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Confidential 1(43)

TEST REQUIREMENTS
Document number Revision
1/1524-1/FCP 101 2777/3 Uen C
Prepared by Date
SEM/BGJ YOSHIHIRO NISHIMURA 2004-08-02
Contents responsible if other than preparer Remarks
This document is managed in metaDoc.
Approved by
SEM/BGJ (KAZUO MURATA)

Tamao Baseband Test Requirement

Contents
1 General.............................................................................................. 3
1.1 Information......................................................................................... 3
1.2 Revision history ................................................................................. 3
1.3 Reference documents........................................................................ 4
1.4 Classification of tests ......................................................................... 5
1.5 Test Environment............................................................................... 5
1.6 Power Supply .................................................................................... 5
1.7 Test points ......................................................................................... 6
1.8 Test signals ....................................................................................... 7
1.9 Measurement Accuracy ..................................................................... 7
1.10 Test Loads......................................................................................... 7
1.11 Current measurements ...................................................................... 7
1.12 Powering off the phone (POFF) ......................................................... 7
2 Tests.................................................................................................. 7
2.1 Measure current before the SW activated .......................................... 7
2.2 Test program startup current.............................................................. 8
2.3 Idle current measurement .................................................................. 9
2.4 Sleep Control..................................................................................... 9
2.5 Battery Voltage calibration ............................................................... 10
2.6 Current Calibration........................................................................... 10
2.7 Fuel Gauge calibration..................................................................... 12
2.8 PHF microphone bias voltage .......................................................... 15
2.9 AFMS _L drive capacity test ............................................................ 15
2.10 SIM Communication ........................................................................ 16
2.11 RTC Accuracy ................................................................................. 16
2.12 BDATA Test..................................................................................... 17
2.13 CTS ................................................................................................. 18
2.14 RTS ................................................................................................. 19
2.15 Backup Capacitor DC Voltage ......................................................... 19
2.16 IrDA loopback test ........................................................................... 20
2.17 RED LED ......................................................................................... 21
2.18 Flash LED........................................................................................ 21
2.19 Key LED .......................................................................................... 21
2.20 Key function check........................................................................... 22
2.21 PSRAM............................................................................................ 23
2.22 NAND .............................................................................................. 24
2.23 EPSON............................................................................................ 24

Note: Any hard copy of this document is for reference only. Due to template and application dependencies the header and footer may fail to display correct data. It is
the responsibility of the user to ensure that they have a correct and valid version. Any outdated hard copy is invalid and must be removed from possible use.
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2.24 Jack Open/Close detection .............................................................. 25


2.25 Vibrator check.................................................................................. 26
2.26 Camera cover Open/Close detection ............................................... 26
2.27 LCD back light check ....................................................................... 27
2.28 LCD bright spot/dark spot/dust check .............................................. 27
2.29 LCD VCOM value adjustment .......................................................... 28
2.30 Camera Check Overview ................................................................. 29
2.31 Camera Connect.............................................................................. 30
2.32 Picture Quality ................................................................................. 31
2.33 Memory Stick Duo ........................................................................... 37
2.34 FM Radio Audio Output level & frequency ....................................... 38
2.35 FM Radio S/N 30dB Sensitivity level................................................ 39
2.36 Search Mode Check ........................................................................ 40
2.37 Receiver Loudness Check ............................................................... 42
2.38 Loudspeaker Loudness Check......................................................... 42
2.39 Audio loop back test ........................................................................ 43
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1 General
1.1 Information

This document contains the test specification for the baseband part of the Tamao
transceiver board.

Changes from Cora’s test specification are marked with red font.

1.2 Revision history

Revisions of this document is rev A.

PA2 -> PA3

Date Detail

18,May,2004 “1.7 Test points” – Ref.Des. changed.

18,May,2004 “2.41 Microphone Sensitivity Check” added.

18,May,2004 “2.42 Receiver Loudness Check” added.

18,May,2004 “2.43 Loudspeaker Loudness Check” added.

18,May,2004 “2.44 Audio loop back test” added.

18,May,2004 “2.14 Backup Capacitor DC Voltage (First)” renamed.

