EEE310 Measurement and

Instrumentation I
Lecture 01
Kolawole S. OGUNBA,
Department of Electronic and Electrical Engineering,
Obafemi Awolowo University,
Ile-Ife,
Osun State,
Nigeria

Useful Pieces of Information

Course Code:
Course Title:

EEE310 Measurement and Instrumentation

I

EEE310
Measurement and
Instrumentation I
Number of Units: 3
Prerequisite:
EEE204
Fundamentals of Electronic and
Electrical Engineering
Time Table Issues: Please sort them out ASAP

Useful Pieces of Information (contd.)

Course Contents

EEE310 Measurement and Instrumentation I

Introduction to Signals and Measuring Systems:

Analog and digital signals. Fundamental elements of measurement systems. Static and
dynamic characteristics of measurement systems.
Modeling of Measuring Systems:
Random noise (thermal, shot and 1/f noise), interference, errors and accuracy.
Mathematical modeling of non-ideal measuring systems. Standards and calibration.
Sensors:
Sensor principles. Thermocouples, thermistors, Platinium100 (Pt100), Linear Voltage
Differential Transformers (LVDTs), accelerometers, microphones, pressure sensors,
photodiodes, strain gauges, Hall-effect sensors, flow sensors etc.
Analog Signal Processing
Filters, filter types: Butterworth, Chebyshev, Bessel, bandwidth narrowing.
Op-amp circuits:
amplifiers, differential amplifiers, integrators, differentiators, Sallen-and-Key filter,
current-to-voltage converters, rectifiers, comparators and peak detectors. Op-amp nonidealities: offset, bias current, finite gain, finite bandwidth, CMRR. Instrumentation
amplifiers.
Analog to Digital and Digital to Analog Conversion
Sampling, sampling theorem, aliasing, anti-aliasing and reconstruction filters, quantization
error, sample-and-hold circuits.

Useful Pieces of Information (contd.)

Chosen Texts for Course

EEE310 Measurement and Instrumentation I

Haykin, S. and Van Veen, B. (1999), Signals and Systems, John Wiley and Sons Inc., 605, Third
Avenue, New-York NY 10158-0012, United States of America.
Lathi, B.P. (1998), Signal Processing and Linear Systems, Berkeley-cambridge Press, P.O. Box 947,
Carmichael, CA 95609-0947, United States of America.
Morris, A. S. (2001), Measurement and Instrumentation Principles, 3rd. ed., Butterworth-Heinemann,
Linacre House, Jordan Hill, Oxford OX2 8DP, United Kingdom.
Oppenheim, A.v. and Willsky, A.S. (1997), Signals and Systems, Prentice-Hall International, Upper
Saddle River, New-Jersey, United States of America.
Sawhney, A.K. and Sawhney, P. (2007), A Course in Electronic and Electrical Measurements and
Instrumentation, Dhanrat Rai and Co. (P) Limited, Educational and Technical Publishers. 1710, Nai
Sarak, Delhi 110006, India.
Webster, J.G. (1999), The Measurement, Instrumentation, and Sensors Handbook, CRC Press LLC,
2000, Corporate Blvd., Boca Raton, FL 33431, United States of America.

Useful Pieces of Information (contd.)

Mode of Delivery of Lectures:

EEE310 Measurement and Instrumentation I

Powerpoint presentations are likely.

I will develop them and send to the students even if I
do not present them in class.
Use of black/white boards still very likely in addition
to/as a replacement of Powerpoint Presentations.

Lecture Notes:

I will develop them as the Semester progresses

Assessment:

Attendance
Mid-Semester Test (1)
Examination (1)
Assignments

NB Honesty is advised with attendances.

EEE310 Measurement and Instrumentation I

Introduction to
Measurement and
Measurement Systems

EEE310 Measurement and Instrumentation I

Measurement and Measurement Systems

Question: Why study signals when the
destination is really measurement and
instrumentation?

Answer: In life, there is a constant need to

quantify phenomena.
The quantification gives rise to signals and the
process of quantification is called measurement
while the tools we utilize in achieving the
quantification are called Instruments or
Measurement Systems or Instrumentation
Systems.
The signals are a collection of data and they give
information that ultimately gives the
knowledge needed to make calculated decisions.

Measurement and Measurement Systems

Measurement:
The process of comparison between a quantity
of a particular variable of interest (mostly
physical) and a pre-defined, globally-accepted
standard.
Standard:
The value of some quantity of a variable which is
set up and established by authority as a rule for
the measurement of quantities of the variable.
Measurand:
The variable to be measured that represents a
particular phenomenon being invvestigated.

EEE310 Measurement and Instrumentation I

EEE310 Measurement and Instrumentation I

Measurement and Measurement Systems

Signal:
The variation of a dependent variable with
respect to one or more independent variables
Data:
A basic entity resulting from a measurement
process.
Information:
The commodity contained within a signal/set of
signals that emerges from processed data of a
measurement process.
Knowledge:
Familiarity, know-how or understanding gained
through the acquisition of information.

EEE310 Measurement and Instrumentation I

Measurement and Measurement Systems

Sensor:
A device that comes in contact directly or indirectly
with a physical quantity and responds to such
quantities by undergoing changes in its specific
characteristics.
Transducer:
A device that responds to a particular physical
quantity by energy conversion from one form to
another. (Most sensors are transducers but not all
transducers are sensors)
Measuring Instrument:
A device, including a sensor, that transforms the
physical variable of interest to a form suitable for
display or recording or transmission or actuation.

Measurement and Measurement Systems

EEE310 Measurement and Instrumentation I

Measurement System:
A collection of devices, including sensors,
transducers, signal conversion elements, signal
manipulating elements, and
display/storage/transmission/actuating devices,
that are put together to enhance the quality of
outputs of simple measuring instruments and to
give as accurate, precise, unambiguous, and reliable
a set of readings as possible.
Measurement systems are necessitated by the
increased domestic and industrial demands for
efficiency and high-quality measurements that
simple instruments are incapable of performing.

They are sometimes called Instrumentation Systems

Measurement and Measurement Systems

Simple Instrument Model

EEE310 Measurement and Instrumentation I

Typical Measurement System Model

Measurement and Measurement Systems

EEE310 Measurement and Instrumentation I

Typical Measurement Situations