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Article history: Polycrystalline Fe doped ZnO nanoparticles were synthesized through citrate gel method. Microstruc-
Received 19 January 2012 tural studies were carried out using XRD, FESEM, EDS, TEM, SAED and FTIR spectroscopy. XRD and TEM
Received in revised form 9 June 2012 results clearly show the formation of all samples in single phase without any impurity and the average
Accepted 10 August 2012
crystallite size has been observed to vary between 10 nm and 20 nm. Band at 500 cm1 observed in FTIR
Available online 18 August 2012
spectrum is attributed to the Zn–O stretching confirms the formation of ZnO nanoparticles. The dielectric
constant, loss tangent and ac conductivity were studied as a function of frequency and composition using
Keywords:
LCR meter. All the dielectric parameters show dispersion and decreases with increase in Fe content. The
A. Nanostructures
observed dielectric behavior is explained on the basis of Maxwell–Wagner model and Koops
B. Sol-gel chemistry
C. Impedance spectroscopy phenomenological theory. The impedance analysis shows only one semicircle of all samples suggesting
C. X-ray diffraction that the contribution of grain boundaries is dominated over grain contribution.
D. Dielectric properties ß 2012 Elsevier Ltd. All rights reserved.
1. Introduction ways to modify the dielectric and other properties of metal oxide
nanostructure. Introducing the dopant into the structure is one of
Metal oxide nanostructures such as zinc oxide (ZnO), indium them. Literature review suggests that several additives (cations:
oxide (In2O3), tin oxide (SnO2) and doped oxides have been Fe, Cu, Co, Cr, Al, Mn, Mg; anions: P, S) can lead to an increase in the
intensively investigated in recent years [1–8]. Among these metal surface area of ZnO based powders. The added active elements
oxide nanostructures, ZnO is gaining more interest because it is an stabilize the ZnO surface, and promote a decrease in grain size. It
abundant, inexpensive and non-toxic material as compared to has been found that Fe3+ doped ZnO nanoparticles with lower
others. ZnO is a II–VI semiconductor material with a wide band gap crystallinity and high surface area have the higher catalytic activity
(3.37 eV) and the large exciton binding energy (60 meV) at room and sensor signal than both pure ZnO and Fe2O3 system [25]. In
temperature [9]. Zinc oxide nanoparticles are used in a variety of many cases metal oxides such as SnO2, TiO2, CuO, CeO2, Fe2O3,
applications such as UV absorption, antibacterial treatment [10], ZnFe2O4 were often used as dopants [26]. The dielectric properties
catalyst [11], photocatalyst [12] and additive in many industrial of pure ZnO are developed due to the defects of zinc excess at the
products. It is also used in the fabrication of solar cells [13], gas interstitial position and the lack of oxidation. As pure ZnO is
sensors [14,15], luminescent materials [16], transparent conductor sensitive to oxidation, absorption of O2 is inclined to decrease its
[17], heat mirrors and coatings [18]. Different physical methods dielectric properties. In cases where ZnO is doped with different
such as pulse laser deposition [19,20], vapor phase transparent dopants, the dielectric properties are changed by extrinsic defects
process [21] and chemical vapor deposition [22] have been and these trials have been attempted [27].
developed for the preparation of nanostructures of ZnO. Sol–gel There are various papers reported on the structural, optical,
method is one of the most important wet chemical methods for the magnetic and gas sensing properties of Fe doped ZnO [28–33]. Kuo
preparation of metal oxide nanoparticles [23] which is based on et al. investigated ethanol vapor sensing with nanosize Fe doped
the hydrolysis of reactive metal precursor. ZnO thin films. Bin et al. showed that large red shift in Raman
Many physical properties, such as electrical conductivity, scattering and photoluminescence of Fe-doped ZnO nanocanti-
piezoelectricity and defect structure, are greatly influenced by lever arrays. Ahn et al. reported the magnetic moment per Fe atom
the amount of excess Zn and impurities [24]. There are various increased with increasing Fe concentration. Cheng et al. studied
the structural, optical and magnetic properties of Fe-doped ZnO
and reported that with increasing the concentration of Fe, the
* Corresponding author. Tel.: +91 9528204837; fax: +91 5712700042. optical band gap shifts slightly to lower energies (66 meV for
E-mail address: mehedi403@rediffmail.com (M. Mehedi Hassan). x = 0.20) than that of the pure ZnO. Magnetization measurement
0025-5408/$ – see front matter ß 2012 Elsevier Ltd. All rights reserved.