18,May,2004 “2.45 Backup Capacitor DC Voltage (Second)” added.

PA3 -> PA4

24,May,2004 “2.33 White Spots Correction” : Sequence and Limitation changed.

24,May,2004 “2.35 Snap Shot” : Deleted

24,May,2004 “2.1 Measure current before the SW activated” added.

24,May,2004 “2.41 Microphone Sensitivity Check” : Deleted.

24,May,2004 “2.15 Back up Capacitor DC Voltage (First)” : Renamed and limits changed.

24,May,2004 “2.46 Back up Capacitor DC Voltage (Second)” : Deleted.

24,May,2004 “2.36 Memory Stick Duo” : Sequence changed.

PA4 -> PA5

24,May,2004 “ 2.31 LCD VCOM value adjustment” : Sequence changed.

PA5 -> PB1

24,May,2004 “ 2.1 Measure current before SW activated” : Sequence changed.

PB1 -> PB3


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21,Jun,2004 “ 2.2 Test Program start up current” : Commands added.

21,Jun,2004 “ 2.7.1 Fuel gauge calibration – SLEEP_OFF” : Power supply voltage changed.

PB3 -> PB5

23,Jun,2004 “ 2.22 Loud Speaker check” : Deleted.

23,Jun,2004 “ 2.18 RED LED” : Limit changed.

23,Jun,2004 “ 2.19 Flash LED” : Limit changed.

23,Jun,2004 “ 2.20 Key LED” : Limit changed.

23,Jun,2004 “ 2.27 Vibrator check” : Limit changed.

23,Jun,2004 “ 2.29 LCD back light check” : Limit changed.

23,Jun,2004 “ 2.30 bright spot/dark spot/dust check” : Purpose changed.

23,Jun,2004 “ 2.35 Picture Quality” : Limit changed.

23,Jun,2004 “ 2.37 FM Radio Audio Output level & frequency” : Sequence changed.

23,Jun,2004 “ 2.38 FM Radio S/N ratio” : Deleted.

23,Jun,2004 “ 2.39 FM Radio S/N 30dB Sensitivity level” : Sequence changed.

23,Jun,2004 “ 2.40 FM Radio Stereo Channel Separation” : Deleted.

23,Jun,2004 “ (2.38) Search Mode Check” : Added.

23,Jun,2004 “ 2.7.1 Fuel gauge calibration – SLEEP_OFF” : Power supply voltage changed.

PB5 -> PC1

30,July,2004 “ 2.38 Loudspeaker Loudness Check” : Limit fixed.

30,July,2004 “ 2.39 Audio loop back test” : Limit fixed.

30,July,2004 “ 2.32 Picture Quality” : Limit sample picture and Test command added.

2,Aug,2004 “2,34 FM Radio Audio Output level & frequency” : Some commands added.

2,Aug,2004 “2.35 FM Radio Sensitivity level” : Limit changed.

2,Aug,2004 “2.** AD TEMP” : Deleted.

2,Aug,2004 “2.** White Spots Correction” : Deleted.

2,Aug,2004 “2.19 Key LED” : Commands changed.

1.3 Reference documents

Programmer’s reference Cora Test Program


1553 - CXC 125 813
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Product specification for Marita Compact: 1301-ROP 101 3049/1.


SEMC part number: ROP 101 3049/1.
Ericsson part number: ROP 101 041/1.

Product specification for Vincenne: 1301-ROP 101 3057/1.


SEMC part number: ROP 101 3057/1.
Ericsson part number: ROP 101 3029/2C.

Product specification for Herta: 1301-ROP 101 3065/1.


SEMC part number: ROP 101 3065/1.
Ericsson part number: ROP 101 1120/11.

Product specification for BT : 1301-RYT 123 907/1.

Product specification for FM radio: 1301-RYT 109 905/1.

System Connector specification : 1/159 35-FCP 101 1989.

1.4 Classification of tests

1. Calibration: these tests are mandatory for functionality.

2. Required tests

3. Optional: Test that not is required, but useful as extra testing if needed.

4. R&D tests: tests performed during the initial phase of the production to gather
statistics for R&D. These tests are not intended to be used in full production.

