Takaya Flying Probe

Fixtureless Tester
APT-9400CE/CJ
Operators guide
(Software)
TAKAYA CORPORATION
System Installation
After all hardware installation was properly finished, power on the PC to start up the Windows .
Be sure to use the right of Administrator to log on the Windows . Otherwise the
APT-9400 operating system cannot be installed in the PC.
Prior to installing the APT-9400 operating system, be sure to close all other
application systems. Otherwise the APT-9400 operating system may not be
installed in the PC properly.
You can install the APT-9400 operating system like any other Windows NT4.0 application. The APT-9400
operating system comes on compact disk (CD).
1.
Put APT-9400 Install CD in the CD-ROM drive of the PC.
2.
After several seconds, the installer starts up automatically. (Refer to [Menu 1])
[Menu 1]
3.
Fill The Tester Moderadio button. And then click Start button to show [Menu 2] below.
[Menu 2]
4.
Verify the directory where the operating system is to be installed, and then click the Next button.
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If you wish to change the directory to be installed, click the [Browse ] button and then
assign your preferable directory.
5.
It automatically starts installing the operating system, and then shows [Menu 3] below.
[Menu 3]
6.
Click the Yes button.

(If you wish to suspend the installation, click the No button.)
7.
Next, install the optical system in accordance with the menu guidance.
8.
All the installation was finished, and then the operating system is reboot automatically.
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Starting and Quitting Operating system

This chapter shows you how to start and quit the APT-9400 operating system.
Be sure to save your test program prior to quitting the APT-9400 operating system.
Otherwise all changes in the test program are invalid.
Starting operating system (1)

1. When the APT-9400 and the PC turn OFF, power ON them to start Windows .
2. Select Start menu, and then click [
] icon.
Starting operating system (2)

1. When the APT-9400 and the PC turn OFF, power ON them to start Windows .
2. Double-click the [
Quitting operating system (1)

Click Close button [
] icon on the Desktop.
] at the right-top corner of the application window.

Select [File] on Menubar, and then click [Close] there.

Press [ Alt ] key and [ F4 ] key on the keyboard simultaneously.
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Application Window
APT-9400s Application window (Main window) contains several regions: Titlebar, Menubar, Toolbar,
Workspace, and Statusbar. Each region has specific uses and functions.
Menubar
Toolbar
Minimize and Maximize Buttons
Titlebar
Workspace
Close Button
Statusbar
[Menu 1] Application window
Titlebar
Titlebar is to display the tile name of the window. Titlebar is shown in blue color when it is active, but shown
in gray color when it is not active.
Activebar, color, font and so on can be optionally defined by Windows . So, Titlebar is
shown differently.
Control icon
or
at the
leftside of Titlebar is called as Control Icon. Clicking the Control icon with the right mouse button, you can
access to Control Menu.
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Control menu
Clicking the Control icon with the right mouse button, Control Menu is displayed.
[Move]
: Relocates window
[Size]
: Changes window size
[Minimize]
: Reduces window to an icon
[Maximum]
: Enlarges windows to fill the screen
[Close]
: Close the window

[Menu 2] Control menu
Window buttons
At the right side of Titlebar there are the Main Windows window buttons (see table below). In Control menu
above, Minimize, Maximize and Close buttons are also available. When the window is maximized, Restore
button replaces the Maximize button.
Minimize
Maximize
Restore
Close
Reduces window to
Enlarges windows to
Returns window to its
Close the window
an icon
fill the screen
last non-minimized,
non-maximized
position
Menubar
Menubar contains APT-9400 system menus. Each menu lists a family of selections, and each selection
performs a specific action. (Refer to About System Function in Page18)
When a test program is listed on the display (Workspace), Menubar changes as follow:
Menu tab
Selecting Menu tab, the relative icon menu is shown on Tool bar.
Toolbar
Toolbar displays specific icons which function is frequently used in each Menu tab.
For example, clicking Open icon on Toolbar can execute the same operation as selecting [File] [Open] on
Menubar.
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Workspace
As the name implies, Workspace is a field where you do your work. When you open a program or create a
new program, you can open the variety of window that was selected.
[Menu 3] Sample display at Workspace
Statusbar
Statusbar is shown at the bottom of the Main Window. Statusbar displays the information about line, input
mode and so on when it displays Edit menu. (Refer to [Menu 4])
[Menu 4] Statusbar
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Measuring Principle
Alike the other MDAs (Manufacturer Defect Analyzer), the board under test is judged to be pass or fail as
compared with its reference value that was learned from a known good PC boards. Generally, the
measuring section in our tester is classified into three methodical sources.
DC-Constant Current measurement (DC-CC)

Measuring method:
The voltage across the circuit where DC-CC signal is input is measured.
Measuring target:
Resistors, Capacitors, Diodes (VF)
Measuring range:
Measuring signal:
Resistors
0.4 ohm 400K ohm
Capacitors
4nF 40mF
Diodes
0.1V 2.5V
DC 5mA, 50mA, 0.5mA, 5mA, 10mA, 20mA, 50mA (constant current)
DC-Constant Voltage measurement (DC-CV)

Measuring method:
The current across the circuit where DC -CV signal is input is measured.
Measuring target:
Resistors
Measuring range:
Resistors
Measuring signal:
DC 0.2V (constant voltage)
4 ohm 40M ohm
AC-Constant Voltage measurement (AC-CV)

Measuring method:
The current across the circuit where AC -CV signal is input is measured.
Measuring target:
Resistors, Capacitors, Inductors
Measuring range:
Resistors
33 ohm - 330K ohm
Capacitors
4pF - 33mF
Inductors
4mH - 10H
Measuring signal:
AC 70mVrms (constant voltage)
Measuring frequency:
160Hz, 1.6KHz, 16KHz, 160KHz
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DC-Constant Current measurement (DC-CC)

Fig. 1 gives an outline of measuring Device (Z) using DC-CC measuring method. In short, Voltage (Vm)
appears across the circuit is measured out after Constant Current (I) was applied there. In our tester, this
DC-CC measuring method is normally used for measuring Resistors of less 400 ohm, Capacitors of over
4mF and Forward voltage (Diodes, Transistors, ICs, etc.)
Vm
[Fig. 1] DC-CC measurement
Resistors
Resistance value (Z) is calculated by DC Constant Current (I) and Voltage (Vm).
[ ohm]
Vm
I
Capacitors
Capacitance value (Z) is calculated by DC Constant Current (I), Measuring time (T) and Voltage (Vm).
Z [F ] =
IT
Vm
Diodes (VF)
Forward voltage (VF) is Voltage (Vm) measured by applying DC-Constant Current (I).
Z [V ] = VF
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DC-Constant Voltage measurement (DC-CV)

Fig. 2 gives an outline of measuring Device (Z) using DC-CV measuring method. In short, Current (Im)
appears across the circuit is measured out after Constant Voltage (V) was applied there. In our tester, this
DC-CV measuring method is normally used for measuring Resistors of over 400 ohm.
Z
Im
[Fig. 2] DC-CV measurement
Resistors
Resistance value (Z) is calculated by DC Constant Voltage (V) and Current (Im).
Z [ ohm ] =
V
Im
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AC-Constant Voltage measurement (AC-CV)

Fig. 3 gives an outline of measuring Device (Z) using AC-CV measuring method. In short, Current (Im)
appears across the circuit is measured out after Constant Voltage (V) was applied there. In our tester, this
AC-CV measuring method is normally used for measuring Capacitors of less 4mF and Inductors.
Z
Im
[Fig. 3] AC-CV measurement
Resistors
Resistance value (Z) is calculated by AC Constant Voltage (V) and Current (Im).
Z [ohm ] =
V
Im
Capacitors
Capacitance value (Z) is calculated by AC Constant Voltage (V), Current (Im) and Frequency (f).
Z [F ] =
Im
(2p f V )
Inductors
Inductance value (Z) is calculated by AC Constant Voltage (V), Current (Im) and Frequency (f).
Z [H ] =
V
( 2p f I m )
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Guarding Function
When loaded boards are measured, occasionally their measured value is not a little far away from the
individual value due to influence from the peripheral circuit. So-called Guarding is such technique to
eliminate such influence as much as possible. Fig. 4 simply explains Guarding principle at DC-CV
measurement.
Device
Device
Device
Device
G
IRy
IRx
A
Guarding
IRy
IRx
Z
Im
Im
DC Power Source
DC Power Source
(G = Guard point)
[Fig. 4] Guarding Principle
While measuring Device Z in Fig. 4, normally measured current Im is divided into two, IRx and IRy. So, it is
impossible to measure IRx that flows across the device Z accurately.
However, if Point-B could be the same electric potential as Point-G (Guard point), the current
suspended. As the result,
IRy is
IRx is equal with the measuring current Im, so that the device Z is measured
accurately.
Guarding is not always effective to eliminate the influence from the peripheral circuit.
Refer to Undetectable Components in following page.
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4-Wires Kelvin Measurement

The APT-9000 Series is equipped with 4-Wires Kelvin Measurement that can eliminate both wire
resistance of the measuring cables and contact resistance of the probes for accurate measurement.
Fig. 5 simply explains the 4-Wires Kelvin Measurement.
I
Vm
R1 - R4 : Wire resistance
and Contact resistance
Rm
R1
R2
Rm
R3
: Internal resistance of Voltmeter
R4
[Fig. 5] 4-Wires Kelvin Measurement
If applying the measuring signal, some voltage appears at each R1, Z and R4.
Because Current (I) is constant, the current flown across the device Z is not changeable, regardless of R1
and R4 that changes inconsistently. Thus the voltage measurement at the device Z is not influenced at all.
R2 and R3 are also connected to the voltmeter that is to measure the device Z. However the internal
resistance
Rm of the voltmeter is so big (several mega ohms), that it does not influence the voltage
measurement at the device Z as well.

Accordingly, the device
Z can be measured accurately, not influenced by the wire resistance of the
measuring cables and contact resistance of the probes.
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Undetectable Components
As aforementioned, Guarding is not always effective to eliminate the influence from the peripheral circuit
and many devices built-in the electronic circuit cannot be measured its value accurately. Its typical samples
are shown in [Table 1].
[Table 1] Typical samples of undetectable component
Sample Circuit
Undetectable Component
Explanation
The circuit is compositely measured by
two resistance values of R1 and R2 that
R1 (Big resistance)
connect in parallel. Because R1 occupies

extremely few ratio in the compositive
value,
the
measured
value
is
unchangeable even if R1 is missing.
C1 (Capacitance)
R1 (Resistance)
D1 (Diode)
C1 (Capacitance)
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Measuring signal flows mostly across R2.
Measuring signal flows mostly across L1

that is low resistance.


Sample Circuit
Undetectable Component
Explanation
The circuit is compositely measured by
two capacitance values of C1 and C2 that
C1 (Small capacitance)
connect in parallel. Because C1 occupies

extremely few ratio in the compositive
value,
the
measured
value
is
unchangeable even if C1 is missing.
R1 (Big resistance)
Measuring signal flows mostly across C1.
Even if one of these two diodes is missing
D1 or D2 (Diode)
or disoriented, the measured value is

unchangeable.
Table. 1 shows typical samples only, and there are many other unmeasurable cases.
To judge whether the component is measurable or not, it is necessary to compare the
measured value with the nominal value of the device.
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Initial Setting
Be sure to set up Option Mode (O.Mode) and Master Mode (M.Mode) prior to your first use of the
APT-9400. Once they were set up, these values are memorized into the system directory file as named
MASTER.MDT, so that it would be unnecessary to set up them when the APT-9400 starts up.
However, if the probes were replaced otherwise any option item was changed, they must be reset each
time.
Option Mode
Select [Tool] [Mode Setting][Option Mode] on Menubar, or just click the [
] icon on Tool bar.
[Menu 1] Option Mode

All tag titles available in Option Mode are shown in the left side of the window. (Refer to [Menu 1]) Click
[Previous] button or [Next] button to select the tag that you need to set up.
In case of the workstation (PC without any measuring unit), the APT-9400 operating system starts up in
Workstation Mode. [Menu 2] shows Option Mode menu while its in Workstation Mode. (lots of parameter
cannot be used)
[Menu 2] Option Mode menu in Workstation Mode
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Tag title
RS-232C Port No.
Objective function
Set up RS-232C communication parameter for an external PC and an
barcode reader
Camera System
Set up Camera system and its relative function.
Inline Application
Set up the control for an In-line system (option).
Signal Tower Setting
Set up the control of Signal tower (option).
Serial number / Auto Data
Set up when your test result is managed by the board serial number or
Loading
when test programs are loaded automatically using the barcode.
Stamp
Input/Output function of I/O
step
DDE Communication
Set up when Stamp unit (option) marks on your boards according to their
test result.
Set up the control of Input/Output function.
Set up DDE communication function, which enables to link the APT-9400
operating system to other application software.
IC Open
Set up Sensor/probe offset for IC Open test system (option).
Menu Customize
Add other application software on Tool menu on Menubar.
Vacuum unit
Set up the use of Vacuum unit (option).
Master Mode
Select [Tool] [Mode Setting][Master Mode] on Menubar, or just click [
[Menu 3] Master Mode
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ic ] on on Toolbar.
All tag titles available in Master Mode are shown in the left side of the window. (Refer to [Menu 3])
Either [Previous] or [Next] button can select the tag that you need to set up.
Tag title
Machine Reference Point
Printer Setup
Objective function
Set up Machine reference point. (Mandatory)
Set up the printer type and printer format used in the tester.
(Be sure to set up if you use any printer other than our standard printer)
Standard Output Format
Set up Standard output format to Printer / RS-232 / File.
Advanced Output Format
Set up Advanced output format.

Set up the default folder to open and/or save the test program.
File / Folder
The APT-9400 will create the TAKAYA directory in the root directory
automatically.
Short / Open Setup

Failure Management
Password Setup
Set up the judgment tolerance at test step where SHORT(SH) or

OPEN(OP)] is substituted.
Set up various functions at fail judgment. (Mandatory)
Set up Password function, which protects any access by other
unauthorized staff.
Probes Crossing Distance
Set up allowable crossing distance of two probes, which moved down.
Debug Status
Edit Debug Status (A - G) used at Step data review menu.
User Preferences
Kelvin Measurement Setup
Set up Power cycle, Keyboard, Window display (font), Undo function, so

on. (Mandatory)
Set up Cancel value at Kelvin measurement step.
As for the details, please refer to Option Mode (Page 185) and Master Mode (Page 170) explained later.
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About System Function

In this chapter, we will explain Menubar, Toolbar so on that configure the APT-9400 operating system menu.
[Menu 1] Menubar
File
If you click File on Menubar, all available file menus are shown there. Generally these file menus are used
when you will save or load the test program from the disk.
File menu title
New
Toolbar
Overwrite your test program without changing the file name, the
folder, the file format
Save your test program with a new file name
Save As
Associate the test program saved in the disk with the test
Associate
Recently Used Files
Make up a new test program
Load any test program from the disk
Open
Save
Function
program under operation
Display the files opened recently (default 5 files)

Load the test programs made by the APT-8400 Series (DOS
Convert
(*1)
operating system) and also convert the test program made by

the APT-9400 to be used at the APT-8400 Series (DOS
operating system)
Print
Print your test program in various format
Exit
Quit the APT-9400 operating system

(*1) Refer to Page 22 for their Toolbar icon
- 18 -
New
If you point to New on the File menu, it opens the Edit menu where all step data and configuration are
cleared for your new generating a test program.
While some test program exists in the memory yet, save it in the disk prior to
executing this operation.
Open
If you point to Open on the File menu, it opens Open dialog on the display. You can point to any file
displayed in the dialog that you need to load. (Refer to [Menu 2])
You can search the other drives and folders in the File Directory combo box.
[Menu 2] Open dialog

Then it opens another dialog box where you can verify the file name, the index, the step number, Test mode
(Coordinate management system) etc. of the test program that was selected. (Refer to [Menu 3])
[Menu 3] File information

After verified them, click the OK button to load the file.
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Choose any of [ 90W ] [ 80W ] [ 80D ] [ 20D ] [ CAD ] [ BAS ] [ CA9 ] [ PIN ] button at the bottom on the
dialog box, so that it will display the data file list as indicated below.
[ 90W ]
Test program file for the APT-9400/APT-9400 Series

(Extension .SW9.SW91)
[ 80W ]
Test program file for the APT-8300/APT-8400 Series (Windows)

(Extension .SW8.SW81)
[ 80D ]
Test program file for the APT-8300/APT-8400 Series (MS-DOS)

(Extension .SD8)
[ 20D ]
Test program file for the APT-2100/APT-2200 Series (MS-DOS)

(Extension .SDT)
[ CAD ]
CAD data file configured to Takaya format

(Extension .CA8.CA9.CW8.CW9)
[ BAS ]
Basic data file configured to Takaya format

(Extension .BA8.BW8.BW9)
[ CA9 ]
Extension CAD data file configured to Takaya format

(Extension .CA9)
[ PIN ]
Pin coordinates data for Point system

(Extension .PIN)
When you will load other data file than the APT-9400/APT-9400 Series,
occasionally their reference value needs to be input again.
(Remarks)
File information shown in [Menu 3] displays some contents in Data mode and the step number, Pass/Fail
numbers saved in the test program, so on.
File Name
It displays the name of the data file, which is selected by the mouse.
Index
It displays the Index of the data file, which was specified at Index tab in Data mode.
Barcode 1 - 3
It displays the Barcode 1-3 used in the data file, which was specified at Barcode No. tab in Data mode.
Test mode
It displays either Teaching systemor Point system, which was specified at Coordinates Management
tab in Data mode.
Step
It displays the total step numbers of the data file.
Pass
It displays the total PC board numbers, which was judged Pass in test mode.
Fail
It displays the total PC board numbers, which was judged Fail in test mode.
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A/B
When the test program is separated into A/B side (in this case, A/B-side Exchange check box at
Coordinates Management tab in Data mode is filled), it displays A/B. Otherwise it displays nothing.
Axis
In case of the test program for the APT-9400 which is equipped with four flying probes, it displays 4.
Lock
When the data file is write protected, it displays ON. Otherwise it displays just like - .
Save
If you point to Save on the File menu, it overwrites your test program in the disk without changing the file
name, the folder, the file format.
When the test program has not been saved in the disk yet, it executes Save As
automatically. In this case, put any preferable file name for your test program to save it.
Save As
If you point to Save on the File menu, it saves your test program in the disk with a new file name. (Refer to
[Menu 4])
[Menu 4] Save As
Designate any preferable file name for your test program and click the Save button.
On this dialog box you can also change the disk drive / folder where your test program is saved.
When the test program using the same file name has already been in the disk yet, it
executes Saveautomatically to overwrite it.
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Associate
You can associate the test program saved in the disk with the test program (in RAM) under operation.
(Refer to [Menu 2] Open)
Click the appropriate file listed in the Open dialog, and then click the OK button to execute the data
association.
Be sure not to associate two test programs, which Data mode and Test mode are not the
same. Otherwise sometimes their coordinates data and the fail map so on may be
corrupted after these data association.
Recently Used Files

It displays the files opened recently (default 5 files). Those files are displayed from the newest one in order.
Thus if there are often used files, you can load them quickly from the menu.
The listed number of the file is changeable at User Preference in Master mode.
Convert
You can load the test program made in the APT-8300/8400 or the APT-2200N, and also save the test
program made in the APT-9400 for APT-8300/8400.
Menu title
Toolbar
Load the test program made in the APT-8300/8400(MS-DOS)
Load SD8 file
Convert the test program made in the APT-9400 for the
Save SD8 file
Load SDT file
Function
APT-8300/8400 and save it in the disk
Load the test program made in the APT-2200N
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Load SD8 file

You can load the test program (.SD8 file) made in the APT-8300/8400 from the disk.
Save SD8 file

You can convert the test program made in the APT-9400 to .SD8 file for the APT-8300/8400 and save it in
the disk.
The SD8 file name should be less than 8 letters.
Load SDT file

You can load the test program (.SDT file) made in the APT-2200N from the disk.
Print
You can output a data to the printer.
Menu title
All Steps Output
All Pins Output
Output Except Jump
Output Only Jump
CAD Data Output
Function
Print the data list in the range specified by the step numbers
Print Pin number, XY coordinates and Net name in the range specified by pin
numbers
Print the data list which function (F) is not substituted by [JP] in the range
specified by the step numbers
Print the data list which function (F) is substituted by [JP] in the range
specified by the step numbers
Print the basic data and XY coordinates (x 1 m) in the range specified by
the step numbers
All Steps Output

You can print basic data, measuring condition, XY coordinates so on in the range specified by the step
numbers.
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[Print sample 1] All Steps Output (Teaching system)
[Print sample 2] All Steps Output (Point system)
- 24 -
All Pins Output

You can print Pin number, XY coordinates and Net name in the range specified by pin numbers.
2000/03/15 16:18:35 All pins output
[page: 1]
( PinNo. / Coordinate / Comment )
00001:[+040.8000,-112.4000] :RESET
00002:[+214.6800,-110.6400] :+5V(VCC)
00003:[+200.6400,-108.1200] :INT1
00004:[+193.0600,-108.1600] :INT2
00005:[+209.5600,-099.2200] :INT3
[Print sample 3] All Pins Output
All Pins Output menu is listed only when Point system is selected at Coordinates
Management in Data mode.
Output Except Jump

You can print the data list which function (F) is not substituted by [JP] in the range specified by the step
numbers. The output format is the same as All Steps Outputabove, with the exception of Header.
Output Only Jump

You can print the data list which function (F) is substituted by [JP] in the range specified by the step numbers.
The output format is the same as All Steps Outputabove, with the exception of Header.
CAD Data Output

You can print the basic data and XY coordinates (x 1 m) in the range specified by the step numbers.
2000/03/15 14:40:30 Cad data output
[page: 1]
( Parts / Value / Comment / Loc / Device )
R622
2.2O *
3B
R +0058500.0
R603
100KO *
3B
R +0060480.0
C602
334
*
3B
C +0063000.0
R602
22KO *
3B
R +0065460.0
C604
56pF *
3B
C +0067520.0
C603
223
*
3B
C +0069480.0
+0022260.0
+0024980.0
+0022260.0
+0026160.0
+0023600.0
+0026180.0
+0058480.0
+0060500.0
+0062980.0
+0065480.0
+0067500.0
+0069480.0
+0025020.0
+0022280.0
+0025960.0
+0023640.0
+0026180.0
+0023580.0
[Print sample 4] CAD Data Output
Exit
You can quit the APT-9400 operating system.
- 25 -
Edit
If you point to Edit on Menubar, all available edit menus are shown there. Generally these edit menus are
used when you will edit the test program.
Menu title
Toolbar
Open Edit menu to create or modify the test data (the display
Step Edit
formation is partly different from Step List)

Open List menu to view the test data (the display formation is
Step List
partly different from Edit List)
Erase the test data in the block or in the appointed area
Erase Step Data
Erase Searched Step
Search
Function
Erase the test data which conforms to the appointed condition

(Parts name, Value, so on)
Search and display the test data, which conforms to the
appointed condition (Parts name, Value, so on).
Open Pin coordinate menu to create or modify Pin coordinate
Pin Coordinate Edit
data when Point system is selected at Coordinates

Management in Data mode
Erase Pin Coordinate
Digitizer
Erase Pin coordinate data in the block or in the appointed

area
Digitizer (option) creates the test data including the
XY coordinate input.
- 26 -
Step Edit, Step List

You can create/add/modify/erase the test data.
If you point to Step Edit/Step List on the Edit menu, it opens a dialog box where you can enter the step
number to be listed. (Refer to [Menu 1])
[Menu 1] Dialog box for entering step number

Enter the step number (Ex. 256) through the keyboard, and then click the OK button so that it displays the
data list, which starts from the step number (Ex. Step No. 256).
If you input nothing and clicked the OK button, it displays the data list, which starts from Step No.1 (Refer to
[Menu 2] [Menu 5])
[Menu 2] Step Edit menu (Teaching system)
[Menu 3] Step Edit menu (Point system)
- 27 -
[Menu 4] Step List menu (Teaching system)
[Menu 5] Step List menu (Point system)

Step (Step number)
Order of test step. This item is not changeable.
Aux. (Auxiliary)
Information related to the test step (Ex. Combination number, IC open etc.)
This item is not changeable through the keyboard.
Parts (Parts name) Maximum 11 letters
When each component name is input, the capital letters should be input as follows:
Parts name
Capital letter
Parts name
Capital letter
Resistor
R or MR
Jumper
J or W
Capacitor
C or MC
Switch
SW
Inductor
Relay
R, L
Transformer
Connector
CN or P
Transistor
Q or TR
Crystal
Diode / IC
Fuse
IC
Zener
ZD
- 28 -
Value (Nominal value) Maximum 11 letters

Input such information like the nominal value so on.
Resistors
Unit of Resistor is O (ohm). If you want to input W(ohm), use Ocharacter.

