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Modeling the strain impact on refractive index and optical transmission rate T
a b c,d e,∗
Asma Darvishzadeh , Naif Alharbi , Amir Mosavi , Nima E. Gorji
a
Department of Chemistry, Tehran Central Branch, Islamic Azad University, Tehran, Iran
b
School of Industrial Engineering, Umm Al-Qura University, Saudi Arabia
c
Institute of Structural Mechanics, Bauhaus University Weimar, Weimar, Germany
d
Institute of Automation, Obuda University, Budapest, Hungary
e
Optoelectronics Research Group, Faculty of Electrical and Electronics Engineering, Ton Duc Thang University, Ho Chi Minh City, Viet Nam
A R T I C LE I N FO A B S T R A C T
Keywords: We propose a new and simple modeling approach for strain impact on the transmission and reflection rate of
Strain semiconductor devices. The model is applied to graphene or carbon nanotubes deposited on substrates. Any
Refractive index change in transmission rate by strain can directly impact on the short-circuit current density of an electronic
Optical transmission device. The nanolayers of graphene and nanotubes are often used as the excellent replacement for the con-
Reflection
ventional metallic contacts. However, these nanolayers are sensitive to in-plain and out-plain strain. It is shown
Graphene
Nanotube
that the transmission rate is significantly reduced by the strain. We have also calculated the change in the
refractive index under in-plain strain and the consequent change in reflection rate. The modeling can be ex-
tended to calculate the change in the refractive index under out-plain strain. Furthermore, one can calculate the
change in short-circuit current density of the full device (i.e. solar cell) under in-plain or out-plain strains. A
practical outcome of our modeling approach is to optimize the thickness or concentration of graphene and
carbon nanotube to en extent which is less sensitive to any thermo-mechanical strain. This leads the reader to
strain tuning techniques which are rarely applied to sensors, solar cells or photodetector devices through fab-
rication and characterization process.
∗
Corresponding author.
E-mail address: nimaegorji@tdt.edu.vn (N.E. Gorji).
https://doi.org/10.1016/j.physb.2018.05.001
Received 4 August 2016; Received in revised form 23 April 2018; Accepted 4 May 2018
Available online 11 May 2018
0921-4526/ © 2018 Elsevier B.V. All rights reserved.
A. Darvishzadeh et al. Physica B: Condensed Matter 543 (2018) 14–17
2. Modeling approach
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A. Darvishzadeh et al. Physica B: Condensed Matter 543 (2018) 14–17
J (d ) ⎞
ΔJsc (d ) = ⎛1 − sc
⎜ ∗100%
⎟
⎝ Jsc ° ⎠ (8)
5. Conclusion
16
A. Darvishzadeh et al. Physica B: Condensed Matter 543 (2018) 14–17
Fig. 4. Transmission rate variation by in-plain strain versus a range of wavelength for graphene and nanotube based devices separately following Eq. (4).
model to graphene/ZnO and CNT/TCO devices as the simplest devices absorption coefficient and refractive index for the device applications of Si-based
which are widely used in optoelectronics in form of substrate or back optoelectronics, J. Appl. Phys. 119 (2016) 103–106.
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