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Features
• Three half bridge power outputs
• Very low power consumption in sleep mode
• 3.3V / 5V compatible inputs with hysteresis
• All outputs with overload and short circuit protection
• Independently diagnosable outputs (overcurrent, open load)
• Open load diagnostics in ON-state for all high-side and low-side
• 16-bit Standard SPI interface with daisy chain and in-frame response capability for control and diagnosis
• Fast diagnosis with the global error flag
• Overtemperature pre-warning and protection
• Over- and Undervoltage lockout
• Cross-current protection
Potential applications
• HVAC Flap DC motors
• Monostable and bistable relays
• Side mirror x-y adjustment
Product validation
Qualified for Automotive Applications. Product Validation according to AEC-Q100
Description
The TLE94103EP is a protected triple half-bridge driver designed especially for automotive motion control
applications such as side mirror x-y adjustment. It is part of a larger family offering half-bridge drivers from
three outputs to twelve outputs with direct interface or SPI interface.
The half bridge drivers are designed to drive DC motor loads in sequential or parallel operation. Operation
modes forward (cw), reverse (ccw), brake and high impedance are controlled from a 16-bit SPI interface. It
offers diagnosis features such as short circuit, open load, power supply failure and overtemperature
detection. In combination with its low quiescent current, this device is attractive among others for automotive
applications. The small fine pitch exposed pad package, PG-TSDSO-14, provides good thermal performance
and reduces PCB-board space and costs.
Datasheet 1 1.0
www.infineon.com 2017-12-07
TLE94103EP
Datasheet 2 1.0
2017-12-07
TLE94103EP
Table of Contents
1 Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
1.1 Pin Assignment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
1.2 Pin Definitions and Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1 Voltage and current definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3 General Product Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.2 Functional Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.3 Thermal Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.4 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4 Characterization results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
5 General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.1 Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.2 Operation modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.2.1 Normal mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.2.2 Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.3 Reset Behaviour . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5.4 Reverse Polarity Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
6 Half-Bridge Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6.1 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6.2 Protection & Diagnosis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
6.2.1 Short Circuit of Output to Supply or Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
6.2.2 Cross-Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
6.2.3 Temperature Monitoring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
6.2.4 Overvoltage and undervoltage shutdown . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.2.4.1 VS Undervoltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.2.4.2 VS Overvoltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.2.4.3 VDD Undervoltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.2.5 Open Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
7 Serial Peripheral Interface (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.1 SPI Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.1.1 Global Error Flag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
7.1.2 Global Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
7.1.3 SPI protocol error detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
7.2 SPI with independent slave configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
7.3 Daisy chain operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
7.4 Status register change during SPI communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
7.5 SPI Bit Mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
7.6 SPI Control Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
7.6.1 Control register definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
7.7 SPI Status Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
7.7.1 Status register definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
8 Application Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
8.1 Application Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Datasheet 3 1.0
2017-12-07
TLE94103EP
Datasheet 4 1.0
2017-12-07
TLE94103EP
Pin Configuration
1 Pin Configuration
SDI 1 14 VDD
CSN 2 13 SDO
SCLK 3 12 TEST
TEST 4 11 EN
VS 5 10 N.U.
OUT 3 6 9 OUT 2
OUT 1 7 8 GND
Datasheet 5 1.0
2017-12-07
TLE94103EP
Pin Configuration
Note: Not used (N.U.) pins and unused outputs are recommended to be left unconnected (open) on the
application board. If N.U. pins or unused output pins are routed to an external connector which
leaves the PCB, then these outputs should have provision for a zero ohm jumper (depopulated if
unused) or ESD protection. In other words, they should be treated like used pins.
Datasheet 6 1.0
2017-12-07
TLE94103EP
Block Diagram
2 Block Diagram
VDD VS
GND
Datasheet 7 1.0
2017-12-07
TLE94103EP
Block Diagram
VS IS
IDD VS
VDD
VDD ISDO
SDO
VSDO ISDI
SDI
V SDI I CSN I OUTx VDS HSx
CSN SPI INTERFACE
OUT x
VCSN ISCLK DRIVER VDSLSx
SCLK
V SCLK
IEN
EN
V EN
GND
IGND
Datasheet 8 1.0
2017-12-07
TLE94103EP
Datasheet 9 1.0
2017-12-07
TLE94103EP
Notes
1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
Datasheet 10 1.0
2017-12-07
TLE94103EP
Note: Within the normal functional range the IC operates as described in the circuit description. The
electrical characteristics are specified within the conditions given in the related electrical
characteristics table.
