this dialog box the
configuration of the CMB IO-7 test set is represented in graphical form by
showing the CMB rear side with the module connectors of the mounted IO
modules.
To set the AUX DC voltage, use AUX DC Configuration from the Configuration
Modules section of the Test Universe start screen.
Figure 4-25:
CMB Configuration
Details dialog box in
offline mode
The behavior of the CMB Configuration Details dialog box in online mode
differs from the behavior in offline mode. This is explained in the following
chapters 4.8.1 and 4.8.2.
96
4.8.1
Behavior in Online Mode

In online mode, that is, if the CMB IO-7 is connected to the PC and switched on,
the dialog box shows the actual configuration of the connected test set.
Figure 4-25:
(1)
The Module Type combo boxes display the types of the equipped IO
modules. The combo boxes of empty plug-in slots are empty and
disabled. The combo boxes of equipped plug-in slots contain only the
designation of the module actually mounted in this slot. No other module
type can be selected from the combo boxes.
(2)
The Rear View area in the middle of the dialog box shows which plug-in
slots are equipped with IO modules.
(3)
The Module In Use check boxes are checked for all equipped modules.
This means that the inputs or outputs of all equipped IO modules are
available and displayed in the Binary / Analog Inputs or Binary Outputs
tabs. To reduce the number of available inputs and/or outputs each
physically available module can be disabled by unchecking the
corresponding Module In Use check box.
Click OK to apply the selected configuration.
4.8.2
Behavior in Offline Mode

In offline mode, the configuration of the CMB IO-7 test set which was connected
for the very first time is displayed by default. In offline mode any combination of
supported IO modules can be defined.
Input modules must be equipped in an ascending order beginning from slot 1 (1,
2, ...), output modules must be equipped in a descending order beginning from
slot 7 (7, 6, ...).
Figure 4-25:
(1)
In the Module Type combo box of the corresponding plug-in slot, select
the wanted module type or the entry "Empty".
(2)
The Rear View area in the middle of the dialog box shows which plug-in
slots are equipped with IO modules.
(3)
Using the Module In Use check boxes you can enable or disable the
inputs or outputs of individual "equipped" IO modules. If the Module In
Use check box of an IO module is unchecked, the inputs or outputs of this
module are not displayed in the Binary / Analog Inputs or Binary
Outputs tabs.
Click OK to apply the selected configuration.
97
98
The OMICRON Control Center
5 The OMICRON Control Center

The OMICRON Control Center simultaneously works as a test manager, word
processor and script editor. The Control Center is the starting point for every test
document and extends the usefulness of every test module.
5.1 Test Modules in a Test Document

A test module focuses on an area of protection or measurement device testing.
It can be embedded in a test document or run stand-alone. Double-clicking a test
module that is embedded in a test document starts up that test module's
software application.
Figure 5-1:
Center test document
containing multiple Test
Objects ( chapter
5.1.4), Hardware
Configurations and
test modules
TestDocument.occ
Test Object 1
Global Hardware
Configuration
1
Test module
1
Test module
2
Global Hardware
Configuration
2
Test module
3
Test Object 2
Test module
4
Figure 5-1 depicts an OMICRON Control Center test document (.occ document).
It shows how a single definition for a Test Object (a "global Test Object"
chapter 3.2 on page 22) can be used by multiple modules. Likewise, a global
definition for the Hardware Configuration can be used by multiple test modules
while still maintaining the ability to tweak the hardware definition locally.
99
Specific test settings are made through the individual applications interface. The
test process can be initiated either from the module or from the OMICRON
Control Center. The actions that a test module takes after assessing the pass/
fail results of the test can be defined.
5.1.1
Multiple Test Modules in a Single Test Document

When creating comprehensive overall tests, test modules can be embedded
multiple times in a Control Center test document for each type of test to be
performed.
Each time a test module is embedded, its properties can be specified so that
different aspects and functions of the test object can be tested.
Embedding the same test module repeatedly into one Control Center test
document can be useful for testing, say, all fault loops for a test object with
similar (but not necessarily identical) settings.
5.1.2
Inserting a Group into a Control Center Document

In Control Center, "grouping" means putting together objects to a "logical group".
You would most likely group consecutive test modules that, for example, have
similar tasks within a test procedure or tasks that complement one another. A
group, however, may also contain another Test Object or Hardware
Configuration.
One mouse click enables/disables the entire group with all objects in it. Just as
single objects can be added to a group by dragging/dropping them, entire
groups can be dragged and dropped, too.
100
A group of consecutive test modules:

Figure 5-2:
A group (Group 1)
holding 3 consecutive
test modules (test
modules 3 to 5)
TestDocument.occ
Test Object
Hardware
Configuration
Test module
1
Test module
2
Group 1
Test module
3
Test module
4
Test module
5
Test module
6
To name/rename a group, right-click the group in the Navigation Pane, Report

View or List View. On the context menu, click Properties.
Just as to single objects, context menu commands like cut/copy/paste can be
applied to groups, too.
How to create a group

Click Group on the Insert tab. This inserts a new group at the current cursor
position. If the current cursor position should already be inside a group, a nested
group (a sub-group within this group) is created.
101
Nested groups:
Figure 5-3:
Nested groups
TestDocument.occ
Test Object
Hardware
Configuration
Test module
1
Test module
2
Group 1
Test module
3
Group 1-1
Test module
4
Test module
5
Test module
6
Test module
7
Test module
8
Rename a group like any other object in a Control Center test document: In the
Navigation Pane or the List View, right-click the group's name, then click
Properties on the context-menu. To add objects to a group, use either the drag
and drop method, or the cut/copy/paste commands on the context-menu or the
Insert tab. This works in the Navigation Pane, the List View and the Report
View. In Report View, beginning and end of a group is indicated by a dotted line
containing the name of the group at the beginning and the end.
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Active/inactive objects
An object within a group can be set active or inactive by selecting or clearing the
check box next to it. The same can be applied to an entire group by using its
check box.
Items set "inactive" in the List View are suppressed from print-out by default. If
an entire group is set "inactive", also text written in it is suppressed from printout. To change that suppression of inactive items, click the Test Options
command on the Home tab, and select the Print inactive modules option on
the Overall Test tab.
Selection of multiple objects

The context menus available in List View and Navigation Pane provide
commands like cut/copy/paste/delete etc. that can be applied to all selected
objects within a group. To select more than one object at a time, hold the <Shift>
key down and either successively click the objects of your choice or select a
range by using the cursor up/down ( / ) keys.
Additional Test Objects or Hardware Configurations in groups

The majority of test documents contain exactly one Test Object and one
Hardware Configuration, and their settings and parameters apply globally to
all test modules embedded in the test document. The use of additional Test
Objects and/or Hardware Configurations in groups requires some caution and
awareness.
The assignment of Test Object and Hardware Configuration to test modules
is quite logical and straight-forward, as shown in the examples 1 and 2. Example
3 shows an additional Test Object in a group and the resulting configuration
assignment.
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Example 1 - Global Test Object and Hardware Configuration:

Figure 5-4:
Example 1 - Global Test
Object and Hardware
Configuration
TestDocument.occ
Test Object
Hardware
Configuration
Test module
1
The first objects in the test document are Test Object

and Hardware Configuration. There are no more
consecutive Test Objects and Hardware
Configurations, that is, the first two serve as global
configuration objects for all test modules, including the
ones of "Group 1".
Test module
2
Group 1
Test module
3
Test module
4
Test module
5
Test module
6
Example 2 - Global Hardware Configuration with different Test Objects:

Figure 5-5:
Example 2 - Global
Hardware
Configuration with
different Test Object
TestDocument.occ
Test Object 1
Test Object 1 serves as configuration

object for consecutive test modules 1 and 2.
Then a new Test Object follows - Test
Object 2.
Test Object 2 now serves as local

configuration object for test modules 3, 4
and 5.
There is only one Hardware Configuration

in this test document, therefore it serves as
global Hardware Configuration object for
all test modules.
Hardware
Configuration
Test module
1
Test module
2
Test Object 2
Test module
3
Test module
4
Test module
5
104
Example 3 - An additional Test Object in a group:

Figure 5-6:
Example 3 - An
additional Test Object
in a group
TestDocument.occ
Test Object 1 serves as configuration

object for the consecutive test modules 1
and 2. The first test module of Group 1,
test module 3, refers back to its
preceding Test Object, which is still Test
Object 1. The "opening" of a group does
not interrupt the binding to the preceding
Test Object and Hardware
Configuration.
Then a new Test Object follows in

Group 1 - Test Object 2. Test Object 2
interrupts the binding to the preceding
Test Object and now serves as local
configuration object for the following test
module 4.
Test module 5, however, refers back to

Test Object 1 since it is not part of
Group 1.
Test Object
Hardware
Configuration
Test module
1
Test module
2
Group 1
Test module
3
Test Object 2
Test module
4
Test module
5
There is only one Hardware Configuration in this test document, therefore

it serves as global Hardware Configuration for all following test modules 1
to 5.
There may be certain applications where Test Object or Hardware

Configurations nesting like this may come in handy. In general, however, it is
advisable to refrain from adding Test Objects and/or Hardware
Configurations to groups. To avoid confusion, we recommend to confine
yourself to adding test modules to groups.
105
5.1.3
LinkToXRIO for the "Activate" Flag

Not only individual test module values (current, voltage, phase angle, frequency
...) can be linked to local or global Test Object parameters via the LinkToXRIO
function. Also the "activate" flag of a test module or a "group" (set in List View
or in the Navigation Pane of the Report View of the Control Center) can be
linked to a Test Object parameter. That way, the on/off status of test modules,
or groups of test modules, that are embedded into a Control Center document
is controlled directly by a Test Object parameter.
To control the "active" flag via LinkToXRIO, the respective test modules or
groups must be tied to a global Test Object; that is, a Test Object embedded
into the Control Center document. Otherwise, LinkToXRIO is not possible.
Linking the "active" flag is only possible via a parameter of type "Boolean", that
is, a parameter whose value can be "true" or "false".
Link the "activate" flag to a control parameter

