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R. Kanj
Dept. of Electrical and Compute Engineering
American University of Beirut
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Fundamental Design Metrics
Cost $$
Non Recurring Engineering cost (fixed)
- design effort
Recurring Engineering cost (variable)
- cost of parts, assembly, test
Performance
Speed (delay)
Power consumption: energy
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Cost of Integrated Circuits
NRE (non-recurring engineering) costs
Fixed cost to produce the design
Influenced by the design complexity and designer productivity
More pronounced for small volume products
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Cost per IC: $$
NRE cost
cost per IC = RE cost per IC + -----------------
# functional chips
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Silicon Wafer
Wafer
Single die
test
Packaged chip
From http://www.amd.com
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Recurring Costs
cost of wafer
cost of die fabrication = -----------------------------------
dies per wafer × die yield
defects per unit area die area
die yield 1
D A is approximately 3
Y (1 )
100
Yield (%)
80
60
40
20
0 1 2 3 4 5
DxA
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Yield Example
Example
wafer diameter 30 cm, die area of 2.5 cm2, 1 defects/cm2,
= 3 (measure of manufacturing process complexity)
240 dies/wafer (remember, wafers round & dies square)
die yield of 16%
240 x 16% = only 38 dies/wafer die yield !
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Examples of Cost Metrics (1994)
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Now that my chip is fabricated
0 1
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Robustness and Reliability in Digital IC
Noise
Definition: unwanted variations of voltages and currents
at the logic nodes
Where can noise come from on a chip?
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Robustness and Reliability
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Robustness and Reliability
VDD
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Example of Capacitive Coupling
Signal wire glitches as large as 80% of the supply
voltage will be common due to crosstalk between
neighboring wires as feature sizes continue to scale
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Static Gate Behavior
Steady-state behavior of a gate – static behavior – tell
how robust a circuit is with respect to noise disturbances.
VOH = ! (VOL)
Vin Vout
VOL = ! (VOH)
VOH = f (VOL)
Vout=Vin
Switching Threshold
VM
VOL = f (VOH)
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Mapping Logic Levels to the Voltage Domain
Vout
"1" VOH Slope = -1
VOH
VIH
Undefined
Region
Slope = -1
VIL
VOL
"0" VOL
VIL VIH Vin
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Noise Margins
For robust circuits, that tolerate noise, want the “0” and
“1” intervals to be as large as possible
VDD VDD
VOH "1"
NMH = VOH - VIH
VIH
Noise Margin High Undefined
Region
Noise Margin Low VIL
NML = VIL - VOL
VOL
"0"
Gnd Gnd
Gate Output Gate Input
v0 v1 v2 v3 v4 v5 v6
v2
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V (volts)
v0
3
1 v1
-1
0 2 4 6 8 10
t (nsec)
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Conditions for Regeneration
good Low
Distorted Low v0 v1 v2 v3 v4 v5 v6
v1 = f(v0)
f(v) f(v)
v1
good Low
v2
v0 v1
Distorted Low
Regenerative Gate
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Directivity
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The Ideal Inverter
The ideal gate should have
infinite gain in the transition region
a gate threshold located in the middle of the logic swing
high and low noise margins equal to half the swing
input and output impedances of infinity and zero, resp.
Vout
Ri =
Ro = 0
g=- Fanout =
Vin
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Fan-In and Fan-Out
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Performance Metrics - Delay Definitions
Vin Vout
Vin
Propagation delay
input 50% tp = (tpHL + tpLH)/2
waveform
t
tpHL tpLH
Vout
90%
output
50% signal slopes
waveform
10%
t
tf tr
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Modeling Propagation Delay
Model circuit as first-order RC network
vin C
Time to reach 50% point is
t = ln(2) = 0.69
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Ring Oscillator
T = 2 tp N
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Power and Energy Dissipation
Power consumption: how much energy is consumed
per operation and how much heat the circuit dissipates
supply line sizing (determined by peak power)
Ppeak = Vddipeak
battery lifetime (determined by average power dissipation)
p(t) = v(t)i(t) = Vddi(t) Pavg= 1/T p(t) dt = Vdd/T idd(t) dt
packaging and cooling requirements
static power
Independent of switching activity
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Summary
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