Académique Documents
Professionnel Documents
Culture Documents
By V. S. Fomenko
Edited by G. V. Samsonov
The current rapid development of cathode electronics has led fanned by their widespread use as cathode materials. A whole
to extensive investigations of the emission properties of chemical el- new section on the thermionic properties of aluminides has
ements and their compounds. This expansion of research is aimed at been introduced. The list of pertinent literature has been aug-
the continual refinement of data already available and the steady widen- mented by new contributions published in the years 1963-1965,
ing of the circle of materials under investigation. These events have as well as some earlier publications that had escaped notice in the
necessitated a whole series of additions and changes in this handbook, Russian edition.
even though the original Russian edition was published only in 1964.
It is the author's hope that the handbook will prove of great val-
Every effort has been made to include all available information ue to American readers interested in the emission properties of the
on each element or compound. Particular attention has been given to elements and compounds, and that it will contribute to the further
bringing the sections on borides and carbides of the transition and rare development of research in this promising and most timely field of
metals up to date, since interest in these compounds has recently been electronics.
v
CONTENTS
vii
INTRODUCTION
The new tools of automatic and remote control, without which The field -emission method, in which the work func-
the present level of technology would be inconceivable, are based on tion is determined by the current flowing when a high acceler-
exploitation of the latest advances in physics, electronics, radio ating field (up to 106 V/cm or higher) is set up at the surface of
engineering, and instrument design. Electronic instruments in which the cathode.
a cathode is one of the basic components are in use in the broadest
The e f fu s ion method, in which the equilibrium pressure
variety of devices. The performance of any instrument, and there-
of the electron gas over the emitter at different temperatures is
fore of the device as a whole, is dependent upon the reliability of
used to determine the work function.
the cathode performance. This places greater stress on the need to
find a greater variety of cathode materials and to study their The con t act pot e n t i aId iff ere n c e method, in
emission properties, particularly the work functions of these ma- which the work function is determined by measuring the contact
terials. potential difference between the cathode and a second electrode
having a known work function.
There are several methods available for the experimental
determination and theoretical calculation of the work function of The calor i met ric method, in which the work function
a particular material. These include: is computed by using the relationship between the quantity of
heat supplied to heat the cathode and the quantity of heat carried
The the r m ion i c method, in which the work function is
off by the electrons participating in the emission process.
found from the temperature behavior of the emission current
appearing in response to heating of the cathode. Empirical relationships linking the work function to various
physical characteristics are utilized in the the 0 ret i cal com-
The photoelectronic method, in which the work func-
put at ion of the work function.
tion is determined by the long-wavelength edge of the photo-
electric effect. For example, Sachtler [303] proposed the following equa-
1
tion: where R is the atomic radius in nanometers and z is the number of
free electrons per single metal atom.
<p=a-ba!, (1) The term "lattice energy" here refers to the half-sum of the
first and second ionization potentials of the metal atom plus the
heat of sublimation of the metal. Then
where cp is the work function of the metals in eV, a is the maximum
packing density of the atoms on the crystal face, I is the first ioni-
zation potential of the atom in V, and a and b are empirical con- W
stants. 8=123 8 , (4)
R
V. V. Demchenko and N. E. Khomutov [398] relate the work
function cp of an electron escaping from a metal to the surface Hence, with the aid of Eq. (3), we have
tension 6, which is assumed to be approximately equal to the free
energy of the electron gas at the surface, and also relate it to the <p=O.232 W. (5)
lattice energy W of the metal. The work function is thus ap-
proached as the variation in free surface energy in the course of The equations derived by R. M. Vasenin [302] are based on the
this process relations
co
8 ( 3)
<p= 1.885 X 10- 3 R2_, where cp is the work function in eV, D is the density in g/cm 3 , A is
Z the atomic weight of the element, z is the number of free electrons
2
per single atom of the metal, R is the atomic radius of the metal, system increases, there will become manifest a tendency for the
and m, n and a, b are empirical coefficients whose values will differ work function of the electrons in that system to diminish; in those
for distinct periods in the Mendeleevian periodic table. cases where it is less than unity, the work function of the system
will always be greater than the work function of the constituent
The Gordy-Thomas equation [55] has the form
chemical elements of the system, and in cases where it is greater
than unity, conversely, the work function will be lower.
x=aip+b. (8)
In the case of semiconductor cathodes, a discrepancy is ob-
served between the work functions CPo found from the slope of lines
Here cP is the work function in eV, x is the electronegativity
plotted in coordinates log (j /1:2) and 5040/T and the values arrived
in Pauling units, and a and b are empirical constants.
at by other methods (the "total current" method, the calorimetric
The electronegativity is defined [399,400] as the tendency method, etc.). In addition, anomalous values of the thermionic
evinced by an atom in a molecule to attach or release electrons, constant differing from the theoretically predicted value for metals
and is usually represented as the half-sum of the first ionization [Ao = 120.4 Alcm2 '(deg K)2] by many orders of magnitude were
potential of the atom and its electronic affinity E: observed, as well as a break in the Richardson lines plotted over a
broad range of temperatures. All of these phenomena can be
accounted for in terms of the temperature behavior of the work
1 (9)
function.
x=- (1+).
2 Consequently, the handbook tables list, in addition to the
CPo values computed from the slope of the Richardson lines, values
arrived at by the "total current" method (the "effective" work
The electronegativity concept is of crucial importance in the
function 'PT at cathode temperature T), and in some cases the
choice of components in the design of an effective film thermionic
graphically determined dependence CPT = J(T).
cathode. By analyzing the available experimental information on
the work function of electrons in film systems and the computed At the present time, there is a huge quantity of data at hand
electronegativity values of the elements comprising those systems, on the emission properties of various materials, but these data are
one author [401] arrives at the following conclusion: as the ratio of scattered over many physical and chemical handbooks, separate
the electronegativities of chemical elements constituting a film original research papers, dissertations, etc. The first attempt on
3
record to collect these dispersed bits of information into a single rived data to the familiar semiempirical relationships mentioned
entity was the reference handbook "Emission Properties of the above. However, even the values obtained with the aid of these
Elements and Chemical Compounds" [Emissionye svoistva elemen- semiempirical formulas may clash somewhat because of some un-
tov i khimicheskikh soedinenii] published in 1961 by the Academy certainties in the coefficients appearing in the formulas. There-
of Sciences of the Ukrainian SSR. However, a wealth of new infor- fore, departure of the experimental data from the empirical rela-
mation on this topic has been published in recent years in both the tionships is not conclusive evidence of experimental error. If an
Soviet and foreign literature; moreover, several sources of data experimentally derived value does agree with these formulas
published earlier have been revised and brought up to date. This (within the limits of experimental error), that value may be
present edition thus is a revised and expanded varian t of its precursor. accepted as sufficiently trustworthy and may be adopted as the
recommended value. Moreover, in the choice of recommended
The handbook presents information compiled on the emis-
values, some allowance is made for the experimental procedure,
sion properties (work function and Richardson constant) of chemical
the time and systematiC nature of the measurements, and the
elements and of their compounds, including elements and com-
purity and quality of the materials measured.
pounds on various substrates, as measured by a variety of experi-
mental techniques, and also reports theoretically calculated values. In conclusion, the author welcomes this opportunity to ac-
knowledge his indebtedness to Professor L. 1. Antropov (Kiev Order-
In the tables, the author strived to provide the fullest possible
of-Lenin Polytechnic Institute) and Associate Professor D. A.
listIng of data reported by various investigators on any particular
Gorodetskii (Kiev Order-of-Lenin T. G. Shevchenko State Uni-
substance, feeling that this would be of interest to research workers
versity), who offered helpful critiques of the earlier handbook, and
in the field.
to G. A. Koval' for his invaluable technical assistance in the com-
With the object of facilitating the practical use of the hand- pilation of the present volume.
book, the recommended values for almost every chemical element The author also expresses his gratitude to Corresponding
in the Mendeleev periodic table are listed (with the exception of Member of the Academy of Sciences of the Ukrainian SSR G. V.
those cases where data are very scanty and sharply conflicting data Samsonov for his kind attention to the progress of the work.
have been reported by the few authors concerned). The effusion
method is acknowledged to be the most reliable. This therefore
provides an additional criterion for fitting the experimentally de- V. Fomenko
4
I. CHEMICAL ELEMENTS*
Work function 'P,eV
No. A Remarks References
TM PM FM EM CPDM CM TC
3. Lithium Li
1 1,40 [ 1]
2 2.28 [3,4,125]
3 2.34-2.38 [5]
4 2.39 [2,6]
5 2,4 [ 7]
6 2.42 [ 8]
7 2.49 Computed using formula (6). [ 302]
8 2.49 [ 9]
9 2,49 [384]
10 3.10 Computed using formula (1). [ 303]
"The abbreviations in the table headings have the following significance: TM-thermionic emission method; PM-photoelectron emission method;
FM -field -emission method; EM -effusion method; CPDM -contact potential difference method; C M-calorimetric method; TC -theoretical com-
putation; A-Richardson constant A, A/cm2 . (deg Kt
5
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
4. Beryllium Be
1 3.10 [ 1J
2 3.17 [ 8J
3 3.30 [10]
4 3.37 a-phase. [ 6]
5 3.9 [ 7]
6 3.92 [2]
7 3.92 [3,5,11]
8 3.92 [ 2]
9 3.92 Computed using formula (6). [302]
10 _5.0 Thick Be layers on tungsten single [ 304]
crystal.
