PSGTECHS COE INDUTECH

Promoted by Ministry of Textiles - Government of India

PSG Foundry Division Campus, Avinashi Road, Neelambur, Coimbatore-641 062
Tel: 0422 3933 250-252 Fax: 0422 2573833 E-mail: psgindutech@gmail.com

PSG COLLEGE OF TECHNOLOGY

TESTING REPORT

Report No: 144

Report Date: 28.03.2015

Name of the Customer: Mr.C.K.Shidhadharan

Description of the Sample: powder
Sample Received Date: 17.03.2015
Type of test: XRD Test
Test done by: S.Vishak
Testing Standard: NA

Results :
Sample 1 :
Anchor Scan Parameters
Dataset Name:
File name:
Sample Identification:
Comment:

Measurement Start Date/Time:

Operator:
Raw Data Origin:
Scan Axis:
Start Position [2]:
End Position [2]:
Step Size [2]:
Scan Step Time [s]:
Scan Type:
PSD Mode:
PSD Length [2]:
Offset [2]:
Divergence Slit Type:
Divergence Slit Size []:
Specimen Length [mm]:

Sample BM 3%_1
D:\XRD Data\Sample BM 3%_1.xrdml
BM 3%
Configuration=Flat Sample Stage, Owner=User-1, Creation date=6/6/2014 8:14:48 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step
size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\Demo\Sample BM
3%.xrdmp, Identifier={AB550F1B-C3C2-4E6D-ADC9-118750F8A9FD}
3/26/2015 10:13:30 AM
User
XRD measurement (*.XRDML)
Gonio
20.0131
79.9691
0.0260
106.5900
Continuous
Scanning
3.35
0.0000
Fixed
0.4354
10.00

1|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Measurement Temperature [C]:

Anode Material:
K-Alpha1 []:
K-Alpha2 []:
K-Beta []:
K-A2 / K-A1 Ratio:
Generator Settings:
Diffractometer Type:
Diffractometer Number:
Goniometer Radius [mm]:
Dist. Focus-Diverg. Slit [mm]:
Incident Beam Monochromator:
Spinning:

25.00
Cu
1.54060
1.54443
1.39225
0.50000
30 mA, 45 kV
0000000011155153
0
240.00
100.00
No
No

Graphics

Peak List
Pos.[2]
20.8788
22.9126
23.7193
26.6111
28.0126
29.4044
30.9485
32.1399
34.0071
36.0179
36.6024
39.4325
40.9447

Height [cts]
840.11
224.28
244.85
1978.70
2796.48
374.58
138.78
384.01
242.40
145.79
191.97
238.36
102.92

FWHMLeft[2]
0.2047
0.2047
0.3070
0.3070
0.3070
0.3070
0.2558
0.2047
0.4093
0.2047
0.3070
0.4093
0.8187

d-spacing []
4.25472
3.88146
3.75124
3.34980
3.18532
3.03764
2.88951
2.78507
2.63631
2.49361
2.45512
2.28519
2.20422

Rel. Int. [%]

30.04
8.02
8.76
70.76
100.00
13.39
4.96
13.73
8.67
5.21
6.86
8.52
3.68

2|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

42.4730
45.7934
47.2363
49.1590
50.5837
52.5318
60.0056
62.1807
68.0076

236.45
96.83
98.98
285.13
234.92
59.12
129.33
49.51
99.07

0.3070
0.6140
0.5117
0.2047
0.2047
0.4093
0.3070
0.5117
1.0234

2.12838
1.98148
1.92427
1.85341
1.80450
1.74208
1.54174
1.49294
1.37853

8.46
3.46
3.54
10.20
8.40
2.11
4.62
1.77
3.54

Pattern List
Visible Ref.Code
Chem. Formula
*
01-070-3755
Si O2

Score
66

Compound Name

Displ.[2]

Scale Fac.

