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by MTP23P06V/D

SEMICONDUCTOR TECHNICAL DATA

  




 




   

Motorola Preferred Device

PChannel EnhancementMode Silicon Gate

TMOS POWER FET

23 AMPERES
60 VOLTS
RDS(on) = 0.120 OHM

TMOS V is a new technology designed to achieve an onresistance area product about onehalf that of standard MOSFETs. This
new technology more than doubles the present cell density of our
50 and 60 volt TMOS devices. Just as with our TMOS EFET
designs, TMOS V is designed to withstand high energy in the
avalanche and commutation modes. Designed for low voltage, high
speed switching applications in power supplies, converters and
power motor controls, these devices are particularly well suited for
bridge circuits where diode speed and commutating safe operating
areas are critical and offer additional safety margin against
unexpected voltage transients.

TM

New Features of TMOS V

Onresistance Area Product about Onehalf that of Standard
MOSFETs with New Low Voltage, Low RDS(on) Technology
Faster Switching than EFET Predecessors

Features Common to TMOS V and TMOS EFETS

Avalanche Energy Specified
IDSS and VDS(on) Specified at Elevated Temperature
Static Parameters are the Same for both TMOS V and
TMOS EFET

S
CASE 221A06, Style 5
TO220AB

MAXIMUM RATINGS (TC = 25C unless otherwise noted)

Symbol

Value

Unit

60

Vdc

DraintoGate Voltage (RGS = 1.0 M)

VDSS
VDGR

60

Vdc

GatetoSource Voltage Continuous

GatetoSource Voltage Nonrepetitive (tp 10 ms)

VGS
VGSM

15
25

Vdc
Vpk

Drain Current Continuous @ 25C

Drain Current Continuous @ 100C
Drain Current Single Pulse (tp 10 s)

ID
ID
IDM

23
15
81

Adc

Total Power Dissipation @ 25C

Derate above 25C

PD

90
0.60

Watts
W/C

TJ, Tstg
EAS

55 to 175

794

mJ

RJC
RJA

1.67
62.5

C/W

TL

260

Rating
DraintoSource Voltage

Operating and Storage Temperature Range

Single Pulse DraintoSource Avalanche Energy STARTING TJ = 25C
(VDD = 25 Vdc, VGS = 10 Vdc, PEAK IL = 23 Apk, L = 3.0 mH, RG = 25 )
Thermal Resistance Junction to Case
Thermal Resistance Junction to Ambient
Maximum Lead Temperature for Soldering Purposes, 1/8 from Case for 10 seconds

Apk

Designers Data for Worst Case Conditions The Designers Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit
curves representing boundaries on device characteristics are given to facilitate worst case design.

EFET, Designers and TMOS V are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.
Preferred devices are Motorola recommended choices for future use and best overall value.

REV 1

TMOS
Motorola
Motorola, Inc.
1996

Power MOSFET Transistor Device Data

MTP23P06V
ELECTRICAL CHARACTERISTICS (TJ = 25C unless otherwise noted)
Symbol

Characteristic

Min

Typ

Max

Unit

60

60.5

Vdc
mV/C

10
100

100

nAdc

2.0

2.8
5.3

4.0

Vdc
mV/C

0.093

0.12

Ohm

3.3
3.2

5.0

11.5

Ciss

1160

1620

Coss

380

530

Crss

105

210

td(on)

13.8

30

tr

98.3

200

td(off)

41

80

tf

62

120

QT

38

50

Q1

7.0

Q2

18

Q3

14

2.2
1.8

3.5

trr

142.2

ta

100.5

tb

41.7

QRR

0.804

3.5
4.5

7.5

OFF CHARACTERISTICS
DrainSource Breakdown Voltage
(VGS = 0 Vdc, ID = 0.25 mAdc)
Temperature Coefficient (Positive)

V(BR)DSS

Zero Gate Voltage Drain Current

(VDS = 60 Vdc, VGS = 0 Vdc)
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150C)

IDSS

GateBody Leakage Current (VGS = 15 Vdc, VDS = 0 Vdc)

