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ABSTRACT
A comprehensive experimental investigation of XLPE and its nanocomposite with fumed
silica (SiO2) has been performed by CIGRE Working Group D1.24, in cooperative tests
conducted by a number of members; covering materials characterization, real and
imaginary permittivity, dc conductivity, space charge formation, dielectric breakdown
strength, and partial discharge resistance. The research is unique, since all test samples were
prepared by one source, and then evaluated by several expert members and their research
organizations. The XLPE used for preparation of the nanocomposites was a standard
commercial material used for extruded power cables. The improved XLPE samples, based
on nanocomposite formulations with fumed silica, were prepared specifically for this study.
Results of the different investigations are summarized in each section; conclusions are given.
Overall, several important improvements over unfilled XLPE are confirmed, which augur
well for future potential application in the field of extruded HV and EHV cables. Some
differences/discrepancies in the data of participants are thought to be the result of
instrumental and individual experimental technique differences.
Index Terms Nanocomposite, XLPE, fumed silica, nano filler, characterization,
dielectrics, electrical insulation, dielectric performance, cooperative test
Plaque samples were removed from the press and cooled to 3 MATERIAL CHARACTERIZATION
room temperature.
3.1 SEM AND TEM OBSERVATION
2.2 HEAT-TREATMENT OF AS-RECEIVED SAMPLES The distribution of filler particles was examined by scanning
FOR REMOVAL OF CROSS-LINKING BY-PRODUCTS electron microscopy (SEM). For such materials, the optimum
The three XLPE materials used for cooperative tests are approach to a full morphological study would involve
shown in Table 2.1. XLPE stands for cross-linked microtomy, permanganic etching, replication and examination
polyethylene. Nominal thickness of all samples of such in the TEM (transmission electron microscope). However,
materials is 1 mm. Samples 1, 2 and 3 were provided by the since the principal objective of this study is to explore the
Dow Chemical Company, while samples H1, H2 and H3 were distribution of the filler rather than to explore both this and
heat-treated in each laboratory of the participants after they the morphology of the XLPE SEM examination was used in
received original samples. place of the much more difficult and costly option of TEM.
XLPE contains little in the way of large-scale morphological
Table 2.1. XLPE and XLPE nanocomposite specimens of 1 mm thickness features, as shown in Figure 3.1.
prepared for tests.
Name Material
Sample 1 Base XLPE
Sample 2 XLPE filled with 5 wt% non-functionalized
silica nano filler
Sample 3 XLPE filled with 5 wt%
functionalized silica nano filler
Sample H1 Heat-treated Sample No.1.
See conditions in Table 2.2.
Sample H2 Heat-treated Sample No.2.
See conditions in Table 2.2.
Sample H3 Heat-treated Sample No.3.
See conditions in Table 2.2.
Table 2.2. Vacuum heat treatment conditions for as-received XLPE and
XLPE nanocomposites samples.
(a)
(a)
(b)
Figure 3.3. SEM micrographs of etched surfaces of the XLPE containing the
treated nano filler (Sample 3).
Endothermic
surprising and is most likely related to some
polymer/nanofiller interaction. 100 min Annealing
30 min Annealing
10 min Annealing
0 min Annealing
0.10
0.05
0.00
-0.05
Figure 3.4. DSC melting traces of the three material systems, as received.
-0.10
During the peroxide crosslinking process, small molecular 40 60 80 100 120
by-products are generated, which should be removed prior to o
analysis of the samples. While this can be readily achieved by Temperature / C
thermal treatment in vacuum, such a process also has the (b)
Figure 3.5. DSC melting data showing the effect of annealing on the lamellar
potential to affect the morphology of the polymer. population of the unfilled XLPE sample (Sample H1): (a) DSC melting traces
Consequently, a series of cyclic annealing experiments were (b) heat flow difference traces obtained by subtracting the melting endotherm
conducted to explore the extent and kinetics of annealing. obtained with no annealing from that of each of the annealed specimens.
Figure 3.5a shows that annealing the unfilled XLPE at 60 C Figure 3.5b shows that the magnitude of the annealing peak
(Sample H1) results in the formation of a shoulder at ~70 C, increases monotonically with annealing time in an
which progressively increases in size with annealing time; approximately logarithmic manner. While it is difficult to
from this figure, it would appear that the majority of annealing envisage this continuing indefinitely, the above clearly
is complete within about 60 min. However, subtracting the indicates that this process continues for an extended period of
melting curve obtained from the non-annealed sample (Sample time. However, the fraction of material that is affected is
1) from each subsequent melting trace reveals a rather relatively small, suggesting that such annealing protocols do
different picture. not have a major influence on the morphology of the polymer.
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1489
Abundance
2 1.5
Acetophenone Butylated Hydroxytoluene
Abundance
D-methylstyrene
1.5 1
Butylated Hydroxytoluene
0.5
1
Tetradecane
Acetophenone 0
0.5 11 12 13 14 15 16 17 18
Time [min]
0
11 12 13 14 15 16 17 18
Time [min] (a) As-received Nano-Filled XLPE (Sample 2)
(a) As-received XLPE (Sample 1)
[u105] 2.5
[u105] 2.5 2
D-methylstyrene
D-methylstyrene
Abundance
2
1.5 Butylated Hydroxytoluene
Abundance
1 0.5
Acetophenone
0.5 0
11 12 13 14 15 16 17 18
0 Time [min]
11 12 13 14 15 16 17 18
Time [min] (b) Heat-treated Sample H2 (60 C) (Sample H2)
(b) Heat-treated XLPE (60 C) (Sample H1)
[u10 ] 2.5
5
[u105] 2.5
Butylated Hydroxytoluene Butylated Hydroxytoluene
2
2
Abundance
Abundance
1.5
1.5
1
1
0.5
0.5
0
0 11 12 13 14 15 16 17 18
11 12 13 14 15 16 17 18 Time [min]
Time [min]
(c) Heat-treated Sample 2 (80 C) (Sample H2)
(c) Heat-treated XLPE (80 C) (Sample H1)
Figure 3.7. Gas-chromatography spectra for XLPE filled with non-
Figure 3.6. Gas-chromatography spectra for unfilled XLPE. functionalized nano filler.
1490 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
[u10 ] 2.5
5
Butylated Hydroxytoluene
2
Abundance
1.5
Intensity
0.5
0
11 12 13 14 15 16 17 18
Time [min]
(c) Heat-treated Sample 3 (80 C) (Sample H3)
Figure 3.8. Gas-chromatography spectra for XLPE filled with functionalized
nano filler.
Gas-chromatography spectra were obtained for three kinds 3000 2500 2000 1500 1000 500
of XLPE to clarify how heat treatment influenced remaining Wavenumber Shift / cm-1
by-products. Results are shown in Figures 3.6, 3.7 and 3.8. It
is evident that as-received XLPE samples (Samples 1, 2 and (a) Unfilled XLPE (Sample 1)
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1491
sub-micrometer range.