Ex. 47O, 2.2KO, 1MO
Capacitors
Unit of Capacitor is F (Farad) If you want to input m(micron), use Ucharacter.

Ex. 22pF, 10nF, 47uF
Inductors
Zener
Unit of Inductor is H (Henry).

Ex. 10uH, 2.2mH
Input Zener voltage from 1V to 40V. (Resolution unit is 0.01V)
If the test step which capital letter of value was N is automatically set to JUMP at
No insert
auto reference input. So Nis usually substituted for the capital letter in the test step,
which has no component to be tested. (N= not installed)
Ex. No-in
Others
Be sure to input something like component number, symbol, etc., even if any value
is not available.
Auto.
If you input [=] character in this column and press [Enter] key, it displays Generation
Generation
dialog box. (Refer to Test Data Generationin Page 38)
H-pin (High Pin) Maximum 4 letters

Pin number contacted by the probe with ( ) polarity
If it was changed to other, the contact point is changed automatically.
This is listed only when Point system is selected at Coordinates Management in Data mode.
L-pin (Low Pin) Maximum 4 letters
Pin number contacted by the probe with ( ) polarity
If it was changed to other, the contact point is changed automatically.
This is listed only when Point system is selected at Coordinates Management in Data mode.
Comment (Comment) Maximum 20 letters
Input any information related to the component.
(NOTE) No input is acceptable.
Loc (Location) Maximum 4 letters
Input the location where the component is loaded on the PCB. Ex. 1A, 1B, 1C
(NOTE) No input is acceptable.
When this location name is not input, use Auto location set function to substitute the location
automatically.
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EL (Element) Maximum 1 letter

This indicates type of the component, and is automatically substituted by any of R, C, L and D while
inputting their reference value based on the capital of Parts name or Value. You can change it while
debugging the test data at Step data review menu if necessary.
EL
Function
Specify R to measure Resistance value
Specify C to measure Capacitance value
Specify L to measure Inductance value
Specify D to measure VF and Zener voltage, ON check of transistor
(NOTE) When you are making a test program, it is substituted by [ * ] automatically.

F. (Function)
This indicates Measuring function such as JUMP (JP), OPEN (OP), SHORT (SH) so on, and is
automatically substituted by anyone in the list below while inputting their reference value. You can
change it while debugging the test data at Step data review menu if necessary.
F.
Function
**
No use (Any particular function is not set up)
JP
Skip this step under test
HO
Interrupt the test prior to this step temporarily
SH
Judge Pass if it measures lower than the threshold value preset in Master mode
OP
Judge Pass if it measures higher than the threshold value preset in Master mode
AJ
Interrupt the test at this step and display the reading value on the monitor. Restart by pressing
[TEST START] SW, as well as Pass/Fail judgment by pressing the operation panel SWs.
Judge Fail if it measures within +/- tolerance of the reference value
Judge Fail if it measures higher than the reference value (+/- tolerance is ignored)
Judge Fail if it measures lower than the reference value (+/- tolerance is ignored)
GJ
When the step is measured out of +/- tolerance of the reference value, the other test steps
flowing this GJ step are skipped and the test starts from the top step in the next group
Interrupt the test at this step, and then the camera moves over the component for your visual
WA
check through the monitor. This interrupted time is designated byVisual test (WA) hold time
(1-255sec)at Camera system in Option mode.
(NOTE) When you are making a test program, it is substituted by [ ** ] automatically.

+% -% (+ tolerance, - tolerance)
This indicates +/- tolerance (percentage) as the test threshold based on the reference values, and is
changeable from +1% to +999%.
When you are making a test program, it is substituted by [+/ - 10%] automatically. But you can set up +/tolerance for each type of components at auto. reference input.
- 30 -
PP (Probes top position)

This parameter indicates the height level where the probe can go up, and should be substituted by H,
M, and L correctly. (default: H)
If this parameter was set wrong, the probes may hit the loaded components easily and get the serious
damages as well as the PC board. Therefore, pay much attention to set the parameter while
considering the height of each component.
Top position
PP
H
M
L
clear 35 from the testing level.

(adjustable between 3 30mm at Top Position of Probe at Data mode)
(adjustable between 3 30mm at Top Position of Probe at Data mode)
PS (Probe speed)
This parameter indicates the probes moving speed nearby the contacting level, and should be
substituted by the figure 0 15. (default: 0)
PL (Probes lowest position)
This parameter indicates the lowest position where the probe can go down, and should be substituted
by the figure 0 F. (default: 0) On the list, it shows Probe 1,2,3,4 from the left.
If the figure was added by +1, the probe moves up approx. 1mm.
Sens (Sensor probe offset)
This parameter indicates the height level where the sensor probe is standby for LD-CN steps (IC Open
measurement steps).
The unit of value is mm. For example, when a LD-CN step is substituted by 10.0, the sensor probe
keeps his position at 10mm higher than the testing level and go down.
This parameter is not effective at the other test steps than LD-CN steps.
M (Examination mark)
This is a sign to indicates whether the test step is already examined or not. If the * mark (so-called
Examined mark) exists in this column, it means this step is already examined. Conversely, the step
not examined yet is substituted by - .
When Evaluation of reference value function was executed, the test step including the Examined
mark is not picked up even if the reference value is much different from the Value
G-P1 (Guard pin-1)
This indicates the pin number where the guard pin (G-P1) contacts. Unless the guard pin (G-P1) is
used, it is substituted by 0.
If it was changed to other, the contact point is changed automatically. This is listed only when Point
system is selected at Coordinates Management in Data mode.
- 31 -
G-P2 (Guard pin-2)

This indicates the pin number where the guard pin (G-P2) contacts. Unless the guard pin (G-P2) is
used, it is substituted by 0.
If it was changed to other, the contact point is changed automatically. This is listed only when Point
system is selected at Coordinates Management in Data mode.
Reference (Reference value)
This indicates the measured value learned from golden board(s) at either Reference value input or
Step data review menu.
Pass/Fail judgment depends on +/- tolerance of the reference value, with the exception of particular
steps. Normally the reference value is changeable through the keyboard, but it is not possible to
change them to any other value that conflicts with Element (EL) and Measuring mode (Mode).
Occasionally it is also not possible to change to the other value that uses the different Measuring range
(Range).
Test (Test value)
This indicates the latest test value saved in the test step. This item is not able to change here.
Cat. (Debug status)
This indicates a sign of Debug status (A to G)that was specified at Ste data review menu.
Unless any Debug status is set up, it is substituted by- .
Mode (Measuring mode)
This indicates Measuring mode (Mode), which was entered at Reference Value Input in Reference
menu. This item is not changeable through the keyboard here.
Measuring
Mode
DC-CV
Measuring method
DC constant voltage
Measuring signal
DC0.2V
Applicable components
High resistance (over 400W)
High Inductance
Small resistance (less 400W)
DC-CC
DC constant current
DC0.5mA~50mA
Capacitance (over 2mF)
(6 ranges)
Diode
Short / open check
AC160
AC1.6K
AC16K
AC constant voltage
AC70mVrms f=160Hz
With phase detection
(Limit current 25mA)
AC constant voltage
AC70mVrms f=1.6kHz
AC constant voltage
AC70mVrms f=16kHz
- 32 -
Capacitance
3.30nF~33.00mF
Inductance
33.0mH~10.00H
Resistance
33.0W~330.0kW
Capacitance
0.330nF~3.300mF
Inductance
3.30mH~10.00H
Resistance
33.0W~330.0kW
Capacitance
33.0pF~330.0nF
Inductance
0.330mH~330.0mH
Resistance
33.0W~330.0kW
AC160K
AC constant voltage
AC70mVrms f=160kHz

DC0.5mA~50mA
Capacitance
4.00pF~33.00nF
Inductance
4.00mH~33.00mH
Resistance
33.0W~100.0kW
DC-ZD
DC constant current1
DC-VM
DC measurement
LD-CN
AC constant voltage
DT-NPN
DT-PNP
FET-EN
(Between GS)
FET-EP
(Between AK)
FET-DN
FET-DP
(Between CE)
DC-PC
(Between DS)
IAC-160
AC constant voltage
AC70mVrms f=160Hz
Impedance
33.0W~330.0kW
IAC-1.6K
AC constant voltage
AC70mVrms f=1.6kHz
Impedance
33.0W~100.0kW
IAC-16K
AC constant voltage
AC70mVrms f=16kHz
Impedance
33.0W~100.0kW
IAC-160K
AC constant voltage
AC70mVrms f=160kHz
Impedance
33.0W~100.0kW
AC-VM
DC-CC4
AUTO
(Between BE)
(5 ranges)
DC voltage (Max. 40V)

AC0.14Vrms
F=100KHz, 5KHz (8 ranges)
(Limit voltage 0.5V / 1.0V / 1.5V /
Reverse check of built-in resistor of
2.0V / 2.5V / 3V / 5V)
transistor
On check of FET
DC0.5mA / 5mA
Auto Range
On check of Photo coupler
(Limit voltage 1.0V)
AC voltage (f=50Hz~2kHz) Max. 40V
measurement
(Kelvin measurement)
IC open check (Option)
DC50mA~20mA(9 ranges)
AC voltage
DC constant current
Zener voltage (Max. 40V)
DC50mA~50mA (4ranges)
Small resistance 0.40W~4.000W
Measuring range is automatically set when the reference value input.
Range (Measuring range)

This indicates Measuring range (Range), which was entered at Reference Value Input in Reference
menu. This item is not changeable through the keyboard here .
Time (Measuring time)
This indicates Measuring time (Time), which was entered at Reference Value Input in Reference menu.
This item is not changeable through the keyboard here.
Volt (Input voltage)
This indicates the optional voltage when you use IO/V function with bottom side probe. This item is not
changeable through the keyboard here.
To use IO/V function, Programmable DC Power Supply Board (option) is necessary.
X coor Y coor (Contact point)
This indicates XY coordinates (the unit of value is mm) for the probes, which are the distance from the
board reference point. On the list, it shows Probe 1,2,3,4 from the left.
- 33 -
Move the cursor on the step, and then press [TEST START] SW so that you can change the XY
coordinates while controlling the arrow keys on the operation panel. After then, press [Enter] SW to
enter the changes.
Polarity (Measuring polarity)
This indicates the polarity of Measuring signal, meaning Probe access like (+, N, N, -), (+, N, G1, -), (-,
N, A, +). This item is not changeable through the keyboard here.
Symbol
Pin name
No use
Signal probe ( )
Signal probe ( )
G1
Guard pin (1)
G2
Guard pin (2)
A1
Sensor probe (1)
A2
Sensor probe (2)
T1
Terminal probe (1) (I/O step)
T2
T3
T4
T5
Bottom probe
This indicates Probe access for the bottom probes.
For example, when Polarity is substituted by (+, N, N, -) and Bottom probe is (N1, N, A2, N), + of
Polarity means the bottom probe N1. In this case, the flying probe (1) does not go down.
Symbol
Pin name
No use
N1
Bottom probe (1)
N2
Bottom probe (2)
A1 - A6
Bottom sensor probe (1) to (6) (option)
E1 - E64
Extension bottom probe (1) to (64) (option)
- 34 -
Programming Step Data

To program step data, you can use either Step Edit or Step List in Edit menu. (As aforementioned, their
display formation is partly different)
Teaching system (Sample process 1)

As shown in [Menu 1], enter Parts, Value and Comment in order while spacing them out, and then press
[Enter] key on the keyboard. Then the cursor moves to the next step. (Refer to [Menu 2])
Next, enter Parts, Value and Comment in the same manner as the previous step, and then press [Enter]
key.
Repeat above operation to the last.
Parts column must be filled absolutely, but other two are not mandatory.
[Menu 1] Edit menu (Teaching system)
- 35 -
In this programming method, any XY coordinates for the flying probes are not substituted yet. Therefore,
you need to come back to the edit menu again to enter their XY coordinates.
At the edit menu, after you pressed [Enter] SW on the operation panel, you can start entering their XY
coordinates step by step according to the menu guidance on the display.
Teaching system (Sample process 2)

As shown in [Menu 4], enter Parts, Value and Comment in order while spacing them out, and then press
[Enter] key on the Operation panel so that it shows a dialog box showingPress [TEST START] SWon the
display.

After [TEST START] SW was pressed, operate the arrow SWs ([FAST], [SLOW], [STEP]) on the operation
panel to move the camera to High pin, and then press [ENTER] SW to fix the position of High pin.
Next, operate the arrow SWs ([FAST], [SLOW], [STEP]) on the operation panel to move the camera to
Low pin, and then press [ENTER] SW to fix the position of Low pin. Then the cursor moves to the next
step. (Refer to [Menu 5])
Repeat above operation to complete your step data.

In this programming method, you can enter the XY coordinates together with the basic data (Parts, Value
and Comment).
- 36 -
Point system
As shown in [Menu 6], enter Parts, H-pin, L-pin and Comment in order while spacing them out, and then
press [Enter] key on the keyboard. Thenthe cursor moves to the next step. (Refer to [Menu 7])
Next, enter Parts, H-pin, L-pin and Comment in the same manner as the previous step, and then press
[Enter] key.
Repeat above operation to the last.
Be sure that Parts, H-pin and L-pin are mandatory.
[Menu 6] Edit menu (Point system)

In this programming method, you need to enter their pin coordinates at Pin Coordinate Edit in Edit menu
separately.
- 37 -
Test Data Generation

The APT-9400 operating system involves a unique programming tool to instantly generate step data of the
ICs, the Connectors, the Transistors so on that have multiple leads.
For example, in the case of programming such IC that is equipped with 100 leads or more, it is enough to
input the coordinates of the leads, which are located at each corner of the device.
If you enter =in Value column and press the Enter key, it a dialog box for automatic program generation.
(Refer to [Menu 9] - [Menu 12])
[Menu 9] Automatic program generation (Teaching system)
[Menu 10] Automatic program generation (Point system)
[Menu 11] Input sample at Data generation menu
- 38 -
[Menu 12] Data generation menu

As for the other devices than ICs, choose objective parts name and then click the Next button to proceed
with the operation according to the menu guidance. (On the Generation menu, it is normal that optimum
choice is automatically made depending the initial letter of parts name)
Erase Step Data

If you select the Erase Step Data in Edit menu, it displays a dialog box as shown in [Menu 13]. You can
assign any range of the step data to be erased.
[Menu 13] Delete Step Data

For example, when you enter 256through the keyboard and then click the OK button, you can erase the
step #256 only.
However, when you enter 32, 48and then click the OK button, you can erase the plural steps from step
#32 to step #48 at once.
Please refer to [Menu 14].
[Menu 14] Delete Step Data
- 39 -
When you assign the range of step data, first enter the smaller number. Otherwise you
cannot assign the range of step data correctly.
If you wish to erase all step data at once, click the OK button without assigning any range.
In this case, it displays a dialog box showing Do you wish to erase all data? to ask your decision. If you
click the Yes button, all step data is entirely erased.
Once the test data was erased, you cannot recover (undo) them. So be sure that
they can be erasable prior to executing this operation.
Erase Searched Step

If you select Erase Searched Step in Edit menu, it displays a dialogbox as shown in [Menu 15].
On this menu, you can assign condition for searching the objective step data to be erased automatically.
[Menu 15] Erase Searched Step

As shown in [Menu 16], for example, when you assign Q101in Part edit box and then click the Execute
button, the step data in which Part column is substituted by Q101 is erased automatically.
- 40 -
[Menu 16] Input sample at Erase Searched Step

As shown in [Menu 17], you can assign plural condition as well. (Q101in Part edit box and C-Ein Value
edit box) In this case, the only step data, which fills these two conditions, is erased.
[Menu 17] Input sample at Erase Searched Step (Plural condition)

As shown in [Menu 18], you can also assign the range of step data, Case sensitive (capital letter/small
letter) and Wild card (both * and ? are usable).
[Menu 18] Input sample at Erase Searched Step

For example, when you assign Q10*in Part edit box and then click the Execute button, all step data which
parts name starts from Q10is searched to erase.
On the other hand, when you assign Q10?? in Part edit box and then click the Execute button, all step
data which parts name starts from Q10including two other characters is searched to erase.
- 41 -
Search
If you select Search in Edit menu, it displays the same dialog box as [Menu 15]. (Refer to [Menu 19]).
On this menu, you can assign condition for searching the objective step data to be listed on the screen.
[Menu 19] Search

As shown in [Menu 20], for example, when you assign D1234in Part edit box and then click the Execute
button, the step data in which Part column is substituted by D1234 is searched and listed on the screen.
[Menu 20] Input sample at Search

As shown in [Menu 21], you can assign plural condition as well. (Q1023in Part edit box and B-Ein Value
edit box) In this case, the only step data, which fills these two conditions, is searched and listed on the
screen.
- 42 -
[Menu 21] Input sample at Search (Plural condition)

[Menu 22] Input sample at Search

For example, when you assign Q10*in Part edit box and then click the Execute button, all step data which
parts name starts from Q10is searched and listed on the screen.
On the other hand, when you assign Q10?? in Part edit box and then click the Execute button, all step
data which parts name starts from Q10 including two other characters is searched and listed on the
screen.
Pin Coordinate Edit

If you select Pin Coordinate Edit in Edit menu, it displays the edit menu asshown in [Menu 23].
On this menu, you can edit (make/add/correct/erase) the pin coordinates used in your test program.
When the Enter SW was pressed while the Pin Coordinate Edit menu is displayed, you can edit the pin
coordinates in the line where the cursor is located.
Toolbar shows the dedicated icons for Pin Coordinate Edit menu.
[Menu 23] Pin Coordinate Edit
- 43 -
Pin No.
It displays Point number in numerical order starting from 00001.
Net Name
You can input any character up to 50, with the exception of Space.
On [Menu 23] above, for example, the point number 3 is shown as GND.
PL
It means an offset from the value assigned at Probes Lowest Position in Data mode, and is changeable
in the range of 0 9 and A - F.
For example, when the offset was increased by 1, the probes lowest position goes up 1mm.
P1 P2 P3 P4
You can set up Probe Permission, which designate the probes that can contact the PC board and is
substituted by either 0or 1.
P1, P2, P3 and P4 show each probe number. It is the only probe designated by 1that can contact the
PC board. On the other hand, the probe designated by0is prohibited from any contact.
On [Menu 23] above, for example, you see that P1 and P3 are designated by 0. In this case, neither
Probe1 nor Probe3 can access to any test step using Pin. #4 in test mode and when you are making a
test program so on.
Xcoor Ycoor
It means X,Y coordinates (unit ; mm).
Pressing the Enter SW on the operation panel, it shows a dialog box that allows you to input the X,Y
coordinates for the point number of the line where the cursor blinks.
Arrow SWs ([FAST] [SLOW] [STEP])
: move the camera to the objective point
Enter SW
: determine your inputting the X,Y coordinates
BFRL
When Automatically correct coordinates and retest failed steps during testing check box at Failure
Management in Master mode is filled, the probes shift their contact position automatically toward four
directions (Bottom, Front, Right, Left) for retesting the component that wasmeasured as fail in test mode.
B F R L (Bottom, Front, Right, Left) means the direction that prevents the probes from shifting their
position automatically for retesting the fail component detected in test mode. When there is substituted by
asterisk ( * ), the direction is move protected.
On [Menu 23] above, for example, you see that both F and R on Pin No. 00005 are asterisked. In this
case, the probe that is used for contacting Pin. #5 will shift to neither F (Front) nor R (Right) direction at
retesting the fail component.
Pin Coordinate Edit appears in Edit menu only when Coordinates Management in Data
mode is set to Point system.
- 44 -
Erase Pin Coordinate

If you select Erase Pin Coordinate in Edit menu, it displays a dialog box as shown in [Menu 24].
If you input the point number and click the OK button, the X,Y coordinates saved for this point are cleared.
[Menu 24] Erase Pin Coordinate

For example, if you input 128 and then click the OK button, the X,Y coordinates saved for Pin #128 are
cleared. You can also clear X,Y coordinates in some specific range at one time as well. (Refer to [Menu 25])
[Menu 25] Erase Pin Coordinate

If you wish to erase all X,Y coordinates in Pin Coordinate list at once, click the OK button without entering
any point number.
In this case, it displays a dialog box showing Do you wish to erase pin data?to ask your decision. If you
click the Yes button, all X,Y coordinates are entirely erased and there are shown just like
[+000.0000,+000.0000].
Erase Pin Coordinate appears in Edit menu only when Coordinates Management in Data
mode is set to Point system.
- 45 -
Digitizer
Digitizer is an optional tool to learn X,Y coordinates on your artwork films to put in the test program.
Digitizer Select
Clicking Digitizer Select(Edit menu > Digitizer), it display a dialog menu. (Refer to [Menu 26])
To start with, please select your digitizer model from combo box on [Menu 26].
[Menu 26] Digitizer Select

Click [Next] button, and then it displays the next dialog menu. (Refer to [Menu 27])
Please select COM Port number connecting to the digitizer from combo box on [Menu 27].
[Menu 27] COM Port number

Please select the magnification of your artwork film from combo box on [Menu 28].
[Menu 28] Film magnification

Please set the artwork film on the digitizer, and assign two points on the same horizontal line to adjust its
inclination. On [Menu 29], you can assign one point at left hand on the artwork film.
- 46 -
[Menu 29] Adjust film inclination (Left hand)

On [Menu 30], you can assign another point at right hand on the artwork film.
[Menu 30] Adjust film inclination (Right hand)

Please assign any point to Film reference point.
[Menu 31] Film reference point

Please fill Coordinate revise function by auxiliary reference pointscheckbox if necessary, and select either
Revise position and inclination of PCBor Revise position, scale, and inclination of PCB.
Unless Coordinate revise function by auxiliary reference points checkbox was filled, click [Next] button
then all necessary setup process is finished.
- 47 -
[Menu 32] Coordinate revise function by auxiliary reference points

Please assign their auxiliary reference points on the artwork film.
[Menu 33] Setup auxiliary reference points

Above mentioned are all procedures to setup the digitizer. Now the digitizer can assist your generating the
test program at Step Edit by Digitizer menu (for Teaching system) and Pin Coordinate Edit by Digitizer
menu (for Point system).
Step Edit by Digitizer

This enables to learn/correct the X,Y coordinates on the artwork film. Both operation and menu display are
the same as Step Edit function, with exception of execution by a mouse cursor provided with the digitizer.
Pin Coordinate Edit by Digitizer

This enables to learn/correct the Pin coordinates on the artwork film. Both operation and display are the
same as Pin Coordinate Edit function, with exception of execution by a mouse cursor provided with the
digitizer.
- 48 -
Step data list

