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PD - 95848C

AUTOMOTIVE MOSFET IRLR2905Z


IRLU2905Z
HEXFET® Power MOSFET
Features
D
O Logic Level VDSS = 55V
O Advanced Process Technology
O Ultra Low On-Resistance
O 175°C Operating Temperature RDS(on) = 13.5mΩ
G
O Fast Switching
O Repetitive Avalanche Allowed up to Tjmax ID = 42A
S

Description
Specifically designed for Automotive applications, this HEXFET®
Power MOSFET utilizes the latest processing techniques to
achieve extremely low on-resistance per silicon area. Additional
features of this design are a 175°C junction operating tempera-
ture, fast switching speed and improved repetitive avalanche
rating . These features combine to make this design an extremely
efficient and reliable device for use in Automotive applications and D-Pak I-Pak
a wide variety of other applications. IRLR2905Z IRLU2905Z

Absolute Maximum Ratings


Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 60
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 43 A
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Package Limited) 42
IDM Pulsed Drain Current c 240
PD @TC = 25°C Power Dissipation 110 W
Linear Derating Factor 0.72 W/°C
VGS Gate-to-Source Voltage ± 16 V
Single Pulse Avalanche Energy
EAS (Thermally limited) d 57 mJ
EAS (Tested ) Single Pulse Avalanche Energy Tested Value h 85
IAR Avalanche Current c See Fig.12a, 12b, 15, 16 A
EAR Repetitive Avalanche Energy g mJ
TJ Operating Junction and -55 to + 175
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Mounting Torque, 6-32 or M3 screw y
10 lbf in (1.1N m) y
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case j ––– 1.38
RθJA Junction-to-Ambient (PCB mount) i ––– 50 °C/W
RθJA Junction-to-Ambient ––– 110

HEXFET® is a registered trademark of International Rectifier.


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IRLR/U2905Z
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 ––– ––– V VGS = 0V, ID = 250μA
ΔV(BR)DSS/ΔTJ Breakdown Voltage Temp. Coefficient ––– 0.053 ––– V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance ––– 11 13.5 mΩ VGS = 10V, ID = 36A e
––– ––– 20 mΩ VGS = 5.0V, ID = 30A e
––– ––– 22.5 mΩ VGS = 4.5V, ID = 15A e
VGS(th) Gate Threshold Voltage 1.0 ––– 3.0 V VDS = VGS, ID = 250μA
gfs Forward Transconductance 25 ––– ––– S VDS = 25V, ID = 36A
IDSS Drain-to-Source Leakage Current ––– ––– 20 μA VDS = 55V, VGS = 0V
––– ––– 250 VDS = 55V, VGS = 0V, TJ = 125°C
IGSS Gate-to-Source Forward Leakage ––– ––– 200 nA VGS = 16V
Gate-to-Source Reverse Leakage ––– ––– -200 VGS = -16V
Qg Total Gate Charge ––– 23 35 ID = 36A
Qgs Gate-to-Source Charge ––– 8.5 ––– nC VDS = 44V
Qgd Gate-to-Drain ("Miller") Charge ––– 12 ––– VGS = 5.0V e
td(on) Turn-On Delay Time ––– 14 ––– VDD = 28V
tr Rise Time ––– 130 ––– ID = 36A
td(off) Turn-Off Delay Time ––– 24 ––– ns RG = 15 Ω
tf Fall Time ––– 33 ––– VGS = 5.0V e
LD Internal Drain Inductance ––– 4.5 ––– Between lead, D

nH 6mm (0.25in.)
G
LS Internal Source Inductance ––– 7.5 ––– from package
S
and center of die contact
Ciss Input Capacitance ––– 1570 ––– VGS = 0V
Coss Output Capacitance ––– 230 ––– VDS = 25V
Crss Reverse Transfer Capacitance ––– 130 ––– pF ƒ = 1.0MHz
Coss Output Capacitance ––– 840 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz
Coss Output Capacitance ––– 180 ––– VGS = 0V, VDS = 44V, ƒ = 1.0MHz
Coss eff. Effective Output Capacitance ––– 290 ––– VGS = 0V, VDS = 0V to 44V f
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current ––– ––– 42 MOSFET symbol
(Body Diode) A showing the
ISM Pulsed Source Current ––– ––– 240 integral reverse
(Body Diode) c p-n junction diode.
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 36A, VGS = 0V e
trr Reverse Recovery Time ––– 22 33 ns TJ = 25°C, IF = 36A, VDD = 28V
Qrr Reverse Recovery Charge ––– 14 21 nC di/dt = 100A/μs e
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

