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TEST REQUIREMENTS
Document number Revision
1/1524-1/FCP 101 2777/3 Uen C
Prepared by Date
SEM/BGJ YOSHIHIRO NISHIMURA 2004-08-02
Contents responsible if other than preparer Remarks
This document is managed in metaDoc.
Approved by
SEM/BGJ (KAZUO MURATA)
Contents
1 General.............................................................................................. 3
1.1 Information......................................................................................... 3
1.2 Revision history ................................................................................. 3
1.3 Reference documents........................................................................ 4
1.4 Classification of tests ......................................................................... 5
1.5 Test Environment............................................................................... 5
1.6 Power Supply .................................................................................... 5
1.7 Test points ......................................................................................... 6
1.8 Test signals ....................................................................................... 7
1.9 Measurement Accuracy ..................................................................... 7
1.10 Test Loads......................................................................................... 7
1.11 Current measurements ...................................................................... 7
1.12 Powering off the phone (POFF) ......................................................... 7
2 Tests.................................................................................................. 7
2.1 Measure current before the SW activated .......................................... 7
2.2 Test program startup current.............................................................. 8
2.3 Idle current measurement .................................................................. 9
2.4 Sleep Control..................................................................................... 9
2.5 Battery Voltage calibration ............................................................... 10
2.6 Current Calibration........................................................................... 10
2.7 Fuel Gauge calibration..................................................................... 12
2.8 PHF microphone bias voltage .......................................................... 15
2.9 AFMS _L drive capacity test ............................................................ 15
2.10 SIM Communication ........................................................................ 16
2.11 RTC Accuracy ................................................................................. 16
2.12 BDATA Test..................................................................................... 17
2.13 CTS ................................................................................................. 18
2.14 RTS ................................................................................................. 19
2.15 Backup Capacitor DC Voltage ......................................................... 19
2.16 IrDA loopback test ........................................................................... 20
2.17 RED LED ......................................................................................... 21
2.18 Flash LED........................................................................................ 21
2.19 Key LED .......................................................................................... 21
2.20 Key function check........................................................................... 22
2.21 PSRAM............................................................................................ 23
2.22 NAND .............................................................................................. 24
2.23 EPSON............................................................................................ 24
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1 General
1.1 Information
This document contains the test specification for the baseband part of the Tamao
transceiver board.
Changes from Cora’s test specification are marked with red font.
Date Detail
24,May,2004 “2.15 Back up Capacitor DC Voltage (First)” : Renamed and limits changed.
21,Jun,2004 “ 2.7.1 Fuel gauge calibration – SLEEP_OFF” : Power supply voltage changed.
23,Jun,2004 “ 2.37 FM Radio Audio Output level & frequency” : Sequence changed.
23,Jun,2004 “ 2.7.1 Fuel gauge calibration – SLEEP_OFF” : Power supply voltage changed.
30,July,2004 “ 2.32 Picture Quality” : Limit sample picture and Test command added.
2,Aug,2004 “2,34 FM Radio Audio Output level & frequency” : Some commands added.
2. Required tests
3. Optional: Test that not is required, but useful as extra testing if needed.
4. R&D tests: tests performed during the initial phase of the production to gather
statistics for R&D. These tests are not intended to be used in full production.
Temperature 15 25 35 °C
Relative humidity 20 - 75 %
ESD 100 V
Important!!! The 12V programming voltage is not required and should therefore not
be applied during the normal tests in this document, unless otherwise specified in
each test description.
Power Up
Apply VBATT.
Start phone.
Delay long enough for VMEM (internal board voltage) to stabilize.
Apply VPPFLASH
Power Down
Remove VPPFLASH
Delay long enough for VPPFLASH to reach 0V.
Shut down phone.
Remove VBATT.
Voltage ±1%
Current ±5%
Frequency ±5%
The measurement accuracy for instruments used during tests should apply to the
recommendation in the GSM and UMTS specification.
All resistors used as test loads shall be 1%, 0.25W, unless otherwise stated.
No external loads are allowed on test points during the current measurements.
Current measurements are performed through VBATT power source if nothing else
is stated.
Before the VBATT power source is disconnected the phone must be shut down in a
controlled manner by sending “POFF” to the phone. This must be done in order to
prevent the file system from crashing. After the file system has crashed it may take a
very long time (up to hours?), from the phone has been powered up, until TP,OK is
received.
2 Tests
Most of the tests shall be made on the board itself to find errors early in production.
Some tests can be performed on assembled parts as well.
2.1.1 Classification
Required test
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2.1.2 Purpose
This is a test to find major faults on the board like short circuits. Supply current shall
be limited.
2.1.3 Connection
No external loads are allowed. This current measurement is implemented before the
ITP software activated.
2.1.4 Sequence
This measurement must be implemented after VBATT is connected and before the
software is activated.
2.1.5 Limits
2.2.1 Classification
Required test
2.2.2 Purpose
Measure the power supply current after the test program has started.