As shown in [Menu 34], the step data list (Edit menu, List menu) is provided with dedicated Menubar.
[Menu 34] Menubar on step data list

Menu title
Function
Edit
Copy/erase/move the test step(s) appointed by any optional step number
Search
Look for your appointed character string to display
Move to..
Move the cursor to any appointed step
Tool
Setup/release various function on each step data
View
Window
Change the display mode to either 1line/step or 2 lines/step, and duplicate their
windows.
Change the window mode to either Cascade or Tile
- 49 -
Edit
You can edit (copy, erase, move and so on) the test step(s) optionally.
Menu title
Toolbar
Function
Undo
Get back to the previous status
Select
Assign the range of step data for [Step Cut] and [Step Copy]
Step Cut
Cut the assigned range of step data and copy to Clip board
Step Copy
Copy the assigned range of step data to Clip board
Paste the assigned range of step data ([Step Cut] and [Step
Step Paste
Copy]) to the position where the cursor blinks
Step Delete
1 Line Insert
1 Line Cut
1 Line Paste
[ENTER SW]
Coordinate Set
Cut the assigned range of step data, without copying to Clip board
Put a new step data (which Parts is substituted by asterisk) in the
position where the cursor blinks
Cut the step data where the cursor blinks to copy to Clip board
Put the step data which was cut by [1 Line Cut] in the position
where the cursor blinks
It is the same function as the Enter SW on the operation panel
and usable to enter the X,Y coordinates value
Undo
Even after [Step Cut] and [Step Copy] was accomplished, otherwise the step data was changed by the key
operation, you can get back to the previous status before your change. If you operated one time, you can
get back to the status that was one time before. If you did 10 times, you can get back to the status that was
10 times before. You can get back up to max. time that is specified at User Preference in Master mode.
(Default = 16)
However there is case that you cannot get back with function.
- 50 -
Select
You can assign the range of step data for [Step Cut] and [Step Copy].
Point to [Select] on Edit menu and press [] [] arrow key, or drag the list menu with the left mouse button,
so that the assigned range of step data changes to gray color.
Step Cut
You can cut the range of step data assigned by [Select] function and copy to Clip board.
And then, if you executed [Step Past], the step data cut by [Step Cut] is inserted in the position where the
cursor blinks.
Step Copy
You can copy the range of step data assigned by [Select] function to Clip board.
And then, if you executed [Step Past], the step data cut by [Step Cut] is inserted in the position where the
cursor blinks.
Step Paste
You can insert the step data assigned for either [Step Cut] or [Step Copy] in the position where the cursor
blinks.
Step Delete
You can erase the range of step data assigned by [Select] function.
In this case, nothing is copied onto Clip board, so that you cannot use [Step Paste] function.
(If you run Undofunction, you can get back the erased step data)
1 Line Insert
You can put a new step data in the position where the cursor blinks. In the new step data, Parts and Value
so on are substituted by asterisk (default condition), so that please fill them properly. Also input the
measuring condition and the reference value as well.
1 Line Cut
You can cut the step data where the cursor blinks to copy to Clip board
And then, if you run [1 Line Paste], this step data is put in the position where the cursor blinks.
1 Line Paste
You can put the step data which was cut by [1 Line Cut] in the position where the cursor blinks.
[ENTER SW] Coordinate Set
It is the same function as the Enter SW on the operation panel, and you can enter the X,Y coordinates
value at the step where the cursor blinks.
- 51 -
Search
You can search or replace the character string involved in the test step(s) optionally.
Searching or replacing the character string is possible in the limited range where the cursor is movable by
using the arrow keys on the keyboard. Therefore, any measuring range, measuring mode, XY coordinates
are out of the target.
Menu title
Toolbar
Function
Search the step data which agrees to the assigned condition
Search
(Parts name, Value so on) and display on the list
Forward
Previous
Replace
Search forward the step data which includes the assigned

character string and display on the list
Search backward the step data which includes the assigned
character string and display on the list
Replace the assigned character string with any other na me
Search
This is the same function explained in Search.
Forward
If you select Forward in Search menu, it displays a dialog box as shown in [Menu 35].
It searches forward the step data which includes the character string assigned in Find what edit box on this
dialog box and display on the list.
[Menu 35] Forward

Match whole word only
While this check box is filled, when for example R1was input, neither R10 nor R100 are searched.
However, while this check box is not filled, R10 and R100 are searched as well.
Match case
While this check box is filled, it distinguishes capital letters from small letters as their search condition.
However, while this check box is not filled, they are not distinguished at all.
- 52 -
Direction
This decides the direction to be searched.
Upmeans Backward search that directs to smaller step number, and Downmeans Forward search that
directs to bigger step number.
Every clicking [Find Next] button, the cursor jumps to the character string on the step data.
Previous
If you select Previous in Search menu, it also displays the dialog box as shown in [Menu 1].
It searches backward the step data which includes the character string assigned in Find what edit box on
this dialog box and display on the list. All other s are the same as Forward search.
Replace
You can replace the character string assigned in Find what edit box with the one assigned in Replace with
edit box. (Refer to [Menu 36])
[Menu 36] Replace

Match whole word only
While this check box is filled, when for example R1was input, neither R10 nor R100 are searched.
However, while this check box is not filled, R10 and R100 are searched as well.
Match case
While this check box is filled, it distinguishes capital letters from small letters as their search condition.
However, while this check box is not filled, they are not distinguished at all.
Find Next
If Find Nextbutton is clicked, it starts searching forward the step data. If there was the assigned character
string, the cursor blinks on the position, but it is not replaced with anything.
Replace
If [Replace] button is clicked, the character string searched by clicking [Find Next] button is replaced. And
then the cursor blinks on the next character string.
- 53 -
Replace All
If [Replace All] button is clicked, all character strings are searched and replaced at one time.
Cancel
If [Cancel] button is clicked, it suspends the search process and quits the dialog box.
Move to..
You can move the cursor to any appointed step, and also open the step data review menu for the step data
where the cursor blinks.
Menu title
Function
Move to Specified Step move the cursor to any appointed step

open the step data review menu for the step data where the cursor
blinks
Move to Examine
(Remarks)
this function is available on the list menu which was accessed from the
step data review menu)
Move to Specified Step

After the dialog box as shown in [Menu 37] appeared, enter the objective step number where you wish to
move and then click the OK button.
[Menu37] Move to Specified Step

Move to Examine
You can open the step data review menu for the step data where the cursor blinks.
- 54 -
Tool
You can setup or release various functions while editing your step data.
(Some menus are displayed only when the relative option unit is installed in the APT-9400)
Menu title
Coordinates Map
Function
Open a graphic display window to indicate the X,Y coordinates of the
step data where the cursor blinks
Setup or release of the combination measurement, the special
Generation
generation, IC open measurement (option) etc. of the step data

where the cursor blinks
Ground
Preset the GND points used for generating IC open measurement

data
Set up or release various IO function (option) at the test step where
IO Function
the cursor blinks

(This menu is displayed only when Input/Output Function of I/O
Stepcheck box in Option mode is filled)
Bottom probe
DDE Function
Select Revise Area Mode
Set up, change or release of using the bottom probes

Set up DDE Communication function (option) at the test step where
the cursor blinks
Set up or release various XY coordinates revise function
Set up or release the optical test system (option)
Optical
(This menu is displayed only when Optical System Installed check

box in Option mode is filled)
Auto Generation
Add the test program for ICs, Transistors, Connectors etc. on the
existing step data, using Test Data Generation function
Change Step Data
Change the step data with the assigned condition in the block
Coordinates input
Change the pin coordinates and the net name on the step list
High-fly / No-contact-zone
Set up optional zone to travel the flying probes over the tall
components whilst keeping their height (H, M, L) or prohibit them
from probing down
- 55 -
Coordinates Map
You can open a graphic map dialog box to indicate the X,Y coordinates of the step data where the cursor
blinks. (Refer to [Menu 38])
On the graphic map, if you drag the mouse to another location whilst keep pressing the left mouse button
and then release the left mouse button there, you can select all the X,Y coordinates, which were
encompassed with your mouse operation.
[Menu 38] Graphic map dialog box
If you operated the left mouse button whilst pressing [Shift] key, [Ctrl] key or [Alt] key on
the keyboard, your selecting XY coordinates will be accomplished more effectively.
Key operation
[Shift] Key
[Ctrl] Key
Function
If you pressed the left mouse button together with [Shift] key, you can select XY
coordinate on the graphic map repeatedly.
If you used the left mouse button together with [Ctrl] key, you can release XY
coordinates from your selection.
If you point a part of the component (Ex. ICs), which is made of plural test steps
[Alt] Key
using the left mouse button together with [Alt] key, you can select all the XY
coordinates used under the same component name in the block.
- 56 -
After selected XY coordinates on the coordinate map, if you click the right mouse button, it displays the
extension menu as shown in [Menu 39] below.
[Menu 39] Extension menu on Graphic display

The extension menu enables to change the selected range of step data as below.
Menu title
Undo
Function
Even after [Step Cut], [Step Copy] or [Step Delete] was accomplished, you
can get back to the previous status
Step Cut
Cut the selected range of step data and copy to Clip board
Step Copy
Copy the selected range of step data to Clip board
Step Paste
Add the step data that was obtained by [Step Cut] or [Step Copy] to the final
step
Step Delete
Cut the selected range of step data, without copying to Clip board
All Select
Select all XY coordinates available on the graphic map in the block
Select Release
Release your selection of XY coordinates back to default status
Change Step Data

Move to
Change the step data which fulfill your search condition (such as Parts
name, Value so on) in the block
Display the information of the step data nearby the cursor on the Statusbar
and moves the list menu
Move Assigned Area
Shift the selected range of step data to another positionoptionally
Copy Assigned Area
Copy the selected range of step data to another positionoptionally
Display
Display the position information of Support pins and Bottom pins
- 57 -
Undo
Even after [Step Cut], [Step Copy] or [Step Delete] was accomplished, you can get back to the previous
status before your change. If you operated one time, you can get back to the status that was one time
before. If you did 10 times, you can get back to the status that was 10 times before. You can get back up to
max. time that is specified at User Preference in Master mode. (Default = 16)
However there are some cases that you cannot get back with function.
Step Cut
You can cut the step data that was selected with the left mouse button and copy to Clip board. After that, if
you run [Step Paste], the step data will be added to the final step
Step Copy
You can copy the step data that was selected with the left mouse button to Clip board. After that, if you run
[Step Paste], the step data will be added to the final step
Step Paste
You can add the step data that was obtained by [Step Cut] or [Step Copy] to the final step.
Step Delete
You can erase the step data that was selected with the left mouse button.
In this case, nothing is copied onto Clip board, so that you cannot use [Step Paste] function.
(If you run Undofunction, you can get back the erased step data)
All Select
You can select all XY coordinates available on the graphic map in the block.
Select Release
You can release your selection of XY coordinates back to default status.
Change Step Data
You can change the step data that was selected with the left mouse button if they fulfill your search condition
(such as Parts name, Value so on) in the block
- 58 -
[Menu 40] Change Step Data

For example, if you enter IC101in Parts edit box at the left hand and ABC12345in Comment edit box at
the right hand, and then click the Execute button, ABC12345 is substituted in Comment column at the
step data named IC101in the block. (Refer to [Menu 41])
[Menu 41] Sample input (Change Step Data)

As shown in [Menu 42] below, when Parts (IC101) and Comment (JE4NFP) were assigned at the same
time, ABC12345is substituted in Comment column at the step data that fulfills both condition in the block.
[Menu 42] Sample input (Change Step Data)

It is possible to use Wild cards (* and ? ) in Parts and Comment edit box.
For example, when R10??was assigned to Parts name, it searches the character string, which starts from
R10 having other two characters in the next place.
- 59 -
As shown in [Menu 43], you can assign the range of step data and also use Case sensitive (capital
letter/small letter) as well as Wild card ( * and ? ).
[Menu 43] Search condition (Change Step Data)

Move to
You can display the information of the step data nearby the cursor on the Statusbar and moves to the list
menu.
Move Assigned Area
Pressing [TEST START] SW on the operation panel and operating the arrow keys, you can shift the step
data that was selected with the left mouse button to another position optionally in the block.
Copy Assigned Area
Pressing [TEST START] SW on the operation panel and operating the arrow keys, you can copy the step
data that was selected with the left mouse button to another position optionally in the block.
Display
You can display the position information of Support pins and Bottom pins if they are used.
- 60 -
Explanation of Coordinates Map
[Menu 44] Graphic map dialog box

Menu title
Map mode
Selection
Zoom
Function
Switch the graphic map mode to [H M L], [Probe Offset], [Permission] or
[Probe Speed] optionally
Switch the mouse selection mode to [Normal] or [Special] optionally
Switch the graphic map magnification to [Normal Viewing], [Zoom In] or
[Zoom Out] optionally
Color
Edit point color displayed on the graphic map
Toolbar
Edit the display on Toolbar
Map mode
You can select a favorite graphic map mode among from [H M L], [Probe Offset], [Permission] and [Probe
Speed]. At each map their point type is distinguishable in different color.
The map mode is also selected on Toolbar. (Refer to [Menu 45])
[Menu 45] Map mode toolbar
- 61 -
Selection
On the graphic map, when you drag the mouse to another location whilst keep pressing the left mouse
button, a quadrangle is drawn by a broken line. And then, if you release the left mouse button there, all the
points, which were encompassed with your mouseoperation, change their color.
You can select the mouse selection mode among from [Normal] and [Special] optionally
In [Normal] mode, when any point (XY coordinates) of [ + ], [ - ], [ G1 ] and [ G2 ] was encompassed by the
broken line which was drawn with the left mouse button, you can select the step data successfully.
In case of [Special] mode, however, it will be only when all points (XY coordinates) of [ + ], [ - ], [ G (G1 and
G2) ] and [ A ] were encompassed by the broken line that you can select their step data.
The selection mode is also selected on Toolbar. (Refer to [Menu 46])
[Menu 46] Map tool toolbar

Zoom
You can select the magnification of the graphic map, using [Normal Viewing], [Zoom In] or [Zoom Out]
optionally
[Normal Viewing] mode shows just normal size, but while [Zoom In] mode is selected, if you left-click the
mouse on the graphic map, their points nearby the cursor are magnified. On the other hand, [Zoom Out]
mode enables to minify those points when you left-click the mouse. Select [Normal Viewing] mode again if
you wish to turn the magnification back to normal.
The Zoom mode is also selected on Toolbar. (Refer to [Menu 47])
[Menu 47] Map tool toolbar

In addition, shifting Magnification bar available on Toolbar, the magnification of the graphic map is
changeable among 1 - 10 times freely. The magnification rate is displayed at the right hand of the
magnification bar. (Refer to [Menu 48])
[Menu 48] Zooming toolbar
- 62 -
Color
You can change and edit point color displayed on the graphic map in your favor. (Refer to [Menu 49])
This can be accomplished for each Map mode.
[Menu 49] Color

The point color used on the graphic map is indicated on Toolbar. (Refer to [Menu 50])
[Menu 50] Map color toolbar

Toolbar
You can select whether Map mode, Map tool, Zooming and Map color is displayed on Toolbar or not. (Refer
to [Menu 51])
[Menu 51] Toolbar (Graphic Map)
- 63 -
Generation
You can setup or release of Combination measurement, Special generation, IC Open measurement
(option) etc.
Menu title
Set Combination Measurements
Clear Combination Measurements
IC Open
IC Open Special
IC Open Clear
blinks to the combination measurement step

Convert the combination measurement step where the
cursor blinks back to the normal measurement step
blinks to the special IC measurement step
Special Generation Clear
Kelvin Clear
Convert the normal measurement step where the cursor
Convert the normal IC measurement step where the cursor
Special Generation
Kelvin
Function
Convert the special IC measurement step where the cursor

blinks back to the normal IC measurement step
Convert the normal measurement step where the cursor
blinks to the Kelvin measurement step
Convert the Kelvin measurement step where the cursor
blinks back to the normal measurement step
Convert the VF IC measurement step where the cursor
blinks to the IC Open measurement step
Convert the IC Open measurement step where the cursor
blinks to the special IC Open measurement step
Convert the IC Open measurement step where the cursor
blinks back to the VF measurement step

If you run this function, the normal measurement step where the cursor blinks is converted to the
combination measurement step automatically. (Refer to [Menu 52])
[Menu 52] Set combination measurement (Step 39 - 41)

The figure between Step and Parts column indicates the testing order in one combination measurement
accomplished whilst making the probes contact at one time.
- 64 -

If you run this function, the combination measurement step where the cursor blinks is released and back to
the normal measurement step automatically. (Refer to [Menu 53])
[Menu 53] Clear combination measurement (Step 39 - 41)

Special Generation
If you run this function, the normal IC measurement step (Pin to Pin, Pin to Ground) where the cursor blinks
is converted to the special IC measurement step automatically. (Refer to [Menu 54])
[Menu 54] Set special IC measurement

The figure between Step and Parts column indicates the testing order in one combination measurement
accomplished whilst making the probes contact at one time. Also, CM- means the special IC
measurement step.
After the step data was converted for the special IC measurement, the total test steps are
increased by some redundant steps.
Neither combination measurement step nor other special function step can be converted
to the special IC measurement step.
They must be released prior to setting to the special IC measurement step.
- 65 -
Special Generation Clear

If you run this function, the special IC measurement step where the cursor blinks is released and back to the
normal IC measurement step (Pin to Pin, Pin to Ground) automatically. (Refer to [Menu 55])
[Menu 55] Clear special IC measurement

After the special IC measurement step was released, the total test steps are decreased
because some redundant steps are erased.
Kelvin
If you run this function, the normal measurement step where the cursor blinks is converted to the Kelvin
measurement step automatically. (Refer to [Menu 56])
[Menu 56] Set Kelvin measurement (Step 287)

Also, Kel.between Step and Parts column means the Kelvin measurement step.
to the Kelvin measurement step.
They must be released prior to setting to the Kelvin measurement step.
Kelvin Clear
If you run this function, the Kelvin measurement step where the cursor blinks is released and back to the
normal measurement step automatically. (Refer to [Menu 57])
[Menu 57] Set Kelvin measurement (Step 287)
- 66 -
IC Open
If you run this function, the VF measurement step (Pin to Ground) for IC on which top step the cursor blinks
is converted to the IC open measurement step automatically. (Refer to [Menu 58])
[Menu 58] Set IC open measurement

Also, ICOPbetween Step and Parts column means the IC open measurement step.
It is the VF measurement step (Pin to Ground) only that you can convert to the IC open
measurement step.
to the IC open measurement step.
They must be released prior to setting to the IC open measurement step.
IC Open Special
If you run this function, the VF measurement step (Pin to Ground) for IC on which top step the cursor blinks
is converted to the special IC open measurement step automatically.
Not like the IC open measurement step above, it measures plural steps whilst making the probe contact at
one time.
It is the VF measurement step (Pin to Ground) only that you can convert to the special IC
open measurement step.
to the special IC open measurement step.
They must be released prior to setting to the special IC open measurement step.
IC Open Clear
If you run this function, the IC open measurement step where the cursor blinks is released and back to the
VF measurement step automatically. (Refer to [Menu 59])
[Menu 59] Clear IC open measurement
- 67 -
Ground
You can preset the GND points used for generating IC open measurement data. In this case, you can short
cut the bothersome job to look for the GND pin number and the XY coordinates necessary each time at
your IC data generation.
Menu title
Ground Coordinates Set
Function
Set up or release the XY coordinates for GND point
Ground Coordinates Set for IC Set up the XY coordinates for GND point used IC open
measurement
Open
Change Ground Pin for Bottom Change the normal test steps so as they are measured with the
bottom probes in the block
Probe
Ground Coordinates Set

You can set up the XY coordinates for GND point for the IC measurement if [TEST START] SW was
pressed whilst it displays Ground coordinates change dialog box. (Refer to [Menu 60])
The XY coordinates will be used for GND point at your test data generation for ICs.
[Menu 60] Ground Coordinates Set

Ground Coordinates Set for IC Open
You can set up the XY coordinates for GND point for IC open measurement if [TEST START] SW was
pressed whilst it displays Ground coordinates change dialog box. (Refer to [Menu 61])
The XY coordinates will be used for GND point at your test data generation for ICs.
[Menu 61] Ground Coordinates Set for IC Open
- 68 -
Change Ground Pin for Bottom Probe

You can change the normal test steps so as they are measured with the bottom probes in the block.
[Menu 62] Change Ground Pin for Bottom Probe

For example, if you click on [Search] button on Change coordinates of ground pin dialog box, all objective
ICs available in your test program are searched and displayed in Object parts window. (Refer to [Menu
62])
Then if you wish to change the GND point of all listed ICs from the top side to the bottom side, click onthe
[All Sel.>>] button. On the other hand, when you wish to accomplish it for some specific ICs only, please
point on them and click on [Select>>] button, so that they are shifted to Select parts window at the right
side.
If you wish to cancel all ICs displayed in Select partswindow, click on [<<All Rel.] button.
When you wish to cancel some specific ICs only, please point on them and click on
[<<Select] button, so that they are shifted back to Object partswindow at the left side.
Next, please specify the bottom probe number (1 or 2) that you wish to use at Specify the bottom ground
1-2combo box. And then, click [Execute] button to accomplish the GND point change from the top side to
the bottom side finally.
- 69 -
I/O Function
If you transmitted an external signal to the Input port while testing the board, the testing order will be
changed. It is also possible to take out Open collector signal from Output port on the Extension I/O board
during the test.
After you set up I/O steps, Aux. column is substituted by any of IO/O, IO/I, IO/T, IO/M, IO/V, IO/P, IO/C,
IO/U and IO/W automatically.
Menu title
Function
Set IO Step
Convert the normal test step to I/O step
Clear IO Step
Convert the I/O step back to the normal test step
Unless Input/Output Function of I/O Stepcheck box in Option mode is filled, this menu is
not displayed.
- 70 -
Set IO Step
If you run this function, you can convert the normal test step where the cursor blinks to the I/O function step
that you specified on the IO Command Generation dialog box. (Refer to [Menu 63])
[Menu 63] IO Command Generation

to the I/O step. They must be released prior to setting to the I/O step.
The IO Command Generation dialog box does not always show the same menu.
Followings I/O commands are displayed only when the option unit is installed on the
APT-9400.
IO/V, IO/P, IO/C
< Programmable DC power supply board
IO/U
< Coaxial relay board
IO/W
< Power relay board
Clear IO Step
If you run this function, you can convert the I/O function step where the cursor blinks back to the normal test
step.
- 71 -
Bottom probe
You can set up, change or release of using the bottom probes.
Menu title
Function
Change Ground Pin for Change the normal test steps so as they are measured with the bottom
probes in the block
Bottom Probe
Set Bottom Probe
Change the normal test step where the cursor blinks so as it is measured
with the bottom probes in the block
Change Bottom Probe
Change their probe access of the bottom probes in the block
Clear Bottom Probe
Cancel the using of the bottom probes in the assigned test steps
Change Bottom Sensor

Probe
Change their probe access of the bottom sensor probes in the block
Change Ground Pin for Bottom Probe

If you run this function, you can change the normal test steps so as they are measured with the bottom
probes in the block. This is the same function as Change Ground Pin for Bottom Probe available in
Ground.
Set Bottom Probe
If you run this function, you can change the normal test step where the cursor blinks so as it is measured
with the bottom probes in the block.
At first, assign the probe ( , ,G1,G2) that you wish to shift to the bottom side, and then assign the bottom
probe number.
Change Bottom Probe
If you run this function, you can change the bottom probes used in the assigned test steps.
Clear Bottom Probe
If you run this function, you can cancel the using of the bottom probes in the assigned test steps.
Change Bottom Sensor Probe
If you run this function, you can change the bottom sensor probes used in the assigned test steps.
- 72 -
DDE Function
Set up or release the terminal number, the communication commands, so on of the external device used in
DDE Communication function (option) at the test step where the cursor blinks.
Menu title
Function
Set DDE Step
Convert the normal test step to the DDE communication step
Clear DDE Step
Convert the DDE communication step back to the normal test step
This DDE Function menu appears only when Use DDE Communication check box in
Option mode is filled, and also Use DDE Communication check box in Data mode is
filled.
Set DDE Step

