ATOMIC FORCE MICROSCOPY

(AFM)
Hemanta Bhattarai
Nov 7 2016
- Optical Microscopy ~1600
-Electron Microscopy ~ 1938 and 1968
-Scanning Tunneling Microscope 1982
-Binning, Geber, Rohrer, Wiebel
-Awarded Nobel Prize
-Atomic Force Microscopy
-Binning, Gerber, Quale -1986
-Used STM
-Wickramsighe et.al -1987
-Used Light lever
-STM
-Basis: tunneling of electron from barrier potential
-Can only be used in the conductive materials
-Hard to study Proteins, Biomolecules, and other non conductive
materials

-AFM
-Basis :Atomic Force
-Can be used for non conductive materials

Hooks Law:
F=-k x
Working Principle
AFM works in principle of Hooks law
F=-k x
Where
F-> Force on spring
K-> spring constant
x-> elongation
In, AFM instead of spring a cantilever is used.
Basic Set Up
Cantilever with a sharp tip
Detector sensor
Sample Stage that controls x,y,z position
Feedback control and loop
Cantilever and Detector sensor
Cantilever and Detector sensor
Cantilever
The effective force constant of cantilever of length L, width b and
thickness h and Youngs modulus E :

The natural frequency of oscillation of cantilever is:

where is the density of the cantilever.

Probes:
Stage and Feedback
Modes of AFM
1. Contact mode: -
- less than 0.5nm separation
- Two modes:- Constant Height
- Constant Force
2. Tapping mode:- Cantilever oscillates with natural frequency
- 0.5-2nm
-Tow modes:- Amplitude Imaging
-Phase Imaging
3.Non-contact mode:
-2nm to 10 nm
Phase imaging
Non-contact mode
Effects of tip:
1. Tip convolution
-if R_tip is quarter of R_sample-> width=2*R_sample
-normally R_sample=0.5nm so R_tip->0.1nm(Unrealistic)
-R_tip=20nm practically
-Cannot differentiate adjacent features
2. Compression of features:
-AFM gives topographical contrast on the basis of force
-The force perturbs the sample and might give false
topographical features
-The width of DNA is correlated with the force

3. Strong interaction with sample:

-The topographical features obtained might be false feature due
to the interaction with the sample
Different types of AFM
1. Electrostatic Force Microscopy
2. Magnetic Force Microscopy
3. Capillary Force Microscopy
4. Frictional Force Microscopy
Frictional Force Microscopy
Working and Imaging
Final Image of Smooth Glass Surface
Applications: E. coli
Applications: DNA
Application: Graphite under STM and AFM
Applications: Beating chicken heart cell(Myocytes)
References:
1. E. Meyer, Atomic Force Microscopy, Progress in Surface Science, 41,3-49
2. Kai-Chih Chang, Yu-Wei Chiang, Chin-Hoe Yang, Je-Wen Liou, Atomic force
microscopy in biology and biomolecules, Tzu Chi Medicine Journal, 24(2012),
162-169
3. Javier Tamayo, Structure of human chromosomes studied by atomic force
microscopy Journal of Structural biology 141(2003) 198-207.
4. Binning G, Roher H, Gerber C, Weibel E, Surface studied by scanning tunneling
microscope Phy Rev letters 1982 49, 57-61
5. Binning G, Quate CF, Gerber G, Atomic force microscope Phy Rev Letters
1986, 56, 930-933
6. Hembarcter S et.al Science (2004), 305-380
7. Astrid Kronenberger, Atomic force Microscopy- Basic and Applications,
Summer School June 2006 Complex material, Cooperative projects of Natural
Energy and Bioscience
8. Avrid Raman Atomic force microscopy, Brick Nanotechnology Center (INAL),
Purdue University
 Thank You

Questions ??