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IRLR/U2905Z

1000 1000
VGS VGS
TOP 10V TOP 10V
9.0V 9.0V
ID, Drain-to-Source Current (A)

ID, Drain-to-Source Current (A)


7.0V 7.0V
5.0V 5.0V
4.5V 4.5V
4.0V 4.0V
100 3.5V
100 3.5V
BOTTOM 3.0V BOTTOM 3.0V

10 10
3.0V

≤ 60μs PULSE WIDTH ≤ 60μs PULSE WIDTH


3.0V Tj = 25°C Tj = 175°C
1 1
0.1 1 10 100 0.1 1 10 100

VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics

1000.0 60

T J = 25°C T J = 25°C
Gfs, Forward Transconductance (S)
ID, Drain-to-Source Current (Α)

50

100.0 T J = 175°C 40

T J = 175°C
30

10.0
20

VDS = 10V
10 VDS = 8.0V
≤ 60μs PULSE WIDTH
1.0 380μs PULSE WIDTH
2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0 10.0 0
0 10 20 30 40 50
VGS, Gate-to-Source Voltage (V)
ID, Drain-to-Source Current (A)

Fig 3. Typical Transfer Characteristics Fig 4. Typical Forward Transconductance


Vs. Drain Current
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IRLR/U2905Z

2500 12
VGS = 0V, f = 1 MHZ
ID= 36A
C iss = C gs + C gd, C ds SHORTED
VDS= 44V

VGS, Gate-to-Source Voltage (V)


C rss = C gd 10
2000
C oss = C ds + C gd VDS= 28V
VDS= 11V
C, Capacitance (pF)

Ciss 8
1500

1000
4

500 2
Coss
Crss
0 0
1 10 100 0 10 20 30 40 50

VDS, Drain-to-Source Voltage (V) QG Total Gate Charge (nC)

Fig 5. Typical Capacitance Vs. Fig 6. Typical Gate Charge Vs.


Drain-to-Source Voltage Gate-to-Source Voltage

1000.0 1000
OPERATION IN THIS AREA
LIMITED BY R DS(on)
ID, Drain-to-Source Current (A)
ISD, Reverse Drain Current (A)

100.0 100
T J = 175°C

10.0 10 100μsec

T J = 25°C
1msec
1.0 1
Tc = 25°C 10msec
Tj = 175°C
VGS = 0V Single Pulse
0.1 0.1
0.2 0.6 1.0 1.4 1.8 2.2 1 10 100 1000
VSD, Source-to-Drain Voltage (V) VDS , Drain-toSource Voltage (V)

Fig 7. Typical Source-Drain Diode Fig 8. Maximum Safe Operating Area


Forward Voltage
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IRLR/U2905Z

60 2.0
LIMITED BY PACKAGE ID = 30A

RDS(on) , Drain-to-Source On Resistance


50 VGS = 5.0V
ID , Drain Current (A)

40 1.5

(Normalized)
30

20
1.0

10

0
0.5
25 50 75 100 125 150 175
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T C , Case Temperature (°C)
T J , Junction Temperature (°C)

Fig 9. Maximum Drain Current Vs. Fig 10. Normalized On-Resistance


Case Temperature Vs. Temperature

10
Thermal Response ( Z thJC )

1
D = 0.50

0.20
0.10 R1 R2
0.1 R1 R2 Ri (°C/W) τi (sec)
0.05 τJ τC
τJ τ 0.765 0.000269
0.02 τ1 τ2
τ1 τ2 0.6141 0.001614
0.01
0.01 Ci= τi/Ri
Ci i/Ri

SINGLE PULSE Notes:


( THERMAL RESPONSE ) 1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.001
1E-006 1E-005 0.0001 0.001 0.01

t1 , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case

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IRLR/U2905Z

240
15V

EAS, Single Pulse Avalanche Energy (mJ)


ID
200
TOP 4.3A
6.2A
L DRIVER
VDS BOTTOM 36A
160
RG D.U.T +
V
- DD
IAS A 120
VGS
20V
tp 0.01Ω
80
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS 40
tp

0
25 50 75 100 125 150 175

Starting TJ, Junction Temperature (°C)

I AS
Fig 12c. Maximum Avalanche Energy
Fig 12b. Unclamped Inductive Waveforms
Vs. Drain Current
QG

10 V
QGS QGD 3.0
VGS(th) Gate threshold Voltage (V)

VG
2.5

Charge
Fig 13a. Basic Gate Charge Waveform 2.0 ID = 250μA
Current Regulator
Same Type as D.U.T.