If you run this function, it shows DDE Step Generation dialog box. Starting from this dialog box, you can
convert the normal test step where the cursor blinks to the DDE communication step.
[Menu 64] DDE Step Generation dialog box
[Menu 65] Sample DDE step (before conversion)
- 73 -
[Menu 66] Sample DDE step (after conversion)
to the DDE step. They must be released prior to setting to the DDE step.
Clear DDE Step

If you run this function, you can convert the DDE communication step back to the normal test step.
Select Revise Area Mode

If you run this function, it shows Revise dialog box as shown in [Menu 67]. You can set up or release various
XY coordinates revise function.
[Menu 67] Revise dialog box

Click the arrow in the combo box available on [Menu 67], and then select any type of Revise area among
from [Release revise function], [It revises after this step], [It revises in only this group], and [It revises step
data using this parts name].
- 74 -
[Menu 68] Revise dialog box (2)

Next, if you click the arrow in the combo box at the right hand, it shows Revise dialog box as shown in
[Menu 69].
[Menu 69] Revise dialog box (3)

Then, select any Revise mode in your favor, and then press [TEST START] SW to set up the auxiliary
reference points.
With above operations, the XY coordinates in the assigned step data are automatically revised to make the
accurate probes contact against the PC boards, which may beplaced insufficiently on the test position.
This revision function is reflected to Edit menu, Reference menu, Step data review menu so on, as well as
Test mode.
Neither combination measurement step nor other special function step can use any
Revise function. They must be released prior to setting to the Revise function.
- 75 -
Optical
You can set up or release the optical test step (option).
Menu title
Function
Select Optical Test Convert the normal test step to the optical test step (the contrary operation is
also possible)
Mode
Scene recycle
If plural test steps test the same devices, they can use a common optical
image.
Select Optical Test Mode

If you run this function, you can convert the normal test step where the cursor blinks to the optical test step.
[Menu 70] Dialog box asking Coordinate revision

After [Menu 70] appeared, normally select [Yes] button and then adjust the Board reference point and the
Auxiliary reference point(s) through the camera to revise some possible inclination or scale of the PC board.
Next, specify the optical test mode from [Menu 71] and then click [OK] button.
[Menu 71] Image Information dialog box
- 76 -
When the test step that was converted to the optical test step, the Comment column is substituted by
following character strings automatically.
Optical test
Aux. column
Comment column
Polarity check of E. capacitor
IM-E.
E.Capa.-Image.
Polarity check of Tantalum
IM-T.
T.Capa.-Image.
Polarity check of connector
IM-Co
Connec.-Image.
Letter recognition
IM-Ch
Charac.-Image.
Presence check
IM-Pa
Parts-Image.
After the test step that was converted to the optical test step, accomplish their reference data input
(Reference > Optical Reference Value Input).
This menu is displayed only when Optical System Installed check box at Camera
system in Option mode is filled.
Scene Recycle
If you move the cursor on the optical test step or the coordinates revision step and then click Scene
Recycle, it shows Scene Select dialog box. (Refer to [Menu 72])
[Menu 72] Scene Select dialog box

On this dialog box, please select the objective scene data that you wish to recycle and click [OK] button.
- 77 -
Auto Generation
You can generate the test program for ICs, Transistors, Connectors etc. on the step data where the cursor
blinks, using Test Data Generation function. (Refer to Test Data Generationin Page 38)
Change Step Data

You can change the step data automatically in the block, whilst assigned Search category in the left
window and Change categoryin the right window.
[Menu 73] Change Step Data dialog box

As shown in [Menu 74], for example, if IC101 is assigned in Part edit box at Search category and
ABC12345 in Comment edit box at Change category and then click the Execute button, Comment
column of the step data which Part column is substituted by IC101 change to ABC12345automatically in
the block.
[Menu 74] Search category

Also if Parts and Comment edit box are assigned as shown in [Menu 75], Comment column of the step
data which Part column is substituted by IC101and Comment column is substituted by JE4NFPchange
to ABC12345automatically in the block.
- 78 -
[Menu 75] Change category

It is possible to use Wild cards ( * and ? ) in Parts and Comment edit box.
For example, when you assign R10?? in Part edit box and then click the Execute button, all step data
which parts name starts from R10 including two other characters is searched. Therefore, any parts that
use one character otherwise more than 2 characters following R10are not searched.
[Menu 76] Search category (Step area assignment, Wild card, Case sensitive)
Coordinates input
You can change the pin coordinates and the net name H-pin(+), L-pin(-), G-pn1(G1) and G-pn2(G2).
[Menu 77] Coordinates input dialog box

In order to change the pin coordinates, click the XY coordinates of the pin number that you wish to change,
and press the ENTER SW then the TEST START SW on the operation panel to follow the menu
instruction.
In order to change the net name, click the net name that you wish to change and then input the name
directly.
Coordinates Input menu appears only when Coordinates Management in Data mode is
set to Point system.
- 79 -
High-fly / No-contact-zone
You can set up optional zone (High-fly-zone) where each probes raise up to the assigned height (Probe
position; H, M, L) automatically before they travel across.
Also, to prevent each probe from possible interference against any tall component loaded on the PC board
under test, you can set up optional zone (No-Contact-zone) where they are prohibited from probing down.
[Menu 78] High-fly / No-contact-zone

On the High-fly / No-contact-zone dialog box, fill [Height] column with the height of the tallest component
inside the High-fly/No-contact-zone. Also, fill [X margin] and [Y margin] column with possible margin of the
assigned zone, and fill [Z margin] column with possible margin of the device height.
Then, press the Enter SW on the operation panel to specify the size of the tall component using the target
marker. In case of [Specify both Left-bottom and Right-top corner of zone], it is necessary to specify both
Left-bottom corner and Right-top corner of the area by the target marker.
In case of [Specify the Left, Right, Top, and Bottom side of the zone], it is necessary to specify four positions
(Top END, Bottom END, Left END, Right END) of the area by the target marker.
If the step assigned to [High-fly-zone] is listed on the display, High-fly-zoneis shown in Comment column
and ZONEis in Aux. Column automatically. (Refer to Step 87 in [Menu 79])
If the step assigned to [No-contact-zone] is listed on the display, No-contact-zone is shown in Comment
column and ZONEis in Aux. Column automatically. (Refer to Step 91 in [Menu 79])
If the step assigned to both [High-fly-zone] and [No-contact-zone] is listed on the display, ZONEis shown
in Comment column and also ZONEis in Aux. Column automatically.
[Menu 79] Sample of Step list
- 80 -
If Top Position of probe in the step specified with [High-fly-zone] is higher than Probe
position (H, M, L), the former height has priority.
[High-fly/No-contact-zone] set area is displayed on the fail map ; High-fly-zone is purple,
No-contact-zone is green and High-fly/No-contact is red.
Use [Specify both Left-bottom and Right-top corner of zone] when you read out the device
which shape is rectangle. On the other hand, [Specify the Left, Right, Top, and Bottom
side of the zone] suits for the device which shape is round or irregular.
[High-fly/No-contact-zone] is assigned up to 500 maximum, but it is not possible on the I/O
step, Optical step, so on.
Your setting High-fly-zone and No-Contact-zone can affect the whole test program loaded
in the memory.
Even if the step specified with [High-fly/No-contact-zone] was set to JP, their zone setting
is not cancelled.
The test steps assigned with [No-contact-zone] shows another checkbox Contact.
Normally in these test steps, any probe never goes down. However, if this checkbox was
marked, it is possible to make probing down at the step. (Refer to [Menu 80])
[Menu 80]
- 81 -
View
You can change the display mode to either 1line/step or 2 lines/step, and duplicate their windows.
Menu title
Function
One Step is Displayed With 1 Line
Display one test step on one line
One Step is Displayed With 2 Lines
Display one test step on two lines
Duplication of This Model
Open plural edit list windows to display one test data
One Step is Displayed With 1 Line

If you run this function, you can display one test step on one line. (Refer to [Menu 81], [Menu 82])
[Menu 81] One Step is Displayed with 1 Line (Teaching system)
[Menu 82] One Step is Displayed With 1 Line (Point system)
- 82 -
One Step is Displayed With 2 Lines

If you run this function, you can display one test step on two lines. (Refer to [Menu 83], [Menu 84])
[Menu 83] One Step is Displayed With 2 Lines (Teaching system)
[Menu 84] One Step is Displayed With 2 Lines (Point system)
- 83 -
Duplication of This Model

If you run this function, you can open plural edit list windows. (Refer to [Menu 85], [Menu 86])
[Menu 85] Duplication of This Model (Teaching system)
[Menu 86] Duplication of This Model (Point system)
If you change something in one edit list window, the same change is made in another edit
list window.
Window
You can change the window mode to either Cascade or Tile whilst you open plural edit list windows using
Duplication of This Modelabove.
Menu title
Function
Cascade
Display plural edit list windows in Cascade style
Tile
Display plural edit list windows in Tile style
- 84 -
Cascade
If you run this function, you can display plural edit list windows in Cascade style. (Refer to [Menu 87])
If you click Titlebar, this window will be active.
[Menu 87] Cascade

Tile
If you run this function, you can display plural edit list windows in Tile style. (Refer to [Menu 88])
If you click Titlebar, this window will be active.
[Menu 88] Tile
- 85 -
Reference
If you point to Reference on Menubar, all available menus are shown there. In this Reference menu,
generally you can input or average the reference data.
Menu title
Toolbar
Function
Learn the reference value from the sample board(s) whilst
Reference Value Input
setting up their measuring condition automatically

Test the sample boards plural times, to average their
Data Average
reference value and appoint it for the reference value

Search adjacent two points with assigned condition
Open Data Generation
automatically, to generate their short check steps

Generate the reference value automatically based on the
capital letter of the parts name or the value used in the
Reference Value Generation
step data
Auxiliary
Optical Reference Value

Input
Learn the reference value automatically for the IC open

test steps only
Learn the optical data for the optical test steps and the
coordinates revision points such as the Board reference
point and the Aux. reference point
Reference Value Input

You can learn the reference value from the sample board(s) whilst setting up their measuring condition
automatically. (Refer to [Menu 1], [Menu 2])
[Menu 1] Reference Value Input (Teaching system)
- 86 -
[Menu 2] Reference Value Input (Point system)

If the necessity arises, you can set up the starting and ending step numbers at edit box at (1), the input
condition at Reference Input menu at (2), and Group separation menu at (3).
After pressed the TEST START SW, the progression status of automatic learning the reference value is
shown by a bar graph at (4) and by the graphic map at (5) on [Menu1] and [Menu 2].
When Use Auxiliary Reference Point(s)check box on Auxiliary Reference Point(s) menu
in Data mode is filled, you can revise possible inclination or scale of the board prior to
learning the reference value.
Enter the starting and ending step numbers:

You can assign the range of test steps where the reference values are leant.
Reference Input
At automatic reference input, it executes the item which check box is filled.
- 87 -
Initialize measuring mode

If this check box is filled, F. (Function), Mode (Measuring mode), Range (Measuring range), Time
(Measuring time) and Reference(Reference value) at each test step are initialized.
When F(Function) is substituted by JP, it is not initialized.

To initialize such step, fill Clear JP steps check box, which is available on the same
window.
Clear guard point

If this check box is filled, the guard points and the probe access are initialized.
If the probe access was initialized, it shows (*,N,N,*) on the list.
Clear element
If this check box is filled, EL(Element) at each test step is initialized.
Clear JP steps
If this check box is filled, F.(Function) of the test step is initialized, even if there is substituted by JP (Jump).
Set tolerance automatically
If this check box is filled, the tolerance ( %) at each test step is set up automatically according to the capital
letter of the Parts name. (Refer to the table below)
Tolerance
Capital letter of Parts name
10%
R, MR, and all others than below
20%
D, Q or TR (except C-E)
30%
C, MC, L, T, F, V, RL
50%
I, J, W, CN, P, S, X
Jump all unmeasurable components

The test step will be set JP (Jump) automatically when it was measured 10 times over than the Value, if
there is the reason in the circuit connected to the same H-PN and L-PN. This is only the case of Resistors
and Capacitors.
Also, the VF measurement steps will be set JP automatically if the other VF measurement steps which use
the same H-PN and L-PN are also connected to 100uF or more in parallel. (It judges the power line) This is
only the case of ICs, Diodes and Transistors (VF measurement only).
- 88 -
Group separation set

You can separate your test program into some groups as you like.
For example, when you want to separate a test program, which consists of 20 steps in total into two groups
(1-10 step for Group1, 11-20 steps for Group2), please specify this just like [Menu 3] below and then press
[Enter] key.
[Menu 3] Group separation set

Unless those groups were specified in numerical order, it may not separate the test data
properly.
When Group test function by locationcheck box at User Preferences in Master mode is
filled, you cannot separate the test data at this menu.
If you want to separate the test data using Group test function by location function,
please enter GR**in Loc. Column on the step edit menu. (Ex. :GR1,GR2,GR3.GR99)
- 89 -
Data Average
You can test your sample boards plural times that you assigned, to average their reference value and
appoint it for the reference value. (Refer to [Menu 4])
[Menu 4] Data Average

If the necessity arises, you can set up the starting and ending step numbers at edit box at (1) and Averaged
Qty at (2) on [Menu 4].
After pressed the TEST START SW, the progression status of averaging data is shown by a bar graph at
(3) and by the graphic map at (4) on [Menu 4].
To run Data Average, be sure to use good sample boards.

Otherwise the reference value is unreliable and it may cause possible misjudgment.

You can assign the range of test steps where the reference values are averaged.
Averaged Qty 1-16?

You can assign how many times it should measure to average their reference value. Please enter the
number of good sample boards you have. (Usually 3 to 5paces are enough)
- 90 -
Open Data Generation

If you run this function, you can search adjacent two points with assigned condition automatically, to
generate their short check steps at the end of existing test program. (Refer to [Menu 5])
[Menu 5] Open Data Generation

If the necessity arises, you can set up the starting and ending step numbers at edit box at (1) and Adjacent
range at (2) on [Menu 5].
After clicked the Execute button, the progression status of generating open data is shown by a bar graph at
If the message Press TEST START SWappears in the middle to generating open data, set your sample
board on the APT-9400 and then press the TEST START SW on the operation panel.

You can assign the range of test steps where the adjacent points are searched.
- 91 -
Adjacent range
You can setup the objective distance for generating short check steps among from 0.1mm - 9.9mm (Default
is 0.5mm - 3.0mm).
Parts, Value, Comment and Loc in short check steps will be substituted by followings.
Parts
: Device name of the step that has the coordinates point searched
Value
: P-auto
Comment : Open-Check
Loc
: Location name of the step that has the coordinates point searched
Reference Value Generation

If you run this function, you can setup the reference value and the measuring condition without using the
sample boards. They are generated automatically based on the capital letter of the parts name or the value
used in the step data. (Refer to [Menu 6])
[Menu 6] Reference Value Generation dialog box

If the necessity arises, you can set up the starting and ending step numbers at edit box at (1) and
Reference value of diode measurement at (2) on [Menu 5]. After clicked [OK] button, the reference values
are generated automatically.

You can assign the range of test steps where the reference values are generated.
- 92 -
Reference value of diode measuremenet:

You can preset the reference value used at VF measurement steps (for such Diodes, Transistors, ICs, so
on) among from 0.3V - 1.5V.
The reference value and the measuring conditions will be generated as follows.
R/C/L devices : Follows Value
D/Q/IC devices : Preset value at Reference value of diode measurement
Q/IC devices
: OP (C-E, Pin Pin)
J/JW devices
: SH
Others
: No input
(When the capital letter of Parts name is N, it automatically judges that no device is
inserted there. Therefore Function is substituted by JP automatically)
Reference Value Generation is just generating idealvalue, so that you should examine
them carefully at Step data review function prior to using them in test mode.
Auxiliary
IC Open Reference Value Input
This is the same function as Reference Value Input, but you can learn the reference value for the IC open
test steps only
Even the IC open test steps are mixed with the other measurement steps in your test program, the
reference value input is made at the IC open test steps only, not for other steps.
As for the operation, please refer to aforementioned Reference Value Input.
- 93 -
Optical Reference Value Input

You can learn the optical data for the optical test steps and the coordinates revision points such as the
Board reference point and the Aux. reference point.
1. when any optical data has not been input
If Optical Reference Value Input function was selected, it shows the left window in [Menu 7].
Press [TEST START] SW on the operation panel and then operate the system in accordance with the
menu message, in order to open the menu window where you can input optical data for Board reference
point. In case that the objective point is not visible clearly, try to change Gain and Offset, or adjust the
LEDs brightness properly.
[Menu 7] Optical Reference Value Input

2. when some optical data has already been input
If Optical Reference Value Input function was selected, it shows the left window in [Menu 8].
There are all optical check assignment steps are displayed item by item. The steps displayed in black has
already input the optical data, but the steps displayed in blue has not yet input. Thus fill the checkbox which
optical data should be input and then click [Move] button, so that it opens the menu window where you can
input optical data.
If you click [Select All], you can fill all the check boxes in the block.
If you click [Release All], you can clear all the check boxes in the block.
[Menu 8] Optical Reference Value Input
- 94 -
Optical Reference Value Input menu is displayed when Optical System Installed check
box at Camera System in Option mode is filled, if both Use Auxiliary Reference Point(s)
check box at Auxiliary Reference Point(s) and Use Optical Systemat Optical system in
Data mode are filled.
- 95 -
Test
If you point to Test on Menubar, all available menus are shown there. In this Test menu, you can not only
test the PC boards, but also debug your test data (Review Step Data) and use LCR Meter function so on.
Menu title
Toolbar
Function
Coordinates Revise
Revise possible inclination/scale of the PC boards
Review Step Data
Debug (examine) the test data
Test
Test the PC boards
LCR meter function, using either the tester leads or the flying
LCR Meter
probes
Total
Display or print the test results in various graphs/lists format
Coordinates Revise
Revise possible inclination/scale of the PC boards, whilst reading out the board reference point and the
auxiliary reference point(s) on the PC board at the test position through the CCD camera.
This function is usable when Use Auxiliary Reference Point(s)check box at Auxiliary Reference Point(s) in
Data mode is filled, unless Revise coordinates prior to testing every PCB check box at Primal Setup in
Test mode is filled.
If you run this function, you can revise the XY coordinates in the test data temporarily in
accordance with actual inclination/scale of the PC boards at the test position.
When the test data is saved into the disk, the revised XY coordinates are cleared. (The
XY coordinates that you can save is the original data)
- 96 -
Review Step Data

You can debug (examine) the measuring conditions and the reference value in your test data (Refer to
[Menu 1])
[Menu 1] Review Step Data

If the necessity arises, you can set up the starting and ending step numbers at edit box at (1) and
Examination Modeat (2) and Evaluation of Reference Valueat (3) on [Menu 1].
After pressed the TEST START SW, the progression status of examining data is shown by a bar graph at
In addition, when the test step which Function is substituted by any of [HO](HOLD), [AJ](ADJUST),
[WA](Vtest) was examined, their operation guid e is displayed at (6) on [Menu 1]).
Examination Mode
There are al available examination mode you can select.
+ Automatic guard point setting
+ Step data review
+ Step data test
+ Evaluation of reference value
+ Evaluation of jump steps
+ Evaluation of debug steps
+ Optical data review
+ Optical data test
- 97 -
Automatic guard point setting

It searches guard points automatically when the reference value is quite different from the parts value.
[ Teaching system ]
[ Point system ]
[Menu 2] Automatic guard point setting
- 98 -
Teaching system
In case of Teaching system, it searches the most effective guard point automatically among from all contact
points or the ones existing in the appointed area on the boards.
Search Area
If you select Entire area, you can search the most effective guard point among from all contact points
in your test data.
If you select Limited area, you can search the most effective guard point among from the area, which
size is assignable by the distance toward X-Y direction from each H-PIN and L-PIN position.
Search Speed
If you select Normal, you can search the most effective guard point among from all contact points in
your specified step area.
If you select Fast, you can search the most effective guard point among from the contact points in
your specified step area, with the exception of the contact points of such IC, Q and D.
Target value
Tolerance limits from the parts value. If it measures within this tolerance whilst searching the guard
point, the point is adopted as the effective guard point.
Priority
If you select IC GND, you can search the most effective guard point among from the IC grounds in
your specified step area, in preference to other points.
If you select Manual, you can search the most effective guard point among points appointed by the
camera target, in preference to other points.
Enter the starting and ending step numbers :
You can specify the range of step data to search the guard point automatically.
Point system
In case of Point system, it searches the most effective guard point automatically based on the network
information, which includes the pin numbers for each H -PIN and L-PIN used at the step data.
Search using pin numbers
If you fill Search using pin numbers check box, you can search the most effective guard point
automatically based on the network information, which includes the pin numbers for each H-PIN and
L-PIN used at the step data. In this case, you cannot specify any range of step data to search.
Unless this check box is filled, it will make the same procedure as Teaching system.
Ground or Power Line :
You can enter the pin number used at the ground or power line so on.
In this case, you can search the most effective guard point among from your appointed pin number, in
preference to other points. It is also possible to appoint to other than the ground and power line.
- 99 -
Enter the starting and ending step numbers :

You can specify the range of step data to search the guard point automatically.
The guard point is searched automatically under condition below.
(1) Element is R (Resistors), and the reference value is less 90% of the parts value, whilst
using either DC-CC or DC-CV as the measuring condition.
(2) Element is C (Capacitors), and the reference value is over 130% of the parts value,
whilst using DC-CC, AC-1.6KHz, AC-16KHz or AC-160KHz as the measuring
condition.
When the parts value is not entered correctly or when there is no effective guard point,
occasionally it does not adopt any guard point instead.
Step data review

It you run this function, it opens the step data review menu (=Debugging menu) of your specified step data.
With this menu, you can change or verify the measuring condition, the reference value, and so on. (Refer to
[Menu 3], [Menu 4])
[Menu 3] Step data review (Teaching system)
- 100 -
[Menu 4] Step data review (Point system)

Step data test
You can verify each step data if the reference value and the measuring condition are proper, whilst testing
good sample board(s). If they were judged fail, it shows either [Menu 3] or [Menu 4] for example. Please
change their measuring condition and/or learn the reference value again.
Evaluation of reference value
Comparing Reference value with Value on each step data, if it was bigger than the percentage specified at
(3) in the [Menu 1], it shows either [Menu 3] or [Menu 4] for example. Please change their measuring
condition and/or learn the reference value again.
Under condition, it also shows the step data review menu like [Menu 3] or [Menu 4].
(1) Element is R Reference value is other than ohm, or not input
(2) Element is C Reference value is other than F, or not input
(3) Element is L Reference value is other than H, or not input
(4) Element is D Reference value is over 2.000/ less 0.400V, or not input
(5) Pin to pin (IC), C-E (Q) Function is other than OP
When the parts value is not entered correctly, occasionally it may show the step data
examination menu because the reference value is not compared with the parts value
improperly. (Refer to [Menu 3], [Menu 4])
- 101 -
Evaluation of jump steps

It shows the step data examination menu of the step data, which function is substituted by JP. (Refer to
[Menu 3], [Menu 4])
With these menus, please change their measuring condition and/or learn the reference value again.
Optical data review
It shows the step data examination menu of optical step data.
First select the target that you want to examine and click [OK] button on the [Menu 13].
And then press the TEST START SW so that it shows the optical data review menu. (Refer to [Menu 4])
Please change their measuring condition and/or learn the optical data again.
[Menu 5] Optical data select menu

