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BSV52
E
SOT-23 B
Mark: B2
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These ratings are based on a maximum junction temperature of 150 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
OFF CHARACTERISTICS
V(BR)CEO Collector-Emitter Breakdown Voltage IC = 10 mA, IB = 0 12 V
V(BR)CES Collector-Base Breakdown Voltage IC = 10 A, IE = 0 20 V
V(BR)EBO Emitter-Base Breakdown Voltage IE = 100 A, IC = 0 5.0 V
ICBO Collector-Cutoff Current VCB = 10 V, IE = 0 100 nA
VCB = 10 V, IE = 0, TA = 125C 5.0 A
ON CHARACTERISTICS
hFE DC Current Gain IC = 1.0 mA, VCE = 1.0 V 25
IC = 10 mA, VCE = 1.0 V 40 120
IC = 50 mA, VCE = 1.0 V 25
VCE(sat) Collector-Emitter Saturation Voltage IC = 10 mA, IB = 0.3 mA 0.3 V
IC = 10 mA, IB = 1.0 mA 0.25 V
IC = 50 mA, IB = 5.0 mA 0.4 V
VBE(sat) Base-Emitter Saturation Voltage IC = 10 mA, IB = 1.0 mA 0.7 0.85 V
IC = 50 mA, IB = 5.0 mA 1.2 V
Spice Model
NPN (Is=44.14f Xti=3 Eg=1.11 Vaf=100 Bf=78.32 Ne=1.389 Ise=91.95f Ikf=.3498 Xtb=1.5 Br=12.69m Nc=2
Isc=0 Ikr=0 Rc=.6 Cjc=2.83p Mjc=86.19m Vjc=.75 Fc=.5 Cje=4.5p Mje=.2418 Vje=.75 Tr=1.073u Tf=227.6p
Itf=.3 Vtf=4 Xtf=4 Rb=10)
BSV52
NPN Switching Transistor
(continued)
Typical Characteristics
0.4
150
125 C 0.3
100 25 C
0.2 125 C
25 C
50 - 40 C
0.1
FE
- 40 C
h
0
0.01 0.1 1 10 100 0.1 1 10 100 500
IC - COLLECTOR CURRENT (mA) I C - COLLECTOR CURRENT (mA)
1
1.4
= 10
- 40C
1.2 0.8 25 C
1
125 C
- 40 C 0.6
0.8
0.6 25 C
0.4 V CE= 1.0V
0.4 125 C
0.2
0.1 1 10 100 300 0.1 1 10 100
IC - COLLE CTOR CURRENT ( mA) I C - COLLECTOR CURRENT (mA)
Collector-Cutoff Current
vs Ambient Temperature
I CBO - COLLECTOR CURRENT (nA)
600
V CB = 20V
100
10
1
25 50 75 100 125 150
T A - AMBIENT TE MPERATURE (C)
BSV52
NPN Switching Transistor
(continued)
C ibo
20
3 tsr
C obo 10
2 t sf
5
1 tss
2 ts d
0 1
0.1 0.5 1 5 10 50 2 5 10 20 50 100 300
REVERSE BIAS VOLTAGE (V) I C - COLLECTOR CURRENT (mA)
12 -12
tsf I C = 10 mA
VCC = 3.0 V
S WITCHING TIMES ( ns)
10 -10
8 tss -8
t s= 3.0 ns
3
6 -6
tsd
4.0 ns
4 -4
tsr
2 -2 6.0 ns
I C= 10 mA, I B1 = 3.0 mA, I B2 = 1.5 mA, VCC = 3.0 V
0 0
25 50 75 100 0 2 4 6 8 10
T A - AMBIENT TE MPERATURE (C) I B1 - TURN ON BASE CURRENT (mA)
-12 -30
I C = 10 mA I = 100 mA
C 4.0 ns
-10 VCC = 3.0 V -25 VCC = 3.0 V
t S= 3.0 ns 8.0 ns
-8 -20 6.0 ns
t s= 3.0 ns
-6 -15
4.0 ns
-4 -10
16.0 ns
-2 6.0 ns -5
0 0
0 2 4 6 8 10 0 5 10 15 20 25 30
I B1 - TURN ON BASE CURRENT (mA) I B1 - TURN ON BASE CURRENT (mA)
BSV52
NPN Switching Transistor
(continued)
-6 -12
I C = 10 mA I C = 30 mA
VCC = 3.0 V VCC = 3.0 V 3.0 ns
-5 -10
4.0 ns
-4 8.0 ns -8
ft = 2.0 ns
t f = 7.0 ns
-3 -6 5.0 ns
-2 10 ns -4
-1 -2
0 0
0 2 4 6 8 10 0 2 4 6 8 10 12
I B1 - TURN ON BASE CURRENT (mA) I B1 - TURN ON BASE CURRENT (mA)
-30 -6
I C = 100 mA 3.0 ns I C = 10 mA
4.0 ns
-25 VCC = 3.0 V -5 V CC = 3.0 V
t d = 8.0 ns
-20 -4
t f = 2.0 ns 8.0 ns
5.0 ns
-15 -3 4.0 ns
-10 12.0 ns -2
3.0 ns
-5 -1
0 0
0 5 10 15 20 25 30 1 2 5 10 20 50
I B1 - TURN ON BASE CURRENT (mA) I B1 - TURN ON BASE CURRENT (mA)
50 350
VCC = 3.0 V
P D - POWER DISSIPATION (mW)
300
10 t r= 2.0 ns
250 SOT-23
200
5.0 ns
1 150
20 ns
10 ns 100
50
0
B1
1 10 100 500 0
I
Test Circuits
VOUT 0 10%
220
VIN VIN
VIN
3.3 K
10%
0
90%
50 VOUT
VOUT 50
3.3 K t off
90% toff VBB = 12 V
t on VIN = - 20.9 V
ton F
0.0023 F
0.0023
VBB = - 3.0 V
VIN = + 15.25 V
0.05 F 0.05 F
To sampling oscilloscope input
impedance = 50
3
Pulse generator Rise Time 1 ns
VIN Rise Time < 1 ns
Source Impedance = 50
VBB 0.1 F 0.1 F
PW 300 ns VCC = 3.0 V
Duty Cycle < 2%
DISCLAIMER
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant into support device or system whose failure to perform can
the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be effectiveness.
reasonably expected to result in significant injury to the
user.
Definition of Terms
Advance Information Formative or This datasheet contains the design specifications for
In Design product development. Specifications may change in
any manner without notice.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Rev. G