50KΩ 1.5
12V .2μF
.3μF

+
V
D.U.T. - DS
1.0
VGS -75 -50 -25 0 25 50 75 100 125 150 175
3mA T J , Temperature ( °C )

IG ID
Current Sampling Resistors

Fig 13b. Gate Charge Test Circuit Fig 14. Threshold Voltage Vs. Temperature
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IRLR/U2905Z

1000

Duty Cycle = Single Pulse


100
Allowed avalanche Current vs
Avalanche Current (A)

avalanche pulsewidth, tav


0.01 assuming Δ Tj = 25°C due to
avalanche losses. Note: In no
10 0.05 case should Tj be allowed to
exceed Tjmax
0.10

0.1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02

tav (sec)

Fig 15. Typical Avalanche Current Vs.Pulsewidth

60 Notes on Repetitive Avalanche Curves , Figures 15, 16:


TOP Single Pulse (For further info, see AN-1005 at www.irf.com)
BOTTOM 1% Duty Cycle 1. Avalanche failures assumption:
50 ID = 36A Purely a thermal phenomenon and failure occurs at a
EAR , Avalanche Energy (mJ)

temperature far in excess of Tjmax. This is validated for


every part type.
40
2. Safe operation in Avalanche is allowed as long asTjmax is
not exceeded.
30 3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. PD (ave) = Average power dissipation per single
20 avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
10 6. Iav = Allowable avalanche current.
7. ΔT = Allowable rise in junction temperature, not to exceed
Tjmax (assumed as 25°C in Figure 15, 16).
0
tav = Average time in avalanche.
25 50 75 100 125 150 175 D = Duty cycle in avalanche = tav ·f
Starting T J , Junction Temperature (°C) ZthJC(D, tav) = Transient thermal resistance, see figure 11)

PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC


Fig 16. Maximum Avalanche Energy Iav = 2DT/ [1.3·BV·Zth]
Vs. Temperature EAS (AR) = PD (ave)·tav
www.irf.com 7
IRLR/U2905Z

Driver Gate Drive


P.W.
D.U.T P.W.
Period D=
Period
+

ƒ
*
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
- • Low Leakage Inductance D.U.T. ISD Waveform
Current Transformer
+
Reverse
‚ Recovery Body Diode Forward
-
„ + Current Current
- di/dt
D.U.T. VDS Waveform
Diode Recovery
 dv/dt
VDD

RG • dv/dt controlled by RG VDD Re-Applied


• Driver same type as D.U.T. + Voltage Body Diode Forward Drop
• ISD controlled by Duty Factor "D" - Inductor Curent
• D.U.T. - Device Under Test

Ripple ≤ 5% ISD

* VGS = 5V for Logic Level Devices

Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs

RD
VDS

VGS
D.U.T.
RG
+
-VDD

10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %

Fig 18a. Switching Time Test Circuit

VDS
90%

10%
VGS
td(on) tr t d(off) tf

Fig 18b. Switching Time Waveforms

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IRLR/U2905Z
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)

2.38 (.094)
6.73 (.265) 2.19 (.086)
6.35 (.250) 1.14 (.045)
0.89 (.035)
-A-
5.46 (.215) 1.27 (.050) 0.58 (.023)
5.21 (.205) 0.88 (.035) 0.46 (.018)

6.45 (.245)
5.68 (.224)
6.22 (.245)
5.97 (.235) 10.42 (.410)
1.02 (.040) 9.40 (.370) LEAD ASSIGNMENTS
1.64 (.025) 1 2 3
1 - GATE
0.51 (.020) 2 - DRAIN
-B- MIN. 3 - SOURCE
1.52 (.060) 4 - DRAIN
1.15 (.045)
0.89 (.035)
3X
0.64 (.025) 0.58 (.023)
1.14 (.045) 0.46 (.018)
2X 0.25 (.010) M A M B
0.76 (.030)

2.28 (.090) NOTES:


1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
4.57 (.180) 2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).