Optical data test
You can verify each optical step data if the optical scene data is proper, whilst testing good sample board(s).
If the optical scene data is judged fail, it shows [Menu 6] for example. Please change their measuring
condition and/or learn the optical data again.
- 102 -
[Menu 6] Optical data review
Test
Pressing TEST START SW on the operation panel whilst the display is on the test mode ([Menu 7]), it starts
testing the PC board(s) and judges pass or fail.
[Menu 7] Test menu
- 103 -
LCR Meter
You can use the APT-9400 system as simple digital & analog waveform tester. Plug the tester lead wires in
the tester terminals in front of the APT-9400.
Touch the objective device (electrode) to be measured with the tester lead wires, and then select the
appropriate Element(RESISTOR, CAPACITOR, COIL, DIODE), so that the measured value is displayed
on the spot.
You can change each condition at Element, Measure Mode, Auto. Range and Measure Time. (Refer to
[Menu 8])
[Menu 8] LCR Meter menu
- 104 -
Total
This enables to collect the test result and outputs various data to the monitor and the printer.
Menu title
Erase Total
Step
Composition
Ratio
Fail Total
Graph
Toolbar
Function
Initialize (clear) your collection data
Classify your test data according to the type of test (component test,
open check, short check, etc.) and display it on the list and the graph
Display the fail collection data according to the fail type (Short, Open,
Low-NG, Up-NG, etc)
Display the fail occurrence status by a circle graph, a bar graph, so on
Erase Total
If you run this function, you can initialize (clear) your collection data.
[Menu9] Erase Total Data

Erase hourly total
If you fill Erase hourly total check box and click [OK] button, the collection data of hourly failure will be
initialized.
Erase daily total
If you fill Erase daily totalcheck box and click [OK] button, the daily collection data displayed at Test mode
menu (Total, Passed, Failed, Fail%) will be initialized. (Refer to (1) in [Menu 10])
[Menu 10] Erase daily total (Test mode menu)
- 105 -
Once Erase daily total function was executed, the data collection per group is also
initialized (cleared).
Erase aggregate total

If you fill Erase aggregate totalcheck box and click [OK] button, the aggregate collection data displayed at
Test mode menu (Total, Passed, Failed, Fail%) will be initialized. (Refer to (2) in [Menu 10])
Erase Total Data is implemented to the test data loaded in the memory or under
generation.
The test data saved in the disk is never affected by Erase Total Data until Save or Save
As is implemented.
Step Composition Ratio
You can classify the test data according to the type of test (component test, open check, short check, etc.)
and display it on the list and the graph. (Refer to [Menu 11])
If you click [Print] button, the summary data is output to the printer. Also if you click [Save] button, the test
result in text format is output to the disk.
[Menu 11] Step Composition Ratio
Step Composition Ratio displays the test data loaded in the memory or under generation.
- 106 -
Fail Total
You can display the fail collection data according to the fail type (Short, Open, Low-NG, Up-NG, etc).
They are displayed in order of fail count number.
[Menu 12] Fail total (Left>Teaching system, Right>Point system)

Fail Totalgroup box on [Menu 20] can select type of failure. In case of displaying the whole collection data,
select Allradio button.
At Daily/Aggregate Totalgroup box, you can also select whether it outputs the daily collection data or the
accumulated data in the past.
The number at Display the **most common failures decides how many failures from the worst case are
displayed.
If you click [Print] button, the summary data is output to the printer. Also if you click [Save] button, the fail
collection data in text format is output to the disk.
The fail collection data is saved in the disk together with the test data. Use Save or Save
As function to save your test data before you finish your work or change the test data.
Unless your test data was saved every time when you finished your work or changed the
test data, the fail collection data is not updated, so that it will be unreliable.
- 107 -
Graph
You can display the fail occurrence status (Breakdown of all failure data, Last 30 days failures, Hourly
failures) and the fail located distribution on the board (Failures by location) by a circle graph, a bar graph,
and so on.
[Menu 13] Graph

Fail Total Graph group box on [Menu 13] can select the fail collection graph that you want to display.
At Daily/Aggregate Totalgroup box, you can also select whether it outputs the daily collection data or the
accumulated data in the past.
- 108 -
Tool
If you point to Tool on Menubar, all available menus are shown there. Tool menu involves various useful
functions to program or correct a test data and self -diagnosis function and so on.
Menu title
Toolbar
Function
Generate the test program for multiple identical boards
hooked together by a cookie-sheet pattern or some other
Group Addition
means
Set up Location name (1A, 1B, 1C ) on each step data
Auto Location Set
automatically
Change Parts, Value, etc on your specified step data in
Change Step Data
the block
Change ground coordinates on your specified IC steps
Coordinates Change for
(VF measurement steps, IC open measurement steps) in
Ground
the block
Optimization
Coordinates
Self Diagnosis
Pin Search
Optimize the step data

Change direction of PC board or the Board reference
point so on
Verify the safe system, the operation panel, the
measuring unit so on
Search the bottom pin number used in Bottom probes,
Extension Scanner Board (option), and Coaxial Scanner
Board (option)
Mode Setting
Test Program Setup
Manage environmental condition for test data, test, tester,

options so on
Convert CAD data (dedicated Takaya format) or any
existing test data (include APT-8400s) to be usable at the
APT-9400
Speed
Up
the
program
CA9 File Convert
test
Minimize the probe movement and save the test program

in your disk
Load CAD data files (extension :.CA8, .CA9, .ASC)
- 109 -
Group Addition
This function is usable for generating the test program for multiple identical boards hooked together by a
cookie-sheet pattern or some other means.
[Menu 1] Group Addition
(Gr.1)
(Gr.2)
(Gr.1)
Parallel
(Gr.1)
(Gr.2)
Reverse X
(Gr.2)
(Gr.1)
Reverse Y
(Gr.2)
Reverse X,Y
As shown above, there are four types of generation types. You can choose any one that needs to generate
your test program.
If Group Addition function was implemented, the test program is separated into groups
automatically.
- 110 -
Prior to implementing Group Addition function, verify that the original test data well
completed at Step data test menu.
How to generate the test program for whole 10 boards (PCB1 to PCB10), based on the PCB1,
which Board ref. point is A, Aux. ref. point1 is B, and Aux. ref. point2 is C.
C'
A'
PCB2
F'
E'
PCB4
F''
E''
PCB6
F'''
E'''
PCB8
F''''
E''''
PCB10
B'
B
PCB1
D
1
PCB3
C
PCB5
D'
2
PCB7
D''
3
PCB9
D'''
5
D''''
7
10
[Sample PCB]
1.
After generated the test program for PCB1, debug it at Step data review menu carefully to verify that no
additional data correction would be required later.
2.
Select [Tool] > [Group Addition] on the Menubar. (Refer to Display1)
[Display 1] Group Addition menu

3.
Fill Reverse X and Y Directionradio button on Group Addition menu, and thenclick on [NEXT] button.
(Refer to Display 2)
- 111 -
[Display 2]
4.
Click on [NEXT] button on Display 2.

(Never enter any figure in Number of groups in the X direction and Number of groups in the Y
direction, because Reverse X and Y Direction mode does not add any location number. This is
operated at Change Step Datafunction in the later process)
[Display 3]
5.
Fill Incline and scale of the PCBradio button on the Display 3, and then click on [NEXT] button.
- 112 -
[Display 4]
6.
It shows Do you use the first auxiliary reference point?on the Display 4. Then click on [Yes] button.
[Display 5]
7.
It shows Do you use the second auxiliary reference point? on the Display 5. Then Click on [Yes]
button.
8.
It shows Press [TEST START] SWon the Display 6. Then press [TEST START] SW on the operation
panel.
[Display 6]
9.
Center the camera target on the Board reference point (A) for the PCB2, and then press [ENTER] SW
on the operation panel.
10. Center the camera target on the Auxiliary reference point1 (B) for the PCB2, and then press [ENTER]
SW on the operation panel.
11. Center the camera target on the Auxiliary reference point2 (C) for the PCB2, and then press [ENTER]
12. Press [TEST STOP] SW and next click on [OK] button. Then the test program for PCB2 is
automatically generated. There are now two test groups (GR1=PCB1,GR2=PCB2).
(At this stage, Board ref. point is A, Aux. ref. point1 is B, Aux. ref. point2 is C)
13. Next, change the location data for PCB2 (GR2).
In case of Fig.1 sample, the location name for PCB2 (GR2) should be changed to 1A>2D, 1B>2C,
2A>1D, and 2B>1C as shown below.
14. Select [Tool] > [Change Step Data] on Menubar. (Refer to Display 7)
15. Enter the start and end step number for PCB2 (GR2) in Enter the starting and ending stepcombo box.
- 113 -
(Refer to Display 7)
In this case, be sure to insert a comma (,) between the start and end step number.
[Display 7] Change Step Data menu

16. Key input Search categoryand Change categoryas shown in Display 7.
17. Click on [Execute] button on the Display 7.
18. Repeat the above process 14 to 17 to change their location name in PCB2 (GR2) ; 1A>2D, 1B>2C,
2A>1D, and 2B>1C exactly.
19. Next, get two test programs for PCB1 and PCB2 together to make one GR only as shown below.
20. Select [Reference] > [Reference Value Input] on Menubar. (Refer to Display 8)
[Display 8]
21. Click on [Start Step] box for Group 2, and then press [Enter] key on the keyboard.
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[Display 9]
22. Press [Delete] key on the keyboard, and then press [Enter] key. (Refer to Display 9)
(Their two test programs for PCB1 and PCB2 get together to be one GR)
23. Next, shift the Board reference point and the Auxiliary reference points for the test program
(PCB1+PCB2) as shown below.
24. Select [Test] > [Review Step Data] on Menubar.
Press [TEST START] SW on the operation panel, and then verify the test program at Step data review
if their all test steps judged pass. (Please fine debug if necessary)
25. To shift the Board reference point from A to D point, select [Tool] > [Coordinates] > [Board Reference
Point Change] on Menubar. (Refer to Display 10)
[Display 10]
26. Click on [Execute] button.
Press [TEST START] SW on the operation panel to center the camera target on the D point. And then
press [ENTER] SW on the operation panel.
Press [TEST STOP] SW so as the camera goes back to the home position. (the Board reference point
is now shifted to the D point)
27. Next, to shift the Auxiliary reference poin1 to E point and also the Auxiliary reference point2 to F point,
select [Tool] > [Mode Setting] > [Data Mode] on Menubar. (Refer to Display 11).
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[Display 11]
28. Click on Auxiliary Reference Point(s). (Refer to Display 12)
[Display 12]
29. Press [TEST START] SW on the operation panel to center the camera target on the new Board
reference point (D), and then press [ENTER] SW.
30. Center the camera target on the new Auxiliary reference point1 (E), and then press [ENTER] SW.
31. Center the camera target on the new Auxiliary reference point2 (F), and then press [ENTER] SW.
32. Click on [OK] button on the Display 12, so that in the test program (PCB1+PCB2) the Board reference
point is now shifted to the D point, the Auxiliary reference point1 to the E point, and the Auxiliary
reference point2 to the F point.
33. Next, to generate the test program for both PCB3 and PCB4, select [Tool] > [Group Addition] on
Menubar. (Refer to Display1)
34. Fill Parallel movementradio button on Group Addition menu, and then click on [NEXT] button. (Refer
to Display 2)
35. Click on [NEXT] button on Display 2, without specifying Number of groups in the X direction and
Number of groups in the Y direction.
36. Fill Incline and scale of the PCBradio button on the Display 3, and then click on [NEXT] button.
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37. It shows Do you use the first auxiliary reference point?on the Display 4. Then click on [Yes] button.
38. It shows Do you use the second auxiliary reference point? on the Display 5. Then Click on [Yes]
button.
39. It shows Press [TEST START] SWon the Display 6. Then press [TEST START] SW on the operation
panel.
40. Center the camera target on the Board reference point (D) for PCB3+PCB4, and then press [ENTER]
41. Center the camera target on the Auxiliary reference point1 (E) for PCB3+PCB4, and then press
[ENTER] SW on the operation panel.
42. Center the camera target on the Auxiliary reference point1 (F) for PCB3+PCB4, and then press
[ENTER] SW on the operation panel.
43. Press [TEST STOP] SW and next click on [OK] button. Then the test program for PCB3+PCB4 is
automatically generated. There are now two test groups (GR1=PCB1+PCB2, GR2=PCB3+PCB4).
(At this stage, Board ref. point =D, Aux. ref. point1=E, Aux. ref. point2=F)
44. Repeat the same process 25 43 above, in order to generate the test program for PCB5+PCB6,
PCB7+PCB8 and PCB9+PCB10.
45. Next, to shift the Auxiliary reference poin1 to E point and also the Auxiliary reference point2 to F
point, select [Tool] > [Mode Setting] > [Data Mode] on Menubar. (Refer to Display 11).
46. Click on Auxiliary Reference Point(s). (Refer to Display 12)
47. Press [TEST START] SW on the operation panel to center the camera target on the new Board
reference point (D), and then press [ENTER] SW.
48. Center the camera target on the new Auxiliary reference point1 (E), and then press [ENTER] SW.
49. Center the camera target on the new Auxiliary reference point2 (F), and then press [ENTER] SW.
50. Click on [OK] button on the Display 12, so that in the test program (PCB1 PCB10) the Board
reference point is now shifted to the D point, the Auxiliary reference point1 to the E point, and the
Auxiliary reference point2 to the F point.
51. Next, divide the test program into 10 groups correctly as shown below.
At this stage, the test program is divided into 5 groups (GR1=PCB1+PCB2, GR2=PCB3+PCB4,
GR3=PCB5+PCB6, GR4=PCB7+PCB8, GR5=PCB9+PCB10).
So this must be changed to 10 groups (GR1=PCB1, GR2=PCB2, GR3=PCB3, GR4=PCB4,
GR5=PCB5, GR6=PCB6, GR7=PCB7, GR8=PCB8, GR9=PCB9, GR10=PCB10)
52. Beforehand, check Step list to record the start step number of each PCB (PCB1,PCB2,PCB10).
53. Select [Reference] > [Reference Value Input] on Menubar. (Refer to Display 13)
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[Display 13]
[Display 14]
55. Enter the start step number of PCB2 (Group2), and then press [Enter] key. (Refer to Display 14-Right)
[Display 15]
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[Display 16]
[Display 17]
[Display 18]
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[Display 19]
[Display 20]
[Display 21]
- 120 -
[Display 22]
71. Enter the start step number of PCB10 (Group10), and then press [Enter] key. (Refer to Display
22-Right)
After all above operation, the test program generation for PCB1 PCB10 was finished.
Examine the test program at Step data review menu carefully. (Please fine debug if necessary) After that,
save it into your disk.
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Auto Location Set

You can set up Location name (1A, 1B, 1C ) on each step data automatically, according to your
assignment at Fail Map in Data mode.
[Menu 2] Auto Location Set

If Border set for Locationcheck box was filled, you can set up the individual border at each Fail map area
manually using the camera. If not filled, the system sets up their borders automatically according to both
maximum and minimum coordinates included in the test data.
In case that Border set for Location check box was not filled, the Fail map area is
separated with the identical width.
If Border set for Locationcheck box was not filled while Fail Map in Data mode has not
been assigned, occasionally the Fail map area will not be separated properly.
Change Step Data

You can change Parts, Value, etc on your specified step data in the block
The operation is the same as Change Step Data.
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Coordinates Change for Ground

You can change ground coordinates on your specified IC steps (VF measurement steps, IC open
measurement steps) in the block. This function is not available when Coordinates Management (Data
mode > Coordinates Management) is selected to Point system.
[Menu 3] Coordinates Change for Ground

Enter the parts name (Wild cards such like * and ? are also acceptable) in Search parts edit box on [Menu
3] above and then click [Search] button, so that the specified parts name is searched and displayed in
Object parts list box at the left hand. (Refer to [Menu 4])
[Menu 4]
Next, use either [Select>>] button or [All Sel.>>] button to shift the parts which ground coordinates need to
be shifted in the block to Select parts list box at the right hand.(Refer to [Menu 5])
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[Menu 5]
Then, click [Execute] button, so that it shows [Menu 6] on the display below.
[Menu 6]
Click [Change] button and press [TEST START] SW on the operation panel. After then, operate the
APT-9400 according to the menu guidance in order to change the ground coordinates to the optional point.
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Optimization
You can optimize the step data.
Menu title
Coordinates Sort
Parts Name Sort
Set
Combination
Toolbar
Function
Rearrange the test steps to minimize the distance the
probes move to test
Rearrange the test steps in the order of the initial letter of
the parts name
Set plural test steps to be tested in the block by all four
Measurements
probes effectively
Clear
Release Combination measurement steps back to normal
Combination
Measurements
(single step)
Coordinates Sort
This rearranges your test step to minimize the distance the probes move to test. Owing to this, normally the
testing time is cut down.
[Menu 7] Coordinates Sort

Fill Set combination measurements, Input partition length and/or Sort steps that have the same part
namecheck box if necessary.
Fill Enter the starting and ending steps combo box if you need to specify the area where step data is
rearranged.
If you click [OK] button, you can execute the data rearrangement.
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Set combination measuremens

If Set combination measurementscheck box was filled, the step data is set for combination measurement
at the same time as the data rearrangement. (As for Combination measurement, refer to Set Combination
Measurements)
Plural test steps which are set for combination measurement can be tested at a time when the probes went
down.
Even if Set combination measurements check box was filled, it is only test steps with
[*,N,N,*] (access probe) that combination measurement can be set.
Fill Use Probe Permission Modecheck box (Data mode > Coordinates Management)
when you wish to set combination measurement to the test steps which access probe are
set other than [*,N,N,*] as well.
After the combination measurement was set, their access probe is changed automatically.
So, in case that you would not like to change any probe access, please don not fill Set
combination measurementscheck box.
Input partition length

This enables to set the partition area optionally with specified distance (X,Y directions), whereby the data
rearrangement is managed.
Unless Input partition length check box is filled, the data rearrangement is made by the partition area
which is set automatically.
Sort steps that have the same part name

This enables to rearrange the test steps which use the identical part name and programmed in series as
well.
Unless Sort steps that have the same part namecheck box is filled, they are not rearranged.
Test steps which use the identical part name and programmed in series means, for
example, ICs, Connectors and Transistors, which need plural test steps to be tested.
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Parts Name Sort

This rearranges your test steps in the order of the initial letter and the number of the parts name.
[Menu 8] Parts Name Sort

Fill Location by locationand/or Set combinations measurementscheck box if necessary.
Fill Starting and ending step numbers combo box if you need to specify the area where step data is
rearranged.
If you click [Execute] button, you can execute the data rearrangement.
Location by location
This enables to rearrange the test steps in the order of the initial letter and the number of the parts name,
according to their Location name (Loc.).
Set combinations measurements
This enables to rearrange the test steps in the order of the initial letter and the number of the parts name,
even though they are already set for combination measurement.
Unless Set combinations measurements check box is filled, the step data which is already set for
combination measurement cannot be rearranged properly.
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This sets plural test steps to be tested in the block by all four probes effectively.
[Menu 9] Set Combination Measurements

On [Menu 9] above, fill Enter the starting and ending step numberscombo box, and then click [OK] button.
In case that you wish to specify the whole test steps, click [OK] button without entering any step number.
For example, our data programming general transistors consist of three test steps for checking B-E (Base
to Collector), B-C (Base to Emitter) and C-E (Collector to Emitter). In this case, usually the probes should go
down three times to test.
But if these three steps were set for combination measurement, it can have three probes go down at a time
to measure them in the block. Because of less probing down, the test time is much cut down.
This method is called Combination measurementand is the most effective to cut down the test time.

This releases Combination measurement steps back to normal (single step).
[Menu 10] Clear Combination Measurements

On [Menu 10] above, fill Enter the starting and ending step numbers combo box, and then click [OK]
button. In case that you wish to specify the whole test steps, click [OK] button without entering any step
number.
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Coordinates
After the test data was created, you can change direction of PC board or the Board reference point so on.
This change is made on the test data in the memory.
Menu title
Toolbar
Function
90 Degrees Turn to
Turn the coordinates on the step data clockwise with 90
Clockwise
degrees
180 Degrees Turn to
Clockwise
degrees
270 Degrees Turn to
Clockwise
degrees clockwise with 270 degrees
Reverse Turn
Turn the coordinates on the step data to reverse
Board
Reference
Change the Board reference point to any other point
Point Change
Fine amend inclination of the X,Y coordinates whilst using the
PCB Incline Amend
PC board
Fine amend inclination/scale of the X,Y coordinates whilst
Incline/Scale Amend
using the PC board
90 Degrees Turn to Clockwise

As shown in [Fig.1] below, you can turn the coordinates on the step data clockwise with 90 degrees.
BRP
IC
90 Degrees
IC
BRP
[Fig.1] 90 degrees turn to clockwise
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[Menu 11] 90 degrees turn to clockwise

Turn your sample PC board clockwise with 90 degrees, and click [Execute] button on the dialog box.
Then press [TEST START] SW on the operation panel, in order to set up the Board reference point on the
PC board that was turned clockwise with 90 degrees. After the Board reference point was set up, the
coordinates on the step data are converted automatically.
Change the probe access

If you click [Execute] button whilst Change the probe accesscheck box is filled, their access probe at the
step data also change properly in order not to have the probes contact to the component.
For example, let us assume that the IC shown in [Fig.2] is J-lead type and the test steps are set for
( *,N,*,N ) originally. ((A)=Probe 1, (B)=Probe 3)
In this case, the probes may contact to the IC package itself after the data conversion, unless the access
probe was changed at that time.
BRP
IC
(A)
(A)
90 Degrees
(B)
IC
BRP
(B)
[Fig.2] Access probe change

In above case, therefore you are recommended to fill Change the probe access check box, so that the
access probe will be automatically replaced with ( *,N,N,* ) that can prevent the probes from the possible
interference. ((A)=Probe 4, (B)=Probe 1)
If you want to keep the original access probe, please dont fill Change the probe accesscheck box.
- 130 -

BRP
IC
IC
180 Degrees
BRP


BRP
(B)
IC
(A)
IC
(A)
180 Degrees
(B)
BRP
- 131 -
access probe will be automatically replaced to prevent the probes from the possible interference.
If you want to keep the original access probe, please dont fill Change the probe accesscheck box.

