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EXPERIMENTAL PROCEDURE
Thin films of amorphous Nb2O5 (a-Nb2O5) and Ta2O5
(a-Ta2O5) were prepared by radio-frequency sputtering a
crystalline oxide target with 99.9% purity. Resistive heating
deposition was also used for preparing a-Nb2O5 and a-Ta2O5
thin films including tungsten, the concentration of which was
aimed for a few at. %. In evaporating a grain of the oxides on
a tungsten coil as a heating source, tungsten is inevitably
introduced into the deposited oxide films.11 A cleavage NaCl
crystal was used as the substrate. The NaCl on which the
1530 nm thick oxide thin film was deposited was put into
distilled water, and then the floating thin film was mounted
onto a platinum grid. The amorphous oxide on the Pt grid
was subjected to heat-treatment in an electric furnace in air
at 7731023 K for 1 h. Some of the crystallized specimens
after annealing were coated with carbon to reduce the effects
of charging at TEM observations.
The changes in its morphology and structure were exam-
ined by a Hitachi H-800 type TEM and a JEOL JEM-3000F
TEM at 300 kV. Atomic number contrast (Z-contrast) images
of scanning TEM (STEM) were obtained using a FEI Titan
80-300 TEM operating at 300 kV with a high-angle annular FIG. 1. A typical example of changes in morphology and structure of a-
dark-field (HAADF) detector. The tilt series of Z-contrast Nb2O5 during annealing in air: (a) as-deposited, (b) 773 K, (c) 823 K, and
(d) 923 K for 1 h.
images were acquired within the detector angle between 60
and 210 mrad, and 3D reconstruction was performed by
using the INSPECT3D software package (FEI Co. Ltd). The
Fig. 1(c). In the amorphous region of (c), a number of spheri-
intensities of selected-area electron diffraction (SAED) pat-
cal nanopores can be seen, as is the case with at 773 K. On the
terns were recorded on an imaging plate (Eu2 doped
other hand, pores in the crystallized region show a tendency to
BaFBr). To avoid contamination, in particular, electron dif-
aggregate and grow larger than those in the amorphous region.
fraction intensities for PDF analysis were measured at cryo-
It is particularly noteworthy that the pores near the front of
genic temperature using a cooling holder. The intensities of
interface of the crystallized phase tend to be elongated. As a
halo-patterns from the as-deposited amorphous samples were
result of crystallization at a high temperature of 923 K, self-
analyzed quantitatively using a Digital Micro-Luminography
elongated and oriented nanopores are formed (d).
FDL5000.12,13 The composition was analyzed by the TEMs
Figure 2 shows the BFIs (a) and SAED patterns (b) of
equipped with an energy dispersive X-ray spectrometer
fully crystallized Nb2O5 films, after annealing at 873 K
(EDS).
for 1 h, where an array of elongated nanopores appears.
The beam incidence is to [014] direction. The structure of
RESULTS AND DISCUSSION
crystallized Nb2O5 was identified as orthorhombic Nb2O5
Figure 1 shows a typical change in structure and mor- (a 0.392 nm, b 4.379 nm, c 0.624 nm (Ref. 8)). The
phology during the annealing of amorphous Nb2O5 (a- electron diffraction patterns (c), simulated on the basis of the
Nb2O5) prepared by sputtering. As shown in the bright field orthorhombic structure model (c0 ), conform to the experi-
image (BFI) of Fig. 1(a), no void-contrast can be detected in mentally obtained diffraction patterns (b). The direction of
an as-deposited thin film of a-Nb2O5. On the other hand, a elongated pores is parallel to the a axis, and therefore, per-
high density of spherical nanopores with an average diameter pendicular to the longitudinal b axis of the orthorhombic
around 3 nm appears in a-Nb2O5 annealed at 773 K (b). The structure. The relationship between pore and crystal orienta-
structure of thin films remains amorphous up to 773 K at an tions in orthorhombic Nb2O5 is in good agreement with that
annealing time of 1 h while crystallized regions appear in in orthorhombic Ta2O5,6 indicating that the formation of the
the amorphous matrix at 823 K for 1 h, as can be seen in self-organized nanopores can be attributed to the strong
124308-3 Nakamura et al. J. Appl. Phys. 114, 124308 (2013)
Ta5 and Nb5 so that W atoms dissolve into amorphous contain oriented (a) and non-oriented (b) pores in Ta2O5-W.
Nb2O5 and Ta2O5 with the short-range order being The streaks appear sharply from the oriented regions (see the
maintained. inset of Fig. 9(a)), which can be attributed to a wide variety
Figures 7 and 8 compare the SAED patterns of pentox- of periodicity in the b-axis direction. In the non-oriented
ides with and without W after the full crystallization. The regions (b), on the other hand, the streaks are very weak and
beam incidence was identically set to be in the [014] for the additional spots are scattered around the fundamental
Nb2O5 (Fig. 7) and [001] for Ta2O5 (Fig. 8), respectively. and superlattice reflections, indicating that the periodicity is
The experimentally obtained SAED patterns ((a) and (b)) are not flexible but limited. These tendencies can be seen com-
in good agreement with the diffraction patterns (c), simu- monly in the oriented and non-oriented crystallized regions
lated from the orthorhombic models (c0 ). The spacing of fun- of Ta2O5, Nb2O5, and Nb2O5-W. In the oriented region, the
damental and superlattice reflections of Nb2O5 and Ta2O5 is atomic arrangement towards the long-periodic b-axis must
almost consistent with that of Nb2O5-W and Ta2O5-W, indi- occur variably during the crystal growth in the amorphous
cating that the lattice spacing of the basic unit cell and the matrix. Under such a condition, pores are likely to grow
periodicity in the direction of longitudinal b-axis of ortho- smoothly in the elongated direction of a-axis along by
rhombic structures are maintained in spite of the introduction absorbing atomic level spaces and existing spherical pores.
of W. Here, periodicity represents superstructures along As shown in Figs. 4 and 5, additive tungsten atoms enhance
[010] with multiplicities (m) of the unit length of b-axis of the self-elongation of pores. Stephenson and Roth1719
the substructure (e.g., a 0.389 nm, b 0.366 nm, reported that the periodicity in the b-axis direction of ortho-
c 0.620 nm for Ta2O5 (Refs. 15 and 16)). rhombic Ta2O5 varies according to the concentration of tung-
The fully crystallized samples contain partly the grains sten: the value of multiplicities, m, is 8, 13, and 19 for
with spherical, non-oriented pores. Figure 9 compares a typi- Ta30W2O81, Ta22W4O67, and Ta38WO98, respectively. It is
cal example of SAED patterns taken from the regions which probable that solute tungsten atoms diffuse to be distributed
to the forefront of growing crystalline phase at the
amorphous-crystalline boundary, providing multiple perio-
dicities and then higher variability of atomic arrangements
during crystal growth. As a result, the elongation of pores
with a larger aspect ratio is promoted by the addition of
tungsten.
In the preceding paper, a synergy effect between the
strong isotropic structure and crystal growth has been consid-
ered to be important factors for the formation of oriented and
elongated nanopores in Ta2O5.6 Discussion on the latter
effect, i.e., kinetic properties such as diffusion of compo-
FIG. 9. Comparison of SAED patterns taken from the region including ori-
nents both at the surface and in the matrices is required to
ented pores (a) and non-oriented pores (b) in Ta2O5-W. A zoomed diffrac- clarify deeply the effect of third element, tungsten, on the
tion spot for enclosed point is at the upper-right corner. crystal and pore growth.
124308-6 Nakamura et al. J. Appl. Phys. 114, 124308 (2013)