IGSS

Adc

ON CHARACTERISTICS (1)
Gate Threshold Voltage
(VDS = VGS, ID = 250 Adc)
Threshold Temperature Coefficient (Negative)

VGS(th)

Static DrainSource OnResistance (VGS = 10 Vdc, ID = 11.5 Adc)

RDS(on)

DrainSource OnVoltage
(VGS = 10 Vdc, ID = 23 Adc)
(VGS = 10 Vdc, ID = 11.5 Adc, TJ = 150C)

VDS(on)

Forward Transconductance
(VDS = 10.9 Vdc, ID = 11.5 Adc)

Vdc

gFS

Mhos

DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance

(VDS = 25 Vdc, VGS = 0 Vdc,

f = 1.0 MHz)

Transfer Capacitance

pF

SWITCHING CHARACTERISTICS (2)

TurnOn Delay Time
Rise Time
TurnOff Delay Time

(VDD = 30 Vdc, ID = 23 Adc,

VGS = 10 Vdc,
RG = 9.1 )

Fall Time
Gate Charge
(See Figure 8)
(VDS = 48 Vdc, ID = 23 Adc,
VGS = 10 Vdc)

ns

nC

SOURCEDRAIN DIODE CHARACTERISTICS

Forward OnVoltage

(IS = 23 Adc, VGS = 0 Vdc)

(IS = 23 Adc, VGS = 0 Vdc, TJ = 150C)

Reverse Recovery Time

(IS = 23 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/s)
Reverse Recovery Stored Charge

VSD

Vdc

ns

INTERNAL PACKAGE INDUCTANCE

Internal Drain Inductance
(Measured from contact screw on tab to center of die)
(Measured from the drain lead 0.25 from package to center of die)

LD

Internal Source Inductance

(Measured from the source lead 0.25 from package to source bond pad)

LS

nH

nH

(1) Pulse Test: Pulse Width 300 s, Duty Cycle 2%.

(2) Switching characteristics are independent of operating junction temperature.

Motorola TMOS Power MOSFET Transistor Device Data

MTP23P06V
TYPICAL ELECTRICAL CHARACTERISTICS
40
VGS = 10V

I D , DRAIN CURRENT (AMPS)

TJ = 25C
40

8V
9V
7V

30
6V

20

10

VDS 10 V

35
I D , DRAIN CURRENT (AMPS)

50

5V

TJ = 55C
25C

30
100C

25
20
15
10
5

4V
0

Figure 2. Transfer Characteristics

TJ = 100C

0.12
25C

0.1
0.08

55C
0.06
0.04
0.02
5

10

15
20
25
30
ID, DRAIN CURRENT (AMPS)

35

40

45

0.12
TJ = 25C
0.115
0.11
0.105

VGS = 10 V

0.1
0.095
15 V

0.09
0.085
0.08

Figure 3. OnResistance versus Drain Current

and Temperature

10

15
20
30
35
25
ID, DRAIN CURRENT (AMPS)

40

45

50

Figure 4. OnResistance versus Drain Current

and Gate Voltage

1.8

100
VGS = 0 V

VGS = 10 V
ID = 11.5 A
I DSS , LEAKAGE (nA)

RDS(on) , DRAINTOSOURCE RESISTANCE

(NORMALIZED)

Figure 1. OnRegion Characteristics

0.14

1.4

VGS, GATETOSOURCE VOLTAGE (VOLTS)

VGS = 10 V

1.6

VDS, DRAINTOSOURCE VOLTAGE (VOLTS)

0.16

10

R DS(on) , DRAINTOSOURCE RESISTANCE (OHMS)

R DS(on) , DRAINTOSOURCE RESISTANCE (OHMS)

1.2
1
0.8
0.6

TJ = 125C

10

0.4
0.2
0
50

25

0
25
50
75
100 125
TJ, JUNCTION TEMPERATURE (C)

150

175

Figure 5. OnResistance Variation with

Temperature

Motorola TMOS Power MOSFET Transistor Device Data

50
10
20
30
40
VDS, DRAINTOSOURCE VOLTAGE (VOLTS)

60

Figure 6. DrainToSource Leakage

Current versus Voltage

MTP23P06V
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge controlled.
The lengths of various switching intervals (t) are determined by how fast the FET input capacitance can be charged
by current from the generator.

