Chapter 11

Electronic Troubleshooting
Chapter 11
Digital Systems
Digital Systems
Key Aspects
Analyzing large systems based upon info in system
diagrams
Topics covered
Understanding Digital Systems
Bus-oriented Systems
Problems in digital systems
Troubleshooting Digital Systems
Testing and Troubleshooting Microprocessor systems
Key Aspects
Most digital and
computer (microprocessor
or micro-controller)
controlled systems can be
represented by a block
diagram similar to the one
on the right
Example System
Simple Interval Counter
Control subsystem:
Control Flip-Flop
Clock
NAND Gate regulates
control signals
Input Subsystem
Reset, Start, & Stop
switches
Arithmetic Subsystem
Tree 7490s arranged in a
multistage counter
Example System
Simple Interval Counter
Output
7-Segement displays ,
drivers , and input signals
Memory
Lacks this subsystem
Testing notes
If the subsystem inputs and
outputs are known
Subsystems operation
testable using I/O values
Characteristics
Bus Symbols on diagrams
Arrow with a diagonal line and the
number of connected lines
Replaced 7 lines between the 7447 IC and
the 7-Seg display
Busses structures require multiple
devices to use circuits (lines) in a bus
as Inputs & Outputs
Can cause significant problems
Example: Gate 1 tries to pull
point X to a logic 1 and Gate 2 tries to put
it at a logic 0 Indeterminate result
Characteristics
Replace the gates driving
lines of a Bus with gates that
use external pull-up resistors
Example 7401 NAND Gates
w/external pull-up resistors
The previous using these types
of gates resolves to the gate
putting out a logic 0 controls the
line
Bus Example
Both X and
W inputs
drive the lines
of th bus
4-bit data
bus
Lines b0 bf
Drives
multiple
gated outputs
Y & Z
Tristate Outputs
Better solution
Has the faster rise time of
the Totem Pole outputs
Has 3 states : High, Low,
High Impedance
Operation
The added diode D1 will
ground out the collector or
Q2 and the base of Q3
Q2 and Q3 are off
No current through R3 and
Q4 is off
Equivalent Circuit lower
left
Tristate Outputs
Example Circuit
Address Bus
Used to select ICs , memory locations, multi-line
Tristate inverters or buffers (same as inverters but no
inversion of levels), etc
Three binary address lines select one of eight outputs
A way to select a bank of tristes to activate
Address Decoder
circuit
Three lines on a 8-bit
address bus is used
to activate one of up-
to eight banks of
tristates
Controlling the
writing data to
another Bus
Typical circuit in Bus
based systems
Microcomputers,
micro-controllors, etc
Typical Problems covered
Ringing and Reflections
Power Supply Glitches
Changes in Layout, Components, and
Temperature
Caused by long interconnecting lines
As the interconnection lines length becomes significant
to the wavelength or the signal frequency
Load, source and transmission line impedance mismatch
can lead to signal reflections and distortions
Reflected waves interfere with new signals on the same
line
May be in or out
of phase with the
new signal
End Result: the
refection combines
with the signal
forming a new third signal.
Distortion call also occur on long interconnecting
lines due to the different impedances seen by
different components of the square wave placed
on the lines
All interconnecting lines have distributed
capacitance and inductances
The longer the lines the more the significant the
distributed components
Square waves have been analyzed as consisting of
a large collection of signals with a large range of
frequencies with differing amplitudes
They react to long transmission line according to that
analysis
Square waves have been analyzed - continued
Higher frequency component waveforms suffer more
attenuation than lower frequency waveforms
Thus more distortion
Noise pick-up and crosstalk
Longer lines form better antennas to pick-up external
signals/noise
Longer lines form better antennas to pick-up internal
signals from nearby lines caring other signals - aka
Crosstalk
Power Supply Glitches
Sudden changes in current draw by one of several
components in a parallel connection to a
regulated power supply can cause a voltage glitch
Caused by the voltage developed across the distributed
inductance of the line supplying the power
Very short duration only as long as the current draw is
changing
Voltage spike per the following:
See Example
di Problem 11-1 on
vL L ' page 320
dt
vL VoltageDevelopedAccrossInduc tan ce
L Induc tan ce Henries
di Rate of Change of Current Amps
dt Second
Power
Supply
Glitches
Solution
Below:
Ground Plane caused problems
A large shared ground plane (as shown in the
previous examples)
Large current draws can lead to ground level fluctuations
and related problems
Best cure is at design time
Provide each part of the circuit its own path to ground
Thus minimizing the sharing of problems
See Figure 11-14 on page 321
Same steps as for an analog system
Understand the circuit operation
Apply typical inputs