1.5 Test Environment

Min Typ Max Unit

Temperature 15 25 35 °C

Relative humidity 20 - 75 %

ESD 100 V

1.6 Power Supply

Min Typ Max Unit

VBATT 3.6 3.7 3.8 V

VPPFLASH 11.7 12.0 12.6 V


(only to be applied in
the tests that need
VPPFLASH, no
overshoot allowed)

Current limit for VBATT set to 400mA, VPPFLASH set to 100mA


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Important!!! The 12V programming voltage is not required and should therefore not
be applied during the normal tests in this document, unless otherwise specified in
each test description.

Important!!! When VPPFLASH shall be applied it is very important that the


following sequences are followed (otherwise can the flash memories be destroyed):

Power Up
Apply VBATT.
Start phone.
Delay long enough for VMEM (internal board voltage) to stabilize.
Apply VPPFLASH

Power Down
Remove VPPFLASH
Delay long enough for VPPFLASH to reach 0V.
Shut down phone.
Remove VBATT.

1.7 Test points

Listed test points are available for production tests:


Ref. Des. Name Comment
JL420,JL401 GND Battery connector
JL421 BDATA Battery connector
JL403,JL402 VBATT Battery connector
JL410 DCIO System connector
JL412 DGND System connector
JL411 VPPFLASH System connector
JL416 FM_ANTENNA System connector
JL414 CFMS System connector
JL413 AFMS_L_CTMS System connector
CN403:7 DFMS_DM System connector
CN403:8 DTMS_DP System connector
JL415 CTS_ON System connector
JL417 AFMS_R_RTS System connector
JL418 ATMS System connector
JL407 SIMVCC SIM connector
JL408 SIMCONRST SIM connector
JL409 SIMCONCLK SIM connector
JL419 SIMCONDAT SIM connector
MIC700:1 Mic + Microphone pad
MIC700:2 Mic - Microphone pad
JL700 EARP + Earphone
JL701 EARP - Earphone
JL600 SPEAK + Speaker
JL601 SPEAK - Speaker

There are a lot of SP available for service as well.

The following connectors are available:


Ref. Des. Name Comment
CN400 Battery connector
CN403 System connector
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CN401 SIM holder


CN003 Key connector
CN004 Harness #1 To LCD Flex
CN005 Harness #2 To LCD Flex
CN002 Camera connector

1.8 Test signals

Accuracy for input test signals:

Voltage ±1%
Current ±5%
Frequency ±5%

1.9 Measurement Accuracy

The measurement accuracy for instruments used during tests should apply to the
recommendation in the GSM and UMTS specification.

The current measurement accuracy shall be less than ±2% ±0.01mA.

The voltage measurement accuracy shall be less than ±1% ±1mV.

1.10 Test Loads

All resistors used as test loads shall be 1%, 0.25W, unless otherwise stated.

1.11 Current measurements

No external loads are allowed on test points during the current measurements.
Current measurements are performed through VBATT power source if nothing else
is stated.

1.12 Powering off the phone (POFF)

Before the VBATT power source is disconnected the phone must be shut down in a
controlled manner by sending “POFF” to the phone. This must be done in order to
prevent the file system from crashing. After the file system has crashed it may take a
very long time (up to hours?), from the phone has been powered up, until TP,OK is
received.

2 Tests
Most of the tests shall be made on the board itself to find errors early in production.
Some tests can be performed on assembled parts as well.

2.1 Measure current before the SW activated

2.1.1 Classification

Required test
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2.1.2 Purpose

This is a test to find major faults on the board like short circuits. Supply current shall
be limited.

2.1.3 Connection

No external loads are allowed. This current measurement is implemented before the
ITP software activated.

2.1.4 Sequence

This measurement must be implemented after VBATT is connected and before the
software is activated.

2.1.5 Limits

Min Typ Max Unit

Supply current 10 - 500 uA

2.2 Test program startup current

2.2.1 Classification

Required test

2.2.2 Purpose

Measure the power supply current after the test program has started.

2.2.3 Sequence

Wait until “TP,OK” command is received.

PCTR=4,7,1

PDOU=4,7,1 : MS_LDO on

Measure average current.

