Departemen Teknik Metalurgi & Material

Fakultas Teknik Universitas Indonesia

Kampus UI Depok 16424 Jawa Barat – Indonesia,
Telp: +62-21-786-3510; Fax: +62-21—787-2350

Assignment – Tech of Microstructure Analysis

Figure 1. Cross Section Image of Old A5X Apple’s Ipad Processor (source:macrumors.com)

Figure 1 showed a cross section of Apple’s processor. Several layers of metallization (denoted
by M2, M7,..) could be seen from the mentioned figure. This micrograph is very usefull to
check the integrated circuit fabrication, and detect any failure or defect in the chip.
From several microstructure analysis methods that you know from lecture, please explain the
method you choose to acquired this kind of micrograph. Let’s say you need to check the
crystallographic information of the metallization layer as well. Please choose the most
appropriate method to obtain the crystallographic data.
Your answer should include the basic principle, step by step procedure, and any precautions
or cosiderations if needed, for all methods you choose in both questions.

Assignment deadline: May 31st, 2017