1. Open the Control Center document of your choice, or create a new one.
2. Go to Control Center's List View or the Navigation Pane of Report View. In
both views you can either select
or clear
test modules and groups.
3. To link either one, test module or group, to one of the Test Object
parameters, right-click it in List View or Report View, and click LinkToXRIO
on the context menu.
4. The LinkToXRIO dialog box provides all the Boolean parameters that belong
to the associated Test Object. Browse the tree to the parameter of your
choice. Click OK to establish the link. This closes the LinkToXRIO dialog
box. The test module's/group's symbol changes to
if the Boolean
parameter it links to is true ("activated"), or to
if it's false ("not activated").
Important to understand:
In a tree structure of groups and test modules only one item of a branch (a
group or a test module) can be linked at a time, that is, each of these
branches can have either none or a max. of one test module or group that is
linked.
In a hierarchical structure in which a test module is linked, the group that
contains that test module cannot be linked once more; it will be locked. The
reason for that is that it is not possible to enforce two different activation
values on the same branch.
The same applies if the group is linked: the test modules or sub-groups of
that linked group cannot be linked once more; they are locked.
For all locked items of a branch, LinkToXRIO is disabled. This is signaled by
the
symbol (or , respectively).
106
The symbols and their meaning:

Active
Inactive
Partially active, that is, a group which has items that are active and
inactive.
LinkToXRIO to a "Value = true" (activated) control parameter
LinkToXRIO to a "Value = false" (deactivated) control parameter
Active locked, that is, a group with active items or an active test module
locked by a link on the branch.
Inactive locked, that is, a group with inactive items or an inactive test
module locked by a link on the branch.
Partially active locked, that is, a group locked by a link on the branch. The
group holds both active and inactive items.
Active invalid LinkToXRIO
Inactive invalid LinkToXRIO
To change a link, right-click the respective test module or group and click
LinkToXRIO... on the context menu.
To remove the link, click Remove Link on the context menu.
If you position the cursor over an established LinkToXRIO, a tooltip displays the
name of and the path to the parameter. The tooltip differentiates between
absolute and relative mode.
Link errors
Each linked test module or group is tied to a particular global Test Object.
Otherwise LinkToXRIO is not possible.
Moving or copying linked items outside the range of their associated Test
Object into the range of another Test Object will result in an attempt to reestablish the links to the new Test Object. If the parameters to link to are found
in the new Test Object, the link is re-established, and the value will be updated.
If the parameters to link to are not found in the new Test Object, or no
associated Test Object can be found, the links will be invalidated.
The same applies when Test Objects are inserted, moved, copied or deleted. If
possible, the links that belong to that Test Object will be updated in the way
described above. Else, they will be invalidated.
The link error indication, a
symbol (or , respectively), keeps the last active/
inactive status symbol, however, indicates an invalid link by turning red.
107
The same link error indication occurs if, for example, the linked control
parameter is inadvertently deleted from the associated Test Object, or if the
entire Test Object itself is deleted. Both actions result in broken links.
Both the status bar and the Status History window show descriptive error
messages. Furthermore, a tooltip displays an "Invalid link" message with
additional information.
5.1.4
Multiple Test Objects in a Single Test Document

A Control Center test document is not restricted to only one Test Object.
However, with the introduction of XRIO with Test Universe 2.0, inserting multiple
Test Objects into one Control Center document has lost its significance.
Test object parameters are defined only once at a central place of the
Test Universe software, the Test Object, which can contain multiple function
blocks.
For details 3.4 "Test Object Parameters" on page 29 and 3.3 "XRIO" on
page 26.
The functionality for inserting multiple Test Objects into one Control Center
document still exists, however, for reasons of downwards-compatibility only.
5.1.5
Multiple Hardware Configurations in a Single Test

Document
A Control Center test document is not restricted to only one Hardware
Configuration. Whereas a global Hardware Configuration can be used by
multiple test modules, sometimes testing requires that new wiring to the test
hardware or to other test hardware be carried out. Thus, a new Hardware
Configuration is required. It is possible to have the execution of the test
document paused at that point precisely for this purpose.
Figure 5-1 on page 99 shows an example of a test document with more than one
Hardware Configuration. More information about Hardware Configuration
can be found in chapter 4 "Setting Up the Test Hardware" on page 41.
5.1.6
Inserting Fields into a Control Center Document

A field is a variable, a placeholder, for certain information such as today's date,
a name or a path, a time or the number of document pages, and so on. Such a
placeholder can be inserted into the Control Center document; it will later be
updated automatically and filled with contents.
108
Inserting a field:
1. To insert a field at the cursor position in the Control Center document, click
Field on the Insert tab.
2. The Insert Field dialog box lists all available fields. Where multiple formats
exist for a field, for example in case of dates, an additional list presents the
different available formats. Select your preferred format and click OK.
If you select Field Names on the View tab, the actual field name and the
placeholders it contains are displayed, for example, " {Date Created /M/d/yyyy}".
Else, the field's "contents" appears; that is, for example, the document's creation
date, a name or a path, a time or the number of document pages, or a
corresponding entry from the document property's Summary tab. If there is no
entry for that particular field on the Document Properties dialog yet, "n/a" (not
available) is shown.
5.1.7
Inserting Objects into a Control Center Document

In this context, an "object" is a non-OMICRON document created by an
application installed on your computer, such as MS Office, Notepad, an image
editor like Adobe Photoshop, and so on.
The Insert Object box dialog lists all OLE1 object types available on your
computer. You can insert any of these objects into your Control Center
document at the current cursor position.
Select the Create New option, and select an object type of your choice, to insert
that particular object with a blank document.
Select the Create from file option to browse for an existing object-specific file
that has already been created and saved before.
Selecting Create from file provides the Link option. If the embedded object is
linked, your Control Center document will update automatically any time the
linked object is edited and changed outside of the Control Center document with
its according application.
Select Display as Icon if you prefer the object to be displayed by your system's
default icon for this object's application rather than an object's thumbnail.
Double-clicking either the object's icon or the thumbnail will launch the default
application that is used on your computer to open this object type, for example,
.DOCX = MS Word, .TXT = Notepad, .JPG = your default image viewer, .PDF =
your default PDF viewer, and so on.
Right-click any object of your choice to open a object-related context-menu.
1. OLE = Object Linking and Embedding. OLE is a technology developed by Microsoft that allows
embedding and linking to documents and other objects.
109
5.2 Test Reports

Control Center automatically generates a report once a Control Center test
document is executed.
OMICRON provides a test report template that is automatically installed with the
Test Universe software. This template contains two pre-defined test report
forms, a "short form" and a "long form". These two forms differ in the number of
selected blocks and items that will later appear in the final test report.
Control Center generates its test report reflecting the settings of the selected
form. If a form does not suit your requirements, it can be customized. In addition
to that, new forms can be added, unused forms deleted.
Click Report Settings on the Home tab to define the template your test report
will use. Click OK to use the selected form, or Define to view its settings or edit
them.
Working with test reports can be differentiated in three steps:
1. Using a pre-defined test report form ( chapter 5.2.1 on page 111)
2. Customizing a test report form ( chapter 5.2.2 on page 112)
3. Advanced features:
110
Adding or deleting test report forms ( chapter 5.2.3, page 113)
Defining a new test report default ( chapter 5.2.3, page 114)
Reset a test report to default ( chapter 5.2.3, page 114)
5.2.1
Using a Pre-Defined Test Report Form
Figure 5-7:
Using a pre-defined test
report form
Test Module, e.g.

State Sequencer
1
2
Test Report Template
Test Report
(1)
Just like any test module, Control Center has its own test report template.
(2)
Click Set all Reports on the Home tab to specify whether the test report
for all test modules of the Control Center document is to be in "short form"
or in "long form".
Click Report Settings on the Home tab or the Insert tab to specify
whether the test report for the currently selected test module is to be in
"short form" or in "long form".
If there are any user-defined test report forms, it will also be listed.
Click OK.
(3)
The test report is composed and generated according to the settings in

the selected test report form.
111
5.2.2
Customizing a Test Report Form

Any change made to the test report settings can be saved to this test report.
Figure 5-8:
Customizing the
currently open test
report, and saving the
changes
Test Module, e.g.

State Sequencer
1
2
Test Report Template
Test Report
3
+
Just like any test module (in the picture above State Sequencer), Control
Center has its own test report template.
Click Set all Reports on the Home tab to specify whether the test report
for all test modules of the Control Center document is to be in "short form"
or in "long form".
Click Report Settings on the Home tab or the Insert tab to specify
whether the test report for the currently selected test module is to be in
"short form" or in "long form".
If there are any user-defined test report forms, it will also be listed.
Click OK.
112
Click the Define button to open the Define Report Forms dialog box, and
define the composition of the test report.
The check boxes in this dialog box symbolize the available blocks and
items to be included in or excluded from the test report. They are arranged
in a tree structure quite similar to Windows Explorer, and display the
settings of the selected test report form.
Selecting a check box includes the respective block or portion in the test
report form, clearing the check box excludes it.
Note that selecting a block automatically includes all of its
subordinated items (if any). Click the "+" symbol to expand a
collapsed tree structure.
Click OK to save the settings to the test report, and return to the Report
Settings dialog box.
Note that the changes apply to this particular test report only. The feature
of saving changes to a user-specific test report template is found under
Advanced.
5.2.3
The Advanced Features

Clicking the Advanced button expands the dialog box and displays the
additional features, clicking it once more collapses the dialog box again.
Adding test report forms

Rather than using "long form" and "short form" only and overwriting their settings
to suit your needs, new report forms with user-defined names can be created.
Click Add... to open the Add Report Form dialog box.
At Name enter a name of your choice for your new test report form.
In the Copy from combo box select an existing test report form, preferably
one that already meets your requirements best. This form serves as the basis
for your new test report form.
Clicking OK closes this dialog box and creates a new test report template
with the name you specified.
You can now customize the new form according to your specific
requirements by including or excluding items of your choice in the tree
structure to the left.
Click OK to close the Define Reports Forms dialog box and to save the new
test report form with all of its current settings. From now on, this test report
form will be available for selection from the Report Form combo box.
113
Deleting test report forms

To delete test report forms from the list
select the test report form of your choice from the Report Form combo box
click the Delete button.
Note that a minimum of two test report forms is required. The deletion will not
work if you try to delete more forms and would fall short of an amount of two.
Defining a new test report default

Using the "Set as Default" feature defines the current test report forms with all
of their settings to be the default for all future test reports that are created with
this test module, for example, State Sequencer.
Note that the Set as Default button is only enabled if the settings of the currently
open test report forms differ from the default.
Reset to Default
The "Reset to Default" feature discards all changes made to the currently open
test report forms and resets all of its settings to their default.
This reset includes new forms that may have been added, or forms that may
have been deleted since this test report was last loaded.
Note that the Reset to Default button is only enabled if the settings of the
currently open test report forms differ from the default.
Apply New Default to Complete OCC Document