Successively split the system into smaller and smaller
sections.
Look for circuits that have good inputs and abnormal
outputs
Start at the approximate middle between inputs and
outputs
Sample circuit is analyzed
A frequency Counter
A frequency Counter
Pages 324
and 325
How it works (see page 325)
Signal to be measure is feed into the Squaring Block
TTL compatible square wave comes out
Before the start of a measurement the control circuit resets
all the counters
Then the squared input signal goes through the gate for 1
second COUNT-NOT pulses
At the freq of the input
COUNT-NOT pulses are feed to the counters for 1 second
Gate is disabled to stop the counting after one second
Counters hold the count of the number of input pulses
that occurred during the 1-second measurement period
Then a store pulse is feed the Latches enabling the storage
of the count that was on the output pins of the counters
The latches feed the BCD to 7-Segement drivers which drive
the displays
The clock is a 555 chip and the output from pin 3 is a
rectangular waveform that has a pulse width of 1 second
Calibrated by adjusting pot R1
The falling edge of the Clock (555 chip -pin 3 ) triggers the
one-shot output from pin 13 of chip 74221
100sec pulse set by R3-C2
Enables the latches to read the output pins of the
counters
The falling edge of the Latch enable one-shot pulse enables
another one-shot output from 74221 pin 5
Pulse resets the counters
The count of pulses stored in the latches represents the
frequency of the input signal since they only count during
the one second measurement period
Timing diagram on page 327 of the textbook
Troubleshooting the sample circuit
Inject a testing signal of a few hundred Hz
Watch the displays
Normal operation is obvious
Troubleshooting the sample circuit
Watch the displays
Indications of the source of abnormal operation can also be
discerned from the displays.
If the least significant digit is operating correctly and the
second and third arent
All the Input, timing & control circuitry is working, also ICs 7,
10, and 13 must also be functional - check the IC supporting
the other displays
If none of the displays are functioning normally
Go to the middle of the circuit. Check the outputs of IC 7
If good split the remaining part of the circuit and test again. etc
Troubleshooting flow chart on page 328
Large scale Integrated IC version on page 331
Testing and Troubleshooting
Microprocessor systems
Very common to find microprocessors,
microcontrollers, Programmable Logic
devices in circuits
Scandalized designs that can be varied to meet a
situation by changing the program in the device
i.e., first circuit that input buttons on a WMS Bluebird Slot
Machine is a PIC microcontroller
Programmed to de-bounce input button activations
Some items can be checked even without a complete
understanding of such a system.
First Step understand the system
Sample system - MC6800 Microprocessor single board
system - See Figure 11-25 on page 333
Sample System - MC6800 continued
Has all the subsystems shown in Figure 11-1 on page 309
MC6800 chip contains the control and arithmetic functions
74LS244 chip contains the Input circuits
Tristate octal input buffer
Connects external inputs to the data bus when enabled
Pins 1G and 2G are active Low
Output data leaves through the octal buffer 74LS373
2716 is EPROM that holds the system program(s)
8 data bits
Sample System - MC6800 continued
RAM - two 2112 ICs
4 data bits
Need two for a byte of data
Chip Select Circuit
74LS155 4 to 1 decoder
2- address lines are used to select one of four ICs (A15 and
A12)
A12 = 0 and A15 = 1 selects output 2Y2
A12 = 0 and A15 = 0 selects output 2Y0
Simple tests w/out maintenance
programming and special test equipment
Usually the major components are in sockets and can
be removed
Remove them an test surface mounted circuits that are
isolated
On the sample circuit the MPU, RAM and EPROM can be
removed
Obvious circuit to test is the clock
On Sample: Pins 01 and 02 of the MC6875 and MC6800
chips
Next check the Chip select circuits
set MC6800 address pins A12 & A15 and check CE-NOT
pins on the other chips
Simple tests w/out continued
Major components removed - continued
Check the input buffers by using external data settings and
the appropriate address settings for A12 & A15
Read the inputted data at the data lines for any of the
removed ICs
Continue with all the supporting circuits that can be directly
tested.
Any inverters and gates can be tested using a logic probe
and digital pulser
Retest with some or all the major components in place

Chapter 11

Transféré par

Informations du document

Copyright

Formats disponibles

Partager ce document

Partager ou intégrer le document

Options de partage

Avez-vous trouvé ce document utile ?

Ce contenu est-il inapproprié ?

Droits d'auteur :

Formats disponibles

Chapter 11

Transféré par

Droits d'auteur :

Formats disponibles

Electronic Troubleshooting

Vous aimerez peut-être aussi