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Phased Array Ultrasonic Probe Catalog

Angle Beam Probes Integrated Wedge Probes Immersion Probes Wedges Probe Accessories

920-117D

Olympus NDT
Olympus NDT is a leading global manufacturer of innovative nondestructive testing instruments that are used in a wide range of industrial and research applications including aerospace, energy, automotive, electronics and manufacturing. Olympus NDT instruments contribute to the quality of products and add to the safety of infrastructures and facilities. They include flaw detectors, thickness gages, bond testers, pulser-receivers, transducers, and advanced systems for inline applications. Our leading-edge technologies include ultrasonics, ultrasonic phased array, eddy current, and eddy current array. Olympus NDT offers products and services from several high quality brands: R/D Tech, Panametrics-NDT, NDT Engineering, Sonic, and Nortec. For many decades these brands have earned excellent reputations for providing cost-effective solutions and excellent support and customer service. Based in Waltham, Massachusetts, USA, the company has sales and service centers in all major industrial locations worldwide. Visit www.olympusNDT.com for application support and sales assistance near you.

Warranty
Olympus NDT Inc. offers a one-year warranty on all phased array probes sold. These products are guaranteed against all defects in materials and manufacturing. All products covered by this warranty must be examined by Olympus NDT Inc. and receive their approval in advance before any repairs or replacement are made. Any shipping costs are at the expense of the customer. The warranty excludes defects and deterioration due to normal wear and tear, or caused by an external accident such as: Incorrect assembly Poor maintenance Incorrect usage Exposure to temperatures outside the range of 20 C to 60 C for storage, or 10 C to 40 C for operation Excessive voltage (max. 180 V for 7.5 MHz and below, max. 115 V for 10 MHz and above) Use of unqualified couplant Unforeseen modifications of the product Olympus NDT will honor claims for defective products if submitted within 45 days from the date of shipment, provided that the product has not been improperly used and is subject to its inspection. Olympus NDT Inc. will not be held responsible in any way whatsoever for damage resulting from improper installation, accident or misuse, or from service or modification of the product by anyone other than Olympus NDT Inc. or an authorized Olympus NDT service center. Olympus NDT Inc. will not be held responsible in any way whatsoever for direct, indirect, special, incidental, or consequential damages resulting from possession, use, improper installation, accident, service, modification, or malfunction of the product (including, without limitation, damages for loss of business profits, business interruption, loss of business information, or other pecuniary loss).

ISO 9001 Certification


Olympus NDT Ultrasonic Transducer Inc. facilitys quality system is ISO 9001 certified, ensuring an increased level of quality, a controlled manufacturing process, and continuous improvement.

UNDERSTANDING

Basic Concepts
The distinguishing feature of phased array ultrasonic testing is the computer-controlled excitation (amplitude and delay) of individual elements in a multielement probe. The excitation of multiple piezocomposite elements can generate a focused ultrasonic beam with the possibility of dynamically modifying beam parameters such as angle, focal distance, and focal spot size through software. To generate a beam in phase by means of constructive interference, the various active transducer elements are pulsed at slightly different times. Similarly, the echo from the desired focal point hits the various transducer elements with a computable time shift. The echoes received by each element are time-shifted before being summed together. The resulting sum is an A-scan that emphasizes the response from the desired focal point and attenuates echoes from other points in the test piece.

Acquisition unit

Phased array unit

Types of Probes
Angle Beam

Emitting

Transmitting delays

Receiving

Examples of focal laws


Delay (ns) PA probe Delay (ns) PA probe

Receiving delays and sum

Delay values (left) and depth scanning principles (right) for a 32-element linear array probe focusing at 15-mm, 30-mm, and 60-mm longitudinal waves.
Illustration of beam focusing Illustration of beam steering

Angle beam probes are used with a removable or integrated wedge to transmit a refracted shear or longitudinal wave into a test piece. They are designed for a wide range of applications and can be used to vary the refracted beam angle or the skew of the beam, depending on the wedge orientation. The probe face is acoustically matched to the wedge material.

Scanning Patterns
Electronic linear scanning
With electronic scanning, a single focal law is multiplexed across a group of active elements; scanning is performed at a constant angle and along the phased array probe length (aperture). This is equivalent to a conventional ultrasonic transducer performing a raster scan for corrosion mapping or shear-wave inspection. If an angled wedge is used, the focal laws compensate for different time delays inside the wedge.

Integrated Wedge Sectorial scanning


With sectorial scanning (also called azimuthal or angular scanning), the beam is moved through a sweep range for a specic focal depth, using the same elements; other sweep ranges with different focal depths may be added. The angular sectors may have different values.

Dynamic depth focusing


Dynamic depth focusing (DDF) is a programmable, real-time array response-on-reception accomplished by modifying the delay, gain, and excitation of each element as a function of time. DDF replaces multiple focal laws for the same focal range created by the emitted beam with separate focused beams at the receiving stage. In other words, DDF dynamically changes the focal distance as the signal returns to the phased array probe. DDF signicantly increases the depth of eld and signal-to-noise ratio.

This variation of an angle beam probe integrates the wedge into the probe housing. The wedge conguration is xed but offers smaller overall dimensions.

Near Wall

Electronic linear scanning

Sectorial scanning

Acquisition without DDF

Acquisition with DDF

The near wall probe is specically designed to minimize the dead zone at probe ends by reducing the distance between the last available element and the external edge of the housing. This probe type is useful for composite radius and corner inspections, or any application requiring close contact to a wall using a 0 wedge.

Immersion

Phased Array Probes


Linear arrays are the most commonly used phased array probes for industrial applications. Thus, one of the important features of linear arrays is the active probe aperture. The active aperture (A) is the total active probe length. Aperture length is given by the following formula: A = (n 1) p + e where n = Number of elements in the PA probe p = Elementary pitchdistance between the centers of two adjacent elements e = Element widthwidth of a single piezocomposite element (a practical value is e < /2) g = Gap between adjacent elements =v f where = Wavelength v = Material sound velocity f = Frequency
e

Phased array probes are made in a variety of shapes and sizes for different applications. A few types are illustrated here:

Linear

1.5-D array

2-D array

n=8

Convex

Concave

Annular

Internal focus

p A

Skewing

Variable angle

Dual linear

Dual 1.5-D

Immersion probes are designed to be used with a water wedge or in an immersion tank when the test part is partially or wholly immersed. The water acts as a uniform couplant and delay line. Immersion probes are longitudinal-wave probes that can be set up for refracted shear-wave inspection under water. Immersion probes are mostly intended for automated inspections.