The Apply New Defaults to Complete OCC Document check box comes into
effect when more than one test module of this kind, for example, more than one
State Sequencer, is embedded into a Control Center document
( 5.1.1 "Multiple Test Modules in a Single Test Document" on page 100).
Selecting this option applies the change to the test reports of all embedded
sessions of this particular test module at once, for example, to all test reports of
all embedded State Sequencer sessions within this Control Center document.
Note that this feature is only enabled if
1. the test module is embedded into a Control Center document
2. and a new default was defined (with Set as Default) or an old one restored
(with Reset to Default).
114
5.3 Running Tests from the Control Center

The Control Center controls the tests procedures. This control includes the
configuration of the embedded test modules, and the starting and stopping of
tests.
5.3.1
Selecting Test Modules for the Test

Each test module embedded in a Control Center test document can be
individually selected for or cleared from the participation in an overall test. In the
List View or the Report Views Navigation Pane, select the test modules that
you want to include in the test or clear the ones you dont need.
Figure 5-9:
Selected modules are
part of the test, cleared
ones not
5.3.2
List View
Report Views Navigation Pane
Verifying the Connected Hardware

"Verifying the hardware" means checking whether the connected hardware is
suitable to execute the test of the selected test module and its set parameters.
To verify the hardware configuration for a single test module:
1. Select the test module of your choice either from the Report Views
Navigation Pane or from the List View by highlighting it.
2. Click Verify in the Home tab and then select Verify Module.
To verify the hardware configuration for all of the test modules in the Control
Center test document:
Click Verify in the Home tab and then select Verify All.
115
5.3.3
Switching Units
You can toggle the test parameters units and values for each test module
between:
time in seconds or cycles
primary or secondary values
absolute or relative values.
The unit settings are test module-specific, that is, if a test document is saved, its
test-specific unit settings are saved with the document. If this test document is
later opened, the units and values are set accordingly.
Units is not available in all test modules.
To switch between the units:
1. Open the test module from the Control Center document.
2. Select the units to be used in the test modules View tab.
Figure 5-10:
Switching units
Toggle time between seconds and cycles

Toggle between absolute and relative values
Toggle between primary and secondary values
For more detailed information about unit switching refer to the Test Universe
Help. Open the Help of the corresponding test module, click the The Ribbon
entry in the table of contents, and navigate to the View topic.
116
5.3.4
Start/Continue a Test
The Control Center lets you run either
a) single tests of individual test modules embedded in the Control Center test
document
b) or an overall test of all (selected) test modules embedded in the Control
Center test document.
In the latter case, the single tests are performed in sequential order. Status
information about the progress of the test is displayed in the status bar (or the
Status History window).
What should happen if a test document fails?

The Control Center lets you to specify what should happen if a test from the
Control Center test document fails: should the execution of the entire test
document be terminated when a single test1 fails or when a test step2 fails? To
do so, click Test Options in the Home tab of the Control Center.
For more detailed information about setting the test options refer to the
Test Universe Help. Open the OMICRON Control Center Help, click the The
Ribbon entry in the table of contents, and navigate to topic Home > Extras.
Starting or continuing the test

To start a single test of an individual test module:
1. In List View or in Report View, select the test module of your choice by
highlighting it. To rerun a test, clear the existing results first.
2. Click Start/Continue on the Home tab.
To start a sequence of tests of several selected or all test modules:
1. In List View or in Report View, select the test modules of your choice by
means of the boxes to the left of the list ( Figure 5-9 on page 115).
2. Click Start/Continue All on the Home tab.
If an embedded test module was started individually from the Control Center test
document, selecting Start/Continue on the Home tab of that test module does
not start or continue the Control Center test procedure but only this particular
test modules portion of it.
1. Test: All test steps of a single embedded test module.

2. Test step: One test step of a single embedded test module.
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5.3.5
Stopping or Pausing a Test

To stop a single test of an individual test module:
1. In the List View or the Report View, select the test module of your choice by
highlighting it.
2. Select Stop on the Home tab.
3. The running test step is aborted. All currents and voltages are immediately
shut off.
If you then click Start/Continue, the current test step re-runs.
To pause an individual test:
highlighting it.
2. Select Pause on the Home tab.
3. The currently running test step is finished. Then the test pauses.
If you then click Start/Continue, the test continues with the next step test; it
will not start over at the beginning, if it already finished a step.
5.3.6
Clearing Results
The results of a test run are written directly to the test document together with
the other test module information. If a test (individual or overall) should be rerun, the existing results have to be cleared from the test document.
To clear the results of a single test of an individual test module:
highlighting it.
2. Select Clear on the Home tab.
To clear the results of more than one single test:
1. In the List View or the Report View, select the test modules of your choice
by means of the boxes to the left of the list ( Figure 5-9 on page 115).
2. Select Clear All on the Home tab.
If an embedded test module was started individually from the Control Center test
document, selecting Clear only deletes this particular test modules portion of
the test results - not all test results of the entire Control Center test procedure.
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5.3.7
Changing a Passed/Failed Test Assessment

Upon completion of a test, each test module provides information about whether
the test was successful or not. These results are evaluated and displayed in the
Control Center. An overall result is derived from these results which represents
the assessment of the entire Control Center test document. These are available
as document fields. Fields can be included in the document and updated
automatically.
If the user does not agree with the automatic assessment of a test module, the
test assessment may be corrected manually to achieve a correct overall
assessment.
However, the actual test results cannot be changed or manipulated. Test results
can only be cleared and re-tested.
1. In the List View or the Report View, select the test module you would like to
change the assessment for by highlighting it.
2. Click Manual Assessment on the Home tab, and select Assess as Passed
or Assess as Failed.
In the test report, a message appears alongside the assessment saying that it is
a manual assessment.
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5.4 Test Document Layout

The entire look and feel of the test document can be changed to suite userdefined needs. The Report View in the OMICRON Control Center is a
rudimentary word processor. It permits page layout, paragraph layout, and
character formatting.
Moreover, the Report View allows test modules to be embedded and
manipulated.
In addition, other objects like graphic images or text can be embedded into a test
document. These could be schematic or wiring diagrams or other useful images
that help explain how the test is to be carried out.
Click Report View in the View tab to open the Report View.
5.4.1
Page Setup
Click File > Page Setup to open a dialog box where the paper size, orientation
of print, and margins can be specified, as well as a paper source for printing.
5.4.2
Text Formatting
The Text tab provides commands to format text that you type in your Control
Center document to your liking.
Clipboard
Use the commands of the Clipboard group to cut, copy and paste objects within
the Control Center document.
Font
Set the font type, size, color and its properties (B = bold, I = italic, U = underline)
for the selected text. Click the
icon of the Font group to open the font
selection dialog.
Paragraph
Define the paragraph properties of the selected paragraph(s). The settings apply
to the selected paragraph or to new paragraphs created with a carriage return
(<Enter>) after the current cursor position.
120
Set a preceding bullet.
Show/hide non-printing characters such as paragraph marks, blanks and tab

stops.
Set indentation and alignment.
Click the
icon of the Paragraph group to define tab stop settings in the
Tabs dialog.
Edit
Find: Search for text in your Control Center document. Type the text to search
for in at Find what and, if necessary, specify additional search criteria.
Replace: That's your well-known find/replace feature.
Select All: Select the entire contents of your Control Center document: text,
Test Object and Hardware Configuration, test modules, inserted fields and
objects, and so on.
5.4.3
Headers, Footers, Page Numbers

Headers are lines of text that appear at the top of every page of a test document,
while footers appear at the bottom of every page.
To define the content a header or a footer for your Control Center document,
click the View tab and select the Report View. At Document Views you find the
Page Header and Page Footer commands. Click the respective command to
open the header or footer editor.
Use the options in the Text tab ( section 5.4.2 on page 120) to format your
header and footer texts.
Or change to the Insert tab to insert objects and/or fields, for example to
insert the page number or the modification date.
For more detailed information about inserting fields, objects and page
breaks, refer to the Test Universe Help. Open the OMICRON Control Center
help and click the The Ribbon entry in the table of contents and navigate to
topic Insert > Items. Inserting fields and objects is also described in section
5.1.6 on page 108 and 5.1.7 on page 109.
To define the exact position of the header or footer on the page, click File >
Header/Footer.
121
5.4.4
Object Icons in Test Documents

The test modules and Test Object or Hardware Configuration objects that are
embedded in the test document can be displayed either as icons or as
information. It can be helpful to have only the information displayed that really
needs to be considered. Extraneous information can be iconized in the test
document so that it is not distracting from other, possibly more important
information.
Figure 5-11:
Representation of the
Hardware
Configuration in the
Report View of a test
document as editable
information:
Test Equipment
Type
Serial number
CMC256-6
EB330D
Hardware Check
Performed at
Result
Details
Not yet performed
or as icon:
Hardware
Configuration
It is possible to switch back and forth between these two representations.

1. Select the object whose representation is to be changed.
2. Click Properties on the Insert tab.
3. Select the appropriate option: either "Editable Information" or "Icon".
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5.4.5
Printing a Test Document

Select File > Print to print the test document without viewing the print preview
before.
Select File > Print Preview to display a preview of the test document:
Click Print to print the test document.
Click Next Page or Prev Page to navigate through the preview.
Click Zoom In or Zoom Out to enlarge or reduce the representation.
Click Close to close the print preview and return to the Report View without
printing the test document.
The Print Preview command is only available for the Report View.
5.5 Exporting a Report

Click File > Export Report to export the Control Center test report. Select
whether the report should be exported in either:
Text only (*.txt), that is, plain ASCII text format with no formatting and
graphics.
MS-DOS text (*.txt), that is, ASCII text that can contain language-specific
characters and symbols (so-called umlauts , , , etc.).
Rich Text Format (*.rtf), that is, a format that contains graphics and
formatting information. Can be read by MS Word.
UNICODE text (*.txt). Unicode is a 16-bit character encoding that supports

the world's major languages.
At the bottom, the Export Report dialog box holds some predefined
Test Universe-specific file destination folders you can use, such as "Test
Documents", "Test Wizard User Templates" or "PTL Folder" (PTL = Protection
Testing Library). They serve as shortcuts to easily locate certain destination
folders. Clicking these shortcuts saves you from having to browse through the
folder structure of your computer. Of course you can also use any other folder
of your choice to export a test report to.
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5.6 Exporting Data

