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Software Testing Metrics

Document Detail:
Description Version No. Creation Author
Date
Test Metrics 1.0 4-Dec-09 Ritesh Rohatgi,

Revision History:
Revision Action Taken Effective Date of Author
Description (add/del/mod) Page No. Change

GlobalLogic Inc.
Table of Contents

.......................................................................................................3

1.0 Objectives ........................................................................................3

2.0 Test Efficiency (TE)...........................................................................3

3.0 Defect Priority Index (DPI)................................................................4

4.0 Defect Acceptance (DA)...................................................................4

5.0 Defect Rejection (DR).......................................................................5

6.0 Bad Fix Defect (B)............................................................................5

7.0 Weighted Defect Density..................................................................6

8.0 Effort Variance (EV)..........................................................................7

9.0 Schedule Variance (SV)....................................................................7

10.0 Scope Change (SC).........................................................................7

11.0 Defect Cause Distribution Report..................................................7

12.0 Functional Test failure..................................................................8

GlobalLogic Inc.
1.0 Objectives
Test metrics that are commonly used for monitoring test preparation and
execution. We'll focus especially on the use and interpretation of such test
metrics for reporting, controlling and analyzing the test effort, including those
based on defects and those based on test data. We'll also look at options for
reporting test status using such metrics and other information.
As you read, remember to watch for the glossary terms defect density, failure
rate, test control, test coverage, test monitoring and test report.

2.0 Test Efficiency (TE)


This metric determine the efficiency of the testing team in identifying the
defects.
It also indicated the defects missed out during testing phase which migrated
to the next phase.
 DT 
Test Efficiency=  * 100%
 DT+DU 
Where,
DT = Number of valid defects identified during testing.
DU = Number of valid defects identified by user after release of
application. In other words, post-testing defect
Test Efficiency Trend

GlobalLogic Inc.
3.0 Defect Priority Index (DPI)
This metric determine the quality of the product under test and at the time of
release, based on which one can take decision for releasing of the product i.e.
it indicates the product quality.
Defect Priority index= ∑(Priority Index*No of Valid Defect(s) for this Priority)
Total Number of Valid Defects

One can divide the Defect Severity Index in two parts: -


1. DPI for All Status defect(s): - This value gives the product quality
under test.

2. DPI for Open Status defect(s): - This value gives the product quality at the time
of release. For calculation of DPI for this, only open status defect(s) must be
considered.

DPI (Open) = ∑(Priority Index*No of open Valid Defect(s) for this Priority)
Total Number of Valid Defects

4.0 Defect Acceptance (DA)


This metric determine the number of valid defects that testing team has
identified during execution.
 Number of Valid Defects 
Defect Acceptance=  * 100 %
 Total Number of Defects 
The value of this metric can be compared with previous release for getting
better picture
Defect Acceptance Trend

GlobalLogic Inc.
5.0 Defect Rejection (DR)
This metric determine the number of defects rejected during execution.
 Number of Defect(s)Rejected 
Defect Rejection=  * 100 %
 Total Number of Defects 
This metric gives the percentage of the invalid defect the testing team has
opened and one can control, if required, in future.
Defect Rejection Trend

6.0 Bad Fix Defect (B)


Defect whose resolution give rise to new defect(s) are bad fix defect.
This metric determine the effectiveness of defect resolution process.

GlobalLogic Inc.
 Number of of BadFixDefect(s) 
BadFixDefect =  * 100
 %
 Total Number of ValidDefects 
This metric gives the percentage of the bad defect resolution which needs to
be controlled.
Bad Fix Defect Trend

7.0 Weighted Defect Density


This metrics can be used to check the defect density. In order to
derive this metrics correctly, we will have to identify Defect
categories and provide weights to each category.

GlobalLogic Inc.
8.0 Effort Variance (EV)
This metric gives the variance in the estimated effort.
 Actual Effort - Estimated Effort 
Effort Variance= * 100 %
 Estimated Effort 

9.0 Schedule Variance (SV)


This metric gives the variance in the estimated schedule i.e. number of days.
 Actual No.of Days- Estimated No.of Days 
ScheduleVariance= * 100 %
 Estimated No.of Days 

10.0 Scope Change (SC)


This metric indicates how stable the scope of testing is.
 Total Scope- Previous Scope 
ScopeChange= * 100 %
 Previous Scope 
Where,
Total Scope = Previous Scope + New Scope, if Scope increases
Total Scope = Previous Scope - New Scope, if Scope decreases
Scope Change Trend for one release

11.0 Defect Cause Distribution Report


Pareto Chart for defect causes - based on the first iteration or
first release defect count for the various causes. The data is shown for
the previous 3 iteration or previous 3 releases. The trend indicates
whether the actions taken for the first iteration / release have been
effective for the top cause

GlobalLogic Inc.
12.0 Functional Test failure
FTF = Number of Functional Test Cases Failed
Number of Functional Test Cases Executed)

GlobalLogic Inc.

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