(2) There is no change in polymer morphology or
crystallinity due to nano filler addition to XLPE according
to DSC measurement. But it was clarified that XLPE
nanocomposites (Samples 2 and 3) melt at a slightly
lower temperature (102 C) than base XLPE (Sample 1)
(104 C). This suggests that nanoparticles will suppress
the formation of crystalline order as a result of
polymer/nanoparticle interactions.
(3) It was elucidated from the gas-chromatography spectra
that cross-linking residues diminish by heat treatment at
3000 2500 2000 1500 1000 500 80 C for a week in vacuum, while some might remain by
Wavenumber Shift / cm-1
heat treatment at 60 C for a week.
(4) It is generally considered that nano particles leave from
(b) XLPE with non-functionalized nanoslica (Sample 2)
their matrix polymer if a polymer nanocomposite is
Figure 3.9. Confocal Raman spectra acquired from PD aged specimens of
unfilled XLPE (Sample 1) and XLPE containing non-functionalized nano subjected to partial discharges (PDs), and then tend to
silica (Sample 2). accumulate on the surface of the nanocomposite. In the
case of XLPE, the existence of such silica products was
Figure 3.9a shows a selection of Raman spectra acquired not confirmed at least by the Raman spectroscopy.
from different points on a PD aged sample of unfilled XLPE.
The bottom two spectra contain the expected polyethylene 4 PERMITTIVITY AND DIELECTRIC LOSS
peaks below 1000 cm-1, plus some additional features around
500 cm-1, which can be associated with oxygen-containing Complex dielectric permittivity consists of the real ' and
species such as O-C=O (deformation mode at 629 cm-1) and the imaginary '' parts (both frequency dependent, and the
C-C-O (symmetric stretching mode at 595 cm-1) [130]. dissipation factor, tan (4.2), is a ratio of the two parts as
represented by the formulas (4.1).
Similar features were previously observed in samples of
polyethylene that contained a cavity within which partial (4.1)
discharge activity has occurred [131] and in degradation
residues formed through electrically-enhanced polymer (4.2)
degradation reactions when conducted in air [132]. The upper
two spectra are, however, very different in that they show no If permittivity measurements are performed in the frequency
evidence of features associated with polyethylene. Both of domain, the conductivity losses are also taken into account in
these spectra are dominated by fluorescence, the lower one the total measured losses, that is, tan = + / . When
also weakly showing the D and G bands of disordered sp2 tends to 0, the major contribution to losses is given by
hybridized carbon. These two spectra therefore contain the conductivity. The is a contribution factor from conduction.
characteristic features previously seen in electrical trees grown An electrode system consists of 10 50 mm upper electrode
in polyethylene [133]. Figure 3.9b shows equivalent data with 1 mm thick specimen electrically stressed usually at 1-
obtained from the nanocomposite containing the 15Vrms. Higher voltage such as 140 and 150 V were used in
unfunctionalized filler; the specimen containing the some cases.
functionalized filler gave equivalent results and, as a result, Heat treatment in vacuum was conducted to remove cross-
these are not included here for the sake of brevity. linking by-products and moisture to lead to proper acquisition
Comparison of sub-figures (a) and (b) of Figure 3.8 reveals of data in nature. The relative permittivity is between 2.2 and
that the same features are present in both; certainly, there is no 2.3 [134] for low density polyethylene, while it must be
clear evidence for an accumulation of nano silica on the slightly larger than this value, around 2.4, for XLPE.
surface of the aged nanocomposite. This is not to say that this
does not occur but, rather, that any accumulation is Experimental results from each research institute are shown
insufficiently great for it to be distinguishable from polymer in Sections 4.1 to 4.5 below.
1492 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
4. 1 EXPERIMENT 1
(a) Frequency dependence of real permittivity (a) Frequency dependence of imginary permittivity
(b) Frequency dependence of real permittivity (b) Frequency dependence of imginary permittivity
The measurements were performed by using IDA 200 (7) There is a small difference in the imginary permittivity
dielectric spectrometer operating within the frequency of XLPE with 5 wt% unfunctionalized silica nano filler
range 10 -4 - 10 3 Hz. The samples were places between and XLPE with 5 wt% functionalized silica nano filler.
contact electrodes in a Keithley 8009 test fixture and the The former seems to be little lower in the low frequency
applied sinusoidal voltage was 144 V rms. Repeatability of region, and a little bit higher in the high frequency
the data was checked in two sets identical experiments, region than the latter.
where the first one was done directly after the thermal
Prior to the above described experiments, the following
treatment and the second one a week later.
two series of experiments were carried out. One was to
Figures 4.1 and 4.2 show the frequency dependence of clarify the effects of heat treatment (at 60 C for a week) and
the real and imaginary parts of dielectric permittivity, the other was to investigate the temperature dependence of
respectively, as measured on 1 mm thick XLPE samples permittivity. In the case of unfilled XLPE, not much
with the contact electrodes. The data shown are for difference was noticeable between original and heat-treated
unfilled XLPE (Sample H1), XLPE with 5 wt% samples, neither in real nor imaginary parts of the
unfunctionalized silica nano filler (Sample H2) and XLPE permittivity.
with 5 wt% functionalized silica nano filler (Sample H3).
The values obtained in this experiment for real It was found that the heat treatment caused in XLPE
permittivity are about 2, which are smaller than the nanocomposites a large reduction in real permittivity below
hypothetical level of 2.4, probably because of the use of 1 Hz, and in imaginary permittivity in the whole range of the
contact electrode system. Nevertheless, comparison frequencies as measured. The initial monotonically
among three kinds of XLPE samples can easily be made. increasing character of real permittivity with decreasing
It is recognized that there is no difference in real frequency, as seen below 1 Hz, for both kinds of XLPE
permittivity and a slight decrease in imaginary nanocomposites turned into a weakly varying dependence.
permittivity for the data obtained directly after and one XLPE with 5 wt% functionalized silica nano filler showed
week later following the heat treatment, as comparing the however larger valuses than those for XLPE with 5 wt%
two sets of the measurements. unfunctionalized silica nano filler. They respectively were
equal to 2.44 and 2.36 at the frequency of 10-4 Hz before the
Distinct features observed after the heat treatment are as heat treatment, while they became reduced to 2.10 and 2.04
follows: after it. Simultaneously, a clear interfacial polarization peaks
in the imaginary permittivity of the two XLPE
(1) Unfilled XLPE (Sample H1) exhibits almost the same
nanaocomposites shifted to much lower frequencies
real permittivity over the whole measured frequency
following the heat treatment. The peak maximum moved
range from 10-4 to 103 Hz, e.g. 1.99 - 1.98, while the two
from ~ 5 x 10-2 to the range below 10-4 Hz. This
kinds of XLPE nanocomposites (Sample H2 and Sample
modification is considered to result from the removal of
H3) indicate an increase at the low frequencies, most
residual moisture and cross-linking by-products, whereas the
probably caused by interfacial polarization.
small differences observed between the two different XLPE
(2) The trend that the permittivity increases with the nanocomposites may indicate that the functional fillers tend
decrease of the frequency in the low frequency region is to adsorb the cross-linking residues.
in XLPE with 5 wt% unfunctionalized silica nano filler
Investigations of the temperature dependence of real and
less noticable than in XLPE with 5 wt% functionalized
imaginary permittivity were performed at 22, 45 and 70 C
silica nano filler.
for the heat treated samples. Real permittivity of unfilled
(3) The steady permittivty value is lower (e.g. 1.90 at 1 XLPE decreases with the increase of temperature within a
kHz) in XLPE with 5 wt% unfanctionalized silica nano few % in the whole frequency ragnge from 10-4 to 103 Hz. In
filler and higher (e.g. 2.03 at 1 kHz) in XLPE with 5 the case of XLPE nanocomposites, it similarly showed a
wt% functionalized silica nano filler than (e.g. 1.98 at 1 negative temperature dependence in the high frequency
kHz) in unfilled XLPE. range from 10-2 to 103 Hz.