5.6.1
Data Export
Select File > Export Data to export test results and data from any Control
Center document into a database-compatible file for later use with other
software applications. Select the export options in the appearing Export Data
dialog:
Format
Select the output format for the exported test document.
CSV: The CSV (Comma Separated Values) file format is readable by any
common database. Data is written in simple a table format. A selectable Field
Delimiter separates the individual values. If a certain value is a text string, the
value needs to have a Text Qualifier (the text may contain the character which
is used a Field Delimiter). As the naming of Boolean values is not consistent
throughout different database programs, the True and False values need to be
defined as well.
XML: XML (eXtensible Markup Language) became accepted as a standard for
data exchange, particularly between different platforms. XML and related
technologies are W3C (World Wide Web Consortium) recommendations.
Path
Enter the target directory for the CSV export or the target file path for the XML
export. The suggested directory/file path corresponds to the default setting
made on the Data Export tab of the System Settings ( Options below).
Include Schema
When you export a test document, you can choose whether to export the
schema of the XML file or not. A schema is used to make consistency checks or
to create/modify the data structures with another tool. Test Universe provides
different options for exporting the schema.
No: The schema is not exported.
In data file: Exports the schema as part of the XML file.
In separate file: Exports the schema to a separate .xsd file.
In case you customized the export settings and choose to export to XML format
with the schema, the schema is adapted to the amount of exported data.
To learn more about the schema and the XML Schema designer, please refer to
the Test Universe Data Export manual.
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Filter Settings
Lists the Control Center plus all components embedded in the document,
offering you the possibility to filter the tables and fields to export. To do so, click
the Change button. This opens the Export Data Settings dialog box that
provides a selection tree to customize the exported data set. Select the
components you want to export, clear the ones you do not want.
Some test modules provide the possibility to switch the units from seconds to
cycles, from primary to secondary and absolute or relative values. These unit
settings are saved with the test document. If this test document is later opened,
the units and values are set accordingly. However, please note that the data
export treats data with their original base units, that is, data are exported with
absolute secondary values with the time unit seconds - even if set differently
in the test module.
Options
Click the Options button to open the Export Data tab. You may already know
this tab from the System Settings (accessible from the Test Universe start
screen). In fact, this Export Data tab has the exact same function as the System
Setting's Export Data tab: defining system-wide default settings for the export
of test report data. Any setting made here is automatically taken over to the
System Settings and vice versa.
5.6.2
Data Caching in Control Center

Data caching for the data export is done each time a test module is closed or
when the export is done if no previous caching was done, so when the next
export data is done, the Control Center will contain the cache data and will not
need to re-start each test module in order to get the data. This feature makes
the data export much faster than in the previous versions.
For more detailed information about data caching in the Control Center, refer to
the Test Universe Help. Open the OMICRON Control Center Help, click the The
Ribbon entry in the table of contents, and navigate to topic File > Export Data.
125
5.7 Protection Levels of Control Center Test

Documents
A test document can be protected from accidental or unauthorized changes.
This is important because a test document can grow to represent a significant
amount of time from the responsible test engineer in development, refinement,
and maintenance. The test documents become valuable company assets, just
like the OMICRON Test Universe equipment and software.
Protection levels restrict both,
the actions a user can carry out in the user interface and in the test reports
and the actions carried out by an application or a user-written script

performing automation commands.
To change the protection level of a Control Center document, open it. Click File
> Protect.
Figure 5-12:
Protect dialog box for
test documents
In the Protect dialog box specify the level of protection required for the current
Control Center document and/or assign a password to this document to prevent
others from editing the protection settings. In addition, you can also change an
existing password.
126
Protect for
Specify the level of protection you require for the current Control Center
document:
No Protection
The Control Center document is not protected, any

user can view or edit it. Its contents can be copied,
embedded objects can be dragged and dropped
by holding the left mouse key pressed.
No Scripting
This option allows viewing and editing the

document (just as "No Protection") and carrying
out a test. It protects editing a script, though.
Changes by Script Only
A user-written script may change settings, manual

changes by the user in the user interface are not
permitted. Test modules and subroutines within
the document, incl. the tests themselves, may be
run.
No Changes
This level protects a document's structure from

being edited and its contents from being copied.
Test modules and subroutines within the
document, incl. the tests themselves may be run.
View/Print Only
The document may be viewed and printed only.

Anything else is protected.
Table 5-1:
Protection levels
overview
Viewing &
printing
Testing
Editing
Script
writing
No Protection
yes
yes
yes
yes
No Scripting
yes
yes
yes
no
Changes by
Script Only
yes
yes
by script only
no
No Changes
yes
yes
no
no
View/Print Only
yes
no
no
no
The protection levels overview listed above does not apply to embedded
objects, such as MS Office or other files. When you selected one of the
protection levels Changes by Script Only, No Changes or View/Print Only,
Control Center protects the embedded object, that is, it does not open this object
in the associated program (Excel, Word, etc.). To open the document and to
view its contents, select one of the protection levels No Protection or No
Scripting. Nevertheless, the embedded object's content is always displayed in
the Report View (unless you have selected the Display as icon option when
embedding the object).
127
Password
If Old Password is enabled, the document already has a password assigned to
it. This password must be entered before the protection level can be changed.
Type in the password and change focus by pressing the <tab> key. If the
password was correct, the protection levels are now enabled for a change.
Select the protection level of your choice, then type in a password for the
document at the New Password field. Confirm your password by entering it
once more in the Confirm New Password field.
The new protection level and a new document password are now set. The new
password will be needed to change the protection level again.
128
5.8 Control Center Helper Module Pause

Pause Module is a Control Center "helper module". It only starts from the
OMICRON Control Center. The Pause Module represents a versatile tool for
stopping, pausing and continuing various types of Control Center test
documents. You can embed as many Pause Modules in your Control Center
document as you like.
The Pause Module runs in either an information/instruction mode or in an
interactive mode that involves a user input. It furthermore generates a report.
Customize the instruction text to be displayed and to be taken to the report on
the Home tab at Module Setup.
Figure 5-13 shows an example of a Control Center test document with two
inserted Pause Modules. This test procedure would be paused twice: after
Distance and after Overcurrent.
Figure 5-13:
Center test document
with Pause Module
inserted
First test procedure pause

Second test procedure pause
Figure 5-14:
Pause Module, Home
tab
129
5.8.1
Inserting a Pause Module into a Control Center

document
1. Start the Control Center from the Test Universe start screen by opening a
new or existing test document, or by loading a template.
2. On the Control Center's Insert tab, click Test Module > Pause Module.
5.8.2
Performing an Information/Instruction Mode Test

Clear User Input to run Pause Module in an information/instruction mode
without the necessity of entering a user input.
1. Go to Pause Module's Test View.
2. Customize the instruction text you want to be shown during runtime and to
be taken to the report on the Home tab at Module Setup.
3. Type the instruction text into the Enter runtime information/instruction
box.
4. Click Run Module on the Home tab.
5. In the Runtime Dialog dialog box, click either Continue or Stop Test.
5.8.3
Continue means:
If Pause Module is launched from the Control Center, clicking Continue
continues the execution of the Control Center document.
Stop Test means:

If Pause Module is launched from the Control Center, clicking Stop Test
stops the execution of the Control Center document.
Performing a Test With Required User Input

Select User Input to run Pause Module in an interactive mode that involves a
user input (that is, an answer or information text that is queried during runtime).
1. Go to Pause Module's Test View.
2. Customize the instruction text you want to be shown during runtime and to
be taken to the report on the Home tab at Module Setup.
3. Type the instructions or the information text you want to be shown during
runtime into the Pause Module's Enter runtime information/instruction
box
4. Click Run Module on the Home tab.
5. Type the answer requested by the instruction text in the User Input box. Note
that an input is mandatory in order to continue.
130
6. In the Runtime Dialog dialog box, click either Continue or Stop Test.
Continue means:
If Pause Module is launched from the Control Center, clicking Continue
continues the execution of the Control Center document.
Stop Test means:

If Pause Module is launched from the Control Center, clicking Stop Test
stops the execution of the Control Center document.
5.9 Control Center Helper Module ExeCute

ExeCute is a Control Center "helper module". It only starts from the OMICRON
Control Center.
ExeCute launches an executable program (.exe), a batch procedure or any
document on your computer from within the Control Center test document. This
can be an OMICRON Test Universe module, a word processing application like
MS Word, an ASCII editor like Notepad, a PDF file, even a sound file or a video
- provided your computer has an application associated with that file type.
5.10 Control Center Helper Module TextView

TextView is a Control Center "helper module". It only starts from the OMICRON
Control Center.
With TextView embedded in a Control Center document (Insert tab > Test
Module > TextView), the contents of an ASCII text file are viewed and updated
in the Control Center document during runtime, that is, while executing the test.
Updating the text file display
Once TextView references to a text file, update the display of the file's
contents by clicking Start/Continue on the Control Center Home tab.
If embedded in a Control Center document with other test modules, click

Start/Continue All on the Control Center Home tab. This will start the test
sequence, and in the course of the test TextView will read the actual contents
of the referenced text file.
Report View
Change to the Report View to see the contents of the text file as well as
additional information as defined at Report Settings.
131
132
Synchronizing CMC Test Sets
6 Synchronizing CMC Test Sets

Test Universe enables a synchronized operation of two or more CMC test sets.
6.1 Synchronizing to an External Reference

Power Frequency
In Synchronized Mode, the test sets CMC 356/CMC 353/CMC 256plus/
CMC 256 synchronize the frequency of the analog outputs to a reference signal
fed into Binary/Analog Input 10. Valid frequency range of the reference signal:
15 Hz ... 70 Hz. This synchronization principle is known as Synchronized
Mode.
Figure 6-1:
Reference signal fed
into binary input 10 of a
CMC 356 test set
15 Hz ... 70 Hz
Currently, Synchronized Mode is available with State Sequencer and
QuickCMC only and requires a CMC test set equipped with the Synchronized
Mode features. CMC 256 test sets produced since mid 2004 (serial no. EI... or
newer), CMC 256plus, CMC 353 and CMC 356 test sets have these features by
default. Older devices can be upgraded.
For information about how to configure the time trigger signals and the
synchronization setup 4.7.12 "Time Source" on page 84.
133
6.2 Synchronizing to an External Time Base GPS, PTP, IRIG-B, PermaSync

Synchronizing to an external time base can be achieved in two ways:
1. Triggering each shot of a test sequence by an external time reference. This
time reference can be a GPS, a PTP or an IRIG-B signal ( 6.5 "Time
Trigger Configuration").
2. By the so-called PermaSync TM functionality, that is, by permanently
synchronizing the internal CMC sample clock to a high-precision external
time reference. PermaSync keeps the output sample clock of the CMC in
permanent synchronism to an external time source, avoiding any phasor drift
between CMC units operating in parallel (for example, decentralized PMU
testing).
This external time source can be an external one pulse per second (1 PPS)
signal, or a 1 PPS generated from the IRIG-B or GPS signal. This requires a
CMIRIG-B interface unit.
For more information about the PermaSync TM functionality, please refer to
the Test Universe Help. Launch the Help and click the --- Synchronizing
CMC Test Sets --- entry in the table of contents.
Synchronizing two or more CMC test sets

A highly accurate time reference triggers two or more CMC test sets to start a
test at the exact same point of time. This time reference can be:
Figure 6-2:
CMGPS
synchronization unit
1. A GPS (Global Positioning System) signal.