11 6.73 a-phase; computed using formula (1). [303]
5. Boron B
1 4.4-4.6 [12,418]
2 4.5 [2,6J
6
Work function CPo eV
No, A Remarks References
TM PM FM EM CPDM CM TC
6. Carbon C
1 3.88 [ 13]
2 3.93 5.93 [14,15]
3 4.00 60.2 [ 16]
4 4.00 [ 17]
5 4.3 [2]
6 4.30-4.81 [5]
7 4.34 30 [3,18]
8 4.35 [ 19]
9 4.38 170 [25]
10 4.380.01 Polycrystalline graphite. Meas- [407]
urements conducted by
method of spherical condens-
ors at room temperature in
1.33 x 10-6 N/m2 (10- 8 mm
Hg) at wavelengths A= 239.9
and 230.2 nm.
11 4.39 15 [20]
12 4.39 [ 6]
13 4.4 [ 7]
14 4.4 [ 191]
15 4.45 [234]
N ewton = N = 1 if dynes.
7
Work function cp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
11. Sodium Na
1 1.60 [ 1]
2 2.06 [8]
3 2.2 [ 7]
4 2.25 [27]
5 2.26 [28]
6 2.27 [ 6]
7 2.28 [29]
8 2.28 [384]
9 2.29 Thick layers of Na on AI. [11]
8
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
10 2.29 [3]
11 2.33 [5]
12 2.34 [2]
13 2.35 [2]
14 2.35 Computed using formula (6). [302]
15 2.40 [ 30]
16 2.46 [125}
17 2.47 [4]
18 2.55 Computed using formula (1). [303]
12. Magnesium Mg
1 2.74 [8]
2 <3.0 [31]
3 3.35 Computed using formula (6). [302]
4 3.40 [6]
5 3.46 [2,6]
6 3.5 [7]
7 3.55 [159]
8 3.58 [1]
9 3.59 [32]
9
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
10 3.60 [32]
11 3.62 [33]
12 3.64 3.64 [ 2]
13 3.66 Mg film 100 mm thick evaporated [ 431]
onto quartz plate in vacuum of
1.33 x 10- 4 N/m 2 (~10-6 mm Hg).
14 3.670.02 [34]
15 3.68 [ 3,11]
16 3.69 [ 5]
17 3.70 Computed using formula (1). [303]
18 3.78 [35]
19 3.79 [34]
13. Aluminum Al
1 2.98 [ 36]
2 3.0 [7]
3 3.38 [1]
4 3.43 (37]
5 3.66 Computed using formula (1). (303]
6 3.74 ( 6]
7 3.9 [159]
8 4.08 4.08 (30]
9 4.20 (38]
10
Work function <Po eV
No. A Remarks References
TM PM FM EM CPDM CM TC
10 4.21 [2]
11 4.23 [2]
12 4.25 [5]
13 4.25 C ontac t potential difference of [ 39]
Al evaporated on W relative
to W ('f'W assumed 4.56 eV).
14 4.25 Computed using formula (6). [302]
15 4.34 [ 40]
16 4.36 [ 41]
14. Silicon Si
1 1.12 [424]
2 3.59 8.0 [20]
3 3.6 [ 7]
4 4.02 5.6 Specimen contained slight [ 43]
impurities of AI, P, and
other elements. Tempera-
ture 1373" to 1623K.
5 4.1 [ 6]
6 4.2 pSi [ 44]
7 4.3 [2]
11
Work function (/1. eV
No, A Remarks References
TM PM FM EM CPDM CM TC
8 4.37-4.67 (45,418]
9 4.5 [93]
10 4.5 Contact potential difference relative (44]
to ClltO (/1Cllt O assumed 4.9 eV).
11 4.5 Temperature 623K. [93]
12 4.6 Temperature 1023"K, [93]
13 4.80 [5]
14 4.8 nSi [44]
15 4.9 {111} face of silicon single crystal [ 375]
in ultrahigh vacuum.
16 5.4 Same [375]
19. Potassium K
1 1.60 [ 1]
2 2.0 [46]
3 2.11 computed using formula (I), [ 303]
4 2.12 [10]
5 2.137:1:0.003 Temperature 82K. [370]
6 2.15 [ 6]
12
Work function cp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
2 O. Calc ium Ca
13
Work function !p, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
7 2.706 [50]
8 2.71 [2]
9 2.75 Computed using formulas (6) and (7). [ 302]
10 2.76 [51]
11 2.76 a-phase. [2,6]
12 2.9 [ 42]
13 2.96 [ 5]
14 3.02 0.12 [14,52]
15 3.2 [ 7]
16 3.20 [53]
17 3.21 [54]
18 3.33 [ 1]
21. Scandium Sc
22. Titanium Ti
15
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
23. Vanadium V
1 3.77 [8]
2 3.78 [5]
3 3.79 [ 417]
4 4.10 Computed using formula (6). [ 302]
5 4.11 [ 6]
6 4.12 [2,57]
7 4.12 50 Emitter: walls of graphite chamber [223]
covered with sputtered V.
8 4.15 Computed using formula (1). [303]
9 4.18 Computed using formula (7). [ 302]
10 4.44 [ 1]
16
Work function fP. eV
No. A Remarks References
TM PM FM EM CPDM CM TC
24. Chromium Cr
1 3.72 [5]
2 4.13 13 -phase. Computed using [302]
formula (7).
3 4.36 y-phase. Computed using [ 302]
formula (6).
4 4.37 [3,60,418]
5 4.38 [1]
6 4.4 [305]
7 4.42 a-phase. Computed using [303]
formula (1).
8 4.49 a-phase. Computed using [3021
formula (7).
9 4.51 a-phase. [6]
10 4.51 4.51 [234]
11 4.58 60 Emitter: walls of graphite [57]
chamber coated with elec-
trolytic or sputtered Cr.
12 4.59 [234]
13 4.59 y-phase. Computed using [302]
formula (7).
14 4.60 48 [3.61]
15 4.6 [7.418]
1'7
Work function CPo eV
No. A Remarks References
TM PM FM EM CPDM CM TC
16 4.62 [2]
17 4.63 [62]
18 4.7 [62]
25. Manganese Mn
1 3.76 [5,8]
2 3.83 [2.57]
3 3.83 34 Emitter: walls of graphite chamber [223]
coated with electrolytic or sput-
tered Mn.
4 3.95 [ 6]
5 4.14 [ 1]
6 4.28 Y-phase. Computed using formula (7). [ 302]
7 4.34 Y-phase. Computed using formula (6). [ 302]
8 4.44 8 -phase. Computed using formula (7). [ 302]
9 4.52 a-phase. Computed using formula (7). [ 302]
18
Work function (/J, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
26. Ir 0 n Fe
1 3.91 [51]
2 3.92 [63]
3 4.04 [5,64]
4 4.210.05 1.5 y-phase. [65]
5 4.31 60.2 Emitter: walls of graphite [57]
chamber coated with elec-
trol ytic or sputtered Fe.
y -phase.
6 4.33 [2]
7 4.36 [ 6]
8 4.40 [1,234]
9 4.40 [234]
10 4.44 a-phase. Computed using [302]
formula (7).
11 4.45 a-phase. Computed using [302]
formula (6).
12 4.47 a-phase. [66]
13 4.480.06 26 a-phase. [65]
14 4.5 [ 191]
15 4.53 a-phase. Computed using [ 302]
formula (7).