(4) The level of imaginary permittivity (losses) is much On the contrary, an opposite temperature dependence
larger in XLPE nanocomposites than in unfilled XLPE. appeared in the low frequency range from 10-2 to 10-4 Hz, i.e.
real permittivity tend to increase with the increase of
(5) Imaginary permittivity in unfilled XLPE is as low as
temperature. It became largest at 70 C at 10-4 Hz.
around 10-4 and shows an unusual discontinuity at
Furthermore, it has to be noticed that XLPE with 5 wt%
around 1 Hz, which is attributed to the instrumental
functionalized silica nano filler exhibited larger permittivity
limits at this low loss level.
valuses than XLPE with 5 wt% unfunctionalized silica nano
(6) Imaginary permittivity shows a similar trend in both filler. At the same time, imaginary permittivity increased
XLPE with 5 wt% unfunctionalized silica nano filler and with the increase of temperature for all the three kinds of
in XLPE with 5 wt% functionalized silica nano filler. XLPE materials, as its frequency dependence curves are
Their values lie in the range between 10-1 at the lowest shifted up to higher level, except for the minimum regions
frequency and 10-3 at the upper frequency range. around 10 to 102 Hz.
1494 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
Figure 4.3. Frequency dependence of the real and imaginary permittivities for
unfilled XLPE (Sample H1), XLPE with 5 wt% silica nanofiller (Sample H2)
and XLPE with 5 wt% functionalized silica nanofiller (Sample H3) after heat
treatment at 60C for a week.
Note that the loss tangent, tanG = H/H.
4. 3 EXPERIMENT 3 4. 4 EXPERIMENT 4
2.38
2.37 Sample H1
Sample H2
2.36 Sample H3
2.35
Real Permittivity H'
2.34
2.33
2.32
2.31
2.30
2.29
2.28
-4 -3 -2 -1 0 1 2 3 4 5 6 7
10 10 10 10 10 10 10 10 10 10 10 10
Frequency (Hz)
(a) Frequency dependence of real permittivity
(a) Frequency dependence of real permittivity
(b) Frequency dependence of imginary permittivity (b) Frequency dependence of imginary permittivity
Figure 4.6. Frequency dependence of real and imaginary permittivity (20 C)
Figure 4.7. Frequency dependence of real (a) and imaginary (b) permittivity
of unfilled XLPE (Sample H1), XLPE with 5 wt% silica nano filler (Sample
of unfilled XLPE (Sample 1 and Sample 1H), XLPE with 5 wt% silica nano
H2) and XLPE with 5 wt% functionalized silica nano filler (Sample H3) after
filler (Sample H2) and XLPE with 5 wt% functionalized silica nano filler
heat treatment at 60 C for a week.
(Sample H3) in a low frequency region.
treatment, as recognized from the curves for Sample 1 and with and without heat treatment (Samples 1, 2, 3, H1, H2
Sample 2 (Sample 2 data not shown in this figure). The former and H3). It was also confirmed in this case that heat
exhibits larger real permittivity than the latter. Imaginary treatment at 80 C for 1 week leads to a reduction of
permittivity is large for unfilled XLPE (Sample 1), either, with permittivity. As far as real permittivity for Samples H1, H2
a peak at about 5 x 10-4 Hz, as this trend is recognized in and H3 is concerned, as shown in Figure 4.8, it is almost
Figures 4.3 and 4.5. The heat treatment in this experiment independent of frequency in the high frequency region from
leads much reduction in both real and imaginary permittivity. 1 to 106 Hz. It is especially to be noted that almost the same
It is recognized that much more reduction in real and data are obtained from 103 to 106 Hz as compared with data
imaginary permittivity is made in the heat treatment at 80 C from 1 to 103 Hz. Real permittivity at 100 Hz is 2.52, 2.51
than at 60 C. It is suspected that cross-linking by-products and 2.50 for Samples H1, H2 and H3, respectively. This
must still remain after heat treatmet at 60 C for a week. trend is the same with other data as shown in the high
frequency region in Sections 4.2, while absolute values are
In summary: different unfortunately.
(1) Real and imaginary permittivity is smaller for unfilled
XLPE than for both XLPE nanocomposites in the low Imaginary permittivity in Figure 4.8 shows a similar trend
frequency region. with other data of Sections 4.2 and 4.3. That is, it increases
(2) Real and imaginary permittivity is smaller for XLPE with with the decrease of frequency in the low frequency region.
5 wt% functionalized silica nano filler than for XLPE But it is different in that it has a hump at 103 Hz for filled but
with 5 wt% silica nano filler in the low frequency region. non-functionalized XLPE (Sample H2) and around 10 Hz for
filled and functionalized XLPE (Sample H3). This could be an
4. 5 EXPERIMENT 5 effect of changing temperature during the measurement. The
real part of the complex permittivity decreases with increasing
2.70
temperature. For the imaginary part of the complex
2.67 Sample H1 permittivity no distinctive behavior could be observed.
Sample H2
2.64 Sample H3
In summary:
Real Permittivity H'
2.61
(1) It was confirmed that heat treatment leads to much
2.58 reduction in permittivity and gives us proper values. This
2.55 reduction is significant for real permittivity at the low
2.52
frequency region. Significant change of imaginary
permittivity: loss peaks shift to lower frequencies or
2.49
diminish.
2.46 (2) Real permittivity of XLPE with modified silica is lower
10
-3 -2
10
-1
10
0
10 10
1 2
10 10
3 4
10 10
5 6
10
7
10 than of unfilled XLPE or XLPE with non-modified silica.
Frequency (Hz) (3) For frequencies above 1 Hz the imaginary permittivity
does not change significantly with the introduction of 5
(a) Frequency dependence of real permittivity wt% of nano silica, while a change is recognized for low
frequencies.
(4) In the low frequency region, XLPE unfilled (H1) and
XLPE filled with non-modified silica (H2) show
increased permittivity, which does not show up in XLPE
with modified silica (H3).