Datasheet 11 1.0
2017-12-07
TLE94103EP
Datasheet 12 1.0
2017-12-07
TLE94103EP
Table 5 Electrical Characteristics, VS =5.5 V to 20 V, VDD = 3.0V to 5.5V, Tj = -40°C to +150°C, EN= HIGH,
IOUTn= 0 A; Typical values refer to VDD = 5.0 V, VS = 13.5 V and TJ = 25 °C unless otherwise
specified; all voltages with respect to ground, positive current flowing into pin (unless
otherwise specified)
Parameter Symbol Values Unit Note or Number
Min. Typ. Max. Test Condition
Current Consumption, EN = GND
Supply Quiescent current ISQ – 0.1 2 µA -40°C ≤ Tj ≤ 85°C P_4.4.1
Logic supply quiescent current IDD_Q – 0.1 1 µA -40°C ≤ Tj ≤ 85°C P_4.4.2
Total quiescent current ISQ + IDD_Q – 0.6 3 µA -40°C ≤ Tj ≤ 85°C P_4.4.3
Current Consumption, EN=HIGH
Supply current IS – 0.13 0.5 mA Power drivers and P_4.4.4
power stages are
off
Supply current IS_HSON – 1.5 3 mA All high-sides ON1)2) P_4.4.101
Logic supply current IDD – 0.6 2.5 mA SPI not active P_4.4.5
Logic supply current IDD_RUN – 2.5 – mA SPI 5MHz 2) P_4.4.6
2)
Total supply current IS + IDD_RUN – 2.7 – mA SPI 5MHz P_4.4.7
Over- and Undervoltage Lockout
Undervoltage Switch ON VUV ON 4.4 4.90 5.3 V VS increasing P_4.4.8
voltage threshold
Undervoltage Switch OFF VUV OFF 4 4.50 4.9 V VS decreasing P_4.4.9
voltage threshold
Undervoltage Switch ON/OFF VUV HY – 0.40 – V VUV ON - VUV OFF 2) P_4.4.10
hysteresis
Overvoltage Switch OFF voltage VOV OFF 21 23 25 V VS increasing P_4.4.11
threshold
Overvoltage Switch ON voltage VOV ON 20 22 24 V VS decreasing P_4.4.12
threshold
Overvoltage Switch ON/OFF VOV HY – 1 – V VOV OFF - VOV ON 2) P_4.4.13
hysteresis
VDD Power-On-Reset VDD POR 2.40 2.63 2.90 V VDD increasing P_4.4.14
VDD Power-Off-Reset VDD POffR 2.35 2.57 2.85 V VDD decreasing P_4.4.15
VDD Power ON/OFF hysteresis VDD POR HY – 0.06 – V VDD POR - VDD POffR 2) P_4.4.98
Static Drain-source ON-Resistance (High-Side or Low-Side)
High-Side or Low-Side RDSON RDSON_HB_25C – 825 1200 mΩ IOUT = ±0.5 A; P_4.4.16
(all outputs) Tj = 25 °C
High-Side or Low-Side RDSON RDSON_HB_150 – 1350 1800 mΩ IOUT = ±0.5 A; P_4.4.17
(all outputs) C Tj = 150 °C
Datasheet 13 1.0
2017-12-07
TLE94103EP
Table 5 Electrical Characteristics, VS =5.5 V to 20 V, VDD = 3.0V to 5.5V, Tj = -40°C to +150°C, EN= HIGH,
IOUTn= 0 A; Typical values refer to VDD = 5.0 V, VS = 13.5 V and TJ = 25 °C unless otherwise
specified; all voltages with respect to ground, positive current flowing into pin (unless
otherwise specified) (cont’d)
Parameter Symbol Values Unit Note or Number
Min. Typ. Max. Test Condition
Output Protection and Diagnosis of high-side (HS) channels of half-bridge output
HS Overcurrent Shutdown ISD_HS -1.5 -1.2 -0.9 A See Figure 5 P_4.4.20
Threshold
2)
Difference between shutdown ILIM_HS - -1.2 -0.6 0 A |ILIM_HS| ≥ |ISD_HS| P_4.4.21
and limit current ISD_HS See Figure 5
2)
Overcurrent Shutdown filter tdSD_HS 15 19 23 µs P_4.4.22
time
Open Load Detection Current IOLD1_HS -15 -8 -3 mA - P_4.4.23
2)
Open Load Detection filter time tOLD1_HS 2000 3000 4000 µs P_4.4.24
Output Protection and Diagnosis of low-side (LS) channels of half-bridge output
LS Overcurrent Shutdown ISD_LS 0.9 1.2 1.5 A See Figure 6 P_4.4.27
Threshold
2)
Difference between shutdown ILIM_LS - 0 0.6 1.2 A ILIM_LS ≥ ISD_LS P_4.4.28
and limit current ISD_LS Figure 6
2)
Overcurrent Shutdown filter tdSD_LS 15 19 23 µs P_4.4.29
time
Open Load Detection Current IOLD_LS 3 8 15 mA - P_4.4.30
2)
Open Load Detection filter time tOLD_LS 2000 3000 4000 µs P_4.4.31
Outputs OUT(1...n) leakage current
HS leakage current in off state IQLHn_NOR -2 -0.5 – µA VOUTn = 0V ; EN=High P_4.4.32
HS leakage current in off state IQLHn_SLE -2 -0.5 – µA VOUTn = 0V; EN=GND P_4.4.33
LS Leakage current in off state IQLLn_NOR – 0.5 2 µA VOUTn = VS ; EN=High P_4.4.34
LS Leakage current in off state IQLLn_SLE – 0.5 2 µA VOUTn = VS ; EN=GND P_4.4.35
Output Switching Times. See Figure 7 and Figure 8.
