TEST UNIVERSE 2.

3x
Test object definition in
Advanced Differential
&
Global HW-Configuration
in OCC
OMICRON

Principle

Exact defined
protection area
100% selectivity
3-system differential
protection

G. Trip

OMICRON

Tripping characteristic
ID=|I1-I2|
Sum
Characteristic

ID>>

Tripping
Saturation
Tap changer
ID>

Blocking

Magnetisation

IBias=|I1|+|I2|

OMICRON

Zero sequence elimination IL-I0

I0 13 IL1 IL 2 IL 3

2
IP 1
1

3
IS 0
0

2 0
2

I' P IP IP 0 1 0 1
1 0
1
2
IBias I' P I' S 1
1

4
1 2
2
1

3 1
2
I' S IS IS 0 0 1 1
0 1
1

IDiff

2 2

I' P I' S 1 1
1 1

OMICRON

0
0
0

YD-interposing transformer

interposing transformer YD

OMICRON

Tripping characteristic SIEMENS

ID

EQ1 : IDiff 0,25 IBias

ID>>

P3 (?/6)

II
ID>

,25
0
=
I: m

P1 (0/0)
P2 (5/1,25)
P3 (14,5/6)

2,5

,5
0
=
m
:

P2 (?/?)

EQ2 : IDiff 0,5 IBias 2,5

IDiff 0,5 IBias 1,25
EQ1 EQ2
0,25 IBias 0,5 IBias 1,25
1,25 0,25 IBias
1,25
IBias
5
0,25

IBias insert IBias 5 in EQ1

IDiff 0,25 IBias 0,25 5 1,25
insert IDiff 6 in EQ2
6 0,5 IBias 1,25
7,25 0,5 IBias
IBias 14,5
OMICRON

Tripping characteristic AREVA

EQ1 : IDiff 2 IBias
0,25 2 IStab IBias 0,125

ID

I: m

=2

ID>>

ID>

I
I
I

0,3
=
m
II:

P1 (?/0,25)
P1 (0,125/0,25)
P2 (4 / 1,41)
P3 (10,56 / 6)

,7
0
=
m
:

P3 (?/6)

0,25 0,3 0,125 b

b 0,25 0,3 0,125 0,21
insert IBias 4 in EQ2
IDiff 0,3 4 0,2125 1,41

P2 (4/?)
4

EQ2 : IDiff 0,3 IBias b

insert P1

IBias

EQ3 : IDiff 0,7 IBias b

insert P2
1,41 0,7 4 b
b 1,41 0,7 4 1,39
insert IDiff 6 in EQ3
6 0,7 IBias 1,39
7,39 0,7 IBias
IBias 10,56
OMICRON