(5) Silica filled XLPE exhibits an additional loss peak:
(i) around 3 x10-2 Hz for non-modified particles
(ii) around 2 x102 Hz for modified particles
(estimated from digital data)
(6) Losses for XLPE with modified silica are the lowest
overall.
comparative study is possible. There are three influential discussion, it can be said that the real permittivity can be
factors that should be taken into deep consideration, i.e. determined by the balance of the effects from the residues
and the nano particles. The residues will increase the
(i) Cross-linking residues
permittivity, while the small amount of nano particles will
(ii) Nano filler particles decrease it. In conclusion, nanocomposite XLPE,
preferably with surface modification, will have a smaller
(iii) Coupling agents for surface modification permittivity than neat XLPE.
Table 4.1. Qualitative comparison of the real permittivity among Samples H1, In the low frequency region, there is a significant
H2 and H3. difference in the real permittivity among the three kinds of
(a) Real Permittivity in High Frequency Region. XLPE materials. It is the lowest for neat XLPE (Sample
Participants Large or Small Ranking Heat Treatment H1). Value of the real permittivity in the low frequency
Gubanski H1 < H2 < H3 60 C region is the lowest for neat XLPE (Sample H1) heat-
Bulinski H1 < H3 < H2 treated at 60 C. On the contrary, one of the data obtained
by the heat treatment at 80 C indicates that it is the lowest
Frchette H1 < H2 < H3
for XLPE nanocomposite (Sample H3). If cross-linking
Montanari ---- 80 C
residues are reduced to the minimum by a proper heat
Morshuis H3 H2 < H1
treatment, it might be possible to realize the lowest
(b) Real Permittivity in Low Frequency Region permittivity in the low frequency region.
Participants Large or Small Ranking Heat Treatment
The following conclusions on nano filler effects are derived
Gubanski H1 < H2 < H3 60 C
from the above discussion.
Bulinski H1 < H3 < H2
Frchette H1 < H2 < H3 (1) In the high frequency region, there is not much difference
Montanari H1 < H3 < H2 80 C in the real permittivity among the three kinds of samples.
Morshuis H3 < H2 < H1 (2) In the low frequency region, there is a significant
difference in the real permittivity among the three kinds
Samples are heat-treated to remove the cross-linking residues of samples.
out. But the first concern is that some of them are suspected to
remain after the heat treatment especially at 60 C. In principle, (3) In both cases, nano filler particles are considered to
such residues are considered to play a role to increase the real reduce the real permittivity, when a proper heat treatment
and imaginary permittivity, as was clarified in Samples 1, 2 is made to remove cross-linking residues.
and 3 before the heat treatment. The next concern is whether (4) Apparent increase of the real permittivity by nano filler
or not nano filler particles will interact with cross-linking addition may be caused by cross-linking residues.
residues. If there is some interaction, the nano particles will
adsorb the residues on their surfaces. Surface treatment might Table 4.2. Qualitative comparison of imaginary permittivity among Samples
act to adsorb or release the residues. It is important to analyze H1, H2 and H3.
the dielectric spectroscopy data obtained in this research by
dividing the frequency region into two, i.e. a high frequency (a) Imaginary Permittivity in High Frequency Region.
region and a low frequency region. It is difficult to clearly Participants Large or Small Ranking Heat Treatment
define the boundary between high and low frequency regions. Gubanski H1 < H3 < H2 60 C
It depends on the data obtained individually by the participants. Bulinski H1 < H3 H2
But it is safe to define that the former is above 1 kHz and the Frchette H1 < H3 < H2
latter is below 0.1 Hz. Montanari ----- 80 C
Morshuis H3 H2 < H1
Table 4.1 shows the ranking from small to large values of the
(b) Imaginary Permittivity in Low Frequency Region.
real permittivity in the high frequency region (a) and in the
low frequency region (b). Participants Large or Small Ranking Heat Treatment
Gubanski H1 < H3 < H2 60 C
In the high frequency region, there is not much difference Bulinski H3 H2 < H1
among the three kinds of samples in general, although a Frchette H1 < H3 < H2
slight difference is recognized. Under such a marginal Montanari H1 < H3 H2 80 C
condition, the real permittivity of neat XLPE (Sample H1)
Morshuis H3 < H2 < H1
is smaller than that of nanocomposite XLPE (Samples H2
and H3), when the samples are heat treated at 60 C, but The imaginary (loss) permittivity is sensitive to impurities in
such a tendency is reversed after the heat treatment at 80 C. general. In our case, the increase of this parameter must be
Therefore, if no residues remain, the real permittivity might caused by the existence of cross-linking residues and nano
decrease by the addition of nano filler. Comparing Samples particles. Surface treatment is expected to reduce the loss
H2 and H3, the surface modification may act to reduce the permittivity. Table 4.2 shows the ranking from small to large
real permittivity. Modified surfaces are considered to make values of the imaginary permittivity (dielectric loss) in the
more adsorption or release of the residues. From the above high frequency region (a) and in the low frequency region (b).
1498 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
6 SPACE CHARGE
Figure 6.2. TSM (Thermal Step Measurement) method for space charge
6.1 MEASUREMENT SYSTEM measurement.
To scope 100
Transducer
Charge density [C/m3]
40
40
cathode anode
Absorber
dB
dB
50
100 100
cathode anode anode
cathode
Charge density [C/m ]
3
3
50
0 0
-50 -50
-100 -100
-150 -150
-50 0 50 100 150 200 -50 0 50 100 150 200
Thickness [Pm] Thickness [ Pm]
(c) XLPE filled with functionalized nano filler (Sample H3) (c) XLPE filled with functionalized nano filler (Sample H3)
Figure 6.3. Space charge distributions observed at 25 oC during the Figure 6.4. Space charge distributions observed at 50 oC during the
application of a dc electric field of 100 kV/mm for smaples after heat application of a dc electric field of 100 kV/mm for smaples after heat
treatment at 80 C in vacuum for a week. treatment at 80 C in vacuum for a week.
50
distribution does not seem to be influenced by heat treatment
in this experiment (data not shown).
0
It is speculated that:
(1) Hetero space charge is formed in unfilled XLPE.
-50
(2) Homo space charge is introduced in filled XLPE.
-100 (3) Only a balance of positive and negative charges becomes
observable.
-150
-50 0 50 100 150 200 6.3 SPACE CHARGE BY PEA METHOD 2
Thickness [ Pm] The measurements were performed with a Five Labs, Ltd.,
20 kV PEA Space Charge Measurement System and Tektronix
(b) XLPE filled with non-functionalized nano filler (Sample H2) 7404, 4 GHz, 20 GS/s digital oscilloscope. The resolution of
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1501
the measurement system is ~ 17 m. All measurements were and the space charge measurements were performed in the
performed at room temperature (~ 20 1 C). PEA test cell, i.e. without any interruptions of the specimen
The measurements were conducted on 1mm thick samples assembly.