Slew rate of high-side and low- dVOUT/ dt 0.1 0.45 0.75 V/µs Resistive load = P_4.4.36
side outputs 100Ω; VS=13.5V 3)
Output delay time high side tdONH 5 20 35 µs Resistive load = P_4.4.37
driver on 100Ω to GND
Output delay time high side tdOFFH 15 45 75 µs Resistive load = P_4.4.38
driver off 100Ω to GND
Output delay time low side tdONL 5 20 35 µs Resistive load = P_4.4.39
driver on 100Ω to VS
Output delay time low side tdOFFL 15 45 75 µs Resistive load = P_4.4.40
driver off 100Ω to VS
Cross current protection time, tDHL 100 130 160 µs Resistive load = P_4.4.41
high to low 100Ω2)
Datasheet 14 1.0
2017-12-07
TLE94103EP
Table 5 Electrical Characteristics, VS =5.5 V to 20 V, VDD = 3.0V to 5.5V, Tj = -40°C to +150°C, EN= HIGH,
IOUTn= 0 A; Typical values refer to VDD = 5.0 V, VS = 13.5 V and TJ = 25 °C unless otherwise
specified; all voltages with respect to ground, positive current flowing into pin (unless
otherwise specified) (cont’d)
Parameter Symbol Values Unit Note or Number
Min. Typ. Max. Test Condition
Cross current protection time, tDLH 100 130 160 µs Resistive load = P_4.4.42
low to high 100Ω2)
Input Interface: Logic Input EN
High-input voltage VENH 0.7 * – VDD V – P_4.4.43
VDD
Low-input voltage VENL 0 – 0.3 * V – P_4.4.44
VDD
2)
Hysteresis of input voltage VENHY – 500 – mV P_4.4.45
Pull down resistor RPD_EN 20 40 70 kΩ VEN = 0.2 x VDD P_4.4.46
SPI frequency
2) 4)
Maximum SPI frequency fSPI,max – – 5.0 MHz P_4.4.47
SPI INTERFACE: Delay Time from EN rising edge to first Data in
2)
Setup time tset – – 150 µs See Figure 12 P_4.4.48
SPI INTERFACE: Input Interface, Logic Inputs SDI, SCLK, CSN
H-input voltage threshold VIH 0.7 * – VDD V – P_4.4.50
VDD
L-input voltage threshold VIL 0 – 0.3 * V – P_4.4.51
VDD
2)
Hysteresis of input voltage VIHY – 500 – mV P_4.4.52
Pull up resistor at pin CSN RPU_CSN 20 40 70 kΩ VCSN = 0.7 x VDD P_4.4.53
Pull down resistor at pin SDI, RPD_SDI, 20 40 70 kΩ VSDI, VSCLK = 0.2 x VDD P_4.4.54
SCLK RPD_SCLK
Input capacitance at pin CSN, CI – 10 15 pF 0V < VDD < 5.25V 2) P_4.4.55
SDI or SCLK
Input Interface, Logic Output SDO
H-output voltage level VSDOH VDD - VDD - VDD V ISDOH = -1.6 mA P_4.4.56
0.4 0.2
L-output voltage level VSDOL 0 0.2 0.4 V ISDOL = 1.6 mA P_4.4.57
Tri-state Leakage Current ISDOLK -1 – 1 µA VCSN = VDD; P_4.4.58
0V < VSDO < VDD
2)
Tri-state input capacitance CSDO – 10 15 pF P_4.4.59
Data Input Timing. See Figure 13 and Figure 15.
2)
SCLK Period tpCLK 200 – – ns P_4.4.60
2)
SCLK High Time tSCLKH 0.45 * – 0.55 * ns P_4.4.61
tpCLK tpCLK
2)
SCLK Low Time tSCLKL 0.45 * – 0.55 * ns P_4.4.62
tpCLK tpCLK
Datasheet 15 1.0
2017-12-07
TLE94103EP
Table 5 Electrical Characteristics, VS =5.5 V to 20 V, VDD = 3.0V to 5.5V, Tj = -40°C to +150°C, EN= HIGH,
IOUTn= 0 A; Typical values refer to VDD = 5.0 V, VS = 13.5 V and TJ = 25 °C unless otherwise
specified; all voltages with respect to ground, positive current flowing into pin (unless
otherwise specified) (cont’d)
Parameter Symbol Values Unit Note or Number
Min. Typ. Max. Test Condition
2)
SCLK Low before CSN Low tBEF 125 – – ns P_4.4.63
2)
CSN Setup Time tlead 250 – – ns P_4.4.64
2)
SCLK Setup Time tlag 250 – – ns P_4.4.65
2)
SCLK Low after CSN High tBEH 125 – – ns P_4.4.66
2)
SDI Setup Time tSDI_setup 30 – – ns P_4.4.67
2)
SDI Hold Time tSDI_hold 30 – – ns P_4.4.68
2)
Input Signal Rise Time at pin trIN – – 50 ns P_4.4.69
SDI, SCLK, CSN
2)
Input Signal Fall Time at pin SDI, tfIN – – 50 ns P_4.4.70
SCLK, CSN
2)
Delay time from EN falling edge tDMODE – – 8 µs P_4.4.71
to standby mode
2)
Minimum CSN High Time tCSNH 5 – – µs P_4.4.72
Data Output Timing. See Figure 13.
