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RADIOLOGY
RESEARCH
Calibration of the
Exposure Index
S. Jeff Shepard
Michael Flynn
AAPM 2008
Annual Meeting
Acknowledgements:
Donald Peck
Phil Rauch
David Leong
AAPM 2009
mikef@rad.hfh.edu
Topics
AAPM 2009
AAPM 2009
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
Noise
AAPM 2009
AAPM 2009
Exposure
Indicators
describe
image
quality in
terms of
the signal
to noise
ratio.
SIG mAS
0.03
Systems vary in
the region used to
assess the signal
for an image.
Full Image
Regular regions
0.02
Anatomic regions
0.01
0
50
60
70
80
90
100
110
120
130
kVp
AAPM 2009
AAPM 2009
is therefore
independent of mAS
Detector SNR/(sig)^.5
SNR (mAS)1/2
SNR/(SIG)1/2
Computation of an indicator
AAPM 2009
AAPM 2009
IEC 62494-1
Gray histogram for the
entire image.
Black histogram for the
anatomic region
(relevant region)
10
Topics
Agfa CR
75 kVP
1.5 mm Cu
400 Speed Class
lgM = 1.96 @ Kcal = 2.5 G
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
11
AAPM 2009
AAPM 2009
12
Kodak CR & DR
80 kVP
0.5 mm Cu + 1 mm Al
EI = 2000 @ Kcal = 1 mR
May have an offset at low exposure
EI = 1000*log10(mR) + 2000
13
AAPM 2009
AAPM 2009
S = 200/mR
14
Philips DR
70 kVp (RQA5)
21 mm Aluminum
HVL = 7.1 mm Al
EI = 400 @ Kcal = 0.26 0.32 mR
EI coarsely rounded, kV correction applied
Imaging Dynamics
80 kVP
1 mm Cu
SE = 200 @ Kcal = 1 mR
Defined target speeds, ST
SE = 200/mR
EI = 1000/G
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AAPM 2009
AAPM 2009
f# = log2(ST/SE)
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Additional Systems
Appendix K: Alara CR
Appendix L: Siemens Medical Systems
Appendix M: iCRco
Appendix N: Canon Medical Systems
Appendix O: Swiss Vision
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AAPM 2009
AAPM 2009
GE DR (Definium
(Definium))
80 kVP
1 mm Al in collimator filter slot/wheel
20 mm AL (with system) at collimator face
Uncompensated detector G (standard beam)
Compensated detector G (kVp,
kVp, grid, filter)
DEI ratio of PV to target PV.
Summary of manf.
manf. EIs
Summary of manf.
manf. EIs
Units
Exposure
Dependence
Manufacturer
Calibration Conditions
80 kVP, 3 mm Al total
filtration
S=200 @ 1 mR
GE
Fujifilm
S Value
Exposure Index
EI
mbels
EI + 300 = 2X
80 kVP + 1.0 mm Al +
0.5 mm Cu
EI = 2000 @ 1 mR
GE
Kodak
Agfa
Log of Median
of histogram
lgM
bels
lgM + 0.3 = 2X
Swissray
Imaging
Dynamics
Company
Konica
Sensitivity
Number
for QR = k,
Unitless
200/S X (mR)
Canon
Reached
Exposure Value
REX
Unitless
Brightness = c1,
Contrast = c2,
REX X 1
Canon
EXP
EXP
Unitless
EXP X
GE
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AAPM 2009
Manufacturer
18
Indicator
Name
Symbo
l
Units
Gy
Uncompensated
Detector
UDExp Air
Exposure
KERMA
Exposure
Dependence
Calibration Conditions
UDExp X
(Gy)
Compensated
Gy
CDExp X
Detector
CDExp Air
(Gy)
Exposure
KERMA
Detector
(mR)
Exposure
DEI Unitless DEI 2.4X
1
Index
Dose Indicator DI Unitless Not available
Not available
Not available
Accutech
f#
f#
tgt(m
Unitless 2 =X(mR)/X