http://dx.doi.org/10.1016/j.materresbull.2012.08.015
M. Mehedi Hassan et al. / Materials Research Bulletin 47 (2012) 3952–3958 3953
2. Experimental
2.1. Synthesis
Fig. 5. (a) TEM image, (b) bar graph and (c) SAED pattern of 7% Fe doped ZnO.
place in the ZnO matrix. Due to adsorption of CO, few peaks at (8.854 1012 F/m) and A is the cross sectional area of the flat
1125 cm1 (C–O), 1406 cm1 (C55C) and 1572 cm1 (C–H) are also surface of the pellet.
observed [36,37]. The complex or imaginary dielectric constant e00 for all the
samples was calculated using the relation:
3.5. Dielectric constant
e00 ¼ e0 tan d (3)
In solids, the dielectric properties can be explained as a function
of frequency of applied electric field, temperature, crystal structure
and other parameters. The dielectric response in a solid material
can be briefly described by expressing the relative dielectric
constant as a complex quantity made up of a real component and
an imaginary component, i.e.,
e ¼ e0 þ jė (1)
where e0 and e00 are the real and imaginary part of dielectric
constant, representing the amount of energy stored in a dielectric
material as polarization and the energy loss respectively, while
applying an electric field. In order to understand the influence of
microstructure, composition and intergranular potential barrier on
the electrical properties of ceramic, the frequency dependent real
dielectric constant can be calculated using the relation:
C pt
e0 ¼ (2)
e0 A
where Cp is the capacitance of the specimen in Farad (F), t is
thickness of pellet, e0 is the permittivity of free space Fig. 6. FTIR spectrum for Fe doped ZnO structure.
3956 M. Mehedi Hassan et al. / Materials Research Bulletin 47 (2012) 3952–3958
where tan d is the dielectric loss tangent which is proportional to similar to the dielectric constant. The value of tan d is large at lower
the loss of energy from the applied field into the sample (this frequencies, while becomes lower at higher frequencies. Plot of
energy is dissipated as heat) and therefore denoted as dielectric tan d for pure ZnO and 3% Fe doped ZnO display small peaks at
loss. Fig. 7 shows the variation of real part of dielectric constant lower frequencies which may represent the relaxation peaks.
with respect to the frequency of applied electric field between the These peaks occur when jumping frequency of localized electric
ranges of 75 kHz to 7 MHz for all the samples. It is observed that charge carrier becomes approximately equal to that of the
the dielectric constant decreases as doping concentration externally applied ac electric field [43]. It is evident that the
increases. The decrease in dielectric constant indicates the overall values of tan d are found to decrease with increasing the
formation of microstructure with semiconducting ZnO grains concentration of Fe3+ ions for all the samples.
surrounded by insulating grain boundaries and also suggest the
existence of interface states in the grain boundaries. It is also 3.7. ac conductivity
evident from Fig. 7 that all the samples show dielectric dispersion.
The dispersion is rapid at lower frequencies but it is slow and Fig. 9 shows the variation of ac conductivity (sac) for Fe doped
approaches to almost frequency independent behavior at high ZnO nanoparticles at room temperature. It is clear from the graphs
frequencies (microwave frequency). The observed dielectric that the conductivity increases as the frequency of applied ac field
behavior can be explained in the light of Maxwell–Wagner increases. The ac conductivity of a dielectric sample can be
interfacial type of polarization [38,39] and Koops phenomenologi- calculated using the relation:
cal theory [40]. According to this model, a dielectric medium is
assumed to be made of well conducting grains which are separated s ac ¼ e0 e0 v tan d (4)
by poorly conducting (or resistive) grain boundaries. The grain where v is the angular frequency. It is also evident from Fig. 9 that
boundaries are found to be more effective at lower frequencies, the ac conductivity decreases as the Fe content increases in the ZnO
while grains are effective at higher frequencies. The grain matrix. It can be attributed to the fact the presence of Fe3+ hole
boundaries are formed during the sintering process due to the doping induced by Zn2+ vacancies which increases the donor
superficial reduction or oxidation of crystallites in a porous defects and dilute the system. Therefore, n-type conductivity of the
material as a result of their direct contact with the firing
atmosphere [41,42]. The frequency independent behavior of all
the samples at higher frequency of applied electrical field is just
because of the charge carriers which are responsible for different
mechanisms of polarization and that lag behind the applied
alternating field. As a result they cannot follow the changes in the
applied field over a certain frequency limit, as the frequency
increases.
