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IRFP260NPbF
HEXFET® Power MOSFET
l Advanced Process Technology
D
l Dynamic dv/dt Rating VDSS = 200V
l 175°C Operating Temperature
l Fast Switching
RDS(on) = 0.04Ω
l Fully Avalanche Rated G
l Ease of Paralleling
l Simple Drive Requirements ID = 50A
S
l Lead-Free
Description
Fifth Generation HEXFETs from International Rectifier utilize
advanced processing techniques to achieve extremely low on-
resistance per silicon area. This benefit, combined with the fast
switching speed and ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer with an
extremely efficient and reliable device for use in a wide variety of
applications.
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 0.50
RθCS Case-to-Sink, Flat, Greased Surface 0.24 ––– °C/W
RθJA Junction-to-Ambient ––– 40
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08/18/10
IRFP260NPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 200 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.26 ––– V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.04 Ω VGS = 10V, ID = 28A
VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 27 ––– ––– S VDS = 50V, ID = 28A
––– ––– 25 VDS = 200V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– 250 VDS = 160V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -20V
Qg Total Gate Charge ––– ––– 234 ID = 28A
Qgs Gate-to-Source Charge ––– ––– 38 nC VDS = 160V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 110 VGS = 10V
td(on) Turn-On Delay Time ––– 17 ––– VDD = 100V
tr Rise Time ––– 60 ––– ID = 28A
ns
td(off) Turn-Off Delay Time ––– 55 ––– RG = 1.8Ω
tf Fall Time ––– 48 ––– VGS = 10V
Between lead, D
LD Internal Drain Inductance ––– 5.0 –––
6mm (0.25in.)
nH
from package G
––– ––– 50
(Body Diode) showing the
A
ISM Pulsed Source Current integral reverse G
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 28A, VGS = 0V
trr Reverse Recovery Time ––– 268 402 ns TJ = 25°C, IF = 28A
Qrr Reverse Recovery Charge ––– 1.9 2.8 µC di/dt = 100A/µs
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by ISD ≤ 28A, di/dt ≤ 486A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. TJ ≤ 175°C
Starting TJ = 25°C, L = 1.5mH Pulse width ≤ 400µs; duty cycle ≤ 2%.
RG = 25Ω, IAS = 28A.
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IRFP260NPbF
1000 1000 VGS
VGS
TOP 15V TOP 15V
10V 10V
8.0V 8.0V
7.0V 7.0V
6.0V 6.0V
5.5V 5.5V
100 5.0V 100 5.0V
BOTTOM 4.5V BOTTOM 4.5V
4.5V
10 10
4.5V
1 1
1000 3.5
ID = 50A
RDS(on) , Drain-to-Source On Resistance
I D , Drain-to-Source Current (A)
3.0
2.5
100
(Normalized)
TJ = 175 ° C
2.0
1.5
TJ = 25 ° C
10
1.0
0.5
V DS = 50V
20µs PULSE WIDTH VGS = 10V
1 0.0
4.0 5.0 6.0 7.0 8.0 9.0 10.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( ° C)
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IRFP260NPbF
8000 16
VGS = 0V, f = 1 MHZ ID = 28A
Ciss = Cgs + Cgd, Cds SHORTED V DS= 160V
Ciss
5000
4000 8
Coss
3000
2000 4
Crss
1000
0 0
0 50 100 150 200
1 10 100 1000
QG , Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)
1000 1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
ISD , Reverse Drain Current (A)
100
ID , Drain Current (A)
10 100us
TJ = 25 ° C
10
1ms
1
TC = 25 °C 10ms
TJ = 175 °C
V GS = 0 V Single Pulse
0.1 1
0.2 0.6 1.0 1.4 1.8 2.2 1 10 100 1000
VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V)
-
ID , Drain Current (A)
10V
30
30 Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
VDS
10 90%
10
0
0 25 50 75 100 125 150 175
25 50 T 75
, Case100 125
Temperature (150
° C) 175 10%
C
TC , Case Temperature ( ° C) VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Fig 10b. Switching Time Waveforms
Case Temperature
1
Thermal Response(Z thJC )
D = 0.50
0.20
0.1
0.10
0.05
0.02
0.01 SINGLE PULSE
(THERMAL RESPONSE) PDM
0.01
t1
t2
Notes:
1. Duty factor D = t1 / t 2
2. Peak TJ = P DM x Z thJC + TC
0.001
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
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IRFP260NPbF
1500
RG D.U.T +
V
- DD
IAS A
20V
tp 0.01Ω
500
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS
tp 0
25 50 75 100 125 150 175
Starting TJ , Junction Temperature ( ° C)
I AS
50KΩ
12V .2µF
QG .3µF
10 V +
V
D.U.T. - DS
QGS QGD
VGS
VG 3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
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IRFP260NPbF
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG • dv/dt controlled by RG +
• Driver same type as D.U.T. V DD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
VGS=10V *
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% ISD
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IRFP260NPbF
TO-247AC Package Outline
Dimensions are shown in millimeters (inches)
20.30 (.800)
19.70 (.775) 5.50 (.217) NOTES:
2X
4.50 (.177) 1 DIMENSIONING & TOLERANCING
PER ANSI Y14.5M, 1982.
1 2 3 2 CONTROLLING DIMENSION : INCH.
3 CONFORMS TO JEDEC OUTLINE
-C- TO-247-AC.
14.80 (.583)
4.30 (.170)
14.20 (.559)
3.70 (.145)
LEAD ASSIGNMENTS
Hexfet IGBT
2.40 (.094) 1.40 (.056) 0.80 (.031) 1 -LEAD
GateASSIGNMENTS
1 - Gate
2.00 (.079) 3X 1.00 (.039) 3X 0.40 (.016) 1 - GATE2 - Collector
2 - Drain
2X 2 - DRAIN
0.25 (.010) M C A S 2.60 (.102) 3 - Source 3 - Emitter
3 - SOURCE
5.45 (.215) 2.20 (.087) 4 - Drain
4 - DRAIN4 - Collector
3.40 (.133)
2X 3.00 (.118)
Notes:
1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/
2. For the most current drawing please refer to IR website at http://www.irf.com/package/
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.08/2010
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