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Development of a Photoelectrochemical Cell (PEC) using Si based (In)GaN Nanowires for Hydrogen production by Splitting of Water under Visible Light View project
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Comment on “Optical investigations of AlGaN on GaN epitaxial films” [Appl. Phys. Lett. 74, 2456 (1999)]
Appl. Phys. Lett. 75, 2334 (1999); 10.1063/1.125007
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Synthesis, Morphology and Optical Properties of GaN and
AlGaN Semiconductor Nanostructures
B. Kuppulingam, Shubra Singh and K. Baskar*
Abstract. Hexagonal Gallium Nitride (GaN) and Aluminum Gallium Nitride (AlGaN) nanoparticles were synthesized
by sol-gel method using Ethylene Diamine Tetra Acetic acid (EDTA) complex route. Powder X-ray diffraction (PXRD)
analysis confirms the hexagonal wurtzite structure of GaN and Al0.25Ga0.75N nanoparticles. Surface morphology and
elemental analysis were carried out by Scanning Electron Microscope (SEM) and Energy Dispersive X-ray spectroscopy
(EDX). The room temperature Photoluminescence (PL) study shows the near band edge emission for GaN at 3.35 eV
and at 3.59 eV for AlGaN nanoparticles. The Aluminum (Al) composition of 20% has been obtained from PL emission
around 345 nm.
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indexed on the basis of a hexagonal unit cell of space presence of Al, Ga, N and O elements. However the
group P63mc, suggesting that the sample is single presence of O peaks indicate the unavoidable surface
phase without any impurity in good agreement with oxidation during synthesis process. Figure 2.(a,b)
reported values. The PXRD pattern of Al0.25Ga0.75N shows SEM image of GaN nanoparticle synthesized at
sample shows 0.2º shift towards higher angle which is 900 ºC. The surface morphology of GaN showed
due to incorporation of Al content in the GaN crystal agglomerated flower like spherical shaped structures
lattice. This confirms that the lattice parameter of consisting of nanoparticles. The average size of the
Al0.25Ga0.75N is lower than the pure GaN which is agglomerated spherical structures was about 800 nm.
consistent with literature. When small amount of Al Figure 2.(c,d) shows SEM image of AlGaN
content was added to pure GaN the (002) peak nanoparticles synthesized at 900 ºC. The surface
intensity decreases. All diffraction peaks were morphology of nanoparticles is strongly dependent on
broadened due to nano-sized effects. The crystallite concentration of Al. When Al is incorporated in to
size was calculated by means of Debye-Scherrer pure GaN the spherical nanoparticles changes to rod
equation. The calculated crystalline size for GaN is like morphology.
about 20 nm and for AlGaN it is about 13 nm. For
Room-temperature photoluminescence spectra
Al0.25Ga0.75N nanoparticle all the diffraction peaks
were recorded using spectra physics HORIBA JOBIN
were broadened compared with GaN nanoparticle
spectrometer Ar+ ion laser second harmonic generation
which can be attributed to the decrease in crystallite
operated at 244 nm with a power of 0.2 W/cm2. Fig. 3a
size.
shows the PL spectrum of pure GaN nanoparticle. The
near-band-edge emission was observed at 376 nm. The
wide and broad emission relative to the band edge
transition may result from surface states associated
with non-perfect surface termination or from defect
states caused by nitrogen deficiencies. Fig. 3b shows
the PL spectrum of Al0.25Ga0.75N nanoparticle. For
Al0.25Ga0.75N a shift in PL peak towards higher energy
is observed.
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CONCLUSION
Semiconductor wurtzite GaN and AlGaN
nanoparticles were prepared by sol-gel method. The
crystalline structure was analyzed by XRD and the
chemical purity of as-synthesized nanoparticles was
confirmed by EDX measurement. The surface
morphology changes from spherical to rod like
nanostructure. Room temperature PL exhibits the
broad near band edge emission at 376 nm for GaN
nanoparticles and 345 nm for AlGaN nanoparticles.
REFERENCES
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