4. Conclusions
are signifying the control of grain boundary resistance in doped [17] S.H. Keshmiri, M. Rezaee Rokn-Abadi, Thin Solid Films 382 (2001) 230–234.
[18] G. Singh, S.B. Shrivastava, D. Jain, S. Pandya, T. Shripathi, V. Ganesan, Bull. Mater.
materials. Sci. 33 (2010) 581–587.
[19] Y. Nakata, T. Okada, M. Maeda, Appl. Surf. Sci. 197 (2002) 368–370.
Acknowledgements [20] Y.Z. Yoo, Z.W. Jin, T. Chikyow, T. Fukumura, M. Kawasaki, H. Koinuma, Appl. Phys.
Lett. 81 (2002) 3798–3801.
[21] B.J. Chen, X.W. Sun, C.X. Xu, B.K. Tay, Physica E 21 (2004) 103–107.
Authors are grateful to the Council of Science & Technology [22] Y.J. Li, R. Duan, P.B. Shi, G.G. Qin, J. Cryst. Growth 260 (2004) 309–315.
(CST), Govt. of UP, India for financial support in the form of Center [23] W.L. Dai, Y. Cao, L.P. Ren, X.L. Yang, J.H. Xu, H.X. Li, H.Y. He, K.N. Fan, J. Catal. 229
(2004) 80.
of Excellence in Materials Science (Nanomaterials). One of the [24] X.S. Wang, Z.C. Wu, J.F. Webb, Z.G. Liu, Appl. Phys. A: Mater. Sci. Process. 77 (2003)
authors (M.M. Hassan) is grateful to the University Grants 561–565.
Commission (UGC) for providing financial support in the form of [25] L.M. Fang, X.T. Zu, Z.J. Li, S. Zhu, C.M. Liu, W.L. Zhou, L.M. Wang, J. Alloys Compd.
454 (2008) 261–267.
Maulana Azad National Fellowship.
[26] W.-H. Zhang, W.-D. Zhang, J.-F. Zhou, J. Mater. Sci. 45 (2010) 209–215.
[27] H. Abdullah, M.N. Norazia, S. Shaari, M.Z. Nuawi, N.S. Mohamed Dan, Am. J. Eng.
References Appl. Sci. 3 (2010) 171–179.
[28] G.-H. Kuo, H. Paul Wang, H.H. Hsu, J. Wang, Y.M. Chiu, C.-J.G. Jou, T.F. Hsu, F.-L.
[1] G. Ambrozic, I. Djerdj, S.D. Skapin, M. Zigon, Z.C. Orel, CrystEngComm 12 (2010) Chen, J. Nanomater. (2009), Article ID 316035.
1862–1868. [29] G.Y. Ahn, S.-I. Park, S.J. Kim, B.W. Lee, C.S. Kim, IEEE Trans. Magn. 41 (2005) 2730.
[2] I. Bilecka, L. Luo, I. Djerdj, M.D. Rossell, M. Jagodic, Z. Jaglicic, Y. Masubuchi, S. [30] Z. Bin, Z. ShoaMin, W. Haiwei, D. ZuLiang, Chin. Sci. Bull. 53 (2008) 1639–1643.
Kikkawa, M. Niederberger, J. Phys. Chem. C 115 (2011) 1484–1495. [31] W. Cheng, X. Ma, J. Phys.: Conf. Ser. 152 (2009) 012039.