Silicon Oxide

0.000

0.532

Sample 2
Anchor Scan Parameters
Dataset Name:
File name:
Sample Identification:
Comment:

Measurement Start Date/Time:

Operator:
Raw Data Origin:
Scan Axis:
Start Position [2]:
End Position [2]:
Step Size [2]:
Scan Step Time [s]:
Scan Type:
PSD Mode:
PSD Length [2]:
Offset [2]:
Divergence Slit Type:
Divergence Slit Size []:
Specimen Length [mm]:
Measurement Temperature [C]:
Anode Material:
K-Alpha1 []:
K-Alpha2 []:
K-Beta []:
K-A2 / K-A1 Ratio:
Generator Settings:
Diffractometer Type:
Diffractometer Number:
Goniometer Radius [mm]:
Dist. Focus-Diverg. Slit [mm]:
Incident Beam Monochromator:
Spinning:

Sample BM 5%_1
D:\XRD Data\Sample BM 5%_1.xrdml
BM 5%
Configuration=Flat Sample Stage, Owner=User-1, Creation date=6/6/2014 8:14:48 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step
size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\Demo\Sample BM
5%.xrdmp, Identifier={99B3F834-219F-44F0-A19C-3B1CFDCDA5B0}
3/26/2015 11:07:12 AM
User
XRD measurement (*.XRDML)
Gonio
20.0131
79.9691
0.0260
106.5900
Continuous
Scanning
3.35
0.0000
Fixed
0.4354
10.00
25.00
Cu
1.54060
1.54443
1.39225
0.50000
30 mA, 45 kV
0000000011155153
0
240.00
100.00
No
No

3|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Graphics

Peak List
Pos.[2]
22.0626
22.9712
23.7261
24.4511
26.6778
27.9184
28.5472
29.4730
30.4296
32.1844
34.3163
35.4291
38.5062
39.4274
41.5814
42.5038
46.9727
50.1868
50.8446
54.8165
57.4252
58.3278
59.9995
68.2479
69.7374
71.8868

Height [cts]
753.23
161.13
146.68
133.04
1616.00
965.83
570.25
457.07
699.24
215.51
177.45
123.96
49.64
231.92
108.71
129.52
211.09
168.21
98.53
94.17
116.06
125.96
232.27
124.45
63.72
91.64

FWHMLeft[2]
0.3070
0.2047
0.3070
0.3070
0.2047
0.3070
0.2047
0.2047
0.2047
0.2047
0.6140
0.3070
0.3070
0.3070
0.6140
0.2047
0.2047
0.2047
0.3070
0.3070
0.3070
0.6140
0.3070
0.3070
0.3070
0.3070

d-spacing []
4.02903
3.87168
3.75019
3.64060
3.34158
3.19584
3.12687
3.03072
2.93760
2.78132
2.61326
2.53368
2.33800
2.28547
2.17193
2.12691
1.93445
1.81784
1.79586
1.67476
1.60473
1.58203
1.54189
1.37426
1.34851
1.31338

Rel. Int. [%]

46.61
9.97
9.08
8.23
100.00
59.77
35.29
28.28
43.27
13.34
10.98
7.67
3.07
14.35
6.73
8.01
13.06
10.41
6.10
5.83
7.18
7.79
14.37
7.70
3.94
5.67

4|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Pattern List
Visible Ref.Code
Chem. Formula
*
01-085-0798
Si O2
*
98-003-0124
Al1.52 Ca0.52 Na0...

Score

Compound Name

Displ.[2]

Scale Fac.

55

Silicon Oxide

0.000

0.761

55

Anorthite, sodian

0.000

0.614

Sample 3
Anchor Scan Parameters
Dataset Name:
File name:
Sample Identification:
Comment:

Measurement Start Date/Time:

Operator:
Raw Data Origin:
Scan Axis:
Start Position [2]:
End Position [2]:
Step Size [2]:
Scan Step Time [s]:
Scan Type:
PSD Mode:
PSD Length [2]:
Offset [2]:
Divergence Slit Type:
Divergence Slit Size []:
Specimen Length [mm]:
Measurement Temperature [C]:
Anode Material:
K-Alpha1 []:
K-Alpha2 []:
K-Beta []:
K-A2 / K-A1 Ratio:
Generator Settings:
Diffractometer Type:
Diffractometer Number:
Goniometer Radius [mm]:
Dist. Focus-Diverg. Slit [mm]:
Incident Beam Monochromator:
Spinning:

Sample BS 3%_1
D:\XRD Data\Sample BS 3%_1.xrdml
Sample BS 3%
Configuration=Flat Sample Stage, Owner=User-1, Creation date=6/6/2014 8:14:48 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step
size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\Demo\Sample BS
3%.xrdmp, Identifier={05238354-C61E-48F7-A0C6-C97184BC4D5D}
3/26/2015 9:48:19 AM
User
XRD measurement (*.XRDML)
Gonio
20.0131
79.9691
0.0260
106.5900
Continuous
Scanning
3.35
0.0000
Fixed
0.4354
10.00
25.00
Cu
1.54060
1.54443
1.39225
0.50000
30 mA, 45 kV
0000000011155153
0
240.00
100.00
No
No