19
Work function <p, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
16 4.6 [ 7]
17 4.62 a-phase. [67]
18 ...4.63 [3,60]
19 4.68 y-phase. [67]
20 4.70 Measurements carried out on spec- [67]
troscopically pure Fe, including
ex _a and a-y transitions in the
temperature range 300o -1243"K.
21 4.703 [234]
22 4.72 [68]
23 4.75-4.77 [5]
24 4.76 705 Emitter: walls of graphite chamber [69]
coated with electrolytic or sput-
tered Fe.
25 4.77 [3,70]
26 4.77 [2]
27 4.92 ex-phase. Computed using formula (1). [303]
20
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
27. Cobalt Co
1 3.90 (51]
2 4.09 [234]
3 4.12 Cubic structure. [5]
4 4.12 [72,133]
5 - 4.12-4.25 [71]
6 4.18 [6]
7 4.2 [2]
8 4.21 [1,234]
9 4.25 Hexagonal structure. [5]
10 4.25 [133,171]
11 4.3 [ 7]
12 4.40 [65]
13 4.41 60 Emitter: walls of graphite chamber [2,57,223]
coated with electrolytic or sput-
tered Co.
14 4.41 [234]
15 4.410.10 41 [3,65]
16 4.48 Computed using formula (7). [302]
17 4.55 [ 3]
1'8 4.56 Computed using formula (6). [302]
19 5.44 Computed using formula (1). [ 303]
28. Nickel Ni
18 4.91 [234]
19 4.96 Temperature 300o K. [ 73]
20 4.98-5.03 [5]
21 5.0 27 [ 74]
22 5.0 [ 7]
23 5.01 [3, 70]
24 5.03 1380 [3,5,75]
25 5.03 i3 -phase. [ 306]
26 5.03 [2]
27 5.04 [234]
28 5.05 Temperature 623"K. [76]
29 5.09 B -phase. Computed using formula (1). [303]
30 5.1 5.1 [ 77]
31 5.20 Temperature 1108K. [ 76]
32 5.24 Temperature 1150o K. [ 76]
29. Copper Cu
1 3.85 [ 78]
2 4.07 [ 36]
3 4.1 [ 7]
4 4.18 [ 51]
5 4.2 [ 191]
23
Work function cp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
30. Zinc Zn
1 3.08 [36]
2 3.28 [ 87]
3 3.32 [88]
4 3.40 [89]
5 3.57 [88]
6 3.60 [ 37]
7 3.66 [1]
25
Work function 1fJ, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
8 3.74 [6]
9 3.89 [ 51]
10 4.04 Computed using formula (7). [ 302]
11 4.11 Contact potential difference relative [ 159]
to silver (IfJAg)assumed 4.31 eV.
12 4.18 Computed using formula (6). [ 302]
13 4.22 Contact potential difference relative [85]
to silver (IfJAg)assumed 4.31 eV.
14 4.24 [2]
15 4.24 [3,90]
16 4.25 [ 5]
17 4.26 {001} face of single crystal. [ 91)
18 4.26 [2)
19 4.280.02 [ 92]
20 4.3 [ 7]
21 4.307 [38]
22 4.65 [85]
23 5.35 Com puted using formula (1). [303]
26
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
31. Gallium Ga
32. Germanium Ge
27
Work function ({I, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
33. Arsenic As
28
Work function /p, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
3 5.ll [2,6]
4 5.11 [8]
5 5.17 Gray. [5]
34. Selenium Se
1 4.42 [1]
2 4.62 [37]
3 4.72 [2,6]
4 4.89 Hexagonal. [5]
5 5.11 [8]
37. Rubidium Rb
29
Work function (/J, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
4 2.1 [3]
5 2.11 Computed using formula (6). [ 302]
6 2.13 [5]
7 2.13 [6]
8 2.14 Computed using formula (7). [ 302]
9 2.16 [ 7]
10 2.16 [4]
11 2.16 [2]
12 2.16-2.19 [3,125]
13 2.17 [2]
38. Strontium Sr
1 2.06 [95]
2 2.2 Monolayer on substrate. [ 425]
3 2.24 [8]
4 2.25 [5]
5 2.35 [6]
6 2.4 [ 7]
7 2.46 Corn puted using formula (1). [ 303]
8 2.6 2.6 [2]
30
Work function I. eV
No. A Remarks References
TM PM FM EM CPDM CM TC
39. Yttrium Y
40. Zirconium Zr
31
Work function 'P, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
3 3.60 a-phase. [ 1]
4 3.73 Temperature 300K. [53]
5 3.74 Computed using formula (6). [302]
6 3.77 Computed using formula (7). [302]
7 3.78 120 [97]
8 3.84 [2,6]
9 3.84 Temperature 300"K. [8]
10 3.91 [190]
11 3.96 [234]
12 4.00 [58]
13 4.1 [ 7]
14 4.1-3.7 [388]
15 4.12 330 [5,301]
16 4.12 [96]
17 4.15 [2]
18 4.16 [234]
19 4.21 1260 [97]
20 4.33 [59]
21 4.50 3 x lOS [98]
32
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
41. Niobium Nb
1 3.96 [411]
2 3.96 57 [5,225]
3 3.97 [2]
4 3.98 [2]
5 3.98 Effective work function at 1873"1<. [429]
6 3.99 [5]
7 3.99 [6,234]
8 4.0 [7,335]
9 4.01 37.2 [99]
10 4.18 Computed using formula (6). [ 302]
11 4.22 Computed using formula (7). [302]
12 4.3 Effective work function at 2200"1<. [ 457]
13 4.37:1:0.03 Contact potential difference relative [434]
to tungsten (CPW assumed 4.54 eV).
Measurements performed in vacuum
of 1.33 x 10-1 N/m 2 (l0-9 mm Hg).
14 4.33 {110} face of single crystal. [459]
15 4.55 {335} face of single crystal. [459]
16 4.66 {111} face of single crystal. [ 459]
42. Molybdenum Mo
22 4.27 [6]
23 4.28 107 [102]
24 4.29 [234]
25 4.30 [234]
26 4.32 [105]
27 4.33 24.6 [106]
28 4.33 [62]
29 4.33 38 Computed by Richardson line method. [360]
30 ~4.34 [ 60]
31 4.34 Effective work function at
1873"1<. Computed from
data in [433].
32 4.37 115 [ 3]
33 4.370.02 155 [ 104]
34 4.38 60.2 [100]
35 4.38 [ 98]
36 4.39 323 [14,107]
37 4.40 [108]
38 4.4 Temperature 2100"K. [7,108]
39 4.41 60 [ 74]
40 4.41 Measurements conducted on wire 0.13 [ 360]
mm diameter at temperature 10000 K
in wavelength range 297 to 238 nm
at electric field strengths 0.8 to 142
kV/cm at cathode surface.
35
Work function 'P, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
43. Technetium Tc
44. Ruthenium Ru
1 4.52 [2,6]
2 4.52 ex-phase. [1]
3 4.60 ex-phase. Computed using formula (1). [303]
4 4.66 Computed using formula (7). [302]
5 4.67 Computed using formula (6). [302]
6 4.80 [2]
45. Rhodium Rh
1 4.52 [1,234]
2 4.57 [3,110]
3 4.58 [110]
4 4.6 [7]
5 4.62 a -phase. Computed using formula (1). [303]
6 4.64 Computed using formula (7). [302]
7 4.65 a-phase. [6]
8 4.7 Computed using formula (6). [302]
9 4.72 [2]
10 4.74 720 [162]
11 4.75 Temperature 400"K. [5,110]
12 4.75 4.75 [234]
13 4.80 33 [3,5,111]
14 4.9 100 [112]
46. Palladium Pd
1 4.49 [1]
2 4.52 Computed using formula (7). [302]
3 4.54 Computed using formula (6). [302]
4 4.60 0.15 Foil heated at 1173"K in vacuum [ 473]
< 1.33 x 10-1 N/m 2 10-9 mm Hg).
37
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
38
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
47. S il ver Ag
1 3.09 [ 78]
2 3.56 0.76 [ 79]
3 3.67 [36]
4 4.00 [234]
5 4.06 60.2 [5]
6 4.08 60.2 [ 80]
7 4.1-4.75 [113]
8 4.18 Com puted using formula (1). [303]
9 4.21 [114]
10 4.26 Computed using formula (7). [302]
11 4.28 [6]
12 4.29 Computed using formula (6). [302]
13 4.3 Work function of electrons from silver [ 158]
in NaCl.
14 4.30 Contact potential difference between [ 157]
silver and barium (CPBa assumed
2.52 eV).