Time-Corrected Gain

Contact
Contact probes are especially designed to be used directly in contact with the inspected material. They are longitudinalwave probes with a resistant wear face acoustically matched to steel.

2-D and 1.5-D Arrays


In order to cover the whole volume of the part with consistency, each focal law has to be calibrated for attenuation and beam spread. This time-correctedgain (TCG) calibration can be performed with a calibration block having several identical reectors (for example, side-drilled holes) at different depths. Using a sectorial scan, the probe is moved back and forth so that each beam hits each reector. The amplitude of each signal is recorded (DAC) and used to construct one TCG curve per focal law. Two-dimensional arrays have multiple strips of linear arrays to allow electronic focusing and steering in both probe axes. 2-D arrays have the same number of elements in both dimensions, whereas 1.5-D identies probes with any combination of uneven numbers of elements. The probes can be used for achieving optimal focusing capability or to cover a dened area without probe movement.

In order to support the growing NDT community, Olympus NDT has published the Understanding Phased Array Technology poster. This poster has been designed by field experts to present phased array technology in a concise and clearly illustrated manner. This poster will become a valuable resource for those who are responding to the large demand for phased array solutions. Get your free poster at www.olympusNDT.com.

Distance-amplitude curves (DAC) used to create the time-corrected gain (TCG)

Once the TCG calibration is completed, each focal law has one individual TCG curve. As a consequence, a reector will always yield the same signal amplitude, regardless of its position inside the part and of the beam that detected it. A defect at 3 mm in depth detected with an angle of 45 degrees will provide the same signal amplitude as if it were at 10 mm and detected at 60 degrees.

Dual Arrays
Two linear or two 1.5-D array probes can be positioned on a roof-angled wedge with a transmitting probe. The probe is paired with a receiving equivalent for optimal performance in noisy materials such as austenitic steel. This conguration is a phased-array equivalent to a dualelement probe in conventional UT and is widely used in the power-generation industry.

Defect Positioning

Olympus NDT Training Academy


RA, PA, DA, and SA readings allow the user to accurately position the defect in real time during an inspection. RA: Reference point to the indication in gate A PA: Probe front face to the indication in gate A DA: Depth of the indication in gate A SA: Sound-path length to the indication in gate A Phased array training is available from professional companies. Visit www.olympusNDT.com

For manual inspections, real-time readings are essential to quickly position the reected signal source with respect to the part geometry and/or probe location.

www.olympusNDT.com The leader in phased array technology for more than a decade

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Table of Contents
Olympus NDT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iv Testing and Documentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v Introduction to Phased Array Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vi

Phased Array Probes


Angle Beam Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 General Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Deep Penetration Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Small-Footprint and Near-Wall Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Weld Inspection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Integrated Wedge Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Immersion Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Wedges for Phased Array Probes


Wedges for Angle Beam Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Wedges for Immersion Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Wedge Offset Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Probe Accessories
Adapters and Extension Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Mini-Wheel Encoder . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Aqualene Elastomer Couplant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

Technical Information
Phased Array Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Books and Training . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

iii

Ordering Information
Numbering System Used to Order Standard Phased Array Probes

5L16-9.6x10-A1-P-2.5-OM
Frequency Array type Number of elements Active aperture Elevation Cable length Cable type Casing type Probe type Connector type

Glossary Used to Order Phased Array Probes


Frequency
1.5 2.25 3.5 5 7.5 10 L EV CC CV A 2D = = = = = = = = = = = = 1.5 MHz 2.25 MHz 3.5 MHz 5 MHz 7.5 MHz 10 MHz linear curvature in elevation concave axial curvature convex axial curvature annular two-dimensional array

Active Aperture Elevation

Active aperture in mm. Refer to page vi for details. Elevation in mm. Example: 10 = 10 mm

Casing size Cable type

Casing size for a given probe type P = PVC outer M = metal armor outer

Cable length

Array type

Number of elements
Example: 16 = 16 elements

Cable length in m. 2.5 = 2.5 m 5= 5m 10 = 10 m

Probe type
A NW PWZ W I = = = = =

angle beam with external wedge near-wall weld inspection angle beam angle beam with integrated wedge immersion

Connector type

OM = OmniScan connector HY = Hypertronics connector OL = OmniScan Connector with conventional UT channel on element 1 (LEMO (00) connector)

Numbering System Used to Order Wedges

SA1-N60S-IHC-AOD8
Wedge type Probe mounting Options Wave type Refracted angle in steel Pipe diameter Curvature type

Glossary Used to Order Wedges


Wedge type
SA00 SA0 SA1 SA2 SA3 SA4 SA5 SNW1 SPWZ1 SPWZ3 = = = = = = = = = = wedge wedge wedge wedge wedge wedge wedge wedge wedge wedge for for for for for for for for for for angle beam probe type A00 angle beam probe type A0 angle beam probe type A1 angle beam probe type A2 angle beam probe type A3 angle beam probe type A4 angle beam probe type A5 near-wall probe type NW1 PipeWIZARD probe type PWZ1 PipeWIZARD probe type PWZ3

Probe mounting

N = normal L = lateral (90 skew) = = = = 0 45 55 60

Refracted angle in steel


0 45 55 60

Wave type

S = shear wave L = longitudinal wave

IHC (optional)

Irrigation, scanner attachment points, and carbide wear pins

Curvature type Pipe diameter

AOD = Axial outside diameter (circumferential scan) COD = Circumferential outside diameter (axial scan)

Measured external pipe diameter in in.


iv

Testing and Documentation


All Olympus phased array probes are rigorously tested to ensure conformance to the highest standards. An extensive database, containing characterization records for each probe sold, is maintained by Olympus NDT. This information can be accessed to compare probe properties. If you have any special testing requirements, please contact Olympus NDT.