2.2.4 Limits

Min Typ Max Unit

Supply current 50 60 70 mA
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2.3 Idle current measurement

2.3.1 Classification

Required test

2.3.2 Purpose

To measure the idle current consumption of the mobile similar to a normal user
case. Much current consuming blocks should be switched off as much as possible.

2.3.3 Sequence

BTFD=1,2 Activate the patches of factory setting to BT_BB

BTHR Bluetooth HCI reset

IDLE=1 Sets as many blocks as possible into sleep.

Measure current at VBATT.

2.3.4 Limits

Phone idle current Min Typ Max Unit

Measured 2 5 7 mA

2.3.5 Post set

IDLE=0,1 Wake up from sleep mode.

The only commands that are guaranteed to work after IDLE has been run, are KILL
and POFF.

2.4 Sleep Control

2.4.1 Classification

Required test

2.4.2 Purpose

Test the signals (SLEEP and CLKREQ) to the sleep control in Vincenne.

2.4.3 Sequence

SCRT Run test.

2.4.4 Limits

To pass the test shall the response: “SCRT:, OK” be received.


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2.5 Battery Voltage calibration

2.5.1 Classification

Calibration

2.5.2 Purpose

Calibration of voltage table. Some voltage measurements in the remaining test will
be done with calculated voltage levels by this test.

2.5.3 Connection

During the calibration the accuracy of the voltage of VBATT must be within ±0.015V

2.5.4 Sequence

LVBA= 0 Reset local values in the test program.

Set VBATT voltage to 3.20V

LVBA= 5,0x140 Read low voltage level from ADC.

Set VBATT voltage to 4.1V

LVBA= 5,0x19A Read high voltage level from ADC.

LVBA=1 Store local values into GDFS.

LVBA=3 View and record values stored in GDFS.

2.5.5 Limits

Voltage level on VBATT Min Typ Max Unit

3.2 1C 27 33 HEX

28 39 51 DEC

4.1 71 7C 87 HEX

113 124 135 DEC

2.5.6 Post set

Reset power supply voltage (VBATT) to nominal value.

2.6 Current Calibration

2.6.1 Classification

Calibration
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2.6.2 Purpose

Calibrate current for charger algorithm.

2.6.3 Connection

Connect DCIO (JL410) to 5.2 V, 1 A.

2.6.4 Sequence

LIMS=0 Reset local variables in test program.

LIMS=6,1 Select charging with 100 mA current limit.

Measure current flowing into DCIO (JL410).

LIMS=5,XXH Read and store values measured on DCIO and by ADC,


where xxH is measured current in mA on DCIO.

LIMS=6,8 Select charging with 800 mA current limit.

Measure current flowing into DCIO (JL410).

LIMS=5,YYH Read and store values measured on DCIO and by ADC,


where yyH is measured current in mA on DCIO.

LIMS=1 Write calibrated values into NVM.

LIMS=3 View and record values.

2.6.5 Limits

Calculate difference between current measured by ADC (DEC) and current


measured on DCIO (DEC),

Difference ( DEC ) = ADC current ( DEC ) DCIO current ( DEC ) .

Conversion to DEC representation should be done according to,

current ( mA)
= current ( DEC ) .
6.67

Selected charge Min Typ Max Unit


current.

100 mA Difference -6 0 16 DEC

DCIO current 50 100 150 mA

800 mA Difference -16 0 16 DEC

DCIO current 700 800 900 mA


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2.6.6 Post set

Reset supply voltage to nominal value.

2.7 Fuel Gauge calibration

This test is divided into three sub-tests, SLEEP_OFF, SLEEP_ON and CHARGING.
Each sub-test should be performed when the phone is in a mode that sets the
current to a value that is suitable for the test.

2.7.1 Fuelgauge calibration – SLEEP_OFF

2.7.1.1 Classification

Calibration

2.7.1.2 Purpose

To calibrate the consumed current measurement in normal operation in


SLEEP_OFF mode.

2.7.1.3 Connection

The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%.

A power source set to 3.45V and limited to 1A should be connected to DCIO (JL410)
during the test.

2.7.1.4 Sequence

I2CW=0x94,0x60,0x98 Enable watchdog in Vincenne.