The CMC test sets that are to be
synchronized require either a CMGPS or a
CMGPS 588 synchronization unit each.
CMGPS is a GPS synchronization unit
connected to the test sets' external Interface
input (a connector at the rear side).
Figure 6-3:
CMGPS 588
synchronization unit
CMGPS 588 is a PTPv2 grandmaster clock connected to one

of the Power over Ethernet ports ETH1 or ETH2 at the CMC
test set's rear side. It requires a CMC test set with an installed
NET-1B board.
CMC 850 and CMC 353 have such a NET-1B board by
default; CMC 356, CMC 256plus and CMC 256-6 can be
upgraded.
For detailed information about either one of the synchronization units, please
refer to the according CMGPS or CMGPS 588 manual.
134
These manuals were installed with the Test Universe software (unless you
deliberately chose not to install documentation). For information where to find
and how to view the manuals, "The Test Universe Documentation" on
page 10.
2. An IRIG-B (Inter Range Instrumentation Group) time reference. IRIG-B is a
serial time code format and provides the time once per second in seconds
through day of year in a binary coded decimal (BCD) format, and an optional
binary second-of-day count.
More information about the IRIG-B standard can be found in the IRIG
SERIAL TIME CODE FORMATS publication on the Internet.
CMC test sets required for IRIG-B:
The IRIG-B time reference requires the use of either a CMC 256 test set with
the NET-1 option, a CMC 256plus (standard version with Ethernet ports; not
with PAR-1 option), a CMC 353, a CMC 356 or a CMC 850. In addition, a
CMIRIG-B interface unit is needed to connect the IRIG-B time reference to
the ext. Interf. input of the CMC.
Figure 6-4:
CMIRIG-B
Via the CMIRIG-B you can connect devices to the

above mentioned test sets that either transmit or
receive the IRIG-B time reference signal (IRIG-B
source or receiver with 5 V/TTL level; demodulated;
DC level shift protocol (B00x)).
Furthermore, a CMGPS synchronization unit can
optionally be integrated into the test setup to serve
as source of the synchronization moment or 1PPS
signal, respectively. The test set CMC 850/CMC 356/CMC 353/
CMC 256plus/CMC 256 decodes (when receiving) or encodes (when
transmitting) the IRIG-B protocol. The IRIG-B protocol extensions required
by standard IEEE C37.118 are supported as well.
For specific information about either one of the synchronization units, please
refer to the according CMGPS or CMGPS 588 manual. PDF versions of
these manuals are available on your hard disk at
installation folder\Test Universe\Doc.
All OMICRON Test Universe test modules that show the Time Trigger icon
at their ribbon support the GPS and/or IRIG-B synchronization. Time Trigger is
disabled if the setting on the Time Source tab of the Hardware Configuration
does not specify the need for Time Trigger Configuration.
When doing end-to-end testing, make sure to use the same synchronization
mode, that is, either GPS or PTP, or IRIG-B for all involved CMC 850/CMC 356/
CMC 353/CMC 256plus/CMC 256 test sets.
135
6.3 Using GPS to Synchronize CMC Test Sets

6.3.1
Using CMGPS 588 Synchronization Units

You can synchronize two or more CMC test sets by connecting a CMGPS 588
synchronization unit to each of the test sets' to Power over Ethernet ports ETH1
or ETH2 at the CMC test set's rear side. Since the GPS signal is available
worldwide, the physical distance between these test sets is thereby of no
relevance ("end-to-end" testing).
Figure 6-5:
Example:
Synchronizing two CMC
test sets with
CMGPS 588 when
testing a transmission
line's protection system
Test Universe
software
CMC 356
136
CMGPS 588
3V, 3I, Trip
CMGPS 588
Signal
Signal
Relay
Relay
3V, 3I, Trip
Test Universe
software
CMC 356
6.3.2
Using CMGPS Synchronization Units

You can synchronize two or more CMC test sets by connecting a CMGPS
synchronization unit to each of the test sets' external Interface inputs (a
connector at the rear side). Since the GPS signal is available worldwide, the
physical distance between these test sets is thereby of no relevance ("end to
end" testing).
Figure 6-6:
Example:
Synchronizing two CMC
test sets with CMGPS
when testing a
transmission line's
protection system
Antenna
Antenna
Test Universe
software
Test Universe
software
CMGPS
CMC 356
CMGPS
Signal
Signal
Relay
Relay
3V, 3I, Trip
3V, 3I, Trip
CMC 156
The synchronization accuracy depends on the settings made at the Time

Trigger Configuration window:
Max. error 100 s - 1.8 at 50 Hz in Standard Mode; possible at any point of

time during a test.
Max. error 5 s - 0.09 at 50 Hz in Enhanced Mode

(CMC 356/CMC 353/CMC 256plus/CMC 256).
Note that the 5 s accuracy is restricted to the test start only. It does not
apply to actions triggered by the following GPS pulses.
137
6.4 Using the IRIG-B Time Reference to

Synchronize CMC Test Sets
navigate to the entry Basic Information about the IRIG Time Codes
Standard.
6.4.1
Using CMIRIG-B Synchronization Units

You can synchronize two or more CMC test sets by connecting a CMIRIG-B to
each of the test sets' external Interface inputs (a connector at the rear side).
The CMIRIG-B interface units on their part are synchronized by an external time
base, for example, a satellite synchronizing clock (a third party product; IRIG-B
generator with 5 V/TTL level; demodulated; DC level shift protocol (B00x)).
Therefore, the physical distance between the test sets is of no relevance
("end-to-end" testing).
6.4.2
Using the CMC Test Set as IRIG-B Generator

Requires a CMC 850/CMC 356/CMC 353/CMC 256plus/CMC 256 test set.
IRIG-B Generator following PPS using a CMIRIG-B

The CMC test set can also work as an IRIG-B generator feeding an IRIG-B time
reference it creates into a test object, for example, a PMU (phasor measurement
unit). This requires a CMIRIG-B to be connected between the CMC test set and
the test object.
138
Figure 6-7:
IRIG-B Generator
following PPS using a
CMIRIG-B.
Feeding a CMC-generated IRIG-B time

reference into a test object.
Test object
PPX OUT IRIG-B OUT
The CMC generates IRIG-B time

telegrams and a PPX Out pulse
sequence (1 pps), both via CMIRIG-B
output and synchronized to external
pulse sequence (1 pps).
The absolute start time for the CMIRIG-B
output is taken from the IRIG-B source
settings. The CMC triggers on PPX
sequence.
CMIRIG-B
CMC test set

(rear view)
IRIG-B Generator following PTPv2 using a CMGPS 588

The CMC test set provides exceptionally high accuracy; it can, of course, not
provide the accuracy of the GPS signal. Therefore, the CMC-generated IRIG-B
time reference can be GPS-synchronized. In this mode, the CMC test set
generates the IRIG-B time reference for the test object, and the CMGPS 588 (a
PTPv2 time source) synchronizes the CMC test set with GPS pulses.
Figure 6-8:
IRIG-B Generator
following PTPv2 using a
CMGPS 588
Test object
CMGPS 588
PPX OUT
IRIG-B OUT
CMIRIG-B
CMC test set

(rear view)
Feeding a CMC-generated
and GPS-synchronized
IRIG-B time reference into a
test object.
The CMC test set generates
IRIG-B time telegrams and a
PPX Out pulse sequence
(1 pps), both via CMIRIG-B
output and synchronized to
the time base received by
CMGPS 588 (PTP) over the
Ethernet ports ETH1 or
ETH2. The CMC triggers on
PPX sequence.
139
IRIG-B Generator following GPS using CMIRIG-B and CMGPS

The CMC test set provides exceptionally high accuracy; it can, of course, not
provide the accuracy of the GPS signal. Therefore, the CMC-generated IRIG-B
time reference can be GPS-synchronized. In this mode, the CMC test set
generates the IRIG-B time reference for the test object, and the CMGPS
synchronizes the CMC test set with GPS pulses.
Figure 6-9:
IRIG-B Generator
following GPS using
CMIRIG-B and CMGPS
Test object
Antenna
PPX Out IRIG-B Out

CMGPS
CMC test set

(rear view)
CMIRIG-B
Feeding a CMC-generated and GPS-synchronized IRIG-B time reference into a

test object. The CMC test set generates IRIG-B time telegrams and a PPX Out
pulse sequence (1 pps), both via CMIRIG-B output and synchronized to the
CMGPS pulse sequence (1 pps). The absolute start time for the CMIRIG-B
output is taken from the IRIG-B source settings.CMC triggers on PPX sequence.
140
6.5 Time Trigger Configuration

Click Time Trigger on the Home tab of the test module to set up a synchronized
operation of two or more CMC test sets. Synchronized operation means: a
highly accurate time reference triggers two or more CMC test sets to start a test
at the exact same point of time. This time reference can be a GPS1 signal, a
PTPv22, or an IRIG-B3 time reference.
Alternatively, you can use the CMC test set as an IRIG-B generator to feed its
time reference into a test object, for example, a PMU (phasor measurement
unit). The CMC generates an IRIG-B time reference with or without additional
GPS- or PTP-synchronization.
6.5.1
How to Set the Time Trigger Configuration

The time trigger configuration settings are made in two different places:
1. In the Hardware Configuration
The Time Source tab provides all hardware-related settings, such as the
source of the synchronization (an external GPS, PTPv2 or IRIG-B time
reference), or the CMC test set parameterization when it operates as IRIG-B
generator (an operational mode that requires no external time reference).
For more information 4.7.12 "Time Source" on page 84.
Only after GPS, PTPv2 or IRIG-B settings were specified in the Hardware
Configuration, the Time Trigger option in the Home tab is enabled.
2. In the Time Trigger Configuration (click Time Trigger on the Home tab of
the test module)
Here you configure the test module-specific start time settings of the trigger
pulse generation.
The specific GPS, PTPv2 and/or IRIG-B settings are saved with the test
document of the respective test module. Once this document is-reopened, all of
these settings are available again.
Should the test document be reopened, but this time with a different hardware
connected - a hardware that, for example, does not support the IRIG-B
configuration -, this symbol
next to the IRIG-B configuration on the Time
Source tab notifies you about this discrepancy. In that case, this particular
configuration will not work with the connected hardware.
1. GPS = Global Positioning System
2. PTP = Precision Time Protocol, a protocol used to synchronize clocks throughout a computer
network).
3. IRIG = Inter Range Instrumentation Group. The IRIG standardized the different time code
formats.
141
Figure 6-10:
Main dialog box of the
Time Trigger
Configuration with
GPS selected as time
source.
2
3
Test Start Time & Trigger Data