R)
Philips
Exposure
Index
EI
Siemens
Medical
Systems
Exposure
Index
Gy
Air
EXI
X(Gy)=EI/100
KERMA
Exposure
Indicator
Value
Exposure
Index
Exposure Index
none Unitless
log [X (mR)]
Alara CR
iCRco
EIV
mbels
EIV + 300 = 2X
80 kVp + 1 mm Cu
20
Topics
AAPM TG 116
21
AAPM 2009
AAPM 2009
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
IEC Standard
Topics
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
23
AAPM 2009
AAPM 2009
Michael Flynn, Eric Gingold, Lee Goldman Kerry Krugh, David L. Leong,
Eugene Mah, Kent Ogden, Donald Peck, Ehsan Samei Charles Willis
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Beam Quality
70 4 kVP
0.5 mm Cu + (0 4) mm Al (type 1100)
70 kVp
RQR5 prepre-filtered beam
21 mm added pure Al filtration
6.8 mm Al HVL
25
AAPM 2009
AAPM 2009
HVL
6.8 mm Al
Approximate Al
to add to 0.5 Cu
to achieve 6.8
mm HVL at 70
kVp. Averaged
from about 25
systems tested.
72.59 kVp
3.02 mm Al prepre-filtered HVL
21 mm type 1090 Al (99.9%)
Filtered HVL : 6.80 mm Al
+ + + + +
0.5 mm Cu + 2.8 mm Al
Filtered HVL : 6.80 mm Al
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26
Normalized
Spectra,
Cu/Al spectrum
is about 2X
that of RQA5
0.5 mm Cu + 2 mm Al
No added Al filter adjustment
HVL = 6.8 +/+/- 0.3 mm Al
28
Topics
29
AAPM 2009
AAPM 2009
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
31
AAPM 2009
AAPM 2009
30
32
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AAPM 2009
AAPM 2009
If the detector is a CR
plate the cassette
should be separated
from any surface that
may increase
backscatter from that
surface entering the
cassette, as
recommended in AAPM
Report 93 (TG10). Use
lead behind the plate to
further reduce
backscatter.
If the detector is not
square, the long axis of
the detector should be
perpendicular to the xxray tube AA-C axis.
34
35
AAPM 2009
AAPM 2009
Detector housing
36
Topics
AAPM TG116
37
AAPM 2009
AAPM 2009
A. Exposure Indicators
B. Manufacturer Indices
C. IEC AAPM Standardization
i. Beam Spectrum (kVp & filtration)
ii. Measurement of entrance exposure
iii. Exposure Index & Deviation Index
AAPM TG116
IEC
Exposure Index ( ):
measure of the detector response to radiation in the
relevant image region of an image acquired with a
digital xx-ray imaging system.
Note: For a fixed radiation quality, the signal
generated in the detector is proportional to the image
receptor air kerma.
kerma.
The exposure index EI shall be calibrated for the
digital xx-ray imaging system over the specified
operating range of image receptor air kerma such that
= 100 CAL
AAPM 2009
AAPM 2009
Exposure Indices
Exposure Indices
KIND
DI = 10
10Log10
AAPM 2009
43
AAPM 2009
AAPM 2009
KTAR (b.v)
b.v)
AAPM
TG116 Med Physics 2009
IEC
62494-1 IEC:2008
Exposure
Index
Calibration
Energy
RQA-5
66 - 74 kVp
RQA-5
66 - 74 kVp
Calibration
Filtration
RQA-5 Equivalent
RQA-5 Equivalent
0.5 mm Cu + 2 mm Al or
21 mm Al
6.8 + 0.3 mm Al HVL
Deviation
Index
Deviation Index
DI = 10*log10(KIND/KTGT)
Deviation Index
DI = 10*log10(EI/ETGT)
DI format
Unspecified
42