IC
IC
270 Degrees
BRP
BRP


- 132 -
(B)
IC
IC
(A)
270 Degrees
(A)
(B)
BRP
BRP

access probe will be automatically replaced with ( N,N,*,* ) that can prevent the probes from the possible
interference. ((A)=Probe 3, (B)=Probe 4)
If you want to keep the original access probe, please don t fill Change the probe accesscheck box.
Reverse Turn
This can turn the coordinates on the step data to reverse.
At the programming of Discrete components, there is case that X,Y coordinates are learnt from the loaded
side of the PC board. In this case, they need to convert the X,Y coordinates in reverse so that the probes
can contact from the soldering side, using Reverse Turn function.
[Menu 14] Reverse turn

Turn your sample PC board in reverse toward Y-direction, and click [Execute] button on the dialog box.
PC board that was turned in reverse. After the Board reference point was set up, the coordinates on the
step data are converted automatically.
When Reverse Turn function is used, the Board reference point must be common and
visible from both the loaded side and the soldering side.
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Board Reference Point Change

You can change the Board reference point to any other point.
[Menu 15] Board Reference Point Change

Place your sample PC board on your tester, and click [Execute] button on the dialog box. Then press [TEST
START] SW on the operation panel and specify a new Board reference point by the camera.
If you are using the Optical system (option), it would be necessary to learn the image data
for the Board reference point again after changed it.
PCB Incline Amend

You can amend inclination of the X,Y coordinates in the block whilst using the PC board.
For example, after a test data was manually created, when you realized that the PC board had been placed
on the tester rails slantly and that the X,Y coordinates saved in the test data need to be amended in the
block, or when the set direction of the PC board changed later, you can use PCB Incline Amend function.
This amendment is automatically by just positioning the Board reference point and the Auxiliary reference
point on your PC board.
Auxiliary reference point is usable only when Use Auxiliary Reference Point(s) check
box (Option mode > Auxiliary Reference Point(s)) is filled.
Unless Use Auxiliary Reference Point(s) check box is filled, it searches the X,Y
coordinates which is most away from the Board reference point to use as the amend point
for PCB Incline Amend function.
Incline/Scale Amend
You can amend inclination/scale of the X,Y coordinates in the block whilst using the PC board.
This amendment is automatically by just positioning the Board reference point and the Auxiliary reference
point 1,2 on your PC board.
Auxiliary reference point 1,2 are usable only when Use Auxiliary Reference Point(s)
check box (Option mode > Auxiliary Reference Point(s)) is filled.
Unless Use Auxiliary Reference Point(s) check box is filled, it searches the X,Y
coordinates which are most away from the Board reference point to use as the amend
points for PCB Incline Amend function.
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Self Diagnosis
This diagnoses various key functions, such as the switches, the sensors, the measuring unit, and so on.
Menu title
Toolbar
Function
Check up/down speed of both the probes and the sensor
Probe Movements
probes
Check the operation panel SWs
Operation Panel
Check various safe SWs (Emergency Stop SW, Safe SW,
Special Switches
Interference Protection SW, so on)

Check various sensors used at each X, Y, X-axis and the PCB
Sensor
loading mechanism of the In-line system (option)
Measuring Unit
Check the measuring unit
Scanner Board
Check the relays on the Scanner board at the measuring unit

Check Extension Scanner Board (option) and open connection
Extension Scanner
Board (64 pin)
of the bottom probes

(this menu is not displayed unless the Extension Scanner
Board is installed)
Coaxial
Scanner
Board (12 pin)

Programmable DC
Voltage
Check Coaxial Scanner Board (option)
(this menu is not displayed unless the Coaxial Scanner Board

is installed)
Check Programmable DC Power Supply Board (option)
(this menu is not displayed unless the Programmable DC

Power Supply Board is installed)
Probe Count
Manage Probe counter
Stray Capacity
Check Stray capacity of each probes to display the graph
IC Open
Adjust Probe
Check the measuring unit for IC Open Test System (option)
Use when the probes and the measuring cables are replaced
- 135 -
When the up/down speeds of both the probes and the sensor probes are checked, be
sure not to contact them directly on the tester rails. Otherwise they may have serious
damage.
Probe Movement
You can check the up/down speed of both the probes and the sensor probes.
[Menu 16] Probe Movement

Click [MOVE] button on the window, and then press [TEST START] SW on the operation panel so that all
probes come to the middle of the work area. (Refer to [Menu 16])
If you click an objective probe button ([ALL], [Probe 1 4], [L-Probe] or [R-Probe]) to check their up/down
speed.
You can use [PROBE 1 4] SW and [PROBE DOWN] SW on the operation panel for
[Probe 1 4] button, after pressed [TEST START] SW.
Be sure to execute this check after removed all PC boards from the work area.
- 136 -
Operation Panel
Clicking Operation panel on Self Diagnosis menu, it shows the graphic image on the display. (Refer to
[Menu 17]) Then if you press the objective SW on the operation panel, their SW lights onthe graphic image.
[Menu 17] Operation Panel
Special Switches
Clicking Special Switches on Self Diagnosis menu, it shows the check window on the display. (Refer to
[Menu 18]) These special SWs are Emergency Stop SW, Cover SW and Reset SW. (Emergency Stop
Signal is one of signal name, instead of any SW) Press the objective SW on the tester, referring to [Menu
18] below.
[Menu 18] Special Switches

1) The Cover SW should be checked whilst opening/closing the safe cover by hand.
2) There is no Emergency Stop SignalSW on the tester. This turns ON when the tester
is suspended under the emergency stop condition.
- 137 -
Sensor
Clicking Sensor on Self Diagnosis menu, it shows the check window for X,Y,Z home sensors and limit
sensors on the display. (Refer to [Menu 19, 20]) Then if you close the objective SW on the tester, their SW
turns on.
[Menu 19] Sensor

Whilst this check window is displayed, all X,Y,Z motors are disengaged from the excitation, so that you can
move their motor axis freely by hand.
Because all X,Y,Z motors are disengaged from the excitation, pay much attention not to hit
the probe to the tester rails on when it is moved by hand.
- 138 -
Mesuring Unit
You can check the measuring unit in the tester. Clicking Measuring Uniton Self Diagnosis menu, it shows
the check window for the measuring unit on the display. (Refer to [Menu 19, 20])
Then if you click on [Execute] button, it diagnoses the measuring unit and shows the result as the example
shown in [Menu 21] below. (The left window shows PASS, the right window shows FAIL)
[Menu 21] Measuring Unit
Scanner Board
You can check the relays on the Scanner board included in the measuring unit. Clicking Scanner Board
on Self Diagnosis menu, it shows the graphic image of the Scanner board on the display.
Then if you click on [Execute] button, it diagnoses their relays and shows the result as the example shown
in [Menu 22, 23] below. ([Menu 22] shows PASS, [Menu 23] shows FAIL)
[Menu 22] Scanner Board (PASS Judgment)
- 139 -
[Menu 23] Scanner Board (FAIL Judgment)
Extension Scanner Board (64pin)

Relay Check
You can check Extension Scanner Board (option). Clicking Relay Checkfrom Extension Scanner Board
(64 pin) menu, it shows the graphic image of the Extension Scanner Board on the display.
Then if you click on [Execute] button, it diagnoses it and shows the result as the example shown in [Menu
24] below. ([Menu 24] shows PASS judgment)
[Menu 24] Extension Scanner Board (PASS Judgment)
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Open Check
You can check open connection of the bottom probes, which are connected to the Extension Scanner
Board. Clicking Open Checkfrom Extension Scanner Board (64 pin), it shows the check window for the
Extension Scanner Board on the display.
Move the tray to the test position and then click on [Execute] button, so that it diagnoses and shows the
result as the example shown in [Menu 25] below. ([Menu 25] shows PASS judgment)
[Menu 25] Extension Scanner Board / Open check (PASS Judgment)
This Extension Scanner Board (64 pin)does not appear on Self Diagnosis menu unless
the Extension Scanner Board (option) is installed in the tester.
- 141 -
Coaxial Scanner Board (12pin)

You can check Coaxial Scanner Board (option). Clicking Coaxial Scanner Board (12 pin), it shows the
graphic image of the Coaxial Scanner Board on the display.
26] below. ([Menu 26] shows FAIL judgment)
[Menu 26] Coaxial Scanner Board (FAIL Judgment)

This Coaxial Scanner Board does not appear on Self Diagnosis menu unless the
Coaxial Scanner Board (option) is installed in the tester.
Programmable DC Voltage
You can check Programmable DC Power Supply Board (option).
Clicking Programmable DC Voltage, it shows the check window for the Programmable DC Power Supply
Board on the display.
[Menu 27] Programmable DC Voltage (PASS Judgment)
- 142 -
This Programmable DC Voltage does not appear on Self Diagnosis menu unless the
Programmable DC Power Supply Board (option) is installed in the tester.
Probe Count
The tester alerts with a message when the probes reached your preset number for probe down count.
(Refer to [Menu 28])
The message Now is time to exchange probe No. (1,2,3,4) is for the probes, and the message Now is
time to maintenance sensor probe No. (1,2)is the sensor probes.
[Menu 28] Probe Count (Left> Probe, Right>Sensor Probe)

[Probe 1-4 Stroke Count] edit box, [R/L-Sensor Stroke Count] edit box
They display the actual probe down count.
[Reset probe stroke count] button
You can initialize the life limit number (Probes Life Limit, Sensor probes Life Limit) to 0.
[Set probes maintenance interval] button
You can assign the number of Probes Life Limit or Sensor probes Life Limit. These life limit numbers can
be substituted by 0 9999999. But when 0 was input, these messaged do not appear.
[Set probe stroke count] button
You can change the probe down count displayed in Probe 1-4 Stroke Count edit box and R/L-Sensor
Stroke Count edit box as you like ( 0 9999999).
- 143 -
Neither Now is time to exchange probe No. (1,2,3,4) nor Now is time to maintenance
sensor probe No. (1,2)is to constrain you to maintain the probes. They are just guideline
necessary for your maintenance.
Stray Capacity
You can measure Stray capacity of between the probes and display them on the graph.
If [Stray Capacity] button is clicked, the stray capacity is measured one time and shown on the graph.
If [Loop Stray Capacity] button is clicked, this check is executed continuously and the real time display on
the graph is possible. (Refer to [Menu 29])
[Menu 29] Stray Capacity

On the X-axis, there show the probes combination. (The figure shows the probe number. U means the
flying probes and Dmeans the bottom probes)
- 144 -
IC Open
You can check the measuring unit for IC Open Test System (option).
Clicking IC Open, it shows the check window for the IC Open Test System on the display.
[Menu 30] IC Open (PASS judgment)
Adjust Probe
You can use this function when the probes and the measuring cables are replaced. (Refer to [Menu 31])
After clicked [Probe 1-4] button, press [TEST START] SW on the operation panel. Then, the assigned
probe moves to the front, so as you can maintain the probe easier whilst the safe cover is open.
[Menu 31] Adjust Probe

After you probe maintenance finished, close the safe cover and click [Close] button
- 145 -
Pin Search
This function enables you to search the pin number of the bottom probes, Extension Scanner Board
(option) and Coaxial Scanner Board (option).
Plug the tester lead wire in the tester terminal (+ terminal), and then connect it to the bottom probe so that
the objective pin number is displayed as shown in [Menu32] below.
[Menu 32] Pin Search
- 146 -
Mode Setting
You can configure Data mode, Test mode, Master mode and Option mode as you like.
Data mode and Test mode are stored in each test program, and Master mode and Option mode are stored
in Master. Mdt file in the system directory.
Menu title
Data Mode
Test Mode
Master Mode
Option Mode
Toolbar
Function
Set up your PCB size, Camera/Probe Offset, Board Reference
Point and so on before creating test data
Set up testing target, output format, display mode during test and
so on
Set up environmental condition of the tester and its system
software
Set up environmental condition of option unit
Data Mode
Clicking Data mode (Tool > Mode Setting > Data mode), it shows Data mode window as shown in
[Menu33] below.
[Menu 33] Data mode

Be sure to setup Data mode properly before creating a test program. Data mode configuration is always
stored together with your test program created. So, when a test program was loaded from the data drive or
when you changed the model of PCB, Data mode is always renewed accordingly.
Data mode is stored in the disk together with the test data.
- 147 -
Be sure to set up or check all parameters available in Data mode before a new test data is
created.
Conveyor Set Up
Use PCB extension support kit (Option)
Fill this check box when PCB extension support kit (option) is used to support the non-quadrangle PCB.
This parameter is displayed only when Use PCB support extension kit check box in the Option mode is
filled.
Use Vacuum unit (Option)
Fill this check box when Vacuum unit (option) is used to support the PCB.
This parameter is displayed only when Use vacuum unit check box in the Option mode is filled.
If you click [Vacuum] button, you can verify if the Vacuum unit functions well or not.
PCB size
Enter your PCB size in Length (X) and Width (Y) and then press [TEST START] SW on the operation panel,
so that the rear conveyor moves automatically to setup the conveyor width. The conveyor width is always
set for Width (Y) plus Conveyor marginon the menu.
When you input the conveyor width, you must confirm that there is no PCB on the conveyor rail.
If there is, it may damage the PCB or the conveyor rail!
Camera/Probe Offset
Camera/Probe Offset is the distance between each probe and camera target marker.
Using the Camera/Probe Offset, all probes are able to contact on the XY coordinates on the PC board
where were read out by the camera target marker correctly.
Reading out the probing mark by the camera target marker, you can set up the Camera/Probe Offset.
[Menu 34] Camera/Probe Offset
- 148 -
Because Camera/Probe Offset setting is very important, never fail to set up before a new
test data is created. Otherwise the probes may not contact on the XY coordinates on the
PC board where were read out by the camera target marker.
Board Reference Point
Pressing [TEST START] SW on the operation panel, the camera moves over the Board reference point
preset on the PC board where is fine adjusted by the camera target marker displayed on the monitor.(Refer
to [Menu 35])
[Menu 35] Board Reference Point

The Board reference point is very important, and it must be preset whenever a new test data is created
and/or when the set position of your PCBs changed. Red color point in the graphic map indicates the Board
reference point of the test data.
How to setup Board reference point

1) Set your PC board into the tester.
2) Open Data mode window (Tool > Mode setting > Data mode).
3) Click Board reference point or [Next] button in Data mode.
4) Press [TEST START] SW on the operation panel.
5) APT-9400 moves the camera target marker over the Board reference point.
6) Center the camera target marker to the Board reference point exactly.
7) Press [ENTER] SW on the operation panel to determine the point.
Because Board reference point is very important, never fail to set up before a new test data
is created and/or when the set position of your PCBs changed. Otherwise the probes may
not contact on the XY coordinates on the PC board correctly.
- 149 -
Coordinates Management
This manages Coordinates Management, A/B-side Exchange Function, Motor Control Mode and Use
Probe Permission Mode. (Refer to [Menu 36])
[Menu 36] Coordinates Management

Coordinates Management
There are two methods to manage test data.
One is so-called Teaching systemin which the probe comes in direct contact with each land (or pad)
of the component. Another is so-called Point system in which the number is applied to the contact
point prepared on each circuit pattern. You can use both methods at the same time as well.
Advantages to using the Teaching system would include faster testing speed because we can optimize
the distance that the probes travel by rearranging the test steps.
Advantages to using the Point system would include shorter development times because of less input
of the X, Y coordinates that should be managed in the test data. In addition, this method shows the
continuity of mutual components through their node information.
A/B-side Exchange Function
This is a function to exchange two test programs (Ex. It is a test program for both component side and
the reverse side of the SMT board with double-face.), which are stored and managed in the same
memory by inputting through a keyboard operation or through I/O port for the optional In-line system
(option) in a very short time. If you want to use this function, fill this checkbox here.
(NOTE)
If this function is turned on, APT-9400 displays either [Side-A] or [Side-B] on the top of Titlebar and on
the middle of the Test menu. So the operator can easily understand which side is dealt with.
- 150 -
Motor Control Mode

APT-9400 manages 3 kinds of the motor control modes, which affect the probing accuracy or probing
speed. (Default is Mode 2.) You can select one of them at each test program.
Mode 1 means that the probe moves faster than Mode 2 (Standard). Mode 3 means that the probe
moves slower than Mode 2 (Standard) to have more precise probe contact.
Use Probe Permission Mode
Unless Use Probe Permission Mode check box is filled (=default), the data combination (Tool >
Optimization) is not set for the test steps which access probe is assigned to other than (*,N,N,*). So, if
you wish to set combination to all test steps regardless of their access probe assignment, fill Use
Probe Permission Modecheck box.
If the data combination (Tool > Optimization) is implemented whilst Use Probe Permission
Mode check box is filled, all test steps are forcibly rearranged regardless of their access
probe assignment.
So, if you dont want to change their access probe assignment, please dont fill Use Probe
Permission Modecheck box.
Fail Map
Fail map is displayed after the PC board was tested and judged fail at Test mode.
Four type of Fail map is indicated to select. Usually, the 2nd type should be selected.
[Menu 37] Fail Map
- 151 -
Fail Map Display Mode

First select your preferable Fail map type, and then assign the partition number of each X, Y-axis on Fail
map.
Fail Map Information
You can select the display mode from two styles.
If Display part namesradio button is filled, the Fail map indicates the fail parts name. (Refer to [Menu 38])
On the other hand, if Display test point locations radio button is filled, the Fail map shows the fail XY
coordinates graphically. (Refer to [Menu 39])
[Menu 38] Display part names
[Menu 39] Display test point locations
- 152 -
Auxiliary Reference Point(s)

This can test a PC board while revising X/Y coordinates in the test data automatically by calculating both the
Board reference point and the Auxiliary reference point(s) on the PC board accurately before starting test.
There are two types to revise the X/Y coordinates.
Inclination uses the Board reference point and one Auxiliary reference point to revise the position and
inclination of the PCB. Inclination & scale uses the Board reference point and two Auxiliary reference
points to revise the position, inclination and scale of the PCB.
Red color point in the graphic map indicates the Board reference point of this test data. Violet color indicates
the 1st Auxiliary and Green color indicates the 2nd Auxiliary reference point.
[Menu 40] Auxiliary Reference Point(s)

Use Auxiliary Reference Point(s)
Fill Use Auxiliary Reference Point(s)check box, and then select either Inclinationor Inclination & scale
radio button.
To use this function, it is always necessary for you to set up Auxiliary reference point(s) before programming
your test data. In this case, please press [TEST START] SW on the operation panel and then operate the
keypad arrow keys to assign the Auxiliary reference point(s).
In case that you use Inclinationfunction, you need to set up just one Auxiliary reference
point. As for Inclination & scale function, you need to set up two Auxiliary reference
points (the 1st and the 2nd Auxiliary reference point).
Not like the Board reference point, you dont need to setup the Auxiliary reference point(s)
each time when the test model changes.
- 153 -
Stamp
This display appears only when Stamp unit (option) is installed on your APT-9400 and Use Stamp
Functioncheck box (Option mode > Stamp) is filled.
Regardless of your selecting Single markingor Group markingon this window, first press [TEST START]
SW on the operation panel, and then specify the position where is marked by the stamp unit whilst
operating the keypad arrow keys.
In case of Single markingyou need to set up just one marking position. As for Group marking, you need
to set up plural marking positions according to the test group.
[Menu 41] Stamp

Support pin
You can set up the support pins whilst monitoring the camera target on the display.
[Menu 42] Support pin

If you fill Position check of Support Pin check box and then click [Support Pin input] button, it shows
[Menu43] below.
- 154 -
[Menu 43] Support Pin input

Fill their two edit boxes (Number of Support Pins, Support Pin restricted area), and click [Next] button.
After then, set up the Support pin reference point and the position where the support pins need to be placed
whilst monitoring the camera target on the display.
Once the support pin position was saved, you can set the support pins according to the menu guidance
available at Support Pin checkfunction. (Refer to [Menu 44])
[Menu 44] Support Pin check

Bottom probe
You can set up the bottom probes whilst monitoring the camera target on the display.
[Menu 45] Bottom probe
- 155 -
If you fill Position check of Bottom Probe check box and then click [Bottom Probe input] button, it shows
[Menu 46] below.
[Menu 46] Bottom Probe input

Fill their two edit boxes (Number of Bottom Probes, Bottom Probes restricted area), and click [Next]
button. After then, enter any information of the bottom probe and set up the Bottom probe reference point
and the position where the bottom probes need to be placed whilst monitoring the camera target on the
display.
Once the bottom probe position was saved, you can set the bottom probes according to the menu
guidance available at Bottom Probe checkfunction. (Refer to [Menu 47])
[Menu 47] Bottom Probe check
- 156 -
Bottom Sensor Probe

You can set up the bottom sensor probes (option) whilst monitoring the camera target on the display.
[Menu 48] Bottom Sensor Probe

If you fill Position check of Bottom Sensor Probe check box and then click [Bottom Sensor Probe input]
button, it shows [Menu 49] below.
[Menu 49] Bottom Sensor Probe input

Fill their two edit boxes (Number of Bottom Sensors, Bottom Sensor restricted area), and click [Next]
button. After then, set up the Bottom sensor reference point and the position where the bottom sensor
probes need to be placed whilst monitoring the camera target on the display.
Once the bottom sensor probe position was saved, you can set the bottom sensor probes according to the
menu guidance available at Bottom Sensor Probe checkfunction. (Refer to [Menu 50])
[Menu 50] Bottom Sensor Probe check
- 157 -
Probes Lowest Position

You can adjust the limit position on the bottom where each probe can go down.
[Menu 51] Probes Lowest Position

Press [TEST START] SW on the operation panel, and operate the keypad arro w keys to move the probe to
the point (in sparsely populated area) where you want to set up or check the bottom position. And then,
press [ENTER] SW.
Next, operate the keypad arrow keys (UP, DOWN) to move the probe down to the preferable position.
Finally press [ENTER] SW to fix the position.
According to the menu guidance, proceed the same adjustments for the other probes as well.
- 158 -
Barcode No.
To use the barcode system (option), first set up Option mode and then save the barcode number within 40
characters here.
[Menu 52] Barcode No.

When the barcode on your PC boards etc. is read out in Test mode and it agrees with the barcode number
saved for each test data, it searches and loads the test data in the memory automatically.
You can save maximum 3 kinds of barcode number for one test data. (Refer to [Menu 52])
After saved the barcode numbers, they are displayed on the Open dialog. (Refer to [Menu 53])
- 159 -
Wild card is usable in the barcode number saved in Data mode.