Standard Test Form


A Probe Test Data Sheet is supplied with the purchase of any probe. This form presents the following information:
Olympus NDT Ultrasonic Transducers 60 Decibel Road, Suite 300, State College, PA 16801 USA Tel.: (1) (814) 689-1390 Fax: (1) (814) 689-1395
__________________________________________________________________________

Median Waveform
The median waveform graph displays a median pulse-echo response (typical) from the test target. Half of the return pulses from the probe elements will have a peak-peak voltage greater than (or equal to) this median element, and the other half will have a smaller value. Return pulse duration is shown on the horizontal axis (in microseconds) and amplitude is shown on the vertical axis (in V). The number of the median element is shown above the graph (in parentheses).

PROBE TEST DATA SHEET


Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259
Probe Information Summary ___________________________________________________________________________ Frequency : Probe Type : Element Count : 5.0 Mhz Linear Array 64 Housing : Cable Jacket : Cable Length : Connector Type : Active Area Dimensions Length : Elevation : 38.4 mm (1.51 in) 10.0 mm (0.39 in) Matching Medium : Rexolite Pitch : 0.60 mm (0.024 in) Angle Beam PVC 2.5 m (8.2 ft) Omniscan

Median Waveform FFT


Pass Pass Pass [ [ [ ] ] ]

Probe Conformance Summary ___________________________________________________________________________ Parameter Measurement Specification Conformance ___________________________________________________________________________ Average Center Frequency (MHz) Average -6dB Bandwidth (%) Overall Vp-p Sensitivity (dB) Probe Cable Order Checked and Verified Probe Uncoupled Response Checked and Verified Probe Programmable Parameters Checked and Verified 5.03 Mhz 81.8 % 1.4 dB +/- 10.0% (band) > 60% (typical)

The median waveform FFT graph shows the calculated spectrum for the median waveform (see above) over a range of zero MHz to twice the probes nominal frequency.

< 4.0dB (range)

6dB Center Frequency


The 6dB center frequency bar graph displays a calculated center frequency value for each of the probes elements. This value is calculated by using the halfway point (in frequency) of an imaginary line intersecting a given elements spectrum (FFT) data at the 6db level. The average value of all the probes elements is displayed at the top of the graph.

Tester Signature __________________________ June 19, 2006

-6dB Center Freq., Avg = 5. MHz 5.6

Freq. (MHz)

________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259

6dB Percent Bandwidth


1 Elements -6dB % Bandwidth, Avg = 81.8 % 64

4.5

Median Waveform (Element 28) 0.5 100

-0.5 18 Time (us) Median Waveform FFT 0


Magnitude (dB)

50 19 1 Elements 64

The 6dB percent bandwidth bar graph displays a calculated percent bandwidth value for each of the probes elements. This value is determined by using the length (in frequency) of an imaginary line intersecting a given elements spectrum (FFT) data at the 6db level and calculated as a percentage of the center frequency. The average value of all the probes elements is displayed at the top of the graph.

Bandwidth (%)

Amplitude (V)

Pk-to-Pk Sensitivity, Avg = -45.9 dB 3.0


Magnitude (dB)

Peak-to-Peak Sensitivity
1 Elements 64

-48 0 Frequency (MHz) 10

-3.0

____________________________________________

AVG MAX MIN RANGE ______________________________ Center Frequency (MHz) -6dB Bandwidth (%) Vp-p Sensitivity (dB) -20dB Pulse Width (ns) -40dB Pulse Width (ns) 5.03 81.8 -45.9 355 765 5.08 83.4 -45.1 360 880 4.96 79.9 -46.5 346 678
Page 2 of 3

1.4

The peak-to-peak sensitivity bar graph displays a value for each of the probes elements, representing the sensitivity of the probe. This value is calculated by using the magnitude of the excitation (test) pulse sent to each element and the peak-to-peak voltage measurement of that elements pulse-echo return (from the test target). The reported value is 20 multiplied by the log of the ratio of these two magnitudes. The average value of all the probes elements is displayed at the top of the graph.

R/D Tech Ultrasonic Transducers 60 Decibel Road, Suite 300, State College, PA 16801 USA Tel.: (1) (814) 689-1390 Fax: (1) (814) 689-1395

Pulse Width
The various pulse-width bar graphs display values representing the axial resolution of the elements pulse-echo returns at various levels, such as 20 dB, 30 dB and 40 dB. These values are calculated by measuring the return pulses width (in nanoseconds) at the desired level. Axial resolution is an important measure of the ability to distinguish individual pulse returns from one another during normal transducer operation. The average value of all the probes elements is displayed at the top of the graph.
64

__________________________________________________________________________ Part Number: XAAB-0004 Description: ARRAY, 5-L-64-38.4X10-A2-P-2.5-OM Serial Number: D0259

Test Conditions
_________________
600

-20dB Pulse Width, Avg = 355 ns

Pulser Voltage : 70 V Pulse Width : 50 ns Primary Gain : 8 dB Secondary Gain : 37 dB Scope Delay : 18.7 us

Date : 6/19/2006 Time : 8:25:37 AM Pulse Type : Negative


Time (ns)

System : FOCUS

Scope Volts per Division : 0.127 V Test Medium : Testing on 2cm Rexolite Block

0 1 -30dB Pulse Width, Avg = 649 ns 1200 1600 Elements -40dB Pulse Width, Avg = 765 ns

Time (ns)

0 1 Elements 64

Time (ns)

0 1 Elements 64

Warranty Information

_____________________

R/D Tech Ultrasonic Transducers offers a one-year warranty on all the phased-array transducers sold by R/D Tech. These products are guaranteed against all defects in materials and manufacturing. All products covered by this warranty must be examined by R/D Tech Ultrasonic transducers and receive their approval in advance before any repairs or replacement are made. Any shipping costs are at the expense of the customer. The warranty excludes defects and deterioration due to normal wear and tear, or caused by an external accident such as: - Incorrect assembly - Poor maintenance - Incorrect usage including, but not limited to, the firing of the probe in air (WARNING : This will damage the probe) - Exposition to temperatures out of the range of -20 C to +60 C for storage or 10 C to 40 C for operation - Excessive voltage (max. 180 V for 7.5 Mhz and below, max. 100 V for 10 Mhz and above) - Use of unqualified couplant - Unforeseen modifications of the product Page 3 of 3

Introduction to Phased Array Probes


Phased array probes are made in a variety of shapes and sizes for different applications. A few types are illustrated here.