SDO Rise Time trSDO – 30 80 ns Cload = 40pF 2) P_4.4.73
2)
SDO Fall Time tfSDO – 30 80 ns Cload = 40pF P_4.4.74
2)
SDO Enable Time after CSN tENSDO – – 75 ns Low Impedance P_4.4.75
falling edge
SDO Disable Time after CSN tDISSDO – – 75 ns High Impedance 2) P_4.4.76
rising edge
2)
Duty cycle of incoming clock at dutySCLK 45 – 55 % P_4.4.77
SCLK
SDO Valid Time for VDD = 3.3V tVASDO3 – 70 95 ns VSDO < 0.2 x VDD P_4.4.78
VSDO > 0.8 x VDD
Cload = 40pF 2)
SDO Valid Time for VDD = 5V tVASDO5 – 50 65 ns VSDO < 0.2 x VDD P_4.4.79
VSDO > 0.8 VDD
Cload = 40pF 2)
Thermal warning & Shutdown
Thermal warning junction TjW 120 135 150 °C See Figure 92) P_4.4.80
temperature
Thermal shutdown junction TjSD 160 175 190 °C See Figure 92) P_4.4.81
temperature
2)
Thermal comparator hysteresis TjHYS – 4 – °C P_4.4.82
2)
Difference between TjSD -TjW TjSD -TjW – 40 – °C P_4.4.120
1) IS_HSON does not include the load current
2) Not subject to production test, specified by design
Datasheet 16 1.0
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TLE94103EP
Datasheet 17 1.0
2017-12-07
TLE94103EP
Characterization results
4 Characterization results
Performed on 5 devices, over operating temperature and nominal/extended supply range.
P_4.4.1 P_4.4.4
2.9 0.3
2.4 0.25
1.9 0.2
ISQ [uA]
IS[mA]
1.4 0.15
0.9 0.1
0.4 0.05
-0.1 0
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
P_4.4.2 P_4.4.5
0.7 0.7
0.6
0.5 0.65
0.4
IDD_Q[uA]
IDD[mA]
0.3 0.6
0.2
0.1 0.55
-0.1 0.5
-50 -30 -10 10 30 50 70 90 110 130 150 -50 0 50 100 150
Junction Temperature [°C] Junction Temperature [°C]
VS=5.5V VS=13.5V VS=18V VS=20V VS=22V VS=5.5V VS=13.5V VS=18V VS=20V VS=22V
Datasheet 18 1.0
2017-12-07
TLE94103EP
Characterization results
P_4.4.16/P_4.4.17 P_4.4.16/P_4.4.17
1500 1600
1400 1500
1300 1400
1300
1200
RDSON_LS [mΩ]
RDSON_HS [mΩ]
1200
1100
1100
1000
1000
900
900
800 800
700 700
600 600
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
VS=5.5V VS=13.5V VS=18V VS=20V VS=22V VS=5.5V VS=13.5V VS=18V VS=20V VS=22V
1200
RDSON_LS [mΩ]
1100
1100
1000
1000
900 900
800 800
700 700
600 600
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
Datasheet 19 1.0
2017-12-07
TLE94103EP
Characterization results
P_4.4.36 P_4.4.36
0.60 0.60
0.55 0.55
0.50 0.50
dVOUT/ dt [V/us]
dVOUT/ dt [V/us]
0.45 0.45
0.40 0.40
0.35 0.35
0.30 0.30
0.25 0.25
0.20 0.20
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
VS=5.5V VS=13.5V VS=18V VS=20V VS=22 VS=5.5V VS=13.5V VS=18V VS=20V VS=22V
Slew rate OFF of high-side outputs Slew rate OFF of low-side outputs
P_4.4.36 P_4.4.36
0.55 0.65
0.60
0.50
0.55
0.45
0.50
dVOUT/ dt [V/us]
dVOUT/ dt [V/us]
0.40 0.45
0.35 0.40
0.35
0.30
0.30
0.25
0.25
0.20 0.20
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
VS=5.5V VS=13V5 VS=18V VS=20V VS=22V VS=5.5V VS=13.5V VS=18V VS=20V VS=22V
Datasheet 20 1.0
2017-12-07
TLE94103EP
Characterization results
P_4.4.20 P_4.4.27
-1120 1240
1220
-1140
1200
-1160
ISD_HS [mA]
ISD_LS [mA]
1180
-1180
1160
-1200
1140
-1220
1120
-1240 1100
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
VS=5.5V VS=13.5V VS=18V VS=20V VS=22V VS=5.5V VS=13.5 VS=18V VS=20V VS=22V
P_4.4.8 P_4.4.9
5.05 4.64
4.62
5
4.6
VUV_OFF [V]
VUV_ON [V]
4.58
4.95
4.56
4.54
4.9
4.52
4.85 4.5
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
Datasheet 21 1.0
2017-12-07
TLE94103EP
Characterization results
P_4.4.12 P_4.4.11
22.8 23.6
22.7 23.5
22.6 23.4
22.5 23.3
VOV_OFF [V]
VOV_ON [V]
22.4 23.2
22.3 23.1
22.2 23
22.1 22.9
22.0 22.8
21.9 22.7
-50 -30 -10 10 30 50 70 90 110 130 150 -50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C] Junction Temperature [°C]
P_4.4.14/P_4.4.15
2.68
2.66
2.64
VDD threshold [V]
2.62
2.60
2.58
2.56
2.54
-50 -30 -10 10 30 50 70 90 110 130 150
Junction Temperature [°C]
Datasheet 22 1.0
2017-12-07
TLE94103EP
General Description
5 General Description
Datasheet 23 1.0
2017-12-07
TLE94103EP
General Description
a) GND b) VBAT
D RP
CS2 CS
HSx HSx
OUTx OUTx
LSx LSx
I RB
VBAT GND
Datasheet 24 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
6 Half-Bridge Outputs
Datasheet 25 1.0
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TLE94103EP
Half-Bridge Outputs
Datasheet 26 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
Datasheet 27 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
VS | IHS |
I ILIM_HS I
ON I ILIM_HS - ISD_HS I
OUTn
I ISD_HS I
Short to GND
t
tdSD_ HS
Short condition on High-Side Switch
VS VS ILS
ILIM_ LS
Short to Supply ILIM_ LS - ISD_LS
ISD_LS
OUTn
ON
t
tdSD_LS
Short condition on Low-Side Switch
Datasheet 28 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
Table 7 Control and Status register bit state in the event of an overcurrent condition for an
activated power switch
BEFORE DURING AFTER
REGISTER REGISTER NAME Bit OVERCURRENT OVERCURRENT OVERCURRENT
TYPE Bit State Bit State Bit State
Control HB_ACT_CTRL_n HBn_HS_EN 1 1 1 (corresponding
HBn_LS_EN half-bridge
deactivated)
Status SYS_DIAG_1: LE 0 0 1
Global Status 1
Status SYS_DIAG_x HBn_HS_OC 0 0 1
where x=2 HBn_LS_OC
Datasheet 29 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
6.2.2 Cross-Current
In bridge configurations the high-side and low-side power transistors are ensured never to be simultaneously
“ON” to avoid cross currents. This is achieved by integrating delays in the driver stage of the power outputs to
create a dead-time between switching off of one power transistor and switching on of the adjacent power
transistor within the half-bridge. The dead times, tDHL and tDLH, as shown in Figure 7 case 3 and Figure 8 case
3, have been specified to ensure that the switching slopes do not overlap with each other. This prevents a cross
conduction event.