I2CW=0x94,0x61,0x30 Enable low resistive mode in Vincenne and charge FET.

Connect DCIO (JL410) to a power source set to 3.6V and limit the current to 1A.

LFUG=3 Copy global data values to local.

Measure the VBATT current consumption IVBATT.

LFUG=5,0,<IVBATT Decimal indication> Calibrate and calculate LSB.

Check response (LFUG:<Calibrated LSB for SLEEP_OFF>,<Diff_sleep>,OK)


against limits. If fail repeat the calibration.

LFUG=1 Store local values to global data.

2.7.1.5 Limits

Min Typ Max Unit

LSB SLEEP_OFF Readout (hex) 1F4 258 2BC 10uAs/LSB

Difference between Readouts* 0 16-32 80 LSB


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Current limit 400 1000 mA

* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between two of the readouts is more than 80, this calibration point
should be run again. The risk that this occurs again is negligible.

2.7.1.6 Post set

Disconnect DCIO (JL410) from the power source.

2.7.2 Fuelgauge calibration – SLEEP_ON

2.7.2.1 Classification

Calibration

2.7.2.2 Purpose

To calibrate the consumed current measurement in normal operation in SLEEP_ON


mode.

2.7.2.3 Connection

The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%

2.7.2.4 Sequence

LFUG=3 Copy global data values to local.

Measure the VBATT current consumption IVBATT.

LFUG=5,2,<IVBATT Decimal indication > Calibrate and calculate LSB.

Check response (LFUG:<Calibrated LSB for SLEEP_ON>,<Diff_sleep>,OK) against


limits. If fail repeat the calibration.

LFUG=1 Store local values to global data.

2.7.2.5 Limits

Min Typ Max Unit

LSB SLEEP_ON Readout (hex) 1F4 258 2BC 10uA/LSB

Difference between Readouts* 0 8-16 40 LSB

Current limit 30 100 mA


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* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between any of the readouts is more than 40, this calibration point
should be run again. The risk that this occurs again is negligible.

2.7.3 Fuelgauge calibration – CHARGING

2.7.3.1 Classification

Calibration

2.7.3.2 Purpose

To calibrate the consumed current measurement during battery charging.

2.7.3.3 Connection

The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%

A power source set to 4.3V and limited to 1A should be connected to DCIO (JL410)
to simulate charging.

2.7.3.4 Sequence

Connect DCIO (JL410) to a power source set to 4.3V and limit the current to 1A.

LFUG=6,8 Start charging with charging current set to 800mA.

Measure the net VBATT current consumption IVBATT.

LFUG=5,1,<IVBATT Decimal indication > Calibrate and calculate LSB.

Check response (LFUG:<Calibrated LSB for CHARGING>,<Diff_charge>,OK)


against limits. If fail repeat the calibration.

LFUG=1 Write local table to GDFS.

2.7.3.5 Limits

Min Typ Max Unit

LSB CHARGING Readout (hex) 1F4 258 2BC 10uA/LSB

Difference between Readouts* 0 16-32 80 LSB

Current limit 400 1000 mA

* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between two of the readouts is more than 80, this calibration point
should be run again. The risk that this occurs again is negligible.
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2.7.3.6 Post Set

LFUG=6,0 Set charging current to 0mA.

Disconnect DCIO.

2.8 PHF microphone bias voltage

2.8.1 Classification

Required test

2.8.2 Purpose

Check the microphone bias voltage on ATMS.

2.8.3 Connection

Measure with 2,2 kOhm between ATMS(JL418) and GND in the system connector.

2.8.4 Sequence

AUDC=8,1 Change audio path

Measure the voltage both side of the resister 2.2kohm.

2.8.5 Limits

Voltage Min Typ Max Unit

0.8 1.0 1.2 V

2.9 AFMS _L drive capacity test

2.9.1 Classification

Required test

2.9.2 Purpose

AFMS_L drive capacity test

2.9.3 Connection

Measure with 33Ohm between AFMS_L (JL413) and GND in the system connector.

2.9.4 Sequence

Audio input from ATMS (JL418). The signal is 1kHz and 150mVrms.