Linear

1.5-D array

2-D array

Convex

Concave

Annular

Internal focus

Skewing

Variable angle

Dual linear

Dual 1.5-D

Typical array probes have a frequency ranging from 1 MHz to 17 MHz and have between 10 and 128 elements. Olympus NDT offers a wide variety of probes using piezocomposite technology for all types of inspection. This catalog shows R/D Tech standard phased array probes, which are divided into three types: angle beam probes, integrated wedge probes, and immersion probes. Other types of probes can be designed to suit the needs of your application. Linear arrays are the most commonly used phased array probes for industrial applications. One of the important features to define phased array probes is the active probe aperture. The active aperture (A) is the total active probe length. Aperture length is given by the following formula: A = n p where n = number of elements in the PA probe p = elementary pitchdistance between the centers of two adjacent elements A more precise way of calculating aperture is given by this formula: A = (n 1) p + e where e = element widthwidth of a single piezocomposite element (a practical value is e < /2)
e

The near-field value gives the maximum depth of usable focus for a given array. This value is given by the following formula: N= D2f 4c where D = element diameter f = frequency c = material velocity To calculate the near-field value in the active (primary) axis of a phased array probe, D = n p, where n = number of elements per group in the focal law. To calculate the near-field value in the passive (secondary) axis of a phased array probe, D = Wpassive, which is often called elevation.

Wpassive

n=8

For further technical details on phased array technology, see page 20.

p A
vi

Angle Beam Probes


General Purpose

5L16-A1

5L64-A2

Angle beam probes are used with a wedge to transmit a refracted shear or longitudinal wave into a test piece. Designed for a wide range of applications, they can be used to vary the refracted beam angle or the skew of the beam, depending on the probe orientation.

Advantages
A wide selection of wedges is available to suit any angle beam application. Probes are designed to have a low-profile probe/wedge combination for easier access in restricted areas. Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe.

Typical Applications
A1 and A2 probes
Manual or automated inspection of 6.35 mm to 38 mm (0.25 in. to 1.5 in.) thick welds Detection of flaws and sizing Inspections of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects 10L64-A2 probe is typically used for stress-corrosion cracking applications
H
H

L
L W

A1 casing

A2 casing

Probe Specifications and Dimensions


Part number 5L16-A1 10L32-A1 5L64-A2 10L64-A2 Frequency (MHz) 5.0 10.0 5.0 10.0 Number of elements 16 32 64 64 Pitch (mm) 0.60 0.31 0.60 0.60 Active aperture (mm) 9.6 9.9 38.4 38.4 Elevation (mm) 10.0 7.0 10.0 7.0 L 17 (0.67) 17 (0.67) 53 (2.09) 53 (2.09) External dimensions mm (in.) W 29 (1.16) 29 (1.16) 29 (1.16) 29 (1.16) H 25 (0.98) 25 (0.98) 35 (1.38) 35 (1.38)

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Note: Dimensions listed herein are approximate and are not be used for design purposes.

Angle Beam Probes


Deep Penetration Applications

A3

A4

A5

Angle beam probes are used with a wedge to transmit a refracted shear or longitudinal wave into a test piece. With their large apertures, the deep penetration angle beam probes are designed for the inspection of thick, noisy or highly attenuative material.

Advantages
A wide selection of wedges is available to suit any angle beam application. Wave layers with acoustic adaptation to Rexolite Captive anchoring screws are provided with the probe.

Typical Applications
A3, A4, and A5 probes
Deep penetration applications Thick plates and welds Forging Noisy or granular material
H H L W
A4 casing A5 casing

W
A3 casing

Probe Specifications and Dimensions


Part number 3.5L16-A3 5L16-A3 1.5L16-A4 2.25L16-A4 2.25L32-A5 5L32-A5 Frequency (MHz) 3.5 5.0 1.5 2.25 2.25 5.0 Number of elements 16 16 16 16 32 32 Pitch (mm) 1.60 1.20 2.80 2.00 0.75 0.60 Active aperture (mm) 25.6 19.2 44.8 32.0 24.0 19.2 Elevation (mm) 16.0 12.0 26.0 20.0 24.0 20.0 L 36 (1.41) 36 (1.41) 57 (2.25) 57 (2.25) 29 (1.15) 29 (1.15) External dimensions mm (in.) W 36 (1.41) 36 (1.41) 46 (1.80) 46 (1.80) 43 (1.67) 43 (1.67) H 25 (0.98) 25 (0.98) 30 (1.19) 30 (1.19) 24 (0.96) 24 (0.96)

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Note: Dimensions listed herein are approximate and are not be used for design purposes.

Angle Beam Probes


Weld Inspection

7.5L60-PWZ1

SPWZ1-N55S-IHC

Advantages
Low-profile housing Front-exit cable to avoid interference with scanner probe holder Fits special PipeWIZARD wedges designed for automated inspection of girth welds (sophisticated irrigation channels, locking carbide wear pins). Can be ordered with CE-certified Hypertronics connector Suitable for manual and automated inspection

H L W

Typical Applications
Automated inspection of girth welds with PipeWIZARD systems Manual or automated inspection of thick welds Detection of flaws and sizing Inspection of castings, forgings, pipes, tubes, and machined and structural components for cracks and welding defects

PWZ1 casing

Probe Specifications and Dimensions


Part number 5L60-PWZ1 7.5L60-PWZ1 5L48-PWZ2 5L32-PWZ3 7.5L32-PWZ3 10L32-PWZ3 Frequency (MHz) 5.0 7.5 5.0 5.0 7.5 10.0 Number of elements 60 60 48 32 32 32 Pitch (mm) 1.0 1.0 1.0 1.0 1.0 1.0 Active aperture (mm) 60.0 60.0 48.0 32.0 32.0 32.0 Elevation (mm) 10 10 10 10 10 10 External dimensions mm (in.) L 68 (2.68) 68 (2.68) 56 (2.20) 40 (1.58) 40 (1.58) 40 (1.58) W 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) 26 (1.02) H 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18)

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. When ordered as part of PipeWIZARD systems, these probes require CE Hypertronics connectors and a 0.6 m (2 ft) cable. Note: Dimensions listed herein are approximate and are not be used for design purposes.

