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A fast and simple method for determining the complex dielectric properties of materials without ambiguity has been
developed based on one-port reflection measurements made
by an ANA. The developed algorithm solves the inherent
ambiguity of the problem under analysis, and eliminates the
need for any initial estimation of the dielectric properties, as
required by other reflection methods.
The error has been analyzed taking into account the
typical uncertainty of the measurement equipment and the
unascertained sample dimensions. Using these uncertainties,
the sample length has been identified as a very important
parameter to obtain high accuracy in the dielectric characterization. For low-loss materials, the accuracy of the method
may be limited if very long samples are not considered. In
this case, resonant cavity methods might be used to increment the accuracy.
Although the application of this method is useful for all
materials, it is particularly recommended for liquids, powders,
and granular materials.
REFERENCES
1. R.C. Jain and W.A.G. Voss, Dielectric measurements methods
for industrial scientific and medical applications in microwave
frequency range, IETE Tech Rev 11 1994., 297311.
2. R.H. Voelker, G. Lei, G. Pan, and B.K. Gilbert, Determination
of complex permittivity of low-loss dielectrics, IEEE Trans Microwave Theory Tech 45 1997., 19551960.
3. S. Roberts and A. Von Hippel, A new method for measuring
dielectric constant and loss in the range of centimeter waves,
J Appl Phys 17 1946., 610616.
194
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 25, No. 3, May 5 2000
The handset model is characterized by conducting surfaces. The model includes the rectangular box of the handset
chassis with the same dimensions as used in w3x: l s 100 mm,
w s 40 mm, and t s 10 mm. The RF feeding cable is 600 mm
long, and the coaxial sleeve on the cable has a variable size
and position. The sleeve is defined as an infinitely thin
conducting sheet.
The MoM code is used to calculate the current distribution, on the triangular patches. From the current distribution,
the radiated far-field pattern at any point in space can be
obtained by superposition of the radiated fields from all
current sources on the model surface.
However, one drawback of the MoM code is obvious if we
look at the long end of the feed cable. A typical feed cable
during a measurement is several meters long, and after some
12 m from the device under test it is situated in an arbitrary
orientation, possibly lying on or behind absorbing material,
and finally, it reaches a feedthrough leading out of the
shielded room. In the MoM calculation a straight cable with
a certain length has to be chosen. Only a length of less than
1 m can be simulated with a reasonable use of resources and
time for a PC. For any length of cable, the termination of the
cable stub is inherently an open end, as the implementation
of lossy material is not possible in this EFIE code. Therefore,
the reflection coefficient at the cable end is < < s 1, causing
resonances and standing waves between the cable end and
the sleeve. Such a resonance can result in an especially high
radiation. Thus, a good position of the sleeve might be
rejected because that specific length of the cable behind the
sleeve happens to support a resonance in the surface current
on the cable. A solution to this problem is described in the
next section.
GENETIC ALGORITHM
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 25, No. 3, May 5 2000
195
196
The authors thank Dr. Jiasu Cao for making the EFIE core
code available in Matlab format.
REFERENCES
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3. C. Icheln, J. Ollikainen, and P. Vainikainen, Reducing the influence of feed cables on small antenna measurements, Electronics
Lett 35 1999., 12121214.
4. S.M. Rao, D.R. Wilton, and A.W. Glisson, Electromagnetic scattering by surfaces of arbitrary shape, IEEE Trans Antennas
Propagat, AP30, 1982., 409418.
5. S.M. Rao, Electromagnetic scattering and radiation of arbitrarily
shaped surfaces by triangular patch modelling, Ph.D. dissertation,
Univ. Mississippi, Aug. 1980.
6. S. He, J. Cao, Scattering from a bi-isotropic object of arbitrary
shape, J Electromag Waves Appl 12 1998., 15471574.
7. D.E. Goldberg, Genetic algorithms in search, optimization and
machine learning, Addison-Wesley, Reading, MA, 1989.
8. D.S. Weile, and E. Michielssen, Genetic algorithms optimization
applied to electromagnetics: A review, IEEE Trans Antennas
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2000 John Wiley & Sons, Inc.
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 25, No. 3, May 5 2000