2.2.3 Sequence
PCTR=4,7,1
PDOU=4,7,1 : MS_LDO on
2.2.4 Limits
Supply current 50 60 70 mA
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2.3.1 Classification
Required test
2.3.2 Purpose
To measure the idle current consumption of the mobile similar to a normal user
case. Much current consuming blocks should be switched off as much as possible.
2.3.3 Sequence
2.3.4 Limits
Measured 2 5 7 mA
The only commands that are guaranteed to work after IDLE has been run, are KILL
and POFF.
2.4.1 Classification
Required test
2.4.2 Purpose
Test the signals (SLEEP and CLKREQ) to the sleep control in Vincenne.
2.4.3 Sequence
2.4.4 Limits
2.5.1 Classification
Calibration
2.5.2 Purpose
Calibration of voltage table. Some voltage measurements in the remaining test will
be done with calculated voltage levels by this test.
2.5.3 Connection
During the calibration the accuracy of the voltage of VBATT must be within ±0.015V
2.5.4 Sequence
2.5.5 Limits
3.2 1C 27 33 HEX
28 39 51 DEC
4.1 71 7C 87 HEX
2.6.1 Classification
Calibration
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2.6.2 Purpose
2.6.3 Connection
2.6.4 Sequence
2.6.5 Limits
current ( mA)
= current ( DEC ) .
6.67
This test is divided into three sub-tests, SLEEP_OFF, SLEEP_ON and CHARGING.
Each sub-test should be performed when the phone is in a mode that sets the
current to a value that is suitable for the test.
2.7.1.1 Classification
Calibration
2.7.1.2 Purpose
2.7.1.3 Connection
The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%.
A power source set to 3.45V and limited to 1A should be connected to DCIO (JL410)
during the test.
2.7.1.4 Sequence
Connect DCIO (JL410) to a power source set to 3.6V and limit the current to 1A.
2.7.1.5 Limits
* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between two of the readouts is more than 80, this calibration point
should be run again. The risk that this occurs again is negligible.
2.7.2.1 Classification
Calibration
2.7.2.2 Purpose
2.7.2.3 Connection
The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%
2.7.2.4 Sequence
2.7.2.5 Limits
* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between any of the readouts is more than 40, this calibration point
should be run again. The risk that this occurs again is negligible.
2.7.3.1 Classification
Calibration
2.7.3.2 Purpose
2.7.3.3 Connection
The phone should be in a mode where a constant current is consumed. During the
calibration the current must not vary more than ± 0.5%
A power source set to 4.3V and limited to 1A should be connected to DCIO (JL410)
to simulate charging.
2.7.3.4 Sequence
Connect DCIO (JL410) to a power source set to 4.3V and limit the current to 1A.
2.7.3.5 Limits
* Note: There is a small risk for miscounts in the Fuelgauge. If this occurs during
calibration it may cause large errors in the current consumption measurements. If
the difference between two of the readouts is more than 80, this calibration point
should be run again. The risk that this occurs again is negligible.
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Disconnect DCIO.
2.8.1 Classification
Required test
2.8.2 Purpose
2.8.3 Connection
Measure with 2,2 kOhm between ATMS(JL418) and GND in the system connector.
2.8.4 Sequence
2.8.5 Limits
2.9.1 Classification
Required test
2.9.2 Purpose
2.9.3 Connection
Measure with 33Ohm between AFMS_L (JL413) and GND in the system connector.
2.9.4 Sequence
Audio input from ATMS (JL418). The signal is 1kHz and 150mVrms.
AULO=2,1,1,0
AUDC=0x18,1
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PCTR=0,7,1
PDOU=0,7,1
2.9.5 Limits
2.10.1 Classification
Required test
2.10.2 Purpose
2.10.3 Connection
TestSIM.
2.10.4 Sequence
3V SIM :
2.10.5 Limits
2.11.1 Classification
Calibration.
2.11.2 Purpose
Measure the frequency of the RTC crystal clock using the calibrated 13MHz clock as
reference. Calculate and store the required calibration values to get correct time
from the RTC clock (the day time).
2.11.3 Connection
No connection necessary. Internal test. The 13MHz clock must be calibrated before
this test.
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2.11.4 Sequence
2.11.5 Limits
The crystal frequency can be calculated from the result returned from the calibration
with LRTC=0x2. The last three parameters must be concatenated and regarded as
one 24 bit unsigned word. The following formula is used to calculate the frequency:
13,000,000
FCrystal = * 32,768
< p 2 >< p3 >< p 4 >
Example:
13,000,000
* 32,768 = 32,768.5924 Hz
C 65C 55 HEx
2.12.1 Classification
Required.
2.12.2 Purpose
2.12.3 Connection
2.12.4 Sequence
2.12.5 Limits
2.13 CTS
2.13.1 Classification
Required test.
2.13.2 Purpose
Test the connection between the system connector and Marita Compact.
2.13.3 Connection
2.13.4 Sequence
2.13.5 Limits
2.14 RTS
2.14.1 Classification
Required tests
2.14.2 Purpose
2.14.3 Connection
2.14.4 Sequence
2.14.5 Limits
2.15.1 Classification
Required test