AULO=2,1,1,0

AUDC=0x18,1
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PCTR=0,7,1

PDOU=0,7,1

2.9.5 Limits

Voltage Min Typ Max Unit

200 400 600 mVrms

2.10 SIM Communication

2.10.1 Classification

Required test

2.10.2 Purpose

SIM communication functional test.

2.10.3 Connection

TestSIM.

2.10.4 Sequence

3V SIM :

SICT perform communication test

2.10.5 Limits

Response from test program: 0,OK

2.11 RTC Accuracy

2.11.1 Classification

Calibration.

2.11.2 Purpose

Measure the frequency of the RTC crystal clock using the calibrated 13MHz clock as
reference. Calculate and store the required calibration values to get correct time
from the RTC clock (the day time).

2.11.3 Connection

No connection necessary. Internal test. The 13MHz clock must be calibrated before
this test.
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2.11.4 Sequence

LRTC=0x0 Reset local table.

LRTC=0x9 Perform the entire calibration and store in local table.

LRTC=0x1 Write compensation parameters into GDFS.

LRTC=0x2 View local table.

Returned string: LRTC:<p1>,<p2>,<p3>,<p4>, ok

2.11.5 Limits

The crystal frequency can be calculated from the result returned from the calibration
with LRTC=0x2. The last three parameters must be concatenated and regarded as
one 24 bit unsigned word. The following formula is used to calculate the frequency:

13,000,000
FCrystal = * 32,768
< p 2 >< p3 >< p 4 >

Example:

The calibration returns: 1B0 C6 5C 55 and the frequency is then:

13,000,000
* 32,768 = 32,768.5924 Hz
C 65C 55 HEx

Min Typ Max Unit

At room temp. 32766.8 32768 32769.2 Hertz

2.12 BDATA Test

2.12.1 Classification

Required.

2.12.2 Purpose

Functional test of the Vincenne BDATA current source.

2.12.3 Connection

Connect 100 kOhm between BDATA(CN400:3) and ground.


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2.12.4 Sequence

PWMC=0xA,3 Resistor mode. 15 µA source turned on.

LBDA=0 Reset local table in TP to default.

LBDA=5 Read BDATA voltage with GPAD B.

LBDA=2 View local table.

2.12.5 Limits

Connected Min Typ Max Unit


resistor

100 kOhm A/D 6E 87 AA HEX


@ 15 uA. BDATA
110 135 170 DEC

2.13 CTS

2.13.1 Classification

Required test.

2.13.2 Purpose

Test the connection between the system connector and Marita Compact.

2.13.3 Connection

Probe on system connector CTS_ON(JL415).

2.13.4 Sequence

MEMW=1,0xF9000044,0x5515 Set GPIO23 to port functionality.

PCTR=2,3,1 GPIO23 as output.

PDOU=2,3,1 GPIO23 high.

Measure the voltage at JL415. Check for low level.

PDOU=2,3,0 GPIO23 low

Measure the voltage at JL415. Check for high level.

2.13.5 Limits

Condition Min Typ Max Unit


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CTS high 3.2 3.5 3.8 VDC

CTS low 0.0 0.007 0.5 VDC

2.13.6 Post set

PCTR=2,3,0 GPIO23 as input(default).

MEMW=1,0xF9000044,0x5555 Reset GPIO23 to CTS functionality.

2.14 RTS

2.14.1 Classification

Required tests

2.14.2 Purpose

Test the connection between the system connector and Marita

2.14.3 Connection

Apply 1.4V at JL417.

2.14.4 Sequence

PCTR=0,0,1 Set GPIO 00 as an output

PDOU=0,0,1 Set GPIO 00 high

PCTR=1,6,0 GPIO16 as input.

PDIN=1,6 Read input. Shall be high.

Apply 1.4V at JL417

PDIN=1,6 Read input. Shall be low..

2.14.5 Limits

The first readout should be 0x1.

The second readout should be 0x0.

2.14.6 Post set

Remove the 1.4V connected to RTS.

PCTR=0,0,0 GPIO 00 as input.

2.15 Backup Capacitor DC Voltage

2.15.1 Classification

Required test

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