Angle Beam Probes


Small-Footprint and Near-Wall Probes

10L16-A00

10L16-A00 with SA00-N60S wedge

5L10-A0-TOP

5L64-NWI1

Advantages of Small-Footprint Probes


Access to confined areas (A00 probe has an 8 8 mm footprint) Cable connector can come out from either the side or the top (A0 only). Special-design small-footprint wedge 10L16-A00 is used for aerospace scribe mark applications.
H H W L

A00 casing Dimensions are without the strain relief.

A0 casing

Advantages of Near-Wall Probes and Wedges


Shortened dead zone at both ends (1.5 mm between center of first or last element and housing edge) Well suited for composite channel inspection Used for C-scan inspection of composites (delamination, disbonding, and porosity)
H L W

NW1 casing

Probe Specifications and Dimensions


Part number Frequency (MHz) Number of elements Pitch (mm) Active aperture (mm) Elevation (mm) L 8 (0.31) 13 (0.50) 13 (0.50) 13 (0.50) 13 (0.50) 66 (2.60) 66 (2.60) External dimensions mm (in.) W 8 (0.31) 10 (0.40) 10 (0.40) 10 (0.40) 10 (0.40) 19 (0.75) 19 (0.75) H 23 (0.90) 23 (0.90) 23 (0.90) 23 (0.90) 23 (0.90) 25 (0.98) 25 (0.98)

Small-footprint probes
10L16-A00 5L10-A0-SIDE 5L10-A0-TOP 10L10-A0-SIDE 10L10-A0-TOP 10.0 5.0 5.0 10.0 10.0 3.5 5.0 16 10 10 10 10 64 64 0.31 0.60 0.60 0.60 0.60 1.0 1.0 5.0 6.0 6.0 6.0 6.0 64.0 64.0 5.0 6.0 6.0 6.0 6.0 7.0 7.0

Near-wall probes
3.5L64-NW1 5L64-NW1

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Note: Dimensions listed herein are approximate and are not be used for design purposes.

10

Immersion Probes

10L128-I2

Immersion probes are designed to be used with a water wedge or in an immersion tank when the test part is partially or wholly immersed. They are longitudinal wave probes that can be set up for refracted shear-wave inspection using a Rexolite wedge.

Advantages
Acoustic impedance matching to water Design allows fitting on water wedges for easier coupling on many surfaces and an adjustable water path (when the part to inspect cannot be immersed in a tank). Linear scanning allows coverage of 30 mm to 90 mm in one line, with very high accuracy. Corrosion-resistant stainless steel case Waterproof guaranteed up to 1 m (3.28 ft) underwater

Typical Applications
Inspection of thin plate or tubing (steel, aluminum, or other) Composite inspection for delamination, disbonding, etc. Inline thickness gaging Automated scanning
W

I3 casing

Probe Specifications and Dimensions


Part number 5L64-I1 10L64-I1 5L128-I2 10L128-I2 2.25L128-I3 5L128-I3 Frequency (MHz) 5.0 10.0 5.0 10.0 2.25 5.0 Number of elements 64 64 128 128 128 128 Pitch (mm) 0.60 0.50 0.60 0.50 0.75 0.75 Active aperture (mm) 38.4 32.0 76.8 64.0 96.0 96.0 Elevation (mm) 10.0 10.0 10.0 7.0 12.0 10.0 External dimensions mm (in.) L W 50 (1.97) 19 (0.75) 50 (1.97) 19 (0.75) 83 (3.27) 21 (0.83) 83 (3.27) 21 (0.83) 102 (4.02) 21 (0.83) 102 (4.02) 21 (0.83) H 25 (0.98) 25 (0.98) 35 (1.38) 35 (1.38) 35 (1.38) 35 (1.38)

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Note: Dimensions listed herein are approximate and are not be used for design purposes.

11

Integrated Wedge Probes

5L16-45SW1

Advantages
Probe and wedge in the same housing The lowest-profile probe-and-wedge combination for contact angle beam inspection. Coupling always good between probe and wedge interfaces, no need for couplant between the probe and wedge Very small assembly for easy access in restricted areas Inspections of 30 to 70 in steel, SW or LW Easy to handle Probes with an internal wedge can be specially ordered to fit a specific curvature radius.

Typical Applications
Manual weld inspection of 6.35 mm to 19 mm (0.25 in. to 0.75 in.) thick surfaces (butt joints, corner joints, tee joints), using 40 to 70 simultaneously Manual inspection of stress corrosion cracking

W
W1 casing

Probe Specifications and Dimensions


Part number 2.25L16-45SW1 2.25L16-45LW1 5L16-45SW1 5L16-45LW1 Frequency (MHz) 2.25 2.25 5.0 5.0 Number of elements 16 16 16 16 Pitch (mm) 0.75 0.75 0.60 0.60 Active aperture (mm) 12.0 12.0 9.6 9.6 Elevation (mm) 12 12 10 10 Nominal refracted beam angle in steel 45 SW 45 LW 45 SW 45 LW External dimensions mm (in.) L 30 (1.18) 30 (1.18) 30 (1.18) 30 (1.18) W 15 (0.59) 15 (0.59) 15 (0.59) 15 (0.59) H 31 (1.22) 31 (1.22) 31 (1.22) 31 (1.22)

These probes come standard with an OmniScan Connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Note: Dimensions listed herein are approximate and are not be used for design purposes.

12

Wedges for Angle Beam Probes

SA0-N45S

SA1-N45L

SA2-N55S

SA2-0L

Advantages
Available in standard refracted angles of 0, 45, 55, and 60 in steel for angle beam inspection from 30 to 70, SW or LW Stainless steel screw receptacles provide a firm anchoring of probes to wedges. Lateral electronic scanning replaces the hand skewing movement (with lateral wedges). The IHC wedge option can be ordered to improve the quality of the inspection: irrigation, mounting holes for the wedge holder to work with any R/D Tech scanner, and carbide pins to increase wear resistance. Wedges are designed to perform manual or automated scans. Custom wedges with specific refracted angles can be ordered; wedge shape and contour can also be customized.