CSN
t
Case 1: Delay Time High Side Driver OFF
VOUT_HSx [V]
Previous State Æ New State
HS ON Æ HS OFF VS
80%
tdOFFH 1)
LS OFF Æ LS OFF
20%
GND 1) t
Delay time HS OFF
tdONL2)
LS OFF Æ LS ON
20%
GND t
2)
Delay time LS ON without dead time ; HS previously OFF
Case 3: Delay Time Low Side Driver ON with tDHL dead time
VOUT_LSx [V]
Previous State Æ New State
HS ON Æ HS OFF
VS
80%
Low-Side 3)
ON tdONL + tDHL
LS OFF Æ LS ON
delay time
20%
GND t
3)
Delay time LS ON with dead time ; HS previously ON
Datasheet 30 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
CSN
t
Case 1: Delay Time High Side Driver OFF
VOUT_LSx [V]
Previous State Æ New State
HS OFF Æ HS OFF VS
80%
LS ON Æ LS OFF tdOFFL1)
20%
GND t
1)
Delay time LS OFF
tdONH2)
LS OFF Æ LS OFF
20%
GND t
2)
Delay time HS ON without dead time ; LS previously OFF
Case 3: Delay Time High Side Driver ON with tDLH dead time
HS OFF Æ HS ON
VS
80%
High-Side
LS ON Æ LS OFF ON tdONH + tDLH3)
delay time
20%
GND t
3)
HS ON delay time with dead time ; LS previously ON
Datasheet 31 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
Tj
TjSD
TjW
VOUTx
Output is switched off if
ON TjSD is reached, can be
reactivated if TSD bit is
High Z cleared
no error
t
Datasheet 32 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
Table 8 Control and Status register bit state in the event of an overtemperature condition for an
activated power switch
Tj < TjW Tj > TjW Tj > TjSD Tj < TjSD - TjHYS
REGISTER REGISTER NAME Bit Bit State Bit State Bit State Bit State
TYPE
Control HB_ACT_CTRL_n HBn_HS_EN 1 1 1 ‘1’ (outputs
HBn_LS_EN (all outputs are latched off
are latched unless error is
off) cleared)
Status SYS_DIAG_1: Global TPW 0 1 1 ‘0’ if error is
status 1 (latched) (latched) cleared and
Tj < TjW , else ‘1’
Status SYS_DIAG_1: Global TSD 0 0 1 ‘0’ if error is
status 1 (latched) cleared, else
‘1’
6.2.4.1 VS Undervoltage
In the event the supply voltage VS drops below the switch off voltage VUV OFF, all output stages are switched off,
however, the logic information remains intact and uncorrupted. The VS under-voltage error bit, VS_UV,
located in SYS_DIAG_1: Global Status 1 status register, will be set and latched. If VS rises again and reaches the
switch on voltage VUV ON threshold, the power stages will automatically be activated. The VS_UV error bit
should be cleared to verify if the supply disruption is still present. See Figure 10.
6.2.4.2 VS Overvoltage
In the event the supply voltage VS rises above the switch off voltage VOV OFF, all output stages are switched off.
The VS over-voltage error bit, VS_OV, located in SYS_DIAG_1: Global Status 1 status register, will be set and
latched. If VS falls again and reaches the switch on voltage VOV ON threshold, the power stages will automatically
be activated. The VS_OV error bit should be cleared to verify if the overvoltage condition is still present. See
Figure 10.