(i.e., as received from the sample provider) and on ~85 m In the case of thick samples (1 mm) not subjected to any dc
thick samples obtained by hot-pressing the original 1 mm field prior to the space charge measurements at 6 kV/mm, no
plaques. space charge is observed, as shown in Figure 6.5a. When a
field of 20 kV/mm is applied for some time and then removed,
only a small amount of a heterocharge is observed in all three
types of XLPE samples, as shown in Figure 6.5b by the
measurement under 6 kV/mm. Initially, unfilled XLPE shows
more of the charge but after 120 h all three materials show the
similar amount. This observation is relevant to the cathode
side of the samples, for which the measurement results are
more reliable than for the anode side due to a relatively weak
signals and noisy spectra. The results of heterocharge
formation seem to indicate that after one week at 60 C in
vacuum the specimens still retained some of the crosslinking
byproducts [138-140]. From the changes in space charge
distributions in all three materials with the time of exposure to
a dc field (Figure not shown here), it was concluded that: (1)
the amount of the heterocharge in the unfilled XLPE does not
change significantly between 1 h and 120 h at 20 kV/mm (at
the cathode side) and, (2) the density of heterocharge in both
nanocomposites increases gradually with time and after 120 h
(a) DC Voltage Application Time: Zero reaches the level similar to that in the unfilled XLPE.
Figure 6.6 shows space charge distributions in the 85 m
thick samples subjected to 50 kV/mm and measured at the
same, 50 kV/mm field. Only a small amount of heterocharge
extending relatively deep into the bulk of the samples could be
observed in both XLPE samples with nanofillers. The
distribution for unfilled XLPE indicates small amount of
homocharge at the cathode.
(2) Charging the samples at a field of 20 kV/mm leads to Figure 6.7 shows the space charge distribution and stored
formation of a small and comparable amounts of total charge for unfilled and filled XLPE (Samples 1, 2 and 3)
heterocharge in all three types of samples. before and (Samples H1, H2 and H3) after heat treatment at 80
(3) A 50 kV/mm field applied for 2 h generates small C for five days. The samples were subjected to an electric
amounts of heterocharge in both nanocomposites and field of 20 kV/mm at room temperature. As can be seen,
some amount of homocharge in the base XLPE. without treatment the nanofilled samples (Samples 2 and 3)
keep significant amounts of space charge (about the same of
the unfilled material, Sample 1), with mostly homocharge at
6.4 SPACE CHARGE BY PEA METHOD 3 the anode and a mix of homo and heterocharge at the cathode
(see depolarization patterns). Removal of the cross-linking
byproducts by thermal treatment reduces significantly the
space charge density. It can be speculated that homo charge
injection is likely to take place if nano filler is added. The
presence of heterocharge at the test voltage (corresponding to
the operation field) can be speculatively explained by the
presence (recently proved) ultra-fast charge packets [140,
141]; these are presumably solitons, which are associated with
the relaxation mechanisms and mechanical properties of
polymer chains. These vary with the presence of nano fillers,
so that the transport and accumulation mechanisms can
change. Heterocharge can be explained in this way rather than
the effect of crosslinking by-products, at least close to
operating stress.
In summary:
(1) Filled XLPE samples show lower space charge
accumulation than unfilled XLPE samples.
(2) The lowest space charge amount is obtained when nano
filler is surface-treated.
(3) Thermal treatement reduces space charge particularly for
filled XLPE samples.
(a)
(b)
Figure 6.8. Space charge distributions (a) in Samples H1, H2 and H3
subjected to the moderate electric field 30 and 40 kV/mm after heat treatment
at 80 C for 12 h, and space charge distributions (b) in an XLPE sample under (b) Electric field at cathode
high dc electric field.
(a) Electric field at anode (3) The same observation can be obtained for the remaining
total charge. That is, the charge increases as the electric
field is increased from 5 kV/mm. It is much reduced when
XLPE is filled with nano filler. There is some exception
for XLPE filled with functionalized filler at 30 kV/mm.
Figure 6.9 shows the remnant electric fields at anode and (1) Filled XLPE seems to accumulate less space charge than
cathode and remaining summed (total) charge for three kinds unfilled XLPE.
of XLPE samples as a function of the electric field up to 30 (2) XLPE filled with functionalized filler exhibits the lowest
kV/mm. The following things can be derived from the figure. electric field of all.
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1505
(3) Double injection seems to take place in the case XLPE 7 DIELECTRIC BREAKDOWN
filled with functionalized filler. Compensation of negative and
positive charge might take place during a long time in poling. 7.1 AC BREAKDOWN STRENGTH 1
In summary:
(1) Heterocharge is formed for unfilled XLPE.
(2) Hetrocharge reduces by the addition of nano filler.
(3) Homocharge is comparatively easy to be injected into
filled XLPE. Figure 7.2. Histogram of AC breakdown strength of unfilled XLPE and filled
(4) Charge compensation takes place when nano filler is XLPE with (a) the scale parameter and (b) the shape parameter.
added. AC dielectric breakdown strength tests were performed by
(5) Charge packet appears at the extremely high electric field means of a test cell with 2 spherical electrodes (diameter 30
near breakdwon. But no nano filler effct was clarified in mm) in silicone oil at room temperature (Figure 7.1). Applied
this experiment. voltage was raised at the rate of 30kVrms/min. Data were
1506 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
obtained in the form of two parameters of the Weibull Samples were heat-treated at 60 C in vacuum for 8 days. Ac
distribution, i.e. the scale parameter and the shape parameter. (60 Hz) breakdown tests were carried out in silicone oil with
They represent the breakdown strength [kVrms/mm] and the plane/plane electrodes (6.4 mm) using a cell as shown in Figure
data scatter , respectively. 7.3. Applied voltage was increased at the rate of 500 Vrms/s.
About 40 of breakdown measurements were made on each of
Figure 7.2 shows ac breakdown strength of unfilled XLPE
the 3 samples (~1 mm thick), and outliers of data were removed
and filled XLPE with (a) the scale parameter and (b) the shape
from statistics. Flashovers were treated as suspended data.
parameter of Weibull distribution. From comparison of the
Figure 7.4 shows ac breakdown strength of unfilled XLPE and
scale and shape parameters experimentally obtained, results
filled XLPE in Weibull distribution. From comparison of ac
can be summarized as follows:
breakdown strength (63.2% value) among three kinds of XLPE
(1) Neither nano filler addition nor surface treatment of nano samples, following results can be derived.
filler raises much of ac breakdown (BD) strength in the
(1) There is no striking effect of nano filler on the change of
case of XLPE samples provided this time.
ac breakdown strength.
(2) Both nano filler addition and surface treatment of nano
(2) Addition of functionalized nano filler seems to cause only
filler would work to reduce BD data scatter.
a slight increase by 2 % to unfilled XLPE.
(3) Heat treatment seems to increase ac breakdown strength
(3) Inversely, addition of non-functionalized nano filler seems
by a few % for nano filled XLPE samples.
to cause a slight decrease by 5 % to unfilled XLPE.