Graphics

5|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Peak List
Pos.[2]
20.8191
21.9594
22.9100
23.6022
26.5846
27.8497
29.3174
30.3938
32.0886
34.0538
35.4633
36.5562
39.4005
41.0964
42.9746
45.7451
46.9726
50.0612
50.7394
53.1988
55.4352
59.8795
62.5976
63.8350
68.3405
73.5120

Height [cts]
322.03
314.23
230.87
262.40
2091.48
689.04
360.97
149.60
352.16
305.77
385.67
199.19
192.13
103.53
125.99
134.42
112.62
143.84
114.98
95.31
61.64
142.50
87.39
114.66
141.93
59.51

FWHMLeft[2]
0.3070
0.3070
0.3070
0.2047
0.3070
0.2047
0.3070
0.2047
0.2047
0.2047
0.2558
0.2047
0.2047
0.5117
0.3070
0.2047
0.6140
0.4093
0.3070
0.2558
0.3070
0.2047
0.4093
0.3070
0.3070
0.3070

d-spacing []
4.26679
4.04773
3.88190
3.76958
3.35308
3.20357
3.04645
2.94097
2.78940
2.63280
2.53132
2.45812
2.28697
2.19643
2.10469
1.98346
1.93445
1.82211
1.79933
1.72180
1.65752
1.54469
1.48399
1.45818
1.37262
1.28831

Rel. Int. [%]

15.40
15.02
11.04
12.55
100.00
32.95
17.26
7.15
16.84
14.62
18.44
9.52
9.19
4.95
6.02
6.43
5.38
6.88
5.50
4.56
2.95
6.81
4.18
5.48
6.79
2.85

Pattern List

6|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Visible Ref.Code
Chem. Formula
*
01-070-2517
Si O2

Score
64

Compound Name

Displ.[2]

Scale Fac.

Silicon Oxide

0.000

0.969

Sample 4
Anchor Scan Parameters
Dataset Name:
File name:
Sample Identification:
Comment:

Measurement Start Date/Time:

Operator:
Raw Data Origin:
Scan Axis:
Start Position [2]:
End Position [2]:
Step Size [2]:
Scan Step Time [s]:
Scan Type:
PSD Mode:
PSD Length [2]:
Offset [2]:
Divergence Slit Type:
Divergence Slit Size []:
Specimen Length [mm]:
Measurement Temperature [C]:
Anode Material:
K-Alpha1 []:
K-Alpha2 []:
K-Beta []:
K-A2 / K-A1 Ratio:
Generator Settings:
Diffractometer Type:
Diffractometer Number:
Goniometer Radius [mm]:
Dist. Focus-Diverg. Slit [mm]:
Incident Beam Monochromator:
Spinning:

Sample BS 5%_1
D:\XRD Data\Sample BS 5%_1.xrdml
BS 5%
Configuration=Flat Sample Stage, Owner=User-1, Creation date=6/6/2014 8:14:48 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step
size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\Demo\Sample BS
5%.xrdmp, Identifier={699384A4-5148-4A9A-A1C7-E037FB493207}
3/26/2015 10:45:41 AM
User
XRD measurement (*.XRDML)
Gonio
20.0131
79.9691
0.0260
106.5900
Continuous
Scanning
3.35
0.0000
Fixed
0.4354
10.00
25.00
Cu
1.54060
1.54443
1.39225
0.50000
30 mA, 45 kV
0000000011155153
0
240.00
100.00
No
No

Graphics

7|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Peak List
Pos.[2]
20.8414
22.9221
23.6496
26.5966
27.8992
29.4043
32.1219
34.1215
39.4200
40.8871
44.0564
45.6545
47.1184
49.9507
51.4919
54.6010
59.9552
68.0224
78.4056

Height [cts]
250.24
247.55
451.43
1422.45
833.32
514.19
344.99
496.67
150.42
137.24
49.37
56.33
222.09
127.89
66.32
40.49
181.16
65.51
61.93

