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a r t i c l e
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Article history:
Received 23 August 2012
Received in revised form 19 November 2012
Accepted 29 November 2012
Available online 6 December 2012
Keywords:
Monovalent copper electrolysis
Additive
Surface roughness
Copper recycling
Ammoniacal solutions
a b s t r a c t
In order to reduce the surface roughness of a copper deposit from cuprous ions in ammoniacal alkaline solutions, optimization of the electrolytic conditions was attempted, and the surface roughness was somewhat
improved. Because the improvement was insufcient, the addition of gelatin or polyethylene glycol (PEG)
to the electrolyte was then examined. It was revealed that both additives effectively polarized during copper
electrodeposition and that the extent of the polarization increased with the molecular weight of the additives. As a result, both surface roughness and crystal size of the copper deposit were reduced. In the case of
PEG, however, nodules tended to form and gelatin was concluded to be superior to PEG as an additive for
the present electrolysis. The inuence of gelatin on the impurity content of the copper deposit was also investigated, and the addition of gelatin was found to have a positive effect on reducing the lead content. This is
important because lead is the most important impurity in the authors' copper recycling process employing
the present electrolysis.
2012 Elsevier B.V. All rights reserved.
1. Introduction
Our research group has been developing a copper recycling process
from used appliances (secondary resources) using monovalent copper
ions (Cu(I)) and ammoniacal alkaline solutions (Alam et al., 2007;
Koyama et al., 2006; Oishi et al., 2006, 2007, 2008). In this process,
metallic copper in secondary resources such as printed circuit boards
is recovered via the following steps: (1) metallic copper is leached as
monovalent copper ions (Cu(I)) using divalent copper ions (Cu(II)) as
the oxidizing reagent in an ammoniacal alkaline solution, (2) impurities
including lead and zinc are removed from the solution by solvent extraction or other techniques, and (3) the puried solution is subjected to an
electrowinning step in which metallic copper and Cu(II) are formed on
the cathode and anode, respectively, from Cu(I). The Cu(II) formed is
then reused as the oxidizing reagent at the rst leaching step. The advantages of this process are the low electric power requirement during
the electrowinning step due to the use of monovalent copper electrolysis and the low cell voltage (Koyama et al., 2006), as well as the potential
to obtain a high-purity copper directly from the secondary resources
such as printed circuit boards (Oishi et al., 2007). In addition, the ammonia/ammonium chloride solution is regarded as one of the alternative
2. Experimental
The copper electrodeposition was conducted in a rectangular vessel
(50 mm130 mm90 mm [h]), which was divided into two components by an anion exchange membrane (Tokuyama Company, Ltd.,
ACM) xed at the center of the vessel. The typical composition of the
electrolytic solution was 5 kmol m3 NH3, 4 kmol m3 NH4Cl, and
0.5 kmol m3 Cu2O. The typical Cu2O concentration, 0.5 kmol m3,
corresponds to a copper content of 64 kg m3, which is slightly higher
than that used in conventional copper electrorening, 4050 kg m3.
These concentration ranges were selected on basis of the results of our
past study reported previously (Oishi et al., 2006). Gelatin (Nippi, Inc. or
Wako Pure Chemical, MW=2.11021.1105) and PEG (Wako Pure
Chemical, MW=21022104) were used as additives at concentrations of 10 or 100 g m3. In order to evaluate the inuence on the impurity content, lead oxide (Wako Pure Chemical) was also added to the
electrolytic solution depending on the objective of the experiment. The
prepared solution was then stirred for 20 h with copper particles of
1 mm diameter along with Ar gas owing into the solution in order to
reduce the generation of divalent copper ions (Cu(II)), which were
formed by the unavoidable oxidation of Cu2O or Cu(I) during the solution preparation. Ar gas was also used to prevent the oxidation of
Cu(I) during the experiment. The anolyte contained 5 kmol m3 NH3
10
(a)2.0
(b)4.0
(c)5.0
100
1000
10
C(NH3) / kmol m
-3
CNH4Cl / kmol m
10
-3
(a)3.0
(b)5.0
(c)10
59
-3
1000
(a)0.25
(b)0.50
(c)1.0
0
100
CCu2O / kmol m
100
1000
60
10
A)
-3
CCu2O / kmol m
(a)0.25
40
(a)0.25
30
(b)0.50
B)
-3
CCu2O / kmol m
(b)0.50
(c)1.0
(c)1.0
20
4
10
2
0
100
1000
100
1000
Fig. 4. Surface roughness of the copper deposits obtained from the electrolytic solutions containing 5 kmol m3 NH3, 4 kmol m3 NH4Cl, and (a) 0.25, (b) 0.5, and (c) 1 kmol m3
Cu2O at a current density of (A) 500 and (B) 2000 Am2 under agitation.