(Ex.) 1234??? > 1234567, 1234123 and so on
Unless Auto. Data Loading by Barcode check box (Option mode > Serial Number /
Auto Data Loading) is filled, Data mode does not show this display.
If you try to specify the same barcode number that already exists in the disk, it shows
an error message to prohibit this operation.
Top Position of Probe
You can adjust the top position where each probe can go up in Test mode and Step data review menu.
[Menu 54] Top Position of Probe

The top position you can adjust is L and M that are programmable per test step. (Refer to [Menu 55]) The
bigger the figure is, the longer the Z strokes is. As the result, their test time is longer than the short stroke.
[Menu 55] List menu

Pay much attention to set up Top Position of Probe whilst considering the height of the
loaded components on your PC board. Otherwise it may possibly cause serious damage
on the probe and/or the PC board.
- 160 -
DDE Communication
This display appears only when Use DDE Communication check box (Option mode > DDE
Communication) is filled. Usually this function is unused.
[Menu 56] DDE Communication

Index
You can complement Model name (File name) with your comment so on (maximum 32 characters).
The index is displayed on the Open dialog and is also affixed to the fail data output in Test mode.
[Menu 57] Index

After saved the index, it is displayed on th e Open dialog. (Refer to [Menu 58])
- 161 -
- 162 -
Test mode
Clicking Test mode (Tool > Mode Setting > Test mode), it shows Test mode window. (Refer to [Menu 59])
Test mode manages the outputting of your test result and various administrations under testing the PC
boards so on. All their contents are saved in the disk together with the test data.
[Menu 59] Test mode

Primary Setup
You can set various configurations for testing.
Output all failure data to the printer
If this check box is filled, it outputs the fail report judged under the test to the printer. Even though the check
box is not filled, they are printed out optionally by pressing [PRINT] SW on the operation panel.
The printer type and the output format are able to set up in Master mode.
Printer type
: Master mode > Printer Setup
Output format
: Master mode > Standard Output Format
Output all test data to the printer

If this check box is filled, it outputs the measurement report (the contents of step data, their measured value
and test judgment, so on) to the printer whilst testing the PC board. Unless the check box is filled, it does not
output any data.
In the meanwhile, when this function is used, occasionally the test speed will be slow down depending on
the data transfer speed and the printing speed so on.
The printer type and the output format are able to set up in Master mode.
Printer type
: Master mode > Printer Setup
Output format
: Master mode > Standard Output Format
- 163 -
Maximum consecutive failed steps (Series Fail #)

If this check box is filled, the test is interrupted when a specified number of continuous faults are detected.
Here you can specify the number. (Initial set number = 3)
Output all failure data to the RS-232C port
If this check box is filled, the fail data detected under the test are output to the RS-232C automatically.
The output format is able to set up in Master mode (Standard Output Format).
In case of outputting the fail data to the RS-232C, be sure to set up Measuring data
communication(Option mode > RS-232C Port No.)
Output all test data to the RS-232C port
If this check box is filled, the measurement report (such as the content of step data, the measured value,
and the test judgment) are output to the RS-232C during test.
In the meanwhile, when this function is used, occasionally the test speed will be slow down depending on
the data transfer speed to the RS-232C.
The output format is able to set up in Master mode (Standard Output Format).
In case of outputting the test data to the RS-232C, be sure to set up Measuring data
communication(Option mode > RS-232C Port No.)
Revise coordinates prior to testing every PCB
If this check box is filled, XY coordinates revision using the Board reference point t and the Auxiliary
reference point(s) are revised every time prior to starting test.
Unless the check box is filled, it is only when the first PC board is tested or examined after the APT system
started up that the XY coordinates are revised, and the revision data at that time will be kept in the memory.
If this function is used, be sure to fill Use Auxiliary Reference Point(s) (Data mode >
Auxiliary Reference Point(s))
Display board graphics during test

If this check box is filled, it displays the XY coordinates points on the PC board graphically
Fail step verification after test
If this check box is filled, it can perform the simple evaluation test on the fail steps detected under test.
- 164 -
Starting Message
When you start testing the PC boards by [TEST STERT] SW, the APT-9400 displays the message box
showing your optional message on the display. (Refer to [Menu 60, 61]) Usually, this function is helpful to
call various attentions, such as Set-up information of SW/VR, some cautions to be strictly observed, etc. to
the operator.
[Menu 60] Starting Message
[Menu 61] Sample display at Test menu

Group Sequential Test
You can assign the groups that are tested on every PC board.
If your assignment is made just like [Menu 62] below, G1 and G4 onlywill be tested in the 1st PC board.
And so, G1-G3, G5 and G7-G9will be tested in the 2nd PC board, and then G2-G3 and G6will be tested
in the 3rd PC board. Next, the 4th PC board will be applied to PCB No.01 also that G1 and G4 onlywill be
tested. You can configure max. 10 kinds of Group sequential test (PCB No.01 - 10).
[Menu 62] Group Sequential Test
- 165 -
Failure Data Storage

You can output the test result judged Fail or Pass under test to the disk.
Fail component detected during the test is saved into the data disk automatically. The output format written
is based on ASCII text file. The file name and fail data are automatically saved on test fault.
[Menu 63] Failure Data Storage

Off
If this radio button is filled, any test result is not output to the disk.
Standard output format
If this radio button is filled, the test result is output to the disk with Standard output format (ASCII text style).
@
* FAIL *
D.T:432
D.P:426
D.F:6
Model:TAKAYA9400.SW91
DATE 00/10/12 15:19:34
G.T:1474
G.P:1456
G.F:18
@
* GROUP No.1 *
00050 R50
10KO
*
3E
R 213
J:( LOW-NG ) R:( 9.94 KO) T1:( 4.60 KO) T2:( 4.58 KO)
00053 R53
4.7KO
*
3E
R 212
J:( UP-NG ) R:( 4.67 KO) T1:( 8.83 KO) T2:( 8.70 KO)
@
101
463
45
463
[ Fig. 7 ] Sample of Standard output format

Standard output format can be configured optionally in Master mode (Standard Output
Format).
File name of Standard output format is Data file name + Extension of ".NGD".
- 166 -
Advanced output format

If this radio button is filled, the test result is output to the disk with Advanced output format (ASCII text style).
@
* FAIL *
D.T:433
D.P:426
D.F:7
DATE 00/10/12 15:21:19
@
00050 "R50
00053 "R53
G.T:1475
G.P:1456
" "10KO " "*

" "4.7KO " "*
G.F:19
" "3E
" "3E
" 213
" 212
101
45
463
463
0
0
"LOW-NG" "R " " 9.94 KO" " 4.61 KO" " 4.57 KO"
"UP-NG " "R " " 4.67 KO" " 8.81 KO" " 8.70 KO"
[ Fig. 8 ] Sample of Advanced output format

Advanced output format can be configured optionally in Master mode (Advanced Output
Format).
File name of Advanced output format is Data file name + Extension of ".NGD".
Save into separate file (Fail information only)

If this check box is filled, the test result judged fail under test is output with the extension of .001 - .999,
instead of the .NGD. The number of the extension is the same asFailed (Daily)number displayed at Test
menu.
Save into separate file (Fail and Pass information)
If this check box is filled, the test result judged pass or fail under test is output with the extension of .00001A
- .99999A, instead of the .NGD. The number of the extension is the same as Total (Aggregate)number
displayed at Test menu.
@
* PASS *
D.T:428
D.P:425
D.F:3
DATE 00/10/12 15:10:13
G.T:1470
G.P:1455
G.F:15
@
@
[ Fig. 9 ] Standard output format (PASSjudgment)
@
* PASS *
D.T:430 D.P:426
D.F:4
G.T:1472
G.P:1456
DATE 00/10/12 15:13:49
@
[ Fig. 10 ] Advanced output format (PASSjudgment)
- 167 -
G.F:16
All Test Data Storage

You can output the test result (Measured value, Judgment) to the disk.
[ Menu 64 ] All Test Data Storage

Off
If this radio button is filled, any test result is not output to the di sk.
Standard output format
If this radio button is filled, the test result is output to the disk with Standard output format ( ASCII text style).
@
* PASS *
D.T:428
D.P:425
D.F:3
DATE 00/10/12 15:10:13
G.T:1470
G.P:1455
G.F:15
@
* GROUP No.1
00001 R1
J:( PASS
00002 R2
J:( PASS
00003 R50
J:( PASS
00004 R53
J:( PASS
@
*
)
)
)
)
1.0KO
R:(0.970
10KO
R:( 9.92
4.7KO
R:( 4.72
10KO
R:( 8.96
*
KO) T1:(0.984
*
KO) T1:( 9.88
*
KO) T1:( 4.62
*
KO) T1:( 8.97
6E
R
KO) T2:(........)
6C
R
KO) T2:(........)
3E
R
KO) T2:(........)
3E
R
KO) T2:(........)
490
228
460
228
213
101
463
212
45
463
[Fig. 11] Sample of Standard output format (when judged PASS)

@
* FAIL *
D.T:431
D.P:426
D.F:5
DATE 00/10/12 15:18:20
G.T:1473 G.P:1456 G.F:17
@
* GROUP No.1
00001 R1
J:( PASS
00002 R2
J:( PASS
00003 R50
J:( LOW-NG
00004 R53
J:( UP-NG
@
*
)
)
)
)
1.0KO
R:(0.970
10KO
R:( 9.92
10KO
R:( 9.94
4.7KO
R:( 4.67
*
KO) T1:(0.999
*
KO) T1:(13.89
*
KO) T1:( 4.61
*
KO) T1:( 8.89
6E
R
KO) T2:(........)
6C
R
KO) T2:(10.50 KO)
3E
R
KO) T2:( 4.61 KO)
3E
R
KO) T2:( 8.70 KO)
490 228
460 228
213 101 463
212 45
[Fig. 12] Sample of Advanced output format (when judged FAIL)
- 168 -
463
Standard output format is changeable in Master mode.
File name of Standard output format is Test program name + .the extension (ATD).
Advanced output format

If this radio button is filled, the test result is output to the disk with Advanced output format (ASCII text style).
@
* PASS *
D.T:430
D.P:426
D.F:4
DATE 00/10/12 15:13:46
@
00001
00002
00003
00004
"R1
"R2
"R50
"R53
"
"
"
"
"1.0KO
"10KO
"4.7KO
"10KO
"
"
"
"
G.T:1472
G.P:1456
"*
"*
"*
"*
G.F:16
"
"
"
"
"6E
"6C
"3E
"3E
"
"
"
"
490
460
213
212
228
228
101
45
0
0
463
463
0
0
0
0
"PASS
"PASS
"PASS
"PASS
"
"
"
"
"R
"R
"R
"R
"
"
"
"
"0.970
" 9.92
" 4.72
" 8.96
KO"
KO"
KO"
KO"
"1.234
" 9.87
" 4.62
" 8.91
KO"
KO"
KO"
KO"
"0.989 KO"
"........"
"........"
"........"
"0.975
" 9.87
" 4.61
" 8.81
KO"
KO"
KO"
KO"
"........"
"........"
" 4.57 KO"
" 8.70 KO"
[Fig. 13] Sample of Advanced output format (when judged PASS)

@
* FAIL *
D.T:433
D.P:426
D.F:7
DATE 00/10/12 15:21:17
@
00001
00002
00003
00004
"R1
"R2
"R50
"R53
"
"
"
"
"1.0KO
"10KO
"10KO
"4.7KO
"
"
"
"
G.T:1475
"*
"*
"*
"*
G.P:1456
G.F:19
"
"
"
"
"6E
"6C
"3E
"3E
"
"
"
"
490
460
213
212
228
228
101
45
0
0
463
463
0
0
0
0
"PASS "
"PASS "
"LOW-NG"
"UP-NG "
"R
"R
"R
"R
"
"
"
"
"0.970
" 9.92
" 9.94
" 4.67
KO"
KO"
KO"
KO"
[Fig. 14] Sample of Advanced output format (when judged FAIL)
Advanced output format is changeable in Master mode.
File name of Advanced output format is Test program name + .the extension (ATD).
- 169 -
Master Mode
Clicking Master mode (Tool > Mode Setting > Master mode), it shows Master mode window as shown in
[Menu 69] below. Master Mode sets up mainly the APT-9400 operating system. Every parameter is
managed in the system folder in your PC.
[Menu 69] Master Mode

Machine Reference Point
The APT-9400 is equipped with a datum point (so-called Machine reference point) at the right side of the
front rail, in order to absorb the individual mechanical difference of the testers. Aligning the four flying probes
on Machine reference point, you can set up the distance from their home position. As the result, the flying
probes are able to contact the same coordinates accurately.
Clicking the Camera Offset Setupbutton, you can save the mechanical offset of the CCD camera against
the flying probes. After this operation, you can use the CCD camera to learn and/or change the X,Y
coordinates for the flying probes.
For your convenience, Automatic Setup executes automatic alignment of Machine reference point and
Camera offset. We hereunder explain the operating process.
Be sure to execute Camera Offset Setup after Machine reference point was well aligned.
Otherwise, it may be substituted by inaccurate offset value.
How to align Machine reference point (Automatic Setup)

(1) Move to Master Mode menu (Tool(Mode Setting(Master Modeon Menubar)
(2) Fill Auto alignment of Machine reference pointcheckbox.
(3) Depress [TEST START] SW on the operation panel twice.
(4) Use arrow keys on the operation panel to move the Probe-4 onto the center of Machine reference
point, and then depress [ENTER] SW.
- 170 -
(5) The APT-9400 starts moving the Probe-4 to search Machine reference point automatically.
(6) After Machine reference point was searched, depress [ENTER] SW.
(7) Use arrow keys on the operation panel to move the Probe-4 onto the center of Aux. Machine
reference point, and then depress [ENTER] SW.
(8) The APT-9400 starts moving the Probe-4 to search Aux. Machine reference point automatically.
(9) After Aux. Machine reference point was searched, depress [ENTER] SW.
(27) After Aux. Machine reference point was searched, all flying probes go back to their home position, and
then it finishes Machine reference point set.
Prior to align Machine reference point, be sure to fill Auto alignment of Machine reference
pointcheckbox.
When you wish to verify or manually align Machine reference point, clear Auto alignment
of Machine reference point checkbox. In this case, the APT-9400 does not execute the
automatic alignment.
- 171 -
How to set up Camera offset (Manual Setup)

(1) Move to Master Mode menu (Tool > Mode Setting > Master Mode).
(2) Click the Camera Offset Setupbutton.
(3) Depress [TEST START] SW on the operation panel.
(4) Following the display message, move the camera to set the camera target for the left end of the
Machine reference point, and then depress [ENTER] SW on the operation panel.
(5) Move the camera to set the camera target for the bottom end of the Machine reference point, and then
depress [ENTER] SW on the operation panel.
(6) Click the OK button to determine the Camera offset.
Unless Auto alignment of Machine reference point checkbox is filled, you cannot set up
the Camera offset.
How to set up Camera offset (Automatic Setup)

(1) Move to Master Mode menu (Tool > Mode Setting > Master Mode).
(2) Click the Automatic Setupbutton.
(3) Depress [TEST START] SW on the operation panel.
(4) Machine reference point is set up automatically, in the order of Probe-4 Probe-3 Probe-2
Probe-1.
(5) Following the display message, move the camera to set the camera target for the left end of the
Machine reference point, and then depress [ENTER] SW on the operation panel.
(6) Move the camera to set the camera target for the bottom end of the Machine reference point, and then
depress [ENTER] SW on the operation panel.
(7) The Camera offset operation finished.
Unless Auto alignment of Machine reference point checkbox is filled, you cannot set up
the Camera offset using Automatic Setupbutton.
Automatic Setup is usable when Machine reference point is realigned after any probe
was replaced.
In case that Machine reference point could not be aligned properly using Automatic
Setupbutton or that any error message is displayed during this operation, realign Machine
reference point in accordance with [How to align Machine reference point] in Page 170.
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Printer Setup
You can set up the printer type, the maximum number of printed failures, the printer feed length, so on.
[Menu 70] Printer Setup

Printer Type
Click the radio button for the printer that is installed in the APT-9400.
In case of TSP200, you can select Auto. Cutter modeas you like.
In case of Windows printer, you can select any printer applicable for the APT-9400
registered in Windows system.
Maximum number of printed failures (1 -9999)

Specify the number of failed components that is output on the printer between 1 and 9999.
Default number is 3. It means that when the 5 failures were occurred, it printed out first 3 failures only.
Printer feed length (1-10)
Specify the feed length of the printer ticket between 1 and 10. Default value is 4 lines.
Output PASSword
When this checkbox is filled, the printer outputs PASS information, when the tested board was judged
pass.
Output failures during test
When this checkbox is filled, the printer outputs the test report in the real time. Otherwise the printer would
only print out the report after the test has completed.
In case that plural step was judged fail in series, occasionally the printing speed is down.
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Standard Output Format

You can specify the output format to Printer/RS-232C/Disk, and select the Separator (for RS-232C/Disk).
[Menu 71] Standard Output Format

Advanced Output Format
You can specify Advanced Output Format used at Fail Data Storage, All Test Data Storagein Test mode.
[Menu 72] Advanced Output Format

Output Itemsin [Menu 189] above shows the items that are output in Advanced Output Format.
Please choose your preferable items from Itemswindow at the left side, and then click the [ > ] button so
that it is shifted to the Output Items window at the right side. On the other hand, if the Output Items
window includes any item unnecessary to output, choose it and click the [ < ] button so that it is shifted to the
Itemswindow.
Clicking either [ << ] or [ >> ] button, you can shift all items to the other window at a time.
If you would like to rearrange the output order of the items which are shown in the Output Itemswindow,
choose the item and click either [Up] or [Down].
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Use Comma separator

If this checkbox was filled, [ , ](comma) is automatically inserted between each output item.
Output with Header
If this checkbox was filled, Test result, Test number, Pass/Fail number and Test time are output to the
header.
Output with Net name
If this checkbox was filled, Net name designated for each pattern is output as well.
Net name output is available only when Output Itemswindow includes either [Hpin Lpin]
or [G-P1 G-P2].
Output with Pin No.

Regardless of your setting Coordinates Management, If this checkbox was filled, each pin number (Hpin,
Lpin, G-P1, G-P2) is output.
Unless this checkbox was filled at the test program, which is generated using both
[Teaching system] and [Point system], usually any pin number (Hpin, Lpin, G-P1, G-P2) is
not output.
In case of the test program generated using [Teaching system], each pin number (Hpin,
Lpin, G-P1, G-P2) is substituted by [ * ] .
Output with Second
If this checkbox was filled, test time at each step is output with a unit of second. Otherwise it is output just
with a unit of minute.
This assignment is possible only when Output Itemswindow includes [Test time].
File / Folder
You can specify the default folder to open and/or save the test program and set up Data back-up function so
on. APT-9400 creates the TAKAYAdirectory in the root directory automatically.
[Menu 73] File / Folder
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Main folder
This folder is normal folder to open the test program (SW91).
Default is \TAKAYAin system drive.
Folder for convert data
This folder is to open the MS-DOS based test program (SD8, CA8 etc.).
Test data (*.ATD / *.NGD)
This folder is to store the test results (ATD: All Test Data / NGD: No Good test Data).
xSave into the same loaded folder
If this check box was filled, the ATD file and the NGD file are stored into the same directory of its test
program.
Test Data
When Save as file name radio button was filled, the test program (Fail Data Storage, All Test Data
Storagein Test mode) is saved with [File name] + [.ATD] or [.NGD].
When Save asradio button was filled, the test program (Fail Data Storage, All Test Data Storagein Test
mode) is saved with [Specified name] + [.ATD] or [.NGD].
Normally, Fail data is stored with extension of [.NGD]. But when either Save into separate
filecheckbox in Test mode is filled, their extension is [.001]-[.999] or [.00001A]-[.99999A].
Save into separate file (Fail information only)
[.001]-[.999]
Save into separate file (Fail and Pass information) [.00001A]-[.99999A].

All test data is stored with extension of [.ATD].
Auto load
If this check box was filled, a specified test program is loaded automatically when APT-9400 started.
Auto save / Time to save
If this check box was filled, the test program is stored (back-up) automatically to the main folder every
certain period (1-30 min) that you specified. If some backup file exists in the main folder, the APT-9400
loads it automatically during starting the software. Owing to this back-up function, occasionally your test
program can be prevented from accidental blackout.
For more safe, you are recommended to overwrite your test program periodically.
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Short / Open Setup

You can specify the judgment tolerance in the test steps, which measuring condition are substituted by
either SH (SHORT) or OP (OPEN).
[Menu 74] Short / Open Setup

Upper limit for short function
When the test step, which measuring condition is substituted by SH (SHORT) was measured less
than Upper limit for short function, it judges GOOD. (Default =10.00 )
Lower limit for open function
When the test step, which measuring condition is substituted by OP (OPEN) was measured over
than Lower limit for open function, it judges GOOD. (Default =100.0 )
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Failure Management
You can manage the testing process after some failure was detected under test.
[Menu 75] Failure Management

Automatically retest failed steps at end of test
If this check box was filled, the fail steps detected on the PC board are retested automatically after the test
finished.
Automatically correct coordinates and retest failed steps during testing
If this check box was filled, the fail steps are retested automatically while shifting the contact position toward
four directions from the original point managed by the test program.
The distance of automatically shifting the probes can be specified in the combo box. (Default =0.1 )
As for the test steps, which measuring condition is substituted by any of [OPEN (OP)],
[>NG<], [NG>Ref.], [NG<Ref.], this function is not operated to prevent possible
misjudgment.
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Jump all zener steps following a failed step

If this check box was filled, the Zener measurement steps (which measuring condition are substituted by
DC-ZD) following the fail test step are handled based on the condition below.
When Jump Zener steps when a step judged SHORT check box is filled;
The Zener measurement steps following the fail test step that was judged SHORT are not tested. In
case of the other failures such as OPEN, UP-NG, LOW-NG, the Zener measurement steps are tested.
On the other hand, unless this check box was filled, theZener measurement steps following the fail test
step (including the SHORT fail step) are not tested.
When Jump Zener steps following this group check box is filled;
Once the failure was detected, the Zener measurement steps included in the following test group are
not tested.
On the other hand, unless this check box was filled, the Zener measurement steps following the fail test
step in the same test group are not tested. (All other Zener measurement steps included in the
following test group are tested)
When Specify output step number for jumped zener step(s) check box is filled;
In case that there were plural number of Zener measurement steps that were not tested (jumped), you
can specify the number of their steps to pint out.
For example, when this was specified to 3, only three (3) steps from the top are output the printer,
even though there were ten (10) Zener measurement steps.
Stop testing when a group fail(s)
If this check box was filled, when your appointed number of test steps were fail in the same group, the
testing flow is changeable based on the condition below.
When Stop all testing radio button is filled;
The test continues to the last test step in the group,and then the other group test is canceled.
When Begin testing next group radio button is filled;
The test steps following the fail test step in the group is canceled, and then it continues the test from the
next group.
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Password Setup
Fill Enable password protection check box, to validate Password function in your system. To move the
menu window while using Password function, you are always asked to enter the preset password.
[Menu 76] Password Setup

User 1 - User 5
You can set up five different passwords (max. 8 letters) for User1-5.
When the check box for File, Test, Mode, Edit, Reference and Image Reference on Password
Setup menu is filled, any menu window cannot be opened without entering the password of the user who
was permitted to access each menu.
The menu window which check box is not filled does not ask any password.
Password should be strictly managed by a specific administrator.

Also be sure not to forget the password. (In the worst, please contact our local distributor)
Capital and minuscule are distinguishable.
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Probes Crossing Distance

You can specify an allowable crossing distance of each flying probes on their X-axis moving direction.
[Menu 77] Probes Crossing Distance

When the inclination/scale of your PC boards was aligned on the test menu so on, their probe access
changes automatically in order to prevent from possible mechanical interference of their flying probes.
In this case, however, the probe access is not changed even if they crossed within the specified range of
Probes Crossing Distance. (Default =0.20mm)
Dubug Status
When it seems to take longer time to evaluate (debug) test steps at Step data review menu, you can put
Book mark tentatively on these steps as a sign, that shows further examination is necessary later, for
example.
Debug Status menu lists seven (7) kinds of Book marks (A - G). Clicking the Editbutton after moved the
cursor on A - G column, you can specify and/or rename the Book mark.
[Menu 78] Dubug Status
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[Menu 79] below shows Step data review menu where Book mark is practically used.
[Menu 79] Step review menu
Book mark can be titled by 40 letters maximum.
User Preferences
There are various setup menus like PASS/FAIL alarm time, Group test, Font name/size, so on.
[Menu 80] User Preferences

PASS/FAIL alarm time after test
You can specify the alarm time that rings after the test finished. (Default =1.0 sec)
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Appointed group test function

Appointed group test function enables to test your specified group on the board, which test program is
separated into multiple groups.
Prior to depressing [TEST START] SW at the Test menu, if [1 ] - [ 0 ] key was pressed together with [Shift ]
key, you can specify the group to be tested. For example, as shown in [Menu 197], if pressing [ 5 ] key and
[Shift ] key simultaneously, you can test the GR5 (step area 401 - 500) only.
[Menu 81] Appointed group test function

Group test function by location
If this check box is filled, the test program can be separated into 99 groups (max), by substituting GRfor
[Loc] column in the test step.
(In this case, one group is defined to the test steps, which are enclosed by twoGR.)
When Group test function by location check box is filled, you cannot use Appointed group
test function available on the same menu window.
Power Cycle
You can specify either 50Hz or 60Hz as your power frequency.
[ Esc ] key = [TEST STOP] SW
If this check box is filled, you can put the flying probes back to their home position by depressing [Esc] key
on the operation panel while they are actuating for the test.
When this check box is not filled, the only way to put them back to their home position is depressing [TEST
STOP] SW on the operation panel.
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Auto caps lock on

If this check box is filled, [Caps Lock] SW on the keyboard turns on automatically when the APT system
starts up.
Font Editor
You can change the font type and the font size used on the data list menu.
Your changes in Font Editor menu is not reflected on other menu than the data list menu.
Recently used file list number

You can specify the file numbers displayed on Recently Used Files available in Menubar. (Default = 5,
programmable between 2 and 20)
Undo max
You can specify the number of Undo function applicable in your data editing operation. (Default = 6,
programmable between 2 and 100)
Undo function is not always usable on your operation.
Both Recently used file list number and Undo max are effective after the APT-9400 system
was rebooted.
Kelvin Measurement Setup

You can preset the measuring offset value used for Kelvin measurement steps, which measuring mode is
DC-CC4. (Default = 0.000[ ])
[Menu 82] Kelvin Measurement Setup
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Option Mode
Clicking Option mode (Tool > Mode Setting > Option mode), it shows Option mode window as shown in
[Menu 83] below.
Option Mode sets up the optional equipments (such as Camera system, In-line system, so on), which are
usable in the APT-9400 system. Every parameter is managed in the system folder in your PC.
[Menu 83] Option mode
Workstation mode
Fill Workstation Modecheck box, only in case that you wish to use the APT system with your workstation,
in which no measuring unit is available. Under Workstation mode, Option mode menu is shown [Menu 84]
below.
[Menu 84] Workstation mode
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RS-232C Port NO.