The capacitance (Ciss) is read from the capacitance curve at

a voltage corresponding to the offstate condition when calculating td(on) and is read at a voltage corresponding to the
onstate when calculating td(off).

The published capacitance data is difficult to use for calculating rise and fall because draingate capacitance varies
greatly with applied voltage. Accordingly, gate charge data is
used. In most cases, a satisfactory estimate of average input
current (IG(AV)) can be made from a rudimentary analysis of
the drive circuit so that

At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source
lead, inside the package and in the circuit wiring which is
common to both the drain and gate current paths, produces a
voltage at the source which reduces the gate drive current.
The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex.
The MOSFET output capacitance also complicates the
mathematics. And finally, MOSFETs have finite internal gate
resistance which effectively adds to the resistance of the
driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is
affected by the parasitic circuit elements. If the parasitics
were not present, the slope of the curves would maintain a
value of unity regardless of the switching speed. The circuit
used to obtain the data is constructed to minimize common
inductance in the drain and gate circuit loops and is believed
readily achievable with board mounted components. Most
power electronic loads are inductive; the data in the figure is
taken with a resistive load, which approximates an optimally
snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces
switching losses.

t = Q/IG(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as
the plateau voltage, VSGP. Therefore, rise and fall times may
be approximated by the following:
tr = Q2 x RG/(VGG VGSP)
tf = Q2 x RG/VGSP
where
VGG = the gate drive voltage, which varies from zero to VGG
RG = the gate drive resistance
and Q2 and VGSP are read from the gate charge curve.
During the turnon and turnoff delay times, gate current is
not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for
voltage change in an RC network. The equations are:
td(on) = RG Ciss In [VGG/(VGG VGSP)]
td(off) = RG Ciss In (VGG/VGSP)
4000

C, CAPACITANCE (pF)

Ciss
3000

VGS = 0 V

VDS = 0 V

TJ = 25C

Crss

2000
Ciss
1000
Coss
Crss

0
10

5
VGS

10

15

20

25

VDS

GATETOSOURCE OR DRAINTOSOURCE VOLTAGE (VOLTS)

Figure 7. Capacitance Variation

Motorola TMOS Power MOSFET Transistor Device Data

30
QT

9
8

27
24

Q2

Q1

VGS

21

18

15

12
9

3
2
Q3

1
0

TJ = 25C
ID = 23 A

VDS
10

15

20

30

25

35

6
3
0
40

1000

t, TIME (ns)

10

VDS , DRAINTOSOURCE VOLTAGE (VOLTS)

VGS, GATETOSOURCE VOLTAGE (VOLTS)

MTP23P06V
TJ = 25C
ID = 23 A
VDD = 30 V
VGS = 10 V

100

tr
tf
td(off)
td(on)

10

1
1

10

Qg, TOTAL GATE CHARGE (nC)

RG, GATE RESISTANCE (OHMS)

Figure 8. GateToSource and DrainToSource

Voltage versus Total Charge

Figure 9. Resistive Switching Time

Variation versus Gate Resistance

100

DRAINTOSOURCE DIODE CHARACTERISTICS

I S , SOURCE CURRENT (AMPS)

25
TJ = 25C
VGS = 0 V

20

15

10

0.25

0.5

0.75

1.25

1.5

1.75

2.25

2.5

VSD, SOURCETODRAIN VOLTAGE (VOLTS)

Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define
the maximum simultaneous draintosource voltage and
drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25C. Peak
repetitive pulsed power limits are determined by using the
thermal response data in conjunction with the procedures
discussed in AN569, Transient Thermal ResistanceGeneral
Data and Its Use.
Switching between the offstate and the onstate may traverse any load line provided neither rated peak current (IDM)
nor rated voltage (VDSS) is exceeded and the transition time
(tr,tf) do not exceed 10 s. In addition the total power averaged over a complete switching cycle must not exceed
(TJ(MAX) TC)/(RJC).
A Power MOSFET designated EFET can be safely used
in switching circuits with unclamped inductive loads. For reli-

Motorola TMOS Power MOSFET Transistor Device Data

able operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than
the rated limit and adjusted for operating conditions differing
from those specified. Although industry practice is to rate in
terms of energy, avalanche energy capability is not a
constant. The energy rating decreases nonlinearly with an
increase of peak current in avalanche and peak junction temperature.
Although many EFETs can withstand the stress of drain
tosource avalanche at currents up to rated pulsed current
(IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the
accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to
equal the values indicated.

MTP23P06V
SAFE OPERATING AREA
800

VGS = 20 V
SINGLE PULSE
TC = 25C

EAS, SINGLE PULSE DRAINTOSOURCE

AVALANCHE ENERGY (mJ)

I D , DRAIN CURRENT (AMPS)

100

100 s

10

1 ms
10 ms
dc
1
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT

600
500
400
300
200
100
0

0.1
0.1

ID = 23 A

700

1
10
VDS, DRAINTOSOURCE VOLTAGE (VOLTS)

25

100

50

75

100

125

150

175

TJ, STARTING JUNCTION TEMPERATURE (C)

Figure 11. Maximum Rated Forward Biased

Safe Operating Area

Figure 12. Maximum Avalanche Energy versus

Starting Junction Temperature

1.00
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE

D = 0.5
0.2
0.1
P(pk)

0.10
0.05
0.02

t1

0.01

t2
DUTY CYCLE, D = t1/t2

SINGLE PULSE
0.01
1.0E05

1.0E04

1.0E03

1.0E02

1.0E01

RJC(t) = r(t) RJC

D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1
TJ(pk) TC = P(pk) RJC(t)

1.0E+00

1.0E+01

t, TIME (s)

Figure 13. Thermal Response

di/dt
IS
trr
ta

tb
TIME
0.25 IS

tp
IS

Figure 14. Diode Reverse Recovery Waveform

Motorola TMOS Power MOSFET Transistor Device Data

MTP23P06V
PACKAGE DIMENSIONS

T
B

NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL
BODY AND LEAD IRREGULARITIES ARE
ALLOWED.

SEATING
PLANE

F
T

Q
1 2 3

STYLE 5:
PIN 1.
2.
3.
4.

H
K
Z
L

G
D
N

GATE
DRAIN
SOURCE
DRAIN

DIM
A
B
C
D
F
G
H
J
K
L
N
Q
R
S
T
U
V
Z

INCHES
MIN
MAX
0.570
0.620
0.380
0.405
0.160
0.190
0.025
0.035
0.142
0.147
0.095
0.105
0.110
0.155
0.018
0.025
0.500
0.562
0.045
0.060
0.190
0.210
0.100
0.120
0.080
0.110
0.045
0.055
0.235
0.255
0.000
0.050
0.045

0.080

MILLIMETERS
MIN
MAX
14.48
15.75
9.66
10.28
4.07
4.82
0.64
0.88
3.61
3.73
2.42
2.66
2.80
3.93
0.46
0.64
12.70
14.27
1.15
1.52
4.83
5.33
2.54
3.04
2.04
2.79
1.15
1.39
5.97
6.47
0.00
1.27
1.15

2.04

CASE 221A06
ISSUE Y

Motorola TMOS Power MOSFET Transistor Device Data

MTP23P06V

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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit,
and specifically disclaims any and all liability, including without limitation consequential or incidental damages. Typical parameters can and do vary in different
applications. All operating parameters, including Typicals must be validated for each customer application by customers technical experts. Motorola does
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systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of
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against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part.
Motorola and
are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer.

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*MTP23P06V/D*

Motorola TMOS Power MOSFET Transistor

Device Data
MTP23P06V/D

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