D-Pak (TO-252AA) Part Marking Information


Notes : T his part marking information applies to devices produced before 02/26/2001
EXAMPLE: T HIS IS AN IRFR120
WIT H AS S EMBLY
LOT CODE 9U1P INT ERNAT IONAL DAT E CODE
RECT IFIER IRFU120
YEAR = 0
LOGO 016
WEEK = 16
9U 1P

AS S EMBLY
LOT CODE

Notes : T his part marking information applies to devices produced after 02/26/2001

EXAMPLE: T HIS IS AN IRFR120


PART NUMBER
WIT H AS S EMBLY INT ERNAT IONAL
LOT CODE 1234 RECT IFIER IRFU120 DAT E CODE
AS S EMBLED ON WW 16, 1999 LOGO 916A YEAR 9 = 1999
IN T HE AS S EMBLY LINE "A" 12 34 WEEK 16
LINE A
AS S EMBLY
LOT CODE

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IRLR/U2905Z
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)

6.73 (.265) 2.38 (.094)


6.35 (.250) 2.19 (.086)
-A-
1.27 (.050) 0.58 (.023)
5.46 (.215)
0.88 (.035) 0.46 (.018)
5.21 (.205)
LEAD ASSIGNMENTS
4 1 - GATE
6.45 (.245) 2 - DRAIN
5.68 (.224) 3 - SOURCE
1.52 (.060) 6.22 (.245) 4 - DRAIN
1.15 (.045) 5.97 (.235)

1 2 3

-B- NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.
2.28 (.090)
9.65 (.380) 2 CONTROLLING DIMENSION : INCH.
1.91 (.075) 8.89 (.350) 3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).

1.14 (.045) 1.14 (.045)


3X 0.89 (.035)
0.76 (.030) 3X 0.89 (.035)
0.64 (.025)

2.28 (.090) 0.25 (.010) M A M B 0.58 (.023)


0.46 (.018)
2X

I-Pak (TO-251AA) Part Marking Information


Notes : T his part marking information applies to devices produced before 02/26/2001

EXAMPLE: T HIS IS AN IRFR120


INT ERNAT IONAL DAT E CODE
WIT H AS S EMBLY
RECT IFIER IRFU120
LOT CODE 9U1P YEAR = 0
LOGO 016
WEEK = 16
9U 1P

AS S EMBLY
LOT CODE

Notes : T his part marking information applies to devices produced after 02/26/2001

EXAMPLE: T HIS IS AN IRFR120 PART NUMBER


INT ERNAT IONAL
WIT H AS S EMBLY
RECT IFIER IRFU120 DAT E CODE
LOT CODE 5678
LOGO 919A YEAR 9 = 1999
AS S EMBLED ON WW 19, 1999
56 78 WEEK 19
IN T HE AS S EMBLY LINE "A"
LINE A
AS S EMBLY
LOT CODE

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IRLR/U2905Z
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR TRR TRL

16.3 ( .641 ) 16.3 ( .641 )


15.7 ( .619 ) 15.7 ( .619 )

12.1 ( .476 ) 8.1 ( .318 )


FEED DIRECTION FEED DIRECTION
11.9 ( .469 ) 7.9 ( .312 )

NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.

13 INCH

16 mm
NOTES :
1. OUTLINE CONFORMS TO EIA-481.

Notes:
 Repetitive rating; pulse width limited by „ Coss eff. is a fixed capacitance that gives the same charging time
max. junction temperature. (See fig. 11). as Coss while VDS is rising from 0 to 80% VDSS .
‚ Limited by TJmax, starting TJ = 25°C, L = 0.089mH… Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive
RG = 25Ω, IAS = 36A, VGS =10V. Part not avalanche performance.
recommended for use above this value. † This value determined from sample failure population. 100%
ƒ Pulse width ≤ 1.0ms; duty cycle ≤ 2%. tested to this value in production.
‡ When mounted on 1" square PCB (FR-4 or G-10 Material) .
For recommended footprint and soldering techniques refer to
application note #AN-994
ˆ Rθ is measured at TJ approximately 90°C

Data and specifications subject to change without notice.


This product has been designed for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.8/09
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