You can set up all necessary parameter for the serial port (RS-232C), such as Port number, Baud rate,
Character length, Parity and X ON/OFF.
[Menu 85] RS-232C Port No.

Please set up them correctly according to the specifications of your equipment.
Measuring data communication
This setup is for the serial port that is used at Failure Data Storage and All Test Data Storage in Test
mode.
Barcode Setting
This setup is for the serial port of the barcode reader that is used at Serial Number / Auto Data Loading.
- 186 -
Camera System
You have to set up the Optical system (option) if it is installed in your APT-9400.
[Menu 86] Camera System

Optical System Installed
Be sure to fill this check box if Optical system (the TOS board) is installed in your APT-9400. Also set up
your video signal type properly to either NTSC or PAL.
Add recognition error to the failure counter
If this check box is filled, even when the Optical system could not read out either the Board Reference Point
or Auxiliary Reference Point(s) preset on the PC board under test, with which the APT system displays the
recognition error, the test number and fail count number is added by (+ 1).
If this check box is not filled, the test number and fail count number doe not change at the recognition error
by the Optical system.
Visual test (WA) hold time (1-255sec) :
If this check box is filled, you can specify the holding time at Visual test step, which Function column is
substituted by Vtest (WA).
If this check box is not filled, it keeps displaying the Visual test step until any of [ENTER], [PROBE DOWN]
or [ ] key on the operation panel is pressed.
On the Visual test step, the keyboard keys play a role of followings.
[ENTER] > Judged PASS
[PROBE DOWN] > Judged FAIL
[ ] > Back to primal Visual test step
- 187 -
Standard PCB
Fill Standard PCBcheck box, if your most PC boards can be fixed by the standard clamp mechanism in
the APT-9400. In this case, Camera/Probe offset can be set up on this menu window.
On the other hand,
When this check box is not filled, you can set up Camera/Probe offset board by board in Option mode,
which data is managed in each test program.
When Camera/Probe offset check box on Camera System menu (Option mode) is filled,
Data Mode does not show Camera/Probe Offset menu.
Inline Application
You can set up the In-line system (option).
[Menu 87] In-line Application

Use Inline Application
Fill Use Inline Application check box, if your APT-9400 is equipped with In-line system (option), which
loads the PC boards up to the test position and unload automatically after test finished. On this menu
window, you can set up the Inline specifications (Conveyor direction, PASS/FAIL PCB output) according to
your production layout.
Auto. conveyor width adjustment mechanism
As our standard specification of the Inline system designed for the APT-9400, the PCB rails width needs to
adjust manually by a handle each time according to their PCB size. However, adding "Auto. conveyor width
adjustment mechanism" on the Inline system with another expense, the PCB rails width is able to setup
automatically just like another model APT-9400.
Fill this check box only when Auto. conveyor width adjustment mechanism is available on your In-line
system.
Rack number output of fail board
When this check box is filled, you can output your PCB rack information (number, position) where the fail
PC boards are stored to the printer ticket as well.
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In addition, if you click on [ ] button at the right hand, it displays another window below.
[Menu 88] Rack number output of board

Do you store both pass and fail PCB in the same rack?
Fill this check box only when you wish to store both the PASS boards and the FAIL boards together in
the same PCB rack.
Do you wish to set PCB No. stocked in a rack every test?
Fill this check box only when the number of your PC boards that are stocked in the PCB rack is
changeable inconsistently model by model.
On the other hand, when your PC boards stored in the PCB rack is the same number, preset the
number in How many PCB can be stored in one rack?combo box.
Do you wish to keep the rack No. when Auto. data loading?
Fill this check box only when you wish to keep using the existing PCB rack even after the test model
changed. (In this case, the different models are mixed in the same PCB rack!)
Auto. test stop by the series fail number appointed
If this check box is filled, you can suspend the automatic operation when the test detected failure in series.
You can preset the fail number of your PC boards in combo box at the right hand of Series fail number for
auto. test stop ?.
Auto. operation stop on probes lifetime error
If this check box is filled, you can suspend the automatic operation when it alerted the probes lifetime with
the error message under testing.
Auto. operation stop on printer error
If this check box is filled, you can suspend the automatic operation when the printer caused some error. (For
example, consumption of the printer ticket).
Auto. operation stop on disk saving error of test value
If this check box is filled, you can suspend the automatic operation when the data saving error occurred.
(For example, lack of the disk capacity)
Auto. operation stop on RS-232C communication error
If this check box is filled, you can suspend the automatic operation when some error occurred at RS-232C
communication.
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Signal Tower Setting

You can set up the signal tower specification (illumination, alarm).
[Menu 89] Signal Tower Setting

To set up the signal tower, select any objective status, which is shown in Scene column, and then click the
Edit Signal Towerbutton.
[Menu 90] Edit Signal tower menu

After Edit Signal tower menu appeared, specify their combo box for Red, Yellow, Greenand Alarmas
you like.
Clicking the Test button, you can monitor the present status on the display.
After your setup, clock the OK button to enter your changes.
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Serial Number / Auto Data Loading
[Menu 91] Serial Number / Auto Data Loading

Use Serial Number Input
When this check box is filled, you can input any serial number of your PC boards when [TEST START] SW
was depressed at Test menu. In this case, these serial numbers can be also output to the printer, the
RS-232C or the disk as you specified. So you can manage the fail information by their board serial number.
The serial number input is made through two methods, the keyboard or the barcode reader (option). Please
specify whichever you like to use.
At Number of serial number check box, specify how many serial numbers you wish to input at a time
(maximum 3). And if you wish to manage the serial number per groups, fill Use Serial Number per each
Groupcheck box.
When Use Serial Number Inputcheck box is filled, it displays a menu window for your serial number input
prior to starting the test at Test menu.
To use the barcode reader for your serial number input, set up the RS-232C serial port
properly in advance.
You cannot use Use Serial Number per each Group function while Use Inline
Applicationcheck box is filled.
Auto. Data Loading
When this check box is filled, you can change test modelsautomatically using the board serial number read
out by the barcode reader.
Use Serial Number per each Groupfunction above is also usable together.
To change test models automatically using the board serial number, set up the RS-232C
serial port properly in advance.
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Stamp
When Use Stamp functioncheck box is filled, you can stamp on the PC board according to the test result
(PASS or FAIL) after test finished.
[Menu 92] Stamp

Stamp Mode
You can specify in which case PC board is stamped, PASS or FAIL.
Stamp holding time 1-255*100ms(S)
You can specify how long the stamper should be held on the PC board.
Stamp / Probe Offset
Pressing [TEST START] SW on the operation panel, you can save the mechanical distance between the
stampper and the reference probe (Probe-4), using the CCD camera.
- 192 -
Input/Output function of I/O step

You can switch the testing process by signaling from the outside and output an open collector signal to the
external equipment under the test.
[Menu 93] Input/Output function of I/O step

Input/Output Function of I/O Step
If this check box is filled, you can input signals from the external equipment and also output signals to the
external equipment, through the Input port (Max. 64), the Output port (Max. 32) and various optional boards.
Jump all I/O steps following a failed step
If this check box is filled, the I/O steps following the fail test step are handled based on the condition below.
When Failed step number to jump I/O step combo box is specified;
If fail test steps reaches your specified numbers, any I/O step following them is not executed.
When Jump I/O steps when OP step judgedSHORT check box is filled;
If test step which Function (F) is substituted by OPis judged fail, any I/O step following the step is not
executed.
However, when this check box is not filled, the I/O steps following fail test step, which Function (F) is
substituted by OPare executed.
When Jump I/O steps following this group check box is filled;
All I/O steps following fail test steps are not executed.
However, when this check box is not filled, the I/O steps in the same test group are not executed. (All
other I/O steps included in the following test group are tested)
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Use Power Relay Board

Fill this check box when Power Relay Board TAKAYA TVX-24x (option) is installed. (Refer to [Menu 94])
With this option, you can power up your PC boards by multiple external power supplies (Max 80V/3A)
prepared by yourself, through max. 12 underside probes or some connectors. You can build-up the test
program using dedicated IO/Wcommand, so that those external power supplies necessary for testing the
PC boards is turned On/Off optionally.
If this check box is filled, you can define your preferable name (Ex. signal name, so on) for each Outport
1-14. (Refer to [Menu 94])
[Menu 94] Use Power Relay Board

DDE Communication
DDE Communication function enables to exchange a data interactively between the APT-9400 and the
other application software. For instance, the APT-9400 communicates some data to control another
application software for some functional test.
[Menu 95] DDE Communication
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Use DDE Communication

If this check box is filled, you can exchange your data interactively between the APT-9400 and the other
application software.
Jump all DDE steps following a failed step
If this check box is filled, the DDE steps following the fail test step are handled based on the condition below.
When Failed step number to jump DDE step combo box is specified;
If fail test steps reaches your specified numbers, any DDE step following them is not executed.
When Jump DDE steps when OP step judged SHORT check box is filled;
If test step which Function (F) is substituted by OPis judged fail, any DDE step following the step is
not executed.
However, when this check box is not filled, the DDE steps following fail test step, which Function (F) is
substituted by OPare executed.
When Jump DDE steps following this group check box is filled;
All DDE steps following fail test steps are not executed.
However, when this check box is not filled, the DDE steps in the same test group are not executed. (All
other DDE steps included in the following test group are tested)
IC Open
You can set up Sensor Probe/Probe Offset, which is the physical distance between the sensor probe(s) and
the probe(s).
[Menu 96] IC Open

Press [TEST START] SW on IC Open menu ([Menu 96]) above, and then follow the menu guidance so that
Sensor Probe/Probe Offset is set up properly.
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Menu Customize
You can add your preferable application software (Ex. Editor) on Tool menu.
[Menu 97] Menu Customize

On Menu Customize menu ([Menu 97]) above, click the [] button so that you can specify the application
file (.EXE). After then, the short cut menu is added on Tool menu. It is maximum five (5) application files
(Menu 1 5) that you can added on.
[Menu 98] shows you the sample of Tool menu where are NOTEPAD, EXPLORER, INTERNET
EXPLORER and OUTLOOK EXPRESS were added.
[Menu 98] Menu Customize(2)

PCB Extension support kit
If you want to use the optional PCB extension support kit to support the non-quadrangle PCB, which the
conveyor cannot transport to the test position, fill this checkbox.
Vacuum unit
Fill this check box when Vacuum unit (option) is installed.
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Test Program Setup

Following their wizard menu step by step, you can convert CAD files and/or any existing test program made
for the APT-8400 series to the test program for your APT-9400.
[Menu 99] Test Program Setup

Each operation step is explained in the open window at the right side on the menu. After read it thoroughly,
click the Execute button.
To skip some of operation steps displayed at the left side on the menu, click the Skip button.
Speed Up the test program

Following their wizard menu step by step, you can optimize your test program so that the test time is
minimized.
[Menu 100] Speed Up the test program

Each operation step is explained in the open window at the right side on the menu. After read it thoroughly,
click the Execute button.
To skip some of operation steps displayed at the left side on the me nu, click the Skip button.
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CA9 File Convert

You can load CAD data files (extension : .CA8, .CA9, .ASC), which were translated into our designated
format.
View
This customize Toolbar and Statusbar to change Main window.
Menu title
Statusbar
Function
Select if Statusbar is displayed or not.
Select if Button name is put on Icon (Toolbar) or not.
Button name
(With button name)
(Without button name)

[Menu 1]
About
This enables to display Information dialog where is written about the APT-9400 operating system version so
on.
Menu title
About
Function
It displays Version number, released date, and Copyright information.
[Menu 1] About
- 198 -
Aux
This shows various kinds of hidden keys usable in Test menu.
Menu title
Function
After the test was suspended by Emergency stop or Abnormal stop,
[F.1] Stop Retest
otherwise by TEST STOP SW, if [ F1 ] key on the operation panel

and then TEST START SW were pressed in order, it starts testing
from the step where the test was suspended.
After the test was judged fail, if [ F2 ] key and ([ F1 ] or [F2 ] key) on
[F.2] Fail Retest
the operation panel and then TEST START SW were pressed in

order, the fail steps are retested or checked by the camera.
[F.3] Print Test List
If [ F3 ] key on the operation panel was pressed, it outputs previous

test result (Measure value, Judgment) to the printer.
If [ F4 ] key on the operation panel was pressed while Fail map is
[F.4] Fail Map
displayed, it selects Graphic display mode or Parts name display

mode.
After the test was judged fail, if RETEST SW the operation panel
[RETEST] Retest
and then TEST START SW were pressed in order, it tests the only
fail steps again.
[PRINT] Fail Printout
[SLOW] A/B-side exchange
After the test was judged fail, if PRINT SW the operation panel was
pressed, it output the fail steps to the printer.
If PROBE UP SW on the operation panel was pressed, it selects
A-Side or B-Side of the test program.
If RESET SW on the operation panel was pressed, it releases
[RESET] Motor Reset
Emergency stop and/or Abnormal stop.

(Be sure to execute after Emergency stop SW was released or the
cause of abnormal stop was removed)
[M] Fail Map
Same function as [ F4 ] key on the operation panel.
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It select whether some optional groups in the test program

separated into groups are tested or not. Pressing [ G ] key shows
[Menu 2] below.
[Menu 2] Skip function

Then, if [Yes] key was selected, you can assign the groups to be
tested. In case of [No], you can assign the groups not to be tested.
[G] Skip Function
(Refer to [Menu 3]
[Menu 3]
After the test finished, it automatically executes the other system
program that was setup in advance.
[O] External Program
[Menu 4]
Total count data displayed in Test menu can be changed through
the keyboard.
[T]
Pass/Fail
Count
Arrangement
[Menu 5]
- 200 -
The test is executed in the only step area assigned optionally.

Ex) when testing Step 21 50, 71 100 and 5 only;
[I] Region Test
[Menu 6]
[S] Parts name search
Search and display the test step using the assigned Parts.
[V] Value search
Search and display the test step using the assigned Value.
[C] Comment search
Search and display the test step using the assigned Comment.
[L] Bottom probe search

[J] Jump search
[P] Pin search
Searches and display the test step using the assigned Bottom
probe.
Search and display the test step which Function (F.) is substituted
by JP.
Search and display the test step using the assigned Pin number.
- 201 -
Table of contents
System Installation1
Starting and Quitting Operating system 3
Application Window 4
Titlebar4
Control icon4
Control menu5
Window buttons5
Menubar5
Menu tab5
Toolbar5
Workspace6
Statusbar6
Measuring Principle7
Guarding Function 11
4-Wires Kelvin Measurement 12
Undetectable Components 13
Initial Setting 15
Option Mode 15
Master Mode 16
About System Function 18
File 18
New 19
Open 19
Save 21
Save As 21
Associate 22
Recently Used Files 22
Convert 22
Load SD8 file 23
Save SD8 file 23
Load SDT file 23
Print 23
All Steps Output 23
All Pins Output 25
Output Except Jump 25
Output Only Jump 25
CAD Data Output 25
Exit 25
Edit 26
Step Edit, Step List 27
Programming Step Data 35
Test Data Generation 38
Erase Step Data 39
Erase Searched Step 40

Search 42
Pin Coordinate Edit 43
Erase Pin Coordinate 45
Digitizer 46
Digitizer Select 46
Step Edit by Digitizer 48
Pin Coordinate Edit by Digitizer 48
Step data list 49
Edit 50
Undo 50
Select 51
Step Cut 51
Step Copy 51
Step Paste 51
Step Delete 51
1 Line Insert 51
1 Line Cut 51
1 Line Paste 51
[ENTER SW] Coordinate Set 51
Search 52
Search 52
Forward 52
Previous 53
Replace 53
Move to.. 54
Move to Specified Step 54
Move to Examine 54
Tool 55
Coordinates Map 56
Undo 58
Step Cut 58
Step Copy 58
Step Paste 58
Step Delete 58
All Select 58
Select Release 58
Change Step Data 58
Move to 60
Move Assigned Area 60
Copy Assigned Area 60
Display 60
Map mode 61
Map mode 61
Selection 62
Zoom 62
Color 63
Toolbar 63
Generation 64
Set Combination Measurements 64
Clear Combination Measurements 65
Special Generation 65
Special Generation Clear 66
Kelvin 66
Kelvin Clear 66
IC Open 67
IC Open Special 67
IC Open Clear 67
Ground 68
Ground Coordinates Set 68
Ground Coordinates Set for IC Open 68
Change Ground Pin for Bottom Probe 69
I/O Function 70
Set IO Step 71
Clear IO Step 71
Bottom probe 72
Change Ground Pin for Bottom Probe 72
Set Bottom Probe 72
Change Bottom Probe 72
Clear Bottom Probe 72
Change Bottom Sensor Probe 72
DDE Function 73
Set DDE Step 73
Clear DDE Step 74
Select Revise Area Mode 74
Optical 76
Select Optical Test Mode 76
Scene Recycle 77
Auto Generation 78
Change Step Data 78
Coordinates input 79
High-fly / No-contact-zone 80
View 82
One Step is Displayed With 1 Line 82
One Step is Displayed With 2 Lines 83
Duplication of This Model 84
Window 84
Cascade 85
Tile 85
Reference 86
Reference Value Input 86
Enter the starting and ending step numbers: 87
Reference Input 87
Initialize measuring mode 88
Clear guard point 88
Clear element 88
Clear JP steps 88
Set tolerance automatically 88
Jump all unmeasurable components 88
Group separation set 89
Data Average 90
Averaged Qty 1-16? 90
Open Data Generation 91
Adjacent range 92
Reference Value Generation 92
Reference value of diode measuremenet: 93
Auxiliary 93
IC Open Reference Value Input 93
Optical Reference Value Input 94
Test 96
Coordinates Revise 96
Review Step Data 97
Examination Mode 97
Automatic guard point setting 98
Step data review100
Step data test101
Evaluation of reference value 101
Evaluation of jump steps102
Optical data review102
Optical data test 102
Test 103
LCR Meter104
Total 105
Erase Total105
Erase hourly total105
Erase daily total105
Erase aggregate total106
Step Composition Ratio 106
Fail Total107
Graph108
Tool109
Group Addition110
Auto Location Set122
Change Step Data122
Coordinates Change for Ground123
Optimization125
Coordinates Sort125
Parts Name Sort127
Location by location127
Set combinations measurements 127
Set Combination Measurements 128
Clear Combination Measurements128
Coordinates129
90 Degrees Turn to Clockwise 129
Reverse Turn 133
Board Reference Point Change134
PCB Incline Amend134
Incline/Scale Amend 134
Self Diagnosis135
Probe Movement136
Operation Panel137
Special Switches137
Sensor138
Mesuring Unit139
Scanner Board139
Extension Scanner Board (64pin)140
Relay Check140
Open Check141
Coaxial Scanner Board (12pin)142
Programmable DC Voltage 142
Probe Count143
Stray Capacity144
IC Open145
Adjust Probe 145
Pin Search 146
Mode Setting147
Data Mode 147
Conveyor Set Up148
Camera/Probe Offset 148
Board Reference Point149
Coordinates Management150
Fail Map151
Auxiliary Reference Point(s) 153
Stamp 154
Support pin154
Bottom probe 155
Bottom Sensor Probe157
Probes Lowest Position158
Barcode No.159
Top Position of Probe 160
DDE Communication 161
Index 161
Test mode163
Primary Setup 163
Starting Message165
Group Sequential Test165
Failure Data Storage 166
All Test Data Storage168
Master Mode170
Machine Reference Point 170
Printer Setup 173
Standard Output Format174
Advanced Output Format174
File / Folder175
Main folder176
Folder for convert data 176
Test data (*.ATD / *.NGD) 176
Test Data 176
Auto load 176
Auto save / Time to save176
Short / Open Setup177
Failure Management178
Password Setup 180
Probes Crossing Distance 181
Dubug Status 181
User Preferences182
Kelvin Measurement Setup 184
Option Mode 185
Workstation mode185
RS-232C Port NO.186
Camera System187
Inline Application188
Signal Tower Setting190
Serial Number / Auto Data Loading191
Stamp 192
Input/Output function of I/O step193

DDE Communication 194
IC Open195
Menu Customize 196
PCB Extension support kit196
Vacuum unit 196
Test Program Setup 197
Speed Up the test program197
CA9 File Convert198
View198
About198
Aux 199
The design of the product is under constant review and whilst every effort is made to keep this
manual up to date, the right is reserved to change specifications and equipment at any time
without prior notice.
Fixtureless Tester APT-9400CE/CJ Operators Guide

Issued: Takaya Corporation
Vol. 2

Takaya Flying Probe

Transféré par

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Fixtureless Tester

Put APT-9400 Install CD in the CD-ROM drive of the PC.

Click the Yes button.

Starting and Quitting Operating system

Starting operating system (1)

Starting operating system (2)

Quitting operating system (1)

] icon on the Desktop.

] at the right-top corner of the application window.

Quitting operating system (2)

Quitting operating system (3)

[Menu 1] Application window

: Changes window size

: Reduces window to an icon

: Enlarges windows to fill the screen

: Close the window

Returns window to its

Close the window

fill the screen

[Menu 3] Sample display at Workspace

DC-Constant Current measurement (DC-CC)

Resistors, Capacitors, Diodes (VF)

0.4 ohm 400K ohm

DC 5mA, 50mA, 0.5mA, 5mA, 10mA, 20mA, 50mA (constant current)

DC-Constant Voltage measurement (DC-CV)

DC 0.2V (constant voltage)

4 ohm 40M ohm

AC-Constant Voltage measurement (AC-CV)

Resistors, Capacitors, Inductors

33 ohm - 330K ohm

AC 70mVrms (constant voltage)

160Hz, 1.6KHz, 16KHz, 160KHz

DC-Constant Current measurement (DC-CC)

[Fig. 1] DC-CC measurement

DC-Constant Voltage measurement (DC-CV)

[Fig. 2] DC-CV measurement

AC-Constant Voltage measurement (AC-CV)

[Fig. 3] AC-CV measurement

4-Wires Kelvin Measurement

and Contact resistance

: Internal resistance of Voltmeter

[Fig. 5] 4-Wires Kelvin Measurement

measurement at the device Z as well.

Z can be measured accurately, not influenced by the wire resistance of the

measuring cables and contact resistance of the probes.

connect in parallel. Because R1 occupies

unchangeable even if R1 is missing.

Measuring signal flows mostly across R2.

Measuring signal flows mostly across L1

Measuring signal flows mostly across L1

Measuring signal flows mostly across L1

connect in parallel. Because C1 occupies

unchangeable even if C1 is missing.

Measuring signal flows mostly across C1.

Even if one of these two diodes is missing

or disoriented, the measured value is

] icon on Tool bar.

[Menu 1] Option Mode

[Menu 2] Option Mode menu in Workstation Mode

Set up Camera system and its relative function.

Set up the control for an In-line system (option).

Signal Tower Setting