Electron Microspore

An electron microscope is a microscope that uses a beam of

accelerated electrons as a source of illumination. As the wavelength of an
electron can be up to 100,000 times shorter than that of visible light photons,
the electron microscope has a higher resolving power than a light
microscope and can reveal the structure of smaller objects. A transmission
electron
microscope
can
achieve
better
than
50 pm resolution
and magnifications of
up
to
about
10,000,000x
whereas
most light
microscopes are limited by diffraction to about 200 nm resolution and useful
magnifications below 2000x.
Types of Electron Microscope
1. Transmission electron microscope (TEM) - is a microscopy technique
in which a beam of electrons is transmitted through an ultra-thin
specimen, interacting with the specimen as it passes through it. An image
is formed from the interaction of the electrons transmitted through the
specimen; the image is magnified and focused onto an imaging device,
such as a fluorescent screen, on a layer of photographic film, or to be
detected by a sensor such as a CCD camera.

2. Scanning electron microscope (SEM) - is a type of electron microscope

that produces images of a sample by scanning it with a focused beam of
electrons. The electrons interact with atoms in the sample, producing
various signals that contain information about the sample's surface
topography and composition. The electron beam is generally scanned in a
raster scan pattern, and the beam's position is combined with the
detected signal to produce an image. SEM can achieve resolution better
than 1 nanometer. Specimens can be observed in high vacuum, in low

vacuum, in wet conditions (in environmental SEM), and at a wide range of

cryogenic or elevated temperatures.

3. Scanning transmission electron microscope (STEM) - is a type of

transmission electron microscope (TEM). As with any transmission
illumination scheme, the electrons pass through a sufficiently thin
specimen. However, STEM is distinguished from conventional transmission
electron microscopes (CTEM) by focusing the electron beam into a narrow
spot which is scanned over the sample in a raster. The rastering of the
beam across the sample makes these microscopes suitable for analysis
techniques such as mapping by energy dispersive X-ray (EDX)
spectroscopy, electron energy loss spectroscopy (EELS) and annular darkfield imaging (ADF). These signals can be obtained simultaneously,
allowing direct correlation of image and quantitative data.

4. Reflection electron microscope (REM) - In the reflection electron

microscope (REM) as in the TEM, an electron beam is incident on a surface
but instead of using the transmission (TEM) or secondary electrons (SEM),
the reflected beam of elastically scattered electrons is detected. This
technique is typically coupled with reflection high energy electron
diffraction (RHEED) and reflection high-energy loss spectroscopy (RHELS).
Another variation is spin-polarized low-energy electron microscopy
(SPLEEM), which is used for looking at the microstructure of magnetic
domains.

National University
Sampaloc, Manila
College of Engineering
Bachelor of Science in Environmental and Sanitary Engineering

Microbiology and Parasitology Lab

ELECTRON MICROSCOPE

MATIAS, CHRISTIAN DON S.

Student
July 15, 2016

CASIANO GONZALES JR.

Lecturer