(4) Highest ac breakdown strength was obtained with XLPE
(4) Highest ac breakdown strength was obtained with XLPE
filled with functionalized nanofiller after heat treatment.
filled with functionalized nanofiller after heat treatment.
7.2 AC BREAKDOWN STRENGTH 2 7.3 IMPULSE BREAKDOWN STRENGTH
Figure 7.6. Impulse breakdown voltages for three kinds of XLPE samples.
Figure 8.2. Evolution of PD erosion depth (a) and PD erosion area (b) with
aging time for Samples H1, H2 and H3.
(a)
1508 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
Figure 8.3. Average erosion speed for three kinds of XLPE (Samples H1, H2
and H3).
(a) Erosion depth
An electrode system as shown in Figure 8.1 was used for
partial discharge (PD) aging. Voltage 10 kVrms (250 Hz) was
applied to three kinds of XLPE samples of 1 mm thickness for
time up to 750 h (50 Hz equivalent time). Applied voltage
corresponds to 5 times PD inception threshold.
Two types of erosion data were obtained, i.e. erosion pit
depth and cross-sectional area of a formed pit. Their temporal
change is shown in Figure 8.2 obtained for 2 specimens for
each material. Average progressing speed for the cross-
sectional area is shown in Figure 8.3. Following observations
can be derived from these figures.
(1) Nano-filled XLPE exhibits much improved endurance to
PDs than non-filled XLPE.
(2) In particular, the best performance is possessed by XLPE
filled with surface-treated filler.
(b) Eroded volume
8.2 PD EROSION 2 Figure 8.5. PD erosion depth (a) and PD erosion volume (b).
(b) Profile of eroded area From these data, the eroded volume was calculated in an area
of 5 mm around the center of the rod electrode, as shown in
Figure 8.4. Electrode of 6 mm diameter (Similar to IEC (b) Electrode) for
surface erosion by PDs (a) and a profile of eroded area (b). Figure 8.4b. As a second value to describe the depth of the
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1509
(3) No measurable amount of cross-linking residues exist in function is considered to reduce impurities and thereby
the case of the heat treatment at 80 C for a week, while heterocharge. Furthermore, it was proposed elswhere that
some of them are suspected to remain in the case of the homocharge is easier to be injected into filled XLPE than to
heat treatment at 60 C for a week, unfilled XLPE. In the latter case, charge compensation takes
place when nano filler is added. Charge packet appears at the
9.1 PERMITTIVITY AND DIELECTRIC LOSS extremely high electric field near breakdown. This can be
There are some effect cross-linking residues on permittivity suppressed by nano filler, but no nano filler effect is clarified
and dielectric loss in the case of the heat treatment at 60 C, in this experiment.
while no such effects are recognizable in the case of the heat 9.4 DIELECTRIC BREAKDOWN STRENGTH
treatment at 80 C. This observation is in a good agreement
with the results obtained by DSC and CG/Mass spectroscopy It was found that there is no significantly positive effect of
measurement. Permittivity and dielectric loss can be analyzed nano filler on the change of ac and impulse breakdown
in two distinct frequency regions, i.e. the low frequency region strength. But the highest ac and impulse breakdown strengths
and the high frequency region. Permittivity and dielectric loss were obtained for filled XLPE with surface-modified nano
in the low frequency region is mainly related to electrical filler, although the difference is not so marked.
conduction and slow-orientation components of dipoles, and 9.5 PD RESISTANCE
those in the high frequency correspond to electronic
polarization and fast-orientation components of dipoles. It was found that PD resistance of XLPE can be significantly
improved by nano filler addition. The surface modification
As for permittivity, the following conclusions are derived. In nano filler particles will further improve PD resistance.
the high frequency region, there is not much difference in
permittivity among unfilled XLPE, filled XLPE with and 9.6 CROSS ANALYSIS
without surface modification. On the contrary, in the low
Cross-linking residues were first evaluated by material
frequency region, there is a significant difference in
characterization with DSC and GC/Mass Spectrometry. Heat
permittivity among the above three kinds of samples. In both
treatment at 80 C for a week is appropriate enough to
cases, nano filler particles are considered to reduce the
measure dielectric properties. This was verified by a series of
permittivity. Apparent increase of the permittivity by nano
dielectric property measurement. SEM observation clarified
filler addition may be caused by cross-linking residues.
that prepared filled XLPE samples include 5 wt% nano silica
As for dielectric loss, the following conclusions are derived. particles ranging 300 nm to 30 Pm in size with their
In the low frequency region, it is not decisive which is less macroscopic homogeneous dispersion. Even if size
lossy, unfilled XLPE or filled XLPE. But the dielectric loss of distribution is relatively large, nano filler included in XLPE
unfilled XLPE seems to be smaller than that of filled XLPE. are effective for some of dielectric performances. Surface
In the high frequency region, it is possible to postulate that modification of nano filler particles also adds a further
nano particles will reduce the loss, although the residues will improvement in dielectric properties, although the state of
increase it. Furthermore, the functionalized nano filler will interfaces between nano filler particles and XLPE matrices
work to reduce the dielectric loss in the both low and high cannot be investigated by the present characterization
frequency regions. In the low frequency region, the dielectric techniques.
loss must be sensitive to the amount of the residues, even if
Permittivity and dielectric loss, dc conductivity, space charge,
they are small in content. Values of the loss might be
dielectric BD strength and PD resistance were evaluated for
determined by a balance of roles between nano filler particles
unfilled XLPE and filled XLPE. It is difficult to discuss them
and cross-linking residues.
with data of material characterization in this research, because
9.2 DC CONDUCTIVITY only limited information is available. We just know that we
used filled XLPE samples include 5 wt% nano silica particles
Nano filler acts to significantly reduce dc conductivity in
ranging 300 nm to 30 Pm in size with homogeneous
XLPE. Surface modified nano filler additionally reduces dc
dispersion as nanocomposites for evaluation, and that cross-
conductivity. Since dc conductivity corresponds to the
linking by-products can be removed by a proper heat treatment.
dielectric loss at very low frequency, then performance of dc
conductivity should be correlated with that of the low Permittivity and dielectric loss, dc conductivity, space charge,
frequency dielectric loss. But unfortunately they are not in dielectric BD strength and PD resistance are not
good agreement. It is because the performance might be interdependent. Dielectric permittivity (real and imaginary) at
sensitively affected by a balance of roles between nano filler very low frequency must be related to dc conductivity. But no
particles and cross-linking residues. similar dependence was obtained as nano filler effects.
Measurement techniques for permittivity should be
9.3 SPACE CHARGE
coordinated through information exchange. Nano filler effect
It was found that heterocharge is formed for unfilled XLPE. is visible for space charge, and it will be more marked at
It is considered to originate from some remains of cross- higher electric field at which a packet charge appears. Short
linking residues and natural impurities. It was also confirmed time BD strength is not much affected by nano filler addition,
that nano filler acts to reduce such heterocharge. Nano filler while PD resistance as long term performance is much
particles are characteritic of adsorbance of impurities. This improved by this technique.
