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1.32 AW1 for responsivity, 2.5 1012 Jones for detectivity and 0.3 ms for response speed, superior to OIP
lms and other typical inorganic NW based PD performances. An energy conversion eciency of 2.5%
has been obtained for NW lm based solar cells. The facile fabrication process, controllable distribution
and optoelectronic applications make the OIP NWs promising building blocks for future optoelectronics,
especially for low dimensional devices.
Introduction
Organolead halide perovskite based optoelectronic devices have
attracted intense research interest due to their low cost, mild
fabrication process, high energy conversion eciency and
tunable optoelectronic properties.14 The reported organolead
halide perovskite thin films for optoelectronic devices are
mostly cast from nanoparticle or micron size grains by various
novel techniques.4 To date, two solution methods have been
developed to control the crystallization of perovskite, either a
two-step sequential deposition or one-step crystallization with
fast deposition induced by an anti-solvent additive.57 The products of the one-step solution method contain a large amount
of dendrite-like whiskers during spin coating. The dendrite
crystal growth implies that organolead iodide perovskite (OIP)
a
Wuhan National Laboratory for Optoelectronics (WNLO) and School of Optical and
Electronic Information, Huazhong University of Sciences and Technology,
1037 Luoyu Road, 430074 Wuhan, Hubei, P. R. China.
E-mail: zhixin-zhao@163.com, songhs-wnlo@mail.hust.edu.cn
b
State Key Laboratory of Advanced Technology for Materials Synthesis and
Processing, Wuhan University of Technology, Luoshi Road, 430070 Wuhan, Hubei,
China
c
Department of Materials Engineering, Monash University, Melbourne, Victoria 3800,
Australia
Electronic supplementary information (ESI) available: The leakage current level
of PDs, It curves of PDs at high bias voltage and the surface morphologies of
NW absorption layers. See DOI: 10.1039/c4nr06982j
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was set at 500 W and the duration was 30 min. The contact
angle was tested using a contact angle meter (USA Kino Industry, SL200B). A fixed volume 1 L solution was dropped onto
the treated substrate for NW growth. Four concentrations of
45 wt%, 10 wt%, 1 wt%, and 0.1 wt% were dropped onto SiO2/
Si substrates to investigate the concentration eects on NW
growth. A three-step method as shown in Fig. 4b was utilized
for NW patterning growth. SiO2/Si substrates coated with a
1 L 2 wt% solution were tilted by a small angle (10) for
aligned NW experiments. The prepared OIP NWs were characterized by scanning electron microscopy (SEM, Nova NanoSEM
450), HRTEM (Tecnai G2 20 U-Twin), XRD (XRD-7000S/L) and
UV-Vis absorption spectra (Cary, Lambda 950).
Photodetector fabrication and measurements
The aligned perovskite NWs uniformly distributed on SiO2/Si
or glass substrates were patterned with interdigitated Au electrodes by thermal evaporation assisted by a shadow mask. The
active channels were 350 m in width and 1.5 cm in length.
Photodetector performances were measured using a probe
station connected to an Agilent B1500A semiconductor characterization system. The device was further covered with an
aluminum cap to provide optical and electromagnetic shielding. Illumination was generated by monochromatic light-emitting diodes controlled by a functional generator (Agilent
33210A). Light intensity was calibrated using a silicon photodetector (Newport 818-UV).
Solar cell fabrication and measurements
Methods
Perovskite NW growth
Unless otherwise indicated, all the starting materials were
obtained from commercial suppliers and were used without
any further purification. CH3NH3I was synthesized according
to a previous study.22 The precursor solution was prepared by
mixing equimolar PbI2 and CH3NH3I DMF solutions. The
starting concentration was 45 wt% and the other dierent concentrations were obtained by diluting a 45 wt% solution. Substrates were ultrasonically cleaned by acetone, ethanol, DI
water and a boiled H2SO4H2O2 (5 : 2) solution, respectively.
For NW growth experiments, four pieces of a clean glass substrate were preheated using four hot plates and the setting
temperature was 120 C, 90 C, 60 C and RT, respectively. Ten
microliters of a 45 wt% perovskite solution were dropped onto
the above four preheated substrates. Solution coated substrates
were kept on hot plates for 3 hours and the substrates gradually became light black. Finally, the light black products were
annealed at 80 C for 10 min to obtain the NWs. Besides this,
the following NWs were all grown at RT and annealed at 80 C
for 10 min.