Datasheet 33 1.0
2017-12-07
TLE94103EP
Half-Bridge Outputs
VS
VOV HY
VOV OFF
VOV ON
VUV HY
High Z t High Z t
SPI command : SPI command
VS_UV error bit Clear SYS _DIAG1 VS_OV error bit Clear SYS_DIAG1
High High
Low Low
t t
Datasheet 34 1.0
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TLE94103EP
CSN high to low: SDO is enabled. Status information transferred to output shift register
CSN
time
CSN low to high: data from shift register is transferred to output functions
SCLK
time
LSB Actual data MSB New data
SDI 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0 1
+ +
time
SDI: will accept data on the falling edge of SCLK signal
Actual status New status
SDO GEF 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 GEF 0 1
+ + +
time
SDO will change state on the rising edge of SCLK signal
Figure 11 SPI Data Transfer Timing (note the reversed order of LSB and MSB as shown in this figure
compared to the register description)
SPI messages are only recognized if a minimum set time, tSET, is observed upon rising edge of the EN pin
(Figure 12).
Datasheet 35 1.0
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TLE94103EP
EN EN
tSET
SPI SPI
0.8V DD
SCLK
0.2V DD
tSDI_setup tSDI_hold
0.8V DD
SDI 0.2V DD
0.8V DD
SDO 0.2V DD
Note: The SDI pin of all devices in daisy chain or non daisy chain mode must be Low at the beginning of the
SPI frame (between the CSN falling edge and the first SCLK rising edge).
It is possible to check if the TLE94103EP has detected a fault by reading the GEF without SPI clock pulse
(Figure 14).
Datasheet 36 1.0
2017-12-07
TLE94103EP
CSN
time
SCLK 0
time
SDI 0
time
High Impedance High Impedance
SDO Global Error Flag
time
Note: The Global Error Flag is a logic OR combination of every bit of the Global Status Register with the
exception of NPOR: GEF = (SPI_ERR) OR (LE) OR (VS_UV) OR (VS_OV) OR (NOT(NPOR)) OR (TSD) OR
(TPW). It is possible to mask open load failures from the Global Error Flag by setting the OL_BLANK
bit (refer to Chapter 7.6).
The following table shows how failures are reported in the Global Status Register and by the Global Error Flag.
Table 9 Failure reported in the Global Status Register and Global Error Flag
Type of Error Failure reported in the Global Global Error Flag
Status Register
SPI protocol error SPI_ERR = 1 1
Open load or Overcurrent LE = 1 11)
VS Undervoltage VS_UV = 1 1
VS Overvoltage VS_OV = 1 1
Power ON Reset NPOR = 0 1
Thermal Shutdown TSD = 1 1
Datasheet 37 1.0
2017-12-07
TLE94103EP
Table 9 Failure reported in the Global Status Register and Global Error Flag
Type of Error Failure reported in the Global Global Error Flag
Status Register
Thermal Warning TPW = 1 1
No Error and no Power ON Reset SPI_ERR = 0 0
LE = 0
VS_UV = 0
VS_OV = 0
NPOR = 1
TSD = 0
TPW = 0
1) Open load errors are reported in the Global Error Flag only if OL_BLANK bit is set to 0.
Note: The default value (after Power ON Reset) of NPOR is 0, therefore the default value of GEF is 1.
Datasheet 38 1.0
2017-12-07
TLE94103EP
Correct incoming clock signal Correct clock during CSN rising edge
CSN
time
t BEF tlead tlag t BEH
SCLK
time
CSN
time
SCLK is High with CSN falling edge
SCLK
time
CSN
Clock is High with CSN rising edge time
SCLK
time
Figure 15 Clock Polarity Error
Datasheet 39 1.0
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TLE94103EP
In an independent slave configuration, the microcontroller controls the CSN of each slave individually
(Figure 16).
SCLK
SCLK
CSN
CSN
CSN
MCSN1
MCSN2
MCSN3
MCLK
MO
MI
Each SPI communication starts with one address byte followed by one data byte (Figure 17).The LSB of the
data byte must be set to ‘1’.The address bytes specifies:
• the type of operation: READ ONLY (OP bit =0) or READ/ WRITE (OP bit = 1) of the configuration bits, and
READ ONLY (OP bit =0)or READ & CLEAR (OP bit = 1) of the status bits.
• The target register address (A[6:2])
The Last Address Byte Token bit (LABT, Bit1 of the address byte) must be set to 1, as no daisy chain
configuration is used.
While the microcontroller sends the address byte on SDI, SDO shifts out GEF and the Global Status Register.
A further data byte (Bit15...8) is allocated to either configure the half-bridges or retrieve status information of
the TLE94103EP.
Datasheet 40 1.0
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TLE94103EP
SD0 SPI_
0 TPW TSD NPOR VS_OV VS_UV LE D0 D1 D2 D3 D4 D5 D6 D7
ERR
Time
The in-frame response characteristic enables the microcontroller to read the contents of the addressed
register within the SPI command. See Figure 17.
Datasheet 41 1.0
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TLE94103EP
Note: The signal on the SDI pin of the first IC in daisy chain (and in non-daisy chain mode), must be Low at
the beginning of the SPI frame (between CSN falling edge and the first SCLK rising edge). This is
because each Global Error Flag in daisy chain operation is implemented in OR logic.
The Master Input (MI), which is connected to the SDO of the last device in the daisy chain receives:
• A logic OR combination of all Global Error Flags (GEF), at the beginning of the SPI frame, between CSN
falling edge and the first SCLK rising edge
• The logic OR combination of the GEFs is followed by the Global Status Registers in reverse order. In other
words MI receives first the Global Status Register of the last device of the daisy chain
• Once all Global Status Registers are received, MI receives the response bytes corresponding to the
respective address and data bytes in reverse order. For example, if the daisy chain consists of three devices
with SDO or TLE941xy_3 connected to MI, the master receives first the Response Byte 3 of TLE941xy_3
(corresponding to Address Byte 3 and Data Byte 3) followed by the Response Byte 2 of TLE941xy_2 and
finally the Response Byte 1 of TLE941xy_1.
