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CMA 2010
The 42nd Annual Conference and Exhibition
September 12 16, Trail Rossland, BC
Spectrometer Detector
1 2
H He
3 4 5 6 7 8 9 10
Li Be B C N O F Ne
11 12 13 14 15 16 17 18
Na Mg Al Si P S Cl Ar
19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36
K Ca Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54
Rb Sr Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
55 56 57 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86
Cs Ba La Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
87 88 89
Fr Ra Ac
58 59 60 61 62 63 64 65 66 67 68 69 70 71
Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
90 91 92 93 94 95 96 97 98 99 100 101 102 103
Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No Lr
Example: LIBS spectra of different coals
Many applications for LIBS have been
developed in the last twenty years
Analysis of
archeological
samples
Analysis / typing of
metal alloys
Measurement of
incinerator exhaust
(aerosols)
Geological samples
Elemental surface LIBS is planned as a diagnostic for a Mars
Rover expedition set to launch in Sept. 2011
maps
Depth profiling
Benefits of LIBS over other techniques
Laser wavelength
Typically Nd:YAG lasers are used as they are
low-maintenance and low $$$/joule pulsed
lasers
1064 nm fundamental couples into plasma
better
Short wavelength (e.g. 266 harmonic) ablates
material better
Dual pulse option
Czerny-Turner + ICCD
Sensitivity
Spectrometer / detector
Gated detectors reject initial continuum from Echelle + ICCD
plasma
Intensified detectors have much more gain Broadband diode array
than non-intensified detectors, and are more
accurately gated Resolution
Broadband spectrometers allow associations
between elements that may have spectrally-
separated lines
Application: Rapid material identification
Broadband
spectra can be
used to quickly
match materials
Many, many
lines
Useful for
sorting,
checking
inventory,
ascertaining
quality
Example: Identification of Stainless Steel
5 different types of
stainless steel
10 shots on each
surface
10 Hz, 100
mJ/pulse, 1064 nm
Nd:YAG
Spectra collected by
an echelle
spectrometer
Ratios 304 316 416 321 410 Simple line ratios
Cr/Fe 0.89 0.83 0.48 1.00 0.98 can be used to
Mn/Fe 1.00 0.88 0.49 1.00 0.81 discriminate
Mo/Fe 0.55 1.00 0.21 0.49 0.45 samples
Ni/Fe 0.73 1.00 0.26 0.62 0.16 PCA is even more
Ni/Cr 0.67 1.00 0.45 0.51 0.14
sensitive
Application: Depth profiling
Successive LIBS
pulses provide
depth profiles
Example: thin
film
interrogation
266 nm Nd:YAG,
single shots, ~
10 mJ/pulse
Czerny-Turner
spectrometer,
UV line ratio of
two light
elements
Another method of depth profiling for moving substrate:
variation of pulse energy
with information
Al
40000
Typi cal gems tone
Classification methods
35000
spectrum (beryl ) taken
such as PLS-DA or 30000
Al
wi th a single laser shot
SIMCA can be used to 25000
using a Photon Ma chines
group data 20000
Insight s ys tem
peak ratios, or
statistical/chemometric
10000
Mg Na
Be
Mg
for calibration
Al Ca
H
0
300 350 400 450 500 550 600 650 700
Geological Example
Calibration Curves for Chromium
6.0E-02
y = 1.93210-3x + 4.31610-3
5.0E-02 R = 0.992
Intensity ICr/TL (a.u.)
4.0E-02
3.0E-02
Normalization to plasma
2.0E-02
Chromium peak at 397.67 nm
1.0E-02
Linear
0.0E+00
0 5 10 15 20 25 30
Similar R2 to internal
Chromium Concentration (wt %) standard
7.0E-01
y = -0.827x 2 + 1.507x + 0.031
Intensity Ratio ICr/IFe (a.u.)
6.0E-01 R = 0.995
Fe Internal Standard
5.0E-01
4.0E-01
0.0E+00
0 0.1 0.2 0.3 0.4 0.5 0.6
266 nm or 1064 nm
single-laser system for
microanalysis
5 micron 2mm spots
with 266 nm
wavelength
Computer-controlled
stages
All enclosed, rugged
Coaxial video
Standard with echelle
spectrometer or
multichannel CCD array
Debut of new
Chromium software
Chromium software for machine control
addLIBS analysis software allows method
development and automation
Identify spectral
features using
NIST or user
library
Build a method
with calibration
data
Automate and
repeat methods
Advanced
calibration
techniques such
as multiple linear
regressions and
PLS included
Chemometric methods applied to LIBS
US National Institute
R = 0.9785
1.2E+05
for Occupational
Health and Safety
1.0E+05
4.0E+04
1.0E+04
development at
Wavelength (nm)
0.0E+00
Photon Machines
0 50 100 150 200 250 300 350
Deposited Silica Mass (g)
Rapid detection of
phosphorous and
nitrogen in fertilizer
is crucial
Product spec and
blending applications
LIBS provides a
relatively quick
assay
LIBS analysis procedure
Sample 1 3 5 7 9 11 13 15 17 21
P2O5
(%) 46.06 46.74 47.08 47.78 48.73 49.08 49.76 50.1 50.92 51.86
N (%) 17.81 17.09 16.48 15.72 15.01 14.43 13.95 13.09 12.38 10.9
% P2O5 %N
53 19
acquired on each of 10
48
13
pellets of varying N and P 47
12
concentration, taken from 46
samples shown at right 11
45 10
0 5 10 15 20 25
Sample number
Insight LIBS system parameters
30000
25 400 micron
spots interrogated 25000
2 cleaning shots
followed by 10 20000
Chemometric
model can be
very accurate
Plot shows
predicted versus
known values
52 smp49 smp4
smp5
smp48 18
smp3
smp8
smp9
smp43
smp50 smp10
smp44 smp13
smp38 smp45 smp14
smp34
50 smp40 16 smp15
smp20
Predicted Y
Predicted Y
smp35 smp18
smp30 smp33 smp29
smp39 smp24smp19
smp25
smp23
smp28
smp28
smp23
14 smp33 smp25
48 smp24
smp19 smp29 smp39 smp35
smp30
smp20
smp18
smp15 smp40 smp34
smp14 smp45
smp44
smp13 12 smp43 smp38
smp10
smp9
smp8 smp50
46 smp3
smp5
smp4 smp48
smp49
4 4
46 48 50 52 12 14 16 18
Measured Y Measured Y