Start time:
This is the start time of the first synchronization pulse; that is, the time the CMC
test set is triggered to start its designated action.
Depending on your start time settings (click the Modify... button), this moment
is either an absolute time (displayed as hh:mm:ss, for example, 10:21:00) or a
certain moment within a time pattern.
The differentiation between absolute start time and moment in time pattern is set
in the Modify Pulse Data dialog box ( chapter 6.5.2).
Trigger period:
Displays the time period between 2 synchronization pulses as set in the Modify
Pulse Data dialog box (click the Modify... button).
pulse n
142
trigger period
pulse n +1
Status & Info

Depending on the time source configuration you selected, the Info section
displays the current synchronization status (GPS Info, CMGPS 588 Info, PTP
Info or IRIG-B Info).
In general, these status messages are clear text, therefore in this manual we
refrain from listing all of them. Should you be in doubt about a particular
message and questions arise, please forward your request to the OMICRON
Technical Support ( "Support" on page 155).
Start Test Accuracy

The accuracy mode settings apply when a configuration using GPS was
selected on the Hardware Configuration's Time Source tab, and if a
CMC 850, a CMC 356, a CMC 353, a CMC 256plus or a CMC 256 test set is
used.
Overall Test System
Standard:
In standard accuracy mode, the synchronized test sets start the actual test
GPS-triggered with the occurrence of the first synchronization pulse as
described above plus a max. deviation of +/- 100 s).
Reason: The CMC 850/CMC 356/CMC 353/CMC 256plus/CMC 256 test sets
have a 100 s sampling interval for reading the status of the binary inputs; that
also applies to the external Interface input for the GPS signal. Since the timing
of the binary input sampling of the different CMC test sets cannot be
synchronized, a time difference of up to 100 s can occur between the test sets
for the recognition of the GPS pulses. This can result in an equivalent phase
difference of up to 1.8 at 50 Hz mains frequency, or up to 2.16 at 60 Hz,
respectively.
High precision:
In high precision mode, the start of a test can be synchronized to the occurrence
of the first synchronization pulse as described above plus a max. timing error of
5 s. Typically, this error is in the range of only 1 s.
Due to technical reasons, however, the high precision mode requires 2
synchronization pulses to actually start the test. This means: occurrence of first
synchronization pulse + trigger period = second synchronization pulse + timing
error of 5 s = test start.
143
1st pulse
trigger period
2nd pulse + 5 s = test start
When doing end to end testing, make sure to use the same accuracy mode on
all involved CMC test sets.
Restrictions of the high precision accuracy mode:
Supported by CMC 356/CMC 353/CMC 256plus/CMC 256 test sets.
Depending on the individual test module, the specified precision refers to the
start of the test, each test point or each test shot.
Concurrent operation of the EnerLyzer is not supported.
Please note that changing the GPS accuracy from "standard" to "high precision"
causes the CMGPS synchronization unit to re-initialize; that is, CMGPS will start
a new search to lock itself to the GPS satellites signals.
6.5.2
Modify Pulse Data
Figure 6-11:
Modify Pulse Data
dialog box in Time
Trigger Configuration
Start Time
The start time is the time of the first synchronization pulse (trigger); that is, the
time the CMC test set is triggered to start its designated action (that is, a test
start). Select between an absolute start time (displayed as hh:mm:ss, for
example, 10:21:00) or a certain moment within a time pattern.
An absolute start time triggers an action exactly once, for example, exactly at
10:21:00 o'clock. For any other trigger, the absolute start time needs to be set
anew.
144
If you set a time pattern, the test module internally calculates an absolute start
time from your time pattern setting at the moment you start the test, that is, the
moment you click Start/Continue on the Home tab. Therefore, a time pattern
setting does not need to be set anew for every test start.
A time pattern of
means
20 s
the trigger pulse will occur at zero (that is, the beginning)
of the next "full 20 seconds". Full 20 seconds means at,
for example, 10:21:00, 10:21:20 or 10:21:40 ...
30 s
of the next "full 30 seconds". Full 30 seconds means at,
for example, 10:21:00, 10:21:30 or 10:22:00 ...
1 min
of the next "full minute". Full minute means at, for
example, 10:21:00, 10:22:00 or 10:23:00 ...
2 min
of the next "full 2 minutes". Full 2 minutes means at, for
example, 10:22:00, 10:24:00 or 10:26:00 ...
5 min
example, 10:25:00, 10:30:00 or 10:35:00 ...
10 min
example, 10:30:00, 10:40:00 or 10:50:00 ...
The time pattern setting has the advantage that it most likely only needs to be
set once, and will then never have to be touched again. Since the start time is
not absolute, whenever you click "test start", the first synchronization pulse is
calculated with reference to that "start test" time to occur at, for example, "zero
of the next full 20 seconds".
If "test start" is actually clicked at 10:21:08, with this 20 s setting the first
synchronization pulse will occur at 10:21:20. If the same "test start" is clicked
once more at 14:52:22, the first synchronization pulse will occur at 14:52:40 without having to change a setting.
Example: Two remote CMC test sets, each at the end of a line, set to, for
example, 30 s, and "test start" is clicked on one side at 10:21:10, on the other
other side at 10:21:22, both test sets will start the actual test synchronized at
exactly 10:21:30. If the test is repeated 3 days later in the afternoon, and on both
sides "test start" is clicked roughly at 16:10:13, the actual synchronized test
starts exactly at 16:10:30.
Such a setting could be incorporated into a Control Center document numerous
times, but it will never have to be adapted again.
145
Trigger period
Specify the time period between 2 synchronization pulses.
pulse n
trigger period
pulse n +1
The trigger period setting is not relevant if the CMC test set works as an IRIG-B
generator. CMIRIG-B always issues PPS (1 pulse per second).
For the test modules Advanced Differential Operating Characteristic and
Advanced TransPlay, please read the subtopic If the trigger period is too
short... in the Test Universe Help. Click --- Synchronizing CMC Test Sets --in the table of contents, then click the Modify Pulse Data entry and scroll down
to If the trigger period is too short...
146
File Name Extensions within OMICRON Test Universe
File Name Extensions within

Layout
filename.OMLAYOUT
The Layout Manager that you start on the View tab by

clicking Apply Layout > Manage Layouts allows for
exporting and importing customized working layouts,
that is, the arrangement of the views and windows.
That way you can easily transfer a customized
working layout that you are familiar with to another
computer that has Test Universe installed.
The customized working layout file can be named to
your liking; its file name extension is .OMLAYOUT.
Control Center OCC

filename.OCC
OMICRON Control Center test document

To find out what software version created a Control
Center test document (*.occ), you don't need to start
the OMICRON Test Universe software. Just rightclick the .occ file in Windows Explorer, select the
context-menu command Properties and select the
Summary tab. At "Comments" you can find the
relevant information.
OCC Helper Modules

filename.PAU
Pause Module
filename.EXQ
ExeCute
filename.TXV
TextView
filename.OHC
OMICRON Hardware Configuration (import/export

from the Hardware Configurations General tab).
147
Test Object
filename.RIO
The term RIO stands for Relay Interface by

OMICRON.
RIO, was developed out of a need for a uniform data
format for parameters of protective relays produced
by different manufacturers. RIO provides a common
structure to allow functionally similar relays from
diverse manufacturers to be tested with similar test
procedures. Moreover, RIO permits relay
characteristics to be imported into the Test Universe
software from external sources.
filename.XRIO
XRIO represents the second generation of RIO file

technology. The term RIO stands for Relay Interface
by OMICRON, a technology that was already
available with previous Test Universe versions. The X
denotes "extended".
Test module-specific test files
148
filename.ADT
Advanced Distance
filename.ANNUCH
Annunciation Checker
filename.AUXDC
AuxDC Configuration
filename.BDF
Differential
filename.CBS
Circuit Breaker Simulation
filename.DST
Distance
filename.GRF
Transient Ground Fault
filename.HRT
(Advanced Differential) Diff. Harmonic Restraint
filename.MEA
EnerLyzer
filename.MET
Meter
filename.NSI
NetSim
filename.OAR
Autoreclosure
filename.OTF
(Advanced Differential) Diff. Operating Characteristic
filename.OUC
UCA-CMC Configuration
filename.OVT
Overcurrent
filename.PQT
PQ Signal Generator
filename.PRA
Pulse Ramping
filename.QCM
QuickCMC
filename.RMP
Ramping
filename.SEQ
State Sequencer
filename.SNC
Synchronizer
filename.TRA
Advanced TransPlay
filename.TRD
Transducer
filename.TST
(Advanced Differential) Diff. Trip Time
filename.VGT
(Advanced Differential) Diff Configuration
filename.VSR
VI-Starting
IED 61850 modules

filename.OGC
GOOSE configuration file
filename.OSV
Samples Values Configuration

(IEC 61850-9-2 LE Configuration Module).
filename.OUC
GSSE configuration file
Test tools
filename.BIO
Binary I/O Monitor
filename.HOU
Harmonics
filename.LST
TransPlay
filename.TYP
TypConverter
Other file name extension to know about

filename.7z
7-Zip is an open source file archiver with a high

compression ratio. Its archives have the extension
.7z.
Control Center files are compressed in 7z format.
filename.CFG
COMTRADE configuration file for the description of

the failure report channels (signal names, sample
frequency etc.). Can be imported with the test module
Advanced TransPlay, and loaded with the (optional)
test tool TransView.
filename.CML
Comtrade file. Can be loaded with the (optional) test

tool TransView.
149
filename.CSV
Comma Separated Value. This file format is readable

by any common database. Data is written in simple a
table format. A selectable field delimiter separates the
individual values.
If a certain value is a text string, the value needs to
have a text qualifier (the text may contain the
character which is used a field delimiter). As the
naming of Boolean values is not consistent throughout
different database programs, the True and False
values need to be defined as well.
filename.DAT
COMTRADE file with the sample values of the failure

report channels. Can be imported with the test module
filename.HDR
"Header file" that contains any data-related text that is

not used by the software. Can be loaded with the test
module Advanced TransPlay.
filename.PDF
Invented by Adobe, Portable Document Format

became the standard format for the electronic
document distribution and exchange. PDF files look
exactly like original documents and preserve the
fonts, images, graphics, and layout of any source file
- regardless of the application and platform used to
create it.
To view a PDF file, either the Adobe Reader or the
Foxit Reader (both freeware) is required. If you have
no PDF reader on your computer yet, OMICRON
Test Universe installs the Foxit Reader.
150
filename.PL4
PL4 file. Can be imported with the test module

filename.RTF
Rich Text Format. File format used by Microsoft Word

or other word processing applications.
filename.TPL
Template file for the test reports (based on RTF)
filename.TRF
TRF file. Can be imported with the test module

filename.XML
XML (eXtensible Markup Language) became

accepted as a standard for data exchange,
particularly between different platforms. XML and
related technologies are W3C (World Wide Web
Consortium) recommendations.
If you want to learn more about XML, the W3C site
http://www.w3.org/XML/ may be a good starting
point.
151
152
Software License Information
Software License Information