An example of an SPI frame with three devices from the TLE941xy family is shown in Figure 19.
Datasheet 42 1.0
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TLE94103EP
SCLK
SCLK
SCLK
CSN
CSN
CSN
MCSN
MCLK
MI
Figure 18 Example of daisy chain hardware configuration with devices from the TLE941xy family
SCLK 8 CLOCK CYCLES 8 CLOCK CYLES 8 CLOCK CYCLES 8 CLOCK CYLES 8 CLOCK CYCLES 8 CLOCK CYLES
0
CSN
SDI2 = SDO1
GEF1 GLOBAL STATUS 1 ADDRESS BYTE 2 ADDRESS BYTE 3 RESPONSE 1 DATA BYTE 2 DATA BYTE 3
SDI3 = SDO2 OR
GEF1/2
GLOBAL STATUS 2 GLOBAL STATUS 1 ADDRESS BYTE 3 RESPONSE 2 RESPONSE 1 DATA BYTE 3
MI =SDO3 OR
GEF1/2/3
GLOBAL STATUS 3 GLOBAL STATUS 2 GLOBAL STATUS 1 RESPONSE 3 RESPONSE 2 RESPONSE 1
Time
Like in the individual slave configuration, it is possible to check if one or several TLE941xy have detected a fault
condition by reading the logic OR combination of all the Global Error Flags when CSN goes Low without any
clock cycle (Figure 20).
Datasheet 43 1.0
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TLE94103EP
SCLK
0
CSN
MO = SDI1 0
Figure 20 Global Error Flag with zero SCLK clock cycle in daisy chain consisting only of TLE941xy
devices
Note: Some SPI protocol errors such as the LSB of an address byte is wrongly equal to 0, may be reported
in the SPI_ERR bit of another device in the daisy chain (refer to Chapter 7.1.3 and Chapter 7.7 for
more details on SPI_ERR). In this case some devices might accept wrong data during the corrupted
SPI frame. Therefore if one of the devices in the daisy chain reports an SPI error, it is recommended
to verify the content of the registers of all devices.
If a new failure occurs after the transfer of the data byte(s), i.e. between the end of the last address byte and
the CSN rising edge, this failure will be reported in the next SPI frame (see example in Figure 21).
CSN
End of the New failure
address byte detection Read status byte
corresponding to the failure
SDO Failure is NOT notified in this SPI frame Failure notified in the new SPI frame
HiZ HiZ
GEF GLOBAL STATUS DATA BYTE GEF GLOBAL STATUS DATA BYTE
Time
Figure 21 Status register change during transfer of data byte - Example in independent slave
configuration
Datasheet 44 1.0
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TLE94103EP
No information is lost, even if a status register is changed during a SPI frame, in particular during a Read and
Clear command. For example:
• the microcontroller sends a Read and Clear command to a status register
• the TLE94103EP detects during the transfer the data byte(s) a new fault condition, which is normally
reported in the target status register
The incoming Clear command will be ignored, so that the microcontroller can read the new failure in the
subsequent SPI frames.
Data inconsistency between the Global Status Register (see Chapter 7.7) and the data byte (status register)
within the same SPI frame is possible if:
• an open load or overcurrent error is detected during the transfer of the data byte
• the target status register corresponds to the new detected failure
In this case the new failure:
• is not reported in the Global Status Register of the current SPI frame but in the next one
• is reported in the data byte of the current SPI frame
Refer to Figure 21.
Datasheet 45 1.0
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TLE94103EP
SPI Frame 1
Overcurrent failure detected on HS of HB 1 SPI frame: Read SYS _DIAG2 (OC error of HB 1-4)
SDI LABT A2 A3 A4 A5 A6 OP
1 X X X X X X X X
=1 =0 =0 =1 =1 =0 =0
Load Error bit (Overcurrent or Open Load ) HB1_HS_OC reports the new
does not report the new Overcurrent failure Overcurrent failure on the HS of HB 1
Inconsistency between Global Status Register
and target Status Register
Time
Figure 22 Example of inconsistency between Global Error Flag and Status Register when a status bit is
changed during the transfer of an address byte
Datasheet 46 1.0
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TLE94103EP
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
8 Address Bits [A7…0]
8 Data Bits [D7…D0]
Access
for Configuration & Status Information
type
Note: LABT: Last Address Bit Token, refer to Chapter 7.2 and Chapter 7.3.