Wedges for Immersion Probes

SI2-N45S-IHC

SI1-0L

Advantages
Stainless steel screw receptacles provide a firm anchoring of probes to wedges. The IHC wedge option can be ordered to improve the quality of the inspection: irrigation, mounting holes for the wedge holder to work with any R/D Tech scanner, and carbide pins to increase wear resistance. Wedges designed to perform manual or automated scans. Custom wedges with specific refracted angles can be ordered; wedge shape and contour can also be customized.

Note: Dimensions listed herein are approximate and are not be used for design purposes.

13

Wedge Specifications and Dimensions


Part number SA00-0L SA00-N45S SA00-N60S SA0-0L SA0-N45S SA0-N45L SA0-N60S SA1-0L SA1-N45L SA1-N55S SA1-N55L SA1-N60S SA1-N60L SA1-L45S SA1-L45L SA2-0L SA2-N45L SA2-N55S dual SA2-N60S SA2-N60L SA2-N60L dual SA3-0L SA3-N45S SA3-N45L SA3-N60S SA3-N60L SA4-0L SA4-N45S SA4-N45L SA4-N60S SA4-N60L SA5-0L SA5-N45S SA5-N55S SA5-N60S SA5-N60L SNW1-0L
*: Width with IHC wedge option

Probe type A00 A00 A00 A0 A0 A0 A0 A1 A1 A1 A1 A1 A1 A1 A1 A2 A2 A2 A2 A2 A2 A3 A3 A3 A3 A3 A4 A4 A4 A4 A4 A5 A5 A5 A5 A5 NW1

Nominal refracted beam angle (in steel) 0 LW 45 SW 60 SW 0 LW 45 SW 45 LW 60 SW 0 LW 45 LW 55 SW 55 LW 60 SW 60 LW 45 SW 45 LW 0 LW 45 LW 55 SW 60 SW 60 LW 60 LW 0 LW 45 SW 45 LW 60 SW 60 LW 0 LW 45 SW 45 LW 60 SW 60 LW 0 LW 45 SW 55 SW 60 SW 60 LW 0 LW

Sweep () N/A 30 to 60 45 to 70 N/A 30 to 60 30 to 60 45 to 70 N/A 30 to 60 30 to 70 30 to 70 45 to 70 45 to 70 -30 to 30 -30 to 30 N/A 30 to 60 30 to 70 45 to 70 45 to 70 45 to 70 N/A 30 to 60 30 to 60 45 to 70 45 to 70 N/A 30 to 60 30 to 60 45 to 70 45 to 70 N/A 30 to 60 30 to 70 45 to 70 45 to 70 N/A

Probe orientation Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Lateral Lateral Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal

Wedge dimensions (mm) L 16.0 21.1 21.3 22.7 32.2 27.8 32.4 29.0 28.1 31.8 21.3 30.3 28.2 45.3 44.8 65.0 65.9 68.5 76.7 66.7 78.1 37.7 55.5 55.0 58.5 52.7 59.3 89.8 88.5 86.3 83.3 38.0 55.6 47.6 45.6 39.5 66.0 W 12.0 12.0 14.0 12.4 11.3 11.3 11.3 30.0 30.0 30.0 30.0 30.0 30.0 34.9 34.9 30.0 30.0 30.0 30.0 40.0 35.0 36.6 36.6 36.6 36.6 36.6 46.6 46.6 46.6 46.6 46.6 45.0 46.6 43.5 43.5 50.0 34.9 W* N/A N/A N/A N/A N/A N/A N/A N/A 40.0 40.0 40.0 40.0 40.0 45.0 45.0 40.0 40.0 40.0 40.0 40.0 40.0 50.0 50.0 50.0 50.0 50.0 55.0 55.0 55.0 55.0 55.0 55.0 55.0 55.0 55.5 55.0 40.0 H 12.0 13.3 13.3 10.8 20.2 25.3 21.5 20.0 24.0 18.9 19.2 16.4 20.6 26.8 42.2 20.0 34.0 43.0 39.1 33.5 48.5 20.0 30.1 48.9 31.6 39.8 20.0 51.0 84.6 45.2 68.1 20.0 36.6 27.3 25.2 41.4 24.9

14

Part number SI1-0L SI1-N45S SI1-N45L SI2-0L SI2-N45S SI2-N45L SI3-0L SPWZ1-0L SPWZ1-N55S REV-C SPWZ3-0L SPWZ3-N55S SPWZ3-N60L
*: Width with IHC wedge option

Probe type I1 I1 I1 I2 I2 I2 I3 PWZ1 PWZ1 PWZ3 PWZ3 PWZ3

Nominal refracted beam angle (in steel) 0 LW 45 SW 45 LW 0 LW 45 SW 45 LW 0 LW 0 LW 55 SW 0 LW 55 SW 60 LW

Sweep () N/A 30 to 60 30 to 60 N/A 30 to 60 30 to 60 N/A N/A 30 to 70 N/A 30 - 70 45 - 70

Probe orientation Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal Normal

Wedge dimensions (mm) L 62.0 68.6 62.7 95.0 107.0 107.0 114.0 75.0 85.8 40.0 65.3 63.6 W 34.9 34.9 36.9 36.9 36.9 36.9 36.9 30.0 30.0 30.0 30.0 30.0 W* 40.0 45.0 45.0 45.0 45.0 45.0 45.0 40.0 40.0 40.0 40.0 40.0 H 21.8 33.2 30.1 21.8 50.2 53.3 21.8 20.0 45.5 20.0 38.1 35.3

Wedge Options

H W*

SA00-N60S

Basic Designed for manual inspection using gel couplant or water (not fed from an irrigation system).

IHC (irrigation, holes, and carbides) Same as Basic but with irrigation, scanner yoke attachment points, and four adjustable carbide wear pins.