[3] I. Djerdj, Z. Jaglicic, D. Arcon, M. Niederberger, Nanoscale 2 (2010) 1096–1104. [32] H. Liu, J. Yang, Y. Zhang, L. Yang, M. Wei, X. Ding, J. Phys.: Condens. Matter 21
[4] I. Djerdj, G. Garnweitner, D. Arcon, M. Pregelj, Z. Jaglicic, M. Niederberger, J. Mater. (2009) 145803.
Chem. 18 (2008) 5208–5217. [33] C. Gaspar, L. Pereira, F.M. Costa, T. Monteiro, IEEE (2000) 326–329. , http://
[5] A. Murali, A. Barve, V.J. Leppert, S.H. Risbud, I.M. Kennedy, H.W.H. Lee, Nano Lett. 1 dx.doi.org/10.1109/SIM.2000.939254.
(2001) 287–289. [34] M.L. Dinesha, H.S. Jayanna, S. Ashoka, G.T. Chandrappa, J. Alloys Compd. 485
[6] G. Fan, Y. Wang, M. Hu, Z. Luo, G. Li, Meas. Sci. Technol. 22 (2011) 045203. (2009) 538–541.
[7] N. Van Hieu, N.A.P. Duc, T. Trung, M.A. Tuan, N.D. Chien, Sens. Actuators B 144 [35] Y. He, B. Yang, G. Cheng, Catal. Today 98 (2004) 595–600.
(2010) 450–456. [36] A.K. Mishra, D. Das, Mater. Sci. Eng. B 171 (2010) 5–10.
[8] A. Azam, A.S. Ahmed, M. Shahnawaze Ansari, M. Muhamed Shafeeq, A.H. Naqvi, J. [37] R.K. Dutta, P.K. Sharma, A.C. Pandey, J. Nanopart. Res. 12 (2010) 1211–1219.
Alloys Compd. 506 (2010) 237–242. [38] J. Maxwell, Oxford Univ. Press 1 (1873) 328.
[9] T.N. Soitah, Y. Chunhui, S. Liang, Sci. Adv. Mater. 2 (2010) 534–538. [39] K.W. Wanger, Ann. Phys. (Leipzig) 40 (1913) 817.
[10] L. Sanches, J. Peral, X. Domenech, Electrochim. Acta 41 (1996) 1981–1985. [40] C.G. Koops, Phys. Rev. 83 (1951) 121–124.
[11] W.J. Huang, G.C. Fang, C.C. Wang, Colloid Surf. A: Physicochem. Eng. Aspects 260 [41] M.A. El Hiti, J. Magn. Magn. Mater. 192 (1999) 305–313.
(2005) 45–51. [42] P. Reddy, T. Rao, J. Less Common Met. 86 (1982) 255–261.
[12] R. Annapoorani, M.R. Dhanjeyan, R. Renganathan, J. Photochem. Photobiol. A: [43] A.M. Abdeen, O.M. Hemeda, E.E. Assem, M.M. El-Sehly, J. Magn. Magn. Mater. 238
Chem. 111 (1997) 215–221. (2002) 75.
[13] K. Matsubara, P. Fons, K. Iwata, A. Yamada, K. Sakurai, H. Tampo, S. Niki, Thin Solid [44] A.M. Abo El Ata, M.K. El Nimr, S.M. Attia, D. El Kony, A.H. Al-Hammadi, J. Magn.
Films 431 (2003) 369–372. Magn. Mater. 33 (2006) 297.
[14] Q. Zhang, C. Xie, S. Zhang, A. Wang, B. Zhu, L. Wang, Z. Yang, Sens. Actuators B 110 [45] M.A. El-Hiti, J. Phys. D: Appl. Phys. 29 (1996) 501–504.
(2005) 370–376. [46] A. Dias, R. Luiz Moreive, J. Mater. Res. 12 (1998) 2190–2194.
[15] H.M. Lin, S.J. Tzeng, P.J. Hsiau, W.L. Tsia, Nano Struct. Mater. 10 (1998) 465–477. [47] S. Dutta, R.N.P. Choudhary, P.K. Sinha, Phys. Stat. Sol. (a) 202 (2005) 1172–1181.
[16] J. Zang, W. Yu, L. Zang, Phys. Lett. A 299 (2002) 276–281.