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Technische Universität München

Defect Classification and Defect Types


Revisited

Stefan Wagner
Technische Universität München, Germany

Dr. Stefan Wagner Fakultät für Informatik Lehrstuhl für Software & Systems Engineering
DEFECTS ‘08, 20.07.2008
Technische Universität München

The Real Defect-Detection Process

Defect-Detection

Description

Priority Defect
Defect
Database
Status

Number of open
/closed defects Analysis
Technische Universität München

The Ideal Defect-Detection Process

Defect-Detection Severity

Effort

Trigger Defect
Defect
Database
Type

Mode

QA Optimisation
Empirical Analysis

Quality Model Defect Distributions


Technische Universität München

State of the Art

•  Defect Taxonomies
–  Implementation solution
–  Beizer
•  Root Cause Analysis
–  Analysis of developer mistakes
–  Fault prevention
–  IBM
•  Defect Classification
–  Classification along several dimensions
–  IEEE Std 1044-1993
–  IBM‘s ODC
–  HP‘s Defect Origins, Types, and Modes
Technische Universität München

Challenges
•  Different Artefacts
–  Similar classifications?
–  Propagation?
•  Dimensions
–  Basic set?
–  What can be reasonably expected to be documented?
•  Defect Type Distributions
–  General distributions?
–  What factors do they depend on?
–  Domain-specific distributions?
•  Connection to Quality Models
–  What quality attributes are affected?
–  Classifications as part of a quality model or vice versa?
•  How can we justify the effort for the quality engineer?
Technische Universität München

Conclusions

•  Useful quality assurance optimisation only possible using defect


classifications intensively
•  We need to
–  find the important dimensions
–  for different artefacts
–  provide empirical data
–  relate classifications to quality models
–  better integrate the classification in the QA process
–  Convince practicioners of the value of defect classification

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