Parts of the Test Universe software are under OMICRON license, other parts
are under open source software licenses.
Test Universe Licensing:

The OMICRON Test Universe software is protected from unauthorized
installation and use by a license file. The license file codes specify both the
individual test modules and the hardware serial numbers, that is, each code
specifies a pair of "test module X to work with test set A". The license code
enabling test module X to work with test set A will differ from the code for test set
B, even though A and B might be the same CMC model.
The master license file Omicron.lic is automatically installed to
[Common Files]\OMICRON.
[Common Files] holds the full path to the folder defined by Windows to store
files shared by applications that are installed on the system. In English Windows,
that folder is named "Common Files" and is located in the [Program Files] folder.
In other language versions of Windows, the common files folder name is
localized appropriately by default.
Omicron.lic is an ASCII text file that can be viewed with any text editor. DO NOT
RENAME Omicron.lic. This file name is mandatory.
If you purchase additional OMICRON test sets at a later point of time, you need
to add their license codes, provided in separate license files, to the master
license file. To do so, use the setup tool License Manager.
Open Source Software Licenses

Both the open source license texts and, where required, the source codes are
provided on the OMICRON Test Universe installation DVD. Insert the DVD
(version 3.00 or higher) into your disk drive.
If the Windows Autostart feature is enabled on your computer, the DVD
browser, a start screen-like installation screen, starts automatically. Click
Browse the DVD, and navigate to the subfolder _Documentation\Common.
The license text files are named Test Universe License Information.txt and
CMC License Information.txt.
If the DVD browser does not start automatically, launch Windows Explorer, and
navigate to the subfolder _Documentation\Common to your DVD drive.
153
154
Support
Support
When you are working with our products we want to provide you with the
greatest possible benefits. If you need any support, we are here to assist you!
24/7 Technical Support Get Support

www.omicron.at/support
www.omicronusa.com/support
Offering our customers outstanding support is one of our top priorities. At our
technical support hotline, you can reach well-educated technicians for all of your
questions. Around the clock competent and free of charge.
Make use of our 24/7 international technical support hotline: +43 59495 4444.
Additionally, you can find our Service Center or Sales Partner closest to you at
www.omicron.at or www.omicronusa.com.
Customer Area Stay Informed

www.omicron.at/customer
www.omicronusa.com/customer
The customer area on our website is an international knowledge exchange
platform. Download the latest software updates for all products and share your
own experiences in our user forum.
Browse through the knowledge library and find application notes, conference
papers, articles about daily working experiences, user manuals and much more.
OMICRON Academy Learn More

www.omicron.at/academy
www.omicronusa.com/academy
Learn more about your product in one of the training courses offered by the
OMICRON Academy.
OMICRON electronics GmbH, Oberes Ried 1, 6833 Klaus, Austria, +43 59495
155
Support
156
Index
Index
Numerics
3 x12.5A, 70VA @ 7.5A 10 Vrms, IE
automatically calculated (HWC) . . . . . . . . . . 69
3x300V, 50VA @ 75V, 660mArms, VE
automatically calculated (HWC) . . . . . . . . . . 68
A
accuracy
GPS synchronization accuracy . . . . . . . 137
start test GPS-triggered . . . . . . . . . . . . . 143
amplifier configuration details (HWC) . . . . . . 72
Analog Outputs (HWC) . . . . . . . . . . . . . . . . . 76
ASCII
data export format . . . . . . . . . . . . . . . . . 124
assessment
changing passed/failed assessment . . . 119
B
Binary Outputs tab (HWC) . . . . . . . . . . . . . . 81
Binary/Analog Inputs tab (HWC) . . . . . . . . . . 78
block
more than one function block in an XRIO file
35
working with blocks in Organizer (Test
Object) . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
C
clearing test results (Control Center) . . . . . 118
CMB IO-7 (hardware option) . . . . . . . . . . . . . 96
CMC configuration details (HWC) . . . . . . . . . 67
CMGPS . . . . . . . . . . . . . . . . . . . . . . . . . . . . 134
CMGPS 588 . . . . . . . . . . . . . . . . . . . . . . . . 134
CMIRIG-B . . . . . . . . . . . . . . . . . . . . . . . . . . 135
color (text color) . . . . . . . . . . . . . . . . . . . . . 120
COMTRADE file name extension CML . . . 149
continue a paused test . . . . . . . . . . . . . . . . 117
Control Center
about the OMICRON Control Center . . . 99
activate a group via LinkToXRIO . . . . . 106
activate a test module via LinkToXRIO . 106
running tests from Control Center . . . . . 115
Control Center Helper Module
ExeCute . . . . . . . . . . . . . . . . . . . . . . . . 131
Pause Module . . . . . . . . . . . . . . . . . . . . 129
TextView . . . . . . . . . . . . . . . . . . . . . . . . 131
CSV
CT (current transformer), configuring a CT
in HWC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
current
mirrored currents . . . . . . . . . . . . . . . . . . . 77
current output 3x12.5A, 70VA @ 7.5A
10 Vrms, IE automatically calculated . . . . . . 69
current sensor simulation (HWC) . . . . . . . . . 74
Custom section on start screen . . . . . . . . . . 19
D
data export
exporting report . . . . . . . . . . . . . . . . . . . 123
exporting report data . . . . . . . . . . . . . . . 124
file formats . . . . . . . . . . . . . . . . . . . . . . . 124
DC Analog Inputs (HWC) . . . . . . . . . . . . . . . 83
debouncing input signals . . . . . . . . . . . . . . . 39
default
apply new test report default to Control
Center document . . . . . . . . . . . . . . . . . . 114
defining a new test report default . . . . . 114
deglitching input signals . . . . . . . . . . . . . . . . 38
Device Settings (Test Object) . . . . . . . . . . . 37
Diagnosis & Calibration section on start
screen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Differential protection, preventing the trip . . 77
documentation of Test Universe . . . . . . . . . 10
DVD browser (installation of Test Universe) 17
157
embedded object does not open from

Control Center document . . . . . . . . . . . . . . 127
end to end testing
with IRIG-B synchronization . . . . . . . . . 138
withGPS synchronization . . . . . . . . . . . . 137
ExeCute (Control Center Helper Module) . . 131
export
test results & data of test document 123, 124
general description . . . . . . . . . . . . . . . . . 42
global (test module embedded in Control
Center) . . . . . . . . . . . . . . . . . . . . . . . . . . 43
gobal vs. local . . . . . . . . . . . . . . . . . . . . . 51
if test module is running stand-alone . . . 48
local (test module embedded in Control
Center) . . . . . . . . . . . . . . . . . . . . . . . . . . 47
multiple HWC in test document . . . . . . . 108
updating HWC with data of connected
test set . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
usage of existing HWC . . . . . . . . . . . . . . 55
verifying connected hardware . . . . . . . . 115
header of Control Center document . . . . . . 120
Help of Test Universe . . . . . . . . . . . . . . . . . . 10
high precision, start test GPS-triggered
(Time Trigger Configuration) . . . . . . . . . . . 143
F
file formats
data export formats . . . . . . . . . . . . . . . . 124
file name extensions in Test Universe . . . . 147
font setting . . . . . . . . . . . . . . . . . . . . . . . . . 120
footer of Control Center document . . . . . . . 120
format
layout of Control Center document . . . . 120
text . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
formula in Test Object . . . . . . . . . . . . . . . . . . 26
G
global Hardware Configuration . . . . . . . . . . . 43
global Test Object in Control Center
document . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
GPS
synchronization accuracy . . . . . . . . . . . 137
synchronization of CMC test sets . . . . . 133
group
activate a group via LinkToXRIO
(Control Center) . . . . . . . . . . . . . . . . . . . 106
158
I
IE automatically calculated (3 x12.5A,
70VA @ 7.5A 10 Vrms, in HWC) . . . . . . . . . 69
input signal
debouncing input signals . . . . . . . . . . . . . 39
deglitching input signals . . . . . . . . . . . . . 38
installation Test Universe, DVD browser . . . 17
IRIG-B
CMC test set as IRIG-B generator . . . . 138
generating an IRIG-B time reference
with a CMC test set . . . . . . . . . . . . . . . . 138
generator following GPS using a
CMIRIG-B and a CMGPS (time source
setting in Hardware Configuration) . . . . . 88
generator following GPS using a
CMIRIG-B and a CMGPS 588 (time
source setting in Hardware
Configuration) . . . . . . . . . . . . . . . . . . . . . 89
generator following PPS using a
CMIRIG-B (time source setting in
Hardware Configuration) . . . . . . . . . . . . . 88
Index
I (cont.)
IRIG-B
generator following PTPv2 using a
CMIRIG-B (time source setting in
generator master using a CMIRIG-B
(time source setting in Hardware
Configuration) . . . . . . . . . . . . . . . . . . . . . 87
synchronization of CMC test sets . . . . . 133
News, OMICRON News . . . . . . . . . . . . . . . . 14