Datasheet 47 1.0
2017-12-07
Note:
Datasheet
Figure 24
TLE94103EP
15 14 13 12 11 10 9 8 7 6 5 4 3 2
CONTROL REGISTERS
HB_ACT_1_CTRL reserved reserved HB3_HS_EN HB3_LS_EN HB2_HS_EN HB2_LS_EN HB1_HS_EN HB1_LS_EN read/write 0 0 0 0 0
FM_CLK_CTRL FM_CLK_MOD1 FM_CLK_MOD0 reserved reserved reserved reserved reserved reserved read/write 0 1 1 0 0
OLBLK_CTRL OL_BLANK reserved reserved reserved reserved reserved reserved reserved read/write 1 1 0 1 0
CONTROL
REGISTERS
48
CONFIG_CTRL reserved reserved reserved reserved reserved DEV_ID2 DEV_ID1 DEV_ID0 read 1 1 0 0 1
ST AT US REGIST ERS
SYS_DIAG_1 : Global status 1 SPI_ERR LE VS_UV VS_OV NPOR TSD TPW 0 read/clear 0 0 1 1 0
SYS_DIAG_2 : OP ERROR_1_STAT reserved reserved HB3_HS_OC HB3_LS_OC HB2_HS_OC HB2_LS_OC HB1_HS_OC HB1_LS_OC read/clear 1 0 1 1 0
STATUS
REGISTERS
SYS_DIAG_3 : OP ERROR_2_STAT reserved reserved HB3_HS_OL HB3_LS_OL HB2_HS_OL HB2_LS_OL HB1_HS_OL HB1_LS_OL read/clear 0 0 0 0 1
LABT: Last Address Bit Token, refer to Chapter 7.2 and Chapter 7.3.
1.0
2017-12-07
TLE94103EP
Datasheet 49 1.0
2017-12-07
TLE94103EP
HB_ACT_1_CTRL
Half-bridge output control 1 (Address Byte [OP] 000 00[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
rw rw rw rw rw rw rw rw
r
Note: The simultaneous activation of both HS and LS switch within a half-bridge is prevented by the
digital block to avoid cross current. If both LS_EN and HS_EN bits of a given half-bridge are set, the
logic turns off this half-bridge.
Datasheet 50 1.0
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TLE94103EP
FM_CLK_CTRL
Frequency modulation select (Address Byte [OP]011 00[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
FM_CLK_ FM_CLK_
Reserved Reserved Reserved Reserved Reserved Reserved
MOD1 MOD0
rw rw rw rw rw rw rw rw
r
Datasheet 51 1.0
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TLE94103EP
OLBLK_CTRL
Open load blanking setting (Address Byte [OP]110 10[LABT]1)B
D7 D6 D5 D4 D3 D2 D1 D0
rw rw rw rw rw rw rw rw
r
Datasheet 52 1.0
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TLE94103EP
CONFIG_CTRL
Device Configuration control (Address Byte [OP]110 01[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
r r r r r r r r
r
Datasheet 53 1.0
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TLE94103EP
Datasheet 54 1.0
2017-12-07
TLE94103EP
SYS_DIAG1
Global status 1 (Address Byte [OP]001 10[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
rc r rc rc rc rc rc r
r
Note: The LE bit in the Global Status register is read only. It reflects an OR combination of the respective
open load and overcurrent errors of the half-bridge channels. If all OC/ OL bits of the respective high-
side and low-side channels are cleared to ‘0’, the LE bit will be automatically updated to ‘0’.
Datasheet 55 1.0
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TLE94103EP
SYS_DIAG_2 : OP_ERROR_1_STAT
Overcurrent error status of half-bridge outputs 1 - 4 (Address Byte [OP]101 10[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
rc rc rc rc rc rc rc rc
r
Datasheet 56 1.0
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TLE94103EP
SYS_DIAG_3 : OP_ERROR_2_STAT
Open load error status of half-bridge outputs 1 - 4 (Address Byte [OP]000 01[LABT]1B)
D7 D6 D5 D4 D3 D2 D1 D0
rc rc rc rc rc rc rc rc
r
Datasheet 57 1.0
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TLE94103EP
Application Information
8 Application Information
Note: The following simplified application examples are given as a hint for the implementation of the
device only and shall not be regarded as a description or warranty of a certain functionality,
condition or quality of the device. The function of the described circuits must be verified in the real
application.
VBAT VS
VBAT
47µF 100nF
100nF
I Q VDD VDD VS
Mirror
adjustment
TLE 4678
µC TLE94103EP motors
OUT 1
N.C. D INH EN
X
RADJ W
VDD
OUT 2
SDO
Series resistors are 10kΩ
recommended if the VS of
SDI Y
the TLE94103EL is protected RO
by an active reverse polarity
protection CSN OUT 3
SCLK
Landing pads for ceramic GND GND GND
capacitors at OUTx
Datasheet 58 1.0
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TLE94103EP
Application Information
4. Not used (NU) pins and unused outputs are recommended to be left unconnected (open) in the application. If
NU pins or unused output pins are routed to an external connector which leaves the PCB, then these outputs
should have provision for a zero ohm jumper (depopulated if unused) or ESD protection. In other words, NU
and unused pins should be treated like used pins.
5. Place bypass ceramic capacitors as close as possible to the VS pins, with shortest connections the GND pins
and GND layer, for best EMC performance
Datasheet 59 1.0
2017-12-07
TLE94103EP
Application Information
80 2s2p / -40°C
2s2p / +85°C
60
40
20
0
0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 10000
time [sec]
15
Zth-jc [K/W]
10
Tamb = -40°C
5
Tamb = +85C
0
0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
time [sec]
Datasheet 60 1.0
2017-12-07
TLE94103EP
Application Information
00B: OFF
01B: FM CLK=15.625 kHZ
10B: FM CLK=31.25 kHz
11B: FM CLK=62.5 kHz
Datasheet 61 1.0
2017-12-07
TLE94103EP
Package Outlines
9 Package Outlines
Datasheet 62 1.0
2017-12-07
TLE94103EP
Revision History
10 Revision History
Datasheet 63 1.0
2017-12-07
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