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1511
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Microcrystalline Silica, American Mineralogist, Vol. 79, pp. 269-273, Tokyo, Japan in 1939. He is presently a Research
1994 Fellow at IPS Research Center of Waseda University.
[129]D. I. Bower and W. F. Maddams, The Vibrational Spectroscopy of He obtained the Ph.D. degree from Osaka University.
Polymers, Cambridge University Press, Cambridge, 1989. He worked until 2009 as Professor at IPS Graduate
[130]A. M. Macdonald, A. S. Vaughan and P. Wyeth, Application of School, Waseda University. He worked for CRIEPI for
Confocal Raman Spectroscopy to Thin Polymer Layers on highly 38 years and ended as Vice President for the last 6
scattering substrates: a case study of synthetic adhesives on historic years, and temporarily for Salford University in UK
textiles, J. Raman Spectrosc., Vol. 36, pp. 185191, 2005. (1970-1972), Rensselaer Polytechnic Institute and
[131]L. Wang, A. Cavallini, G. C. Montanari, A. S. Vaughan and N.A. General Electric in the USA (1975-76), and Kyushu
Freebody, PD-induced surface degradation of Insulation-embedded University in Japan (1993-1997). He is a recipient of the Ministry of Science
Cavities: Microscopic Investigation, submitted to Intl. Sympos. Electr. and Technology Prize in 2000, IEEJ Technology Progress Award in 1988, and
Insulating Materials (ISEIM), 2011. IEEE Dakin Award in 2002. He is active in IEEJ, IEEE, and CIGRE. He is an
[132]N. A. Freebody and A.S. Vaughan, Surface Ageing of Dielectric Associate Editor of the IEEE Transactions on Dielectrics and Electrical
Materials in a Controlled Atmosphere: a Raman Microprobe Study, Insulation and an IEEJ Life Fellow.
IEEE Conf. Electr. Insul Dielectr. Phenomena (CEIDP), pp. 54-57, 2004.
[133]A. S. Vaughan, I L Hosier, S J Dodd and S J Sutton, On the Structure Alexander Bulinski (F'95) received the Ph.D. degree
and Chemistry of Electrical Trees in Polyethylene, J. Phys. D: Appl. (1976) in electrical engineering from the Wroclaw
Phys., Vol. 39, pp. 962978, 2006. University of Technology, Poland. He joined the
4. Permittivity National Research Council of Canada in 1977 and has
[134]IEE Monograph Series 14, Electrical Insulating Materials and their been associated with it ever since. His research
Application, Edited by R. W. Sillars, Peter Peregrinus Ltd on behalf of interests include aging processes in high voltage
IEEE, p. 144, 1973. insulation, insulation system design and testing, high
6 Space Charge voltage measurements and the development of
[135]CIGRE Task Force D1.12.01, Space Charge Measurement in diagnostic measurement techniques and
Dielectrics and Insulating Materials - PEA, PWP (PIPWP & LIPP) and instrumentation for assessing the operating conditions
TSM methods, CIGRE Technical Brochure No. 288, pp.50, 2006. of different types of high voltage insulation. He is a recipient of the IEEE-
6.1 TSM Principle and Mathematical Treatment (Castellon) DEIS Eric O. Forster Award (2007).
[136]A. Toureille, P. Notingher jr, N. Vella, S. Malrieu, J. Castellon and S.
Agnel, The Thermal Step Technique : an Advanced Method for
Studying the Properties and Testing the Quality of Polymers, Polymer Jerome Castellon (M08) was born in Lodve,
Intl., Vol. 46, pp. 81-92, 1998. France, in 1970. He received the Ph.D. degree in
[137]P. Notingher jr, A. Toureille, S. Agnel and J. Castellon, Determination electronic, optronic and systems from the University
of electric field and space charge in the insulation of power cables with of Montpellier 2 "UM2", France, in 1997. He has been
the thermal step method and a new mathematical processing, IEEE the technical manager of Advanced metrology for
Trans. Industr. Appl., Vol. 45, pp. 67-74, 2009. electrical engineering "Am2e" Company until 2003.
6.3 Space Charge (Bulinski) Since then, he is an assistant professor at the UM2. He
[138]Y. Li and T. Takada, Experimental Observation of Charge Transport is working with the Energy and Materials Group
and Injection in XLPE at Polarity Reversals, J. Phys. D: Appl. Phys. "GEM" of the Southern Institute of Electronics "IES"
Vol. 25, pp. 704-716, 1992. (joint facility of the UM2 and French National
[139]K.S. Suh, S.J. Hwang, J.S. Noh and T. Takada, Effects of Constituents Council for Scientific Research "CNRS"). He has been involved in various
of XLPE on the Formation of Space Charge, IEEE Trans. Dielectr. research fields related to insulating materials and system for electrical
Electr. Insul., Vol. 1, pp. 1077-1083, 1994. engineering. His major research activities concern electrical characterization,
[140]M. Fu, G. Chen, L.A. Dissado and J.C. Fothergill, Influence of Thermal dielectric phenomena and diagnostic techniques development. He is a member
Treatment and Residues on Space Charge Accumulation in XLPE for of the IEEE Dielectrics and Electrical Insulation Society, of the CIGRE SC-
DC Power Cable Application, IEEE Trans. Dielectr. Electr. Insul., Vol. D1 Materials and Emerging Technologies, of the French Society of
14, pp. 53-64, 2007. Electrostatics and of the Socit des Electriciens et Electroniciens.
1516 T. Tanaka et al.: Dielectric Properties of XLPE/SiO2 Nanocomposites Based on CIGRE WG D1.24 Cooperative Test Results
Michel Frchette (SM95) has a graduate Peter Morshuis (M95) was born in The Hague, The
background in physics. He joined Hydro- Netherlands, in 1959. Between 1986 and 1988, he was
Qubecs research institute (IREQ) in 1981. involved in studies for NKF Kabel on the effects of
Since then, he has been involved in applied defects on the lifetime of high voltage cables and in
basic research in various fields related to studies on new cable concepts. Since 1988, he has been
electrical insulation and insulating materials. a staff member of the High Voltage Group at Delft
His major contributions concern discharge University of Technology where he was awarded the
physics, dielectric phenomena, and most Ph.D. degree in electrical engineering in 1993 on the
recently nanodielectrics. topic of ultra wide-band electrical and optical studies of
partial discharges in solid dielectrics. In 1998, he was a visiting Professor at
the University of Bologna. Since 1999, he is an Associate Professor in High
Stanislaw M. Gubanski (M'89-SM'90-F'01) received the M.Sc. (high voltage Voltage Engineering at Delft University of Technology. His most important
engineering) and Ph.D. degrees (material science) from fields of interest are HVDC (materials and systems), nanodielectrics, space
the Technical University of Wroclaw, Poland, in 1973 charge, partial discharge, smart grid and aging of electrical insulation. He is
and 1976, respectively. He was a Research Fellow at involved in a number of CIGR and IEEE activities and he is an Associate
the University College of North Wales Bangor, U.K Editor of the IEEE Transactions on Dielectrics and Electrical Insulation.
from 1976 to 1977, a senior lecturer at the Technical
University of Wroclaw, Wroclaw, Poland, from 1977 Yasuhiro Tanaka (M99) was born in Fukuoka, Japan
to 1988. Afterwards he was an associate professor at in 1961. He received the B.E., M.E. and Ph.D. degrees
the Royal Institute of Technology, Stockholm, Sweden. in electrical engineering from Waseda University, Japan,
Currently, he is professor of High Voltage Engineering in 1986, 1988 and 1991, respectively. He became a
at the Department of Manufacturing and Materials Lecturer, an Associate Professor and a Professor at
Technology, Chalmers University of Technology. He currently is Vice Musashi Institute of Technology, in 1992, 1998 and
President Administrative of IEEE-DEIS and a Senior Associate Editor of the 2004, respectively. He was a Visiting Scientist at
IEEE Transactions on Dielectrics and Electrical Insulation. University of Southampton from 1999 to 2000.