NTP
time-stamping via NTP (time source
L
Language Selection on start screen . . . . . . . 17
layout
format layout of Control Center doc. . . . 120
legal notice . . . . . . . . . . . . . . . . . . . . . . . . . 153
license file Omicron.lic . . . . . . . . . . . . . . . . . 16
License Manager . . . . . . . . . . . . . . . . . . . . . 16
licensing
software license information . . . . . . . . . 153
link error
LinkToXRIO with test modules or
groups (Control Center) . . . . . . . . . . . . . 106
LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . . . 26
activate a group via LinkToXRIO
(Control Center) . . . . . . . . . . . . . . . . . . . 106
activate a test module via LinkToXRIO
(Control Center) . . . . . . . . . . . . . . . . . . . 106
local Hardware Configuration . . . . . . . . . . . . 47
local Test Object of stand-alone test module 21
long form
pre-defined test report form . . . . . . . . . . 110
low level outputs configuration (HWC) . . . . . 75
O
OLE object in Control Center document protection levels . . . . . . . . . . . . . . . . . . . . . 127
OMICRON Control Center . . . . . . . . . . . . . . 99
OMICRON News . . . . . . . . . . . . . . . . . . . . . 14
Omicron.lic license file . . . . . . . . . . . . . . . . . 16
open source software . . . . . . . . . . . . . . . . . 153
overload detection (Test Object) . . . . . . . . . 39
P
page numbers of Control Center document 120
PAR-1 option of CMC 256plus . . . . . . . . . . . 53
password-protection for test documents . . 128
pause
continue paused test . . . . . . . . . . . . . . . 117
pausing a test (Pause Module) . . . . . . . 118
Pause Module (Control Center Helper
Module) . . . . . . . . . . . . . . . . . . . . . . . . . . . 129
PDF file name extension . . . . . . . . . . . . . . 150
PermaSync . . . . . . . . . . . . . . . . . . . . . . . . . 134
protected OLE object in Control Center
document . . . . . . . . . . . . . . . . . . . . . . . . . . 127
protection levels for test documents . . . . . . 126
PTP (time source setting in Hardware
Configuration) . . . . . . . . . . . . . . . . . . . . . . . . 85
M
Manchester II (IRIG-B setting in HWC) . . . . . 93
manuals of Test Universe . . . . . . . . . . . . . . . 10
mirrored currents . . . . . . . . . . . . . . . . . . . . . . 77
modulation (IRIG-B setting in HWC) . . . . . . . 93
159
Relay Interface for OMICRON. Refer to RIO

reset to default
test report . . . . . . . . . . . . . . . . . . . . . . . . 114
Residual voltage/current factors (Test
Object) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
RIO
exporting a RIO file . . . . . . . . . . . . . . . . . 31
importing a RIO file . . . . . . . . . . . . . . . . . 30
the XRIO file format . . . . . . . . . . . . . . . . . 26
Rogowski current sensor simulation (HWC) . 74
RTF
report export format . . . . . . . . . . . . . . . . 124
telegram format (settings in HWC) . . . . . . . . 92

template
test report template . . . . . . . . . . . . . . . . 112
test
changing passed/failed assessment . . . 119
clearing test results (Control Center) . . 118
pausing a test (Pause Module) . . . . . . . 118
running tests from Control Center . . . . . 115
start time (Time Trigger Configuration) . 142
start/continue a test . . . . . . . . . . . . . . . . 117
test document
exporting data . . . . . . . . . . . . . . . . . . . . 124
exporting report . . . . . . . . . . . . . . . . . . . 123
layout . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
multiple HWCs in test document . . . . . . 108
multiple test modules in Control Center
document . . . . . . . . . . . . . . . . . . . . . . . 100
multiple Test Objects in test document . 108
object icon in test document . . . . . . . . . 122
password-protection . . . . . . . . . . . . . . . 128
printing . . . . . . . . . . . . . . . . . . . . . . . . . 123
protection levels . . . . . . . . . . . . . . . . . . 126
test module
activate a test module via LinkToXRIO
(Control Center) . . . . . . . . . . . . . . . . . . 106
in Control Center test document . . . . . . . 99
multiple test modules in test document . 100
Test Object
Advanced operational mode . . . . . . . . . . 30
in Control Center documents . . . . . . . . . 22
LinkToXRIO . . . . . . . . . . . . . . . . . . . . . . . 26
local Test Object of stand-alone test
module . . . . . . . . . . . . . . . . . . . . . . . . . . 21
moving/copying LinkToXRIO-linked items
from one Test Object to another (Control
Center) . . . . . . . . . . . . . . . . . . . . . . . . . 106
multiple Test Objects in test document . 108
Standard operational mode . . . . . . . . . . . 30
S
Sampled Values data streams . . . . . . . . . . . 92
scripting
protect Control Center document from
changes . . . . . . . . . . . . . . . . . . . . . . . . . 126
setting up the hardware . . . . . . . . . . . . . . . . 41
Setup section on start screen . . . . . . . . . . . . 16
short form
pre-defined test report form . . . . . . . . . . 110
signal
debouncing input signals . . . . . . . . . . . . . 39
deglitching input signals . . . . . . . . . . . . . . 38
software license information . . . . . . . . . . . . 153
start screen . . . . . . . . . . . . . . . . . . . . . . . . . . 13
start/continue a test (Control Center) . . . . . 117
switching units . . . . . . . . . . . . . . . . . . . . . . . 116
synchronization of CMC test sets
(GPS, IRIG-B) . . . . . . . . . . . . . . . . . . . . . . . 133
syntax of formulas in Test Object . . . . . . . . . 26
System Settings on start screen . . . . . . . . . . 16
160
Index
T (cont.)
test report
adding test report forms . . . . . . . . . . . . . 113
Apply New Default to complete Control
Center document . . . . . . . . . . . . . . . . . . 114
customizing a test report . . . . . . . . . . . . 112
defining a new test report default . . . . . . 114
deleting test report forms . . . . . . . . . . . . 114
pre-defined forms . . . . . . . . . . . . . . . . . . 110
reset to default . . . . . . . . . . . . . . . . . . . . 114
using pre-defined forms . . . . . . . . . . . . . 110
test setup . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Test Tools section on start screen . . . . . . . . 16
text formatting . . . . . . . . . . . . . . . . . . . . . . . 120
TextView (Control Center Helper Module) . 131
time synchronization of CMC test sets
(GPS, IRIG-B) . . . . . . . . . . . . . . . . . . . . . . . 133
Time Trigger Configuration . . . . . . . . . . . . . 141
time-stamping via NTP (time source setting
in Hardware Configuration) . . . . . . . . . . . . . . 90
Tips & Tricks . . . . . . . . . . . . . . . . . . . . . . . . . 18
toolbar
unit manager . . . . . . . . . . . . . . . . . . . . . 116
trigger
time trigger synchronization of CMC test
sets (GPS, IRIG-B) . . . . . . . . . . . . . . . . 133
trigger data (Time Trigger Config.) . . . . 142
via GPS using a CMGPS (time source
via GPS using a CMGPS 588 (time
source setting in Hardware Config.) . . . . 85
via IRIG-B using a CMIRIG-B (time
source setting in Hardware Config.) . . . . 86
via PTPv2 (time source setting in
trip
preventing diff. protection from tripping . . 77
Tutorials (CM-Line tutorials) . . . . . . . . . . . . . 17
Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
update hardware inf. of connected test set . 56
V
variables in Test Object (user-defined
variables) . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
VE automatically calculated (3x300V,
50VA @ 75V, 660mArms in HWC) . . . . . . . 68
verify connected hardware (Control Center) 115
voltage output
3x300V, 50VA @ 75V, 660mArms,
VE automatically calculated . . . . . . . . . . 68
voltage sensor simulations (HWC) . . . . . . . . 73
VT, configuring a voltage transformer . . . . . . 70
W
wiring tables (HWC) . . . . . . . . . . . . . . . . . . . 60
X
XML
file name extension . . . . . . . . . . . . . . . . 151
XRIO
about XRIO . . . . . . . . . . . . . . . . . . . . . . . 26
exporting an XRIO file . . . . . . . . . . . . . . . 31
importing an XRIO file . . . . . . . . . . . . . . . 30
Z
zero sequence current
calculation of ground-fault current . . . . . . 38
zero sequence voltage
calculation of residual voltage . . . . . . . . . 38
161
162

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The Concept

of OMICRON Test Universe

OMICRON Test Universe

Test Universe 3.00 - Manual Version: CONC.ENU.16 - Year: 2014

Test Modules - Stand-Alone Startup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Control Center - Creating Multi-Functional Test Documents . . . . . . . . . . . . . . . . . 14

Test Tools - Additional Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Setup - Preparing Test Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Support - Documentation and Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

Custom - User-Specific Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

3 Setting Up the Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

A Test Modules Local Test Object . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Global Test Object - Sharing a Test Object in a Control Center Document. . . . . . 22

More Than One Test Object in a Control Center Document . . . . . . . . . . . . . . . . . . . . . 22

Test Objects in Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Why Test Modules Change their Reference to a Test Object . . . . . . . . . . . . . . . . . . . . 24

Example of Test Objects in a Control Center Test Document. . . . . . . . . . . . . . . . . . . . 25

Test Object Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

Operational Modes and Available Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

The File Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

The View Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

The Function Menu (Advanced Mode Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

The Block Menu (Advanced Mode Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

The Parameter Menu (Advanced Mode Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

Creating Entries in the Custom Block (Advanced Mode Only) . . . . . . . . . . . . . . . . . . . 36

OMICRON Test Universe

4 Setting Up the Test Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

About the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

What is the Hardware Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

Global Hardware Configuration if the Test Module is Embedded in a Control Center

Local Hardware Configuration if the Test Module is Embedded in a Control Center

Hardware Configuration if the Test Module is Running in Stand-Alone Mode . . . . . . . 48

Example of Global and Local Hardware Configurations (Test Module

Test Setup (Symbolic Representation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53

Starting the Hardware Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54

Usage of Existing Hardware Configurations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

Update of the Test Hardware Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

Update Behavior if a Test Module is Running Stand-Alone . . . . . . . . . . . . . . . . . . . . . 56

The Hardware Configuration Dialog Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

CMC Output Configuration Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67

Amplifier Configuration Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72

Voltage and Current Sensor Simulations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

Rogowski Current Sensor Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74

Low Level Outputs Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

Analog Outputs Tab. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76

Binary / Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Binary Outputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81

DC Analog Inputs Tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83

CMB IO-7 Hardware Option . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96

Behavior in Online Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97

Behavior in Offline Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97

5 The OMICRON Control Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

Test Modules in a Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

Multiple Test Modules in a Single Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

Inserting a Group into a Control Center Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

LinkToXRIO for the "Activate" Flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

Multiple Test Objects in a Single Test Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

Multiple Hardware Configurations in a Single Test Document . . . . . . . . . . . . . . . . . . 108

Inserting Fields into a Control Center Document. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

Inserting Objects into a Control Center Document . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

Test Reports. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110

Using a Pre-Defined Test Report Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111

Customizing a Test Report Form. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112

The Advanced Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113