FWHMLeft[2]
0.3070
0.2047
0.3070
0.3070
0.3070
0.3070
0.2558
0.3070
0.2047
0.5117
0.4093
0.8187
0.3070
0.5117
0.3070
1.0234
0.2558
0.6140
0.4093

d-spacing []
4.26228
3.87986
3.76214
3.35160
3.19800
3.03764
2.78659
2.62773
2.28588
2.20719
2.05549
1.98719
1.92881
1.82588
1.77479
1.68086
1.54292
1.37826
1.21971

Rel. Int. [%]

17.59
17.40
31.74
100.00
58.58
36.15
24.25
34.92
10.57
9.65
3.47
3.96
15.61
8.99
4.66
2.85
12.74
4.61
4.35

Pattern List
Visible Ref.Code
Chem. Formula
*
01-078-1252
Si O2

Score
67

Compound Name

Displ.[2]

Scale Fac.

Silicon Oxide

0.000

0.880

8|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Sample 5
Anchor Scan Parameters
Dataset Name:
File name:
Sample Identification:
Comment:

Measurement Start Date/Time:

Operator:
Raw Data Origin:
Scan Axis:
Start Position [2]:
End Position [2]:
Step Size [2]:
Scan Step Time [s]:
Scan Type:
PSD Mode:
PSD Length [2]:
Offset [2]:
Divergence Slit Type:
Divergence Slit Size []:
Specimen Length [mm]:
Measurement Temperature [C]:
Anode Material:
K-Alpha1 []:
K-Alpha2 []:
K-Beta []:
K-A2 / K-A1 Ratio:
Generator Settings:
Diffractometer Type:
Diffractometer Number:
Goniometer Radius [mm]:
Dist. Focus-Diverg. Slit [mm]:
Incident Beam Monochromator:
Spinning:

Sample CC 0%_1
D:\XRD Data\Sample CC 0%_1.xrdml
CC 0%
Configuration=Flat Sample Stage, Owner=User-1, Creation date=6/6/2014 8:14:48 AM
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step
size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\Demo\Sample CC
0%.xrdmp, Identifier={BD4A6CC6-FC3B-42E5-8059-12346713E680}
3/26/2015 11:59:55 AM
User
XRD measurement (*.XRDML)
Gonio
20.0131
79.9691
0.0260
106.5900
Continuous
Scanning
3.35
0.0000
Fixed
0.4354
10.00
25.00
Cu
1.54060
1.54443
1.39225
0.50000
30 mA, 45 kV
0000000011155153
0
240.00
100.00
No
No

Graphics

9|Page
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Peak List
Pos.[2]
21.8244
22.8109
23.6994
26.5600
28.0011
29.3504
30.3314
31.9304
33.8324
35.1045
38.1906
39.4617
40.7821
45.0553
47.0980
49.0217
54.5099
59.9075
68.0378
71.5837

Height [cts]
1185.65
128.89
601.84
2300.71
1107.08
205.31
360.48
178.97
180.04
307.98
97.66
102.22
95.34
205.21
151.50
168.69
41.29
178.74
111.80
52.46

FWHMLeft[2]
0.2047
0.3070
0.2047
0.2047
0.2047
0.2558
0.3070
0.3070
0.4093
0.3070
0.2047
0.3582
0.4093
0.3070
0.6140
0.2047
1.2280
0.2047
0.8187
0.6140

d-spacing []
4.07247
3.89853
3.75434
3.35613
3.18660
3.04311
2.94687
2.80286
2.64952
2.55637
2.35659
2.28357
2.21263
2.01221
1.92959
1.85828
1.68345
1.54403
1.37799
1.31820

Rel. Int. [%]

51.53
5.60
26.16
100.00
48.12
8.92
15.67
7.78
7.83
13.39
4.24
4.44
4.14
8.92
6.59
7.33
1.79
7.77
4.86
2.28

Pattern List

10 | P a g e
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer

Visible Ref.Code
Chem. Formula
*
00-050-0493
Pb4 Bi V O8
*
00-028-0582
K Li S O4

Score

Compound Name

Displ.[2]

Scale Fac.

62

Lead Bismuth Vanad..

0.000

0.826

52

Lithium Potassium ..

0.000

0.258

Note: Samples will be retained as per our internal guidelines for a particular period of time.

For PSGTECHS COE INDUTECH

This is a computer generated report. No need of signature

11 | P a g e
Important:
This Report is strictly CONFIDENTIAL. Its use for publicity, arbitration or as evidence
In legal disputes is forbidden. The Results relate only to the sample supplied by the customer