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Dr. Veena S Chakravarthi scveena@gmail.com Professor Department of Electronics & Communication Engineering BNMIT
Agenda
Introduction- History, Revolution, growth Understand the core device - MOS Shrinking MOS / Scaling Design Methodology SOC Product development flow Getting ready for semiconductor Industry Summary
So it is
History
Silicon R evolution in 40 years !!
19 8 19 5 58 1997 1997
In P tiu II, 1997 tel en m C ck: 233M z lo H N m er o tran u b f sisto 7.5 M rs: G L g : 0.35 ate en th
Gorden Moore
Growth
1997 devices (0.25 m)
1 cm 1 mm 0.1 mm 10m 1 m 0.1 m 10 nm 1 nm 1
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Transistor- structure
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Transistor- Function
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Transistor- Characteristics
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Transistor- Connections
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Transistor- application
Vss
S
n+ p-
Vdd
n+
D
S
Vgs
N-Transistor
Substrate
Vgs
- Substrate , Diffusion , Gate-Oxide(SiO2) & PolySi gate - Source , Drain , Gate & Substrate
Vss
D
p+ n-
G
p+
Vdd
S
D
G
Vgs <= Vth > Vth ON OFF
P-Transistor
Substrate
Vgs
Transistor- application
N-Switch
Vdd G
Vgs
Complimentary Switch
(Transmission Gate) s b S=0 a -s b
D S Vss
a S=1
Transistor Schematic s
P-Switch
Vdd
Vgs
S G D Vss
a S=0
S=1 : Output b is Good 0 / Good 1 Depending on input a. S=0 : Switch is OFF No path from a to b.
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CMOS logic
Vdd a x Vss a
0 1
Vdd a a b Vss a b
0 0 1 1 0 1 0 1
Vdd b x a x
1 1 1 0
a b b a
0 0 1 1
x b
0 1 0 1
Vss
x
1 0
x
1 0 0 0
Circuit Symbol
a x b Circuit Symbol
a x b Circuit Symbol
INVERTER
NAND2
NOR2
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VDD
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Inverter Layout
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Scaling
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Scaling- FET
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Wire Scaling
45 40 35 30
Delay (ps)
Mark Bohr, Intel, IEDM 95 Wire 43um long 0.8um high Scaled width
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VLSI Design
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25
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Structural Domain
Chip / System RISC Processor Gates. Adders, Registers Transistor Circuit Abstraction Layer Transistor Cells Modules Chips , Boards & Boxes RTL, Logic Abstraction Layer
Physical Domain
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OUT [ 1 : M ] NS [ 1 : K]
D Reg
OUT = NS =
Clock
D q Reg
Clk (1)
SYS_CLK
C/L 1
D q Reg
Clk (2)
C/L 2
D q Reg
Clk (3)
C/L 3
Stage 4 D D q
Reg
Clk (4)
SYS_CLK
t1
T
T
Timing Constraint
t2 >= t clk-q +
t4
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Speed , Power , Function & flexibility. ( hence cost of Die). ( hence cost of Engineering & Schedule ). ( hence cost of Engineering & Schedule ).
Implementation Options :
Gate Array Performance Die Size Design Effort Test Generation Effort Low Large Low Low Cell Based Medium Small Medium Medium Full Custom High Smallest Very High High
NOTE : Test Generation has two aspects. 1. Design or Function Test . & 2. Manufacturing Test.
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: Successive refinement of SW Design into lower & lower functions/objects. : Repetitive use of Objects. Object Reuse ( Object Factory.). : Well defined object functionality & interface to enable reuse of the Objects. : Local variables & Methods hidden from outside world.
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Hardware
Modules Data path Module Reuse, Regular arrays,
Modularity Locality
Well Defined Well defined Subroutine Module Interface, Interface Timing & Loading Data. Local Scoping, No Global Variables. Local Connection Thro Floor-planning. Registered I/O.
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SOC
What is SoC? System-on-Chip An IC that integrates the major functional elements of a complete end-product into a single chip.
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SOC (Contd.)
An SOC contains
Reusable IP Embedded processor/Memory Real world interface Mixed signal blocks Programmable hardware
Has more than 500K gates Use 0.25um technology or below Not an ASIC
anywhere Idea should be in sync with the companys objective Core Resources available at Companys reach.
Market analysis Costing and ROI worked out Competitive analysis and differentiators identified
Responsibility Application scenarios Feature definition Feasibility with Engineering Product specification, HW/SF/DSP needs identified
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Tape Out decision Marketing Responsibility Market analysis Costing and ROI worked out Competitive analysis and differentiators identified
Chip Validation and Engineering Samples System Engineering Responsibility Application scenarios Feature definition Feasibility with Engineering Product specification, HW/SF/DSP needs identified
Product Release System Engineering Responsibility Application scenarios Feature definition Feasibility with Engineerin Product specification, HW/SF/DSP needs identified
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HDL Simulation
Tech_Dbase
Gate SIM - OK ? Y B
Gate SIM - OK ? Y
To Si Foundry
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Opportunities
Product development Services
Design houses Board design houses System integration services Test houses Repair and maintenance services Verification services Total Solutions Quicker shuttles Characterization
Product companies
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Opportunities
Larger system development State of Art development suites Close relationship with customers and suppliers Challenges at all phases of the development Opportunity to become Multi skilled World connect Need to do distributed development taking advantage of geographic locations Global coordination
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Find application for your task Communicate Well Be open for Learning Get broader perspective Detailing Be a perfectionist Plan you career in advance Be patient Develop good attitude Be a good Team player
Summary
VLSI - Revisited Understand the core device - MOS Shrinking MOS / Scaling
Design Description Domains : Behavior , Structure & Physical. RTL Design , Synchronous Sequential Machine , FSM Performance , Die Size , Design Effort , Test Generation Effort.
System Design Parameters Design Strategies SOC Product development Cycle Typical Design Flow Getting ready for Semiconductor Industry
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