15 4.31 [39,157]
16 4.31 107 Emitter: walls of graphite chamber [82]
coated with Ag.
17 4.33 Contact potential difference relative [115]
to tungsten ('Pw assumed 4.56 eV).
18 4.33:1:0.05 [116]
39
Work function tp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
19 4.35 [ 39]
20 4.38 [234]
21 4.41 Silver evaporated onto surface of fused [158]
quartz and molybdenum.
22 4.44 [ 1]
23 4.45 [2]
24 4.46 [53, ll6]
25 4.47 [117]
26 4.48 [ 159]
27 4.50 Layer evaporated onto silver substrate. [158]
28 4.5 [191]
29 4.50-4.52 [ 45]
30 4.55 [2]
31 4.56 Temperature 873"K. [ 118]
32 4.58 [ 161,186]
33 4.61 [221]
34 4.63 [234]
35 4.68 [158,220]
36 4.70 Work function of electrons from silver [160]
in KBr.
37 4.7 [ 7]
38 4.7 Oxidized surface. [159]
39 4.73 Temperature 293"K. [5,118]
40 4.74 [3]
41 4.75:1:0.01 {111} face of single crystal. [ 119]
40
Work function IP, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
48. Cadmium Cd
1 3.68 [ 8]
2 3.73 [ 36]
3 3.9 Computed using formula (6). [ 302]
4 3.92 [2,6]
5 3.93 Computed using formula (7). [ 302]
6 3.94 [ 37]
7 4.00 [ 1]
8 4.0 Contact potential difference relative [178]
to silver (IPAg ~sumed 4.3 e V).
9 4.04 [159]
10 4.06 Contact potential difference relative [85]
to silver (IPAg assumed 4.31 eV).
11 4.07 [ 120]
41
Work function <P. eV
No. A Remarks References
TM PM FM EM CPDM CM TC
12 4.08 [ 5]
13 4.08 Contact potential difference between [ 312]
cadmium evaporated onto Ta, and
barium (<PBa assumed 2.52 eV).
14 4.099 [ 38]
15 4.1 [ 7]
16 4.47 Computed using formula (1). [ 303]
17 4.49 [ 85]
49. Indium In
50. Tin Sn
1 3.62 [ 36]
2 3.87 [ 37]
42
Work function f{!. eV
No. A Remarks References
TM PM FM EM CPDM CM TC
3 4.09 [ 1]
4 4.11 [ 6]
5 4.21 [ 85]
6 4.21 Liquid. [ 121]
7 4.25 Contact potential difference relative [ 159]
to silver ( cp assumed 4.31 eV).
8 4.28 Agy-phase. [ 2]
9 4.38 a -phase. [ 2]
10 4.38 Hexagonal structure. [ 5]
11 4.38 Y-phase. [ 121]
12 4.39-4.28 [2]
13 4.4 [7]
14 4.50 a -phase. [121]
15 4.51 ex-phase. [ 418]
16 4.51 Tetragonal structure. [ 5]
17 4.64 [ 85]
1 4.0 [ 7]
2 4.01 [122]
3 4.05 B -phase. [5]
4 4.08 [6]
43
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
5 4.08 [2]
6 4.14 [ 1]
7 4.60 Crystalline sublimated layers on Ni, Mo, [94]
Pt, Nb, quartz, graphite.
Recommended value: 4.08 e V.
52. Tellurium Te
53. Iodine
44
Work function ({J, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
55. Cesium Cs
1 1.B [ 7]
2 1.B [191]
3 1.B1 [422]
4 1.B1 162 [ 3,5,124,301]
5 1.B6 Computed using formula (7). [ 302]
6 1.B7 [2]
7 I.B7-1.96 [ 3,125]
8 1.88 Computed using formula (6). [302]
9 1.89 [6]
10 1.9 [3,4]
11 1.93 [2]
12 1.93 [5]
13 1.94 Computed using formula (1). [303]
14 1.96 [ 47]
15 2.14:1:0.05 Massive layer of pure Cs produced [ 427]
in vacuum of ~1.33 x 10- 8 N/m2
(~10-10 mm Hg).
56. Barium Ba
2 1. 73 [ 1]
3 1.19 Monolayer on substrate. [ 425]
4 2.1 60 [5]
5 2.1 Sputtered on W. [314]
6 2.11 60 [301]
7 2.11 [ 125]
8 2.29 [ 6]
9 2.3 [ 191]
10 2.30 Computed using formula (1). [ 303]
11 2.39 0.05 [126]
12 2.4 [ 7]
13 2.48 [29]
14 2.49 [3,127]
15 2.5 Computed using formula (6). (302]
16 2.52 (50]
17 2.52 (2]
18 2.53 Computed using formula (7). [302]
19 2.55 [5]
Recommended value: 2.49 eV.
57. Lanthanum La
58. Cerium Ce
1 2.6 [128]
2 2.6 Read off graph of work function vs. [2]
atomic number.
3 2.7 [6]
4 2.84 Read off graph of work function [ 437]
vs. atomic number.
5 2.84 a -phase. [ 53]
6 2.98 a-phase. Computed using formula (1). [ 303]
7 3.07 [ 5]
Recommended value: 2.7 eV.
59. Praseodymium Pr
47
Work function rp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
60. Neodymium Nd
62. Samarium Sm
1 3.2 [6,128]
2 3.2 Read off graph of work function vs. [2]
atomic number.
63. Europium Eu
64. Gadolinium Gd
48
Work function 1fI, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
65. Terbium Tb
66. Dysprosium Dy
67. Holmium Ho
69. Thulium Tm
49
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
70. Ytterbium Yb
1 2.59 Work function evaluated from Eq. (8). [56]
7l. Lutecium Lu
72. Hafnium Hf
50
Work function CPo eV
No. A Remarks References
TM PM FM EM CPOM CM TC
73. Tantalum Ta
1 3.14 [130]
2 3.58 1.31 X 10- 3 [14,21]
3 3.96 Temperature 300o K. [1]
4 4.03 Temperature 1473"-1773"K. [131]
5 4.04 34 [5,14,100]
6 4.05 Temperature 300o K. [ 32]
7 4.07 60.2 [109]
8 4.08 [lOS]
9 4.D9 [234]
10 4.10 37.2 [132]
11 4.10 [2]
12 4.1 [ 7]
13 4.1 60 [301]
14 4.11 [3]
15 4.12 37 [ 411]
16 4.12 60 [3,74,42]
17 4.12 [6,418]
IS 4.12 Temperature 300 oK. [ 53]
19 4.12 [ 234]
20 - 4.12-4.16 [ 5]
21 4.13 Temperature 273"K. [ 113,133]
22 4.13 [ 2]
23 4.13 Computed using formula (6). [ 302]
51
Work function CPo eV
No. A Remarks References
TM PM FM EM CPDM CM TC
24 4.16 [133]
25 4.16 Temperature 9O-K. [62]
26 4.18 2.95 [134]
27 4.18 Temperature 973"K. [133]
28 4.190.02 555 [135]
29 4.2 Computed using formula (7). [302]
30 4.24 [108]
31 4.24 Temperature 2550"K. [108]
32 4.25 Temperature 1900K. [136]
33 4.28 [234]
34 4.3:1:0.1 Film 0.01 mm thick after [473]
heating to 2273 -2573K.
35 4.352:1:0.01 120 {211} face of single crystal. [ 387]
36 4.4 Effective work function at 2200K. [ 457]
37 4.51 [22]
38 4.75:1:0.06 {lIO} face of single crystal. [430]
39 4.77 [228]
Recommended value: 4.12 eV.
52
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
74. Tungsten W
1 4.25 [139]
2 4.35-4.65 Emission of tungsten coated with Pt, at [321]
high collecting fields.
3 4.38 Temperature 300o K. [1]
4 4.38 [234]
5 4.40 43.6 [134]
6 4.40 40 [ 144]
7 4.42 a-phase. Computed using formula (1). [ 303]
8 4.42 [ 322]
9 4.45 38 [144,232]
10 4.46 [146]
11 4.46:1:0.09 [ 146]
12 4.48 [22]
13 4.49 [3]
14 4.49:1:0.02 [147]
15 4.5 [191]
16 4.50 60.2 [98,148]
17 4.50 a-phase. [6,7]
18 4.5 [ 320,417]
19 4.5 [339,376]
20 4.5007 [234]
21 4.52 60.2 [ 16,149,150,411]
53
Work function ({i, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
22 4.52 72 [3,151]
23 4.52 [ 149]
24 4.52 [2]
25 4.52 84 [151,230]
26 4.52 [ 316]
27 4.53 55 [ 231]
28 4.53 60.2 [106,109]
29 4.53 22 [ 106]
30 4.54 [ 3]
31 4.54 60-100 [3,5,301]
32 4.54 [2]
33 4.54 [ 152]
34 4.54 52 [232]
35 4.54 [234]
36 4.54:1:0.07 53 Measured by Richardson straight- [354]
line method.