H L W L

SA0-0L

SA0-N45S

H H

L W

SPWZ1-N55S-IHC

SI1-0L

15

Wedge Offset Parameters


Angle Center of first element

H
Z X XT Y

A Wedge Specification Sheet is provided with every wedge. This sheet presents the wedge offset parameters of a phased array probes first element for both OmniScan and TomoView software. It is important to note that the values given are only applicable for the wedge and probe combinations listed.
Olympus NDT Canada 505, boul. du Parc-Technologique Qubec (Qubec) G1P 4S9 Canada Web site: Tel.: 1-418-872-1155 Fax: 1-418-872-5431 www.olympusNDT.com

Wedge parameters with OmniScan X Y Z Primary offset Secondary offset (0 when probe is centered) Height

Wedge parameters with TomoView XT Y Primary axis offset of the middle of the first element (mm) Secondary axis offset of the middle of the first element (mm) (measured from the side of the wedge) Height at the middle of the first element (mm)

Wedge Specification Sheet


Wedge: Probe:
SA1-N60S-IHC 2L16-A1,5L16-A1 AND 10L32-A1

OmniScan Wedge Parameters

Wedge Parameters
Model Wedge Angle Serial Number SA1-N60S-IHC Orientation Normal Sec. Offset 0,00

Z
Velocity 2330,00 Height 5,00

Close Browse New Edit Manage Save


39,00 Angle:
(deg)

39,00 Pri. Offset mm -27,30

m/s mm

mm

How to Find the Wedge Parameters


1. Find the appropriate wedge in either the OmniScan or TomoView Wedge Database. Parameters are automatically set once the wedge model is chosen. If the wedge is not already in the database, you may download the latest database update from the Service & Support section of www .olympusNDT .com. Enter the parameters manually using the values provided on the Wedge Specification Sheet accompanying the wedge. Call your local sales representative.

2.
Normal Orientation: 2330,00 Velocity:
(m s)

-27,30 Pri. Offset:


(mm)

0,00 Sec. Offset:


(mm)

5,00 Height:
(mm)

TomoView Wedge Parameters Wedge


SA1-N60S-IHC Flat

3. 4.
39,000 0,000 2330,00 5,000 3,000 20,000 -30,300 -20,000 30,300 40,000

Footprint Wedge angle (deg) Roof angle (deg) Sound velocity (m/s) Height at the middle of the first element (mm) Primary axis offset of the middle of the first element (mm) Secondary axis offset of the middle of the first element (mm) Primary axis position of wedge reference (mm) Secondary axis position of wedge reference (mm) Wedge length (mm) Wedge width (mm)

Note that if the word reverse appears on the header of the Wedge Specification Sheet, it means that the probe is mounted backwards on the wedge.

16

Adapters and Extension Cables


Part number Description

Adapters

OMNI-A-ADP03

Adapter to connect Hypertronics PA probe to the OmniScan

OMNI-A-ADP04

Adapter to connect PA probe with an OmniScan Connector to the Tomoscan FOCUS or Tomoscan III PA, or to other PA equipment having a Hypertronics input

OMNI-A-ADP05

Y-adapter with an OmniScan Connector to support two PA probes. Connector layout: 1 female output and 2 male inputs.

OMNI-A-ADP11

Adapter to connect up to 8 UT probes with LEMO (00) connectors to the OmniScan Connector of an OmniScan PA or of a TomoScan FOCUS LT. Enables the use of conventional UT probes with a PA instrument.

OMNI-A-ADP12

Adapter to connect up to 16 UT probes with LEMO (00) connectors to an OmniScan PA or to a TomoScan FOCUS LT. Supplied with a 1 m cable. Enables the use of conventional UT probes with a PA instrument.

Extension cables
E128P5-0000-OM E128P10-0000-OM Extension cable with OmniScan Connector at both ends. 128 elements are available for phased array use.

E128P5-0004-OM E128P5-0202-OM E128P10-0004-OM E128P10-0202-OM

Extension cable with OmniScan Connector at both ends. Four conventional UT channels with LEMO connectors are provided; 124 elements are available for phased array use.

Combining extension cables with adaptors offers numerous connection possibilities.

17

Numbering System Used to Order PA Extension Cables

E128P10-0004-OM
Number of elements Cable type Cable length Number of elements in extension
E128 = 128 elements

Instrument Connector Probe Connectors

Connector on the probe side


0000 = 0004 = 0202 = HY = OM = HY =

Cable type

P = PVC outer M = metal armor outer

OmniScan Connector with 0 LEMO OmniScan Connector with 4 LEMO at pins 125 to 128 OmniScan Connector with 4 LEMO at pins 6364 and 127128 Hypertronics OmniScan Connector Hypertronics connector

Cable length
0 = 0.5 m 5= 5m 10 = 10 m

Connector on the instrument side

Probe Options OL OmniScan Connector


Additional conventional UT channel (LEMO 00 connector) directly on the OmniScan Connector of the phased array probe Allows simultaneous or alternate use of phased array and pulse-echo using a single setup. To order this option, for the Instrument Connector code of the extension cable part number, replace OM with OL.

Metal Armor Outer


Offers mechanical protection against cut, wear, and harsh environments Available for most standard probes and extension cables

OmniScan Connector
Enables probe recognition. The main probe characteristics are sent to the OmniScan phased array instrument for faster and error-free setups. No more pins to bend or break Splash-proof casing Improved shielding Compact design Improved signal-to-noise ratio

18

Mini-Wheel Encoder

D
RESOLUTION 12 steps/mm

E C A B

A = 27 mm (1.06 in.) B = 28.7 mm (1.12 in.) C = 22.5 mm (0.89 in.)

D = 24 mm (0.94 in.) E = 17.5 mm (0.69 in.) F = 6 mm (0.23 in.)

