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Processor/Display
P P
P
Signal Source
forward s? reverse
s B
s LO B
B
a0 - ? j B
b0- j B
B
a3 - j ADC
b3- j
Test-Set
B B
B B Receiver
port 1 port 2
Signal Source
To create the RF-power for the test system either open-loop voltage-controlled oscillators
(VCOs) or more expensive synthesized sweepers with low phase noise and high frequency
stability are used. To keep the phase information during the down convertion process in
the rf-mixer, additional rf-signals have to be deduced from the original test signal.
Test-Set
The main rf-building block of a network anlayzer is the so-called Test Set. A rf-switch
switches the signal coming from the signal source into two different branches. One for
the foward (S11 , S21 ) and the other for the reverse measurement (S22 , S12 ). To provide the
reference signals (forward a0 ), (reverse a3 ), usually broadband resistive power dividers
are used, while for separation of the incident and reflected waves from the device under
test (DUT) in most cases broadband directional couplers are implemented.
Receiver
To detect the signal usually a tuned receiver uses a local oscillactor (LO) to mix the rf to a
lower intermediate frequency (IF). The IF signal is bandpass filtered and analog-to-digital
converters (ADC) are used to prepare the signal for digital-signal processing.
Processor/Display
The last major block of hardware in a network analyzer is the processor/display section.
This is where the reflection and transmission data is error corrected and put in different
representations.
Today most network analyzers are realised using coaxial connectors which cover the frequency
range up to 60 GHz. Above these frequencies the microwave part (Test Set) is build using
rectangular wave guides.
HH
HH
error
G rA G rA
real adapter
ideal
a) b)
a0 s e10 -s
@
@ @
@
e00 e11 rA
c)
b0 e
s 01 @
@s
efficient. The non-ideal properties of the used directional couplers can be described, as shown
in Fig. 2 b), by a so-called error model, which is put between the ideal reflectometer and the
DUT. Fig. 2 c) shows the associated signal-flow chart [1]. During the calibration process all
three error parameters are measured, to be used later for error correction. In principle all errors
are assumed to be located in a two port, which is used as adapter, between the DUT (rA ) and
the measured reflection coefficient. The adapter is described by the three error parameters e00 ,
e10 e01 and e11 . Calculating the measured reflection coefficient rM = b0 /a0 in dependence of the
reflection coefficient of the DUT rA taking the error adapter into account, yields the following
equation:
e10 e01
rM = e00 + r (1)
1 e11 rA A
Now we will discuss the influence, which the three different parameters have on the measuring
process
e00
Accorcing to equation 1, the influence of the parameter e00 is greatest when objects have
a small reflection coefficient. In the limit rA 0, the measured reflection coefficient will
be equal to e00 . Thus it accounts for the finite directivity of the used directional couplers.
e10 e01
The influence of these parameters becomes clearest in the limit e00 = e11 = 0 and we find
that the measured reflection coefficient will be equal to e10 e01 rA . Thus it accounts for the
transmission factors of the used directional couplers and transmission lines.
e11
This parameter accounts for the source match of the measurement setup.
In the ideal case the parameters of the error adapter show the following values: e00 0, e10 e01
1 and e11 0. In this case the measured reflection coefficient would be equal to the reflection
coefficient of the DUT rA .
OSL-Calibration
The error adapter for measuring a one port consists of three independent complex error param-
eter, which are functions of the frequency. To carry out a correction for each frequency value
all three parameters have to be determined using three independent calibration standards. One
frequently used method is called OSL-calibration. The letters originate from the used standards
Open, Short, Load. In the following section we want to examine how to use the measurement
results of the calibration standards to determine the error parameters e00 , e10 e01 and e11 in a
coaxial measurement setup.
conducting copper layers as top and/or bottom layer. Typically the copper layers posses a
thickness of 35 m, 70 m or 140 m depending on the current density they have to carry.
Instead of the thickness sometimes also the mass of the conducting layer is given in ounce
per square feet (oz/sq.ft). Today the base material consist of glass fibre matts filled with epoxy
(FR4). Compared to older materials it shows lower leakage currents and better RF performance.