37 4.55 [ 422]
38 4.55 89 In 1900-2100"1< range. [ 421]
39 4.55 90 [ 229]
40 4.55 75 Pol ycrystalline surface. [ 153]
41 4.55-4.66 - Temperature range 293" -429"K. [ 319]
42 4.55-4.57 [5]
43 4.56 [323]
44 4.56 Computed from formula (6). [302]
45 4.565 [l08]
46 4.58 80 [74]
54
EMISSION PROPERTIES OF VARIOUS FACES OF TUNGSTEN SINGLE CRYSTAL [cp, eV; A, A/em>. (deg K)']
4.66 t O.06'}
[315]
5.30:10,06
[8] 4.58
[105] 4.58
[410] 5.33:1:0.03 4.40 to,03 4.30tO,03
Aeff= 300t Aeff= 122t Acff= 115t
[460] <1'2000"1< .... 5.1'
[461] - ~T=4.52- 'PT=4.38+ ~T=4.74- ~T=(5.28-
0.1 X 10~5T' 2'::5.14:1: 4.9 X IO-sT' 6.7 x IO-5 T , 4.39)+4.9 x IO-sT'
[462.463]
Photoelectric emission [233) 5.85 4.34 4.31 4.39 4.76 4.30 4.35 4.52 4.46
[140] 4.32 4.50 4.50 43Q(4.35)
Field emission [ 318] 5.7 <4.391 5.81
[376] 5.0 4.6 5.6 3.9 4.3
[145] 4.97 4.68 4.64 4.93 4.49 4.45
[ 137] 4.6 >4.9 4.40 4.8 4.2
[ 138] 4.6:1:0.1 5.5:0.2 4.2.0.1 4.9:1:0.2
[ 155] 6.0
[233] 4.34 5.7-5.99 4.39 4.65-4.88 4.30 4.35 4.52 4.46 4.31
[ 464,465] 4.BOH,08 4.3iO.1
[320] 5.0-5.5
:l:Determined by means of surface ionization on {UO} face of sodium and potas~ium atoms.
Field in projector assumed hyperbolic.
55
Work function tfI, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
75. Rhenium Re
1 4.66:1:0.01 [ 386]
2 4.7 [ 7]
3 4.72 Computed using formula (7). [ 302]
4 4.74 [162]
5 4.74 [385]
6 4.75-4.80 [435]
7 4.80 52 [323,421]
56
Work function ((I, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
76. Osmium Os
1 4.55 [6]
2 4.55 [1]
3 4.7 [2]
4 4.7 [165]
5 4.7 [7]
6 4.9 Computed using formula (7). [302]
7 4.91 Computed using formula (1). [ 303]
8 4.99 Computed using formula (6). [302]
Recommended value: 4.7 eV.
57
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
77. Iridium Ir
1 4.57 [6]
2 4.57 [1,2]
3 4.86 Computed using formula (7). [ 302]
4 4.91 Computed using formula (6). [ 302]
5 5.3 100 [ 112]
78. Platinum Pt
58
Work function cp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
59
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
79. Gold Au
1 4.00-4.58 ( 79]
2 4.23 60.2 [5}
60
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
61
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
24 4.9 [ 7]
25 4.90 [ 3]
26 4.92 [2]
27 5.1 [ 305]
80. Me rc ury Hg
1 4.50 [ 1]
2 4.50 [ 182]
3 4.5 [ 7]
4 4.52 [6]
5 4.52 [3,183]
6 4.52 [ 2]
7 4.53 [5,184,185]
62
Work function f/J, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
81. Thallium Tl
82. Lead Pb
63
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
83. Bismuth Bi
1 4.14 [37]
2 4.17 [ 1]
3 4.22-4.25 [187]
4 4.28 [ 6]
5 4.28 [2]
6 4.31 [60]
7 4.32 [60]
8 4.34 [94]
9 4.4 [ 3]
10 4.44 [ 10]
11 4.46 [188]
12 4.6 [ 7]
13 4.62 [5]
14 4. 76-fi. 06 [ 189]
84. Polonium Po
64
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
87. Francium Fr
88. Radium Ra
89. Actinium Ac
90. Thorium Th
65
Work function cp, eV
No. A Remarks References
TM PM FM EM CPOM CM TC
9 3.38 70 [3,301]
10 3.38 Temperature 300o K. [53]
11 3.39 [58]
12 3.4 [7]
13 3.41 [6]
14 3.42 "Thick" thorium layers on W. [339]
15 3.44 [60]
16 3.455:1:0.012 Contact potential difference relative [ 368]
to tungsten (1Pw assumed 4.560 eV).
Measured on film sputtered in vacuum.
17 3.46 Temperature 300o K. [ 1]
18 3.46 [234]
19 3.47 [58]
20 3.51:1: 0.05 - [37,58,96,426]
21 3.52 [234]
22 3.57 Temperature 300o K. [ 37]
23 3.65 [8]
24 3.68 [8]
25 3.728:1:0.010 Contact potential difference relative [ 368]
to tungsten (CPW assumed 4.560 eV).
Measured on thin foil.
66
Work function CP. eV
No. A Remarks References
TM PM FM EM CPDM CM TC
92. Uranium U
67
Work function cp, eV
No. A Remarks References
TM PM FM EM CPDM CM TC
68
II. CHEMICAL COMPOUNDS
1. SIMPLE OXIDES
Richardson constant A,
No. Oxide Work function cP, eV in A/cm 2.(deg K)2 Remarks References
9 TiO
6.21
2.96-3.1
4.08 X 10 5
range 1750-2000"1<.
Unactivated. ~ [331]
[2]
69
Richardson constant A,
No. Oxide Work function <p,eV in A/cm 2 (deg K)2 Remarks References
I
No. Oxide Work function cp, eV in A/cm z . (deg K)Z Remarks References
72
Richardson constant A,
No. Oxide Work function cp, e V in A/cm z . (deg K)Z Remarks References
}
23 NdzOs 2.3 0.99 Computed from equation with TZ.
. 2.3:0.2 246 Tactivation =1773-1823"1<. [333]
Computed from equation with T 5/ 4
3.06 Effective work function at 1673"1<. Computed [437]
from data in [447].
3.30 Effective work function at 1600"1<. [333]
3.3 Same, at 1700"1<. [340,445]
24 PmzOs ~3.33 Suggested value of effective work [445]
function at 1700"1<.
25 SmzOs 2.8 0.33 Computed from equation with TZ. [333]
2.8:0.1 55 T activation =2023-2123"1<. [333]
Computed from equation with T 5/ 4 ,
3.21 Effective work function at 1700"1<. [340,445]
3.57 Same, at 1600"1<. (333]
26 EuzOs 2.6 0.11 Computed from equation with TZ. [333]
2.6 0.2 22 T activation =1723-1823"1<. [333]
Computed from equation with T 5/ 4
3.38 Effective work function at 1700"1<. [ 340,445]
I
3.60 Same, at 1600"1<. [333]
27 GdzOs 2,1 0.66 Computed from equation with TZ.
2.2:1:0,1 274 T activation =1723"1<. [333]
Computed from equation with T 5/ 4
2.82 Effective work function at 1600"1<.
3.11 Same, at 1673"1<. Computed from data [ 437]
in [447J.
3.29 Same, at 1700"1<. [340,445]
73
Richardson constant A.
No. Oxide Work function cp. eV in Alcmz . (deg K)2 Remarks References
I
30 Ho Z0 3 2.3 0.33 Computed from equation with T2.
2.4 0.1 66 Tactivation = 2073' -2173"1<. [333]
Computed from equation with T 5/ 4.
3.20 Effective work function at 1600"1<.
3.24 Same, at 1700"1<. [445]
31 ErzOs 2.4 0.76 Computed from equation with TZ.
T activation =2023' -2123"1<.
'w
2.4 i O.2 88
3.0
3.33
Computed from equation with T5/4.
Effective work function at 1600"1<.
Effective work function at 1700"1<.