Controllable distribution of OIP NWs
A UV-ozone treatment was utilized to make the substrate
surface hydrophilic for a uniform distribution and the power
The NW thin film solar cells were fabricated in the same way
as the typical device fabrications except for the absorbed
materials.23 The device configuration was FTO/dense TiO2
layer/mesoporous TiO2 layer/OIP NW film/hole transport layer
(HTM)/Au. The OIP NW layer was deposited in the same way as
in the aforementioned NW growth part, and the only dierence was spraying a solution onto the substrates for fast deposition instead of dropping. A sun simulator (Oriel) coupled
with a filtered 1000 W xenon lamp was used to provide simulated solar irradiation (AM 1.5, 100 mW cm2). Current
voltage characteristics were measured using a Keithley
2400 meter.
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Fig. 1 NW growth. (ad) SEM morphologies prepared at dierent substrate temperatures: (a) 120 C, (b) 90 C, (c) 60 C and (d) RT. (eg) HRTEM
image of single NWs (e) and its selected area FFT patterns (f and g). The FFT patterns were extracted from dierent circled areas denoted as f and g
in (e). (h) The XRD spectra of the obtained NWs on dierent substrates. The spectra denoted as 1#, 2# and 3# were recorded from NWs grown on
glass, FTO and SiO2/Si substrates. Star symbols indicate the standard perovskite XRD peaks. Solid circles indicate the XRD peaks from FTO.
Uniform NW distribution
In addition to the right crystal phase of perovskite NWs, the
NW distribution on the substrate should match the traditional
techniques of micro- and nano-fabrications. The uniform distribution was implemented by UV-ozone treatment due to the
improvement of surface DMF infiltration. The contact angles
of SiO2/Si substrates before (Fig. 2a) and after (Fig. 2b) the UVozone treatments were 71 and 3, respectively. The surface
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aligned growth in the whole substrate. For the growth mechanism described in Fig. 5b, nanowires started growth from the
substrate edge due to the heterogeneous nucleation growth.30
As the evaporation continued, the contact line (liquid/substrate
interface) driven by evaporation and gravity moved along the
evaporation direction. In other words, the evaporation direction can help to guide the NW growth in the whole substrate.
As a result, the modified EISA method could be utilized for
large scale ordered NW growth. The reasons of NW alignment
can also be explained by energetically favorable and surface
energy minimization growth.35
Photodetectors (PDs) of monolayer NWs
Fig. 6 (a) UV-Vis spectra of OIP NW lms. (b) Photocurrent response under dierent wavelength light illumination from UV to infrared. The inset is
the optical image of a typical PD with a scale bar of 200 m. (c) It curve illuminated by 650 nm light at a bias of 2 V. (d) High resolution scan to one
cycle of It curves. The time interval was 0.1 ms.
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R AB
and noise current (In) by the equation: D*
. ResponsiIn
vity is defined by photocurrent (Ip = Ilight Id) divided by the
incident power (P) to the active area. The shot noise, associated
with current fluctuations flowing across a PD, often dominates
the total noise of the detector.36 So, In could be approximately
p
correlated with Id described by I n 2qI d B where q is elemenp
Ip A
tary charge. Therefore, D* can be simplified as D* p.
P 2qI d
In Fig. 7a, Ip increased as the applied voltage and irradiation
increased, which roughly reflected the dependent relationship
between Ip, applied bias and P. Fig. 7b and c further show the
detailed responsivity evolution as we changed the bias and
irradiation, respectively. The estimated R can reach 1.3 A W1
with the increase of applied bias under a fixed illumination of
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Fig. 7 (a) IV curves under dierent illumination power densities at a bias of 1 V. (b) PD responsivity depending on the applied bias under 650 nm
light illumination at a power density of 80 W cm2. (c) Dependence relationship between responsivity and irradiance at a xed bias of 1 V. (d) The
normalized detectivity evolved as the irradiance, and the applied bias was 1 V.
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References
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Fig. 8 Photocurrent density of solar cells as a function of the forward
bias voltage. The inset is the detailed performance parameters.
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Conclusions
A new morphology of OIP materials, OIP NWs, has been successfully implemented. The self-assembly growth of NWs is
mainly attributed to the low symmetry of OIP and the strong
intermolecular interactions. As a kind of low dimensional
material for optoelectronic devices, the controllable distribution
of NWs was crucial for its application. The NW patterning and
alignment were implemented by selected area treatment and
modified EISA, respectively. The synthesized NWs were successfully applied in low dimensional PDs and thin film solar cells as
demos. Monolayer NW based PDs obtained a response time of
0.3 ms, a responsivity of 1.3 A W1 and a detectivity of 2.5
1012 Jones, which are superior to recently reported PD performances based on OIP thin films and inorganic NWs. Thin film
solar cells based on OIP NWs also worked and obtained an
energy conversion eciency of 2.5%. The one dimensional
single crystals, mild growth conditions, controllable distribution
and superior light absorption and conversion properties suggest
that the present NWs have wide application in optoelectronics.
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Acknowledgements
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