The elements named L1 to L3 realise real lumped inductors while the elements named C1 to
C3 act as real lumped capacitors. As was already shown in [3] realizing a lumped reactive
element always also results in the realisation of paracestic elements, which have to be taken
into account, if one wants to describe the frequency behaviour of the real element. Fig. 5 shows
simple equivalent circuits able to describe the behaviour of real inductors (a) or capacitors
(b). During this laboratory exercise all elements of the equivalent circuit will be deduced from
measurements. Additional to the inductors and capacitors a series resonance circuit (SSK) and
Rs Ls Rs
r r r r r r
Cp C
a) Rp L
b) Rp
r r r r r
a parallel resonance circuit (PSK) is realised on the test board. Both circuits are combinations
of the real inductor L2 and the real capacitor C2. If one would try to carry out an analysis of
the combined circuit on the base of the equivalent circuits given in Fig. 5 one would end up in
very complicated expressions, hiding the essential behaviour of the circuit. To circumvent this
problem we will use simplified equivalent circuits for the series and parallel resonance circuits,
which are valid only next to the resonance frequency. For the complex impedance of both
RS L GP
s s s s s s
C
Figure 6: Simple equivalent circuit of a series and a parallel resonance circuit
Here the quality factor Q of the resonance circuit and v = /0 0 /, called detuning factor
were introduced. If one defines the frequencies f2 and f1 to be the frequencies of 45o detuning,
one can get the following relation between the quality factor Q, the bandwith B = f2 f1 and
the resonance frequency f0 of the resonance circuit [3]:
f0
Q= (9)
B
2 Laboratory Experiments
2.1 Measuring the Inductors
With the help of the network analyzer the reflection coefficient of the inductors shall be mea-
sured in the frequency range from 1 MHz to 350 MHz. The first step is to define the sweep
range of the network analyzer. To do this proceed as follows:
Press button Start in menu Stimulus. Define the start frequency by pressing the numeric
buttons and finish by pressing the dimension button MHz
Press button Stop in menu Stimulus. Define the stop frequency by pressing the numeric
buttons and finish by pressing the dimension button MHz
Now the sweep range of the network analyzer is defined and we can proceed with the one port
calibration, performing the following procedure:
Press button Cal in menu Response. Further submenus will be displayed on the screen of
the network analyzer. To define the Cal-Kid to be used press button Cal Kit and select the
submenu Select Cal Kit. Chose the Kit 3.5mmD. Pressing two times the button Return
brings you back to the Cal menu.
Press button Calibrate Menu to open the calibration menu. Choose S11 1-Port calibra-
tion. The submenus Open, Short and Load will be displayed.
To perform the calibration one first connects the calibration standard to port 1 and after
connecting press the appropriate button. This has to be done with all three calibration
standards. To finish the calibration press the button Done. Now the error parameters are
calculated.
The calibration has to be saved by pressing the button Save/Recall in the menu Instrument
Stat and by pressing the button Save State.
After calibrating the network analyzer the different objects to be measured may be connected to
port 1. To see their frequency response the button Meas in menue Response has to be pressed.
With the help of the button Format one can chose Smith Chart and with the help of the marker
functions one can read out the values of L and Rs at the lowest frequency and f p and R p at the
resonance frequency at the intersection point with the real axis of the smith-chart.
1
Zc = 0 L =
0C
3 Data analysis
1. Calculate the self-capacitance of the winding using the parallel resonance frequency and
the measured values of L1, L2 and L3
2. Carry out a simulation for the real inductors L1, L2 and L3 using the equivalent circuit
according to Fig. 5 a) and display the results in the smith chart.
3. Calculate the series inductance of the real capacitors C1, C2 and C3 using their series
resonance frequency
4. Carry out a simulation for the real capacitors C1, C2 and C3 using the equivalent circuit
according to Fig. 5 b) and display the results in the smith chart.
5. Carry out a simulation using the simple equivalent circuits of the parallel resonance cir-
cuits according to Fig. 6 and the detailed equivalent circuit using the equivalent circuit of
the real capacitor and the real inductor (Fig. 5). Compare the absolute value of the total
impedance of both simulations in one chart (LinMag).
References
[1] Rytting, D.: An Analysis of Vector Measurement Accuracy Enhancement Techniques,
Hewlett Packard Application Note.
[2] Thumm, M.; Wiesbeck, W.; Kern, S.: Hochfrequenzmetechnik, B. G. Teubner Verlag,
1997.