} [333]
[ 340,445]
I
32 TmZ03 3.27 Same as above. [445]
33 YbzOs 2.7 1.42 Computed from equation with TZ.
2.70.1 121 T activation = 1723"1<.
[333]
Computed from equation with T5/4.
3.3 Effective work function at 1600"1<.
74
Richardson constant A,
No. Oxide Work function cp, eV in A/cm 2 . (deg K)2 Remarks References
I
Yb 20 3 3.39 Same, at 17001<. [ 445]
34 LU203 2.3 0.11 Computed from equation with T2.
2.40.2 187 Tactivation =1823-1923K.
[333]
Computed from equation with T 5 / 4
3.86 Effective work function at 16001<.
3.26 Effective work function at 17001<. [445]
3.86 Same, at 16001<. [333]
35 Hf02 2.82 0.49 Activated. Temperature measurement [331]
range 1500-19001<.
3.60 Effective work function at break point [446]
on Richardson slope (T =15001<). Measured
I
in 1300-20001< temperature range on powder
coated on W ribbon.
3.76 Activated. Temperature measurement
range 1300-15001<. [331J
5.84 9.25 X 106 Unactivated.
36 Ta20S 4.65 [ 2]
37 W02 4.96 [ 2]
38 Th0 2 1.66 1.1 X 10- 3 Activated. Temperature measurement [331]
range 1350-16501<.
2.54 2.5 [266]
2.55 3.3 Temperature 18001<. [203]
2.55 3.3 Temperature 20001<. [203J
2.57 7.9 [267J
2.60 2.45 Temperature 20001<. [334]
" 2.6 Computed from equation with T2. [ 335]
75
Richardson constant A,
No. Oxide Work function <p, eV in A/cm 2 (deg K)2 Remarks References
. 1.1
1.14 9 X 10- 2
Temperature 1000"1<. [195]
[274]
. 1.2 [277]
1.23 (260]
1.24 1.2 X 10- 2 [271]
1.3 10- 3 [270]
1.37 [275]
1.4 [279]
1.42 1.8 X 10- 1 [280]
1.51 [268]
1.66 Photoemission. (265]
2.1 1.1 Unac tiv ated. [278]
Emission maximum at 300"/0 BaO, 700"/0 [284)
SrO.
. Emission maximum at 35% BaO, 650"/0 [285)
SrO.
43 BaO+CaO Same, at 600"/0 BaO, 400"/0 CaO. [285)
44 BaO + SrO + CaO 1.9 430"/0 BaO, 430/0 SrO, 14% CaO. [279)
Emission maximum at 470/0 BaO, 430/0 (283)
SrO, 100/0 CaO.
45 High - alumina 4.4 40/0 CaO in composition. Measured by [440]
zirconium ceramic Richardson slope method.
77
46. Mixed rare earth oxides
1 7 ff1/0 Gd.t0s + 2ff1/0 LazDs 2.99 Computed from data in [447]. ( 437]
2 5f11/0 Gd.tDs + 500/0 LazDs 2.93 Same ( 437]
3 45. 50/0 LazDs + 110/0 PrzOs + 380/oNdz0s 3.03 ( 437]
+ 5.50/0 other rare earth oxides
4 700/0 mixture (3) + 300/0 ThOz 2.98 [ 437]
5 4ff1/0 ClaOs + 2ff1/0 LazO~ + 17.90/0 Ndz0s 3.34 [448]
+ 5.70/0 PrzOs + 8.90/0 other rare earth
oxides
6 470/0 SrnzOs + 2ff1/0 Gdz0s + 280/0 other 3.39 ( 448]
rare earth oxides
78
~__________
f.eV -r____-'
r-________- '__________-r__________
2.9
c:C:X __ x
~~V~--~----r----r----,----,
2.7 L-------~---------+--------_t~~-~--_r--_l
2.5
2.3 L-------~~------~=-------7~------_t--_1
2.1
1.9 L-----~~~----~;J~------_t--------_t--~
1.7
lit 1200 1600 2000 T. Of{
(1060 ~~6
1.5 L::::~~:..:j~-------+--------_t----------t----j
Fig. 4. Temperature behavior of work SoO- So
79
2. COMPLEX OXIDES
Barium Niobate [300] <Pt. e V
L
Effective work function Emission current density ie' /
No. Compound 'PT' eV, at 12000 K in A/cm2 , at 12000 K
V
1 2.42 2.J
900 1100 1300 fj()O l, 'f(
No. Compound
Activation
temperature,"K
Effective work
function <p'f, Richardson work
in eV, at 1250"K function <Po' eV
Richardson
constant A,
in Alcm! (degK)2
~:11;1 ~f I
2.0 BOO 1000 1200 1, O/(
80
Tantalates
:0;::
o
I
1 CasT~OlO 1200 2.98 5.5 X 10-5
2 Srs Ta2010 1200 2.82 2.6 X 10-4 [300]
3 Bas Ta2010 1200 2.39 1.5 X 10-2
Tungsten 1560 1000-1550 1200 2.79 1.10 1.07 X 10-0 Sintered in hydrogen f
1560 1000-1550 1200 2.72 1.08 2.09 x 10~ Sintered in air
[299]
Tantalum 1250 840-1230 900 2.25 1.15 7.0 x10-4 Sintered in hydrogen
1250 840-1230 900 2.15 1.22 1.0 X 10-3 S intered in air
4 (Ba0>n<T~Cl;\n
n:m
3: 7 1200 3.49 4.0X10-7
1: 1 1200 3.18 7.0x10-s
~:1 1200 2.75 5.0 x 10-4
7:3 1200 2.71 7.5 X 10-4
3:1 1200 2.48 7.5 X 10- 3
[300]
4:1 1200 2.51 5.0 X 10- 3
4.5: 1.0 1200 2.44 1.0 X 10-2
7:1 1200 2.36 2.2 X 10-2
9:1 1200 2.37 2.0xlO- 2
81
No. Compound Core Remarks
82
v. Fig. 8. Temperature behavior of total
I
Tungstenates
:>-
..>:: (l)
b .S
~
I
1200 2.52 4.2x10-3 [300]
Tungsten 1560 1100-1500 1.20 1.07 x 10 '5 Sintered in hydrogen
1560 1000-1550 1200 2.82 1.25 3.39 X 10-5 S intered in air
[299]
Tantalum 1400 950-1400 1200 2.55 1.10 1.09 X 10-3 Sintered in hydrogen
1400 950-1400 1200 2.52 1.18 1.13 X 10-3 Sintered in air
83
No. Substance Core Remarks
2 BaC0S+BaSW06
(BaO: was>
9:1 1100 1.80 1.27 4.81 X 10-1
5: 1 1100 2.00 1.33 8.52 X 10-2
4:1 1100 2.08 1.32 3.98 X 10-2
3 BasWas+B~ W~ 1100 2.55 1.75 2.40 X 10-2
4 B~W~ 1100 2.76 1.85 9.77 X 10-3
5 B~W~+BaW04 1100 3.05 1.94 3.55 X 10-3
6 BaW04 1100 3.34 2.27 1.66 X 10-3
7 Baz.sSro.s Was 1700 1100 2.35 1.11 2.57x10-4 2.5x10- 3 [299]
8 B~SrW06 1700 1100 2.37 1.25 7.60x10-4 2.1x10- 3
9 BaLSSrLS WQ; 1700 1100 2.61 1.49 6.76 X 10-4 1.6 X 10-4
10 BaSrzWOs 1700 1100 2.83 1.82 4.80 X 10-3 1.5 X 10-5
11 SrsWOs 1700 1100 3.19 1.85 9.14 X 10-5 3.6 X 10-1
12 SrZCaW06 1700 1100 2.88 1.58 1.35 X 10..4 1.0 X 10-5
13 Srl,SCal.S WQ; 1700 1100 3.00 1.68 1.26 X 10"'" 2.5 X 10-6
14 SrC~W06 1700 1100 3.17 1.77 5.75 X 10-5 4.4 X 10-1
15 CasWC\; 1700 1100 3.36 2.13 2.82 X 10-4 5.5 X 10-8
16 C~BaWQ; 1700 1100 2.89 1.99 8.70 X 10-~ 7.7 X 10-6
84
~ ~
Q) Q)
. B bO::;
No. Substance Core .5... ~ Remarks
~ ~ ...
a
::l Q)
.~
a ~
0...
t;
< 3 :2 3
17 Cal.5Bal.5 WOG 1700 1100 2.70 1.55 4.26 x 10-4 6.0 X 10-5
18 CaB~WOs 1700 1100 2.40 1.33 1.35 x 10-3 1.4 X 10- 3
[299]
1
19 Cao.5B~.5W06 1700 1100 2.38 1.18 3.80xl0-41.8xl0-s
20 BaSrCaWOs 1700 1100 2.50 1.52 4.07xl0- 3 5.0xl0-4
35 ~
J.V
3.1
/ I cP t' e V:r---r---,.--r--"
J2r--+--r-~7Y
//2/
2.7
V/ / Fig. 10. Temperature behavior of work function for the basic barium
YI""- 1'3 2.81---+-*-_+_---1
tungstenate BasWOs [299]. (a) 1) After thermal activation at 1600o K;
2) after activation with current drain at 1600o K; 3) after thermal
2.3 1/ activation at 1 700o K; 4) after calcining at temperature 2000K.