atomic emission spectroscopy (ICP-AES) measurement, after successive rinsing in a NH3(2.5 kmol m 3)NH4Cl(2 kmol m 3) solution,
tap water, and deionized water. The surface roughness was measured
using a contact-type roughness meter (Tokyo Seimitsu Co., SURFCOM
480A) at a scan rate of 0.06 mm s1 for 4.0 mm in the vertical direction.
The values in this paper are given as the average of three measurements
at different positions near the center of the cathode. The average roughness (Ra) was selected as the parameter of the surface roughness,
because some of the samples had heterogeneous regions such as nodules
on a sub-mm scale. Average roughness, which reects the roughness of
both the microscopic and macroscopic scale to a certain extent, is appropriate for the evaluation of such samples.
2CuNH3 2 CuNH3 4 Cu
The inuence of the concentration of each electrolyte on the surface
roughness at a current density of 1000 Am2 is shown in Figs. 13,
where the basic bath composition was selected to be 5 kmol m3
NH3, 4 kmol m3 NH4Cl, and 0.5 kmol m3 Cu2O, and the concentration of each electrolyte was varied with xed concentrations of the
others. The cathodic current efciency calculated from the weight gain
of the cathode on the assumption of one electron reaction was in the
range 7696%, which was controlled by the Cu(II) concentration as the
authors reported elsewhere (Oishi et al., 2006). As shown in Figs. 1
and 2, the NH3 and NH4Cl concentrations seem to have no signicant
inuence on the surface roughness, although increases in the NH3 and
NH4Cl concentrations cause a slight increase in the kinematic viscosity
and a signicant increase in the electric conductivity of the solution,
1000
100
Gelatin free
10
MW=
2,100
MW=
3,700
MW= 14,000
MW= 110,000
1
-0.2
-0.3
-0.4
-0.5
-0.6
61
1000
100
PEG free
10
MW=
200
MW= 2000
MW= 20000
Additive free
PEG added
Gelatin added
0
-0.2
-0.3
-0.4
-0.5
-0.6
100
1000
62
a) Additive free
c) PEG
b) Gelatin
1cm
1cm
1cm
Fig. 8. Appearance of the copper deposits obtained by galvanostatic electrolysis at 300 A m2 for 50 h in the electrolytic solutions containing 5 kmol m3 NH3, 4 kmol m3 NH4Cl,
and 0.5 kmol m3 Cu2O with and without 10 g m3 of additives with no articial agitation.
b) Gelatin
a) Additive free
(a-1)
c) PEG
(b-1)
200 m
(a-2)
(c-1)
200 m
(b-2)
10 m
200 m
(c-2)
10 m
10 m
Fig. 9. SEM images of the copper deposits obtained by galvanostatic electrolysis at 300 A m2 for 50 h in the electrolytic solutions containing 5 kmol m3 NH3, 4 kmol m3 NH4Cl,
and 0.5 kmol m3 Cu2O with and without 10 g m3 of additives with no articial agitation.
103
10
10
Cu
100
Pb
10-1
10-2
Additive free
10-3
10-4
Gelatin added
-0.26
-0.28
-0.30
-0.32
-0.34
-0.36
63
The authors wish to acknowledge Nippi, Inc., for supplying the gelatins
of various molecular weights.
References
was not puried in advance (Oishi et al., 2007). To evaluate the inuence
of gelatin on the impurity content, a potentiostatic electrolysis was
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on the cathode, the average partial cathodic current density for copper
and lead electrodeposition was calculated and plotted in Fig. 10 as a
function of the cathode potential. The number of electrons required for
the copper and lead electrodeposition was assumed to be 1 and 2,
respectively. From this gure, it was recognized that the lead electrodeposition was also suppressed by the addition of gelatin as well as the
copper electrodeposition. Because there is a certain difference between
the extents of polarization for the copper and lead electrodeposition,
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decrease in the lead content by the addition of gelatin (Fig. 11) might
be caused by the adsorption of gelatin molecules on the active sites of
the copper surface for the lead electrodeposition or adsorption.
4. Conclusions
Additive free
Gelatin added
1000
500
-0.26
-0.28
-0.30
-0.32
-0.34
-0.36
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