Currently, he is developing a measurement system for
Josef Kindersberger (M87). He received the Dipl.-Ing. space charge distribution in various solid dielectric
and the Dr.-Ing. materials at high temperatures, under ultra-high electric field or under
degrees from the Technische Universitaet Muenchen in irradiation of gamma-ray or electron-beam in vacuum. (Musashi Institute of
1979 and 1986, respectively. From 1986 to 1995 he was Technology was renamed Tokyo City University.)
with the High Voltage Insulator Group of Hoechst
CeramTec AG. In 1995 he became full professor at the Serge Plissou (M77-SM96) was born in Castres,
Technische Universitaet Dresden. Since 2001 he has France, in 1951. He received the B.Sc.A., M.Sc.A.
been Head of the Institute of High Voltage Technology and Ph.D. degrees in engineering physics from the
and Power Transmission of Technische Universitaet cole Polytechnique, University of Montral,
Muenchen, Germany. He is active in IEC (chairman of Qubec, Canada, in 1976, 1979 and 1986,
TC 36), CIGRE (Chairman SC D1), IEEE and VDE/ETG. respectively. Since 1982, he joined the Institut de
recherche dHydro-Qubec (IREQ) as a member of
Gian Carlo Montanari (M87-SM90-F00) was the scientific staff. His research interests are
born on 8 November 1955. He is currently Full materials for cables, including dielectric properties of
Professor of Electrical Technology at the Department polymers, extruded dielectric cable performance, physico-chemical
of Electrical Engineering of the University of characterization of insulations and diagnostic techniques for underground
Bologna, and teaches courses of Technology, lines. He is a registered engineer in the province of Qubec, a senior member
Reliability and Asset management. He has worked of IEEE/PES, involved in several activities of the ICC/PES, and in CIGRE
since 1979 in the field of aging and endurance of SC-D1 Materials and Emerging Technologies.
solid insulating materials and systems, of diagnostics
of electrical systems and innovative electrical Alun Vaughan (M06-SM07) has a B.Sc.
materials (magnetics, nanomaterials, electrets, degree in chemical physics and a Ph.D. degree in
superconductors). He has been also engaged in the fields of power quality and polymer physics. After working at the UKs
energy market, power electronics, reliability and statistics of electrical Central Electricity Research Laboratories and
systems. He is a member of AEI and Institute of Physics. He is a member of spending a period as an academic at The
the AdCom of the IEEE DEIS. Since 1996 he is President of the Italian University of Reading, he is now Professor in
Chapter of the IEEE DEIS. He is an Associate Editor of IEEE Transactions on Electronics and Computer Science at the
Dielectrics and Electrical Insulation. He is founder and President of the spin- University of Southampton. He is an EPSRC
off TechImp, established on 1999. He is author or coauthor of about 600 College member, Chair of The Dielectrics Group
scientific papers. He is an Associate Editor of the IEEE Transactions on of the Institute of Physics, a Fellow of the
Dielectrics and Electrical Insulation. Institute of Physics, and a member of the IET.
Masayuki Nagao (M90) was born in Gifu, Japan in Yoshimichi Ohki (M76-SM98-F00) received the B.
1950. He received the B.Eng., M.Eng. and D.Eng. Eng., M. Eng. and Dr. Eng. degrees in 1973, 1975 and
degrees from the Nagoya University, Japan in 1973, 1978, respectively, all from Waseda University, Japan.
1975 and 1978, respectively. He became a Lecturer in He joined the teaching staff of the Department of EE,
1980, an Associate Professor in 1985 and a full Waseda University in 1976 and is presently a
Professor in 1998 in the Department of Electrical and Professor. He was a Visiting Scientist at the
Electronics Engineering of Toyohashi University of Massachusetts Institute of Technology from 1982 to
Technology, Japan. He is engaged primarily in research 1984. He is a recipient of the Forster, Whitehead, and
on high-field electrical properties of polymers and insulation degradation Ieda Awards from IEEE-DEIS, Outstanding
phenomena. He received a Paper Awards from IEEJ in 1991 and from Achievement Award and two Best Paper Awards from
Japanese National Committee of CIGRE in 2006 and 2010, and Technical IEE Japan, and other awards. His major research interests cover various
Committee Award from CIGRE in 2005. He is a member of the IEE Japan, organic and inorganic dielectrics, e.g., those used in optical fibers and power
Japan Society of Applied Physics, CIGRE and presently a chair of IEEE DEIS cables. He is an Associate Editor of the IEEE Transactions on Dielectrics and
Japan Chapter. Electrical Insulation.
IEEE Transactions on Dielectrics and Electrical Insulation Vol. 18, No. 5; October 2011 1517
Clive W. Reed (M80) graduated from the University Suh Joon Han (M '98) is a Senior R&D Specialist
of Bristol, England in 1956 with a First Class Special for the Wire and Cable buisness of The Dow
Honors B.Sc. degree in organic chemistry and with a Chemical Company. He holds a Ph.D. degree in
PhD. Degree in physical chemistry in 1960. After a polymer science and engineering from Lehigh
postdoctoral fellowship in low temperature physics at University of Bethlehem, Pennsylvania. Since 1998,
the National Research Council of Canada in Ottawa, in he has been involved in research and development
1963 he joined GE Corporate Research and projects for semiconductive shields compounds and
Development, Schenectady, NY, where he worked on insulation materials in power cable applications, and
high voltage insulation material and design and dielectric fluids for transformer applications. He is a
dielectric phenomena for numerous commercial member of IEEE Dielectrics and Insulation Society,
applications until retirement in 2002. He is past and Society of Plastics Engineers. He is an author of more than 36 technical
chairman of CEIDP, past member of NAS-NRCs Committee on Dielectrics, papers and presentations, and holds 10 patents.
past chairman of CIGREs Study Committee on Materials for
Electrotechnology, and has served in many capacities for these and other
professional organizations and on NIST, US Government, and industrial
review and advisory committees. Presently, he is an independent consultant on
dielectrics and high voltage insulation materials and design.