/ (b) 1) BasWOs on tungsten (sintered in hydrogen atmosphere);
1/
1.9 800 1200 1600 .
T. K 1200 T.K 2) BasWOs on tungsten (sintered in air); 3) BasWOs on tantalum
a b (sintered in hydrogen); 4) BasW06 on tantalum (sintered in air).
85
Rhenates [337]
';:l I #j
Effective work
Activation function <fIT, eV, Richardson work Richardson constant A,
No. Composition temperature, oK at 12500 K func tion <Po' e V in Alcm2 (deg Ki
1 BaO'R~Or 1450 2.94 1.69 1.1 X 10- 3 2.2 900 1100 T,K
2 2BaO'R~Or 1300 2.68 1.43 1.1 X 10- 3
3 3BaO' Re20r 1300 2.57 1.57 1.1 x 10-1 Fig. 11. Stable emission curve
4 5BaO' R~Or 1350 2.44 1.67 1.15 X 10-2 for basic composition of
5 7BaO' R~Or 1350 2.38 1.51 7.4 X 10-2 bariulJl rhenate 7Ba' R~Or [337].
3. SALTS
86
4. BORIDES
Richardson constant A,
No. Boride Work function <p, eV in A/cm2.(deg K)2 Remarks References
87
Richardson constant A,
No. Boride Work function cp, eV in A/cm z (deg K)z Remarks References
88
Richardson constant A,
No. Boride Work function cp, eV in A/cm 2 . (deg K)2 Remarks References
90
Richardson constant A,
No. Boride Work function cP, eV in A/cm 2 (deg K)2 Remarks References
91
(/J,. e \(
t>;'
~ 1_ "
V 3.4
~
~
"',
3,2
[;tb :2; ~ . 0
0) .0 0
V
'O,
2. 4 1()()() . j{:
O
~
92
5. CARBIDES
Richardson constant A.
No. Carbide Work function CPo eV in A/cm 2 (deg K)2 Remarks References
93
Richardson constant A,
No. Carbide Work function cp, eV in A/cm 2 (deg K)2 Remarks References
94
Richardson constant A,
No. Carbide Work function cP, eV in A/cm 2 (deg K)2 Remarks References
95
Richardson constant A,
No. Carbide Work function cpo eV Remarks References
in A/cm2 . (deg K)2
96
Richardson constant A,
No. Carbide Work function cp, eV in A/cm 2 (deg K)2 Remarks References
97
Richardson constant A,
No. Carbide Work function cP, eV in A/cm z (deg K)z Remarks References
98
Richardson constant A,
No. Carbide Work function cP, eV in A/cm 2 (deg K)2 Remarks References
99
Richardson constant A,
No. Carbide Work function cP, eV in A/cm z . (deg K)z Remarks References
23 (TaC)o.s-(UC)o.z 3.45
core.
Same, at 2100"1<. Powder coating on
tungsten carbide core.
} [ 457]
100
'Pr,e Fig. 14. Dependence of effective work function
---
0 on temperature, metal carbides [371]. 1) VC;
o v 0 1 2
38 2) TiC; 3) HfC; 4) TaC; 5) ZrC; 6) NbC.
~
!""" ~
l,.--<>- "
~ '"'-0....
~ ;--...!!
3,6
,....,..
5 6
---:-
~x
x
3.8
x 0
0
'.' ~><" / m
yA
p: ~ ./.
v.~
.
"
" ---:- ~ ~
--" ~ ..Y u
3 .0
Al' ..
~'Vv.
..
~
./'
V ~
#:~
- ..
A
'.0
87
3.' -"x-"
0
/:
~ 0
,., ~
~
V
3,1
/
3 .0
1100 "00 1600 1800 1100 2400 T. OK
,... 1700 1800 1900 2000 :2'100 2200 1Joo 2'400 2300
, K
Fig. 15. Temperature dependence of effective work function Fig. 16. Temperature dependence of work function for TaC-ZrC
of ZrC [452]: 0) ZrC rod; ., t:>, X) various specimens of cam odes system [458J at various concentrations (in mol. ,,/0): I) 60-40;
fabricated of powder coated on tungsten. II) 90-10; III) 30-70.
101
s. ,
s. ,
' .,
lJ) V
, JYln d
V/ .~
Vo .
::;:.
.'l
. :)
k~ V 4.
/
L// ~~
/
.
I/o
'
p
.7::~~ V
. ~
Bf
'.J
<.J
v;, v' l~.
" ~~V
6
f,P-"
nlO
.
4 .0
o
0 / 4
~~
' .0 ~ . ';
. ,
V ......
~.,.;
~
------:~
J.
l. ,
v ~
V '"
'h:P
ylyo/'
1000 1700 1800 1900 2000 :1100 nco 1]00 101.00 ,::,00
t ~
1600 1700 1800 1901) 1000 1100 :n00 2JOO 2.400 2'500
I, -K
Fig. 17. Temperature depel1del1ce of work fUl1ctiol1 for NbC - HfC Fig. 18. Temperature depel1del1ce of work fUl1ctiol1 for TaC- HfC system
system [458] at various cOl1cel1tratiol1s (il1 mol. 0/0): I) 33-67; [458] at various cOl1centrations (il1 mol. 0/0): I) 33.3-66.7; II) 88-12;
II) 57.2-42.8; III) 88-12. III) 57.2-42.8.
102
6. NITRIDES
Richardson constant A,
No. Nitride Work function cp, eV in A/cm 2 (deg K)2 Remarks References
103
7. ALUMINIDES [466]
3.S
-r-.",_
3.6 r- '"
- "-~ .-
~
-f
~
~
3.4
3.7
1---'
...- - . -n
3
2
0
2.S
1200 1300 1400 1500 1600 1700 1800
t emperOrufC'. K
104
8. SILICIDES
-Temperature coefficient of work function is the average for the particular temperature range,
since it goes from a negative value through the zero point to a positive value.
105
9. CHALCOGENIDES AND MISCELLANEOUS SEMICONDUCTOR COMPOUNDS
Richardson constant A,
No. Compound Work function <P, eV in A/cm2 (deg K)2. Remarks References
4.16 1700"K.
5 LaS Measured on sintered specimen. Tem- [392J
perature dependence of effective work
function in range 1200 -1 700 K:
0
106
Richardson constant A.
No. Compound Work function cpo eV in Alcm2 (deg Kl Remarks References
107
Richardson constant A.
No. Compound Work function cpo eV in A/cm2 . (deg K)2 Remarks References
108
'fi" e.\j-- - ---r----.-----..-----,r-..........,
~e V'r----r--_r--_r--,
Fig. 21. Temperature behavior of work function of Fig. 22. Temperature behavior of work function
L~S3 [392]. 0 Sample No.1; X sample No.2; of LaS [392]. 1) Sample No.1 on heating;
b. sample No.3; sample No.4; sample No.4, 2) sample No. 1 on cooling; 3) sample No.2 on
reheated. heating; 4) sample No.2 on cooling; 5) sample
No. 3 on heating.
109
'Ii. ev.,r - - - -,-----.-______,r-----
~ev~---r----,,----.-------,
4.301----t----+----+--:;;~~
110
~~ U-------~------~--------r-------'
38~-----+------+-~~~~~---\
331----------*'e;::.------I-----+-------\
~
3.8 C?
J3
~./'
//
2.8 '373 1573 1773 T.
.
K
111
!II,ev,r-------,.--- - - , - - - - - - . - - - - ,
3.8~----_4------_r~~~+_----~
~r, eV.
3,8
0 .
~
33 /
0
2.8 ~
/IOU /300 /500 1700 r'x
112
Richardson constant A,
No. Compound Work function !{J,eV in Alcm2 (deg K)2 Remarks References
113
I
Richardson constant A.