The Mini-Wheel Encoder is used for the positioning and dimensioning of defects on the scan axis. It can synchronize data acquisition with probe movement. The Mini-Wheel Encoder is waterproof and compatible with the HST-X04 scanner as well as Olympus NDT standard phased array wedges which can be connected with the included bracket kit. This miniature encoder is built with an aluminium casing and a stainless steel wheel. Waterproof Small dimensions Encoder resolution is engraved on the wheel Removable encoder wheel Double O-ring tire for better adherence Metallic strain relief for cable protection Spring-loaded pin for encoder attachment Two M3 threaded holes on the top of the casing for rigid attachment DE version is compatible with the OmniScan instrument with DE15 type connector BX version is compatible with the FOCUS LT instrument with Bendix type connector

Mini-Wheel Encoder Specifications


Part number ENC1-2.5-DE ENC1-5-DE ENC1-2.5-BX ENC1-5-BX Cable length (m) 2.5 5.0 2.5 5.0 Connector DE-15 DE-15 Bendix Bendix Instrument OmniScan OmniScan TomoScan FOCUS LT TomoScan FOCUS LT

Aqualene Elastomer Couplant


Aqualene is an elastomer designed specifically for ultrasonic inspection applications. Acoustic impedance of the material is nearly the same as water and its attenuation coefficient is lower than many documented elastomers and plastics. Applications for nondestructive testing include: Flexible couplant pads with minimal water addition Low-velocity delay lines Water box membrane Aqualene elastomer couplant reduces the drawbacks of wet coupling when used on porous or refractory surfaces. It allows a minimal amount of couplant to be used while protecting the probe when in direct contact with the part. Furthermore, Aqualene may serve as a thermic insulator. Aqualene couplant products are available in many sizes and thicknesses, and custom designs are also available.

One of the many uses of Aqualene: phased array probe cluster used in an R/D Tech industrial pipe inspection system.

19

Phased Array Technology


The distinguishing feature of phased array ultrasonic testing is the computer-controlled excitation (amplitude and delay) of individual elements in a multielement probe. The excitation of multiple piezocomposite elements generates a focused ultrasonic beam allowing the dynamic modification of beam parameters such as angle, focal distance, and focal spot size through software. To generate a beam in phase by means of constructive interference, the various active transducer elements are pulsed at slightly different times. Similarly, the echo from the desired focal point hits the various transducer elements with a computable time shift. The echoes received by each element are timeshifted before being summed together. The resulting sum is an A-scan that emphasizes the response from the desired focal point and attenuates echoes from other points in the test piece. All R/D Tech phased array systems offer the following capabilities:

Software Control of Beam Angle, Focal Distance, and Focal Spot Size
To generate a beam, the various probe elements are pulsed at slightly different times. By precisely controlling the delays between the probe elements, beams of various angles, focal distances, and focal spot sizes can be produced. The echo from the desired focal point hits the various probe elements with a computable time shift. The signals received at each probe element are time-shifted before being summed together. The resulting sum is an A-scan emphasizing the response from the desired focal point and attenuating various other echoes from other points in the material.

Multiple-Angle Inspection with a Single, Small, Electronically Controlled, Multielement Probe


A conventional UT inspection requires a number of different transducers. A single phased array probe can be made to sequentially produce the various angles and focal points required by the application.

Delay (ns) PA probe


Angle steering

Acquisition unit

Phased array unit


Probe elements
Pulses Trigger Incident wave front

Incident wave front

Emitting

Transmitting delays

Flaw

Inspection of Complex Shapes


Reflected wave front Echo signals

Receiving

Receiving delays and sum

Flaw

The capacity to produce at will, and under computer control, various beam angles and focal lengths is used to inspect parts with complex shapes such as turbine discs, turbine blade roots, reactor nozzles, and other complex shapes.

20

High-Speed Scans with No Moving Parts


While phased arrays imply handling the many signals from multielement probes, it is important to note that the resulting signal is a standard RF signal (or A-scan) comparable to that of any conventional system with a fixed-angle transducer. This signal may be evaluated, processed, filtered, and imaged as any A-scan from a conventional UT system. B-scans, C-scans, and D-scans built from the A-scan are also identical to that of a conventional system. The difference is that a multiple-angle inspection can be handled with a single transducer. Multiplexing also allows motionless scanning: a focused beam is created using a few of the many elements of a long phasedarray probe. The beam is then shifted (or multiplexed) to the other elements to perform a high-speed scan of the part with no probe movement along that axis. More than one scan may be performed with various inspection angles. The principle can be applied to flat parts using a linear phased array probe or to tubes and rods using a circular phased array probe.

Defect Positioning
For manual inspections, real-time readings are essential to quickly position the reflected signal source with respect to the part geometry and/or probe location. RA, PA, DA, and SA readings allow the user to accurately position the defect in real time during an inspection. RA: Reference point to the indication in gate A PA: Probe front face to the indication in gate A DA: Depth of the indication in gate A SA: Sound-path length to the indication in gate A

Top

B0

Bottom

45 T1 Top

Active group
16 1 128

Scanning direction
High-speed linear scan: R/D Tech phased array systems can also be used to inspect flat surfaces such as steel plates. Compared to a wide, single-element transduceroften referred to as a paint brushphased array technology offers a much higher sensitivity due to the use of a small focused beam.

RA PA DA SA

21

Training
Olympus NDT has recently developed its unique Training Academy, which is a partnership with major training companies in an effort to offer comprehensive courses in phased array technology and applications. Courses range from a two-day Introduction to Phased Array program to an in-depth, two-week Level II Phased Array course. In both cases, students experience practical training utilizing the portable OmniScan phased array unit. Courses lead either to recognized certification or to certificates of attendance. Courses are currently being offered at the training facilities of participating companies as well as at customer-determined locations worldwide. Customized courses can also be arranged. Check the latest course schedule at www.olympusNDT.com.

Olympus NDT Training Partners


Davis NDE (USA) DgzfP (Germany) Eclipse Scientific Products (Canada) Lavender International (UK) TEST NDT (USA) Vinotte Academy (Belgium)

How to Order
For pricing or for further information, consult the ordering information outlined on page iv and call your local sales representative. To quickly locate your local sales representative, go to www.olympusNDT.com.

Disclaimer
This document was prepared with particular attention to usage to ensure the accuracy of the information contained therein. It corresponds to the version of the products manufactured prior to the printing date. There may, however, be some differences between the catalog and the products if the products have been modified thereafter. The information contained in this document (including photographs, drawings, descriptions, and technical data) is subject to change without notice.

23

www.olympusNDT.com info@olympusNDT.com
Olympus NDT
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PA_Probe_Catalog_EN_0710 Printed in Canada Copyright 20042007 by Olympus NDT. All brands are trademarks or registered trademarks of their respective owners.