No. Compound Work function cpo eV Remarks References
in Alcm2 (deg K)2
1.43 A=404.6 nm
1.46 A = 313.0 nm
Layer thickness ~ 530 nm
1.47 A=2S0.5nm
1.49 A=24S.2nm
114
I I
/ I
If-O / 1
I
,, \
V I
1 , ,
I
~
~ 4,0
38 , ,
....
/ '" ........
I
e _ I ,/
, /
I
~
'-
V
3.6
3.6 60 20 w, o
100 60 20W o b
a
/e
3.4
Fig, 30. Dependence of the work functions of alloys on
composition (wt!'/o) [397], a) Tungsten -hafnium system:
-/
3.2
X values of work function determined experimentally;
values of work function computed from formula
1300 1400 1500 1600 1700 IBOO r. X N
'P*- ~ Ii 'Pi' where q>* is the work function of the
Fig. 29. Temperature behavior of work function i-I
of LaG~ [396]. 0 Heating; ~ cooling; "re- phase mixture. f i is the fraction of the current supplied
heating; cooling. Specimens were obtained by by patches of the i-th type; q>i is the work function of a
sintering components with subsequent melting in patch of the same i-th type. b) Tungsten-titanium sys-
an argon atmosphere. tem: X work function values determined experimentally.
115
T. oK
f .v
~.eV
3500
T. <:IK
3500 3000
3000 5.8
2500 2000
r-
2000 5.0
1500
~,
....,
0 2000
,/
--- --- 2
:-- >--
V
4. 2 1500
,./_Q..--
-v-
r---<>
--,,-
~. .;...- '\
1'-, _SJ
oj 4.0
/ - ~-- ------ 2
1000
===0=- - ,..,.0-
4.2
1500 1000
I o 20 40 60 80 100
3.8
20 40 60 80 100
3.2
T.
20 40
ClI. %
100
R.
Nb w t. % T. C t. ~
Fig. 31. Dependence of work function on com- Fig. 32. Dependence of work function on composition of alloys [468]: a) Nb-Ta; b) Ti-Re;
position of alloy Ta -Re [468]. o castings; hot-pressed compacts.
116
10. INTERMETALLIDES
Richardson constant A.
No. Alloy Work function cpo eV Remarks References
in A/cm2 . (deg K)2
Richardson constant A.
No. Compound Work function cpo eV in A/cm2 . (deg K)2 Remarks References
117
III. CHEMICAL ELEMENTS ON SUBSTRATES
(Metal- Film)
3 Titanium - cesium (Ti -Cs) 1.07 0.10 Optimum coating at Cs pressure of [ 420]
1.33 X(10-4to 1)N/m 2 (10-6 to 10- 2 mmHg).
.TE-work function in thermionic emission <P. in eV; PE-work function in photoelectron emission <P. in eV; CPD-work function in contact
potential difference <P. in eV; RC-Richardson constant A. in A/cm 2 '(deg K)2.
118
No. Metal-film TE PE CPD RC Remarks References
119
No. Metal-film TE PE CPD RC Remarks References
120
No. Metal-film TE PE CPD RC Remarks References
121
No. Metal-film TE PE CPD RC Remarks References
122
No. Metal-film TE PE CPD RC Remarks References
123
No. Metal- film TE PE CPD RC Remarks References
124
No. Metal-film TE PE CPD RC Remarks References
125
IV. CHEMICAL COMPOUNDS ON SUBSTRATES
>-OJ
<.-
..
'CIIi:l Q'
~ .... be
c:: 190 OJ
.S () ~
No. Substr ate-material ....() c:: Remarks References
c:: 0"
.E '" S
.:.: :a . .(). .
"Cl
!5 iJ<.
~ o:! ....c::
1 Carbon- barium, barium oxide (C-Ba/BaO) 1.99 Heat-activated at 1073 to 1173"1<. Therm- [ 382]
ionic emission.
2 Aluminum-aluminum oxide (AI-AI20 s) 3.9 Contact potential difference. Oxide film [471]
thickness 200 nm.
4.3:1:0.1 Same. Film thickness 3 nm. [471]
3 Aluminum- barium oxide (AI- BaO) 1.80 Activated. Thermionic emission. [352]
4 Silicon-barium, barium oxide (Si-Ba/BaO) 2.07 Heat-activated at 1073 to 1173"1<. Therm- [382]
ionic emission.
126
<
:>-
(l) ... '"
...
c:!~
c:!
190 DO
(l)
Remarks References
c:! 0",
.8 ~ 6
....
u
..:x:
0
.... ~<
u
:::: ~ .S
127
<:
>-<1l <-> ..
c:: ~
S- S :.::
c:: '" <1lbO
.g U~
No. Substrate-material U c:: Remarks References
c:: 0 ..
.;:! ~ a
.... u
-c0 l'!"<
u c::
;3: .~
0:: .~
Tantalum- barium oxide (Ta- BaO) 1.3-1.0 Temperature 600 _900 0K. [195]
1.48 Activated. Thermionic emission. [353]
1.58 Same [352]
25 Tungsten- calcium oxide (W-CaO) 2.1 Temperature 8200_9200K. [195]
26 Tungsten-strontium oxide (W-SrO) 1.2-1.1 Temperature 550 -900 0K. [195]
27 Tungsten-barium oxide (W-BaO) 1.1 Temperature 1000o K. [195]
1.2-1. 0 Temperature 550 _900 o K. [195]
1.34 Activated. Thermionic emission. [352]
1.36 Same [353]
1.9-2.0 Contact potential difference. Ba impurity [ 322]
present.
28 Tungsten-tungsten oxide (W-WOs) 9.22 5 X lOll [5]
29 Tungsten-thorium oxide (W-Th~) 1.5 5 X 10-2 Activated at 2150K. [249]
1.6 1 X 10-2 [250]
2.4 12 Ba impurity present. [336]
2.5 2.5 Temperature 1980o K. [248]
2.5 100 [249]
30 Tungsten-barium-gold alloy (W-BaAlIs) 3.3 Field emission. Vacuum: 1.33 to 2.66 X 10-7 [357]
N/m2 [or (1-2) X 10-9 mm Hgl.
129
No. S ubstr ate -m aterial Remarks References
31 Tungsten-tungsten silicide (W-WSi2) 3.9-4.02 Contact potential difference. WS~ layer [322]
5 to 25 IJ. thick.
4.67-4.83 Contact potential difference. Layer sub- [322]
jected to seven-hour heat treatment at
2050 -21200K.
32 Tungsten-thorium sulfide (W-ThS) 3.4 100 [219]
33 Iridium-thorium oxide (Ir-Th~) 6.2 6 X 107 [112]
34 Platinum- beryllium oxide (Pt- BeO) 1.88 4,56 X 10-6 [196]
3.94 360 [134]
35 Platinum- boron oxide (Pt- B20 S) 4.51 13,2 [134]
36 Platinum- magnesium oxide (Pt- MgO) 3.19 1.1 X 10-5 [196]
3.31 1.02 X 10 3 [134]
37 Platinum-aluminum oxide (Pt-A~03) 3.00 2,09 X 10-5 [196]
3.90 16.2 [134]
38 Platinum-silicon oxide (Pt-Si~) 4.75 12.3 [134]
39 Platinum-calcium oxide (Pt-CaO) 2.52 129 [134]
3.33 249 [196]
40 Platinum-scandium oxide (Pt-Sc20S) 3.52 13.5 [134]
41 Platinum-titanium oxide (Pt-Ti02) 4.24 2.04 [134]
42 Platinum-ferric oxide (Pt- F~03) 3.82 1.16 X 10-2 [196]
130
co::
> '"
....;aQ
(J) ....
s.
~ '" (J)bO
.3 u::::'.,
No. S ubstr ate-m aterial .... Remarks References
u ~
0 ...
~
.2 {j E
u
.2:;:
~
..:>::
....
0 u
~ e:::
.~ ~
.~
131
No. Substrate-material Remarks References
132
No. S ubstr ate-material Remarks References
133
No. Substrate- material Remarks References
134
No. Substrate-material Remarks References
135
EMISSION CONSTANTS OF THORIUM OXIDE CATHODES [198.199]
Richardson constant A.
No. Type of cathode Work function cpo eV in A/cm2 . (deg K)2 References
I
9 W - Ba, pressed 1400 1 Smooth
1550 5 Smooth [ 415]
10 Th02 , sintered on tantalum 1950 2 10 Smooth
137
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150
PUBLISHER'S NOTE
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